RENESAS UPD720114K9

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DATA SHEET
MOS INTEGRATED CIRCUIT
μPD720114
ECOUSBTM Series
USB 2.0 HUB CONTROLLER
The μPD720114 is a USB 2.0 hub device that complies with the Universal Serial Bus (USB) Specification Revision
2.0 and works up to 480 Mbps. USB 2.0 compliant transceivers are integrated for upstream and all downstream ports.
The μPD720114 works backward compatible either when any one of the downstream ports is connected to a USB 1.1
compliant device, or when the upstream port is connected to a USB 1.1 compliant host.
Detailed function descriptions are provided in the following user’s manual. Be sure to read the manual before designing.
μPD720114 User’s Manual: S17463E
FEATURES
• Compliant with Universal Serial Bus Specification Revision 2.0 (Data Rate 1.5/12/480 Mbps)
• High-speed or full-speed packet protocol sequencer for Endpoint 0/1
• 4 (Max.) downstream facing ports
• Low power consumption (10 μA when hub in idle status, 149 mA when all parts run in HS mode)
• All downstream facing ports can handle high-speed (480 Mbps), full-speed (12 Mbps), and low-speed (1.5
Mbps) transaction.
• Supports split transaction to handle full-speed and low-speed transaction on downstream facing ports when
Hub controller is working in high-speed mode.
• One Transaction Translator per Hub and supports four non-periodic buffers
• Supports self-powered and bus-powered mode
• Supports individual or global over-current detection and individual or ganged power control
• Supports downstream port status with LED
• Supports non-removable devices by I/O pin configuration
• Support Energy Star for PC peripheral system
• On chip Rpu, Rpd resistors and regulator (for core logic)
• Use 30 MHz crystal
• 3.3 V power supply
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version. Not all products and/or types are available in every country. Please check
with an NEC Electronics sales representative for availability and additional information.
Document No. S17462EJ6V0DS00 (6th edition)
Date Published December 2009 NS
Printed in Japan
The mark "<R>" shows major revised points.
2005
μPD720114
ORDERING INFORMATION
Part Number
Package
μPD720114GA-9EU-A
μPD720114GA-YEU-A
<R> μPD720114K9-4E4-A
Remark
48-pin plastic TQFP (Fine pitch) (7 × 7)
Lead-free product
48-pin plastic TQFP (Fine pitch) (7 × 7)
Lead-free product
40-pin plastic QFN (6 × 6)
Lead-free product
BLOCK DIAGRAM
To Host/Hub
downstream
facing port
Upstream facing port
UP_PHY
CDR
SERDES
UPC
FS_REP
SIE_2H
CDR
ALL_TT
F_TIM
EP1
DP(1)_PHY
Downstream facing port #1
To Hub/Function
upstream facing port
EP0
DP(2)_PHY
Downstream facing port #2
To Hub/Function
upstream facing port
APLL
DP(3)_PHY
Downstream facing port #3
X1/X2
To Hub/Function
upstream facing port
OSB
DP(4)_PHY
Downstream facing port #4
2.5V REG
2
Data Sheet S17462EJ6V0DS
To Hub/Function
upstream facing port
μPD720114
APLL
: Generates all clocks of Hub.
ALL_TT
: Translates the high-speed transactions (split transactions) for full/low-speed device
to full/low-speed transactions.
ALL_TT buffers the data transfer from either
upstream or downstream direction. For OUT transaction, ALL_TT buffers data from
upstream port and sends it out to the downstream facing ports after speed
conversion from high-speed to full/low-speed. For IN transaction, ALL_TT buffers
data from downstream ports and sends it out to the upstream facing ports after
speed conversion from full/low-speed to high-speed.
CDR
: Data & clock recovery circuit
DPC
: Downstream Port Controller handles Port Reset, Enable, Disable, Suspend and
DP(n)_PHY
: Downstream transceiver supports high-speed (480 Mbps), full-speed (12 Mbps), and
EP0
: Endpoint 0 controller
EP1
: Endpoint 1 controller
F_TIM (Frame Timer)
: Manages hub’s synchronization by using micro-SOF which is received at upstream
Resume
low-speed (1.5 Mbps) transaction
port, and generates SOF packet when full/low-speed device is attached to
downstream facing port.
FS_REP
: Full/low-speed repeater is enabled when the μPD720114 are worked at full-speed
mode
OSB
: Oscillator Block
2.5V REG
: On chip 2.5V regulator
SERDES
: Serializer and Deserializer
SIE_2H
: Serial Interface Engine (SIE) controls USB2.0 and 1.1 protocol sequencer.
UP_PHY
: Upstream Transceiver supports high-speed (480 Mbps), full-speed (12 Mbps)
transaction
UPC
: Upstream Port Controller handles Suspend and Resume
Data Sheet S17462EJ6V0DS
3
μPD720114
PIN CONFIGURATION (TOP VIEW)
• 48-pin plastic TQFP (Fine pitch) (7 × 7)
VDD33REG
VBUSM
CSB1
PPB1
CSB2
PPB2
VSS
CSB3
PPB3
CSB4
PPB4
SYSRSTB
μPD720114GA-9EU-A
μPD720114GA-YEU-A
48 47 46 45 44 43 42 41 40 39 38 37
VDD25OUT
VSSREG
LED4
LED3
LED2
LED1
GREEN
AMBER
VDD33
X1
X2
VDD25
36
35
34
33
32
31
30
29
28
27
26
25
1
2
3
4
5
6
7
8
9
10
11
12
BUS_B
TEST
RREF
AVSS(R)
AVDD
AVSS
AVDD
VDD33
DMU
DPU
VSS
VDD25
13 14 15 16 17 18 19 20 21 22 23 24
4
Data Sheet S17462EJ6V0DS
VSS
DP4
DM4
VDD25
DP3
DM3
VDD33
DP2
DM2
VSS
DP1
DM1
μPD720114
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
1
VDD25OUT
13
BUS_B
25
DM1
37
SYSRSTB
2
VSSREG
14
TEST
26
DP1
38
PPB4
3
LED4
15
RREF
27
VSS
39
CSB4
4
LED3
16
AVSS(R)
28
DM2
40
PPB3
5
LED2
17
AVDD
29
DP2
41
CSB3
6
LED1
18
AVSS
30
VDD33
42
VSS
7
GREEN
19
AVDD
31
DM3
43
PPB2
8
AMBER
20
VDD33
32
DP3
44
CSB2
9
VDD33
21
DMU
33
VDD25
45
PPB1
10
X1
22
DPU
34
DM4
46
CSB1
11
X2
23
VSS
35
DP4
47
VBUSM
12
VDD25
24
VDD25
36
VSS
48
VDD33REG
Remark
AVSS(R) should be used to connect RREF through 1 % precision reference resistor of 2.43 kΩ.
