V6203608 VID

REVISIONS
LTR
DESCRIPTION
DATE
APPROVED
A
Make correction the title block. Replace footnote
1/ under Table I. Add notes and inch dimensions
to figure 1. Drawing updated to reflect current
requirements. - ro
08-04-28
R. HEBER
B
Make changes to TM2-0 test modes 010 and 110
as specified in Table E figure 5.
Update document paragraphs to current
requirements. - ro
14-09-03
C. SAFFLE
CURRENT DESIGN ACTIVITY CAGE CODE 16236
HAS CHANGED NAMES TO:
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
Prepared in accordance with ASME Y14.24
Vendor item drawing
REV
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PMIC N/A
PREPARED BY
RICK OFFICER
Original date of drawing
YY-MM-DD
CHECKED BY
TOM HESS
02-12-12
TITLE
MICROCIRCUIT, DIGITAL-LINEAR, CMOS,
14-BIT, 1, 3, 8 MSPS, ANALOG-TO-DIGITAL
CONVERTER, MONOLITHIC SILICON
APPROVED BY
RAYMOND MONNIN
SIZE
A
REV
AMSC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
CODE IDENT. NO.
DWG NO.
V62/03608
16236
B
PAGE
1
OF
20
5962-V106-14
1. SCOPE
1.1 Scope. This drawing documents the general requirements of a high performance analog-to-digital microcircuit, with an operating
temperature range of -55C to +125C.
1.2 Vendor Item Drawing Administrative Control Number. The manufacturers PIN is the item of identification. The vendor item
drawing establishes an administrative control number for identifying the item on the engineering documentation:
V62/03608
-
Drawing
number
01
X
E
Device type
(See 1.2.1)
Case outline
(See 1.2.2)
Lead finish
(See 1.2.3)
1.2.1 Device type(s).
Device type
Generic
Circuit function
Clock frequency
01
THS1401-EP
1 MHz
02
THS1403-EP
03
THS1408-EP
14-bit, 8 MSPS DSP compatible analog-todigital converter with internal reference
14-bit, 8 MSPS DSP compatible analog-todigital converter with internal reference
14-bit, 8 MSPS DSP compatible analog-todigital converter with internal reference
3 MHz
8 MHz
1.2.2 Case outline(s). The case outline(s) are as specified herein.
Outline letter
Number of pins
X
48
JEDEC PUB 95
Package style
MS-026
Plastic quad flat pack
1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacturer:
Finish designator
A
B
C
D
E
Z
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Material
Hot solder dip
Tin-lead plate
Gold plate
Palladium
Gold flash palladium
Other
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1.3 Absolute maximum ratings.
1/
Supply voltage (AVDD to AGND) ................................................................................ 4 V
Supply voltage (DVDD to DGND) ............................................................................... 4 V
Reference input voltage range (VBG) ......................................................................... -0.3 V to AVDD +0.3 V
Analog input voltage range ........................................................................................ -0.3 V to AVDD +0.3 V
Digital input voltage range ..........................................................................................
Storage temperature range (TSTG)...............................................................................
Lead temperature 1.6 mm (1/16 inch) from case for 10 seconds ...............................
Thermal resistance, junction-to-case (JC) ................................................................
-0.3 V to DVDD +0.3 V
-65C to 150C
260C
0.79C/W 2/
Thermal resistance, junction-to-ambient (JA) ........................................................... 28.8C/W 2/
1.4 Recommended operating conditions. 3/
Supply voltage range (AVDD, DVDD) ......................................................................... 3 V to 3.6 V
High level digital input voltage (VIH) ........................................................................... 2 V minimum
Low level digital input voltage (VIL) ............................................................................ 0.8 V maximum
Load capacitance (CL) ............................................................................................... 15 pF maximum
Clock frequency (fCLK) :
Device type 01 .......................................................................................................
Device type 02 .......................................................................................................
Device type 03 .......................................................................................................
Clock duty cycle .........................................................................................................
Operating free-air temperature range (TA):
Device types 01 and 02 ..........................................................................................
Device type 03 .......................................................................................................
1/
2/
3/
0.1 to 1 MHz
0.1 to 3 MHz
0.1 to 8 MHz
45% to 55%
-40C to +125C
-55C to +125C
Stresses beyond those listed under “absolute maximum rating” may cause permanent damage to the device. These are stress
ratings only, and functional operation of the device at these or any other conditions beyond those indicated under
“recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may
affect device reliability.
Informational purposes only, not production tested.
Use of this product beyond the manufacturers design rules or stated parameters is done at the user’s risk. The manufacturer
and/or distributor maintain no responsibility or liability for product used beyond the stated limits.
