PD - 9.1387B IRFI3710 PRELIMINARY HEXFET® Power MOSFET Advanced Process Technology Isolated Package l High Voltage Isolation = 2.5KVRMS l Sink to Lead Creepage Dist. = 4.8mm l Fully Avalanche Rated Description l D l VDSS = 100V RDS(on) = 0.025Ω G Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. ID = 32A S The TO-220 Fullpak eliminates the need for additional insulating hardware in commercial-industrial applications. The moulding compound used provides a high isolation capability and a low thermal resistance between the tab and external heatsink. This isolation is equivalent to using a 100 micron mica barrier with standard TO-220 product. The Fullpak is mounted to a heatsink using a single clip or by a single screw fixing. TO-220 FULLPAK Absolute Maximum Ratings Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 screw Max. Units 32 23 180 63 0.42 ± 20 530 28 6.3 5.0 -55 to + 175 A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RθJC RθJA Junction-to-Case Junction-to-Ambient Typ. Max. Units ––– ––– 2.4 65 °C/W 3/16/98 IRFI3710 Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 100 ––– ––– 2.0 20 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 0.12 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 14 59 58 48 IDSS Drain-to-Source Leakage Current LD Internal Drain Inductance ––– 4.5 LS Internal Source Inductance ––– 7.5 Ciss Coss Crss C Input Capacitance Output Capacitance Reverse Transfer Capacitance Drain to Sink Capacitance ––– ––– ––– ––– 3000 640 330 12 V(BR)DSS ∆V(BR)DSS/∆TJ IGSS Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 0.025 Ω VGS = 10V, ID = 16A 4.0 V VDS = VGS, ID = 250µA ––– S VDS = 25V, ID = 28A 25 VDS = 100V, VGS = 0V µA 250 VDS = 80V, VGS = 0V, TJ = 150°C 100 VGS = 20V nA -100 VGS = -20V 190 ID = 28A 26 nC VDS = 80V 82 VGS = 10V, See Fig. 6 and 13 ––– VDD = 50V ––– ID = 28A ns ––– RG = 2.5Ω ––– RD = 1.7Ω, See Fig. 10 Between lead, ––– 6mm (0.25in.) nH G from package ––– and center of die contact ––– VGS = 0V ––– VDS = 25V pF ––– ƒ = 1.0MHz, See Fig. 5 ––– ƒ = 1.0MHz D S Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol 32 ––– ––– showing the A G integral reverse ––– ––– 180 p-n junction diode. S ––– ––– 1.3 V TJ = 25°C, IS = 16A, VGS = 0V ––– 210 320 ns TJ = 25°C, IF = 28A ––– 1.7 2.6 µC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by Pulse width ≤ 300µs; duty cycle ≤ 2%. max. junction temperature. ( See fig. 11 ) VDD = 25V, starting TJ = 25°C, L = 1.4mH t=60s, ƒ=60Hz RG = 25Ω, IAS = 28A. (See Figure 11) ISD ≤28A, di/dt ≤ 460A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Uses IRF3710 data and test conditions IRFI3710 1000 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP I , D rain-to-S ource C urrent (A ) D I , D rain-to-S ource C urrent (A ) D TOP 100 100 10 4.5V 20µ s P U LS E W ID TH TC = 25°C 1 0.1 1 10 A 4.5V 10 100 V D S , D rain-to-S ource V oltage (V ) R D S (on ) , D rain-to-S ource O n R esistance (N orm alized) I D , D ra in -to-S o urc e C urren t (A ) 3.0 T J = 2 5 °C 100 T J = 1 7 5 °C 10 VDS = 50V 2 0 µ s P U L S E W ID T H 5 6 7 8 9 V G S , G a te -to -S o u rc e V o lta g e (V ) Fig 3. Typical Transfer Characteristics 10 A 100 Fig 2. Typical Output Characteristics 1000 4 1 V D S , D rain-to-S ource V oltage (V ) Fig 1. Typical Output Characteristics 1 20µ s P U LS E W ID TH T C = 175°C 1 0.1 10 A I D = 46A 2.5 2.0 1.5 1.0 0.5 V G S = 10V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 180 T J , Junction T em perature (°C ) Fig 4. Normalized On-Resistance Vs. Temperature