AMD NPT Family 0Fh Processor Electrical Data Sheet Publication # 31119 Revision: 3.00 Issue Date: August 2006 Advanced Micro Devices © 2004–2006 Advanced Micro Devices, Inc. All rights reserved. The contents of this document are provided in connection with Advanced Micro Devices, Inc. (“AMD”) products. AMD makes no representations or warranties with respect to the accuracy or completeness of the contents of this publication and reserves the right to make changes to specifications and product descriptions at any time without notice. The information contained herein may be of a preliminary or advance nature and is subject to change without notice. No license, whether express, implied, arising by estoppel or otherwise, to any intellectual property rights is granted by this publication. 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PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Contents 1 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2 HyperTransport™ Technology Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.1 HyperTransport™ Technology Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . 8 2.2 HyperTransport Technology Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 10 2.3 HyperTransport Internal Termination . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 2.4 HyperTransport Technology Pin States During Reset and Power Management States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 3 DDR2 SDRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 3.1 DDR2 SDRAM Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 3.2 DDR2 SDRAM Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 3.3 DDR2 SDRAM Output Pin States during Reset, S1, and S3 . . . . . . . . . . . . . . . . . . 27 4 Miscellaneous Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 4.1 CLKIN_H/L Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 4.2 VID Interface Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 4.3 Miscellaneous Input Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 4.4 Miscellaneous Output Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 4.5 Miscellaneous Bi-Directional Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 4.6 Miscellaneous Pin States During Reset and Power Management States . . . . . . . . . . 32 5 Thermal Diode and Thermal Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 5.1 Thermal Diode Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 5.2 THERMTRIP_L Thermal Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 6 Power Supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 6.1 Power Supply and PWROK Relationships . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 6.2 PWROK Sequencing Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 6.3 Power-Up (S3/S4/S5/G2 Exit) Power Sequencing Group Requirements . . . . . . . . . 36 6.4 Powerdown (S4/S5/G2 Entry) and Power Failure (G3 Entry) Power Sequencing Group Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 6.5 S3 Entry Power Sequencing Group Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . 37 7 Signal Sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 7.1 Power-Up Power Supply and Signal Sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 8 Internal Termination Reference Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Contents 3 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet List of Figures Figure 1. RTT = (VTT – Vx)/Ix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Figure 2. Output Switching . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Figure 3. The tCKS Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Figure 4. The tDQS Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Figure 5. The tDSS and tDSH Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Figure 6. The tDQSQV and tDQSQIV Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . 23 Figure 7. The t1 Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Figure 8. The t2 Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Figure 9. The t3 Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Figure 10. The t4 Timing Parameter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Figure 11. CLKIN_H/L Waveform Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 Figure 12. Power-Up Power Supply and Signal Sequencing . . . . . . . . . . . . . . . . . . . . . . . 39 List of Figures 4 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet List of Tables Table 1. Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Table 2. Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Table 3. DC Operating Conditions for HyperTransport™ Technology Interface . . . . . . . . 8 Table 4. AC Operating Conditions for HyperTransport Technology Interface . . . . . . . . . . 9 Table 5. HyperTransport Technology Interface Timing Characteristics . . . . . . . . . . . . . . 10 Table 6. Internal Termination for HyperTransport Technology Interface . . . . . . . . . . . . . 10 Table 7. HyperTransport Technology Output Pin States During Reset, S1, and S3 . . . . . 11 Table 8. DDR2 Pin Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Table 9. DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Table 10.AC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Table 11.Input Capacitance of DDR2 SDRAM Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Table 12.Output Slew Rate of DDR2 SDRAM Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Table 13.Input Slew Rate of DDR2 SDRAM Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Table 14.M*_DATA*, M*_DQS_*, M*_DM*, M*_CHECK*, M*_CLK_* Driver Characteristics 1.0x . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Table 15.Address, Command, Control and Data Driver Characteristics 1.5x . . . . . . . . . . 19 Table 16.Address, Command and Control Driver Characteristics 2.0x . . . . . . . . . . . . . . . 20 Table 17.Electrical AC Timing Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Table 18.DDR2 SDRAM Output Pin States During Reset, S1, and S3 . . . . . . . . . . . . . . . 27 Table 19.Operating Conditions for CLKIN_H/L . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 Table 20.Combined AC and DC Operating Conditions for VID[5:0], and PSI_L . . . . . . . 29 Table 21.Combined AC and DC Operating Conditions for RESET_L, LDTSTOP_L, and PWROK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Table 22.Combined AC and DC Operating Conditions for TCK, TDI, TMS, TRST_L, and DBREQ_L . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Table 23.Combined AC and DC Operating Conditions for TDO, DBRDY . . . . . . . . . . . 30 Table 24.Combined AC and DC Operating Conditions for THERMTRIP_L . . . . . . . . . . 