Freescale Semiconductor Technical Data Document Number: A2T21H100--25S Rev. 0, 6/2015 RF Power LDMOS Transistor N--Channel Enhancement--Mode Lateral MOSFET This 18 W asymmetrical Doherty RF power LDMOS transistor is designed for cellular base station applications covering the frequency range of 2110 to 2170 MHz. A2T21H100--25SR3 2100 MHz Typical Doherty Single--Carrier W--CDMA Performance: VDD = 28 Vdc, IDQA = 250 mA, VGSB = 0.2 Vdc, Pout = 18 W Avg., Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. Frequency Gps (dB) D (%) Output PAR (dB) 2110 MHz 17.3 52.1 8.2 –32.4 2140 MHz 17.4 51.0 8.0 –33.1 2170 MHz 17.4 50.5 8.0 –35.0 2110–2170 MHz, 18 W AVG., 28 V AIRFAST RF POWER LDMOS TRANSISTOR ACPR (dBc) Features Advanced High Performance In--Package Doherty Greater Negative Gate--Source Voltage Range for Improved Class C Operation Designed for Digital Predistortion Error Correction Systems NI--780S--4L4S 8 VBWA(1) N.C. 1 RFinA/VGSA 2 7 RFoutA/VDSA RFinB/VGSB 3 6 RFoutB/VDSB 4 Peaking 5 VBWB(1) N.C. Carrier (Top View) Figure 1. Pin Connections 1. Device cannot operate with the VDD current supplied through pin 5 and pin 8. Freescale Semiconductor, Inc., 2015. All rights reserved. RF Device Data Freescale Semiconductor, Inc. A2T21H100--25SR3 1 Table 1. Maximum Ratings Symbol Value Unit Drain--Source Voltage Rating VDSS –0.5, +65 Vdc Gate--Source Voltage VGS –6.0, +10 Vdc Operating Voltage VDD 32, +0 Vdc Storage Temperature Range Tstg –65 to +150 C Case Operating Temperature Range TC –40 to +150 C TJ –40 to +225 C CW 193 2.9 W W/C Operating Junction Temperature Range (1,2) CW Operation @ TC = 25C Derate above 25C Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case Case Temperature 72C, 18 W Avg., W--CDMA, 28 Vdc, IDQA = 250 mA, VGSB = 0.2 Vdc, 2140 MHz Symbol Value (2,3) Unit RJC 0.76 C/W Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 2 Machine Model (per EIA/JESD22--A115) B Charge Device Model (per JESD22--C101) III Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) Symbol Min Typ Max Unit Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS = 32 Vdc, VGS = 0 Vdc) IDSS — — 1 Adc Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) IGSS — — 1 Adc Gate Threshold Voltage (VDS = 10 Vdc, ID = 40 Adc) VGS(th) 0.8 1.2 1.6 Vdc Gate Quiescent Voltage (VDD = 28 Vdc, IDA = 250 mAdc, Measured in Functional Test) VGSA(Q) 1.5 1.8 2.3 Vdc Drain--Source On--Voltage (VGS = 10 Vdc, ID = 0.4 Adc) VDS(on) 0.1 0.15 0.3 Vdc Gate Threshold Voltage (VDS = 10 Vdc, ID = 60 Adc) VGS(th) 0.8 1.2 1.6 Vdc Drain--Source On--Voltage (VGS = 10 Vdc, ID = 0.6 Adc) VDS(on) 0.1 0.15 0.3 Vdc Characteristic Off Characteristics (4) On Characteristics -- Side A, Carrier On Characteristics -- Side B, Peaking 1. 2. 3. 4. Continuous use at maximum temperature will affect MTTF. MTTF calculator available at http://www.freescale.com/rf/calculators. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf and search for AN1955. Each side of device measured separately. (continued) A2T21H100--25SR3 2 RF Device Data Freescale Semiconductor, Inc. Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Functional Tests (1,2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 250 mA, VGSB = 0.2 Vdc, Pout = 18 W Avg., f = 2170 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. Power Gain Gps 16.5 17.4 19.5 dB Drain Efficiency D 47.3 50.5 — % PAR 7.3 8.0 — dB ACPR — –35.0 –29.8 dBc Output Peak--to--Average Ratio @ 0.01% Probability on CCDF Adjacent Channel Power Ratio Load Mismatch (2) (In Freescale Doherty Test Fixture, 50 ohm system) IDQA = 250 mA, VGSB = 0.2 Vdc, f = 2140 MHz, 12 sec(on), 12% Duty Cycle VSWR 10:1 at 32 Vdc, 126 W Pulsed CW Output Power (3 dB Input Overdrive from 78 W Pulsed CW Rated Power) No Device Degradation Typical Performance (2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 250 mA, VGSB = 0.2 Vdc, 2110–2170 MHz Bandwidth Pout @ 1 dB Compression Point, CW P1dB — 75 — W (3) P3dB — 112 — W AM/PM (Maximum value measured at the P3dB compression point across the 2110–2170 MHz frequency range) — –21.9 — VBWres — 120 — MHz Gain Flatness in 60 MHz Bandwidth @ Pout = 18 W Avg. GF — 0.17 — dB Gain Variation over Temperature (–30C to +85C) G — 0.01 — dB/C P1dB — 0.006 — dB/C Pout @ 3 dB Compression Point VBW Resonance Point (IMD Third Order Intermodulation Inflection Point) Output Power Variation over Temperature (–30C to +85C) (4) Table 5. Ordering Information Device A2T21H100--25SR3 Tape and Reel Information R3 Suffix = 250 Units, 44 mm Tape Width, 13--inch Reel Package NI--780S--4L4S 1. Part internally matched both on input and output. 2. Measurements made with device in an asymmetrical Doherty configuration. 3. P3dB = Pavg + 7.0 dB where Pavg is the average output power measured using an unclipped W--CDMA single--carrier input signal where output PAR is compressed to 7.0 dB @ 0.01% probability on CCDF. 4. Exceeds recommended operating conditions. See CW operation data in Maximum Ratings table. A2T21H100--25SR3 RF Device Data Freescale Semiconductor, Inc. 3 VGGA VDDA C9 R2 A2T21H100--25S Rev. 1 C1 C10 C11 R3 C12 C3 C4 Z1 R1 C5 C6 C7 CUT OUT AREA C2 C13 C P C14 C15 D60961 R4 C16 C8 C18 C17 R5 C19 VGGB VDDB Figure 2. A2T21H100--25SR3 Test Circuit Component Layout Table 6. A2T21H100--25SR3 Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1, C8, C10, C11, C16, C18 10 F Chip Capacitors C5750X7S2A106M230KB TDK C2, C4, C5, C7, C12, C13, C14, C17 10 pF Chip Capacitors ATC600F100JT250XT ATC C3, C6, C15 0.5 pF Chip Capacitors ATC600F0R5BT250XT ATC C9, C19 220 F, 50 V Electrolytic Capacitors 227CKS050M Illinois Capacitor R1 50 , 10 W Chip Resistor C10A50Z4 Anaren R2, R5 10 K, 1/4 W Chip Resistors CRCW120610K0JNEA Vishay R3, R4 5.6 , 1/4 W Chip Resistors CRCW12065R60FKEA Vishay Z1 2000–2300 MHz Band, 90, 5 dB Directional Coupler X3C21P1-05S Anaren PCB Rogers RO4350B, 0.020, r = 3.66 D60961 MTL A2T21H100--25SR3 4 RF Device Data Freescale Semiconductor, Inc. TYPICAL CHARACTERISTICS — 2110–2170 MHz 17.6 52 D 17.5 50 Gps 17.4 17.3 17.2 –28 –1.4 –30 –1.6 –32 PARC –34 17.1 Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 17 16.9 2060 2080 2100 2120 2140 –36 ACPR 2160 2180 2200 –38 2220 –1.8 –2 –2.2 PARC (dB) Gps, POWER GAIN (dB) 17.7 ACPR (dBc) 17.8 D, DRAIN EFFICIENCY (%) 58 VDD = 28 Vdc, Pout = 18 W (Avg.), IDQA = 250 mA, VGSB = 0.2 Vdc 56 Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth 54 17.9 –2.4 f, FREQUENCY (MHz) IMD, INTERMODULATION DISTORTION (dBc) Figure 3. Single--Carrier Output Peak--to--Average Ratio Compression (PARC) Broadband Performance @ Pout = 18 Watts Avg. 0 VDD = 28 Vdc, Pout = 11 W (PEP), IDQA = 250 mA VGSB = 0.2 Vdc, Two--Tone Measurements (f1 + f2)/2 = Center Frequency of 2140 MHz IM3--L –15 –30 IM3--U IM5--L –45 IM7--U –60 IM7--L IM5--U –75 –90 1 100 10 300 TWO--TONE SPACING (MHz) 17.4 0 17.2 17 16.8 16.6 16.4 –1 dB = 13 W VDD = 28 Vdc, IDQA = 250 mA, VGSB = 0.2 Vdc f = 2140 MHz, Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth –1 ACPR –2 –26 60 –28 55 50 –3 dB = 25.6 W D –3 –2 dB = 19 W –4 –5 65 Gps Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 10 15 20 45 –30 –32 ACPR (dBc) 1 D DRAIN EFFICIENCY (%) 17.6 OUTPUT COMPRESSION AT 0.01% PROBABILITY ON CCDF (dB) Gps, POWER GAIN (dB) Figure 4. Intermodulation Distortion Products versus Two--Tone Spacing –34 40 –36 35 40 –38 PARC 25 30 35 Pout, OUTPUT POWER (WATTS) Figure 5. Output Peak--to--Average Ratio Compression (PARC) versus Output Power A2T21H100--25SR3 RF Device Data Freescale Semiconductor, Inc. 5 TYPICAL CHARACTERISTICS — 2110–2170 MHz 2170 MHz 14 2110 MHz 2140 MHz 2170 MHz 12 Gps 30 15 0 –10 –20 –30 –40 ACPR (dBc) 90 VDD = 28 Vdc, IDQA = 250 mA, VGSB = 0.2 Vdc, Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth, Input Signal 20 PAR = 9.9 dB @ 0.01% Probability on CCDF 2110 MHz 75 2140 MHz 2170 MHz 18 60 2110 MHz 2140 MHz ACPR 16 45 D, DRAIN EFFICIENCY (%) Gps, POWER GAIN (dB) 22 –50 D 10 1 10 100 0 200 –60 Pout, OUTPUT POWER (WATTS) AVG. Figure 6. Single--Carrier W--CDMA Power Gain, Drain Efficiency and ACPR versus Output Power 18 17 Gain GAIN (dB) 16 15 14 VDD = 28 Vdc Pin = 0 dBm IDQA = 250 mA VGSB = 0.2 Vdc 13 12 1850 1950 2050 2150 2250 2350 2450 f, FREQUENCY (MHz) Figure 7. Broadband Frequency Response A2T21H100--25SR3 6 RF Device Data Freescale Semiconductor, Inc. Table 7. Carrier Side Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, IDQA = 237 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB f (MHz) Zsource () Zin () Zload () (1) Gain (dB) (dBm) (W) D (%) AM/PM () 2110 16.2 – j20.6 14.5 + j19.4 13.0 – j11.6 19.9 46.6 45 57.2 –15 2140 22.6 – j22.0 18.4 + j19.4 11.3 – j8.94 19.7 46.6 46 57.7 –16 2170 30.0 – j15.0 25.1 + j17.0 12.1 – j10.2 19.6 46.7 47 58.1 –15 Max Output Power P3dB f (MHz) Zsource () Zin () Zload (2) () Gain (dB) (dBm) (W) D (%) AM/PM () 2110 16.2 – j20.6 16.6 + j21.3 12.8 – j12.8 17.7 47.4 55 58.3 –21 2140 22.6 – j22.0 22.3 + j20.9 12.2 – j11.4 17.5 47.4 55 58.5 –22 2170 30.0 – j15.0 30.4 + j16.9 12.7 – j12.3 17.4 47.5 56 58.8 –20 (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Table 8. Carrier Side Load Pull Performance — Maximum Drain Efficiency Tuning VDD = 28 Vdc, IDQA = 237 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB Gain (dB) (dBm) (W) D (%) AM/PM () 15.5 + j2.97 22.7 44.8 30 68.7 –28 16.6 + j23.8 13.6 + j2.89 22.4 44.8 30 68.6 –30 24.7 + j23.1 13.3 + j1.92 22.2 45.0 31 68.8 –27 f (MHz) Zsource () Zin () 2110 16.2 – j20.6 11.6 + j22.0 2140 22.6 – j22.0 2170 30.0 – j15.0 Zload () (1) Max Drain Efficiency P3dB f (MHz) Zsource () Zin () Zload () (2) Gain (dB) (dBm) (W) D (%) AM/PM () 2110 16.2 – j20.6 13.0 + j23.6 14.4 + j1.73 20.3 45.6 36 69.0 –37 2140 22.6 – j22.0 18.9 + j25.5 12.6 + j1.63 20.1 45.5 36 68.7 –39 2170 30.0 – j15.0 29.3 + j24.0 13.3 + j0.91 20.0 45.7 37 69.0 –35 (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload A2T21H100--25SR3 RF Device Data Freescale Semiconductor, Inc. 7 Table 9. Peaking Side Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, VGSB = 0.2 Vdc, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB f (MHz) Zsource () Zin () Zload () (1) Gain (dB) (dBm) (W) D (%) AM/PM () 2110 9.12 – j16.9 10.8 + j19.0 6.94 – j11.9 14.2 48.6 72 61.8 –31 2140 12.3 – j17.6 15.2 + j19.5 7.25 – j12.4 14.1 48.5 70 60.8 –32 2170 17.3 – j16.3 21.2 + j18.5 7.13 – j12.8 14.0 48.4 70 60.3 –31 Max Output Power P3dB f (MHz) Zsource () Zin () Zload (2) () Gain (dB) (dBm) (W) D (%) AM/PM () 2110 9.12 – j16.9 12.8 + j20.5 7.33 – j13.3 12.2 49.2 83 62.3 –38 2140 12.3 – j17.6 18.7 + j20.4 7.57 – j13.9 12.0 49.1 82 61.1 –39 2170 17.3 – j16.3 26.4 + j17.2 7.78 – j15.1 11.9 49.1 81 60.0 –38 (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Table 10. Peaking Side Load Pull Performance — Maximum Drain Efficiency Tuning VDD = 28 Vdc, VGSB = 0.2 Vdc, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB Gain (dB) (dBm) (W) D (%) AM/PM () 13.9 – j3.44 15.6 46.2 42 73.9 –40 11.4 + j21.4 13.0 – j3.73 15.5 46.3 42 73.1 –40 16.4 + j23.3 12.0 – j1.88 15.2 45.7 37 72.8 –43 f (MHz) Zsource () Zin () 2110 9.12 – j16.9 7.84 + j19.6 2140 12.3 – j17.6 2170 17.3 – j16.3 Zload () (1) Max Drain Efficiency P3dB f (MHz) Zsource () Zin () Zload () (2) Gain (dB) (dBm) (W) D (%) AM/PM () 2110 9.12 – j16.9 9.75 + j21.2 12.6 – j3.97 13.6 46.9 49 74.0 –54 2140 12.3 – j17.6 15.7 + j22.5 12.1 – j6.94 13.4 47.6 57 72.9 –49 2170 17.3 – j16.3 23.6 + j22.1 11.2 – j6.81 13.2 47.5 57 72.7 –50 (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload A2T21H100--25SR3 8 RF Device Data Freescale Semiconductor, Inc. P1dB -- TYPICAL CARRIER SIDE LOAD PULL CONTOURS — 2140 MHz 10 10 5 5 E E --5 P --10 44 42.5 46.5 --15 43 --20 45 0 5 62 P --10 60 64 66 --5 58 56 --15 46 43.5 44.5 --25 --5 54 52 --20 45.5 10 15 20 --25 --5 30 25 0 5 10 15 20 30 25 REAL () REAL () Figure 8. P1dB Load Pull Output Power Contours (dBm) Figure 9. P1dB Load Pull Efficiency Contours (%) 10 10 23 5 E 22.5 IMAGINARY () 22 21.5 P 21 20.5 --15 19.5 --20 0 5 10 15 –22 –20 --5 –18 P --10 –16 --15 20 --20 19 --25 --5 E 0 --5 --10 –26 –30 –24 –28 5 0 IMAGINARY () 68 0 IMAGINARY () IMAGINARY () 0 20 30 25 --25 --5 –14 0 REAL () 5 10 15 20 25 30 REAL () Figure 10. P1dB Load Pull Gain Contours (dB) NOTE: Figure 11. P1dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power A2T21H100--25SR3 RF Device Data Freescale Semiconductor, Inc. 9 P3dB -- TYPICAL CARRIER SIDE LOAD PULL CONTOURS — 2140 MHz 10 10 5 5 E --5 --10 43.5 --15 P 45 --25 --5 46 47 44.5 45.5 0 66 --5 5 64 62 60 --10 P 58 --15 44 --20 68 E 0 IMAGINARY () IMAGINARY () 0 56 54 --20 46.5 10 15 20 --25 --5 30 25 0 5 10 20 15 52 30 25 REAL () REAL () Figure 12. P3dB Load Pull Output Power Contours (dBm) Figure 13. P3dB Load Pull Efficiency