Data Sheet S17462EJ6V0DS
5
μPD720114
• 40-pin plastic QFN (6 × 6)
<R>
VDD33REG
VBUSM
CSB1
PPB1
CSB2
PPB2
CSB3
PPB3
CSB4
PPB4
μPD720114K9-4E4-A
40 39 38 37 36 35 34 33 32 31
VDD25OUT
LED4
LED3
LED2
LED1
GREEN
AMBER
VDD33
X1
X2
1
2
3
4
5
6
7
8
9
10
30
29
28
27
26
25
24
23
22
21
GND area
SYSRSTB
DP4
DM4
VDD25
DP3
DM3
VDD33
DP2
DM2
DP1
BUS_B
TEST
RREF
AVDD
AVDD
VDD33
DMU
DPU
VDD25
DM1
11 12 13 14 15 16 17 18 19 20
Pin No.
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
1
VDD25OUT
11
BUS_B
21
DP1
31
PPB4
2
LED4
12
TEST
22
DM2
32
CSB4
3
LED3
13
RREF
23
DP2
33
PPB3
4
LED2
14
AVDD
24
VDD33
34
CSB3
5
LED1
15
AVDD
25
DM3
35
PPB2
6
GREEN
16
VDD33
26
DP3
36
CSB2
7
AMBER
17
DMU
27
VDD25
37
PPB1
8
VDD33
18
DPU
28
DM4
38
CSB1
9
X1
19
VDD25
29
DP4
39
VBUSM
10
X2
20
DM1
30
SYSRSTB
40
VDD33REG
Remark
6
Pin Name
RREF should be connected to ground through 1% precision reference resistor of 2.43 kΩ.
Data Sheet S17462EJ6V0DS
μPD720114
1.
PIN INFORMATION
Pin Name
I/O
Buffer Type
Active
Level
Function
X1
I
2.5 V input
30 MHz Crystal oscillator in
X2
O
2.5 V output
30 MHz Crystal oscillator out
SYSRSTB
I
3.3 V Schmitt input
DP(4:1)
I/O
USB D+ signal I/O
USB’s downstream facing port D+ signal
DM(4:1)
I/O
USB D− signal I/O
USB’s downstream facing port D− signal
DPU
I/O
USB D+ signal I/O
USB’s upstream facing port D+ signal
DMU
I/O
USB D− signal I/O
USB’s upstream facing port D− signal
BUS_B
I
3.3 V Schmitt input
Power mode select
RREF
A (O)
Analog
Reference resistor connection
CSB1
I
5 V tolerant Schmitt input
Low
Port’s over-current status input.
CSB(4:2)
I
3.3 V Schmitt input
Low
Port’s over-current status input
PPB(4:1)
I/O
3.3 V output / input
Low
Low
Asynchronous chip hardware reset
Port’s power supply control output or hub
configuration input
VBUSM
I
AMBER
I/O
5 V tolerant Schmitt input
Upstream VBUS monitor
3.3V output / input
Amber colored LED control output or port
indicator select
GREEN
O
3.3V output
Green colored LED control output or port
indicator select
LED(4:1)
I/O
3.3V output / input
Low
LED indicator output show downstream port
status or Removable/Non-removable select
TEST
I
3.3 V Schmitt input
Test signal
VDD25OUT
On chip 2.5 V regulator output, it must have a
22 μF (or greater) capacitor to VSSREG
VDD33
3.3 V VDD
VDD33REG
3.3 V VDD for on chip 2.5 V regulator input, it must
have a 4.7 μF ( or greater) capacitor to VSSREG
VDD25
2.5 V VDD. These pins must be supplied from
VDD25OUT, output from internal regulator
AVDD
2.5 V VDD for analog circuit
VSS
VSS
VSSREG
On chip 2.5 V regulator VSS
AVSS
VSS for analog circuit
AVSS(R)
VSS for reference resistor, Connect to AVSS.
Remark “5 V tolerant“ means that the buffer is 3 V buffer with 5 V tolerant circuit.
Data Sheet S17462EJ6V0DS
7
μPD720114
2.
ELECTRICAL SPECIFICATIONS
2.1
Buffer List
•
2.5 V Oscillator interface
•
5 V tolerant Schmitt input buffer
•
3.3 V Schmitt input buffer
•
3.3 V IOL = 12 mA output buffer
•
3.3 V input and 3.3 V IOL = 3 mA output buffer
•
3.3 V input and IOL = 12 mA output buffer
•
USB2.0 interface
X1, X2
CSB1, VBUSM
CSB(4:2),BUS_B, SYSRSTB, TEST
GREEN
PPB(4:1), LED(4:1)
AMBER
DPU, DMU, DP(4:1), DM(4:1), RREF
Above, “5 V” refers to a 3 V input buffer that is 5 V tolerant (has 5 V maximum input voltage). Therefore, it is
possible to have a 5 V connection for an external bus.