31 Table 25.Combined AC and DC Operating Conditions for PROCHOT_L . . . . . . . . . . . . 31 Table 26.Miscellaneous Output Pin States During Reset, S1, and S3 . . . . . . . . . . . . . . . . 32 Table 27.Miscellaneous Input Pin Requirements During Reset, S1, and S3 . . . . . . . . . . . 32 Table 28.Thermal Diode Specifications for Socket F (1207) and Socket AM2 Processors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Table 29.Thermal Diode Specifications for Socket S1g1 Processors . . . . . . . . . . . . . . . . . 34 Table 30.Platform Thermal Protection Limits for the Processor . . . . . . . . . . . . . . . . . . . . 35 Table 31.Power Sequencing Group Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 32.Internal Termination for Miscellaneous Pins Interface and Test Pins . . . . . . . . . 40 List of Tables 5 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 1. Revision History Date Revision Description August 2006 3.00 Initial public release. 6 PID: 31119 Rev 3.00- August 2006 1 AMD NPT Family 0Fh Processor Electrical Data Sheet Absolute Maximum Ratings Stresses greater than those listed in Table 2 may cause permanent damage to the device and motherboard. Systems using this device must be designed to ensure that these parameters are not violated. Violation of these ratings voids the product warranty. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 2. Absolute Maximum Ratings Characteristic Range Storage Temperature –55oC to 85oC VLDT supply voltage relative to VSS –0.3 V to 1.5 V VDD supply voltage relative to VSS –0.3 V to 1.65 V VTT supply voltage relative to VSS –0.3 V to 1.1 V (see Note 1) VDDIO supply voltage relative to VSS –0.3 V to 2.2 V (see Note 1) VDDA supply voltage relative to VSS –0.3 V to 3.0 V M_VREF input voltage relative to VSS –0.3 V to VDDIO + 0.3 V Input voltage relative to VSS for HyperTransport™ technology interface –0.3 V to VLDT + 0.3 V Differential input voltage for HyperTransport technology interface –1.5 V to 1.5 V Input voltage relative to VSS for DDR2 SDRAM memory interface and Miscellaneous pins –0.3 V to VDDIO + 0.3 V (see Note 2) Notes: 1.See “Power Supply and PWROK Relationships” on page 36 for the relationship between VDDIO and VTT. 2.The input voltage of these pins can momentarily go to –1.0 V during capacitor charging prior to PWROK assertion. In Section 3, see the various operating condition tables on DDR2 pins and Miscellaneous pins for the relationship between these pins and VDDIO. Absolute Maximum Ratings 7 PID: 31119 Rev 3.00- August 2006 2 AMD NPT Family 0Fh Processor Electrical Data Sheet HyperTransport™ Technology Interface 2.1 HyperTransport™ Technology Operating Conditions Table 3. DC Operating Conditions for HyperTransport™ Technology Interface Symbol Parameter Unit Min Typ Max Notes VOD Output differential voltage mV 495 600 715 1, 2 VOCM Output common mode voltage mV 495 600 715 1, 2 VID Input differential voltage mV 100 600 1000 1, 2 VICM Input common mode voltage mV 440 600 780 1, 2 DeltaVOD Change in VOD from 0 to 1 state mV –15 0 15 1 DeltaVOCM Change in VOCM from 0 to 1 state mV –15 0 15 1 DeltaVID Change in VID from 0 to 1 state mV –15 0 15 1 DeltaVICM Change in VICM from 0 to 1 state mV –15 0 15 1 Il Input leakage current μA –500 500 IOZ Output tristate leakage current mA –1 1 RTT Input differential impedance Ohm 90 100 110 RON Output driver impedance Ohm 45 50 55 DeltaRON Change in RON driving 0=>1 or 1=>0 % 0 0 5 Notes: 1. Measured by comparing each signal voltage with respect to ground. 2. Measured at <100 MHz, considered slow enough to attain both 0 and 1 logic state voltage levels without AC transients on signals and supplies. HyperTransport™ Technology Interface 8 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 4. AC Operating Conditions for HyperTransport™ Technology Interface Symbol Parameter Unit Min Typ Max Notes VOD Output differential voltage mV 400 600 820 1 VOCM Output common mode voltage mV 440 600 780 1 VID Input differential voltage mV 200 600 900 1, 3 VICMAC Peak-to-peak magnitude of input common mV mode voltage 350 1, 3 DeltaVOD Change in VOD from 0 to 1 State mV –75 75 1 DeltaVOCM Change in VOCM from 0 to 1 State mV –50 50 1 DeltaVID Change in VID from 0 to 1 State mV –125 125 1 TIR Input rising slew rate V/ns 2.0 8.0 2, 3 TIF Input falling slew rate V/ns 2.0 8.0 2, 3 TOR Output rising slew rate V/ns 2.5 8.0 4 TOF Output falling slew rate V/ns 2.5 8.0 4 CIN Input pad capacitance, 600 MHz, 800 MHz, 1.0 GHz pF 2 5 COUT Output pad capacitance, 600 MHz, 800 MHz, 1.0 GHz pF 3 5 CDELTA CIN pad capacitance range across group pF 0.5 Notes: 1. Measured by comparing each signal voltage with respect to ground. 2. Measured differentially between ±100 mV. 3. Only simulated at the receive die pad. This parameter is intended to give guidance for simulation. It is guaranteed by design and cannot be tested on a tester. 4. Output slew rates are measured differentially between ±200 mV. 5. CIN and COUT are measured with a time domain reflectometer (TDR) set to a low repeat rate or equivalent measurement technique. HyperTransport™ Technology Interface 9 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 2.2 HyperTransport™ Technology Timing Characteristics Table 5. HyperTransport™ Technology Interface Timing Characteristics Symbol Parameter Unit Min Typ TCADV Transmitter output CAD/CTLOUT valid relative to CLKOUT, 200 MHz ps 695 1, 5 Transmitter output CAD/CTLOUT valid relative to CLKOUT, 400 MHz ps 345 1, 5 Transmitter output CAD/CTLOUT valid relative to CLKOUT, 600 MHz ps 234 1, 5 Transmitter output CAD/CTLOUT valid relative to CLKOUT, 800 MHz ps 166 1, 5 Transmitter output CAD/CTLOUT valid relative to CLKOUT, 1.0 GHz ps 183 1, 4, 5 TCADVRS Receiver input CADIN valid time to CLKIN ps 92 1, 3 TCADVRH Receiver input CADIN valid time from CLKIN ps 105 1, 3 TPHERR Accumulated phase error, CLKIN_H/L to ps L*_CLKOUT_H/L[1:0] TSU Device setup time ps 85 1, 2 THLD Device hold time ps 98 1, 2 0 Max Notes 5000 Notes: 1. All timing measurement points are at the zero crossing points of differential pairs. 2. Only simulated at the receive die pad. This parameter is intended to give guidance for data bus simulation. It is guaranteed by design and cannot be tested on a tester. 3. Measured at the receiver pins. 4. TCADV of 183 ps for 1000 MHz operation implies a maximum TX CAD to CLK skew of 67 ps at the device pins. Refer to the HyperTransport™ I/O Link Specification for further details. 5. Measured at the transmitter pins into the ideal test load described in the HyperTransport™ I/O Link Specification. 