H5N1506P Silicon N Channel MOS FET High Speed Power Switching REJ03G0389-0200 Rev.2.00 Jul 03, 2006 Features • Low on-resistance • Low leakage current • High speed switching Outline RENESAS Package code: PRSS0004ZE-A (Package name: TO-3P) D 1. Gate 2. Drain (Flange) 3. Source G 1 2 S 3 Absolute Maximum Ratings (Ta = 25°C) Item Drain to Source voltage Gate to Source voltage Drain current Drain peak current Body-Drain diode reverse Drain current Body-Drain diode reverse Drain peak current Avalanche current Avalanche energy Channel dissipation Channel to case thermal impedance Channel temperature Storage temperature Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Value at Tc = 25°C 3. STch = 25°C, Tch ≤ 150°C Rev.2.00 Jul 03, 2006 page 1 of 6 Symbol VDSS VGSS ID Note1 ID (pulse) IDR Note1 IDR (pulse) Note3 IAP EARNote3 Pch Note2 θch-c Tch Tstg Ratings 150 ±30 98 294 98 294 48 172 150 0.833 150 –55 to +150 Unit V V A A A A A mJ W °C/W °C °C H5N1506P Electrical Characteristics (Ta = 25°C) Item Drain to Source breakdown voltage Zero Gate voltage Drain current Gate to Source leak current Gate to Source cutoff voltage Forward transfer admittance RDS(on) Min 150 — — 3.0 36 — Typ — — — — 60 0.014 Max — 1 ±0.1 4.5 — 0.016 Unit V µA µA V S Ω Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd — — — — — — — — — — 4900 1000 120 60 380 220 250 100 24 45 — — — — — — — — — — pF pF pF ns ns ns ns nC nC nC Body-Drain diode forward voltage Body-Drain diode reverse recovery time VDF trr — — 1.0 150 1.5 — V ns Body-Drain diode reverse recovery charge Notes: 4. Pulse test Qrr — 1.0 — µC Static Drain to Source on state resistance Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Total Gate charge Gate to Source charge Gate to Drain charge Rev.2.00 Jul 03, 2006 page 2 of 6 Symbol V(BR)DSS IDSS IGSS VGS(off) |yfs| Test conditions ID = 10 mA, VGS = 0 VDS = 150 V, VGS = 0 VGS = ±30 V, VDS = 0 VDS = 10 V, ID = 1 mA ID = 47.5 A, VDS = 10 V Note4 ID = 47.5 A, VGS = 10 VNote4 VDS = 25 V VGS = 0 f = 1 MHz ID = 47.5 A VGS = 10 V RL = 1.58 Ω Rg = 10 Ω VDD = 120 V VGS = 10 V ID = 95 A IF = 95 A, VGS = 0 Note4 IF = 95 A, VGS = 0 diF/dt = 100 A/µs H5N1506P Main Characteristics Maximum Safe Operation Area Power vs. Temperature Derating 1000 Ta = 25°C 300 150 100 50 10 10 0 µs 1 m µs s 100 Drain Current ID (A) Channel Dissipation Pch (W) 200 30 10 PW = 10 ms (1shot) 3 1 DC Operation (Tc = 25°C) 0.3 0.1 Operation in this area is limited by 0 100 50 100 150 0.03 RDS(on) 0.01 1 3 200 1000 Typical Output Characteristics Typical Transfer Characteristics 100 10 V VDS = 10 V Pulse Test 7V Drain Current ID (A) 6.5 V 60 40 5.5 V 20 VGS = 5 V 4 8 12 16 80 60 40 20 Tc = 75°C 0 20 2 25°C −25°C 6 4 8 10 Drain to Source Voltage VDS (V) Gate to Source Voltage VGS (V) Drain to Source Saturation Voltage vs. Gate to Source Voltage Static Drain to Source on State Resistance vs. Drain Current 4 0.1 Pulse Test 3 2 ID = 95 A 1 47.5 A 20 A 0 4 8 12 16 20 Gate to Source Voltage VGS (V) Rev.2.00 Jul 03, 2006 page 3 of 6 Drain to Source on State Resistance RDS(on) (Ω) Drain Current ID (A) Drain to Source Saturation