SMPS MOSFET PD - 95702 IRFPS40N60KPbF Applications l Hard Switching Primary or PFC Switch l Switch Mode Power Supply (SMPS) l Uninterruptible Power Supply l High Speed Power Switching l Motor Drive l Lead-Free Benefits l Low Gate Charge Qg results in Simple Drive Requirement l Improved Gate, Avalanche and Dynamic dv/dt Ruggedness l Fully Characterized Capacitance and Avalanche Voltage and Current l Enhanced Body Diode dv/dt Capability Absolute Maximum Ratings HEXFET® Power MOSFET VDSS VGS dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds (1.6mm from case ) ID 0.110 Ω 40A 600V SUPER TO-247AC Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C RDS(on) typ. Max. Units 40 24 160 570 4.5 ± 30 5.5 -55 to + 150 A W W/°C V V/ns 300 °C Avalanche Characteristics Symbol EAS IAR EAR Parameter Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Typ. Max. Units ––– ––– ––– 600 40 57 mJ A mJ Typ. Max. Units ––– 0.24 ––– 0.22 ––– 40 °C/W Thermal Resistance Symbol RθJC RθCS RθJA www.irf.com Parameter Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient 1 9/10/04 IRFPS40N60KPbF Static @ TJ = 25°C (unless otherwise specified) Symbol V(BR)DSS RDS(on) VGS(th) Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage IDSS Drain-to-Source Leakage Current IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage ∆V(BR)DSS/∆TJ Min. 600 ––– ––– 3.0 ––– ––– ––– ––– Typ. ––– 0.63 0.110 ––– ––– ––– ––– ––– Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 0.130 Ω VGS = 10V, ID = 24A 5.0 V VDS = VGS, ID = 250µA 50 VDS = 600V, VGS = 0V µA 250 VDS = 480V, VGS = 0V, TJ = 125°C 100 VGS = 30V nA -100 VGS = -30V Dynamic @ TJ = 25°C (unless otherwise specified) Symbol gfs Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Coss Coss Coss eff. Parameter Forward Transconductance Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance Min. 21 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– ––– ––– ––– 47 110 97 60 7970 750 75 9440 200 260 Max. Units Conditions ––– S VDS = 50V, ID = 24A 330 ID = 38A 84 nC VDS = 480V 150 VGS = 10V, See Fig. 6 and 13 ––– VDD = 300V ––– ID = 38A ns ––– R G = 4.3Ω ––– VGS = 10V,See Fig. 10 ––– VGS = 0V ––– VDS = 25V ––– pF ƒ = 1.0MHz, See Fig. 5 ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz ––– VGS = 0V, VDS = 480V, ƒ = 1.0MHz ––– VGS = 0V, VDS = 0V to 480V Diode Characteristics Symbol IS VSD Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge ISM IRRM ton Reverse Recovery Current Forward Turn-On Time Min. Typ. Max. Units Conditions D ––– ––– 40 MOSFET symbol showing the A G ––– ––– 160 integral reverse S p-n junction diode. ––– ––– 1.5 V TJ = 25°C, IS = 38A, VGS = 0V ––– 630 950 TJ = 25°C IF = 38A ns ––– 730 1090 TJ = 125°C di/dt = 100A/µs ––– 14 20 TJ = 25°C µC ––– 17 25 TJ = 125°C ––– 39 58 A TJ = 25°C Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by Pulse width ≤ 300µs; duty cycle ≤ 2%. Starting TJ = 25°C, L = 0.84mH, RG = 25Ω, Coss eff. is a fixed capacitance that gives the same charging time max. junction temperature. (See Fig. 11) IAS = 38A, dv/dt =5.5V/ns (See Figure 12a) as Coss while VDS is rising from 0 to 80% VDSS ISD ≤ 38A, di/dt ≤ 150A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C 2 www.irf.com IRFPS40N60KPbF 1000 100 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V 100 10 TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 1 0.1 4.5V 0.01 20µs PULSE WIDTH Tj = 25°C 0.001 0.1 1 10 10 4.5V 1 20µs PULSE WIDTH Tj = 150°C 0.1 100 0.1 1 