2.3 HyperTransport™ Internal Termination Table 6. Internal Termination for HyperTransport™ Technology Interface Pin Internal Termination Value Tolerance L*_CADIN* Differential RTT 100 ohms (PVT-compensated) ±10% L*_CTLIN* Differential RTT 100 ohms (PVT-compensated) ±10% L*_CLKIN* Differential RTT 100 ohms (PVT-compensated) ±10% HyperTransport™ Technology Interface 10 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 2.4 HyperTransport™ Technology Pin States During Reset and Power Management States The default pin states for HyperTransport™ Technology output pins during reset and ACPI power management states are listed in Table 7. Chapter 7, on page 38, contains additional information and requirements for signal sequencing for certain input and output pins. Table 7. HyperTransport™ Technology Output Pin States During Reset, S1, and S3† Pin Name Reset S1 S3 Comments L*_CLKOUT* T Z Z Tristated in S1 only if programmed to do so. L*_CTLOUT* 0 Z Z Tristated in S1 only if programmed to do so. L*_CADOUT* 1 Z Z Tristated in S1 only if programmed to do so. † Notes: • • For differential pins “0” and “1” refer to the high-end differential output. Low-end differential outputs are inverted. Definition of pin states: • X—Either logic 1 or logic 0. • Z—Tristated. • T—Toggling between 0 and 1. HyperTransport™ Technology Interface 11 PID: 31119 Rev 3.00- August 2006 3 AMD NPT Family 0Fh Processor Electrical Data Sheet DDR2 SDRAM 3.1 DDR2 SDRAM Operating Conditions In this chapter, some DDR2 pins are grouped together and given group names. The groups are defined in the following Table 8. Table 8. DDR2 Pin Groups Pin group names Pins Address M*_ADD*, M*_BANK* Command M*_RAS_L, M*_CAS_L, M*_WE_L, M*_PAR Control M*_CS_L, M*_ODT and M*_CKE* Data M*_DATA*, M*_DQS*, M*_DM*, M*_CHECK*, M*_CLK* The notes for Table 9 through Table 13 on page 15 begin on page 15. Table 9. DC Operating Conditions Symbol Parameter Unit Min Typ Max Notes VREF Reference voltage (for I/O) V 0.49* VDDIO_dc 0.50* VDDIO_dc 0.51* VDDIO_dc 2 VTT Termination voltage (for I/O) V 0.50* VDDIO_dc 0.50* VDDIO_dc 0.50* VDDIO_dc 2 Il Input leakage current mA Any input: 0 < VIN < VDDIO V (All other pins not under test = 0 V) –1 1 1 Ioz Output leakage current mA Any output: 0 < VOUT < VDDIO V –1 1 1 VIH Input high voltage (logic 1) V VREF + 0.125 – – 3 VIL Input low voltage (logic 0) V – VREF – 0.125 3 VOH Output high voltage (logic 1) for Data and M*_RESET_L pins (1x drive strength) V 1.34 (1.18) VOL Output low voltage (logic 0) for Data and M*_RESET_L pins (1x drive strength) V IOH Output levels -Output high current for Data and M*_RESET_L pins (VOUT= VDDIO/2) (1x drive strength) mA –19.0 DDR2 SDRAM – 20, 24 –22.5 0.38 (0.53) 20, 24 –29.5 4, 24 12 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 9. DC Operating Conditions (Continued) Symbol Parameter Unit Min Typ Max Notes IOL Output levels - Output low current for Data and M*_RESET_L pins (VOUT=VDDIO/2) (1x drive strength) mA 19.0 22.5 28.0 4, 24 VOH V Output high voltage (Logic 1) for Address, Command, Control, Data and M*_RESET_L pins (1.5x drive strength) VOL V Output low voltage (Logic 0) for Address, Command, Control, Data and M*_RESET_L pins (1.5x drive strength) IOH Output levels – Output high current mA for Address, Command, Control, Data and M*_RESET_L pins (VOUT= VDDIO/2) (1.5x drive strength) –27.0 IOL Output levels – Output low current for mA Address, Command, Control, Data and M*_RESET_L pins (VOUT= VDDIO/2) (1.5x drive strength) 27.5 VOH Output high voltage (logic 1) for Address, Command, and Control pins (2.0x drive strength) V 1.45 (1.32) VOL Output low voltage (logic 0) for Address, Command and Control pins (2.0x drive strength) V IOH Output levels – Output high current mA for Address, Command and Control pins (VOUT= VDDIO/2) (2.0x drive strength) –37.0 IOL Output levels – Output low current mA for Address, Command and Control pins (VOUT= VDDIO/2) (2.0x drive strength) VID Differential Input voltage (for M*_DQS_*) 1.40 (1.26) 20, 25, 28 0.30 (0.46) 20, 25, 28 –34.0 –45.0 4, 25, 28 33.5 42.0 4, 25, 28 20, 26, 28 0.25 (0.38) 20, 26, 28 –45.0 –61.0 4, 26, 28 37.0 45.0 57.0 4, 26, 28 V 0.25 - - 5 mV –200 - 200 6 Delta VSwing Difference in voltage swing mV between M*_DQS_* and associated M*_DATA* –300 0 300 22 VICM Input common mode voltage (for M*_DQS_*) V 0.7 0.9 1.1 7 VOD Differential output voltage (for M*_CLK_* and M*_DQS_*) V 1.18 (0.87) - - 9, 20 Delta VID Change in VID magnitude DDR2 SDRAM 13 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 9. DC Operating Conditions (Continued) Symbol Parameter Unit Min Typ Max Notes VOCM Output common mode voltage (for M*_CLK_* and M*_DQS_*) V 0.75 0.9 1.05 11, 20 RTT On-die termination Ohm 75 or 150 or 300 13 Table 10. AC Operating Conditions Symbol Parameter Unit Min VREF Reference voltage (for I/O) V VTT Termination voltage (for I/O) VIH Typ Max Notes VREF(DC) – 2% VREF(DC) + 2% 2 V VREF(DC) – 0.075 VREF(DC) + 0.075 2 Input high voltage (logic 1) V VREF + 0.2 – VDDIO + 0.15 3 VIL Input low voltage (logic 0) V – 0.15 – VREF – 0.2 3 VID Differential input voltage (for M*_DQS_*) V 0.5 – VDDIO + 0.3 5 Delta VID Change in VID magnitude mV –400 400 VIX Input crosspoint voltage mV 0.5* 0.5* VDDIO_dc – VDDIO_dc 250 0.5* 21 VDDIO_dc + 250 Delta VICM Change in VICM magnitude mV –50 – 50 8 Delta VOCM Change in VOCM magnitude mV –30 – 30 12, 20 VOX Output crosspoint voltage mV 0.5* 0.5* VDDIO_dc – VDDIO_dc 125 6 0.5* 23, 20 VDDIO_dc + 125 Table 11. Input Capacitance of DDR2 SDRAM Signals Symbol Parameter Unit Min Typ Max Notes Cin Input capacitance (M*_DATA*, M*_DQS_*,) pF 1.3 1.8 2.3 27 Delta C Delta input capacitance pF – – 0.4 14 Table 12. Output Slew Rate of DDR2 SDRAM Signals Symbol Parameter Unit Min Typ Max Notes SOUT Output slew rate (pullup and pulldown) – 1.0x Drive Strength V/ns 2 5 10 15 DDR2 SDRAM 14 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 12. Output Slew Rate of DDR2 SDRAM Signals (Continued) Symbol Parameter Unit Min SOUT Output slew rate (pullup and pulldown) – 1.5x Drive Strength V/ns SOUT Output slew rate (pullup and pulldown) – 2.0x Drive Strength V/ns SOUT_Ratio Output slew rate ratio between pullup and pulldown – 1.0x, 1.5x and 2.0x Drive Strength Typ Max Notes 2 12 15 2 12 15 1.25 16 0.75 1 Table 13. Input Slew Rate of DDR2 SDRAM Signals Symbol Parameter Unit 400 MT/s 533 MT/s 667 MT/s 800 MT/s Min Max Min Max Min Max Min Max Notes Sin Input slew rate — single-ended signals V/ns 0.5 2.5 0.5 2.5 0.5 2.5 0.5 2.5 17 Sin Input slew rate — differential signals V/ns 1 5 1.0 5 1.0 5 1.0 5 17 Smismatch Input slew rate mismatch between M*_DQS_* and associated M*_DATA*/M*_CHE CK* V/ns –0.2 0.2 –0.2 0.2 –0.2 0.2 –0.5 0.5 18 Smismatch Input slew rate mismatch between M*_DQS_* and associated M*_DATA*/M*_CHE CK* V/ns –0.5 0.5 –0.5 0.5 –0.5 0.5 N/A 19 Notes: 1. Leakage current is measured when the pin is configured to high-impedance state and with all on-die termination disabled. 