Voltage VDS(on) (V) 300 Drain to Source Voltage VDS (V) 6V 0 100 Case Temperature Tc (°C) Pulse Test 80 30 10 VGS = 10 V 0.05 0.02 0.01 0.005 0.002 Pulse Test 0.001 1 3 10 30 100 300 1000 Drain Current ID (A) Static Drain to Source on State Resistance vs. Temperature VGS = 10 V Forward Transfer Admittance |yfs| (S) 0.05 Forward Transfer Admittance vs. Drain Current Pulse Test 0.04 47.5 A ID = 95 A 0.03 0.02 20 A 0.01 0 −25 0 25 50 75 100 125 150 1000 300 Tc = −25°C 100 30 25°C 10 75°C 3 VDS = 10 V Pulse Test 1 1 3 10 30 100 300 Case Temperature Tc (°C) Drain Current ID (A) Body-Drain Diode Reverse Recovery Time Typical Capacitance vs. Drain to Source Voltage 1000 100000 500 30000 Capacitance C (pF) Reverse Recovery Time trr (ns) Static Drain to Source on State Resistance RDS(on) (Ω) H5N1506P 200 100 50 20 10 5 di / dt = 100 A / µs VGS = 0, Ta = 25°C 2 1000 VGS = 0 f = 1 MHz 10000 Ciss 3000 1000 Coss 300 100 Crss 30 1 3 10 30 100 300 150 Dynamic Input Characteristics Switching Characteristics 16 ID = 95 A VDD = 120 V 60 V 30 V VGS VDS 12 8 60 4 VDD = 120 V 60 V 30 V 0 0 100 Drain to Source Voltage VDS (V) 40 80 120 160 Gate Charge Qg (nC) Rev.2.00 Jul 03, 2006 page 4 of 6 200 10000 Switching Time t (ns) 120 50 Reverse Drain Current IDR (A) 240 180 0 1000 Gate to Source Voltage VGS (V) Drain to Source Voltage VDS (V) 1 1000 VGS = 10 V, VDD = 75 V PW = 5 µs, duty ≤ 1 % RG = 10 Ω tf tr tf td(off) 100 td(on) tr 10 0.1 0.3 1 3 10 30 Drain Current ID (A) 100 H5N1506P Gate to Source Cutoff Voltage VGS(off) (V) Reverse Drain Current vs. Source to Drain Voltage Reverse Drain Current IDR (A) 100 80 60 10 V 40 5V VGS = 0 V 20 Pulse Test 0 0.4 0.8 1.2 1.6 2.0 Gate to Source Cutoff Voltage vs. Case Temperature 5 VDS = 10 V 1 mA 3 2 0.1 mA 1 0 –25 0 25 50 75 Case Temperature Source to Drain Voltage VSD (V) Normalized Transient Thermal Impedance γs (t) ID = 10 mA 4 100 125 150 Tc (°C) Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 θ ch – c(t) = γ s (t) • θ ch – c θ ch – c = 0.833°C/W, Tc = 25°C 0.1 0.05 PDM 0.03 0.02 lse 1 0.0 0.01 10 µ ot D= PW T PW pu T h 1s 100 µ 1m 10 m Pulse Width 100 m 1 10 PW (s) Switching Time Test Circuit Waveform 90% Vout Monitor Vin Monitor D.U.T. Vin 10% RL 10 Ω Vin 10 V Vout V DD = 75 V 10% 90% td(on) Rev.2.00 Jul 03, 2006 page 5 of 6 10% tr 90% td(off) tf H5N1506P Package Dimensions JEITA Package Code SC-65 Previous Code TO-3P / TO-3PV RENESAS Code PRSS0004ZE-A 15.6 ± 0.3 MASS[Typ.] 5.0g Unit: mm 4.8 ± 0.2 1.5 0.3 19.9 ± 0.2 2.0 14.9 ± 0.2 0.5 1.0 φ3.2 ± 0.2 5.0 ± 0.3 Package Name TO-3P 1.6 2.0 1.4 Max 18.0 ± 0.5 2.8 1.0 ± 0.2 3.6 0.6 ± 0.2 0.9 1.0 5.45 ± 0.5 5.45 ± 0.5 Ordering Information Part Name H5N1506P-E Quantity 360 pcs Shipping Container Box (Tube) Note: For some grades, production may be terminated. Please contact the Renesas sales office to check the state of production before ordering the product. Rev.2.00 Jul 03, 2006 page 6 of 6 Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corp. product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corp. or a third party. 2. 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