Philips Semiconductors Product specification PowerMOS transistor GENERAL DESCRIPTION N-channel enhancement mode field-effect power transistor in a plastic envelope suitable for surface mounting featuring high avalanche energy capability, stable blocking voltage, fast switching and high thermal cycling performance with low thermal resistance. Intended for use in Switched Mode Power Supplies (SMPS), motor control circuits and general purpose switching applications. PINNING - SOT428 PIN PHD6N10E QUICK REFERENCE DATA SYMBOL PARAMETER MAX. UNIT VDS ID Ptot RDS(ON) Drain-source voltage Drain current (DC) Total power dissipation Drain-source on-state resistance 100 6.3 50 0.54 V A W Ω PIN CONFIGURATION DESCRIPTION 1 gate 2 drain 3 source SYMBOL d tab g 2 tab s drain 1 3 LIMITING VALUES Limiting values in accordance with the Absolute Maximum System (IEC 134) SYMBOL PARAMETER CONDITIONS ID Continuous drain current IDM PD ∆PD/∆Tmb VGS EAS Pulsed drain current Total dissipation Linear derating factor Gate-source voltage Single pulse avalanche energy Peak avalanche current Tmb = 25 ˚C; VGS = 10 V Tmb = 100 ˚C; VGS = 10 V Tmb = 25 ˚C Tmb = 25 ˚C Tmb > 25 ˚C IAS Tj, Tstg Operating junction and storage temperature range MIN. MAX. UNIT - 6.3 4.5 25 50 0.33 ± 30 30 A A A W W/K V mJ - 6.3 A - 55 175 ˚C VDD ≤ 50 V; starting Tj = 25˚C; RGS = 50 Ω; VGS = 10 V VDD ≤ 50 V; starting Tj = 25˚C; RGS = 50 Ω; VGS = 10 V THERMAL RESISTANCES SYMBOL PARAMETER Rth j-mb Thermal resistance junction to mounting base Thermal resistance junction to ambient Rth j-a September 1997 CONDITIONS pcb mounted, minimum footprint 1 TYP. MAX. UNIT - 3 K/W 50 - K/W Rev 1.000 Philips Semiconductors Product specification PowerMOS transistor PHD6N10E ELECTRICAL CHARACTERISTICS Tj = 25 ˚C unless otherwise specified SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT V(BR)DSS VGS = 0 V; ID = 0.25 mA 100 - - V ∆V(BR)DSS / ∆Tj RDS(ON) VGS(TO) gfs IDSS Drain-source breakdown voltage Drain-source breakdown voltage temperature coefficient Drain-source on resistance Gate threshold voltage Forward transconductance Drain-source leakage current VDS = VGS; ID = 0.25 mA - 0.15 - V/K IGSS Gate-source leakage current VGS = 10 V; ID = 3.4 A VDS = VGS; ID = 0.25 mA VDS = 50 V; ID = 3.4 A VDS = 100 V; VGS = 0 V VDS = 80 V; VGS = 0 V; Tj = 150 ˚C VGS = ±30 V; VDS = 0 V 2.0 1.3 - 0.25 3.0 3.0 0.1 1 10 0.54 4.0 25 250 100 Ω V S µA µA nA Qg(tot) Qgs Qgd Total gate charge Gate-source charge Gate-drain (Miller) charge ID = 5.6 A; VDD = 80 V; VGS = 10 V - 9.2 1.7 4.7 12 3 6 nC nC nC td(on) tr td(off) tf Turn-on delay time Turn-on rise time Turn-off delay time Turn-off fall time VDD = 50 V; ID = 5.6 A; RG = 24 Ω; RD = 8.4 Ω - 7 40 22 18 - ns ns ns ns Ld Ls Internal drain inductance Internal source inductance Measured from tab to centre of