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2. APPLICABLE DOCUMENTS
JEDEC Solid State Technology Association
JEDEC PUB 95 –
Registered and Standard Outlines for Semiconductor Devices
(Copies of these documents are available online at http:/www.jedec.org or from JEDEC – Solid State Technology Association,
3103 North 10th Street, Suite 240–S, Arlington, VA 22201-2107).
3. REQUIREMENTS
3.1 Marking. Parts shall be permanently and legibly marked with the manufacturer’s part number as shown in 6.3 herein and as
follows:
A.
B.
C.
Manufacturer’s name, CAGE code, or logo
Pin 1 identifier
ESDS identification (optional)
3.2 Unit container. The unit container shall be marked with the manufacturer’s part number and with items A and C (if applicable)
above.
3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are
as specified in 1.3, 1.4, and table I herein.
3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein.
3.5 Diagrams.
3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1.
3.5.2 Terminal connections. The terminal connections shall be as shown in figure 2.
3.5.3 Block diagram. The block diagram shall be as shown in figure 3.
3.5.4 Timing diagrams. The timing diagrams shall be as shown in figure 4.
3.5.5 Principles of operation. The principles of operation and test circuit shall be as shown in figure 5.
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TABLE I. Electrical performance characteristics. 1/
Test
Symbol
Conditions
AVDD = DVDD = 3.3 V
unless otherwise specified
Temperature,
TA
Device
type
Limits
Min
Unit
Max
Power supply section.
Analog supply current
Digital supply current
IDDA
IDDD
Power
AVDD = 3.6 V
DVDD = 3.6 V
AVDD = DVDD = 3.6 V
Power down current
-40C  TA  +125C
01,02
90
-55C  TA  +125C
03
90
-40C  TA  +125C
01,02
10
-55C  TA  +125C
03
10
-40C  TA  +125C
01,02
360
-55C  TA  +125C
03
360
-40C  TA  +125C
01,02
20 typical
-55C  TA  +125C
03
20 typical
-40C  TA  +125C
01,02
14 typical
-55C  TA  +125C
03
14 typical
-40C  TA  +125C
01,02
1
-55C  TA  +125C
03
1
-40C  TA  +125C
01
2.5
02
3
-55C  TA  +125C
03
7.5
-40C  TA  +125C
01,02
0.3
-55C  TA  +125C
03
0.3
-40C  TA  +125C
01,02
1.75
-55C  TA  +125C
03
1.75
mA
mA
mW
A
DC characteristics section.
Resolution
Differential nonlinearity
Integral nonlinearity
Offset error
Gain error
DNL
INL
OE
GE
Best fit
IN+, IN-, PGA = 0 dB
PGA = 0 dB
Bits
LSB
LSB
FSR
FSR
See footnote at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions
AVDD = DVDD = 3.3 V
unless otherwise specified
Temperature,
Device
type
Limits
Min
TA
Unit
Max
AC characteristics section.
Effective number of bits
Total harmonic
distortion
-40C  TA  +125C
01,02
11.2
-55C  TA  +125C
03
11.2
-40C  TA  +125C
01,02
-81 typical
-55C  TA  +125C
03
-81 typical
-40C  TA  +125C
02
-78 typical
-55C  TA  +125C
03
-78 typical
fi = 4 MHz
-55C  TA  +125C
03
-77 typical
fi = 100 kHz
-40C  TA  +125C
01,02
72 typical
-55C  TA  +125C
03
72 typical
-40C  TA  +125C
02
70
-55C  TA  +125C
03
70
fi = 4 MHz
-55C  TA  +125C
03
71 typical
fi = 100 kHz
-40C  TA  +125C
01,02
70 typical
-55C  TA  +125C
03
70 typical
-40C  TA  +125C
02
69
-55C  TA  +125C
03
69
fi = 4 MHz
-55C  TA  +125C
03
70 typical
fi = 100 kHz
-40C  TA  +125C
01,02
80 typical
-55C  TA  +125C
03
80 typical
-40C  TA  +125C
02
71
-55C  TA  +125C
03
71
-40C  TA  +125C
03
ENOB
THD
fi = 100 kHz
fi = 1 MHz
Signal-to-noise ratio
SNR
fi = 1 MHz
Signal-to-noise ratio +
distortion
SINAD
fi = 1 MHz
Spurious free dynamic
range
SFDR
fi = 1 MHz
fi = 4 MHz
Bits
dB
dB
dB
dB
80 typical
See footnote at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions
AVDD = DVDD = 3.3 V
unless otherwise specified
Temperature,
TA
Device
type
Limits
Min
Unit
Max
AC characteristics section – continued.
