Freescale Semiconductor Technical Data Document Number: AFT26H160--4S4 Rev. 1, 11/2013 RF Power LDMOS Transistor N--Channel Enhancement--Mode Lateral MOSFET This 32 W asymmetrical Doherty RF power LDMOS transistor is designed for cellular base station applications covering the frequency range of 2496 to 2690 MHz. AFT26H160--4S4R3 Typical Doherty Single--Carrier W--CDMA Performance: VDD = 28 Vdc, IDQA = 500 mA, VGSB = 0.6 Vdc, Pout = 32 W Avg., Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. Frequency Gps (dB) D (%) Output PAR (dB) ACPR (dBc) 2496 MHz 14.9 45.7 8.0 --28.9 2570 MHz 15.4 45.6 7.9 --30.8 2690 MHz 15.1 44.5 7.8 --33.0 2496--2690 MHz, 32 W AVG., 28 V Features Advanced High Performance In--Package Doherty Greater Negative Gate--Source Voltage Range for Improved Class C Operation Designed for Digital Predistortion Error Correction Systems In Tape and Reel. R3 Suffix = 250 Units, 56 mm Tape Width, 13--inch Reel. NI--880XS--4L4S 8 VBWA (1) N.C. 1 RFinA/VGSA 2 7 RFoutA/VDSA RFinB/VGSB 3 6 RFoutB/VDSB 4 Peaking 5 VBWB (1) N.C. Carrier (Top View) Figure 1. Pin Connections 1. Device cannot operate with the VDD current supplied through pin 5 and pin 8. Freescale Semiconductor, Inc., 2013. All rights reserved. RF Device Data Freescale Semiconductor, Inc. AFT26H160--4S4R3 1 Table 1. Maximum Ratings Symbol Value Unit Drain--Source Voltage Rating VDSS --0.5, +65 Vdc Gate--Source Voltage VGS --6.0, +10 Vdc Operating Voltage VDD 32, +0 Vdc Storage Temperature Range Tstg --65 to +150 C Case Operating Temperature Range TC --40 to +150 C TJ --40 to +225 C Operating Junction Temperature Range (1,2) Table 2. Thermal Characteristics Characteristic Symbol Value (2,3) Unit Thermal Resistance, Junction to Case Case Temperature 74C, 32 W W--CDMA, 28 Vdc, IDQA = 500 mA, VGSB = 0.6 Vdc, 2590 MHz RJC 0.41 C/W Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 2 Machine Model (per EIA/JESD22--A115) B Charge Device Model (per JESD22--C101) IV Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) Symbol Min Typ Max Unit Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) IDSS — — 1 Adc Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) IGSS — — 1 Adc Gate Threshold Voltage (VDS = 10 Vdc, ID = 80 Adc) VGS(th) 0.8 1.2 1.6 Vdc Gate Quiescent Voltage (VDD = 28 Vdc, IDA = 500 mAdc, Measured in Functional Test) VGS(Q) 1.5 1.8 2.3 Vdc Drain--Source On--Voltage (VGS = 6 Vdc, ID = 0.8 Adc) VDS(on) 0.1 0.15 0.3 Vdc Gate Threshold Voltage (VDS = 10 Vdc, ID = 120 Adc) VGS(th) 0.8 1.2 1.6 Vdc Drain--Source On--Voltage (VGS = 6 Vdc, ID = 1.2 Adc) VDS(on) 0.1 0.15 0.3 Vdc Characteristic Off Characteristics (4) On Characteristics -- Side A (4) (Carrier) On Characteristics -- Side B (4) (Peaking) 1. Continuous use at maximum temperature will affect MTTF. 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. 4. Each side of device measured separately. (continued) AFT26H160--4S4R3 2 RF Device Data Freescale Semiconductor, Inc. Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Functional Tests (1,2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 500 mA, VGSB = 0.6 Vdc, Pout = 32 W Avg., f = 2496 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. Power Gain Gps 13.5 14.9 16.5 dB Drain Efficiency D 41.5 45.7 — % PAR 7.3 8.0 — dB ACPR — --28.9 --26.0 dBc Output Peak--to--Average Ratio @ 0.01% Probability on CCDF Adjacent Channel Power Ratio Load Mismatch (In Freescale Test Fixture, 50 ohm system) IDQA = 500 mA, f = 2570 MHz No Device Degradation VSWR 10:1 at 32 Vdc, 160 W CW Output Power (3 dB Input Overdrive from 100 W CW Rated Power) Typical Performances (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 500 mA, VGSB = 0.6 Vdc, 2496--2690 MHz Bandwidth Pout @ 1 dB Compression Point, CW P1dB — 100 — W Pout @ 3 dB Compression Point (3) P3dB — 200 — W — --30.1 — VBWres — 100 — MHz Gain Flatness in 194 MHz Bandwidth @ Pout = 32 W Avg. GF — 0.5 — dB Gain Variation over Temperature (--30C to +85C) G — 0.01 — dB/C P1dB — 0.009 — dB/C AM/PM (Maximum value measured at the P3dB compression point across the 2496--2690 MHz frequency range) VBW Resonance Point (IMD Third Order Intermodulation Inflection Point) Output Power Variation over Temperature (--30C to +85C) 1. Part internally matched both on input and output. 2. Measurements made with device in an asymmetrical Doherty configuration. 3. P3dB = Pavg + 7.0 dB where Pavg is the average output power measured using an unclipped W--CDMA single--carrier input signal where output PAR is compressed to 7.0 dB @ 0.01% probability on CCDF. AFT26H160--4S4R3 RF Device Data Freescale Semiconductor, Inc. 3 VGSA C23 C14 C20 C12 C16 C P R1 C1 C3 C17 R3 C5 CUT OUT AREA R2 C2 Z1 C6 C18 C4 C9 C10 C7 C11 C8 C21 C19 C13 AFT26HP160--8S Rev. 3 C15 C22 VGSB Figure 2. AFT26H160--4S4R3 Test Circuit Component Layout Table 5. AFT26H160--4S4R3 Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1, C11 0.3 pF Chip Capacitors ATC600F0R3BT250XT ATC C2, C3, C4, C5, C6, C7, C8 8.2 pF Chip Capacitors ATC600F8R2BT250XT ATC C9 0.4 pF Chip Capacitor ATC600F0R4BT250XT ATC C10 5.6 pF Chip Capacitor ATC600F5R6BT250XT ATC C12, C13, C14, C15 2.2 F Chip Capacitors C3225X7R2A225K230AB TDK C16, C17, C18, C19, C20, C21 10 F Chip Capacitors C5750X7S2A106M230KB TDK C22, C23 220 F, 100 V Electrolytic Capacitors MCGPR100V227M16X26-RH Multicomp R1 50 , 4 W Termination CW12010T0050GBK ATC R2, R3 2.7 , 1/4 W Chip Resistors CRCW12062R7FKEA Vishay Z1 2300--2700 MHz Band, 90, 5 dB Hybrid Coupler X3C25P1-05S Anaren PCB 0.020, r = 3.5 RO4350B Rogers AFT26H160--4S4R3 4 RF Device Data Freescale Semiconductor, Inc. 15.6 Gps, POWER GAIN (dB) 46 D 45 15.4 44 15.2 VDD = 28 Vdc, Pout = 32 W (Avg.) IDQA = 500 mA, VGSB = 0.6 Vdc Single--Carrier W--CDMA 15 14.8 43 Gps PARC 14.6 14.4 3.84 MHz Channel Bandwidth Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 14.2 14 2480 2510 2540 2570 2600 2660 --1.8 --29 --2 --30 --31 ACPR 2630 --28 --32 2690 --2.2 --2.4 --2.6 --33 2720 PARC (dB) 47 15.8 ACPR (dBc) 16 D, DRAIN EFFICIENCY (%) TYPICAL CHARACTERISTICS --2.8 f, FREQUENCY (MHz) IMD, INTERMODULATION DISTORTION (dBc) Figure 3. Single--Carrier Output Peak--to--Average Ratio Compression (PARC) Broadband Performance @ Pout = 32 Watts Avg. --10 VDD = 28 Vdc, Pout = 25 W (PEP), IDQA = 500 mA VGSB = 0.6 Vdc, Two--Tone Measurements --20 (f1 + f2)/2 = Center Frequency of 2570 MHz IM3--U --30 IM3--L --40 IM5--L IM5--U --50 --60 IM7--U IM7--L 1 10 200 100 TWO--TONE SPACING (MHz) Figure 