NB6L295M 2.5V / 3.3V Dual Channel Programmable Clock/Data Delay with Differential CML Outputs Multi−Level Inputs w/ Internal Termination http://onsemi.com The NB6L295M is a Dual Channel Programmable Delay Chip designed primarily for Clock or Data de−skewing and timing MARKING adjustment. The NB6L295M is versatile in that two individual DIAGRAM* variable delay channels, PD0 and PD1, can be configured in one of 24 two operating modes, a Dual Delay or an Extended Delay. 1 QFN−24 NB6L In the Dual Delay Mode, each channel has a programmable delay MN SUFFIX 295M section which is designed using a matrix of gates and a chain of CASE 485L 24 1 ALYWG multiplexers. There is a fixed minimum delay of 3.2 ns per channel. G A = Assembly Location The Extended Delay Mode amounts to the additive delay of PD0 L = Wafer Lot plus PD1 and is accomplished with the Serial Data Interface MSEL bit Y = Year set High. This will internally cascade the output of PD0 into the input W = Work Week of PD1. Therefore, the Extended Delay path starts at the IN0/IN0 G = Pb−Free Package inputs, flows through PD0, cascades to the PD1 and outputs through (Note: Microdot may be in either location) Q1/Q1. There is a fixed minimum delay of 6.0 ns for the Extended *For additional marking information, refer to Application Note AND8002/D. Delay Mode. The required delay is accomplished by programming each delay ORDERING INFORMATION channel via a 3−pin Serial Data Interface, described in the application See detailed ordering and shipping information in the package dimensions section on page 12 of this data sheet. section. The digitally selectable delay has an increment resolution of typically 11 ps with a net programmable delay range of either 0 ns to 6 ns per channel in Dual Delay Mode; or from 0 ns to 11.2 ns for the Extended Delay Mode. The Multi−Level Inputs can be driven directly by differential LVPECL, LVDS or CML logic levels; or by single ended LVPECL, LVCMOS or LVTTL. A single enable pin is available to control both inputs. The SDI input pins are controlled by LVCMOS or LVTTL level signals. The NB6L295M 16 mA CML output contains temperature compensation circuitry. This device is offered in a 4 mm x 4 mm 24−pin QFN Pb−free package. The NB6L295M is a member of the ECLinPS MAX™ family of high performance products. • Input Clock Frequency > 1.5 GHz with 210 mV • 2.4 ps Typical Clock Jitter, RMS VOUTPP • 20 ps Pk−Pk Typical Data Dependent Jitter • Input Data Rate > 2.5 Gb/s • LVPECL, CML or LVDS Differential Input Compatible • Programmable Delay Range: 0 ns to 6 ns per Delay • LVPECL, LVCMOS, LVTTL Single Ended Input Channel Compatible • Programmable Delay Range: 0 ns to 11.2 ns for • 3−Wire Serial Interface Extended Delay Mode • Operating Range: VCC = 2.375 V to 3.6 V • Total Delay Range: 3.2 ns to 8.5 ns per Delay Channel • CML Output Level; 380 mV Peak−to−Peak, Typical • Total Delay Range: 6.2 ns to 16.6 ns in Extended Delay • Internal 50 W Input/Output Termination Provided Mode • −40°C to 85°C Ambient Operating Temperature • Monotonic Delay: 11 ps Increments in 511 Steps • 24−Pin QFN, 4 mm x 4 mm • Linearity $20 ps, Maximum • These are Pb−Free Devices* • 100 ps Typical Rise and Fall Times *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. © Semiconductor Components Industries, LLC, 2010 January, 2010 − Rev. 4 1 Publication Order Number: NB6L295M/D 2 http://onsemi.com Figure 1. Simplified Functional Block Diagram SLOAD SCKL SDATA VT1 IN1 IN1 50 W 50 W VT1 VT0 IN0 IN0 50 W 50 W VT0 0 128 GD* 1 0 *GD = Gate Delay 256 1 GD* 11 Bit Shift Register 0 1 0 128 GD* 1 *GD = Gate Delay 256 1 GD* 0 64 GD* 64 GD* 1 0 1 0 32 GD* 32 GD* 1 0 1 0 1 0 1 9 Bit Latch 16 GD* 0 PD1 9 Bit Latch 16 GD* PD0 8 GD* 8 GD* 1 0 1 0 4 GD* 4 GD* 1 0 1 0 2 GD* 2 GD* 1 0 1 0 1 GD* 1 GD* 1 0 1 0 1 0 Q1 Q1 Q0 Q0 NB6L295M PSEL MSEL D0 D1 D2 D3 D4 D5 D6 D7 D8 NB6L295M VT0 IN0 24 23 Exposed Pad (EP) IN0 VT0 GND VCC0 22 21 20 19 VCC 1 18 Q0 EN 2 17 Q0 SLOAD 3 16 VCC0 SDIN 4 15 VCC1 SCLK 5 14 Q1 VCC 6 13 Q1 NB6L295M 7 VT1 8 9 IN1 IN1 10 11 12 VT1 GND VCC1 Figure 2. Pinout: QFN−24 (Top View) Table 1. PIN DESCRIPTION Pin Name I/O Description 1 VCC Power Supply 2 EN LVCMOS/LVTTL Input Input Enable/ Disable for both PD0 and PD1. LOW for enable, HIGH for disable, Open Pin Default state LOW (37 kW Pulldown Resistor). 3 SLOAD LVCMOS/LVTTL Input Serial Load; This pin loads the configuration latches with the contents of the shift register. The latches will be transparent when this signal is HIGH; thus, the data must be stable on the HIGH−to−LOW transition of S_LOAD for proper operation. Open Pin Default state LOW (37 kW Pulldown Resistor). 4 SDIN LVCMOS/LVTTL Input Serial Data In; This pin acts as the data input to the serial configuration shift register. Open Pin Default state LOW (37 kW Pulldown Resistor). 5 SCLK LVCMOS/LVTTL Input Serial Clock In; This pin serves to clock the serial configuration shift register. Data from SDIN is sampled on the rising edge. Open Pin Default state LOW (37 kW Pulldown Resistor). 6 VCC Power Supply 7 VT1 8 IN1 LVPECL, CML, LVDS Input Noninverted differential input. Note 1. Channel 1. 9 IN1 LVPECL, CML, LVDS Input Inverted differential input. Note 1. Channel 1. Positive Supply Voltage for the Inputs and Core Logic Positive Supply Voltage for the Inputs and Core Logic Internal 50 W Termination Pin for IN1. 10 VT1 11 GND Power Supply Negative Power Supply 12 VCC1 Power Supply Positive Supply Voltage for the Q1/Q1 outputs, channel PD1 13 Q1 CML Output Inverted Differential Output. Channel 1. Typically terminated with 50 W resistor to VCC1 14 Q1 CML Output Noninverted Differential Output. Channel 1. Typically terminated with 50 W resistor to VCC1 15 VCC1 Power Supply Positive Supply Voltage for the Q1/Q1 outputs, channel PD1 16 VCC0 Power Supply Positive Supply Voltage for the Q0/Q0 outputs, channel PD0 17 Q0 CML Output Inverted Differential Output. Channel 0. Typically terminated with 50 W resistor to VCC0 18 Q0 CML Output Noninverted Differential Output. Channel 0. Typically terminated with 50 W resistor to VCC0 19 VCC0 Power Supply Positive Supply Voltage for the Q0/Q0 outputs, channel PD0 20 GND Power Supply Negative Power Supply 21 VT0 22 IN0 LVPECL, CML, LVDS Input Inverted differential input. Note 1. Channel 0. 23 IN0 LVPECL, CML, LVDS Input Noninverted differential input. Note 1. Channel 0. 