2. VREF and VTT are expected to be equal to 0.5*VDDIO and to track variations in the DC level of the same. 3. The AC values indicate the voltage levels at which the receiver must meet its timing specifications. The DC values indicate the voltage levels at which the final logic state of the receiver is unambiguously defined. The receiver effectively switches to the new logic state when receiver input crosses the AC level. The new logic state is maintained as long as the input stays beyond the DC threshold. 4. Table 14 on page 18, Table 15 on page 19, and Table 16 on page 20 show the pullup and pulldown driver characteristics. Typical: 25o C (TAmbient), VDDIO_dc=1.8 V, Typical process Minimum: 70o C (TAmbient), VDDIO_dc=1.7 V, Slow-slow process Maximum: 0o C (TAmbient), VDDIO_dc=1.9 V, Fast-fast process 5. VID is the input differential voltage or the voltage difference between the true and complement under DC or AC conditions. DDR2 SDRAM 15 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 6. Delta VID is the change in magnitude between the input differential voltage while receiving a Logic 0 and while receiving a Logic 1. Delta VID represents the change in magnitude from one bit time to next bit time. 7. VICM is the input common mode voltage defined as the average of the true voltage magnitude and the complement voltage magnitude relative to ground under DC conditions. This parameter includes the variation due to power supply. 8. Delta VICM is the change in magnitude between the input common mode voltage while receiving a Logic 0 and while receiving a Logic 1. Delta VICM represents the variation in input common mode voltage from one bit time to next bit time. 9. VOD is the differential output voltage or the voltage difference between true and complement under DC or AC conditions. 10. Delta VOD is the change in magnitude between the differential output voltage while driving a Logic 0 and while driving a Logic 1. 11. VOCM is the output common mode voltage defined as the average of the true voltage magnitude and the complement voltage magnitude relative to ground under DC or AC conditions. 12. Delta VOCM is the change in magnitude between the output common mode voltage while driving a Logic 0 and while driving a Logic 1. 13. The RTT value is programmable depending on system configuration. The tolerance for each value is 20%. This termination applies to all M*_DATA*, M*_DQS_* when enabled. This specification is guaranteed by design and characterization only. To characterize, apply some voltage Vx at the pin and measure the current Ix. RTT = (VTT – Vx)/Ix. VTT RTT CPU Input Pin Figure 1. RTT = (VTT – Vx)/Ix 14. Delta C means the difference in capacitance between any M*_DATA*/DQS_* pin to any other M*_DATA*/DQS_* pin. 15. Pullup and pulldown slew rate is measured into RTT (50 ohms) to VTT. The slew rate is measured between VREF + 250 mV. It is guaranteed for any pattern of data, including all outputs switching and only one output switching. VTT RTT Driver 0 pF Figure 2. Output Switching DDR2 SDRAM 16 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 16. The ratio of pullup slew rate to pulldown slew rate is specified for the same temperature and voltage, over the entire temperature and voltage range. For a given output, it represents the maximum difference between pullup and pulldown drivers due to process variation. 17. The slew rate is measured at the CPU pin between VREF + 125 mV for single-ended signals. For differential input signal, the slew rate is measured differentially at the CPU pin between + 250 mV. The single-ended input slew rate parameter also applies to the M*_ERR_L pin. 18. When nominal slew rate of an input signal (M*_DQS_* or its associated M*_DATA*) is 1.5 V/ns or less at the processor pin, then the slew rate mismatch between M*_DQS_* and its associated M*_DATA* is maximum of + 200 mV/ns from the nominal slew rate. 19. When nominal slew rate of an input signal (M*_DQS_* or its associated M*_DATA*) is 1.5 V/ns or higher at the processor pin, then the slew rate mismatch between M*_DQS_* and its associated M*_DATA* is maximum of + 500 mV/ns from the nominal slew rate. The absolute highest slew rate at processor pin is 2.5 V/ns. 20. The values are defined assuming that output test load is 50 ohms to VTT. The value in parentheses is for output test load assuming 25 ohms to VTT. . 21. The typical value of VIX is expected to be 0.5*VDDIO of the transmitting device and is expected to track variations in VDDIO. VIX indicates the voltage at which differential input signals must cross over one bit time to any other bit time. VIX consists of input slew rate mismatch, trace mismatch between differential signals, input capacitive mismatch, crosstalk noise, etc. 22. During a given bit time, Delta VSwing is the difference in voltage swing between M*_DQS_* and associated M*_DATA*. The voltage swing for M*_DQS_H* and M*_DQS_L* is measured single-ended. 23. The typical value of VOX is expected to be 0.5*VDDIO of the transmitting device and is expected to track variations in VDDIO. VOX indicates the voltage at which differential output signals must cross over one bit time to any other bit time. VOX consists of output slew rate mismatch, package trace mismatch between differential signals, crosstalk noise, etc. 24. The specification assumes nominal drive strength of 40 ohms. If drive strength is adjusted, the specification also changes. 25. The specification assumes nominal drive strength of 27 ohms. If drive strength is adjusted, the specification also changes. 26. The specification assumes nominal drive strength of 20 ohms. If drive strength is adjusted, the specification also changes. 27. This parameter is measured at the “pad” and not at the package pin. The “pad” capacitance includes all parasitics capacitance from the pad silicon, through the C4 plus package landing pad and via to the start of the package trace. This is guaranteed by design and verification. 