8
Data Sheet S17462EJ6V0DS
μPD720114
2.2
Terminology
Terms Used in Absolute Maximum Ratings
Parameter
Symbol
Power supply voltage
VDD33,
VDD33REG
Input voltage
VI
Meaning
Indicates voltage range within which damage or reduced reliability will not
result when power is applied to a VDD pin.
Indicates voltage range within which damage or reduced reliability will not
result when power is applied to an input pin.
Output voltage
VO
Indicates voltage range within which damage or reduced reliability will not
result when power is applied to an output pin.
Output current
IO
Indicates absolute tolerance values for DC current to prevent damage or
reduced reliability when current flows out of or into an output pin.
Operating temperature
TA
Indicates the ambient temperature range for normal logic operations.
Storage temperature
Tstg
Indicates the element temperature range within which damage or reduced
reliability will not result while no voltage or current are applied to the device.
Terms Used in Recommended Operating Range
Parameter
Symbol
Meaning
Power supply voltage
VDD33,
VDD33REG
Indicates the voltage range for normal logic operations to occur when VSS = 0
V.
High-level input voltage
VIH
Indicates the voltage, applied to the input pins of the device, which indicates
the high level state for normal operation of the input buffer.
* If a voltage that is equal to or greater than the “Min.” value is applied, the
input voltage is guaranteed as high level voltage.
Low-level input voltage
VIL
Indicates the voltage, applied to the input pins of the device, which indicates
the low level state for normal operation of the input buffer.
* If a voltage that is equal to or less than the “Max.” value is applied, the
input voltage is guaranteed as low level voltage.
Hysteresis voltage
VH
Indicates the differential between the positive trigger voltage and the negative
trigger voltage.
Input rise time
tri
Indicates allowable input rise time to input signal transition time from
0.1 × VDD to 0.9 × VDD.
Input fall time
tfi
Indicates allowable input fall time to input signal transition time from
0.9 × VDD to 0.1 × VDD.
Data Sheet S17462EJ6V0DS
9
μPD720114
Terms Used in DC Characteristics
Parameter
Off-state output leakage current
Symbol
IOZ
Meaning
Indicates the current that flows into a 3-state output pin when it is in a highimpedance state and a voltage is applied to the pin.
Output short circuit current
IOS
Indicates the current that flows from an output pin when it is shorted to GND
pins.
Input leakage current
II
Indicates the current that flows into an input pin when a voltage is applied to
the pin.
Low-level output current
IOL
Indicates the current that flows to the output pins when the rated low-level
output voltage is being applied.
High-level output current
IOH
Indicates the current that can flow out of an output pin in the high-level state
without reducing the output voltage below the specified VOH. (A negative
current indicates current flowing out of the pin.)
10
Data Sheet S17462EJ6V0DS
μPD720114
2.3
Electrical Specifications
Absolute Maximum Ratings
Parameter
Symbol
Power supply voltage
VDD33,VDD33REG
Input/output voltage
VI/VO
Condition
3.0 V ≤ VDD33 ≤ 3.6 V
3.3 V input/output voltage
Rating
Unit
−0.5 to +4.6
V
−0.5 to +4.6
V
−0.5 to +6.6
V
10
40
mA
mA
VI /VO < VDD33 + 1.0 V
3.0 V ≤ VDD33 ≤ 3.6 V
5 V input/out voltage
VI /VO < VDD33 + 3.0 V
Output current
IO
IOL = 3 mA
IOL = 12 mA
Operating temperature
TA
0 to +85
°C
Storage temperature
Tstg
−65 to +150
°C
Caution Product quality may suffer if the absolute maximum rating is exceeded even momentarily for any
parameters. That is, the absolute maximum ratings are rated values at which the product is on the
verge of suffering physical damage, and therefore the product must be used under conditions
that ensure that the absolute maximum ratings are not exceeded.
The ratings and conditions indicated for DC characteristics and AC characteristics represent the
quality assurance range during normal operation.
Recommended Operating Ranges
Parameter
Symbol
Operating voltage
VDD33,VDD33REG
High-level input voltage
VIH
Condition
Min.
Typ.
Max.
Unit
3.3 V for VDD33 pins
3.14
3.30
3.46
V
3.3 V High-level input voltage
2.0
VDD33
V
5.0 V High-level input voltage
2.0
5.5
V
3.3 V Low-level input voltage
0
0.8
V
5.0 V Low-level input voltage
0
0.8
V
5 V Hysteresis voltage
0.3
1.5
V
3.3 V Hysteresis voltage
0.2
1.0
V
10
ms
Low-level input voltage
Hysteresis voltage
VIL
VH
Input rise time for SYSRSTB
trst
Input rise time
tri
Normal buffer
0
200
ns
Schmitt buffer
0
10
ms
Normal buffer
0
200
ns
Schmitt buffer
0
10
ms
Input fall time
tfi
Data Sheet S17462EJ6V0DS
11
μPD720114
DC Characteristics (VDD33 = 3.14 to 3.46 V, TA = 0 to +70 °C)
Control Pin Block
Parameter
Off-state output leakage current
Symbol
IOZ
Output short circuit current
IOS
Low-level output current
IOL
Condition
Min.
VO = VDD33, VDD25 or VSS
Note
Max.
Unit
±10
μA
−250
mA
3.3 V low-level output current (3 mA)
VOL = 0.4 V
3
mA
3.3 V low-level output current (12 mA)
VOL = 0.4 V
12
mA
3.3 V high-level output current (3 mA)
VOH = 2.4 V
−3
mA
3.3 V high-level output current (12
VOH = 2.4 V
−12
mA
High-level output current
IOH
mA)
Input leakage current
II
3.3 V buffer
VI = VDD or VSS
±10
μA
5.0 V buffer
VI = VDD or VSS
±10
μA
Note The output short circuit time is measured at one second or less and is tested with only one pin on the LSI.
