TI ISO7221C-HT

ISO7221C-HT
SLLSE78 – APRIL 2011
www.ti.com
DUAL DIGITAL ISOLATOR
Check for Samples: ISO7221C-HT
FEATURES
1
•
•
•
•
•
•
•
•
•
•
•
APPLICATIONS
•
•
Controlled Baseline
One Assembly/Test Site
One Fabrication Site
Available in Extreme (–55°C/175°C)
Temperature Range (1) (2)
Extended Product Life Cycle
Extended Product-Change Notification
Product Traceability
Texas Instruments high temperature products
utilize highly optimized silicon (die) solutions
with design and process enhancements to
maximize performance over extended
temperatures.
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1-, 5- and 25-Mbps Signaling Rate Options
– Low Channel-to-Channel Output Skew;
1 ns max
– Low Pulse-Width Distortion (PWD);
1 ns max
– Low Jitter Content; 1 ns Typ at 150 Mbps
4000-Vpeak Isolation, 560 Vpeak VIORM
– UL 1577 Approved
– 50-kV/μs Typical Transient Immunity
Operates with 3.3-V or 5-V Supplies
4-kV ESD Protection
High Electromagnetic Immunity
Down-Hole Drilling
High Temperature Environments
ISO7221C
(1)
(2)
VCC1
1
OUTA
INB
2
GND1
4
3
Isolation
•
SUPPORTS EXTREME TEMPERATURE
APPLICATIONS
8
VCC2
7
INA
OUTB
GND2
6
5
Custom temperature ranges available.
Device is qualified to ensure reliable operation for 1000 hours
at maximum rated temperature. This includes, but is not
limited to temperature bake, temperature cycle, electro
migration, bond inter metallic life, and mold compound life.
Such qualification testing should not be viewed as justifying
use of this component beyond specified performance and
environmental limits.
DESCRIPTION
The ISO7221 is a dual-channel digital isolator. To facilitate PCB layout, the channels are oriented in the opposite
directions. This device has a logic input and output buffer separated by TI’s silicon-dioxide (SiO2) isolation
barrier, providing galvanic isolation of up to 4000 V. Used in conjunction with isolated power supplies, this device
blocks high voltage, isolates grounds, and prevents noise currents on a data bus or other circuits from entering
the local ground and interfering with or damaging sensitive circuitry.
A binary input signal is conditioned, translated to a balanced signal, then differentiated by the capacitive isolation
barrier. Across the isolation barrier, a differential comparator receives the logic transition information, then sets or
resets a flip-flop and the output circuit accordingly. A periodic update pulse is sent across the barrier to ensure
the proper dc level of the output. If this dc-refresh pulse is not received every 4 μs, the input is assumed to be
unpowered or not being actively driven, and the failsafe circuit drives the output to a logic high state.
The small capacitance and resulting time constant provide fast operation with signaling rates available from
0 Mbps (dc) to 150 Mbps. (3) The A-, B- and C-option devices have TTL input thresholds and a noise filter at the
input that prevents transient pulses from being passed to the output of the device. The M-option devices have
CMOS VCC/2 input thresholds and do not have the input noise-filter and the additional propagation delay.
(3)
The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated
ISO7221C-HT
SLLSE78 – APRIL 2011
www.ti.com
This device requires two supply voltages of 3.3 V, 5 V, or any combination. All inputs are 5-V tolerant when
supplied from a 3.3-V supply and all outputs are 4-mA CMOS.
The ISO7221 is characterized for operation over the ambient temperature range of –55°C to 175°C.
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
SINGLE-CHANNEL FUNCTION DIAGRAM
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Galvanic Isolation
Barrier
DC Channel
IN
Filter
OSC
+
PWM
Vref
Input
+
Filter
Vref
Pulse Width
Demodulation
Carrier Detect
Data MUX
AC Detect
OUT
Output Buffer
AC Channel
AVAILABLE OPTIONS (1)
(1)
(2)
PRODUCT
MAX
SIGNALING
RATE
PACKAGE (2)
INPUT
THRESHOLD
MARKED
AS
ORDERING
NUMBER
ISO7221C
25 Mbps
SOIC-8
≉ 1.5 V (TTL)
(CMOS compatible)
I7221H
ISO7221CHD
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
REGULATORY INFORMATION
UL
Recognized under 1577 Component Recognition Program (1)
File Number: E181974
(1)
Production tested ≥3000 VRMS for 1 second in accordance with UL
1577.