28. These parameters are generated based on the specification of the memory controller pins only, and it does not represent the actual system loading environment. DDR2 SDRAM 17 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 14. M*_DATA*, M*_DQS_*, M*_DM*, M*_CHECK*, M*_CLK_* Driver Characteristics 1.0x Pulldown Current (mA) Pullup Current (mA) Voltage Minimum Typical Maximum Minimum Typical Maximum 0 0.0 0.0 0.0 –26.2 –33.0 –42.9 0.1 2.6 3.0 3.7 –25.5 –32.0 –41.5 0.2 5.2 6.0 7.3 –24.8 –31.0 –40.1 0.3 7.7 9.0 10.8 –24.1 –29.8 –38.6 0.4 10.2 11.8 14.2 –23.4 –28.6 –37.2 0.5 12.5 14.4 17.5 –22.6 –27.4 –35.8 0.6 14.7 16.9 20.5 –21.7 –26.2 –34.3 0.7 16.6 19.2 23.2 –20.7 –25.0 –32.9 0.8 18.2 21.0 25.4 –19.6 –23.8 –31.5 0.9 19.5 22.5 27.2 –18.2 –22.5 –30.0 1.0 20.5 23.7 28.6 –16.5 –20.9 –28.6 1.1 21.3 24.9 30.1 –14.5 –18.9 –27.0 1.2 22.1 26.0 31.5 –12.4 –16.7 –25.0 1.3 22.9 27.0 33.0 –10.1 –14.3 –22.7 1.4 23.7 28.0 34.4 –7.7 –11.6 –20.0 1.5 24.3 29.0 35.8 –5.2 –8.9 –17.1 1.6 24.9 30.0 37.3 –2.6 –6.0 –13.9 1.7 25.5 31.0 38.7 0.0 –3.0 –10.6 32.0 40.0 0.0 –7.2 1.8 1.9 41.2 –3.6 DDR2 SDRAM 18 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 15. Address, Command, Control and Data Driver Characteristics 1.5x Pulldown Current (mA) Pullup Current (mA) Voltage Minimum Typical Maximum Minimum Typical Maximum 0 0.0 0.0 0.0 –38.0 –49.5 –64.2 0.1 3.8 4.6 5.6 –37.0 –48.7 –62.2 0.2 7.6 9.1 11.1 –36.0 –46.3 –60.2 0.3 11.3 13.4 16.5 –35.0 –44.7 –58.1 0.4 14.8 17.7 21.6 –33.9 –42.9 –56.1 0.5 18.2 21.7 26.6 –32.7 –41.1 –54.0 0.6 21.3 25.4 31.1 –31.5 –39.3 –52.0 0.7 24.1 28.7 35.2 –30.0 –37.5 –49.9 0.8 26.5 31.6 38.7 –28.4 –35.7 –47.9 0.9 28.3 33.8 41.4 –26.3 –33.8 –45.7 1.0 29.7 35.4 43.5 –23.9 –31.3 –43.5 1.1 31.0 37.0 45.5 –21.1 –28.4 –41.1 1.2 32.2 38.6 47.6 –18.0 –25.1 –38.1 1.3 33.3 40.2 49.7 –14.7 –21.4 –34.6 1.4 34.4 41.8 51.7 –11.2 –17.5 –30.5 1.5 35.3 43.4 53.8 –7.6 –13.3 –26.0 1.6 36.2 45.0 55.8 –3.8 –9.0 –21.3 1.7 37.0 46.6 57.7 0.0 –4.6 –16.2 48.2 59.5 0.0 –11.0 1.8 1.9 61.4 –5.5 DDR2 SDRAM 19 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 16. Address, Command and Control Driver Characteristics 2.0x Pulldown Current (mA) Pullup Current (mA) Voltage Minimum Typical Maximum Minimum Typical Maximum 0 0.0 0.0 0.0 –51.2 –66.0 –86.7 0.1 5.2 6.1 7.6 –49.9 –63.8 –84.1 0.2 10.3 12.1 15.1 –48.6 –61.6 –81.4 0.3 15.2 17.9 22.3 –47.2 –59.4 –78.7 0.4 20.0 23.5 29.3 –45.7 –57.2 –76.1 0.5 24.5 28.9 35.9 –44.1 –54.8 –73.2 0.6 28.7 33.9 42.1 –42.4 –52.4 –70.3 0.7 32.5 38.3 47.7 –40.5 –50.0 –67.4 0.8 35.6 42.1 52.3 –38.3 –47.6 –64.6 0.9 38.1 45.0 56.0 –35.5 –45.0 –61.7 1.0 40.1 47.3 58.8 –32.2 –41.8 –58.8 1.1 41.7 49.5 61.5 –28.4 –37.9 –55.6 1.2 43.3 51.7 64.1 –24.3 –33.4 –51.6 1.3 44.9 53.9 66.8 –19.8 –28.5 –46.8 1.4 46.3 56.0 69.5 –15.1 –23.3 –41.3 1.5 47.6 58.0 72.2 –10.2 –17.7 –35.2 1.6 48.8 60.0 74.8 –5.2 –12.0 –28.7 1.7 49.8 62.0 77.4 0.0 –6.1 –21.9 64.0 79.9 0.0 –14.8 1.8 1.9 82.3 –7.5 3.2 DDR2 SDRAM Timing Characteristics Table 17. Electrical AC Timing Characteristics Symbol Parameter Unit Min tCK M*_CLK_* cycle time ps tCH M*_CLK_* high pulse width tCL Typ Max Notes 2500 10000 17 ps 0.47*tCK 0.53*tCK M*_CLK_* low pulse width ps 0.47*tCK 0.53*tCK tCKS M*_CLK_* output skew ps tDQSH M*_DQS_* high pulse width ps tDQSL M*_DQS_* low pulse width ps tDQS M*_CLK_* to M*_DQS_* ps 225 1,2,3 0.45*tCK 0.55*tCK 1 0.45*tCK 0.55*tCK 1 225 1,4,5 DDR2 SDRAM 20 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 17. Electrical AC Timing Characteristics (Continued) Symbol Parameter Unit Min Typ tDSS M*_DQS_* falling edge to M*_CLK_* rising edge ps 0.45*tCK – 250 1,6,7 tDSH M*_CLK_* rising edge to M*_DQS_* falling edge ps 0.45*tCK – 250 1,6,7 tDQSQV M*_DQS_* to M*_DATA* shift (when data becomes valid) ps –{tCK/4 + 225} tCK/4 –{tCK/4 – 225} 1,8,9 tDQSQIV M*_DQS_* to M*_DATA* shift (when data becomes in-valid) ps {tCK/4 – 225} tCK/4 {tCK/4 + 225} 1,8,9 t1 M*_ADD/CMD to M*_CLK_* (Unbuffered DIMM environment M*_ADD/CMD are launched 1 clock early) ps 225 1,10, 11 t2 M*_ADD/CMD to M*_CLK_* (unbuffered DIMM environment M*_ADD/CMD are launched 3/4 clock early) ps 225 1,10, 12 t3 M*_ADD/CMD to M*_CLK_* (Registered DIMM environment M*_ADD/CMD are launched 1/2 clock early) ps 225 1,10, 13 t4 M*_DATA* edge arrival relative to ps M*_DQS_* {tCK/4 – 210} 14,15,1 6 –{tCK/4 – 210} Max Notes Notes: 1. Write cycle timing parameter. 2. The skew consists of pad skew and package routing skew between any two clock pairs. 3. Figure 3 shows the tCKS timing parameter: M*_CLK_L* tCK M*_CLK_H* M*_CLK_L* tCKS Max M*_CLK_H* Figure 3. The tCKS Timing Parameter 4. The timing consists of pad skew and package routing skew between any clock and any M*_DQS_* pair. DDR2 SDRAM 21 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 5. Figure 4 shows the tDQS timing parameter: M*_CLK_L* tCK M*_CLK_H* M*_DQS_H*, M*_DQS_L* tDQS Max Figure 4. The tDQS Timing Parameter 6. The skew consists of pad output skew and package routing skew between any clock pair to any M*_DQS_* pair. 7. Figure 5 shows the tDSS and tDSH timing parameter: M*_CLK_L* tCK M*_CLK_H* tDSS Min M*_DQS_H*, M*_DQS_L* M*_DQS_H*, M*_DQS_L* tDSH Min Figure 5. The tDSS and tDSH Timing Parameter 8. During write, M*_DATA* signals are driven quarter clock earlier such that M*_DQS_* is placed in the center of data eye window. The skew consists of pad skew, package routing skew between any M*_DQS_* signals and its associated M*_DATA* signals (within a byte or nibble) and maximum clock granularity. 9. Figure 6 on page 23 shows the tDQSQV and tDQSQIV timing parameter. This timing parameter applies only within M*_DQS_* and its associated M*_DATA* signals. DDR2 SDRAM 22 PID: 31119 Rev 3.00- August 2006 M*_CLK_L* AMD NPT Family 0Fh Processor Electrical Data Sheet tCK M*_CLK_H* M*_DQS_H*, M*_DQS_L* Ideal 90o phase shift — tDQSQV typical M*_DATA* tDQSQV Max — latest time data can become valid M*_DATA* M*_DATA* tDQSQV Min — earliest time data can become valid Ideal 90o phase shift — tDQSQIV typical M*_DATA* tDQSQIV Max — latest time data can become invalid M*_DATA* M*_DATA* tDQSQIV Min — earliest time data can become invalid Figure 6. The tDQSQV and tDQSQIV Timing Parameter 10. The skew consists of pad output skew and package routing skew between any clock pair to any M*_ADD/CMD/CTRL signals. 11. Figure 7 on page 24 shows the t1 timing parameter (unbuffered DIMM environment only). The M*_ADD/CMD signals are launched 1 clock early. DDR2 SDRAM 23 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet . M*_CLK_L* tCK M*_CLK_H* tCK/2 tCK/2 M*_ADD/CMD t1 (Ideal timing) t1 max M*_ADD/CMD Figure 7. The t1 Timing Parameter 12. Figure 8 shows the t2 timing parameter (unbuffered DIMM environment only). The M*_ADD/CMD signals are launched 3/4 clock early. The granularity term is included in this parameter only. M*_CLK_L* tCK M*_CLK_H* 3/4*tCK tCK/4 M*_ADD/CMD t2 (Ideal timing) t2 max M*_ADD/CMD Figure 8. The t2 Timing Parameter 13. Figure 9 on page 25 shows the t3 timing parameter (registered DIMM environment only). The M*_ADD/CMD signals are launched 1/2 clock cycle early. DDR2 SDRAM 24 PID: 31119 Rev 3.00- August 2006 M*_CLK_L* AMD NPT Family 0Fh Processor Electrical Data Sheet tCK M*_CLK_H* tCK/2 tCK/2 M*_ADD/CMD t3 =0 (Ideal timing) t3 max M*_ADD/CMD Figure 9. The t3 Timing Parameter 14. Read cycle timing parameter. 