24 VT0 − EP Internal 50 W Termination Pin for IN1 Internal 50 W Termination Pin for IN0 Internal 50 W Termination Pin for IN0 Ground The Exposed Pad (EP) on the QFN−24 package bottom is thermally connected to the die for improved heat transfer out of package. The exposed pad must be attached to a heat−sinking conduit. The pad is electrically connected to GND and must be connected to GND on the PC board. 1. In the differential configuration when the input termination pin (VTx/VTx) are connected to a common termination voltage or left open, and if no signal is applied on INx/INx input then the device will be susceptible to self−oscillation. 2. All VCC, VCC0 and VCC1 Pins must be externally connected to the same power supply for proper operation. Both VCC0s are connected to each other and both VCC1s are connected to each other: VCC0 and VCC1 are separate. http://onsemi.com 3 NB6L295M Table 2. ATTRIBUTES Characteristics Value Input Default State Resistors 37 kW ESD Protection Human Body Model Machine Model Moisture Sensitivity (Note 3) QFN−24 Flammability Rating Oxygen Index: 28 to 34 Transistor Count > 2 kV > 100V Level 1 UL 94 V−0 @ 0.125 in 3094 Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test 3. For additional information, see Application Note AND8003/D. Table 3. MAXIMUM RATINGS Symbol Parameter VCC, VCC0, VCC1 Positive Power Supply VIO Positive Input/Output Voltage VINPP Differential Input Voltage IIN Condition 1 Condition 2 GND = 0 V GND = 0 V −0.5vVIOvVCC+0.5 Rating Unit 4.0 V 4.5 V VCC − GND V Input Current Through RT (50 W Resistor) $50 mA IOUT Output Current Through RT (50 W Resistor) $50 mA TA Operating Temperature Range −40 to +85 °C Tstg Storage Temperature Range −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) (Note 4) 0 lfpm 500 lfpm QFN−24 QFN−24 37 32 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) (Note 4) QFN−24 11 °C/W Tsol Wave Solder Pb−Free 265 °C |INx − INx| Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 4. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad. http://onsemi.com 4 NB6L295M Table 4. DC CHARACTERISTICS, MULTI−LEVEL INPUTS VCC = VCC0 = VCC1 = 2.375 V to 3.6 V, GND = 0 V, TA = −40°C to +85°C Characteristic Symbol Min Typ Max Unit 170 215 mA POWER SUPPLY CURRENT ICC Power Supply Current (Inputs, VTX and Outputs Open) (Sum of ICC, ICC0, and ICC1) CML OUTPUTS (Notes 5 and 6, Figure 22) VOH Output HIGH Voltage VOL Output LOW Voltage VCC = VCC0 = VCC1 = 3.3 V VCC = VCC0 = VCC1 = 2.5 V VCC − 40 3260 2460 VCC − 10 3290 2490 VCC 3300 2500 mV VCC = VCC0 = VCC1 = 3.3 V VCC = VCC0 = VCC1 = 2.5 V VCC − 500 2800 2000 VCC − 400 2900 2100 VCC − 300 3000 2200 mV VCC − 150 mV DIFFERENTIAL INPUT DRIVEN SINGLE−ENDED (see Figures 11 and 12) (Note 7) Vth Input Threshold Reference Voltage Range 1050 VIH Single−Ended Input HIGH Voltage Vth +150 VCC mV VIL Single−Ended Input LOW Voltage GND Vth − 150 mV VISE Single−Ended Input Voltage Amplitude (VIH − VIL) 300 VCC − GND mV DIFFERENTIAL INPUTS DRIVEN DIFFERENTIALLY (see Figures 13 and 14) (Note 8) VIHD Differential Input HIGH Voltage 1200 VCC mV VILD Differential Input LOW Voltage GND VCC − 150 mV VID Differential Input Voltage Swing (INx, INx) (VIHD − VILD) 150 VCC − GND mV VCMR Input Common Mode Range (Differential