Analog input bandwidth
-40C  TA  +125C
01,02
140 typical
-55C  TA  +125C
03
140 typical
-40C  TA  +125C
01,02
1.425
1.575
-55C  TA  +125C
03
1.425
1.575
-40C  TA  +125C
01,02
40 typical
-55C  TA  +125C
03
40 typical
-40C  TA  +125C
01,02
2.5 typical
-55C  TA  +125C
03
2.5 typical
-40C  TA  +125C
01,02
0.5 typical
-55C  TA  +125C
03
0.5 typical
-40C  TA  +125C
01,02
2 typical
-55C  TA  +125C
03
2 typical
-40C  TA  +125C
01,02
5 typical
-55C  TA  +125C
03
5 typical
-40C  TA  +125C
01,02
40 typical
-55C  TA  +125C
03
40 typical
-40C  TA  +125C
01,02
200 typical
-55C  TA  +125C
03
200 typical
MHz
Reference voltage section.
Bandgap voltage,
internal mode
VBG
Input impedance
Positive reference
voltage
Negative reference
voltage
Reference difference,
REF+ - REF-
REF+
REF-
REF
Accuracy, internal
reference
Temperature
coefficient
Voltage coefficient
TC
VC
V
k
V
V
V
%
ppm/
C
ppm/V
See footnote at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions
AVDD = DVDD = 3.3 V
unless otherwise specified
Temperature,
TA
Device
type
Limits
Unit
Min
Max
Analog inputs section.
Positive analog input
Negative analog input
-40C  TA  +125C
01,02
0
AVDD
-55C  TA  +125C
03
0
AVDD
-40C  TA  +125C
01,02
0
AVDD
-55C  TA  +125C
03
0
AVDD
Ain = IN+ - IN-,
-40C  TA  +125C
01,02
-Vref
Vref
Vref = REF+ - REF-
-55C  TA  +125C
03
-Vref
Vref
-40C  TA  +125C
01,02
25 typical
-55C  TA  +125C
03
25 typical
-40C  TA  +125C
01,02
0
7
-55C  TA  +125C
03
0
7
-40C  TA  +125C
01,02
1 typical
-55C  TA  +125C
03
1 typical
-40C  TA  +125C
01,02
0.25
-55C  TA  +125C
03
0.25
-40C  TA  +125C
01,02
2
-55C  TA  +125C
03
2
-40C  TA  +125C
01,02
0.8
-55C  TA  +125C
03
0.8
-40C  TA  +125C
01,02
5 typical
-55C  TA  +125C
03
5 typical
-40C  TA  +125C
01,02
1
-55C  TA  +125C
03
1
IN+
IN-
Analog input voltage
difference
Input impedance
PGA range
PGA step size
PGA gain error
V
V
V
k
dB
dB
dB
Digital inputs section.
High level digital input
Low level digital input
Input capacitance
Input current
VIH
VIL
CIN
IIN
V
V
pF
A
See footnote at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions
AVDD = DVDD = 3.3 V
unless otherwise specified
Temperature,
TA
Device
type
Limits
Min
Unit
Max
Digital outputs section.
High level digital output
Low level digital output
Output current, high
impedance
VOH
VOL
IOH = 50 A
IOL = 50 A
IOZ
-40C  TA  +125C
01,02
2.6
V
-55C  TA  +125C
03
2.6
-40C  TA  +125C
01,02
0.4
-55C  TA  +125C
03
0.4
-40C  TA  +125C
01,02
10
-55C  TA  +125C
03
10
-40C  TA  +125C
01
0.1 2/
1
02
0.1 2/
3
-55C  TA  +125C
03
0.1 2/
8
-40C  TA  +125C
01,02
25
-55C  TA  +125C
03
25
-40C  TA  +125C
01,02
9.5 typical
-55C  TA  +125C
03
9.5 typical
V
A
Clock timing (CS low) section.
Clock frequency
Output delay time
fCLK
td
Latency
MHz
ns
Cycles
1/
Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over
the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters
may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization
and/or design.
2/
This parameter is not production tested.
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Case X
FIGURE 1. Case outline.
