SHENZHENFREESCALE TK12P60W

TK12P60W
Silicon N Channel MOS Type (DTMOSⅣ)
Switching Regulator Applications
Rating
Unit
Drain-source voltage
VDSS
600
V
Gate-source voltage
VGSS
±30
V
Drain current (Continuous)
(Note 1)
ID
11.5
A
Drain current (Pulsed)
(Note 1)
IDP
46.0
A
Drain power dissipation (Tc = 25°C)
PD
100
W
Single pulse avalanche energy
(Note 2)
EAS
93
mJ
Avalanche current
IAR
5.8
A
Drain reverse current (Continuous)
(Note 1)
IDR
11.5
A
Drain reverse current (Pulsed)
IDRP
46.0
A
Channel temperature
Tch
150
°C
Storage temperature range
Tstg
-55 to 150
°C
(Note 1)
1.08±0.2
10.0
1.14MAX
+0.25
−0.12
Symbol
2.29
0.76 ± 0.12
2
1
1.52
Characteristics
2.3 ± 0.1
Absolute Maximum Ratings (Ta = 25°C)
0.58MAX
6.1 ± 0.12
+0.4
−0.6
6.6 ± 0.2
5.34 ± 0.13
0.07 ± 0.07
•
•
Low drain-source ON-resistance : RDS (ON) = 0.256Ω (typ.)
by used to Super Junction Structure : DTMOS
Easy to control Gate switching
Enhancement-mode: Vth = 2.7 to 3.7 V (VDS = 10 V, ID = 0.6 mA)
1.01MAX
•
Unit: mm
3
1.
2.
GATE
DRAIN
(HEAT SINK)
3. SOURCE
JEDEC
⎯
JEITA
⎯
TOSHIBA
2-7K1A
Weight : 0.36 g (typ.)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
Handbook (“Handling Precautions”/“Derating Concept and Methods’’) and individual reliability data (i.e.
reliability test report and estimated failure rate, etc).
Internal Connection
Thermal Characteristics
Characteristics
Symbol
Max
Unit
Rth (ch-c)
1.25
°C/W
2
Thermal resistance, channel to case
Note 1: Ensure that the channel temperature does not exceed 150°C.
Note 2: VDD = 90 V, Tch = 25°C (initial), L = 4.83 mH, RG = 25 Ω, IAR = 5.8 A
This transistor is an electrostatic-sensitive device. Handle with care.
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3
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Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Gate leakage current
IGSS
VGS = ±30 V, VDS = 0 V
⎯
⎯
±1
µA
Drain cut-off current
IDSS
VDS = 600 V, VGS = 0 V
⎯
⎯
100
µA
ID = 10 mA, VGS = 0 V
600
⎯
⎯
V
VDS = 10 V, ID = 0.6 mA
2.7
⎯
3.7
V
VGS = 10 V, ID = 5.8 A
⎯
0.265
0.30
Ω
⎯
890
⎯
⎯
2.8
⎯
⎯
23
⎯
VDS = 0 to 400 V, VGS = 0 V
⎯
41
⎯
pF
VDS = OPEN, f = 1MHz
⎯
6.9
⎯
Ω
⎯
23
⎯
⎯
45
⎯
Drain-source breakdown voltage
V (BR) DSS
Gate threshold voltage
Vth
Drain-source ON-resistance
RDS (ON)
Input capacitance
Ciss
Reverse transfer capacitance
Crss
Output capacitance
Coss
Effective output capacitance
Co(er)
Gate resistance
VDS = 300 V, VGS = 0 V, f = 1 MHz
Rg
Rise time
Turn-on time
ton
ns
tf
Turn-off time
VDD ≈ 400 V
toff
Total gate charge
VOUT
RL= 69 Ω
10 Ω
Switching time
Fall time
ID = 5.8 A
10 V
VGS
0V
tr
Duty ≤ 1%, tw = 10 µs
Qg
Gate-source charge1
Qgs1
Gate-drain charge
Qgd
MOSFET turn-off dv/dt capability
dv/dt
pF
VDD ≈ 400 V, VGS = 10 V, ID = 11.5 A
VDD = 0 to 400 V, ID = 5.8 A
⎯
6
⎯
⎯
85
⎯
⎯
25
⎯
⎯
5.5
⎯
⎯
11
⎯
50
⎯
⎯
V/ns
Min
Typ.
Max
Unit
⎯
⎯
−1.7
V
⎯
380
⎯
ns
⎯
3.8
⎯
µC
⎯
25
⎯
A
15
⎯
⎯
V/ns
nC
Source-Drain Characteristics (Ta = 25°C)
Characteristics
Symbol
Forward voltage (diode)
VDSF
Reverse recovery time
trr
Reverse recovery charge
Qrr
Reverse recovery peak current
Irr
Reverse Diode dv/dt capability
dv/dt
Test Condition
IDR = 11.5 A, VGS = 0 V
IDR = 11.5 A, VGS = 0 V,
-dIDR/dt = 100 A/µs
IDR = 11.5 A, VGS = 0 V,
VDD = 400 V
Marking
TK12P60W
Part No. (or abbreviation code)
Lot No.
