Qtp#143604:Lq16 Qfn16 (3x3x0.6mm) Lq24 Qfn24 (4x4x0.6mm) Pure Sn, Cupd Wire Msl3, 260 Reflow.pdf

Document No.001-97853 Rev. **
ECN # 4784181
Cypress Semiconductor
Package Qualification Report
QTP# 143604 VERSION **
July 2015
QFN16L (3x3x0.6mm)
QFN24L (4x4x0.6mm)
Pure Sn, CuPd Wire
MSL3, 260C Reflow
ASEK Taiwan (G)
FOR ANY QUESTIONS ON THIS REPORT, PLEASE CONTACT
[email protected] or via a CYLINK CRM CASE
Prepared By:
Honesto Sintos
Reliability Engineer
Reviewed By:
Rene Rodgers
Reliability Manager
Approved By:
Don Darling
Reliability Director
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 1 of 10
Document No.001-97853 Rev. **
ECN # 4784181
PACKAGE QUALIFICATION HISTORY
QTP
Number
134505
143604
Description of Qualification Purpose
Qualification of QFN16L (3x3x0.6mm) & QFN24L (4x4x0.6mm) at
ASEK Taiwan(G) using G700 mold compound, FH900 film die attach,
0.8mil CuPd wire, Pure Sn leadfinish at MSL3, 260C Reflow
Temperature
Qualification of QFN16L (3x3x0.6mm) & QFN24L (4x4x0.6mm) at
ASEK Taiwan(G) using G700 mold compound, NEX130 die attach
film, 0.8mil CuPd wire, Pure Sn leadfinish at MSL3, 260C Reflow
Temperature
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 2 of 10
Date
Feb
2014
June
2015
Document No.001-97853 Rev. **
ECN # 4784181
MAJOR PACKAGE INFORMATION USED IN THIS QUALIFICATION
Package Designation:
LQ16A / LQ24A
Package Outline, Type, or Name:
QFN16L (3x3x0.6mm) & QFN24L (4x4x0.6mm)
Mold Compound Name/Manufacturer:
G700 / Sumitomo
Mold Compound Flammability Rating:
UL 94 V=0 pass
Mold Compound Alpha Emission Rate:
N/A (not low alpha mold compound)
Oxygen Rating Index: >28%
54%
Lead Frame Designation:
FMP
Lead Frame Material:
Copper with Ag-Spot Plating
Substrate Material:
N/A
Lead Finish, Composition / Thickness:
Pure Sn
Die Backside Preparation Method/Metallization:
Backgrind
Die Separation Method:
Wafer Saw
Die Attach Supplier:
Hitachi
Die Attach Material:
FH900
Bond Diagram Designation
001-88428, 001-88427
Wire Bond Method:
Thermosonic
Wire Material/Size:
CuPd / 0.8mil
Thermal Resistance Theta JA C/W:
49.6 C/W (QFN16), 38.01 CW (QFN24)
Package Cross Section Yes/No:
No
Assembly Process Flow:
001-89390M
Name/Location of Assembly (prime) facility:
ASEK Taiwan (G)
MSL LEVEL
3
REFLOW PROFILE
260C
ELECTRICAL TEST / FINISH DESCRIPTION
Test Location:
CML (R)
Note: Please contact a Cypress Representative for other package availability.
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 3 of 10
Document No.001-97853 Rev. **
ECN # 4784181
MAJOR PACKAGE INFORMATION USED IN THIS QUALIFICATION
Package Designation:
LQ16A / LQ24A
Package Outline, Type, or Name:
QFN16L (3x3x0.6mm) & QFN24L (4x4x0.6mm)
Mold Compound Name/Manufacturer:
G700 / Sumitomo
Mold Compound Flammability Rating:
UL 94 V=0 pass
Mold Compound Alpha Emission Rate:
N/A (not low alpha mold compound)
Oxygen Rating Index: >28%
54%
Lead Frame Designation:
FMP
Lead Frame Material:
Copper with Ag-Spot Plating
Substrate Material:
N/A
Lead Finish, Composition / Thickness:
Pure Sn
Die Backside Preparation Method/Metallization:
Backgrind
Die Separation Method:
Wafer Saw
Die Attach Supplier:
Nippon Steel
Die Attach Material:
NEX130
Bond Diagram Designation
001-88428, 001-88427
Wire Bond Method:
Thermosonic
Wire Material/Size:
CuPd / 0.8mil
Thermal Resistance Theta JA C/W:
49.6 C/W (QFN16), 38.01 CW (QFN24)
Package Cross Section Yes/No:
No
Assembly Process Flow:
49-41999
Name/Location of Assembly (prime) facility:
ASEK Taiwan (G)
MSL LEVEL
3
REFLOW PROFILE
260C
ELECTRICAL TEST / FINISH DESCRIPTION
Test Location:
CML (R)
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 4 of 10
Document No.001-97853 Rev. **
ECN # 4784181
RELIABILITY TESTS PERFORMED PER SPECIFICATION REQUIREMENTS
Stress/Test
Pressure Cooker Test
Temperature Cycle
Acoustic Microscopy
Test Condition (Temp/Bias)
JESD22-A102, 121 C, 100%RH, 15 PSIG
Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30 C, 60% RH, 260C Reflow)
MIL-STD-883C, Method 1010, Condition C, -65 C to 150 C
Precondition: JESD22 Moisture Sensitivity Level 3
(192 Hrs., 30 C, 60% RH, 260C Reflow)
J-STD-020
Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30 C, 60% RH, 260C Reflow)
Result
P/F
P
P
P
Constructional Analysis
Criteria: Meet external and internal
characteristics of package
P
High Temp Storage
JESD22-A103: 150 C, no bias
P
X-Ray
MIL-STD-883 - 2012
P
Internal Visual
MIL-STD-883-2014
P
Bond Pull
MIL-STD-883 – Method 2011
P
Ball Shear
JESD22-B116A
P
High Accelerated Saturation Test
(HAST)
JEDEC STD 22-A110, 130 C, 85%RH, 5.5V
Precondition: JESD22 Moisture Sensitivity Level
(192 Hrs., 30 C°, 60% RH, 260C Reflow)
P
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 5 of 10
Document No.001-97853 Rev. **
ECN # 4784181
Reliability Test Data
QTP #: 134505
Device
Package
Fab Lot #
Assy Lot #
Assy Loc
Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
COMP
15
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
COMP
15
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
COMP
15
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
COMP
10
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
COMP
10
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
COMP
10
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
COMP
