QTP#152602:100L TQFP (14X20X1.4MM) PURE SN LEADFINISH, CUPD WIRE, MSL3, 260C REFLOW, ASEK-TAIWAN (G)

Document No. 002-11529 Rev. **
ECN #: 5164534
Cypress Semiconductor
Package Qualification Report
QTP# 152602 VERSION **
March 2016
100L TQFP (14x20x1.4mm)
Pure Sn Leadfinish, CuPd Wire
MSL3, 260C Reflow
ASEK-Taiwan (G)
FOR ANY QUESTIONS ON THIS REPORT PLEASE CONTACT [email protected] :
OR VIA LINK A CYLINK CRM CASE
Prepared By:
Josephine Pineda (JYF)
Sr. Reliability Engineer
Reviewed By:
Rene Rodgers (RT)
Sr. MTS Reliability Engineer
Approved By:
Don Darling (DCDA)
Reliability Director
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 1 of 7
Document No. 002-11529 Rev. **
ECN #: 5164534
PACKAGE QUALIFICATION HISTORY
QTP
Number
152602
Description of Qualification Purpose
Qualification of 100L TQFP (14x20x1.4mm) at ASEK-Taiwan (G) using G631
Mold Compound, CRM1076 Die Attach Epoxy, Pure Sn Leadfinish, 0.8 mil CuPd
Wire at MSL 3, 260°C reflow temperature
Company Confidential
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Page 2 of 7
Date
Oct. 2015
Document No. 002-11529 Rev. **
ECN #: 5164534
MAJOR PACKAGE INFORMATION USED IN THIS QUALIFICATION
Package Designation:
AZ0AA
Package Outline, Type, or Name:
100L-Thin Quad Flat Package (14x20x1.4mm)
Mold Compound Name/Manufacturer:
G631/Sumitomo
Mold Compound Flammability Rating:
V-0 per UL94
Mold Compound Alpha Emission Rate:
0.001 (low alpha mold compound)
Oxygen Rating Index:
54%
Lead Frame Designation:
Slotted Full Metal Pad (FMP)
Lead Frame Material:
Copper
Lead Finish, Composition / Thickness:
Pure Sn
Die Backside Preparation Method/Metallization:
Backgrind
Die Separation Method:
Wafer saw
Die Attach Supplier:
Sumitomo
Die Attach Material:
CRM1076
Die Attach Method:
Epoxy
Bond Diagram Designation:
001-98412
Wire Bond Method:
Thermosonic
Wire Material/Size:
CuPd / 0.8 mil
Thermal Resistance Theta JA °C/W:
37.95 °C/W
Package Cross Section Yes/No:
Yes
Assembly Process Flow:
002-09793
Name/Location of Assembly (prime) facility:
ASEK-Taiwan (G)
MSL Level
3
Reflow Profile
260C
ELECTRICAL TEST / FINISH DESCRIPTION
Test Location:
CML-RA
Company Confidential
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Page 3 of 7
Document No. 002-11529 Rev. **
ECN #: 5164534
RELIABILITY TESTS PERFORMED PER SPECIFICATION REQUIREMENT
Stress/Test
Test Condition
(Temp/Bias)
Result
P/F
Acoustic Microscopy
J-STD-020
Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30C, 60% RH, 260C Reflow)
P
Ball Shear
JESD22-B116
P
Bond Pull
JESD22-B116
P
Constructional Analysis
Criteria: Meet external and internal characteristics of
Cypress package
P
Dye Penetrant Test
MIL-STD-883, Method 2019
Per die size:
 <3000 sq. mils = 1.2 kgf
 30001-5000 sq. mils = 1.2 kgf

>5001 sq. mils = 1.2 kgf
Test to determine the existence and extent of cracks,
Criteria: No Package Crack
High Accelerated Saturation Test
(HAST)
JESD22-A110, 130C, 3.63V, 85%RH
Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30C, 60% RH, 260C Reflow)
P
High Temperature Storage Life
JESD22-A103, 150C
P
Internal Visual
MIL-STD-883-2014
P
Die Shear
Pressure Cooker
Temperature Cycle
X-Ray
JESD22-A102, 121C, 100%RH, 15 Psig
Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30C, 60% RH, 260C Reflow)
MIL-STD-883, Method 1010, Condition C, -65°C to 150°C
Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30C, 60% RH, 260C Reflow)
MIL-STD-883 - 2012
Company Confidential
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Page 4 of 7
P
P
P
P
P
Document No. 002-11529 Rev. **
ECN #: 5164534
Reliability Test Data
QTP #:
Device