ABSOLUTE MAXIMUM RATINGS (1)
VALUE
UNIT
VCC
Supply voltage (2), VCC1, VCC2
–0.5 to 6
V
VI
Voltage at IN, OUT
–0.5 to 6
V
IO
Output current
±15
mA
Human Body Model
Electrostatic discharge JEDEC Standard
22, Test Method A114-C.01
Field-Induced-Charged Device
Model
JEDEC Standard 22, Test Method C101
Machine Model
ANSI/ESDS5.2-1996
ESD
Electrostatic
discharge
TJ
Maximum junction temperature
(1)
(2)
2
±4
All pins
kV
±1
±200
V
180
°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values.
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RECOMMENDED OPERATING CONDITIONS
MIN
VCC
Supply voltage (1), VCC1, VCC2
IOH
High-level output current
IOL
Low-level output current
TYP
MAX
3
UNIT
5.5
V
4
mA
–4
(2)
mA
tui
Input pulse width
40
33
1/tui
Signaling rate (2)
0
30
VIH
High-level input voltage
2
VIL
Low-level input voltage
0
0.8
V
TA
Operating temperature
–55
175
°C
(2)
Mbps
VCC
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(1)
ns
25
V
For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.
Typical signaling rate and Input pulse width are measured at ideal conditions at 25°C.
ELECTRICAL CHARACTERISTICS: VCC1 and VCC2 at 5-V (1) OPERATION
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SUPPLY CURRENT
ICC1
25 Mbps
VI = VCC or 0 V, no load
12
22
ICC2
25 Mbps
VI = VCC or 0 V, no load
12
22
VOH
High-level output voltage
VOL
Low-level output voltage
VI(HYS)
Input voltage hysteresis
IIH
High-level input current
IN from 0 V to VCC
IIL
Low-level input current
IN from 0 V to VCC
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V, See Figure 3
(1)
IOH = –4 mA, See Figure 1
VCC – 0.8
4.6
IOH = –20 μA, See Figure 1
VCC – 0.1
5
mA
V
IOL = 4 mA, See Figure 1
0.2
0.4
IOL = 20 μA, See Figure 1
0
0.1
V
150
mV
μA
11
–11
25
μA
1
pF
50
kV/μs
For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.
SWITCHING CHARACTERISTICS: VCC1 and VCC2 at 5-V OPERATION
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
21
32
43
UNIT
1
2
ns
10
ns
tpLH, tpHL
Propagation delay
See Figure 1
PWD
Pulse-width distortion |tpHL – tpLH| (1)
See Figure 1
tsk(pp)
Part-to-part skew
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
See Figure 1
tf
Output signal fall time
See Figure 1
1
ns
tfs
Failsafe output delay time from input power loss
See Figure 2
3
μs
(1)
(2)
(3)
(2)
(3)
0.2
5
1
ns
ns
ns
Also referred to as pulse skew.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
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ELECTRICAL CHARACTERISTICS: VCC1 at 5 V, VCC2 at 3.3 V (1) OPERATION
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SUPPLY CURRENT
ICC1
25 Mbps
VI = VCC or 0 V, no load
12
22
mA
ICC2
25 Mbps
VI = VCC or 0 V, no load
6
12
mA
VOH
High-level output voltage
VOL
Low-level output voltage
(5-V side)
IOH = –4 mA, See Figure 1
VCC – 0.8
IOH = –20 μA, See Figure 1
VCC – 0.1
0.4
IOL = 20 μA, See Figure 1
0.1
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IOL = 4 mA, See Figure 1
VI(HYS)
Input voltage hysteresis
IIH
High-level input current
IN from 0 V to VCC
IIL
Low-level input current
IN from 0 V to VCC
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V, See Figure 3
(1)
V
150
mV
11
–11
15
V
μA
μA
1
pF
40
kV/μs
For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.