10
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
COMP
10
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
COMP
10
0
STRESS: BALL SHEAR
STRESS: BOND PULL
STRESS: CONSTRUCTIONAL ANALYSIS
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
COMP
5
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
COMP
5
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
COMP
5
0
STRESS: HIGH ACCELERATED SATURATION TEST
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
128
40
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
128
40
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
128
40
0
STRESS: HIGH TEMPERATURE STORAGE
CY8C20234 (8C20234BK)
LQ16A 5234006
611326674
ASE-G
500
80
0
CY8C20234 (8C20234BK)
LQ16A 5234006
611326674
ASE-G
1000
80
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
COMP
5
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
COMP
5
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
COMP
5
0
STRESS: INTERNAL VISUAL
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 6 of 10
Document No.001-97853 Rev. **
ECN # 4784181
Reliability Test Data
QTP #: 134505
Device
Package
Fab Lot #
Assy Lot #
Assy Loc
Duration Samp Rej Failure Mechanism
STRESS: PRESSURE COOKER TEST
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
168
79
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
288
79
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
168
78
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
288
78
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
168
80
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
288
79
0
STRESS: TEMPERATURE CYCLE
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
500
78
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
1000
78
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
500
79
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
1000
79
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
500
78
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
1000
77
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342071
ASE-G
COMP
128
0
CY8CMBR3108 (8CP44303AC)
LQ16A 4339140
611342072
ASE-G
COMP
128
0
CY8CMBR3116 (8CP44304AC)
LQ24A 4339140
611342073
ASE-G
COMP
128
0
STRESS: X-RAY
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 7 of 10
Document No.001-97853 Rev. **
ECN # 4784181
Reliability Test Data
QTP #: 143604
Device
Package
Fab Lot #
Assy Lot #
Assy Loc
Duration Samp Rej Failure Mechanism
STRESS: ACOUSTIC, MSL3
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
COMP
15
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
COMP
15
0
CY8CMBR3145 (8CP44304AC)
LQ16A 4345693
611417857
ASE-G
COMP
15
0
CY8C4014LQI (8CP44303AC)
LQ16A 4444274
611512731
ASE-G
COMP
15
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4444274
611512733
ASE-G
COMP
15
0
CY8CMBR3145 (8CP44303BK)
LQ16A 5435004
611512726
ASE-G
COMP
15
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
COMP
100
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
COMP
100
0
CY8CMBR3145 (8CP44304AC)
LQ16A 4345693
611417857
ASE-G
COMP
100
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
COMP
100
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
COMP
100
0
CY8CMBR3145 (8CP44304AC)
LQ16A 4345693
611417857
ASE-G
COMP
100
0
611417855
ASE-G
COMP
5
0
STRESS: BALL SHEAR
STRESS: BOND PULL
STRESS: CONSTRUCTIONAL ANALYSIS
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
STRESS: HIGH ACCELERATED SATURATION TEST
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
96
30
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
96
30
0
611417855
ASE-G
COMP
5
0
STRESS: INTERNAL VISUAL INSPECTION
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
STRESS: PRESSURE COOKER TEST
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
168
80
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
288
80
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
168
79
0
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 8 of 10
Document No.001-97853 Rev. **
ECN # 4784181
Reliability Test Data
QTP #: 143604
Device
Package
Fab Lot #
Assy Lot #
Assy Loc
Duration Samp Rej Failure Mechanism
STRESS: TEMPERATURE CYCLE
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
500
80
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
1000
78
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
500
80
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
1000
80
0
CY8CMBR3145 (8CP44304AC)
LQ16A 4345693
611417857
ASE-G
500
80
0
CY8CMBR3145 (8CP44304AC)
LQ16A 4345693
611417857
ASE-G
1000
78
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417855
ASE-G
COMP
15
0
CY8CMBR3145 (8CP44303AC)
LQ16A 4345693
611417856
ASE-G
COMP
15
0
CY8CMBR3145 (8CP44304AC)
LQ16A 4345693
611417857
ASE-G
COMP
15
0
STRESS: X-RAY
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 9 of 10
Document No.001-97853 Rev. **
ECN # 4784181
Document History Page
Document Title: QTP#143604: LQ16 QFN16 (3X3X0.6MM) LQ24 QFN24 (4X4X0.6MM) PURE SN, CUPD WIRE MSL3,
260 REFLOW
Document Number:
001-97853
Rev. ECN
Orig. of
No.
Change
**
4784181 HSTO
Description of Change
Initial spec release
Company Confidential
A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.
Page 10 of 10
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