152602
Fab Lot #
Assy Lot #
Assy Loc
Duration
Samp
Rej
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
COMP
15
0
CY7C1383KVE33 (7CP1383K)
9527002
611529845
G-TAIWAN
COMP
15
0
CY7C1370KV33 (7CP1370K)
9527002
611529844
G-TAIWAN
COMP
15
0
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
COMP
24
0
CY7C1383KVE33 (7CP1383K)
9527002
611529845
G-TAIWAN
COMP
24
0
CY7C1370KV33 (7CP1370K)
9527002
611529844
G-TAIWAN
COMP
24
0
CY7C1370KE33 (7CP1376K)
9527002
611526472
G-TAIWAN
COMP
24
0
CY7C1372KV33 (7CP1377K)
9527002
611526473
G-TAIWAN
COMP
24
0
CY7C1381KE33 (7CP1381K)
9527002
611526474
G-TAIWAN
COMP
24
0
CY7C13709KV25 (7CP13709K) 9527002
611526471
G-TAIWAN
COMP
24
0
CY7C1383KE33 (7CP1383K)
9527002
611526475
G-TAIWAN
COMP
24
0
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
COMP
24
0
CY7C1383KVE33 (7CP1383K)
9527002
611529845
G-TAIWAN
COMP
24
0
CY7C1370KV33 (7CP1370K)
9527002
611529844
G-TAIWAN
COMP
24
0
CY7C1370KE33 (7CP1376K)
9527002
611526472
G-TAIWAN
COMP
24
0
CY7C1372KV33 (7CP1377K)
9527002
611526473
G-TAIWAN
COMP
24
0
CY7C1381KE33 (7CP1381K)
9527002
611526474
G-TAIWAN
COMP
24
0
CY7C13709KV25 (7CP13709K) 9527002
611526471
G-TAIWAN
COMP
24
0
CY7C1383KE33 (7CP1383K)
611526475
G-TAIWAN
COMP
24
0
9527002
611526357
G-TAIWAN
COMP
5
0
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
COMP
4
0
CY7C1383KVE33 (7CP1383K)
9527002
611529845
G-TAIWAN
COMP
4
0
CY7C1370KV33 (7CP1370K)
9527002
611529844
G-TAIWAN
COMP
4
0
CY7C1370KE33 (7CP1376K)
9527002
611526472
G-TAIWAN
COMP
4
0
Failure Mechanism
STRESS: ACOUSTICS
STRESS: BALL SHEAR
STRESS: BOND PULL
9527002
STRESS: CONSTRUCTIONAL ANALYSIS
CY7C1370KVE33 (7CP1376K)
STRESS: DIE SHEAR
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 5 of 7
Document No. 002-11529 Rev. **
ECN #: 5164534
Reliability Test Data
QTP #:
Device
152602
Fab Lot #
Assy Lot #
Assy Loc
Duration
Samp
Rej
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
COMP
15
0
CY7C1383KVE33 (7CP1383K)
9527002
611529845
G-TAIWAN
COMP
15
0
CY7C1370KV33 (7CP1370K)
9527002
611529844
G-TAIWAN
COMP
15
0
Failure Mechanism
STRESS: DYE PENETRANT
STRESS: HI-ACCEL SATURATION TEST, 130C, 85%RH, 3.63V, PRE COND 192 HR 30C/60%RH, MSL3
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
96
25
0
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
192
25
0
STRESS: HIGH TEMPERATURE STORAGE
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
500
78
0
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
1000
78
0
9527002
611526357
G-TAIWAN
COMP
5
0
STRESS: INTERNAL VISUAL
CY7C1370KVE33 (7CP1376K)
STRESS: PRESSURE COOKER TEST, 121C, 100%RH, 15 Psig, PRE COND 192 HR 30C/60%RH, MSL3
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
168
80
0
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
288
80
0
STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH, MSL3
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
500
80
0
CY7C1370KVE33 (7CP1376K)
9527002
611526357
G-TAIWAN
1000
80
0
CY7C1383KVE33 (7CP1383K)
9527002
611529845
G-TAIWAN
500
79
0
CY7C1370KV33 (7CP1370K)
9527002
611529844
G-TAIWAN
500
80
0
9527002
611526357
G-TAIWAN
COMP
15
0
STRESS: X-RAY
CY7C1370KVE33 (7CP1376K)
Company Confidential
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Page 6 of 7
Document No. 002-11529 Rev. **
ECN #: 5164534
Document History Page
Document Title:
Document Number:
QTP#152602: 100L TQFP (14X20X1.4MM) PURE SN LEADFINISH, CUPD WIRE, MSL3, 260C
REFLOW, ASEK-TAIWAN (G)
002-11529
Rev. ECN
Orig. of
No.
Change
**
5164534 JYF
Description of Change
Initial spec release.
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 7 of 7