DPG 60B600LB

DPG 60B600LB
HiPerFRED2
VRRM = 600 V
IDAV = 60 A
trr
= 40 ns
High Performance Fast Recovery Diode
Low Loss and Soft Recovery
1~ Rectifier Bridge
Part number
DPG60B600LB
9
8
7
1
3 2
e
4
6 5
8 = n/c
6
9
7
1
2
3
iv
5
E72873
a
t
4
Backside: isolated
Applications:
Features / Advantages:
t
e
n
t
•Planar passivated chips
•Rectifiers in switch mode power
supplies (SMPS)
•Very low leakage current
•Very short recovery time
•Improved thermal behaviour
•Very low Irm-values
•Very soft recovery behaviour
•Avalanche voltage rated for reliable operation
•Soft reverse recovery for low EMI/RFI
•Low Irm reduces:
- Power dissipation within the diode
- Turn-on loss in the commutating switch
Package: SMPD
•Isolation Voltage: 3000 V~ (t = 1s)
•Industry convenient outline
•RoHS compliant
•Epoxy meets UL 94V-0
•Soldering pins for PCB mounting
•Backside: DCB ceramic
•Reduced weight
•Advanced power cycling
IXYS reserves the right to change limits, test conditions and dimensions.
© 2013 IXYS All rights reserved
Data according ot IEC 60747 and per semiconductor unless otherwise specified
20131010
1-5
DPG 60B600LB
Fast Diode
Ratings
Symbol
Definitions
Conditions
VRSM
max. non-repetitive rev. blocking voltage VRRM
max. repetitive reverse blocking voltage
IR
reverse current, drain current
VF
forward voltage drop
min.
typ.
max.
TVJ = 25°C
600
V
TVJ = 25°C
600
V
VR = 600 V
TVJ = 25°C
TVJ = 150°C
250
2
µA
mA
IF = 30 A
IF = 60 A
TVJ = 25°C
2.51
3.19
V
V
IF = 30 A
IF = 60 A
TVJ = 150°C
1.59
2.21
V
V
ID25
ID80
diode forward DC current
TC = 25°C
TC = 80°C
TVJ = 175°C
TVJ = 175°C
77
58
A
A
IDAV
bridge output current
rectangular; d = 0.5; TC = 125°C
TVJ = 175°C
60
A
VF0
rF
threshold voltage
slope resistance
for power loss calculation only
TVJ = 175°C
0.85
17
V
mW
RthJC
thermal resistance junction to case
101
K/W
RthJH
thermal resistance case to heatsink
with thermal transfer paste (IXYS test setup)
Ptot
total power dissipation
TC =
IFSM
max. forward surge current
t = 10 ms; (50 Hz), sine; VR = 0 V
TVJ = 45°C
VR = 300 V; f = 1 MHz
TVJ = 25°C
30
pF
TVJ = 25°C
TVJ = 125°C
5.5
12
A
A
TVJ = 25°C
TVJ = 125°C
40
85
ns
ns
max. reverse recovery current
trr
reverse recovery time
IF = 30 A; VR = 300 V
-diF /dt = 400 A/µs
K/W
135
250
W
A
t
e
n
t
a
t
iv
IRM
25°C
e
CJ
0.40
IXYS reserves the right to change limits, test conditions and dimensions.
© 2013 IXYS All rights reserved
Data according ot IEC 60747 and per semiconductor unless otherwise specified
20131010
2-5
DPG 60B600LB
Package SMPD
Ratings
Symbol
Definitions
Conditions
IRMS
RMS current
wide pin
standard pin
Tstg
Top
TVJ
storage temperature
opertation temperature
virtual junction temperature
min.
-55
-55
-55
Weight
max.
100
60
A
A
125
150
175
°C
°C
°C
8.5
FC
mounting force with clip
d Spp/App
d Spb/Apb
creepage distance on surface /
striking distance through air
terminal to terminal
terminal to backside
VISOL
isolation voltage
t = 1 second
t = 1 minute
40
mm
4.0
mm
3000
2500
V
V
~
~
Part number
e
D = Diode
P = HiPerFRED
G = extreme fast
60 = Current Rating [A]
B = 1~ Rectifier Bridge
600 = Reverse Voltage [V]
LB = SMPD-B
XXXXXXXXXX
yywwA
Data Matrix Code
Pin 1 identifier
a
t
Part #
Date Code
Assembly line
Lot #
Split Lot
Individual #
N
iv
Assembly line
130
1.6
50/60 Hz; RMS; IISOL < 1 mA
Backside DCB
Part number
Date code
g
UL Logo
~
Digits
1 to 19:
20 to 23:
24 to 25:
26 to 31:
32:
33 to 36:
typ.