12
Data Sheet S17462EJ6V0DS
μPD720114
USB Interface Block
Parameter
Symbol
Conditions
Includes RS resistor
Min.
Max.
Unit
40.5
49.5
Ω
3.6
V
Output pin impedance
ZHSDRV
Termination voltage for upstream facing
port pullup (full-speed)
VTERM
3.0
High-level input voltage (drive)
VIH
2.0
High-level input voltage (floating)
VIHZ
2.7
Low-level input voltage
VIL
Differential input sensitivity
VDI
⏐(D+) − (D−)⏐
0.2
Differential common mode range
VCM
Includes VDI range
0.8
2.5
V
High-level output voltage
VOH
RL of 14.25 kΩ to GND
2.8
3.6
V
Low-level output voltage
VOL
RL of 1.425 kΩ to 3.6 V
0.0
0.3
V
SE1
VOSE1
0.8
Output signal crossover point voltage
VCRS
1.3
2.0
V
High-speed squelch detection threshold
(differential signal)
VHSSQ
100
150
mV
High-speed disconnect detection
threshold (differential signal)
VHSDSC
525
625
mV
High-speed data signaling common
mode voltage range
VHSCM
−50
+500
mV
High-speed differential input signaling
levels
See Figure 2-4.
Input Levels for Low-/full-speed:
V
3.6
V
0.8
V
V
Output Levels for Low-/full-speed:
V
Input Levels for High-speed:
Output Levels for High-speed:
High-speed idle state
VHSOI
−10.0
+10
mV
High-speed data signaling high
VHSOH
360
440
mV
High-speed data signaling low
VHSOL
−10.0
+10
mV
Chirp J level (different signal)
VCHIRPJ
700
1100
mV
Chirp K level (different signal)
VCHIRPK
−900
−500
mV
Data Sheet S17462EJ6V0DS
13
μPD720114
Figure 2-1. Differential Input Sensitivity Range for Low-/full-speed
Differential Input Voltage Range
Differential Output
Crossover
Voltage Range
-1.0
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
2.2
2.4
2.6
2.8
3.0
3.2
Input Voltage Range (Volts)
Figure 2-2. Full-speed Buffer VOH/IOH Characteristics for High-speed Capable Transceiver
VDD−3.3
VDD−2.8 VDD−2.3
VDD−1.8 VDD−1.3 VDD−0.8
VDD−0.3 VDD
0
IOUT (mA)
−20
−40
Min.
−60
Max.
−80
VOUT (V)
Figure 2-3. Full-speed Buffer VOL/IOL Characteristics for High-speed Capable Transceiver
80
Max.
IOUT (mA)
60
Min.
40
20
0
0
0.5
1
1.5
2
VOUT (V)
14
Data Sheet S17462EJ6V0DS
2.5
3
4.6
μPD720114
Figure 2-4. Receiver Sensitivity for Transceiver at DP/DM
Level 1
+400 mV
Differential
Point 3
Point 1
Point 4
0V
Differential
Point 2
Point 5
Point 6
−400 mV
Differential
Level 2
0%
100%
Unit Interval
Figure 2-5. Receiver Measurement Fixtures
Test Supply Voltage
15.8 Ω
USB
Connector
Nearest
Device
VBUS
D+
DGND
15.8 Ω
143 Ω
50 Ω
Coax
50 Ω
Coax
+
To 50 Ω Inputs of a
High Speed Differential
Oscilloscope, or 50 Ω
Outputs of a High Speed
Differential Data Generator
−
143 Ω
Data Sheet S17462EJ6V0DS
15
μPD720114
Power Consumption
Parameter
Power Consumption
Symbol
PW-0
Condition
Typ.
Unit
31
86
mA
mA
Hub controller is operating at full-speed mode.
36
mA
Hub controller is operating at high-speed mode.
120
mA
Hub controller is operating at full-speed mode.
38
mA
Hub controller is operating at high-speed mode.
134
mA
Hub controller is operating at full-speed mode.
41
mA
Hub controller is operating at high-speed mode.
149
mA
10
μA
220
μA
The power consumption under the state without suspend. All
the ports do not connect to any function.
Note 1
Hub controller is operating at full-speed mode.
Hub controller is operating at high-speed mode.
PW-2
The power consumption under the state without suspend.
The number of active ports is 2.
PW-3
The power consumption under the state without suspend.
The number of active ports is 3.
PW-4
Note 2
The power consumption under unplug and the hub in idle
state.
PW_S
Note 2
The power consumption under the state without suspend.
The number of active ports is 4.
PW-UNP
Note 2
Note 3
The power consumption under plug (VBUS ON) and the hub in
suspend state.
Note 4
Notes 1. Ports available but inactive or unplugged do not add to the power consumption.
2. The power consumption depends on the number of ports available and actively operating.
3. If the μPD720114 is locally powered and the upstream facing port is unplugged, μPD720114 goes into
suspend state and downstream facing port VBUS goes down.
4. If the upstream VBUS in OFF state, the power consumption is same as PW-UNP.
16
Data Sheet S17462EJ6V0DS
μPD720114
AC Characteristics (VDD33 = 3.14 to 3.46 V, TA = 0 to +70 °C)
Pin capacitance
Parameter
Symbol
Condition
Min.
Max.
Unit
Input capacitance
CI
VDD = 0 V, TA = 25 °C
6
pF
Output capacitance
CO
fC = 1 MHz
6
pF
I/O capacitance
CIO
Unmeasured pins returned to 0 V
6
pF
System Clock Ratings
Parameter
Symbol
Clock frequency
fCLK
Condition
Crystal
Min.
Typ.
Max.
Unit
−500
30
+500
MHz
ppm
Clock Duty cycle
tDUTY
40
ppm
50
60
%
Remarks 1. Recommended accuracy of clock frequency is ± 100 ppm.
