Dec./2006 MITSUBISHI SEMICONDUTOR <GaAs FET> MGF1451A Low Noise MES FET DESCRIPTION Outline Drawing The MGF1451A is designed for use in S to Ku band power amplifiers. FEATURES High gain and High P1dB Glp=10.5dB , P1dB=13dBm (Typ.) @ f=12GHz APPLICATION S to Ku band power Amplifiers QUALITY GRADE IG Keep Safety first in your circuit designs! ABSOLUTE MAXIMUM RATINGS Symbol VGDO VGSO (Ta=25°C ) Parameter Ratings Unit Gate to drain voltage -8 V Gate to source voltage -8 V 120 mA ID Drain current PT Tch Total power dissipation 300 mW Channel temperature 175 °C Tstg Storage temperature -55 to +175 °C ELECTRICAL CHARACTERISTICS (Ta=25°C ) Synbol V(BR)GDO V(BR)GSO IGSS Parameter Gate to drain breakdown voltage Gate to source breakdown voltage Gate to source leakage current IDSS Saturated drain current VGS(off) Gate to source cut-off voltage Glp Linear Power Gain P1dB Output Power at 1dB gain Compression Thermal Resistance Rt. Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable , but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury , fire or property damage. Remember to give due consideration to safety when making your circuit designs , with appropriate measure such as (I) placement of substitutive , auxiliary circuits , (ii) use of non-flammable material or (iii) prevention against any malfunction or mishap. Test conditions IG=-30μA IG=-30μA VGS=-3V VDS=0V VGS=0V VDS=3V VDS=3V ID=300μA VDS=3V ID=30mA f=12GHz MIN. -8 -8 -- Limits TYP. ---- MAX --10 Unit V V uA 35 60 120 mA -0.3 -1.4 -3.5 V 9.0 10.5 -- dB 11.0 13.0 -- dBm -- -- -- 420 ℃/W MITSUBISHI (1/4) Decl/2006 Dec./2006 MITSUBISHI SEMICONDUTOR <GaAs FET> MGF1451A Low Noise MES FET TYPICAL CHARACTERISTICS ID vs. VDS 80 ID VS. VDS 80 Ta=25℃ VGS=-0.2V/STEP 70 Ta=25℃ VDS=3V 70 VGS=0V 60 DRAIN CURRENT ID(mA) DRAIN CURRENT ID(mA) (Ta=25°C) 50 40 30 20 10 0 60 50 40 30 20 10 0 0 1 2 3 4 5 DRAIN TO SOURCE VOLTAGE VDS(V) -2.0 -1.0 0.0 GATE TO SOURCE VOLTAGE VGS(V) Pout,Glp vs. Pin 25 30 Pout(dBm) 20 25 15 20 10 15 5 10 0 -10.0 -5.0 0.0 Pin(dBm) 5.0 Glp(dB) f=12GHz VDS=3V IDS=30mA Pout Glp 5 10.0 MITSUBISHI (2/4) Decl/2006 Dec./2006 MITSUBISHI SEMICONDUTOR <GaAs FET> MGF1451A Low Noise MES FET S PARAMETERS (Conditions:VDS=3V,IDS=30mA,Ta=25deg.C) freq (GHz) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 S11 Mag. 0.986 0.953 0.921 0.886 0.850 0.810 0.784 0.748 0.714 0.667 0.606 0.521 0.447 0.386 0.382 0.460 0.578 0.688 0.767 0.794 S21 Angle -21.3 -41.0 -58.6 -74.3 -90.2 -101.0 -111.5 -121.3 -131.5 -143.9 -157.3 -173.0 165.7 134.3 95.5 57.9 29.8 8.2 -8.0 -20.5 Mag. 4.089 3.848 3.570 3.274 3.054 2.823 2.686 2.588 2.542 2.541 2.562 2.586 2.653 2.686 2.674 2.619 2.445 2.224 1.979 1.736 S12 Angle 159.6 140.9 124.1 109.1 93.5 80.9 68.9 57.3 45.4 33.2 19.6 5.6 -9.6 -26.7 -45.2 -65.5 -86.0 -106.6 -126.1 -145.0 Mag. 0.016 0.029 0.039 0.046 0.052 0.054 0.055 0.055 0.057 0.062 0.067 0.069 0.073 0.076 0.078 0.080 0.080 0.077 0.075 0.077 S22 Angle 75.2 61.4 50.8 41.7 31.2 24.8 19.3 15.5 13.5 11.2 4.4 -4.9 -13.3 -23.5 -37.5 -54.5 -73.9 -95.0 -117.1 -140.2 Mag. 0.542 0.544 0.542 0.539 0.528 0.531 0.541 0.547 0.552 0.560 0.556 0.544 0.526 0.496 0.451 0.379 0.282 0.169 0.060 0.083 K Angle -15.9 -31.0 -43.3 -52.9 -64.5 -72.5 -79.2 -85.4 -91.2 -96.6 -103.4 -109.9 -117.9 -125.7 -135.0 -144.3 -154.0 -157.6 -138.7 -42.8 0.17 0.30 0.40 0.51 0.64 0.82 0.93 1.08 1.17 1.18 1.27 1.46 1.52 1.58 1.60 1.57 1.54 1.51 1.46 1.48 MSG/MAG (dB) 24.1 21.2 19.6 18.5 17.7 17.2 16.9 14.9 14.0 13.5 12.7 11.7 11.4 11.0 10.8 10.7 10.5 10.4 10.2 9.4 GaAs FET Bottom view (MGF1451A) ① Calibration point Gate 1.0mm Microstrip line (Z0=50Ω) Drain GND Calibration point Substrate (Ceramics) εr=9.8 MetalM carrier etal carrier Calibration point ② ② ③ ①Gate ②Source ③Drain Calibration point 1.1mm MITSUBISHI (3/4) Decl/2006 Dec./2006 MITSUBISHI SEMICONDUTOR <GaAs FET> MGF1451A Low Noise MES FET Requests Regarding Safety Designs Mitsubishi Electric constantly strives to raise