2/5
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ID – VDS
ID – VDS
20
10
Common source
Ta = 25°C
Pulse test
Common source
Ta = 25°C
Pulse test
7
6.5
8
7.5
(A)
8
6
ID
9
6
Drain current
Drain current
ID
(A)
10
4
5.5
2
10
8
9
7.5
16
7
12
6.5
8
6
4
VGS = 5 V
5.5
VGS = 5 V
0
0
0
1
2
3
Drain-source voltage
4
VDS
5
0
4
2
(V)
ID – VGS
Common source
Ta = 25°C
Pulse test
(V)
VDS
12
Drain-source voltage
(A)
ID
Drain current
Common source
VDS = 10 V
Ta = 25°C
16
Pulse test
8
6
4
ID = 11.5 A
2
5.8
2.9
0
0
2
4
6
Gate-source voltage
8
VGS
0
10
4
(V)
8
16
VGS
20
(V)
RDS(ON) – ID
VDSS – Ta
10
Drain-source on-resistance
RDS(ON) (Ω)
Common source
VGS = 0 V
I = 10 mA
660 D
Pulse test
620
580
540
500
−100
12
Gate-source voltage
700
(V)
(V)
VDS – VGS
0
VDSS
VDS
10
8
4
Drain-source voltage
8
Drain-source voltage
20
−50
0
50
Ambient temperature
3/5
6
100
Ta
150
(°C)
200
1
0.1
Common source
VGS = 10 V
Ta = 25°C
Pulse test
0.01
0.1
1
Drain current
10
ID
100
(A)
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RDS(ON) – Ta
IDR – VDS
100
Common source
VGS = 0 V
Ta = 25°C
Pulse test
(A)
Common source
VGS = 10 V
Pulse test
IDR
Drain-source on-resistance
RDS(ON) (Ω)
0.8
0.6
10
Reverse drain current
11.5
5.8
0.4
ID = 2.9 A
0.2
0
−80
1
0.1
−40
0
40
Ambient temperature
80
120
Ta
−0.8
−0.4
0
160
(°C)
Drain-source voltage
C – VDS
100
Coss
Common source
VGS = 0 V
f = 1 MHz
Ta = 25°C
Crss
10
2
1
0
100
VDS
3
1000
0
100
(V)
200
300
Drain-source voltage
400
VDS
500
(V)
Dynamic input/output
characteristics
Vth – Ta
5
(V)
500
4
Common source
ID = 11.5 A
Ta = 25°C
Pulse test
VDS
16
Drain-source voltage
3
2
Common source
1
VDS = 10 V
ID = 0.6 mA
Pulse test
0
−80
−40
VGS
VDS
400
20
(V)
Drain-source voltage
Vth (V)
(V)
300
12
VDD ≈ 400 V
VGS
200
8
100
4
0
0
0
40
Ambient temperature
80
Ta
120
(°C)
160
Gate-source voltage
1
Output capacitance stored energy
Eoss (µJ)
(pF)
C
Capacitance
Ciss
1000
1
0.1
Gate threshold voltage
VDS
−2
4
10000
4/5
−1.6
Eoss – VDS
100000
10
−1.2
0
5
10
15
Total gate charge
20
Qg
25
30
(nC)
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rth – tw
Normalized transient thermal impedance
rth/Rth(ch-c)
10
1
Duty = 0.5
0.2
PDM
0.1
0.1 0.05
t
Single pulse
0.02
T
0.01
0.01
10 µ
Duty = t/T
Rth(ch-c) = 1.25°C/W
100 µ
1m
10 m
Pulse width
100 m
tw
1
(s)
PD – Tc
EAS – Tch
100
(mJ)
80
EAS
Avalanche energy
(W)
100
PD
120
Power dissipation
10
60
40
20
80
60
40
20
0
0
0
40
80
Case temperature
120
Tc
160
(°C)
25
50
75
100
125
Channel temperature (initial)
150
Tch (°C)
Safe operating area
100
ID max (pulse) *
100 ns *
1 ms *
15 V
ID
(A)
100 µs *
Drain current
IAR
−15 V
ID max (continuous)
10
VDD
1 µs *
10 µs *
1
This area is limited by
RDS(ON)
VDS
Waveform
DC operation
Tc = 25°C
BVDSS
1
2
・L・I AR・
RG = 25 Ω, VDD = 90 V EAS =
BVDSS − VDD
2
0.1
0.01
0.001
0.1
* : Single pulse Tc = 25°C
Curves must be derated
linearly with increase in
temperature.
1
10
Drain-source voltage
5/5
BVDSS
VDSS max
100
VDS
1000
(V)
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