Contours (%) 10 10 21 5 20 --5 19.5 --10 P 19 18.5 --15 17.5 --20 –28 –26 --5 –24 --10 P –22 --15 18 –30 –32 –36 E 0 IMAGINARY () IMAGINARY () 20.5 E 0 –34 5 –20 --20 17 --25 --5 0 5 10 15 20 30 25 --25 --5 0 REAL () 5 10 15 20 25 30 REAL () Figure 14. P3dB Load Pull Gain Contours (dB) NOTE: Figure 15. P3dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power A2T21H100--25SR3 10 RF Device Data Freescale Semiconductor, Inc. P1dB -- TYPICAL PEAKING SIDE LOAD PULL CONTOURS — 2140 MHz 5 5 44.5 0 45 45.5 E --5 46.5 46 --10 P 47.5 48 --15 IMAGINARY () IMAGINARY () 0 47 72 E --5 68 70 64 66 --10 62 P 60 --15 58 --20 --20 --25 0 5 10 15 20 --25 30 25 0 5 10 15 20 25 30 REAL () REAL () Figure 16. P1dB Load Pull Output Power Contours (dBm) Figure 17. P1dB Load Pull Efficiency Contours (%) 5 5 0 0 IMAGINARY () IMAGINARY () E --5 --10 15 P --15 11.5 12 --25 0 5 –36 –34 --10 P –32 --15 14.5 13 --20 –38 E --5 –40 –42 –44 13.5 12.5 --20 14 14 10 15 20 25 30 --25 –30 0 5 REAL () 10 15 20 25 30 REAL () Figure 18. P1dB Load Pull Gain Contours (dB) NOTE: Figure 19. P1dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power A2T21H100--25SR3 RF Device Data Freescale Semiconductor, Inc. 11 P3dB -- TYPICAL PEAKING SIDE LOAD PULL CONTOURS — 2140 MHz 5 5 45 0 0 E --15 48 48.5 P 46 46.5 --10 IMAGINARY () IMAGINARY () 45.5 --5 47 47.5 49 --5 E --10 66 62 64 P --15 60 58 --20 --20 --25 --25 0 68 70 72 5 10 15 20 30 25 56 0 5 10 15 20 25 30 REAL () Figure 20. P3dB Load Pull Output Power Contours (dBm) Figure 21. P3dB Load Pull Efficiency Contours (%) 5 5 0 0 --5 --5 IMAGINARY () IMAGINARY () REAL () E --10 --15 9.5 --20 0 11.5 10.5 5 –50 E 10 –48 –46 –44 --10 –42 –40 P --15 12.5 11 10 --25 13 P –52 –38 --20 12 15 20 25 30 --25 –36 0 5 REAL () 10 15 20 25 30 REAL () Figure 22. P3dB Load Pull Gain Contours (dB) NOTE: Figure 23. P3dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Gain Drain Efficiency Linearity Output Power A2T21H100--25SR3 12 RF Device Data Freescale Semiconductor, Inc. PACKAGE DIMENSIONS A2T21H100--25SR3 RF Device Data Freescale Semiconductor, Inc. 13 A2T21H100--25SR3 14 RF Device Data Freescale Semiconductor, Inc. PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS Refer to the following resources to aid your design process. Application Notes AN1955: Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins EB212: Using Data Sheet Impedances for RF LDMOS Devices Software Electromigration MTTF Calculator RF High Power Model .s2p File Development Tools Printed Circuit Boards To Download Resources Specific to a Given Part Number: 1. Go to http://www.freescale.com/rf 2. Search by part number 3. Click part number link 4. Choose the desired resource from the drop down menu REVISION HISTORY The following table summarizes revisions to this document. Revision Date 0 June 2015 Description Initial Pre--release of Data Sheet A2T21H100--25SR3 RF Device Data Freescale Semiconductor, Inc. 15 How to Reach Us: Home Page: freescale.com Web Support: freescale.com/support Information in this document is provided solely to enable system and software implementers to use Freescale products. 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