INTEGRATED CIRCUITS DATA SHEET TDA8040T Quadrature demodulator Objective specification Supersedes data of 1995 Feb 07 File under Integrated Circuits, IC02 1996 Oct 08 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T It has been designed to operate in conjunction with the TDA8041H to provide a complete QPSK demodulator. FEATURES • +5 V supply voltage The design of this circuit has been optimized to provide the best quadrature accuracy necessary for digital receiver applications and particularly for digital television. • Bandgap internal reference voltage • Low crosstalk between I (in-phase) and Q (quadrature) channel outputs The TDA8040T includes two matched mixers, an RF amplifier, a symmetrical Voltage Controlled Oscillator (VCO), a frequency divider and two matched amplifiers. Two external filters are required for the baseband filtering. • High operating input sensitivity • High Carrier-to-Noise Ratio (CNR) of the VCO. APPLICATIONS The VCO requires an external LC tank circuit with two varicap diodes. This oscillator operates at twice the IF carrier frequency and can be used in a carrier recovery AFC loop. • Quadrature Phase Shift Keying (QPSK) demodulation. GENERAL DESCRIPTION The TDA8040T is a monolitic bipolar IC dedicated for quadrature demodulation. QUICK REFERENCE DATA SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT VCC supply voltage ICC(tot) total supply current Vi(RF) operating input voltage level 64 67 70 dBµV fi(RF) RF input signal frequency 10.7 − 150 MHz VolQ(p-p) I and Q output voltage (peak-to-peak value) − 0.5 − V Eφ(IQ) phase error between the I and Q channels − − 3 deg EG(IQ) gain error between the I and Q channels − − 1 dB EG(tilt) gain tilt error in the I and Q channels − − 1 dB αct(IQ) crosstalk between the I and Q channels 30 − − dB IM3 intermodulation distortion in the I and Q channels 40 − − dB VCC = 5 V 4.5 5.0 5.5 V 70 79 90 mA ORDERING INFORMATION PACKAGE TYPE NUMBER NAME TDA8040T 1996 Oct 08 SO16 DESCRIPTION plastic small outline package; 16 leads; body width 3.9 mm 2 VERSION SOT109-1 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T BLOCK DIAGRAM handbook, full pagewidth VCC(A) 1 16 15 AMP I GND(D) RF A RF B 2 Iout AMP VOLTAGE REFERENCE 3 ÷2 AMP 14 13 0 4 5 12 Q GND(A) 6 7 8 11 AMP AMP TDA8040T 10 9 MGE511 Fig.1 Block diagram. 1996 Oct 08 3 VCC(V) VCOB VCO 90 VCC(D) Iin VCOA GND(V) Qout Qin Philips Semiconductors Objective specification Quadrature demodulator TDA8040T PINNING SYMBOL PIN DESCRIPTION VCC(A) 1 supply voltage for I and Q amplifiers I 2 I channel buffer output GND(D) 3 demodulator ground RF A 4 RF input A RF B 5 RF input B VCC(D) 6 supply voltage for demodulator Q 7 Q channel buffer output GND(A) 8 I and Q amplifiers ground RF B 5 12 VCOA Qin 9 Q channel amplifier input VCC(D) 6 11 GND(V) Qout 10 Q channel amplifier output Q 7 10 Qout GND(A) 8 9 GND(V) 11 VCO ground VCOA 12 VCO tank circuit A VCOB 13 VCO tank circuit B VCC(V) 14 supply voltage for VCO Iout 15 I channel amplifier output Iin 16 I channel amplifier input handbook, halfpage 1 16 Iin I 2 15 Iout GND(D) 3 14 VCC(V) RF A 4 13 VCOB TDA8040T Qin MGE510 Fig.2 Pin configuration. The VCO operates at twice the carrier frequency. Its output signal is applied to a frequency divider (divide-by-2) to produce the two LO signals which are 90 degrees out of phase. The VCO is powered from the internal voltage stabilizer to ensure good shift performance. FUNCTIONAL DESCRIPTION The QPSK modulated RF signal is applied at the input of a high gain RF amplifier. The amplified signal is then mixed in a pair of mixers with two LO signals, which are 90 degrees out of phase, to produce the in-phase (I) and quadrature (Q) signals. These two signals are separately buffered to drive the external low-pass filters used for the baseband filtering. The I and Q signals are then amplified by two matched amplifiers designed to avoid crosstalk between channels. 