PANASONIC 2SB0936

Power Transistors
2SB0936 (2SB936), 2SB0936A (2SB936A)
Silicon PNP epitaxial planar type
For low-voltage switching
Unit: mm
Unit
−40
V
1
−50
−20
Collector-emitter voltage 2SB0936
(Base open)
2SB0936A
VCEO
Emitter-base voltage (Collector open)
VEBO
−5
V
Collector current
IC
−10
A
Peak collector current
ICP
−20
A
40
W
Collector power dissipation
2
V
−40
PC
Ta = 25°C
14.4±0.5
3.0+0.4
–0.2
0 to 0.4
0.8±0.1 R = 0.5
R = 0.5
2.54±0.3
1.0±0.1
1.4±0.1
0.4±0.1
5.08±0.5
(8.5)
(6.0)
1.3
3
(1.5)
Rating
VCBO
2SB0936A
1.5+0
–0.4
4.4±0.5
Symbol
2SB0936
1.0±0.1
(7.6)
Parameter
6.0±0.2
2.0±0.5
■ Absolute Maximum Ratings TC = 25°C
Collector-base voltage
(Emitter open)
3.4±0.3
10.0±0.3
1.5±0.1
• Low collector-emitter saturation voltage VCE(sat)
• High-speed switching
• N type package enabling direct soldering of the radiating fin to the
printed circuit board, etc. of small electronic equipment.
8.5±0.2
4.4±0.5
■ Features
(6.5)
1 : Base
2 : Collector
3 : Emitter
N-G1 Package
Note) Self-supported type package is also prepared.
1.3
Junction temperature
Tj
150
°C
Storage temperature
Tstg
−55 to +150
°C
■ Electrical Characteristics TC = 25°C ± 3°C
Parameter
Symbol
Collector-emitter voltage
(Base open)
2SB0936
Collector-base cutoff
current (Emitter open)
2SB0936
Conditions
IC = −10 mA, IB = 0
VCEO
Min
Typ
Max
−20
Unit
V
−40
2SB0936A
ICBO
2SB0936A
VCB = −40 V, IE = 0
−50
VCB = −50 V, IE = 0
−50
Emitter-base cutoff current (Collector open)
IEBO
VEB = −5 V, IC = 0
Forward current transfer ratio
hFE1 *
VCE = −2 V, IC = − 0.1 A
45
hFE2
VCE = −2 V, IC = −3 A
90
Base-emitter voltage
VBE(sat)
IC = −10 A, IB = − 0.33 A
Collector-emitter saturation voltage
VCE(sat)
IC = −10 A, IB = − 0.33 A
−50
µA
µA

260
−1.5
− 0.6
V
V
VCE = −10 V, IC = − 0.5 A, f = 10 MHz
100
MHz
Cob
VCB = −10 V, IE = 0, f = 1 MHz
400
pF
Turn-on time
ton
IC = −3 A,
0.1
µs
Storage time
tstg
IB1 = − 0.1 A, IB2 = 0.1 A
0.5
µs
Fall time
tf
VCC = −20 V
0.1
µs
Transition frequency
fT
Collector output capacitance
(Common base, input open circuited)
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *: Rank classification
Rank
Q
P
hFE1
90 to 180
130 to 260
Publication date: April 2003
Note) The part number in the parenthesis shows conventional part number.
SJD00017BED
1
2SB0936, 2SB0936A
IC  VCE
–80mA
−10
30
20
10
–60mA
–50mA
−8
–40mA
–35mA
−6
–30mA
–25mA
−4
–15mA
–10mA
–5mA
(3)
40
80
120
160
−2
0
Ambient temperature Ta (°C)
−4
Forward current transfer ratio hFE
Base-emitter saturation voltage VBE(sat) (V)
TC=–25˚C
100˚C
25˚C
− 0.1
− 0.01
− 0.1
−1
–25˚C
10
Turn-on time ton , Storage time tstg , Fall time tf (µs)
Collector output capacitance
C (pF)
(Common base, input open circuited) ob
−10
103
102
10
1
–0.01
−100
103
102
10
−100
Pulsed tw=1ms
Duty cycle=1%
IC/IB=30
(–IB1=IB2)
VCC=–20V
TC=25˚C
tstg
ton
0.1
tf
−2
−4
Non repetitive pulse
TC=25˚C
−10
t=1ms
IC
t=10ms
t=300ms
−1
− 0.1
−6
Collector current IC (A)
SJD00017BED
–10
ICP
1
0
–1
Safe operation area
−100
10
0.01
–0.1
Collector current IC (A)
ton, tstg, tf  IC
IE=0
f=1MHz
TC=25˚C
−10
VCE=–10V
f=10MHz
TC=25˚C
102
−1
−1
Collector current IC (A)
Collector current IC (A)
Collector-base voltage VCB (V)
2
− 0.01
− 0.1
fT  I C
25˚C
TC=100˚C
Cob  VCB
−10
–25˚C
104
103
1
− 0.1
−10
104
−1
−12
VCE=–2V
Collector current IC (A)
1
− 0.1
−10
25˚C
hFE  IC
104
IC/IB=30
−1
−8
TC=100˚C
Collector-emitter voltage VCE (V)
VBE(sat)  IC
−10
−6
Transition frequency fT (MHz)
0
0
Collector current IC (A)
0
−1
− 0.1
–20mA
−2
(2)
IC/IB=30
−8
− 0.01
− 0.1
−1
−10
2SB0936A
(1)
40
TC=25˚C
IB=–100mA
−10
2SB0936
(1)TC=Ta
(2)With a 50×50×2mm
Al heat sink
(3)Without heat sink
(PC=1.3W)
Collector current IC (A)
Collector power dissipation PC (W)
VCE(sat)  IC
−12
Collector-emitter saturation voltage VCE(sat) (V)
PC  Ta
50
−100
Collector-emitter voltage VCE (V)
2SB0936, 2SB0936A
Rth  t
Thermal resistance Rth (°C/W)
103
(1)Without heat sink
(2)With a 50×50×2mm Al heat sink
(1)
102
(2)
10
1
10−1
10−2
10−4
10−3
10−2
10−1
1
10
102
103
104
Time t (s)
SJD00017BED
3
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and semiconductors described in this material
(1) An export permit needs to be obtained from the competent authorities of the Japanese Government
if any of the products or technologies described in this material and controlled under the "Foreign
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(3) We are not liable for the infringement of rights owned by a third party arising out of the use of the
product or technologies as described in this material.
(4) The products described in this material are intended to be used for standard applications or general
electronic equipment (such as office equipment, communications equipment, measuring instruments and household appliances).
Consult our sales staff in advance for information on the following applications:
• Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment,
combustion equipment, life support systems and safety devices) in which exceptional quality and
reliability are required, or if the failure or malfunction of the products may directly jeopardize life or
harm the human body.
• Any applications other than the standard applications intended.
(5) The products and product specifications described in this material are subject to change without
notice for modification and/or improvement. At the final stage of your design, purchasing, or use of
the products, therefore, ask for the most up-to-date Product Standards in advance to make sure that
the latest specifications satisfy your requirements.
(6) When designing your equipment, comply with the guaranteed values, in particular those of maximum rating, the range of operating power supply voltage, and heat radiation characteristics. Otherwise, we will not be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of
incidence of break down and failure mode, possible to occur to semiconductor products. Measures
on the systems such as redundant design, arresting the spread of fire or preventing glitch are
recommended in order to prevent physical injury, fire, social damages, for example, by using the
products.
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2002 JUL