PANASONIC 2SC4809J

Transistors
2SC4809J
Silicon NPN epitaxial planar type
1.60+0.05
–0.03
1.00±0.05
■ Features
Unit : mm
0.80±0.05
For high-frequency amplification/oscillation/mixing
0.12+0.03
–0.01
0 to 0.02
(0.50)(0.50)
5˚
Parameter
Symbol
Rating
Unit
VCBO
15
V
Collector-emitter voltage (Base open)
VCEO
10
V
Emitter-base voltage (Collector open)
VEBO
3
V
Collector current
IC
50
mA
Collector power dissipation
PC
125
mW
Junction temperature
Tj
125
°C
Storage temperature
Tstg
−55 to +125
°C
(0.375)
1.60±0.05
0.10 max.
■ Absolute Maximum Ratings Ta = 25°C
Collector-base voltage (Emitter open)
(0.80)
2
0.27±0.02
0.70+0.05
–0.03
1
5˚
0.85+0.05
–0.03
3
• High transition frequency fT
• Small collector output capacitance (Common base, input open circuited) Cob and reverse transfer capacitance (Common emitter) Crb
• SS-Mini type package, allowing downsizing of the equipment and
automatic insertion through the tape packing
1: Base
2: Emitter
3: Collector
EIAJ: SC-89
SSMini3-F1 Package
Marking Symbol: 1S
■ Electrical Characteristics Ta = 25°C ± 3°C
Parameter
Symbol
Collector-emitter voltage (Base open)
VCEO
IC = 2 mA, IB = 0
10
Emitter-base voltage (Collector open)
VEBO
IE = 10 µA, IC = 0
3
Collector-base cutoff current (Emitter open)
ICBO
VCB = 10 V, IE = 0
hFE
VCE = 4 V, IC = 5 mA
Forward current transfer ratio
hFE ratio *
∆hFE
Conditions
hFE2: VCE = 4 V, IC = 100 µA
Min
Typ
Max
Unit
V
V
1
µA
75
400

0.75
1.6

0.5
V
2.7
GHz
hFE1: VCE = 4 V, IC = 5 mA
Collector-emitter saturation voltage
Transition frequency
VCE(sat)
fT
IC = 20 mA, IB = 4 mA
VCB = 4 V, IE = −5 mA, f = 200 MHz
1.4
1.9
Collector output capacitance
(Common base, input open circuited)
Cob
VCB = 4 V, IE = 0, f = 1 MHz
1.4
pF
Reverse transfer capacitance
(Common emitter)
Crb
VCB = 4 V, IE = 0, f = 1 MHz
0.45
pF
11
ps
Collector-base parameter
rbb' • CC
VCB = 4 V, IE = −5 mA, f = 31.9 MHz
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. * :∆hFE = hFE2 / hFE1
Publication date: August 2003
SJC00303AED
1
2SC4809J
PC  Ta
IC  VCE
50
80
60
40
400 µA
100
40
300 µA
35
30
200 µA
25
20
100 µA
15
10
20
VCE = 4 V
IB = 500 µA
Collector current IC (mA)
100
IC  VBE
120
Ta = 25°C
45
120
Collector current IC (mA)
Collector power dissipation PC (mW)
140
80
Ta = 85°C
−25°C
60
25°C
40
20
5
0
20
40
60
80
100
0
0
120 140
0
Ambient temperature Ta (°C)
10
100
Collector current IC (mA)
2
10
12
0
0.2 0.4
1 000
120
25°C
100
−25°C
80
60
40
20
0
0.1
1
10
Collector current IC (mA)
SJC00303AED
0.6
0.8
1.0
1.2
1.4
Base-Emitter voltage VBE (V)
Cob  VCB
VCE = 4 V
Ta = 85°C
Forward current transfer ratio hFE
Collector-emitter saturation voltage VCE(sat) (V)
−25°C
25°C
1
8
hFE  IC
0.1
0.01
0.1
6
140
IC / IB = 5
Ta = 85°C
4
Collector-emitter voltage VCE (V)
VCE(sat)  IC
1
2
100
Collector output capacitance
C (pF)
(Common base, input open circuited) ob
0
10
1
f = 1 MHz
Ta = 25°C
0
2
4
6
8
10
12
14
Collector-base voltage VCB (V)
16
Request for your special attention and precautions in using the technical information
and semiconductors described in this material
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if any of the products or technologies described in this material and controlled under the "Foreign
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product or technologies as described in this material.
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electronic equipment (such as office equipment, communications equipment, measuring instruments and household appliances).
Consult our sales staff in advance for information on the following applications:
• Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment,
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notice for modification and/or improvement. At the final stage of your design, purchasing, or use of
the products, therefore, ask for the most up-to-date Product Standards in advance to make sure that
the latest specifications satisfy your requirements.
(6) When designing your equipment, comply with the guaranteed values, in particular those of maximum rating, the range of operating power supply voltage, and heat radiation characteristics. Otherwise, we will not be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of
incidence of break down and failure mode, possible to occur to semiconductor products. Measures
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2002 JUL