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Case X
Dimensions
Inches
Symbol
Millimeters
Min
Max
Min
Max
A
---
.047
---
1.20
A1
.037
.041
0.95
1.05
A2
.009
---
0.25
---
A3
.001
.005
0.05
0.15
b
.006
.010
0.17
0.27
C
.005
---
0.13
---
D
.346
.362
8.80
9.20
D1
.267
.283
6.80
7.20
D2
.216
---
5.50
---
E
.346
.362
8.80
9.20
E1
.267
.283
6.80
7.20
E2
.216
---
5.50
---
e
.019
---
0.50
---
L1
.017
.029
0.45
0.75
NOTES:
1. Controlling dimensions are inch, millimeter dimensions are given for reference only.
2. Body dimensions do not include mold flash or protrusion.
3. The package thermal performance may be enhanced by bonding the thermal pad to an thermal plane.
This pad is electrically and thermally connected to the backside of the die and possibly selected leads.
4. Falls within JEDEC MS-026.
FIGURE 1. Case outline – Continued.
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Device types
All
Device types
All
Case outline
X
Case outline
X
Terminal
number
Terminal
symbol
Terminal
number
Terminal
symbol
1
-IN
25
DGND
2
AVDD
26
DVDD
3
VBG
27
D2
4
CML
28
D1
5
+REF
29
D0
6
-REF
30
DVDD
7
AGND
31
DVDD
8
AGND
32
CLK
9
DGND
33
DGND
10
OV
34
DGND
11
D13
35
OE
12
D12
36
WR
13
D11
37
CS
14
DVDD
38
NC
15
DGND
39
NC
16
D10
40
A1
17
D9
41
A0
18
D8
42
DVDD
19
D7
43
AVDD
20
DVDD
44
AGND
21
D6
45
AGND
22
D5
46
AGND
23
D4
47
AVDD
24
D3
48
+IN
NC = No connection
FIGURE 2. Terminal connections.
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Terminal
symbol
I/O
A0; A1
I
Description
Address input.
AGND
Analog ground.
AVDD
Analog power supply.
CLK
I
Reference midpoint. This pin requires a 0.1 F capacitor to AGND.
CML
CS
Clock input.
I
Chip select input. Active low.
DGND
Digital ground.
DVDD
Digital power supply.
D0 – D13
I/O
NC
Data inputs / outputs.
No connection. Do not use. Reserved.
+IN
I
Positive differential analog input.
-IN
I
Negative differential analog input.
OE
I
Output enable. Active low.
OV
O
Out of range output
+REF
O
Positive reference output. This pin requires a 0.1 F capacitor to AGND.
-REF
O
Negative reference output. This pin requires a 0.1 F capacitor to AGND.
VBG
I
Reference input. This pin requires a 1 F capacitor to AGND
WR
I
Write signal. Active low.
FIGURE 2. Terminal connections – Continued.
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FIGURE 3. Block diagram.
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Sample timing waveform
NOTE:
The device core is based on a pipeline architecture with a dormancy of 9.5 samples. The conversion results
appear on the digital output of 9.5 clock cycles after the input signal was sampled. The parallel interface of the
device features 3-state buffers making it possible to directly connect it to a data bus. The output buffers are
enabled by driving the OE input low. Besides the sample results, it is also possible to read the values of the
control register, the PGA register, and the control register. Which register is read is determined by the address
inputs A1, A0. The device results are available at address 0.
FIGURE 4. Timing diagram.
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Read timing waveform
Symbol
Test 1/
Limit
Min
Unit
Max
Load capacitance
CL
Address and chip select setup time
tsu(OE-ACS)
Output enable
ten
Output disable
tdis
10 typical
ns
Address hold time
th(A)
1
ns
Chip select hold time
th(CS)
0
ns
1/
15
pF
4
ns
15
ns
All timing tests refer to 50 % level.
FIGURE 4. Timing diagram – Continued.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
SIZE
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CODE IDENT NO.
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Write timing waveform
Symbol
Test 1/
Limit
Min
Unit
Max
Load capacitance
CL
Chip select setup time
tsu(WE-CS)
4
ns
Data and address setup time
tsu(DA)
29
ns
Data and address hold time
th(DA)
0
ns
Chip select hold time
th(CS)
0
ns
Wide pulse duration high
tWH(WE)
15
ns
1/
15
pF
All timing tests refer to 50 % level.
FIGURE 4. Timing diagram – Continued.
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
SIZE
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Registers
The device contains several registers. The A register is selected by the values of bits A1 and A0:
A1
0
0
1
1
A0
0
1
0
1
Register
Conversion result
PGA
Offset
Control
TABLE A and B describe how to read the conversion results and how to configure the data converter. The default values
(where applicable) show the state after a power-on reset.
TABLE A. Conversion result register, Address O, Read
Bit
Function
D13
MSB
D12
---
D11
---
D10
---
D9
---
D8
---
D7
---
Bit
Function
D6
---
D5
---
D4
---
D3
---
D2
---
D1
---
D0
LSB
The output can be configured for two’s complement or straight binary format (see D11 / control register).