15. The sum of all uncertainty contains PDL placement uncertainty, package routing skew mismatch, setup and hold time of the flop and the receiver uncertainty. 16. Figure 10 on page 26 shows the t4 timing parameter. DDR2 SDRAM 25 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet M*_DQS_H/L* M*_DATAs Perfect Edge Aligned t4 = 0 ps t4 Max M*_DATAs Late arrival from strobe t4 Max t4 Min M*_DATAs Early arrival from strobe t4 Min setup Sum of all skews Figure 10. The t4 Timing Parameter 17. The slow operation of 10-ns cycle time is specifically included for functional test purpose only. All electrical characterization is performed at full speed; however, all functional tests are performed at 10-ns cycle time. 18. This parameter is intended to give guidance for DRAM data bus simulation. It cannot be tested on a tester. It is guaranteed by design. DDR2 SDRAM 26 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 3.3 DDR2 SDRAM Output Pin States during Reset, S1, and S3 The default pin states for DDR2 SDRAM output pins during reset and ACPI power management states are listed in Table 18. Chapter 7, on page 38, contains additional information and requirements for signal sequencing for certain input and output pins. Table 18. DDR2 SDRAM Output Pin States During Reset, S1, and S3† Pin Name Reset S1 S3 Comments M*_CLK_* 0 Z Z Tristated in S1 only under AltVid and only if programmed to do so. M*_DQS_* Z Z Z M*_CKE* 0 0 0 M*_DATA* Z Z Z M*_CHECK* Z Z Z M*_ERR* X X X M*_PAR* 0 Z Z M*_CS_L* 0 Z Z M*_ODT* 0 Z Z M*_RAS_L 0 Z Z M*_CAS_L 0 Z Z M*_WE_L 0 Z Z M*_ADD* 0 Z Z M*_BANK* 0 Z Z M*_RESET_L 0 0 0 M_ZN 0 0 Z M_ZP 1 1 Z In S3, M*_RESET_L is forced to Logic 0. † Notes: • • For differential pins “0” and “1” refer to the high-end differential output. Low-end differential outputs are inverted. Definition of pin states: • X—Either logic 1 or logic 0. • Z—Tristated. • T—Toggling between 0 and 1. DDR2 SDRAM 27 PID: 31119 Rev 3.00- August 2006 4 AMD NPT Family 0Fh Processor Electrical Data Sheet Miscellaneous Pins 4.1 CLKIN_H/L Pins Table 19. Operating Conditions for CLKIN_H/L Symbol Parameter Unit Min Typ Max Notes VIH Input high voltage mV VDDIO + 150 1 VIL Input low voltage mV 0 VICM Input common mode voltage mV 700 Delta VCROSS Change in crossover point voltage over all edges mV F Input frequency range MHz 198.8 200 ppm Long term accuracy ppm –300 300 5 SFALL Input falling edge slew rate V/ns –10 –1.2 2,6 SRISE Input rising edge slew rate V/ns 1.2 10 2,6 TJC Jitter, cycle-to-cycle ps 0 200 7 VID Differential input voltage mV 250 Delta VID Change in VID_dc cycle-to-cycle mV –150 150 9 CIN Input capacitance pF 0 3 2 DC Duty cycle % 30 70 10 1 1100 3 400 4 8 Notes: 1.Single-ended measurement using absolute voltages. Refer to Figure 11 on page 29. 2.Only simulated at the receive die pad. This parameter is intended to give guidance for simulation. It is guaranteed by design and cannot be tested on a tester. 3.Single-ended measurement using mathematical function (average voltage of CLKIN_H and CLKIN_L). 4.Single-ended measurement at crossover point. Value is max - min over all time. Refer to Figure 11 on page 29. 5.Measured with spread spectrum turned off. 6.Differential measurement through the range of ±250 mV. Refer to Figure 11 on page 29. 7.Maximum difference of tCYCLE between any two adjacent cycles. 8.Magnitude of differential measurement. Refer to Figure 11 on page 29. 9.The difference in magnitude of two adjacent VID_dc measurements. 10.Defined as tHIGH / tCYCLE. Refer to Figure 11 on page 29. Miscellaneous Pins 28 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet CLKIN_H DeltaVCROSS CLKIN_L VIL VIH VICM CLKIN(H-L) 250m 0V VID SRISE 250m SFALL tHIGH tCYCLE Figure 11. CLKIN_H/L Waveform Diagram 4.2 VID Interface Pins Table 20. Combined AC and DC Operating Conditions for VID[5:0], and PSI_L Symbol Parameter Unit Min Typ Max VOH Output high voltage (logic 1) @ IOH = 5 mA V 0.83 * VDDIO VDDIO VOL Output low voltage (logic 0) @ IOL = V –5 mA VSS 0.18 * VDDIO IOH Output high current (VOUT = Min VOH) mA 5 IOL Output low current (VOUT = Max VOL) mA IOZ Output leakage current mA –1 1 SOUT Output slew rate V/ns 1 10 Notes –5 Miscellaneous Pins 29 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 4.3 Miscellaneous Input Pins Table 21. Combined AC and DC Operating Conditions for RESET_L, LDTSTOP_L, and PWROK Symbol Parameter Unit Min Typ Max VIH Input high voltage (logic 1) mV 0.58 * VDDIO VDDIO VIL Input low voltage (logic 0) mV VSS 0.42 * VDDIO IL Input leakage current mA –1 1 CIN Input capacitance pF SIN Input slew rate V/ns Notes 4 0.01 1 Notes: 1.Minimum input slew rate specification is based on HyperTransport™ technology input minimum slew rate specification for single-ended signals. Table 22. Combined AC and DC Operating Conditions for TCK, TDI, TMS, TRST_L, and DBREQ_L Symbol Parameter Unit Min Typ Max VIH Input high voltage (logic 1) mV 0.66 * VDDIO VDDIO VIL Input low voltage (logic 0) mV VSS 0.34 * VDDIO IL Input leakage current mA –1 1 CIN Input capacitance pF SIN Input slew rate V/ns Notes 4 0.50 4.4 Miscellaneous Output Pins Table 23. Combined AC and DC Operating Conditions for TDO, DBRDY Symbol Parameter Unit Min Typ Max VOH Output high voltage (logic 1) @ IOH = 4.2 mA mV 0.83 * VDDIO VDDIO VOL Output low voltage (logic 0) @ IOl mV = –4.2 mA VSS 0.18 * VDDIO IOH Output high current (VOUT = Min VOH) mA 4.2 IOL Output low current (VOUT = Max VOL) mA IOZ Output leakage current mA –1 1 SOUT Output slew rate V/ns 1 10 Notes –4.2 Miscellaneous Pins 30 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 24. Combined AC and DC Operating Conditions for THERMTRIP_L Symbol Parameter Unit Min Typ Max VOL Output low voltage (logic 0) @ IOL = –5 mA mV VSS 0.18 * VDDIO IOZ Output leakage current mA –1 1 IOL Output low current (VOUT = Max VOL) mA SOUT Output slew rate V/ns Notes –5 See Note 1 Notes: 1.Slew rates for open-drain signals are pullup-dependent. 