4. Intermodulation Distortion Products versus Two--Tone Spacing 14.5 14 13.5 13 --1 dB = 17.5 W --1 D --24 50 --26 ACPR --2 40 --2 dB = 30 W --3 30 Gps --3 dB = 40 W --4 20 VDD = 28 Vdc, IDQA = 500 mA PARC VGSB = 0.6 Vdc, f = 2570 MHz Single--Carrier W--CDMA 3.84 MHz Channel Bandwidth, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF --5 --6 60 10 25 40 55 70 --28 --30 ACPR (dBc) 15 OUTPUT COMPRESSION AT 0.01% PROBABILITY ON CCDF (dB) Gps, POWER GAIN (dB) 15.5 0 D DRAIN EFFICIENCY (%) 16 --32 10 --34 0 --36 85 Pout, OUTPUT POWER (WATTS) Figure 5. Output Peak--to--Average Ratio Compression (PARC) versus Output Power AFT26H160--4S4R3 RF Device Data Freescale Semiconductor, Inc. 5 TYPICAL CHARACTERISTICS Gps, POWER GAIN (dB) 2690 MHz 50 2496 MHz 40 2690 MHz 2496 MHz 15 VDD = 28 Vdc, IDQA = 500 mA 14.5 VGSB = 0.6 Vdc Single--Carrier W--CDMA 14 ACPR 2496 MHz 13.5 2690 MHz 2570 MHz 1 10 30 20 10 3.84 MHz Channel Bandwidth, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 13 60 D 100 0 200 0 --10 --20 --30 --40 ACPR (dBc) 2570 MHz 15.5 2570 MHz Gps D, DRAIN EFFICIENCY (%) 16 --50 --60 Pout, OUTPUT POWER (WATTS) AVG. Figure 6. Single--Carrier W--CDMA Power Gain, Drain Efficiency and ACPR versus Output Power 24 20 GAIN (dB) 16 VDD = 28 Vdc Pin = 0 dBm IDQA = 500 mA VGSB = 0.6 Vdc Gain 12 8 4 0 2200 2300 2400 2500 2600 2700 2800 2900 3000 f, FREQUENCY (MHz) Figure 7. Broadband Frequency Response AFT26H160--4S4R3 6 RF Device Data Freescale Semiconductor, Inc. VDD = 28 Vdc, IDQA = 492 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB f (MHz) Zsource () Zin () Zload (1) () Gain (dB) (dBm) (W) D (%) AM/PM () 2496 6.68 – j14.6 6.44 + j14.3 4.25 – j6.60 18.7 49.3 86 54.2 –12 2570 10.5 – j14.5 9.37 + j14.6 4.08 – j6.60 18.6 49.3 86 54.6 –13 2690 18.5 – j7.11 18.7 + j7.55 3.90 – j7.10 18.6 49.2 84 52.9 –12 Max Output Power P3dB Gain (dB) (dBm) (W) D (%) AM/PM () 4.01 – j7.07 16.5 50.2 104 53.7 –17 10.4 + j15.8 3.85 – j7.11 16.3 50.1 103 53.5 –17 21.2 + j5.79 3.85 – j7.75 16.4 50.0 101 52.1 –17 f (MHz) Zsource () Zin () 2496 6.68 – j14.6 6.75 + j15.3 2570 10.5 – j14.5 2690 18.5 – j7.11 Zload () (2) (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Figure 8. Carrier Side Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, IDQA = 492 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB Gain (dB) (dBm) (W) D (%) AM/PM () 9.14 – j4.04 21.0 47.6 58 62.8 –20 8.94 + j15.3 7.19 – j3.17 20.8 47.7 59 63.2 –21 19.1 + j8.75 5.76 – j3.49 20.8 47.6 58 61.6 –21 f (MHz) Zsource () Zin () 2496 6.68 – j14.6 6.05 + j14.7 2570 10.5 – j14.5 2690 18.5 – j7.11 Zload () (1) Max Drain Efficiency P3dB f (MHz) Zsource () Zin () Zload (2) () Gain (dB) (dBm) (W) D (%) AM/PM () 2496 6.68 – j14.6 6.36 + j15.5 7.51 – j5.25 18.4 49.0 79 63.6 –25 2570 10.5 – j14.5 9.81 + j16.4 6.90 – j3.94 18.5 48.7 74 63.7 –27 2690 18.5 – j7.11 21.7 + j6.99 5.56 – j4.59 18.4 48.8 75 61.9 –26 (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Figure 9. Carrier Side Load Pull Performance — Maximum Drain Efficiency Tuning Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload AFT26H160--4S4R3 RF Device Data Freescale Semiconductor, Inc. 7 VDD = 28 Vdc, VGSB = 0.6 Vdc, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB f (MHz) Zsource () Zin () Zload (1) () Gain (dB) (dBm) (W) D (%) AM/PM () 2496 4.34 – j16.2 4.65 + j15.8 6.04 – j9.43 13.5 51.0 126 53.4 26 2570 6.43 – j16.1 6.85 + j16.3 6.01 – j9.36 13.5 51.0 125 53.3 21 2690 15.7 – j11.8 15.8 + j12.5 6.40 – j10.4 13.4 50.9 122 51.6 25 Max Output Power P3dB f (MHz) Zsource () Zin () 2496 4.34 – j16.2 5.00 + j16.4 2570 6.43 – j16.1 7.70 + j17.1 2690 15.7 – j11.8 18.0 + j11.1 Zload () (2) Gain (dB) (dBm) (W) D (%) AM/PM () 5.78 – j10.4 11.2 51.7 148 53.8 18 6.01 – j10.3 11.4 51.6 146 53.8 16 6.96 – j11.3 11.3 51.5 141 52.1 23 (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Figure 10. Peaking Side Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, VGSB = 0.6 Vdc, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB Gain (dB) (dBm) (W) D (%) AM/PM () 13.7 – j7.40 14.5 49.5 89 62.6 18 6.11 + j16.5 9.99 – j4.88 14.7 49.7 94 63.5 22 15.0 + j14.0 8.15 – j5.32 14.5 49.8 95 61.7 21 f (MHz) Zsource () Zin () 2496 4.34 – j16.2 4.19 + j15.8 2570 6.43 – j16.1 2690 15.7 – j11.8 Zload () (1) Max Drain Efficiency P3dB f (MHz) Zsource () Zin () Zload (2) () 2496 4.34 – j16.2 4.56 + j16.4 13.7 – j8.25 12.5 50.1 102 62.1 9 2570 6.43 – j16.1 7.00 + j17.2 11.9 – j5.77 12.6 50.1 103 63.2 11 2690 15.7 – j11.8 17.5 + j12.7 8.15 – j5.47 12.5 50.3 108 61.5 12 Gain (dB) (dBm) (W) D (%) AM/PM () (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload Figure 11. Peaking Side Load Pull Performance — Maximum Drain Efficiency Tuning AFT26H160--4S4R3 8 RF Device Data Freescale Semiconductor, Inc. P1dB -- TYPICAL CARRIER SIDE LOAD PULL CONTOURS — 2570 MHz --2 --2 48 E 48.5 --4 --3 47 IMAGINARY () IMAGINARY () --3 --5 --6 47.5 P --7 E --4 62 --5 --6 P --7 60 48 --8 --8 --9 49 3 4 5 6 7 8 --9 10 9 58 46 3 50 52 4 54 5 56 6 7 8 9 10 REAL () Figure 12. P1dB Load Pull Output Power Contours (dBm) Figure 13. P1dB Load Pull Efficiency Contours (%) --2 --2 --3 --3 E 19 --4 21 18.5 --5 IMAGINARY () IMAGINARY () REAL () --6 3 4 5 6 7 8 9 10 --22 --20 --4 --18 --5 --14 --6 --9 --16 P --12 --8 20 --24 E --7 19.5 18 --8 --9 20.5 P --7 --26 3 4 5 6 7 8 9 REAL () REAL () Figure 14. P1dB Load Pull Gain Contours (dB) Figure 15. P1dB Load Pull AM/PM Contours () NOTE: P = Maximum Output Power E = Maximum Drain Efficiency 10 Gain Drain Efficiency Linearity Output Power AFT26H160--4S4R3 RF Device Data Freescale Semiconductor, Inc. 9 P3dB -- TYPICAL CARRIER SIDE LOAD PULL CONTOURS — 2570 MHz --2 --2 48.5 --3 49 --4 E 48 49.5 --5 IMAGINARY () --3 IMAGINARY () 47.5 --6 --7 --9 62 --5 --6 --7 P --8 E --4 50 --8 50 3 4 5 7 6 8 --9 10 9 P 60 52 54 48 58 56 3 4 5 6 7 8 9 10 REAL () Figure 16. P3dB Load Pull Output Power Contours (dBm) Figure 17. P3dB Load Pull Efficiency Contours (%) --2 --2 --3 --3 17 --4 E 16.5 19 --5 --6 16 --7 IMAGINARY () IMAGINARY () REAL () 17.5 18 --8 --9 --26 --5 --24 --6 4 5 6 7 8 9 10 --9 --22 P --18 --8 3 --28 E --4 --7 18.5 P --30 --32 --20 --16 3 4 5 6 7 8 9 REAL () REAL () Figure 18. P3dB Load Pull Gain Contours (dB) Figure 19. P3dB Load Pull AM/PM Contours () NOTE: P = Maximum Output Power E = Maximum Drain Efficiency 10 Gain Drain Efficiency Linearity Output Power AFT26H160--4S4R3 10 RF Device Data Freescale Semiconductor, Inc. P1dB -- TYPICAL