2. Required accuracy of X’tal is including initial frequency accuracy, the spread of X’tal capacitor
loading, supply voltage, temperature, and aging, etc.
System Reset Timing
Parameter
Reset active time (Figure 2-6)
Symbol
Conditions
trst
Min.
5
Max.
Unit
μs
Figure 2-6. System Reset Timing
trst
SYSRSTB
Data Sheet S17462EJ6V0DS
17
μPD720114
Over-current Response Timing
Parameter
Symbol
Condition
Min.
Over-current response time from CSB low tOC
Typ.
4
Max.
Unit
5
ms
to PPB high (Figure 2-7)
Figure 2-7. Over-current Response Timing
CSB(4:1)
tOC
PPB(4:1)
Figure 2-8. CSB/PPB Timing
4 ms
Hub power supply
4 ms
4 ms
4 ms
Bus reset
Up port D+ line
PPB pin output
CSB pin input
Output
cut-off
Device
connection
inrush current
Port power
supply ON
Overcurrent
generation
CSB pin operation region
Bus power: Up port connection
Self power: Power supply ON
Remark
CSB detection
delay time
The active period of the CSB pin is in effect only when the PPB pin is ON.
There is a delay time of approximately 4 ms duration at the CSB pin.
18
Data Sheet S17462EJ6V0DS
CSB active
period
μPD720114
USB Interface Block
(1/4)
Parameter
Symbol
Conditions
Min.
Max.
Unit
Low-speed Electrical Characteristics
Rise time (10% to 90%)
tLR
CL = 200 pF to 600 pF
75
300
ns
Fall time (90% to 10%)
tLF
CL = 200 pF to 600 pF
75
300
ns
80
125
%
1.49925
1.50075
Mbps
tDDJ1
tDDJ2
−25
−14
+25
+14
ns
ns
tUJR1
tUJR2
−152
−200
+152
+200
ns
ns
Source SE0 interval of EOP (Figure 2-14)
tLEOPT
1.25
1.5
μs
Receiver SE0 interval of EOP (Figure 2-14)
tLEOPR
670
Note
Differential rise and fall time matching
tLRFM
(tLR/tLF)
Low-speed data rate
tLDRATHS
Average bit rate
Downstream facing port source jitter total
(including frequency tolerance) (Figure
2-13):
To next transition
For paired transitions
Downstream facing port differential receiver
jitter total (including frequency tolerance)
(Figure 2-15):
To next transition
For paired transitions
ns
Width of SE0 interval during differential
transition
tLST
210
ns
Hub differential data delay (Figure 2-11)
tLHDD
300
ns
Hub differential driver jitter (including cable)
(Figure 2-11):
Downstream facing port
tLDHJ1
tLDHJ2
−45
−15
+45
+15
ns
ns
tLUHJ1
tLUHJ2
−45
−45
+45
+45
ns
ns
tLSOP
−60
+60
ns
Hub EOP delay relative to tHDD (Figure 2-12)
tLEOPD
0
200
ns
Hub EOP output width skew (Figure 2-12)
tLHESK
−300
+300
ns
4
20
ns
4
20
ns
90
111.11
%
11.9940
12.0060
Mbps
0.9995
1.0005
ms
To next transition
For paired transitions
Upstream facing port
To next transition
For paired transitions
Data bit width distortion after SOP (Figure
2-11)
Full-speed Electrical Characteristics
Rise time (10% to 90%)
tFR
CL = 50 pF,
RS = 36 Ω
Fall time (90% to 10%)
tFF
CL = 50 pF,
RS = 36 Ω
Differential rise and fall time matching
tFRFM
(tFR/tFF)
Full-speed data rate
tFDRATHS
Average bit rate
Frame interval
tFRAME
Note Excluding the first transition from the Idle state.
Data Sheet S17462EJ6V0DS
19
μPD720114
(2/4)
Parameter
Symbol
Conditions
Min.
Max.
Unit
42
ns
−3.5
−4.0
+3.5
+4.0
ns
ns
−2
+5
ns
−18.5
−9
+18.5
+9
ns
ns
175
ns
Full-speed Electrical Characteristics (Continued)
Consecutive frame interval jitter
tRFI
No clock adjustment
Note
Source jitter total (including frequency
tolerance) (Figure 2-13):
To next transition
For paired transitions
Source jitter for differential transition to SE0
transition (Figure 2-14)
tDJ1
tDJ2
tFDEOP
Receiver jitter (Figure 2-15):
To Next Transition
For Paired Transitions
tJR1
tJR2
Source SE0 interval of EOP (Figure 2-14)
tFEOPT
160
Receiver SE0 interval of EOP (Figure 2-14)
tFEOPR
82
Width of SE0 interval during differential
transition
tFST
14
ns
tHDD1
tHDD2
70
44
ns
ns
ns
Hub differential data delay (Figure 2-11)
(with cable)
(without cable)
Hub differential driver jitter (including cable)
(Figure 2-11):
tHDJ1
tHDJ2
−3
−1
+3
+1
ns
ns
Data bit width distortion after SOP (Figure
2-11)
tFSOP
−5
+5
ns
Hub EOP delay relative to tHDD (Figure 2-12)
tFEOPD
0
15
ns
Hub EOP output width skew (Figure 2-12)
tFHESK
−15
+15
ns
Rise time (10% to 90%)
tHSR
500
ps
Fall time (90% to 10%)
tHSF
500
ps
Driver waveform
See Figure 2-9.
High-speed data rate
tHSDRAT
479.760
480.240
Mbps
Microframe interval
tHSFRAM
124.9375
125.0625
μs
Consecutive microframe interval difference
tHSRFI
4 highspeed
Bit
times
Data source jitter
See Figure 2-9.
Receiver jitter tolerance
See Figure 2-4.