4.5 Miscellaneous Bi-Directional Pins Table 25. Combined AC and DC Operating Conditions for PROCHOT_L Symbol Parameter Unit Min Typ Max VIH Input high voltage (logic 1) mV 0.66 * VDDIO VDDIO VIL Input low voltage (logic 0) mV VSS 0.34 * VDDIO VOL Output low voltage (logic 0) mV VSS 0.18 * VDDIO SIN Input slew rate V/ns See Note 1. SOUT Output slew rate V/ns See Note 1. Notes Notes: 1.Slew rates for open-drain signals are pullup-dependent. Miscellaneous Pins 31 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 4.6 Miscellaneous Pin States During Reset and Power Management States Table 26. Miscellaneous Output Pin States During Reset, S1, and S3† Pin Name Reset S1 S3 SID X X Z VID* X X X PSI_L X X Z TDO X X Z DBRDY 0 0 Z THERMTRIP_L Z X Z PROCHOT_L X X Z Comments † Notes: • • For differential pins “0” and “1” refer to the high-end differential output. Low-end differential outputs are inverted. Definition of pin states: • X—Either logic 1 or logic 0. • Z—Tristated. • T—Toggling between 0 and 1. Table 27. Miscellaneous Input Pin Requirements During Reset, S1, and S3† Pin Name Reset S1 S3 PWROK Refer to Section 7.1 1 on page 38 0 RESET_L Refer to Section 7.1 1 on page 38 0 LDTSTOP_L Refer to Section 7.1 0 on page 38 X Comments † Note: • Definition of pin states: • X—Either logic 1 or logic 0. • Z—Tristated. • T—Toggling between 0 and 1. Miscellaneous Pins 32 PID: 31119 Rev 3.00- August 2006 5 AMD NPT Family 0Fh Processor Electrical Data Sheet Thermal Diode and Thermal Protection An on-die thermal diode is provided as a tool for thermal management. An external thermal monitor is necessary to measure the temperature of the thermal diode. 5.1 Thermal Diode Specifications The specifications for on-die thermal diode for socket F (1207) processors and socket AM2 processors with a lidded package are different from the specifications for socket S1g1 processors with a lidless package as tabulated in the following tables. Refer to the following documents for functional and mechanical details. • Socket F (1207) Processor Functional Data Sheet, order #31118, for socket F (1207) processors. • Socket AM2 Processor Functional Data Sheet, order #31117, for socket AM2 processors. • Socket S1g1 Processor Functional Data Sheet, order #31731, for socket S1g1 processors. Table 28. Thermal Diode Specifications for Socket F (1207) and Socket AM2 Processors Symbol Parameter Units Min Idiode_lidded_pckg Thermal diode sourcing current for processors with lidded package µA o TOffset_lidded_pckg Thermal diode temperature offset for processors with lidded package C Typ Max Notes 5 250 1, 2 –52 10 3, 4, 5, 6 Notes: 1.Thermal diode sourcing current should always be used in forward bias. 2.TOffset supports diode thermal monitor using two sourcing currents only. AMD does not support other sourcing current implementations. 3.TOffset is used to normalize the diode thermal monitor reading to the Tcontrol scale. TOffset should be added to the diode thermal monitor reading. Tcontrol = diode thermal monitor reading +TOffset . System thermal policy should ensure that Tcontrol_max is not exceeded. Tcontrol_max is specified in the appropriate power and thermal data sheet. 4.Thermal solutions should not be designed and validated using the thermal diode. Thermal solutions should be designed and validated against the case temperature specification per the methodology documented in the appropriate processor thermal design guide. 5.TOffset is unique for each processor and is programmed at the factory. TOffset value is found in the Thermtrip Status Register described in the BIOS and Kernel Developer’s Guide for AMD NPT Family 0Fh Processors, order# 32559. 6.If the diode thermal monitor has an ideality factor different from 1.008, a small correction to this offset is required. Contact your diode thermal monitor vendor to determine if additional correction is required. Thermal Diode and Thermal Protection 33 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet Table 29. Thermal Diode Specifications for Socket S1g1 Processors Symbol Parameter Units Min Idiode_lidless_pckg Thermal diode sourcing current for processors with lidless package µA o TOffset_lidless_pckg Thermal diode temperature offset for processors lidless package C Typ Max Notes 5 250 1, 2 –32 0 3, 4, 5 Notes: 1.Thermal diode sourcing current should always be used in forward bias. 2.TOffset supports diode thermal monitor using two sourcing currents only. AMD does not support other sourcing current implementations. 3.TOffset should be added to the diode thermal monitor reading. Tdiode = diode thermal monitor reading +TOffset . 4.TOffset is unique for each processor and is programmed at the factory. TOffset value is found in the Thermtrip Status Register described in the BIOS and Kernel Developer’s Guide for AMD NPT Family 0Fh Processors, order# 32559. 5.If the diode thermal monitor has an ideality factor different from 1.008, a small correction to this offset is required. Contact your diode thermal monitor vendor to determine if additional correction is required. Thermal Diode and Thermal Protection 34 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 5.2 THERMTRIP_L Thermal Protection This section describes the parameters relating to thermal protection. THERMTRIP functionality is a hardware failsafe mechanism to protect the processor from thermal damage. When a factory determined thermal shutdown temperature, TSHUTDOWN , is reached, the processor asserts the THERMTRIP_L signal. Upon sensing the assertion of THERMTRIP_L signal, the motherboard must shut down the voltage on VDD within the specific delay, TSD_DELAY , to prevent thermal damage to the processor. Thermal protection circuitry reference designs and thermal solution guidelines could be found in the following documents: • Socket S1g1 Motherboard Design Guide, order# 33164 • Socket AM2 Motherboard Design Guide, order# 33165 • Socket F (1207) Motherboard Design Guide, order# 33166 Table 30 provides the thermal limits that are necessary to protect the processor from thermal damage. Table 30. Platform Thermal Protection Limits for the Processor Symbol Parameter Description Max Units Notes TSHUTDOWN THERMTRIP shutdown temperature 125 o C 1 TSD_DELAY 500 ms 2 Maximum allowed time from TSHUTDOWN detection to VDD shutdown to prevent thermal damage to the processor Notes: 1.THERMTRIP uses an internal temperature sensor independent of the thermal diode. 