Configuration) (Note 9) 950 VCC – 75 mV IIH Input HIGH Current INx/INX, (VTn/VTn Open) −150 150 mA IIL Input LOW Current IN/INX, (VTn/VTn Open) −150 150 mA SINGLE−ENDED LVCMOS/LVTTL CONTROL INPUTS VIH Single−Ended Input HIGH Voltage 2000 VCC mV VIL Single−Ended Input LOW Voltage GND 800 mV IIH Input HIGH Current −150 150 mA IIL Input LOW Current −150 150 mA TERMINATION RESISTORS RTIN Internal Input Termination Resistor 40 50 60 W RTOUT Internal Output Termination Resistor 40 50 60 W NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 5. CML outputs loaded with 50 W to VCC for proper operation. 6. Input and output parameters vary 1:1 with VCC. 7. Vth, VIH, VIL, and VISE parameters must be complied with simultaneously. Vth is applied to the complementary input when operating in single−ended mode. 8. VIHD, VILD, VID and VCMR parameters must be complied with simultaneously. 9. VCMR(min) varies 1:1 with voltage on GND pin, VCMR(max) varies 1:1 with VCC. The VCMR range is referenced to the most positive side of the differential input signal. http://onsemi.com 5 NB6L295M Table 5. AC CHARACTERISTICS VCC = VCC0 = VCC1 = 2.375 V to 3.6 V, GND = 0 V, TA = −40°C to +85°C (Note 10) Min Characteristic Symbol Typ Max Unit 20 MHz fSCLK Serial Clock Input Frequency, 50% Duty Cycle VOUTPP Output Voltage Amplitude (@ VINPPmin) fin ≤ 1.5 GHz (Note 15) (See Figure 23) 210 fDATA Maximum Data Rate (Note 14) 2.5 tRange Programmable Delay Range (@ 50 MHz) Dual Mode IN0/IN0 to Q0/Q0 or IN1/IN1 to Q1/Q1 Extended Mode IN0/IN0 to Q1/Q1 tSKEW Duty Cycle Skew (Note 11) Within Device Skew − Dual Mode Lin Linearity (Note 12) ts Setup Time (@ 20 MHz) SDIN to SCLK SCLK to SLOAD EN to SDIN 0.5 1.5 0.5 0.3 1.0 ns th Hold Time SDIN to SCLK SCLK to SLOAD EN to SLOAD 1.0 1.0 0.5 0.6 ns tpwmin Minimum Pulse Width SLOAD tJITTER Random Clock Jitter RMS; SETMIN to SETMAX (Note 13) fin ≤ 1.5 GHz Dual Mode IN0/IN0 to Q0/Q0 or IN1/IN1 to Q1/Q1 Extended Mode IN0/IN0 to Q1/Q1 Deterministic Jitter; SETMIN to SETMAX (Note 14) fDATA v 2.5 Gbps Dual Mode IN0/IN0 to Q0/Q0 or IN1/IN1 to Q1/Q1 D[8:0] = 0 D[8:0] = 1 380 mV Gb/s ns 0 0 5.7 11.2 6.9 13.7 0 1 55 67 4 96 170 ps $15 $20 ps 1 VINPP Input Voltage Swing/Sensitivity (Differential Configuration) (Note 15) 150 tr, tf Output Rise/Fall Times (@ 50 MHz), (20% − 80%) Qx, Qx 85 ns 2 4 6 12 2 15 ps VCC − GND mV 150 ps 100 10. Measured by forcing VINPPmin and VINPPmax from a 50% duty cycle clock source, VCMR (min+max). All loading with an external RL = 50 W to VCC. See Figure 20. Input edge rates 40 ps (20% − 80%). 11. Duty cycle skew is measured between differential outputs using the deviations of the sum of Tpw− and Tpw+ @ 0.5 GHz. 12. Deviation from a linear delay (actual Min to Max) in the Dual Mode 511 programmable steps; 3.3 V @ 25°C, 400 mV VINPP. 13. Additive Random CLOCK jitter with 50% duty cycle input clock signal. 1000 WFMS, JIT3 Software. 14. NRZ data at PRBS23 and K28.5. 10,000 WFMS, TDS8000. 