the level of its quality and reliability. Despite these concerted efforts, however, there will be occasions when our semiconductor products suffer breakdowns, malfunctions or other problems. In view of this reality, it is requested that every feasible precaution be taken in the pursuit of redundancy design, malfunction prevention design and other safety-related designs, to prevent breakdowns or malfunctions in our products from resulting in accidents involving people, fires, social losses or other problems, thereby upholding the highest levels of safety in the products when in use by customers. Matters of Importance when Using these Materials 1. These materials are designed as reference materials to ensure that all customers purchase Mitsubishi Electric semiconductors best suited to their specific use applications. Please be aware, however, that the technical information contained in these materials does not comprise consent for the execution or use of intellectual property rights or other rights owned by Mitsubishi Electric Corporation. 2. Mitsubishi Electric does not assume responsibility for damages resulting from the use of product data, graphs, charts, programs, algorithms or other applied circuit examples described in these materials, or for the infringement of the rights of third-party owners resulting from such use. 3. The data, graphs, charts, programs, algorithms and all other information described in these materials were current at the issue of these materials, with Mitsubishi Electric reserving the right to make any necessary updates or changes in the products or specifications in these materials without prior notice. Before purchasing Mitsubishi Electric semiconductor products, therefore, please obtain the latest available information from Mitsubishi Electric directly or an authorized dealer. 4. Every possible effort has been made to ensure that the information described in these materials is fully accurate. However, Mitsubishi Electric assumes no responsibility for damages resulting from inaccuracies occurring within these materials. 5. When using the product data, technical contents indicated on the graphs, charts, programs or algorithms described in these materials, assessments should not be limited to only the technical contents, programs and algorithm units. Rather, it is requested that ample evaluations be made of each individual system as a whole, with the customer assuming full responsibility for decisions on the propriety of application. Mitsubishi Electric does not accept responsibility for the propriety of application. 6. The products described in these materials, with the exception of special mention concerning use and reliability, have been designed and manufactured with the purpose of use in general electronic machinery. Accordingly these products have not been designed and manufactured with the purpose of application in machinery or systems that will be used under conditions that can affect human life, or in machinery or systems used in social infrastructure that demand a particularly high degree of reliability. When considering the use of the products described in these materials in transportation machinery (automobiles, trains, vessels), for objectives related to medical treatment, aerospace, nuclear power control, submarine repeaters or systems or other specialized applications, please consult with Mitsubishi Electric directly or an authorized dealer. 7. When considering use of products for purposes other than the specific applications described in these materials, please inquire at Mitsubishi Electric or an authorized dealer. 8. The prior consent of Mitsubishi Electric in writing is required for any reprinting or reproduction of these materials. 9. Please direct any inquiries regarding further details of these materials, or any other comments or matters of attention, to Mitsubishi Electric or an authorized dealer. MITSUBISHI (4/4) Decl/2006