1996 Oct 08 VCC(A) 4 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VCC(A) supply voltage for I and Q amplifiers −0.3 +6.0 V VCC(D) supply voltage for demodulator −0.3 +6.0 V VCC(V) supply voltage for VCO −0.3 +6.0 V Vn(max) maximum voltage on all pins −0.3 VCC V Imax maximum sink or source current − 10 mA tsc(max) maximum short-circuit time on outputs − 10 s ZL(IQ) AC load impedance for I and Q channels fi = 15 MHz 35 − Ω ZLA(IQ) AC load impedance for I and Q output amplifiers fi = 15 MHz 300 − Ω VVCO(p-p) voltage drive level for external oscillator signal (peak-to-peak value) − 0.6 V Ptot total power dissipation − 500 mW Tstg storage temperature Tamb = 70 °C −55 +150 °C Tj junction temperature − 150 °C Tamb operating ambient temperature 0 70 °C HANDLING Inputs and outputs are protected against electrostatic discharge in normal handling. However, to be totally safe, it is desirable to take normal precautions appropriate to handling MOS devices. THERMAL CHARACTERISTICS SYMBOL Rth j-a 1996 Oct 08 PARAMETER thermal resistance from junction to ambient in free air 5 VALUE UNIT 110 K/W Philips Semiconductors Objective specification Quadrature demodulator TDA8040T CHARACTERISTICS VCC(A) = VCC(D) = VCC(V) = 5 V; fi(RF) = 70 MHz; fi(VCO) = 140 MHz; Vi(RF) = 67 dBµV; Tamb = 25 °C; measured in application circuit of Fig.10; unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT Supplies VCC(A) supply voltage for I and Q channel amplifier 4.75 5.0 5.25 V VCC(D) supply voltage for demodulator 4.75 5.0 5.25 V VCC(V) supply voltage for VCO 4.75 5.0 5.25 V ICC(A) supply current for I and Q channel amplifier note 1 − 29 − mA ICC(D) supply current for demodulator note 1 − 16 − mA ICC(V) supply current for VCO note 1 − 34 − mA QPSK demodulator fi(RF)min minimum input IF frequency − − 10.7 MHz fi(RF)max maximum input IF frequency 150 − − MHz Ri(RF) resistive input impedance − 50 − Ω Xi(RF) reactive input impedance − 5 − Ω Vi(RF) operating input voltage 64 67 70 dBµV Ro(IQ) output resistance for I and Q channels 45 50 55 Ω VolQ(p-p) output voltage for I and Q channels (peak-to-peak value) note 2 − 85 − mV Gch(IQ) I and Q channel gain note 3 21 22.5 24 dB Eφ(IQ) phase error between I and Q channels note 4 − − 3 deg EG(IQ) gain error between I and Q channels note 4 − − 0.5 dB EG(tilt) gain tilt error between I and Q channels note 5 − − 0.8 dB NF double sideband noise figure Zsource = 50 Ω; note 6 − 17 20 dB IM3 intermodulation distortion in the I and Q channels note 7 45 − − dB 1996 Oct 08 6 Philips Semiconductors Objective specification Quadrature demodulator SYMBOL TDA8040T PARAMETER CONDITIONS MIN. TYP. MAX. UNIT Voltage controlled oscillator (VCO) fiVCO(min) minimum input oscillator frequency − − 21.4 MHz fiVCO(max) maximum input oscillator frequency 300 − − MHz ∆f frequency deviation − 6 − MHz ∆fdrift frequency drift note 8 − − 100 kHz ∆fshift frequency shift ∆VCC = 5% − − 100 kHz CNRosc oscillator carrier-to-noise ratio at 10 kHz; note 9 − 85 − dBc/Hz at 100 kHz; note 9 − 105 − dBc/Hz Vosc(p-p) required voltage drive level for external oscillator injection (peak-to-peak value) 100 − − mV Rsource(osc) source resistance for external oscillator generator − − 50 Ω I and Q amplifiers VilQ(p-p) I and Q channel input voltage (peak-to-peak value) note 10 − 0.1 − V VolQ(p-p) I and Q channel output voltage (peak-to-peak value) note 10 − 0.5 − V at 1 dB gain compression; note 10 1.0 − − V IM3 intermodulation distortion in the I and Q channels note 11 40 − − dB BIQ bandwidth of I and Q amplifiers at 0.5 dB 25 − − MHz αct(IQ) crosstalk between the I and Q channels note 12 30 − − dB VO(IQ) DC output voltage level for the I and Q amplifier − 2.45 − V ZI(IQ) input impedance of the I and Q channels − 10 − kΩ ZO(IQ) output impedance of the I and Q channels − 50 − Ω Notes to the characteristics 1. Typical supply currents are defined for VCC = 5 V. 2. The I and Q channel output voltages are measured with the following conditions: a) fi(RF) = 1⁄2fi(VCO) + 500 kHz (70.5 MHz) b) the higher frequencies (140.5 MHz) are filtered out. V IQ ( rms ) 3. The I and Q channels gain is defined by G IQ = ------------------------. V iRF ( rms ) The gains are measured with the conditions defined in note 2. 