15. Input and output voltage swing is a single−ended measurement operating in differential mode. Table 6. AC CHARACTERISTICS VCC = VCC0 = VCC1 = 2.375 V to 3.6 V, GND = 0 V, TA = −40°C to +85°C (Note 10) −405C Symbol tPLH, tPHL Extended Mode D[8:0] = 0 D[8:0] = 1 Dt Min Characteristic Propagation Delay (@ 50 MHz) Dual Mode IN0/IN0 to Q0/Q0 or IN1/IN1 to Q1/Q1 D[8:0] = 0 D[8:0] = 1 IN0/IN0 to Q1/Q1 Typ +255C Max Min Typ +855C Max Min Typ Max Unit ns 2.7 7.2 3.1 8.5 3.3 9.1 2.8 7.4 3.2 8.5 3.5 9.6 3.1 8.6 3.4 9.3 3.8 10.7 5.0 14 5.9 16.4 6.5 17.7 5.2 14.4 6.2 16.6 6.6 18.7 5.9 17 6.6 19 7.3 21 Step Delay (Selected D Bit HIGH All Others LOW) D0 HIGH D1 HIGH D2 HIGH D3 HIGH D4 HIGH D5 HIGH D6 HIGH D7 HIGH D8 HIGH ns 8.4 16.4 41.2 85 178 360 722 1448 2903 http://onsemi.com 6 12.4 25.1 58.3 108 210 405 796 1579 3143 NB6L295M Serial Data Interface Programming The NB6L295M is programmed by loading the 11−Bit SHIFT REGISTER using the SCLK, SDATA and SLOAD inputs. The 11 SDATA bits are 1 PSEL bit, 1 MSEL bit and 9 delay value data bitsD[8:0]. A separate 11−bit load cycle is required to program the delay data value of each channel, PD0 and PD1. For example, at powerup two load cycles will be needed to initially set PD0 and PD1; Dual Mode Operation as shown in Figures 3 and 4 and Extended Mode Operation as shown in Figures 5 and 6. DUAL MODE OPERATIONS Control Bits PD0 Programmable Delay 0/1 D8 0/1 D7 0/1 D6 0/1 D5 0/1 D4 0/1 D3 0/1 D2 0/1 D1 0/1 D0 0 MSEL (MSB) Control Bits PD1 Programmable Delay 0 Value 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0 1 Value PSEL Bit Name D8 D7 D6 D5 D4 D3 D2 D1 D0 MSEL PSEL Bit Name (LSB) (MSB) (LSB) Figure 3. PDO Shift Register Figure 4. PD1 Shift Register EXTENDED MODE OPERATIONS Control Bits PD0 Programmable Delay Control Bits PD1 Programmable Delay 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 1 0 Value 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 0/1 1 1 Value D8 D7 D6 D5 D4 D3 D2 D1 D0 MSEL PSEL Bit Name D8 D7 D6 D5 D4 D3 D2 D1 D0 MSEL PSEL Bit Name (MSB) (LSB) (MSB) Figure 5. PDO Shift Register (LSB) Figure 6. PD1 Shift Register Refer to Table 7, Channel and Mode Select BIT Functions. In a load cycle, the 11−Bit Shift Register least significant bit (clocked in first) is PSEL and will determine which channel delay buffer, either PDO (LOW) or PD1 (HIGH), will latch the delay data value D[8:0]. The MSEL BIT determines the Delay Mode. When set LOW, the Dual Delay Mode is selected and the device uses both channels independently. A pulse edge entering IN0/IN0 is delayed according to the values in PD0 and exits from Q0/Q0. An input signal pulse edge entering IN1/IN1 is delayed according to the values in PD1 and exits from Q1/Q1. When MSEL is set HIGH, the Extended Delay Mode is selected and an input signal pulse edge enters IN0 and IN0 and flows through PD0 and is extended through PD1 to exit at Q1 and Q1. The most significant 9−bits, D[8:0] are delay value data for both channels. See Figure 7. Table 7. CHANNEL AND MODE SELECT BIT FUNCTIONS BIT Name PSEL Function 0 Loads Data to PD0 1 Loads Data to PD1 MSEL 0 Selects Dual Programmable Delay Paths, 3.1 ns to 8.8 ns Delay Range for Each Path 1 Selects Extended Delay Path from IN0/IN0 to Q1/Q1, 6.0 ns to 17.2 ns Delay Range; Disables Q0/Q0 Outputs, Q0−LOW, Q0−HIGH. D[8:0] Select one of 512 Delay Values http://onsemi.com 7 NB6L295M Q0/Q0 Q1/Q1 PD0 Delay PD1 Delay PD0 Latch PD1 Latch MSEL PSEL D2 D1 D0 1 D5 D4 