SWITCHING CHARACTERISTICS: VCC1 at 5 V, VCC2 at 3.3 V OPERATION
over recommended operating conditions (unless otherwise noted)
PARAMETER
tpLH, tpHL
TEST CONDITIONS
Propagation delay
MIN
TYP
MAX
24
36
49
(1)
UNIT
ns
PWD
Pulse-width distortion |tpHL – tpLH|
tsk(pp)
Part-to-part skew
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
See Figure 1
tf
Output signal fall time
See Figure 1
2
ns
tfs
Failsafe output delay time from input power loss
See Figure 2
3
μs
(1)
(2)
(3)
1
(2)
(3)
0.2
2
ns
10
ns
10
2
ns
ns
Also referred to as pulse skew.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
ELECTRICAL CHARACTERISTICS: VCC1 at 3.3 V, VCC2 at 5 V (1) OPERATION
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SUPPLY CURRENT
ICC1
25 Mbps
VI = VCC or 0 V, no load
6
12
mA
ICC2
25 Mbps
VI = VCC or 0 V, no load
12
22
mA
VOH
High-level output voltage
VOL
Low-level output voltage
VI(HYS)
Input threshold voltage hysteresis
IIH
High-level input current
IN from 0 V or VCC
IIL
Low-level input current
IN from 0 V or VCC
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V, See Figure 3
(1)
4
(3.3-V side)
IOH = –4 mA, See Figure 1
VCC – 0.4
IOH = –20 μA, See Figure 1
VCC – 0.1
IOL = 4 mA, See Figure 1
IOL = 20 μA, See Figure 1
0
V
0.4
0.1
150
mV
11
–11
15
μA
μA
1
pF
40
kV/μs
For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.
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SWITCHING CHARACTERISTICS: VCC1 at 3.3 V, VCC2 at 5 V OPERTAION
over recommended operating conditions (unless otherwise noted)
PARAMETER
tpLH,
tpHL
TEST CONDITIONS
Propagation delay
Pulse-width distortion |tpHL – tpLH|
tsk(pp)
Part-to-part skew
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
tf
Output signal fall time
tfs
Failsafe output delay time from input power loss
MAX
24
36
49
1
(2)
(3)
0.2
UNIT
ns
3
ns
10
ns
10
ns
1
See Figure 1
1
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(3)
TYP
(1)
PWD
(1)
(2)
MIN
See Figure 2
μs
3
Also referred to as pulse skew.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
ELECTRICAL CHARACTERISTICS: VCC1 and VCC2 at 3.3 V (1) OPERATION
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SUPPLY CURRENT
ICC1
25 Mbps
VI = VCC or 0 V, no load
6
12
mA
ICC2
25 Mbps
VI = VCC or 0 V, no load
6
12
mA
VOH
High-level output voltage
VOL
Low-level output voltage
IOH = –4 mA, See Figure 1
VCC – 0.4
3
IOH = –20 μA, See Figure 1
VCC – 0.1
3.3
IOL = 4 mA, See Figure 1
0.2
0.4
IOL = 20 μA, See Figure 1
0
0.1
VI(HYS)
Input voltage hysteresis
IIH
High-level input current
IN from 0 V or VCC
IIL
Low-level input current
IN from 0 V or VCC
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
CMTI
Common-mode transient immunity
VI = VCC or 0 V, See Figure 3
(1)
V
150
V
mV
11
μA
–11
1
pF
15
40
kV/μs
MIN
TYP
MAX
256
40
53
ns
3
ns
10
ns
For the 5-V operation, VCC1 or VCC2 is specified from 4.5 V to 5.5 V.
For the 3-V operation, VCC1 or VCC2 is specified from 3 V to 3.6 V.
SWITCHING CHARACTERISTICS: VCC1 and VCC2 at 3.3 V
over recommended operating conditions (unless otherwise noted)
PARAMETER
tpLH,
tpHL
TEST CONDITIONS
Propagation delay
(1)
UNIT
PWD
Pulse-width distortion |tpHL – tpLH|
tsk(pp)
Part-to-part skew (2)
tsk(o)
Channel-to-channel output skew
tr
Output signal rise time
See Figure 1
2
tf
Output signal fall time
See Figure 1
2
ns
tfs
Failsafe output delay time from input power loss
See Figure 2
3
μs
(1)
(2)
(3)
(3)
1
0.2
5
ns
ns
Also referred to as pulse skew.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
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ISOLATION BARRIER
PARAMETER MEASUREMENT INFORMATION
IN
Input
Generator
VI
50 W
NOTE A
VCC1
VI
VCC1/2
VCC1/2
OUT
0V
tPHL
tPLH
CL
NOTE B
VO
VO
VOH
90%
50%
50%
10%
tr
VOL
tf
The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3
ns, tf ≤ 3 ns, ZO = 50Ω.
B.
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
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A.
Figure 1. Switching Characteristic Test Circuit and Voltage Waveforms
VI
0V
or
VCC1
A.