Ordering
Part Name
Marking on Product
DPG60B600LB
DPG60B600LB
Blister
45
512859
DPG60B600LB-TRR
DPG60B600LB
Tape&Reel
200
512852
n
t
Standard
Delivering Mode Base Qty Ordering Code
Equivalent Circuits for Simulation
V0
R0
e
I
*on die level
threshold voltage
0.85
R0 max
slope resistance *
17
V
mW
t
V0 max
TVJ = 175°C
IXYS reserves the right to change limits, test conditions and dimensions.
© 2013 IXYS All rights reserved
Data according ot IEC 60747 and per semiconductor unless otherwise specified
20131010
3-5
DPG 60B600LB
Outlines SMPD
A(8:1)
5,5 0,1
2)
(6x) 1 0,05
0 + 0,15
2°
 0,1
18 0,1
seating plane
(3x) 2 0,05
9 0,1
8
4 0,05
0,55 0,1
9
iv
32,7 0,5
23 0,2
e
7
2)
4,85 0,2
0,5 0,1
1)
2 0,2
25 0,2
3)
 0,05
3 2 1
A
t
6 5 4
Pin number
Notes:
1) potrusion may add 0.2 mm max. on each side
2) additional max. 0.05 mm per side by punching misalignement
or overlap of dam bar or bending compression
3) DCB area 10 to 50 µm convex;
position of DCB area in relation to plastic rim: ±25 µm
(measured 2 mm from Cu rim)
4) terminal plating: 0.2 - 1 µm Ni + 10 - 25 µm Sn (galv.)
cutting edges may be partially free of plating
a
2,75 0,1
5,5 0,1
13,5 0,1
t
16,25 0,1
n
19 0,1
5
6
9
7
1
2
3
t
e
4
8 = n/c
IXYS reserves the right to change limits, test conditions and dimensions.
© 2013 IXYS All rights reserved
Data according ot IEC 60747 and per semiconductor unless otherwise specified
20131010
4-5
DPG 60B600LB
600
100
VR = 300 V
500
80
TVJ = 150°C
IF = 60 A
IF = 15 A
IF = 30 A
Qr
TVJ = 100°C
IR M
IF = 15 A
300
[A ] 40
IF = 30 A
18
IF = 60 A
400
I F 60
24
TVJ = 100°C
12
[A ]
[μ C ]
TVJ = 100°C
200
6
20
0
100
TVJ = 25°C
0
1
2
3
0
100
4
140
60
VR = 300 V
iv
IF = 15 A
80
[n s]
Qr
40
120
160
0.25
200
400
600
800
40
0.20
30
0.15
t fr
[μ s ]
[V ]
20
tfr
VFR
10
0
1000
0.10
0.05
0
200
400
600
800
0.00
1000
- d i F /d t [A /μ s ]
Fig. 5 Typ. recovery time
trr versus -diF /dt
a
Fig. 6 Typ. peak forward voltage
VFR and tfr versus diF /dt
t
1
0.30
IF = 30 A
-d i F /d t [A /μ s ]
T V J [°C ]
Fig. 4 Dynamic parameters
Qr, IRM versus TVJ
2
0
t
80
1000
V FR
IF = 30 A
t rr
60
800
e
IF = 60 A
100
IRM
600
TVJ = 100°C
50
1.5
K f 1.0
400
Fig. 3 Typ. peak reverse current
IRM versus -diF /dt
TVJ = 100°C
120
40
200
-d i F /d t [A /μ s ]
Fig. 2 Typ. reverse recov. charge
Qr versus -diF /dt
2.0
0
0
-d i F /d t [A /μ s ]
Fig. 1 Forward current
IF versus VF
0.5
0
1000
V F [V ]
0.0
VR = 300 V
n
Z th J0.1
C
[K /W ]
Constants for ZthJC calculation:
e
0.01
t
0.001
0.00001
0.0001
0.001
0.01
0.1
i
Rthi (K/W)
ti (s)
1
0.465
0.0052
2
0.179
0.0003
3
0.256
0.0396
1
t [s ]
Fig. 7 Transient thermal impedance junction to case
IXYS reserves the right to change limits, test conditions and dimensions.
© 2013 IXYS All rights reserved
Data according ot IEC 60747 and per semiconductor unless otherwise specified
20131010
5-5