2.VDD shutdown is specified within this context as ramping down of the VDD voltage level to 20% of the nominal VDD level at the maximum performance state. Thermal Diode and Thermal Protection 35 PID: 31119 Rev 3.00- August 2006 6 AMD NPT Family 0Fh Processor Electrical Data Sheet Power Supplies 6.1 Power Supply and PWROK Relationships Power supply relationships during power-up, powerdown, and entry and exit of any power management state must be controlled in order to ensure proper operation of the device. Power supplies are arranged into power sequencing groups as shown in Table 31. There are no sequencing requirements between power supplies in the same power sequencing group unless specifically noted. The following sections define the sequencing requirements between the power sequencing groups and their relationship to PWROK. These relationships should be specifically ensured by system power generation and distribution schemes. Chapter 7, on page 38, defines additional signal sequencing requirements for power-up, power-down, and entry and exit of power management states. Table 31. Power Sequencing Group Definitions Power Group A Power Group B Power Group C VDDIO1 VDD VLDT VTT1 VDDA Notes: 1.VDDIO must never exceed VTT by greater than 1.10 V. This relationship must be enforced at all times including powerup, powerdown, and power failure. 6.2 PWROK Sequencing Requirements The following bulleted list shows PWROK sequencing requirements. • All power supplies in all Power Sequencing Groups must be stable and within specification before the assertion of PWROK. Additional power-up sequencing requirements for PWROK are defined and illustrated in Section 7 on page 38. • PWROK must be deasserted when any supply in any Power Sequencing Group is out of specification. 6.3 Power-Up (S3/S4/S5/G2 Exit) Power Sequencing Group Requirements The following bulleted list shows power-up (S3/S4/S5/G2) power sequencing group requirements. • Any special relationships noted within a Power Sequencing Group must be maintained at all times (see Table 31). • All power supplies in Power Sequencing Group A must be stable and within specification before any power supply in Power Sequencing Group B is greater than 10% of its specified typical operating value. • All power supplies in Power Sequencing Group B must be stable and within specification before any power supply in Power Sequencing Group C is greater than 10% of its specified typical operating value. Power Supplies 36 PID: 31119 Rev 3.00- August 2006 AMD NPT Family 0Fh Processor Electrical Data Sheet 6.4 Powerdown (S4/S5/G2 Entry) and Power Failure (G3 Entry) Power Sequencing Group Requirements Any special relationships noted within a Power Sequencing Group must be maintained at all times (see Table 31 on page 36). No sequencing relationships are required between the Power Sequencing Groups during powerdown, Power Failure, or S3 entry. 6.5 S3 Entry Power Sequencing Group Requirements Any special relationships noted within a Power Sequencing Group must be maintained at all times (see Table 31 on page 36). No sequencing relationships are required between the Power Sequencing Groups during powerdown, Power Failure, or S3 entry. DDR2-compatible processors require VDDIO and VTT to remain powered and within specification during S3. All other processor power supply planes are powered down during S3. Power Supplies 37 PID: 31119 Rev 3.00- August 2006 7 AMD NPT Family 0Fh Processor Electrical Data Sheet Signal Sequencing Figure 12 on page 39 illustrates the signal and power supply sequencing requirements during a cold reset (power-up conditions). The HyperTransport™ link reset sequencing is defined in the HyperTransport™ I/O Link Specification. Table 31 on page 36 and Section 6.3 on page 36 define the Power Sequencing Groups and sequencing requirements specific to all system power supplies. 7.1 Power-Up Power Supply and Signal Sequencing The following numbered group shows power-up power supply and signal sequencing. 1. All power supplies in Power Sequencing Group A (defined in Table 31 on page 36) must be within specification before any supply in Power Sequencing Group B (defined in Table 31) is greater than 10% of its specified typical operating value. Additional power up sequencing requirements for Power Sequencing Group A are noted in Table 31. 2. All power supplies in Power Sequencing Group B (defined in Table 31 on page 36) must be within specification before any supply in Power Sequencing Group C (defined in Table 31) is greater than 10% of its specified typical operating value. 3. RESET_L must be asserted a minimum of 1 ms prior to the assertion of PWROK, as defined in the HyperTransport™ I/O Link Specification. CLKIN_H/L must be within specification a minimum of 1 ms prior to the assertion of PWROK. 4. If the JTAG interface is used in a system, the TMS pin must be asserted a minimum of 10 nS before PWROK assertion or TRST_L de-assertion and must be held in the High state a minimum of 10 nS after the assertion of PWROK or TRST_L de-assertion . 5. PWROK remains deasserted at least 1 ms after both CLKIN_H/L and all voltages to the processor are within specification for operation. 6. After PWROK assertion the VID[5:0] signals change from the Metal Mask VID to the value programmed during device manufacturing. 7. LDTSTOP_L must be deasserted a minimum of 1 μs before the deassertion of RESET_L, as defined by the HyperTransport™ I/O Link Specification. 8. RESET_L must remain asserted until the clocks from the transmitters of all HyperTransport devices are stable, and a minimum of 1 ms after PWROK assertion as defined in the HyperTransport™ I/O Link Specification. Signal Sequencing 38 PID: 31119 Rev 3.00- August 2006 Power Sequence Group A Power Sequence Group B Power Sequence Group C RESET_L CLKIN_H/L AMD NPT Family 0Fh Processor Electrical Data Sheet 1 2 2 3 8 3 TMS 4 PWROK VID[5:0] 4 5 Metal Mask VID 6 L0_CLKIN_H/L[1:0] LDTSTOP_L 7 PWROK – 1ms PWROK + 1ms Note: Timing not to scale Figure 12. Power-Up Power Supply and Signal Sequencing Signal Sequencing 39 PID: 31119 Rev 3.00- August 2006 8 AMD NPT Family 0Fh Processor Electrical Data Sheet Internal Termination Reference Information Table 32 shows internal termination for miscellaneous pins interface and test pins. Table 32. Internal Termination for Miscellaneous Pins Interface and Test Pins Pin Internal Termination Min Value Max Value TCK Pullup to VDDIO 1 460 ohms 730 ohms TMS Pullup to VDDIO 1 460 ohms 730 ohms TRST_L Pullup to VDDIO 1 460 ohms 730 ohms TDI Pullup to VDDIO 1 460 ohms 730 ohms DBREQ_L Pullup to VDDIO 1 460 ohms 730 ohms TEST26 Pullup to VDDIO 1 460 ohms 730 ohms TEST27 Pullup to VDDIO 1 460 ohms 730 ohms TEST24 Pulldown to VSS 1 460 ohms 730 ohms TEST20 Pulldown to VSS 1 460 ohms 730 ohms TEST21 Pulldown to VSS 1 460 ohms 730 ohms TEST22 Pulldown to VSS 1 460 ohms 730 ohms TEST12 Pulldown to VSS 1 460 ohms 730 ohms TEST18 Pulldown to VSS 1 460 ohms 730 ohms TEST19 Pulldown to VSS 1 460 ohms 730 ohms Notes: 1.Systems that do not require use of these pins can rely on the internal termination to pull the signals to the proper inactive state. When these pins are used, they must not be driven with open-drain outputs, otherwise additional termination is required. Internal Termination Reference Information 40