VDS, Drain-to-Source Voltage (V) 10 100 VDS, Drain-to-Source Voltage (V) Fig 2. Typical Output Characteristics Fig 1. Typical Output Characteristics 3.5 1000 I D = 38A 3.0 T J= 150 ° C 10 TJ = 25 °C 1 0.1 V DS= 50V 20µs PULSE WIDTH 0.01 4 6 8 10 11 13 V GS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com 15 2.5 (Normalized) R DS(on) , Drain-to-Source On Resistance I D, Drain-to-Source Current (A) 100 2.0 1.5 1.0 0.5 V GS = 10V 0.0 -60 -40 -20 0 20 40 60 TJ , Junction Temperature 80 100 120 140 ( ° C) Fig 4. Normalized On-Resistance Vs. Temperature 3 160 IRFPS40N60KPbF 100000 VGS C iss C rss C oss 10000 I D = 38A Ciss 1000 Coss 100 Crss 10 VDS = 120V 7 5 2 0 1 10 100 0 1000 100 150 200 250 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 1000 ID, Drain-to-Source Current (A) 1000 OPERATION IN THIS AREA LIMITED BY R DS(on) 100 100 I SD , Reverse Drain Current (A) 50 QG, Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) T J= 150 ° C 10 TJ = 25 °C 1 V GS = 0 V 0.1 0.2 0.6 0.9 1.3 V SD,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 VDS = 480V VDS = 300V 10 VGS , Gate-to-Source Voltage (V) C, Capacitance(pF) 12 = 0V, f = 1 MHZ =C +C , C SHORTED gs gd ds =C gd =C +C ds gd 100µsec 10 1msec 1 0.1 1.6 10msec Tc = 25°C Tj = 150°C Single Pulse 1 10 100 1000 10000 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRFPS40N60KPbF 40 VGS D.U.T. RG 30 I D , Drain Current (A) RD V DS + -VDD 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 20 Fig 10a. Switching Time Test Circuit 10 VDS 90% 0 25 50 75 100 TC , Case Temperature 125 150 ( ° C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms (Z thJC ) 1 D = 0.50 0.1 Thermal Response 0.20 0.10 0.05 0.01 0.02 0.01 P DM SINGLE PULSE (THERMAL RESPONSE) t1 t2 Notes: 1. Duty factor D = 2. Peak T 0.001 0.00001 0.0001 0.001 0.01 t1/ t 2 J = P DM x Z thJC +TC 0.1 1 t 1, Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFPS40N60KPbF 1200 TOP 17A 24A BOTTOM 38A VGS(th) Gate threshold Voltage (V) 960 EAS , Single Pulse Avalanche Energy (mJ) 5.0 ID 720 480 240 4.5 4.0 ID = 250µA 3.5 3.0 2.5 2.0 0 25 50 75 100 125 150 ( ° C) Starting Tj, Junction Temperature -75 -50 -25 0 25 50 75 100 125 150 T J , Temperature ( °C ) Fig 12a. Maximum Avalanche Energy Vs. Drain Current Fig 14. Threshold Voltage Vs. Temperature 15V V(BR)DSS DRIVER L VDS D.U.T RG + - VDD IAS 20V tp tp A 0.01Ω I AS Fig 12c. Unclamped Inductive Test Circuit Fig 12d. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. QG 50KΩ 12V VGS V .2µF .3µF D.U.T. + V - DS QGS QGD VG VGS 3mA IG ID Current Sampling Resistors Fig 13a. Gate Charge Test Circuit 6 Charge Fig 13b. Basic Gate Charge Waveform www.irf.com IRFPS40N60KPbF Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + RG • • • • Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Period D= - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFET® Power MOSFETs www.irf.com 7 IRFPS40N60KPbF Case Outline and Dimensions — Super-247 Super-247 (TO-274AA) Part Marking Information E X A M P L E : T H IS IS A N IR F P S 3 7 N 5 0 A W IT H A S SE M BLY LO T C O D E 1789 A SS EM B LE D O N W W 19, 1997 IN T H E A S S E M B L Y L IN E "C " PART NUM BER IN T E R N A T IO N A L R E C T IF IE R LOG O IR FPS 37N 50A 719C 17 89 ASSEM BLY LOT CO DE N o te : "P " in a s s e m b ly lin e p o s itio n in d ic a te s " L e a d - F re e " DATE CO DE YE AR 7 = 1997 W EEK 19 L IN E C TOP Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.09/04 8 www.irf.com