die Measured from source lead solder point to source bond pad - 3.5 7.5 - nH nH Ciss Coss Crss Input capacitance Output capacitance Feedback capacitance VGS = 0 V; VDS = 25 V; f = 1 MHz - 222 74 30 - pF pF pF MIN. TYP. MAX. UNIT SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS Tj = 25 ˚C unless otherwise specified SYMBOL PARAMETER CONDITIONS IS Tmb = 25˚C - - 6.3 A Tmb = 25˚C - - 25 A VSD Continuous source current (body diode) Pulsed source current (body diode) Diode forward voltage IS = 5.6 A; VGS = 0 V - - 1.5 V trr Reverse recovery time IS = 5.6 A; VGS = 0 V; dI/dt = 100 A/µs - 70 - ns Qrr Reverse recovery charge - 0.4 - µC ISM September 1997 2 Rev 1.000 Philips Semiconductors Product specification PowerMOS transistor Zth j-mb, Transient Thermal Impedance (K/W) Normalised Power Derating PD% 120 PHD6N10E 10 110 100 90 80 1 70 0.5 0.2 60 0.1 50 0.05 40 0.1 30 0.02 20 PD t D= p T tp 0 10 0 0 20 40 60 80 100 Tmb / C 120 140 160 1us Fig.1. Normalised power dissipation. PD% = 100⋅PD/PD 25 ˚C = f(Tmb) 10us 100us 1ms 10ms tp, pulse widtht (s) 0.1s ID, Drain current (Amps) 12 100 PHP5N10 Tj = 25 C 10 V 110 7V 10 90 6.5 V 80 8 70 6V 60 6 50 5.5 V 40 4 30 5V 20 2 VGS = 4.5 V 10 0 0 20 40 60 80 100 Tmb / C 120 140 160 0 180 0 Fig.2. Normalised continuous drain current. ID% = 100⋅ID/ID 25 ˚C = f(Tmb); conditions: VGS ≥ 5 V 100 10s 1s Fig.4. Transient thermal impedance. Zth j-mb = f(t); parameter D = tp/T Normalised Current Derating ID% 120 t T 0.01 180 10 15 20 VDS, Drain-Source voltage (Volts) 25 30 Fig.5. Typical output characteristics. ID = f(VDS); parameter VGS PHP5N10E ID, Drain current (Amps) 5 RDS(on), Drain-Source on resistance (Ohms) 0.8 5V 5.5 V 6V PHP5N10 6.5 V 7V 0.7 ID S/ )= VD N 10 O S( 0.6 tp = 10 us 0.5 RD 100 us 0.4 1 ms DC 1 0.3 10 ms 100 ms VGS = 10 V 0.2 0.1 Tj = 25 C 0.1 1 10 100 VDS, Drain-source voltage (Volts) 0 1000 Fig.3. Safe operating area. Tmb = 25 ˚C ID & IDM = f(VDS); IDM single pulse; parameter tp September 1997 0 2 4 6 8 ID, Drain current (Amps) 10 12 Fig.6. Typical on-state resistance. RDS(ON) = f(ID); parameter VGS 3 Rev 1.000 Philips Semiconductors Product specification PowerMOS transistor 8 ID, Drain current (Amps) VDS = 30 V PHD6N10E VGS(TO) / V PHP5N10E Tj = 25 C max. Tj = 175 C 4 7 6 typ. 3 5 min. 4 2 3 2 1 1 0 0 0 2 4 6 VGS, Gate-source voltage (Volts) 8 -60 10 PHP5N10E gfs, Transconductance (S) VDD = 30 V 20 60 Tj / C 100 140 180 Fig.10. Gate threshold voltage. VGS(TO) = f(Tj); conditions: ID = 0.25 mA; VDS = VGS Fig.7. Typical transfer characteristics. ID = f(VGS); parameter Tj 4 -20 1E-01 SUB-THRESHOLD CONDUCTION ID / A Tj = 25 C 1E-02 3 2% 1E-03 typ 98 % Tj = 175 C 2 1E-04 1 0 1E-05 1E-06 0 2 4 6 ID, Drain current (Amps) 8 0 10 Fig.8. Typical transconductance. gfs = f(ID); parameter Tj 2.4 2 VGS / V 3 4 Fig.11. Sub-threshold drain current. ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS Normalised RDS(ON) = f(Tj) a 1 1000 Ciss, Coss, Crss, Junction capacitances (pF) PHP5N10E 2.2 2.0 1.8 Ciss 1.6 Coss 1.4 1.2 100 Crss 1.0 0.8 0.6 0.4 0.2 0 -60 -20 20 60 Tj / C 100 140 10 180 Fig.9. Normalised drain-source on-state resistance. a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 5.6 A; VGS = 5 V September 1997 1 10 VDS, Drain-source voltage (Volts) 100 Fig.12. Typical capacitances, Ciss, Coss, Crss. C = f(VDS); conditions: VGS = 0 V; f = 1 MHz 4 Rev 1.000 Philips Semiconductors Product specification PowerMOS transistor PHD6N10E PHP5N10E VGS, Gate-Source voltage (Volts) 15 IF, Source-drain diode current (Amps) 20 PHP5N10E VGS = 0 V ID = 5.6 A Tj = 25 C VDS = 20 V 50 V 80 V 15 10 10 Tj = 25 C Tj = 175 C 5 5 0 0 5 10 Qg, Gate charge (nC) 0 15 Switching times (ns) PHP5N10E 120 110 100 90 80 70 tr td(off) tf 10 VDD = 50 V VGS = 10 V RD = 8.4 Ohms ID = 5.6 A Tj = 25 C 0 20 40 60 RG, Gate resistance (Ohms) 80 100 EAS, Normalised unclamped inductive energy (%) 20 Fig.14. Normalised drain-source breakdown voltage. V(BR)DSS/V(BR)DSS 25 ˚C = f(Tj) 1.15 2 60 50 40 30 20 10 0 td(on) 1 0.5 1 1.5 VSDS, Source-drain voltage (Volts) Fig.16. Source-Drain diode characteristic. IF = f(VSDS); parameter Tj Fig.13. Typical turn-on gate-charge characteristics. VGS = f(QG); parameter VDS 100 0 40 60 80 100 120 Starting Tj ( C) 140 160 180 Fig.17. Normalised unclamped inductive energy. EAS% = f(Tj) Normalised Drain-source breakdown voltage V(BR)DSS @ Tj + V(BR)DSS @ 25 C 1.1 VDD L 1.05 VDS - VGS 1 -ID/100 0 0.95 0.9 0.85 -100 T.U.T. RGS -50 0 50 Tj, Junction temperature (C) 100 150 Fig.18. Unclamped inductive test circuit. EAS = 0.5 ⋅ LID2 ⋅ V(BR)DSS /(V(BR)DSS − VDD ) Fig.15. Normalised drain-source breakdown voltage. V(BR)DSS/V(BR)DSS 25 ˚C = f(Tj) September 1997 R 01 shunt 5 Rev 1.000 Philips Semiconductors Product specification PowerMOS transistor PHD6N10E MECHANICAL DATA Dimensions in mm : Net Mass: 1.4 g seating plane 6.73 max 1.1 tab 2.38 max 0.93 max 5.4 4 min 6.22 max 10.4 max 4.6 2 1 0.5 0.5 min 3 0.3 0.5 0.8 max (x2) 2.285 (x2) Fig.19. SOT428 : centre pin connected to mounting base. MOUNTING INSTRUCTIONS Dimensions in mm 7.0 7.0 2.15 1.5 2.5 4.57 Fig.20. SOT428 : soldering pattern for surface mounting. Notes 1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent damage to MOS gate oxide. 2. Epoxy meets UL94 V0 at 1/8". September 1997 6 Rev 1.000 Philips Semiconductors Product specification PowerMOS transistor PHD6N10E DEFINITIONS Data sheet status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications. Limiting values Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. Philips Electronics N.V. 1997 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale. September 1997 7 Rev 1.000