IRFI3710 V GS C iss C rss C oss 5000 = = = = 20 0V , f = 1M H z C gs + C gd , C ds S H O R TE D C gd C ds + C gd V G S , G ate-to-S ource V oltage (V ) 6000 C , C apacitanc e (pF ) C is s 4000 3000 C os s 2000 C rs s 1000 0 10 V D S = 80V V D S = 50V V D S = 20V 16 12 8 4 FO R TE S T C IR C U IT S E E FIG U R E 13 0 A 1 I D = 28 A 0 100 V D S , D rain-to-S ource V oltage (V ) 80 120 160 A 200 Q G , Total G ate C harge (nC ) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 1000 O P E R A TIO N IN TH IS A R E A LIM ITE D B Y R D S (on) I D , D rain C urrent (A ) I S D , R everse D rain C urrent (A ) 40 100 T J = 17 5°C T J = 25°C 10 10µ s 100 100µ s 1m s 10 10m s V G S = 0V 1 0.4 0.8 1.2 1.6 V S D , S ource-to-D rain V oltage (V ) Fig 7. Typical Source-Drain Diode Forward Voltage A 2.0 T C = 25°C T J = 175°C S ingle P ulse 1 1 A 10 100 1000 V D S , D rain-to-S ource V oltage (V ) Fig 8. Maximum Safe Operating Area IRFI3710 35 RD VDS I D , Drain Current (A) 30 VGS D.U.T. RG 25 + -VDD 20 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 15 Fig 10a. Switching Time Test Circuit 10 VDS 5 90% 0 25 50 75 100 125 150 175 TC , Case Temperature ( ° C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 1 D = 0.50 0.20 0.10 0.05 0.1 0.02 0.01 P DM SINGLE PULSE (THERMAL RESPONSE) t1 0.01 t2 0.001 0.00001 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 10 IRFI3710 15V L VDS D .U .T RG IA S 20V D R IV E R + V - DD 0 .01 Ω tp Fig 12a. Unclamped Inductive Test Circuit A E A S , S ingle P ulse A valanc he E nergy (m J) 1200 TO P 1000 B O TTO M ID 11A 20A 28 A 800 600 400 200 0 V D D = 25V 25 50 A 75 100 125 150 175 S tarting T J , Junction T em perature (°C ) V (B R )D S S tp Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Current Regulator Same Type as D.U.T. Fig 12b. Unclamped Inductive Waveforms 50KΩ QG 12V .2µF .3µF 10 V QGS D.U.T. QGD + V - DS VGS VG 3mA Charge Fig 13a. Basic Gate Charge Waveform IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit IRFI3710 Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • • • • RG Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test D= Period - VDD P.W. Period VGS=10V D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS ISD * IRFI3710 Package Outline TO-220 Fullpak Outline Dimensions are shown in millimeters (inches) 10.60 (.417) 10.40 (.409) ø 3.40 (.133) 3.10 (.123) 4.80 (.189) 4.60 (.181) -A3.70 (.145) 3.20 (.126) 16.00 (.630) 15.80 (.622) 2.80 (.110) 2.60 (.102) LE A D A S S IG N ME N TS 1 - G A TE 2 - D R A IN 3 - SOURCE 7.10 (.280) 6.70 (.263) 1.15 (.045) M IN . NOTES: 1 D IME N S IO N IN G & TO LE R A N C IN G P E R A N S I Y 14.5M , 1982 1 2 3 2 C O N TR O LLIN G D IM E N S IO N : IN C H . 3.30 (.130) 3.10 (.122) -B- 13.70 (.540) 13.50 (.530) C A 1.40 (.055) 3X 1.05 (.042) 0.90 (.035) 3X 0.70 (.028) 0.25 (.010) 2.54 (.100) 2X 3X M A M B 0.48 (.019) 0.44 (.017) 2.85 (.112) 2.65 (.104) D B M IN IM U M C R E E P A G E D IS TA N C E B E TW E E N A -B -C -D = 4.80 (.189) Part Marking Information TO-220 Fullpak E X AEMXPALMEP: L ETH 1 0F1I8 0 40G : IST HIS IS AISN AIR N F IR W ITH A S SAESMS BE LMYB L Y W ITH L O TL OCTO DCEO D9EB 1EM4 0 1 A IN TE R N A T IO N A L IN T E R N A T IO N A L R E C TIF IE R IRIRFF1I8 0 1400 G R E C T IF IE R LOGO 9 246 LOGO 9 BE 40 1 192M45 A SASSESM B LBYL Y EM L OL TO T C O DD EE CO P A R T N U M B E RA PART NUMBER D A TE C O D E (YDYAW T EW )C O D E Y(Y Y Y=W YWE)A R Y == YE RK WYW W EA E W W = W EEK WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 3/98