Hub data delay (without cable)
tHSHDD
36 highspeed+4 ns
Bit
times
Hub data jitter
See Figure 2-4, Figure 2-9.
Hub delay variation range
tHSHDV
5 highspeed
Bit
times
To next transition
For paired transitions
High-speed Electrical Characteristics
Note Excluding the first transition from the Idle state.
20
Data Sheet S17462EJ6V0DS
μPD720114
(3/4)
Parameter
Symbol
Conditions
Min.
Max.
Unit
2.5
2.5
2000
12000
μs
μs
2.5
μs
Hub Event Timings
Time to detect a downstream facing port
tDCNN
connect event (Figure 2-17):
Awake hub
Suspended hub
Time to detect a disconnect event at a hub’s
downstream facing port (Figure 2-16)
tDDIS
2.0
Duration of driving resume to a downstream
port (only from a controlling hub)
tDRSMDN
20
Time from detecting downstream resume to
rebroadcast
tURSM
Duration of driving reset to a downstream
facing port (Figure 2-18)
tDRST
Time to detect a long K from upstream
ms
1.0
ms
10
20
ms
tURLK
2.5
100
μs
Time to detect a long SE0 from upstream
tURLSE0
2.5
10000
μs
Duration of repeating SE0 upstream (for
low-/full-speed repeater)
tURPSE0
23
FS Bit
times
Inter-packet delay (for high-speed) of
packets traveling in same direction
tHSIPDSD
88
Bit
times
Inter-packet delay (for high-speed) of
packets traveling in opposite direction
tHSIPDOD
8
Bit
times
Inter-packet delay for device/root hub
tHSRSPIPD1
Only for a SetPortFeature
(PORT_RESET) request
192
response with detachable cable for highspeed
Time of which a Chirp J or Chirp K must be
tFILT
Bit
times
μs
2.5
continuously detected (filtered) by hub or
device during Reset handshake
Time after end of device Chirp K by which
tWTDCH
100
μs
hub must start driving first Chirp K in the
hub’s chirp sequence
tDCHBIT
40
60
μs
Time before end of reset by which a hub
must end its downstream chirp sequence
tDCHSE0
100
500
μs
Time from internal power good to device
pulling D+ beyond VIHZ (Figure 2-18)
tSIGATT
100
ms
Debounce interval provided by USB system
software after attach (Figure 2-18)
tATTDB
100
ms
Maximum duration of suspend averaging
interval
tSUSAVGI
1
s
Period of idle bus before device can initiate
resume
tWTRSM
5
Duration of driving resume upstream
tDRSMUP
1
Time for which each individual Chirp J or
Chirp K in the chirp sequence is driven
downstream by hub during reset
Data Sheet S17462EJ6V0DS
ms
15
ms
21
μPD720114
(4/4)
Parameter
Symbol
Conditions
Min.
Max.
Unit
Hub Event Timings (Continued)
Resume recovery time
tRSMRCY
Remote-wakeup is
enabled
10
Time to detect a reset from upstream for
non high-speed capable devices
tDETRST
Reset recovery time (Figure 2-18)
tRSTRCY
Inter-packet delay for full-speed
tIPD
Inter-packet delay for device response with
detachable cable for full-speed
tRSPIPD1
6.5
Bit
times
SetAddress() completion time
tDSETADDR
50
ms
Time to complete standard request with no
data
tDRQCMPLTND
50
ms
Time to deliver first and subsequent (except
last) data for standard request
tDRETDATA1
500
ms
Time to deliver last data for standard
request
tDRETDATAN
50
ms
Time for which a suspended hub will see a
tFILTSE0
2.5
tWTRSTFS
2.5
3000
ms
tWTREV
3.0
3.125
ms
tWTRSTHS
100
875
ms
Minimum duration of a Chirp K on upstream
from a hub within the reset protocol
tUCH
1.0
Time after start of SE0 on upstream by
tUCHEND
7.0
ms
Time between detection of downstream chip
and entering high-speed state
tWTHS
500
μs
Time after end of upstream Chirp at which
tWTFS
2.5
ms
2.5
ms
10000
μs
10
ms
2
Bit
times
μs
continuous SE0 on upstream before
beginning the high-speed detection
handshake
Time a hub operating in non-suspended fullspeed will wait after start of SE0 on
upstream before beginning the high-speed
detection handshake
Time a hub operating in high-speed will wait
after start of SE0 on upstream before
reverting to full-speed
Time a hub will wait after reverting to fullspeed before sampling the bus state on
upstream and beginning the high-speed will
wait after start of SE0 on upstream before
reverting to full-speed
ms
which a hub will complete its Chirp K within
the reset protocol
hub reverts to full-speed default state if no
downstream Chirp is detected
22
Data Sheet S17462EJ6V0DS
1.0
μPD720114
Figure 2-9. Transmit Waveform for Transceiver at DP/DM
+400 mV
Differential
Level 1
Point 3
Point 4
Point 1
0V
Differential
Point 2
Point 5
Point 6
−400 mV
Differential
Level 2
Unit Interval
0%