1996 Oct 08 7 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T 4. The phase and gain error between the I and Q channel outputs is measured as follows: a) the oscillator is tuned at fi(VCO) = 140 MHz b) a sine wave signal fi(RF) = 1⁄2fi(VCO) + 500 kHz (70.5 MHz) is applied at the IF input c) the higher frequencies (140.5 MHz) are filtered out. Under these conditions, in each I and Q channel, a sine wave with a frequency of 500 kHz will be present. These sine waves should be 90 degrees out of phase. The phase error is defined as the phase quadrature imbalance between the I and Q channels. The gain error is defined as the gain difference between the I and Q channels. 5. The tilt is defined as the difference between the maximum and the minimum channel gain measured in a frequency band of 25 MHz around fi(RF). The specified tilt is the maximum tilt value found in one of the I or Q channels. 6. The specified noise figure is the maximum value obtained from I and Q channel noise measurement. The noise meter is tuned to 10.7 MHz. 7. The specified intermodulation distortion is the minimum value obtained from intermodulation measurements in the I and Q channels. Intermodulation is measured with two sine wave signals at fi(RF) = 79 MHz and fi(RF) = 81 MHz with an amplitude of 67 dBµV for each tone. The difference in level between the converted carriers (9 MHz and 11 MHz) and the intermodulation products after frequency conversion (7 MHz and 13 MHz) is defined as IM3 (see Fig.3). 8. The temperature for the VCO frequency drift is defined for ∆Tamb = 25 °C. It is measured in the application circuit of Fig.10 with the following component values for the tank circuit: a) L1: 22 nH (TOKO NE545BNA5 - 100082) b) C1: 15 pF NP0 c) C2: 33 pF N220 (220 ppm/°C) d) C3 and C4: 1 nF e) C5: 3.3 µF f) D1 and D2: BB133 g) R1 and R2: 100 kΩ h) R3: 1 kΩ. 9. The phase noise is measured at the oscillator frequency (140 MHz). Due to the frequency divider, the phase noise at the input of the mixers is 6 dB better (111 dBc/Hz at 100 kHz). 10. Output amplifiers are measured separately with an external DC bias applied at pins 9 and 16. The gain is measured for an output signal of 500 mV (p-p) at fi = 500 kHz. 11. The specified intermodulation distortion is the minimum value obtained from intermodulation measurements in the I and Q output amplifier. Intermodulation is measured with two sine wave signals at fi = 9 MHz and fi = 11 MHz at an output level of 500 mV (p-p) for each tone. 12. The crosstalk between the I and Q amplifiers is defined as the ratio between the wanted output signal and the disturbing signal from the other channel. To measure the crosstalk of the I and Q amplifiers, a sine wave 15 MHz, 0.1 V (p-p) is applied at the I input and a sine wave 15.5 MHz, 0.1 V (p-p) is applied at the Q input. For each output, the difference in level is measured between the 15 MHz and the 15.5 MHz component. This difference is the value of the crosstalk between the I and Q amplifiers. 1996 Oct 08 8 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T MGE512 handbook, halfpage IM3 5 7 9 11 13 15 fi (MHz) Fig.3 IM3 definition. handbook, halfpage R2 C3 13 D2 R3 C1 C2 Vvaricap L1 D1 C5 12 C4 R1 MGE513 Fig.4 Tank circuit. 1996 Oct 08 9 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T INPUT PIN CONFIGURATION handbook, halfpage V 1 handbook, halfpageV CC(A) 1 CC(A) 9,16 10,15 GND(A) 8 MGE514 GND(A) Fig.5 Input circuitry VCC(A) to GND(A). 8 MBE259 Fig.6 Input circuitry VCC(A) to GND(A). handbook, halfpage VCC(A) handbook, halfpage 1 13 12 2,7 GND(V) 11 GND(A) MGE515 Fig.7 Input circuitry VCC(V) to GND(V). 8 MBE261 Fig.8 Input circuitry VCC(A) to GND(A). 14 handbook, halfpage VCC(V) 4 GND(V) 5 3 MBE262 Fig.9 Input circuitry VCC(V) to GND(V). 