PEAKING SIDE LOAD PULL CONTOURS — 2570 MHz --2 48.5 --4 E 50 --6 E IMAGINARY () IMAGINARY () --4 --2 49 49.5 --8 50.5 P --10 --12 60 --8 P --10 58 56 --12 50 --14 62 --6 6 4 8 10 14 12 --14 16 46 48 4 6 50 8 54 52 10 14 12 16 REAL () REAL () Figure 20. P1dB Load Pull Output Power Contours (dBm) Figure 21. P1dB Load Pull Efficiency Contours (%) --2 --2 --4 --4 --36 --8 13.5 13 --10 --34 E 14.5 IMAGINARY () IMAGINARY () E --6 P --6 --32 --8 --30 P --10 14 --12 --14 --12 12 12.5 4 6 --28 8 10 12 14 16 --14 4 6 8 10 12 14 16 REAL () REAL () Figure 22. P1dB Load Pull Gain Contours (dB) Figure 23. P1dB Load Pull AM/PM Contours () NOTE: P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power AFT26H160--4S4R3 RF Device Data Freescale Semiconductor, Inc. 11 P3dB -- TYPICAL PEAKING SIDE LOAD PULL CONTOURS — 2570 MHz --2 --2 IMAGINARY () 49.5 50 50.5 --6 --4 E IMAGINARY () 49 --4 51 --8 --10 P --12 --14 46 62 --8 60 --10 P --12 51.5 8 10 14 12 --14 16 4 58 52 50 48 6 4 E --6 6 56 54 8 10 14 12 16 REAL () Figure 24. P3dB Load Pull Output Power Contours (dBm) Figure 25. P3dB Load Pull Efficiency Contours (%) --2 --2 --4 --4 E --6 IMAGINARY () IMAGINARY () REAL () 12.5 --8 11.5 --10 P --44 E --6 --42 --40 --8 --38 --10 P 12 --12 --14 --46 --36 --12 --32 11 4 6 8 10 12 14 16 --14 4 6 --34 8 10 12 14 16 REAL () REAL () Figure 26. P3dB Load Pull Gain Contours (dB) Figure 27. P3dB Load Pull AM/PM Contours () NOTE: P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power AFT26H160--4S4R3 12 RF Device Data Freescale Semiconductor, Inc. PACKAGE DIMENSIONS AFT26H160--4S4R3 RF Device Data Freescale Semiconductor, Inc. 13 AFT26H160--4S4R3 14 RF Device Data Freescale Semiconductor, Inc. PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS Refer to the following documents, software and tools to aid your design process. Application Notes AN1955: Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins EB212: Using Data Sheet Impedances for RF LDMOS Devices Software Electromigration MTTF Calculator RF High Power Model .s2p File Development Tools Printed Circuit Boards For Software and Tools, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to the Software & Tools tab on the part’s Product Summary page to download the respective tool. REVISION HISTORY The following table summarizes revisions to this document. Revision Date Description 0 July 2013 Initial Release of Data Sheet 1 Nov. 2013 Updated opening paragraph to reflect part performance, p. 1 AFT26H160--4S4R3 RF Device Data Freescale Semiconductor, Inc. 15 How to Reach Us: Home Page: freescale.com Web Support: freescale.com/support Information in this document is provided solely to enable system and software implementers to use Freescale products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based on the information in this document. Freescale reserves the right to make changes without further notice to any products herein. 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U.S. Pat. & Tm. Off. Airfast is a trademark of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. E 2013 Freescale Semiconductor, Inc. AFT26H160--4S4R3 Document Number: AFT26H160--4S4 Rev. 16 1, 11/2013 RF Device Data Freescale Semiconductor, Inc.