ISOLATION BARRIER
VCC1
IN
VCC1
OUT
VI
2.7 V
VO
0V
VOH
tfs
CL
NOTE A
VO
50%
FAILSAFE HIGH
VOL
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 2. Failsafe Delay Time Test Circuit and Voltage Waveforms
VCC1
VCC2
S1
ISOLATION BARRIER
C = 0.1 mF± 1%
IN
GND1
C = 0.1 mF± 1%
Pass-fail criteria:
Output must
remain stable
OUT
NOTE A
VOH or VOL
GND2
VCM
A.
CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.
Figure 3. Common-Mode Transient Immunity Test Circuit
DUT
Tektronix
HFS9009
VCC1
IN
OUT
Tektronix
784D
PATTERN
GENERATOR
0V
VCC/2
Jitter
NOTE: PRBS bit pattern run length is 216 – 1. Transition time is 800 ps.
Figure 4. Peak-to-Peak Eye-Pattern Jitter Test Circuit and Voltage Waveform
6
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DEVICE INFORMATION
DEVICE I/O SCHEMATICS
Input
VCC1
VCC1
Output
VCC2
VCC1
750 kW
8W
500 W
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IN
OUT
13 W
SOIC-8 PACKAGE THERMAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
Low-K Thermal Resistance
θJA
Junction-to-air
θJB
Junction-to-Board Thermal Resistance
θJC
Junction-to-Case Thermal Resistance
(1)
MIN
(1)
TYP
MAX
UNIT
212
High-K Thermal Resistance
122
37
°C/W
69.1
Tested in accordance with the Low-K or High-K thermal metric definitions of EIA/JESD51-3 for leaded surface mount packages.
DEVICE FUNCTION TABLE
Table 1. Function Table (1)
INPUT SIDE VCC
(1)
OUTPUT SIDE VCC
PU
PU
PD
PU
INPUT IN
OUTPUT OUT
H
H
L
L
Open
H
X
H
PU = Powered Up(Vcc ≥ 3.0V); PD = Powered Down (Vcc ≤ 2.5V); X = Irrelevant; H = High Level;
L = Low Level
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TYPICAL CHARACTERISTIC CURVES
3.3-V RMS SUPPLY CURRENT
vs
SIGNALING RATE (Mbps)
5-V RMS SUPPLY CURRENT
vs
SIGNALING RATE (Mbps)
20
30
TA = 25°C,
15 pF Load
18
26
ISO7220x ICC2
24
14
ICC - Supply Current - mA
16
ISO7220x ICC2
12
10
ISO7221x ICC1&2
8
6
4
22
20
18
16
14
12
10
4
2
0
0
0
25
50
75
ISO7220x ICC1
8
6
ISO7220x ICC1
2
ISO7221x ICC1&2
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ICC - Supply Current - mA
TA = 25°C,
15 pF Load
28
100
0
25
Signaling Rate - Mbps
50
50
75
Signaling Rate - Mbps
100
Figure 5.
Figure 6.
PROPAGATION DELAY
vs
FREE-AIR TEMPERATURE
INPUT VOLTAGE LOW-TO-HIGH SWITCHING THRESHOLD
vs
FREE-AIR TEMPERATURE
1.45
5-V Vth+
VCC = 3.3 V
1.4
45
tpLH & tpHL
40
35
30
VCC = 5 V
tpLH & tpHL
25
Input Voltage Threshold - V
Propagation Delay - ns
1.35
3.3-V Vth+
1.3
1.25
1.2
15 pF Load
5-V Vth-
1.15
1.1
3.3-V Vth-
1.05
20
-55
-40
25
125
175
1
-60
Temperature - °C
40
90
140
190
Temperature - °C
Figure 7.
8
-10
Figure 8.
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TYPICAL CHARACTERISTIC CURVES (continued)
VCC FAILSAFE THRESHOLD
vs
FREE-AIR TEMPERATURE
HIGH-LEVEL OUTPUT CURRENT
vs
HIGH-LEVEL OUTPUT VOLTAGE
2.75
-80
15 pF Load
VCC = 3.3 V or 5 V
2.7
VFS
-60
VCC = 5 V
2.65
-50
IOUT - mA
2.6
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Failsafe Threshold - V
15 pF Load
TA = 25°C
-70
VFS-
-40
-30
2.55
VCC = 3.3 V
-20
2.5
-10
2.45
-60
0
-10
40
90
140
0
190
2
4
6
VOUT - V
Temperature - °C
Figure 9.
Figure 10.