D3 D6 D8 D7 0 SDATA D2 D1 D0 D5 D4 D3 D6 D8 D7 D2 D1 D0 D5 D4 D3 D6 SLOAD D8 D7 MSEL SCLK 11−Bit Shift Register Figure 7. Serial Data Interface, Shift Register, Data Latch, Programmable Delay Channels Load Cycle Required for Each Channel Serial Data Interface Loading Loading the device through the 3 input Serial Data Interface (SDI) is accomplished by sending data into the SDIN pin by using the SCLK input pin and latching the data with the SLOAD input pin. The 11−bit SHIFT REGISTER shifts once per rising edge of the SCLK input. The serial input SDIN must meet setup and hold timing as specified in the AC Characteristics section of this document for each bit and clock pulse. The SLOAD line loads the value of the shift register on a LOW−to−HIGH edge transition (transparent state) into a data Latch register and latches the data with a subsequent HIGH−to−LOW edge transition. Further changes in SDIN or SCLK are not recognized by the latched register. The internal multiplexer states are set by the PSEL and MSEL bits in the SHIFT register. Figure 6 shows the timing diagram of a typical load sequence. Input EN should be LOW (enabled) prior to SDI programming, then pulled HIGH (disabled) during programming. After programming, the EN should be returned LOW (enabled) for functional delay operation. EN EN to SLOAD EN to SDIN LSB PSEL MSEL MSB D0 D1 D2 D3 D4 D5 D6 D7 D8 SDIN SCLK SLOAD ts SDIN to SCLK C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 ts SCLK to SLOAD th SDIN to SCLK tH SCLK to SLOAD Figure 8. SDI Programming Cycle Timing Diagram (Load Cycle 1 of 2) http://onsemi.com 8 NB6L295M Table 8 shows theoretical values of delay capabilities in both the Dual Delay Mode and in the Extended Delay Modes of operation. Table 8. EXAMPLES OF THEORETICAL DELAY VALUES FOR PD0 AND PD1 IN DUAL MODE INPUTS: IN0/IN0, IN1/IN1, OUTPUTS: Q0/Q0, Q1, Q1 Dual Mode PD1 D[8:0] (Decimal) PD0 D[8:0] (Decimal) MSEL PD0 Delay* (ps) PD1 Delay* (ps) 000000000 (0) 000000000 (0) 0 0 0 000000000 (0) 000000001 (1) 0 11 0 000000000 (0) 000000010 (2) 0 22 0 000000000 (0) 000000011 (3) 0 33 0 000000000 (0) 000000100 (4) 0 44 0 000000000 (0) 000000101 (5) 0 55 0 000000000 (0) 000000110 (6) 0 66 0 000000000 (0) 000000111 (7) 0 77 0 000000000 (0) 000001000 (8) 0 88 0 • • • • • • • • • 000000000 (0) 000010000 (16) 0 176 0 000000000 (0) 000100000 (32) 0 352 0 000000000 (0) 001000000 (64) 0 704 0 000000000 (0) 111111101 (509) 0 5599 0 000000000 (0) 111111110 (510) 0 5610 0 000000000 (0) 111111111 (511) 0 5621 0 *Fixed minimum delay not included Table 9. EXAMPLES OF THEORETICAL DELAY VALUES FOR PD0 AND PD1 IN EXTENDED MODE INPUTS: IN0/IN0, IN1/IN1, OUTPUTS: Q0/Q0, Q1, Q1 Extended Delay Mode PD1 D[8:0] (Decimal) PD0 D[8:0] (Decimal) MSEL PD0* (ps) PD1* (ps) Total Delay* (ps) 000000000 (0) 000000000 (0) 1 0 0 0 000000000 (0) 000000001 (1) 1 0 11 11 000000000 (0) 000000010 (2) 1 0 22 22 000000000 (0) 000000011 (3) 1 0 33 33 • • • • • • • • • • • • 000000000 (0) 111111101 (509) 1 0 5599 5599 000000000 (0) 111111110 (510) 1 0 5610 5610 000000000 (0) 111111111 (511) 1 0 5621 5621 000000001 (1) 111111111 (511) 1 11 5621 5632 000000010 (2) 111111111 (511) 1 22 5621 5643 • • • • • • • • • • • • 111111100 (508) 111111111 (511) 1 5588 5621 11209 111111101 (509) 111111111 (511) 1 5599 5621 11220 111111110 (510) 111111111 (511) 1 5610 5621 11231 111111111 (511) 111111111 (511) 1 5621 5621 11242 *Fixed minimum delay not included http://onsemi.com 9 NB6L295M VTx VCC VCCO 50 W INx VCC (Receiver) 50 W 50 W 50 W 50 W I INx 16 mA 50 W GND VTx Figure 9. Input Structure Figure 10. Typical CML Output Structure and Termination VCC Vthmax INx VIH VIHmax VILmax Vth VIH Vth VIL Vth VIL Vthmin INx Figure 11. Differential Input Driven Single−Ended Figure 12. Vth Diagram INx INx INx INx Figure 13. Differential Inputs Driven Differentially VIHD(MAX) VILD VILD VINPP = VIH(INx) − VIL(INx) Qx VOUTPP = VOH(Qx) − VOL(Qx) Qx VIHD(MIN) GND VIHD INx INx VIHD VID = VIHD − VILD VID = |VIHD(INx) − VILD(INx)| Figure 14. Differential Inputs Driven Differentially VILD(MAX) VCMR VILmin GND Vth VCC VIHmin tPD tPD VILD(MIN) Figure 15. VCMR Diagram Figure 16. AC Reference Measurement http://onsemi.com 10 NB6L295M VCC VCC INx VCC VCC INx NB6L295M Zo = 50 W 50 W VTx LVPECL Driver VTx 50 W 50 W* VTx LVDS Driver VTx Zo = 50 W 50 W* Zo = 50 W VTx = VTx INx INx VTx = VTx = VCC − 2.0 V GND NB6L295M Zo = 50 W GND GND Figure 17. LVPECL Interface GND Figure 18. LVDS Interface VCC VCC INx NB6L295M Zo = 50 W CML Driver VTx 50 W* VTx 50 W* VCC Zo = 50 W INx VTx = VTx = VCC GND GND Figure 19. CML Interface, Standard 50 W Load VCC VCC INx VCC VCC INx NB6L295M Zo = 50 W Differential Driver NB6L295M Zo = 50 W 50 W* VTx Single−Ended Driver VREFAC VTx 50 W* VTx 50 W* VTx 50 W* VREFAC Zo = 50 W INx INx VTx = VTx = External VREFAC GND VTx = VTx = External VREFAC GND GND Figure 20. Capacitor−Coupled Differential Interface (VTx/VTx Connected to VREFAC; VREFAC Bypassed to Ground with 0.1 mF Capacitor) GND Figure 21. Capacitor−Coupled Single−Ended Interface (VTx/VTx Connected to External VREFAC; VREFAC Bypassed to Ground with 0.1 mF Capacitor) http://onsemi.com 11 NB6L295M VCC 50 W Z = 50 W 50 W Q DUT Driver Device D Receiver Device Z = 50 W Q D Figure 22. Typical Termination for Output Driver and Device Evaluation VOUTPP, TYPICAL OUTPUT VOLTAGE AMPLITUDE (mV) 800 700 600 500 400 300 200 100 0 0 0.5 1.0 1.5 fOUT, CLOCK OUTPUT FREQUENCY (GHz) Figure 23. Output Voltage Amplitude (VOUTPP) vs. Output Frequency at Ambient Temperature (Typical) ORDERING INFORMATION Package Shipping† NB6L295MMNG QFN−24 (Pb−free) 92 Units / Rail NB6L295MMNTXG QFN−24 (Pb−free) 3000 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 12 NB6L295M PACKAGE DIMENSIONS QFN24, 4x4, 0.5P MN SUFFIX CASE 485L−01 ISSUE A D A PIN 1 IDENTIFICATION NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN 0.25 AND 0.30 MM FROM TERMINAL. 4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS. B E 2X DIM A A1 A2 A3 b D D2 E E2 e L 0.15 C 2X 0.15 C A2 0.10 C A 0.08 C A3 A1 SEATING PLANE REF D2 e L 7 C MILLIMETERS MIN MAX 0.80 1.00 0.00 0.05 0.60 0.80 0.20 REF 0.20 0.30 4.00 BSC 2.70 2.90 4.00 BSC 2.70 2.90 0.50 BSC 0.30 0.50 12 6 13 E2 24X b 1 0.10 C A B 18 24 19 e 0.05 C ECLinPS MAX is a trademark of Semiconductor Components Industries, LLC (SCILLC). ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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