1996 Oct 08 10 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T APPLICATION INFORMATION handbook, full pagewidth +5 V LOW-PASS FILTER VCC(A) 1 16 Iin AMP I 2 AMP VOLTAGE REFERENCE GND(D) 3 RFin ÷2 AMP 14 VCC(V) VCO 12 VCOA 90 +5 V VCC(D) 6 Q 7 GND(A) 8 11 GND(V) AMP AMP 10 Qout 9 Qin TDA8040T LOW-PASS FILTER MGE516 Fig.10 Application circuit. 1996 Oct 08 +5 V 13 VCOB 0 RF A 4 RF B 5 15 Iout 11 Vvaricap Philips Semiconductors Objective specification Quadrature demodulator TDA8040T PACKAGE OUTLINE SO16: plastic small outline package; 16 leads; body width 3.9 mm SOT109-1 D E A X c y HE v M A Z 16 9 Q A2 A (A 3) A1 pin 1 index θ Lp 1 L 8 e 0 detail X w M bp 2.5 5 mm scale DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT A max. A1 A2 A3 bp c D (1) E (1) e HE L Lp Q v w y Z (1) mm 1.75 0.25 0.10 1.45 1.25 0.25 0.49 0.36 0.25 0.19 10.0 9.8 4.0 3.8 1.27 6.2 5.8 1.05 1.0 0.4 0.7 0.6 0.25 0.25 0.1 0.7 0.3 0.069 0.010 0.057 0.004 0.049 0.01 0.019 0.0100 0.39 0.014 0.0075 0.38 0.16 0.15 0.050 0.039 0.016 0.028 0.020 0.01 0.01 0.004 0.028 0.012 inches 0.244 0.041 0.228 θ Note 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. REFERENCES OUTLINE VERSION IEC JEDEC SOT109-1 076E07S MS-012AC 1996 Oct 08 EIAJ EUROPEAN PROJECTION ISSUE DATE 95-01-23 97-05-22 12 o 8 0o Philips Semiconductors Objective specification Quadrature demodulator TDA8040T SOLDERING Wave soldering Introduction Wave soldering techniques can be used for all SO packages if the following conditions are observed: There is no soldering method that is ideal for all IC packages. Wave soldering is often preferred when through-hole and surface mounted components are mixed on one printed-circuit board. However, wave soldering is not always suitable for surface mounted ICs, or for printed-circuits with high population densities. In these situations reflow soldering is often used. • A double-wave (a turbulent wave with high upward pressure followed by a smooth laminar wave) soldering technique should be used. • The longitudinal axis of the package footprint must be parallel to the solder flow. • The package footprint must incorporate solder thieves at the downstream end. This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in our “IC Package Databook” (order code 9398 652 90011). During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured. Reflow soldering Reflow soldering techniques are suitable for all SO packages. Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder is 10 seconds, if cooled to less than 150 °C within 6 seconds. Typical dwell time is 4 seconds at 250 °C. Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement. A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications. Several techniques exist for reflowing; for example, thermal conduction by heated belt. Dwell times vary between 50 and 300 seconds depending on heating method. Typical reflow temperatures range from 215 to 250 °C. Repairing soldered joints Fix the component by first soldering two diagonallyopposite end leads. Use only a low voltage soldering iron (less than 24 V) applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C. When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C. Preheating is necessary to dry the paste and evaporate the binding agent. Preheating duration: 45 minutes at 45 °C. 1996 Oct 08 13 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T DEFINITIONS Data sheet status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications. Limiting values Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale. 1996 Oct 08 14 Philips Semiconductors Objective specification Quadrature demodulator TDA8040T NOTES 1996 Oct 08 15 Philips Semiconductors – a worldwide company Argentina: see South America Australia: 34 Waterloo Road, NORTH RYDE, NSW 2113, Tel. +61 2 9805 4455, Fax. +61 2 9805 4466 Austria: Computerstr. 6, A-1101 WIEN, P.O. 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The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands 537021/50/02/pp16 Date of release: 1996 Oct 08 Document order number: 9397 750 01345