LOW-LEVEL OUTPUT CURRENT
vs
LOW-LEVEL OUTPUT VOLTAGE
70
15 pF Load
TA = 25°C
60
VCC = 5 V
IOUT - mA
50
40
VCC = 3.3 V
30
20
10
0
0
1
2
3
4
5
VOUT - V
Figure 11.
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Product Folder Link(s) :ISO7221C-HT
9
ISO7221C-HT
SLLSE78 – APRIL 2011
www.ti.com
APPLICATION INFORMATION
V CC 1
V CC 2
0.1mF
OUTPUT
2 mm
max .
from
Vcc 1
1
OUTA
2
INB
INPUT
0.1mF
INPUT
OUTPUT
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3
4
8
INA
7
OUTB
6
5
2 mm
max .
from
Vcc 2
ISO 7221
GND 1
GND 2
Figure 12. Typical ISO7221 Application Circuit
10
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ISO7221C-HT
SLLSE78 – APRIL 2011
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ISOLATION GLOSSARY
Creepage Distance — The shortest path between two conductive input to output leads measured along the
surface of the insulation. The shortest distance path is found around the end of the package body.
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Clearance — The shortest distance between two conductive input to output leads measured through air (line of
sight).
Input-to Output Barrier Capacitance — The total capacitance between all input terminals connected together,
and all output terminals connected together.
Input-to Output Barrier Resistance — The total resistance between all input terminals connected together, and
all output terminals connected together.
Primary Circuit — An internal circuit directly connected to an external supply mains or other equivalent source
which supplies the primary circuit electric power.
Secondary Circuit — A circuit with no direct connection to primary power, and derives its power from a separate
isolated source.
Comparative Tracking Index (CTI) — CTI is an index used for electrical insulating materials which is defined as
the numerical value of the voltage which causes failure by tracking during standard testing. Tracking is the
process that produces a partially conducting path of localized deterioration on or through the surface of an
insulating material as a result of the action of electric discharges on or close to an insulation surface -- the higher
CTI value of the insulating material, the smaller the minimum creepage distance.
Generally, insulation breakdown occurs either through the material, over its surface, or both. Surface failure may
arise from flashover or from the progressive degradation of the insulation surface by small localized sparks. Such
sparks are the result of the breaking of a surface film of conducting contaminant on the insulation. The resulting
break in the leakage current produces an overvoltage at the site of the discontinuity, and an electric spark is
generated. These sparks often cause carbonization on insulation material and lead to a carbon track between
points of different potential. This process is known as tracking.
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Insulation:
Operational insulation — Insulation needed for the correct operation of the equipment.
Basic insulation — Insulation to provide basic protection against electric shock.
Supplementary insulation — Independent insulation applied in addition to basic insulation in order to ensure
protection against electric shock in the event of a failure of the basic insulation.
Double insulation — Insulation comprising both basic and supplementary insulation.
Reinforced insulation — A single insulation system which provides a degree of protection against electric shock
equivalent to double insulation.
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Pollution Degree:
Pollution Degree 1 — No pollution, or only dry, nonconductive pollution occurs. The pollution has no influence.
Pollution Degree 2 — Normally, only nonconductive pollution occurs. However, a temporary conductivity caused
by condensation must be expected.
Pollution Degree 3 — Conductive pollution occurs or dry nonconductive pollution occurs which becomes
conductive due to condensation which is to be expected.
Pollution Degree 4 – Continuous conductivity occurs due to conductive dust, rain, or other wet conditions.
Installation Category:
Overvoltage Category — This section is directed at insulation co-ordination by identifying the transient
overvoltages which may occur, and by assigning 4 different levels as indicated in IEC 60664.
I: Signal Level — Special equipment or parts of equipment.
II: Local Level — Portable equipment etc.
III: Distribution Level — Fixed installation
IV: Primary Supply Level — Overhead lines, cable systems
Each category should be subject to smaller transients than the category above.
12
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PACKAGE OPTION ADDENDUM
www.ti.com
20-Feb-2012
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PACKAGING INFORMATION
Orderable Device
ISO7221CHD
Status
(1)
ACTIVE
(1)
Package Type Package
Drawing
SOIC
D
Pins
Package Qty
8
75
Eco Plan
TBD
(2)
Lead/
Ball Finish
Call TI
MSL Peak Temp
(3)
Samples
(Requires Login)
Call TI
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF ISO7221C-HT :
• Catalog: ISO7221C
• Automotive: ISO7221C-Q1
NOTE: Qualified Version Definitions:
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
20-Feb-2012
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• Catalog - TI's standard catalog product
• Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
Addendum-Page 2
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