100%
Figure 2-10. Transmitter Measurement Fixtures
Test Supply Voltage
15.8 Ω
USB
Connector
Nearest
Device
VBUS
D+
DGND
15.8 Ω
143 Ω
50 Ω
Coax
50 Ω
Coax
+
To 50 Ω Inputs of a
High Speed Differential
Oscilloscope, or 50 Ω
Outputs of a High Speed
Differential Data Generator
−
143 Ω
Data Sheet S17462EJ6V0DS
23
μPD720114
Timing Diagram
Figure 2-11. Hub Differential Delay, Differential Jitter, and SOP Distortion
Upstream
End of
Cable
Crossover
Point
Upstream
Port of Hub
50% Point of
Initial Swing
VSS
VSS
Downstream
Port of Hub
Hub Delay
Downstream
tHDD1
VSS
50% Point of
Initial Swing
Hub Delay
Downstream
tHDD2
Downstream
Port of Hub
VSS
A. Downstream Hub Delay with Cable
B. Downstream Hub Delay without Cable
Downstream
Port of Hub
Crossover
Point
VSS
Upstream Port
or
End of Cable
Hub Delay
Upstream
tHDD1
tHDD2
VSS
Crossover
Point
C. Upstream Hub Delay with or without Cable
Upstream end of cable
Upstream port
Downstream port
Receptacle
Plug
Host or
Hub
Hub
Function
Downstream signaling
Upstream signaling
D. Measurement Points
Hub Differential Jitter:
tHDJ1 = tHDDx(J) − tHDDx(K) or tHDDx(K) − tHDDx(J) Consecutive Transitions
tHDJ2 = tHDDx(J) − tHDDx(J) or tHDDx(K) − tHDDx(K) Paired Transitions
Bit after SOP Width Distortion (same as data jitter for SOP and next J transition):
tFSOP = tHDDx(next J) − tHDDx(SOP)
Low-speed timings are determined in the same way for:
tLHDD, tLDHJ1, tLDJH2, tLUHJ1, tLUJH2, and tLSOP
24
Data Sheet S17462EJ6V0DS
μPD720114
Figure 2-12. Hub EOP Delay and EOP Skew
Upstream
End of
Cable
50% Point of
Initial Swing
Upstream
Port of Hub
VSS
Crossover
Point
Extended
VSS
tEOP- tEOP+
tEOP- tEOP+
Downstream
Port of Hub
Downstream
Port of Hub
VSS
VSS
A. Downstream EOP Delay with Cable
B. Downstream EOP Delay without Cable
Crossover
Point
Extended
Downstream
Port of Hub
VSS
tEOP-
tEOP+
Crossover
Point
Extended
Upstream Port
or
End of Cable
VSS
C. Upstream EOP Delay with or without Cable
EOP Delay:
tFEOPD = tEOPy − tHDDx
(tEOPy means that this equation applies to tEOP- and tEOP+)
EOP Skew:
tFHESK = tEOP+ − tEOPLow-speed timings are determined in the same way for:
tLEOPD and tLHESK
Data Sheet S17462EJ6V0DS
25
μPD720114
Figure 2-13. USB Differential Data Jitter for Low-/full-speed
tPERIOD
Differential
Data Lines
Crossover
Points
Consecutive
Transitions
N × tPERIOD + txDJ1
Paired
Transitions
N × tPERIOD + txDJ2
Figure 2-14. USB Differential-to-EOP Transition Skew and EOP Width for Low-/full-speed
tPERIOD
Differential
Data Lines
Crossover
Point Extended
Crossover
Point
Diff. Data-toSE0 Skew
N × tPERIOD + txDEOP
Source EOP Width: tFEOPT
tLEOPT
Receiver EOP Width: tFEOPR
tLEOPR
Figure 2-15. USB Receiver Jitter Tolerance for Low-/full-speed
tPERIOD
Differential
Data Lines
txJR
txJR1
Consecutive
Transitions
N × tPERIOD + txJR1
Paired
Transitions
N × tPERIOD + txJR2
26
Data Sheet S17462EJ6V0DS
txJR2
μPD720114
Figure 2-16. Low-/full-speed Disconnect Detection
D+/D−
VIHZ (min)
VIL
D−/D+
VSS
tDDIS
Device
Disconnected
Disconnect
Detected
Figure 2-17. Full-/high-speed Device Connect Detection
D+
VIH
D−
VSS
tDCNN
Device
Connected
Connect
Detected
Figure 2-18. Power-on and Connection Events Timing
Hub port
power OK
Reset recovery
time
Attatch detected
Hub port
power-on
≥ 4.01 V
t2SUSP
VBUS
VIH (min)
VIH
D+
or
D−
Δt1
tSIGATT
tATTDB
Data Sheet S17462EJ6V0DS
tDRST
USB system software
reads device speed
tRSTRCY
27
μPD720114
3.
PACKAGE DRAWINGS
• μPD720114GA-9EU-A
48-PIN PLASTIC TQFP (FINE PITCH) (7x7)
A
B
detail of lead end
25
24
36
37
S
P
C
T
D
R
48
13
12
1
L
U
Q
F
G
J
H
I
M
K
S
N
S
M
NOTE
ITEM
Each lead centerline is located within 0.10 mm of
its true position (T.P.) at maximum material condition.
A
B
MILLIMETERS
9.0±0.2
7.0±0.2
C
7.0±0.2
D
F
9.0±0.2
0.75
G
0.75
H
0.22 +0.05
−0.04
I
0.10
J
0.5 (T.P.)
K
L
1.0±0.2
0.5
0.17 +0.03
−0.07
M
N
0.08
P
1.0±0.1
Q
0.1±0.05
3°+4°
−3°
R
S
1.27 MAX.
T
0.25 (T.P.)
U
0.6±0.15
P48GA-50-9EU-1
28
Data Sheet S17462EJ6V0DS
μPD720114
• μPD720114GA-YEU-A
48-PIN PLASTIC TQFP (FINE PITCH)(7x7)
HD
D
detail of lead end
36
A3
25
37
24
c
θ
E
L
Lp
HE
L1
13
48
1
12
(UNIT:mm)
ZE
e
ZD
b
x
M
S
A
A2
ITEM
D
DIMENSIONS
7.00±0.20
E
7.00±0.20
HD
9.00±0.20
HE
9.00±0.20
A
1.20 MAX.
A1
0.10±0.05
A2
1.00±0.05
A3
b
S
c
L
y
A1
S
NOTE
Each lead centerline is located within 0.08 mm of
its true position at maximum material condition.
