PANASONIC XN01504

Composite Transistors
XN01504 (XN1504)
Silicon NPN epitaxial planar type
Unit: mm
2.90+0.20
–0.05
1.9±0.1
(0.95) (0.95)
5
1.50+0.25
–0.05
• Two elements incorporated into one package
(Emitter-coupled transistors)
• Reduction of the mounting area and assembly cost by one half
2
0.4±0.2
4
2.8+0.2
–0.3
3
■ Features
5˚
For amplification of low-frequency output
0.16+0.10
–0.06
1
(0.65)
0.30+0.10
–0.05
1.1+0.2
–0.1
• 2SD1915F × 2
Parameter
Symbol
Rating
Unit
Collector-base voltage (Emitter open)
VCBO
50
V
Collector-emitter voltage (Base open)
VCEO
20
V
Emitter-base voltage (Collector open)
VEBO
25
V
Collector current
IC
300
mA
Peak collector current
ICP
500
mA
Total power dissipation
PT
300
mW
Junction temperature
Tj
150
°C
Storage temperature
Tstg
−55 to +150
°C
0 to 0.1
■ Absolute Maximum Ratings Ta = 25°C
1.1+0.3
–0.1
10˚
■ Basic Part Number
1: Collector (Tr1)
2: Collector (Tr2)
3: Base (Tr2)
EIAJ: SC-74A
4: Emitter
5: Base (Tr1)
Mini5-G1 Package
Marking Symbol: 5S
Internal Connection
3
■ Electrical Characteristics Ta = 25°C ± 3°C
5
Tr2
Tr1
2
1
Parameter
Symbol
Collector-emitter voltage (Base open)
VCEO
IC = 1 mA, IB = 0
Base-emitter voltage
VBE
VCE = 2 V, IC = 4 mA
Collector-base cutoff current (Emitter open)
ICBO
VCB = 50 V, IE = 0
0.1
µA
Emitter-base cutoff current (Collector open)
IEBO
VEB = 25 V, IC = 0
0.1
µA
hFE
VCE = 2 V, IC = 4 mA
500
2 500

hFE(Small
VCE = 2 V, IC = 4 mA
0.50
Forward current transfer ratio
hFE ratio *1
Conditions
4
Min
Typ
Max
20
Unit
V
0.6
V

0.99
/Large)
Collector-emitter saturation voltage
Transition frequency
VCE(sat)
fT
Collector output capacitance
(Common base, input open circuited)
Cob
ON resistanse *2
Ron
IC = 30 mA, IB = 3 mA
0.1
VCB = 6 V, IE = −4 mA, f = 200 MHz
80
VCB = 10 V, IE = 0, f = 1 MHz
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL
STANDARD JIS C 7030 measuring methods for transistors.
2. *1: Ratio between 2 elements
*2: Ron start resistance test circuit
MHz
7
1.0
V
pF
Ω
1 kΩ
IB = 5 mA
f = 1 kHz
V = 0.3 V
VB VV
Ron =
VA
VB × 1 000
(Ω)
VA − VB
Note) The part number in the parenthesis shows conventional part number.
Publication date: February 2004
SJJ00029BED
1
XN01504
PT  Ta
IC  VCE
24
Ta = 25°C
200
100
0
40
80
120
IB = 10 µA
16
8 µA
12
8
4 µA
4
2 µA
0
160
6 µA
Ambient temperature Ta (°C)
2
4
2 000
20
10
12
0.1
Ta = 75°C
25°C
−25°C
10
100
Ta = 75°C
Collector current IC (mA)
−25°C
800
400
1
Collector output capacitance
C (pF)
(Common base, input open circuited) ob
f = 1 MHz
Ta = 25°C
16
12
8
4
0
1
10
10
Collector current IC (mA)
Cob  VCB
20
100
Collector-base voltage VCB (V)
SJJ00029BED
0.4
0.6
0.8
1.0
fT  I E
25°C
0
0.1
0.2
200
1 200
1
0
Base-emitter voltage VBE (V)
VCE = 2 V
1 600
1
0.01
40
hFE  IC
IC / IB = 10
0.001
0.1
2
8
−25°C
60
Collector-emitter voltage VCE (V)
Forward current transfer ratio hFE
Collector-emitter saturation voltage VCE(sat) (V)
6
Ta = 75°C
80
0
0
VCE(sat)  IC
10
Collector current IC (mA)
Collector current IC (mA)
300
VCE = 2 V
25°C
100
20
400
0
IC  VBE
120
Transition frequency fT (MHz)
Total power dissipation PT (mW)
500
100
VCB = 6 V
Ta = 25°C
160
120
80
40
0
− 0.1
−1
−10
Emitter current IE (mA)
−100
Request for your special attention and precautions in using the technical information
and semiconductors described in this material
(1) An export permit needs to be obtained from the competent authorities of the Japanese Government if any of
the products or technical information described in this material and controlled under the "Foreign Exchange
and Foreign Trade Law" is to be exported or taken out of Japan.
(2) The technical information described in this material is limited to showing representative characteristics and
applied circuits examples of the products. It neither warrants non-infringement of intellectual property right
or any other rights owned by our company or a third party, nor grants any license.
(3) We are not liable for the infringement of rights owned by a third party arising out of the use of the technical
information as described in this material.
(4) The products described in this material are intended to be used for standard applications or general electronic equipment (such as office equipment, communications equipment, measuring instruments and household appliances).
Consult our sales staff in advance for information on the following applications:
• Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combustion equipment, life support systems and safety devices) in which exceptional quality and reliability are
required, or if the failure or malfunction of the products may directly jeopardize life or harm the human
body.
• Any applications other than the standard applications intended.
(5) The products and product specifications described in this material are subject to change without notice for
modification and/or improvement. At the final stage of your design, purchasing, or use of the products,
therefore, ask for the most up-to-date Product Standards in advance to make sure that the latest specifications satisfy your requirements.
(6) When designing your equipment, comply with the guaranteed values, in particular those of maximum rating, the range of operating power supply voltage, and heat radiation characteristics. Otherwise, we will not
be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of
break down and failure mode, possible to occur to semiconductor products. Measures on the systems such
as redundant design, arresting the spread of fire or preventing glitch are recommended in order to prevent
physical injury, fire, social damages, for example, by using the products.
(7) When using products for which damp-proof packing is required, observe the conditions (including shelf life
and amount of time let standing of unsealed items) agreed upon when specification sheets are individually
exchanged.
(8) This material may be not reprinted or reproduced whether wholly or partially, without the prior written
permission of Matsushita Electric Industrial Co., Ltd.
2003 SEP