The output code is given by:
2’s complement:
-8192
Straight binary:
at IN = - REF
at IN = -REF
0
0
at IN = 0
8192
at IN = 0
8191
IN = -REF – 1LSB
16383
at IN = -REF – 1 LSB
1 LSB
= 2REF / 16384
TABLE B. PGA gain register, Address 1, Read / Write
Bit
Function
Default
D13
X
0
D12
X
0
D11
X
0
D10
X
0
D9
X
0
D8
X
0
D7
X
0
Bit
Function
Default
D6
X
0
D5
X
0
D4
X
0
D3
X
0
D2
G2
0
D1
G1
0
D0
G0
0
The PGA gain is determined by writing to G2-0.
Gain (dB) = 1 dB x G2-0 maximum = 7 dB. The range of G2-0 is to 0 to 7.
FIGURE 5. Principles of operation.
DEFENSE SUPPLY CENTER, COLUMBUS
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Registers – Continued.
TABLE C. Offset register, Address 2, Read/Write
Bit
Function
Default
D13
X
0
D12
X
0
D11
X
0
D10
X
0
D9
X
0
D8
X
0
D7
MSB
0
Bit
Function
Default
D6
--0
D5
--0
D4
--0
D3
--0
D2
--0
D1
--0
D0
LSB
0
NOTE: The offset correction range is from –128 to 127 LSB. This value is added to the conversion results
from the device.
TABLE D. Control Register, Address 3, Read
Bit
Function
D13
PWD
D12
REF
D11
FOR
D10
TM2
D9
TM1
D8
TM0
D7
OFF
Bit
Function
D6
RES
D5
RES
D4
RES
D3
RES
D2
RES
D1
RES
D0
RES
TABLE E. Control Register, Address 3, Write
Bit
Function
Default
D13
PWD
0
D12
REF
0
D11
FOR
0
D10
TM2
0
D9
TM1
0
D8
TM0
0
D7
OFF
0
Bit
Function
Default
D6
RES
0
D5
RES
0
D4
RES
0
D3
RES
0
D2
RES
0
D1
RES
0
D0
RES
0
PWD:
Power down
0 = normal operation
1 = power down
REF:
Reference select
0 = internal reference
1 = external reference
FOR:
Output format
0 = straight binary
1 = 2’s complement
TM2-0:
Test mode
000 = normal operation
001 = both inputs = -REF
010 = +IN at VCM (voltage at CML pin), -IN at –REF
011 = +IN at +REF, -IN at –REF
100 = normal operation
101 = both inputs = +REF
110 = +IN at –REF, -IN at VCM (voltage at CML pin)
111 = +IN at –REF, -IN at +REF
OF:
Offset correction
0 = enable
RES
Reserved
Must be set to 0
1 = disable
FIGURE 5. Principles of operation – Continued.
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4. VERIFICATION
4.1 Product assurance requirements. The manufacturer is responsible for performing all inspection and test requirements as
indicated in their internal documentation. Such procedures should include proper handling of electrostatic sensitive devices,
classification, packaging, and labeling of moisture sensitive devices, as applicable.
5. PREPARATION FOR DELIVERY
5.1 Packaging. Preservation, packaging, labeling, and marking shall be in accordance with the manufacturer’s standard commercial
practices for electrostatic discharge sensitive devices.
6. NOTES
6.1 ESDS. Devices are electrostatic discharge sensitive and are classified as ESDS class 1 minimum.
6.2 Configuration control. The data contained herein is based on the salient characteristics of the device manufacturer’s data book.
The device manufacturer reserves the right to make changes without notice. This drawing will be modified as changes are provided.
6.3 Suggested source(s) of supply. Identification of the suggested source(s) of supply herein is not to be construed as a guarantee
of present or continued availability as a source of supply for the item. DLA Land and Maritime maintains an online database of all
current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Vendor item drawing
administrative control
number 1/
Device
manufacturer
CAGE code
Top side marking
Vendor part number
V62/03608-01XE
01295
THS1401QE
THS1401QPHPEP
V62/03608-02XE
01295
THS1403QE
THS1403QPHPEP
V62/03608-03XE
01295
THS1408ME
THS1408MPHPEP
1/ The vendor item drawing establishes an administrative control number for identifying the
item on the engineering documentation.
CAGE code
01295
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
Source of supply
Texas Instruments, Inc.
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
Point of contact: U.S. Highway 75 South
P.O. Box 84, M/S 853
Sherman, TX 75090-9493
SIZE
A
CODE IDENT NO.
16236
REV
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DWG NO.
V62/03608
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20