Lp
0.60±0.15
L1
θ
1.00±0.20
3° +5°
−3°
e
0.50
x
0.08
y
0.08
ZD
0.75
ZE
Data Sheet S17462EJ6V0DS
0.25
0.22±0.05
0.145 +0.055
−0.045
0.50
0.75
P48GA-50-YEU
29
μPD720114
<R> • μPD720114K9-4E4-A
40-PIN PLASTIC VQFN(6x6)
x4
t S A B
B
HD
D
DETAIL OF
E
HE
A
PART
A2
A
A1
A
c
x4
f S A B
y1
S
(UNIT:mm)
A
ITEM
S
y
S
EXPOSED DIE PAD
D2
1
10
D
5.75
E
5.75
HD
6.00
HE
6.00
A
0.85 ± 0.05
A1
0.00 to 0.05
A2
c
0.65 ± 0.05
+
0.23 0.07
0.05
0.20
e
0.50
b
11
40
E2
31
20
21
30
Lp
e
b
30
x1 M
S A B
x2 M
S
DIMENSIONS
f
0.10
Lp
0.40 ± 0.10
t
0.10
x1
0.10
x2
0.05
y
0.05
y1
0.10
D2
4.30 ± 0.10
E2
4.30 ± 0.10
P40K9-50-4E4
NEC Electronics Corporation 2009
Data Sheet S17462EJ6V0DS
μPD720114
4.
RECOMMENDED SOLDERING CONDITIONS
The μPD720114 should be soldered and mounted under the following recommended conditions.
For soldering methods and conditions other than those recommended below, contact an NEC Electronics sales
representative.
For technical information, see the following website.
Semiconductor Device Mount Manual (http://www.necel.com/pkg/en/mount/index.html)
• μPD720114GA-9EU-A: 48-pin plastic TQFP (Fine pitch) (7 × 7)
<R>
• μPD720114GA-YEU-A: 48-pin plastic TQFP (Fine pitch) (7 × 7)
• μPD720114K9-4E4-A: 40-pin plastic QFN (6 × 6)
Soldering Method
Infrared reflow
Soldering Conditions
Peak package’s surface temperature: 260 °C, Reflow time: 60 seconds or less
(220 °C or higher), Maximum allowable number of reflow processes: 3,
Exposure limit
Note
Symbol
IR60-107-3
: 7 days (10 to 72 hours pre-backing is required at 125C°
afterwards),
Flux: Rosin flux with low chlorine (0.2 Wt% or below) recommended.
<Caution>
Non-heat-resistant trays, such as magazine and taping trays, cannot be baked
before unpacking.
Partial heating method
Pin temperature: 300°C or below,
–
Heat time: 3 seconds or less (per each side of the device) ,
Flux: Rosin flux with low chlorine (0.2 Wt% or below) recommended.
Note The Maximum number of days during which the product can be stored at a temperature of 5 to 25°C and a
relative humidity of 20 to 65% after dry-pack package is opened.
Data Sheet S17462EJ6V0DS
31
μPD720114
[MEMO]
32
Data Sheet S17462EJ6V0DS
μPD720114
NOTES FOR CMOS DEVICES
(1) VOLTAGE APPLICATION WAVEFORM AT INPUT PIN: Waveform distortion due to input noise or a reflected
wave may cause malfunction. If the input of the CMOS device stays in the area between VIL (MAX) and VIH
(MIN) due to noise, etc., the device may malfunction. Take care to prevent chattering noise from entering the
device when the input level is fixed, and also in the transition period when the input level passes through the
area between VIL (MAX) and VIH (MIN).
(2) HANDLING OF UNUSED INPUT PINS: Unconnected CMOS device inputs can be cause of malfunction. If
an input pin is unconnected, it is possible that an internal input level may be generated due to noise, etc.,
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS
devices must be fixed high or low by using pull-up or pull-down circuitry. Each unused pin should be
connected to VDD or GND via a resistor if there is a possibility that it will be an output pin. All handling
related to unused pins must be judged separately for each device and according to related specifications
governing the device.
(3) PRECAUTION AGAINST ESD: A strong electric field, when exposed to a MOS device, can cause destruction
of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of
static electricity as much as possible, and quickly dissipate it when it has occurred. Environmental control
must be adequate. When it is dry, a humidifier should be used. It is recommended to avoid using insulators
that easily build up static electricity. Semiconductor devices must be stored and transported in an anti-static
container, static shielding bag or conductive material. All test and measurement tools including work benches
and floors should be grounded. The operator should be grounded using a wrist strap. Semiconductor
devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with
mounted semiconductor devices.
(4) STATUS BEFORE INITIALIZATION: Power-on does not necessarily define the initial status of a MOS device.
Immediately after the power source is turned ON, devices with reset functions have not yet been initialized.
Hence, power-on does not guarantee output pin levels, I/O settings or contents of registers. A device is not
initialized until the reset signal is received. A reset operation must be executed immediately after power-on
for devices with reset functions.
(5) POWER ON/OFF SEQUENCE: In the case of a device that uses different power supplies for the internal
operation and external interface, as a rule, switch on the external power supply after switching on the internal
power supply. When switching the power supply off, as a rule, switch off the external power supply and then
the internal power supply. Use of the reverse power on/off sequences may result in the application of an
overvoltage to the internal elements of the device, causing malfunction and degradation of internal elements
due to the passage of an abnormal current. The correct power on/off sequence must be judged separately for
each device and according to related specifications governing the device.
(6) INPUT OF SIGNAL DURING POWER OFF STATE : Do not input signals or an I/O pull-up power supply while
the device is not powered. The current injection that results from input of such a signal or I/O pull-up power
supply may cause malfunction and the abnormal current that passes in the device at this time may cause
degradation of internal elements. Input of signals during the power off state must be judged separately for
each device and according to related specifications governing the device.
Data Sheet S17462EJ6V0DS
33
μPD720114
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