ETC L10C23NC30

L10C23
L10C23
DEVICES INCORPORATED
64-bit Digital Correlator
64-bit Digital Correlator
DEVICES INCORPORATED
FEATURES
DESCRIPTION
❑ High Speed (50 MHz), Low Power
(125 mW), CMOS 64-bit Digital
Correlator
❑ Replaces Fairchild
TDC1023/TMC2023
❑ Bit Can be Selectively Masked
❑ Three-State Outputs
❑ 24-pin PDIP
The L10C23 is a high speed CMOS
64-bit digital correlator. It is pin-forpin equivalent to the Fairchild
TDC1023/TMC2023. The L10C23
operates over the full military ambient
temperature range using advanced
CMOS technology.
The L10C23 produces the 7-bit correlation score of two input words of up
to 64 bits, denoted A and B. The A
and B inputs are serially shifted into
two independently clocked 64-bit
registers. The A register is clocked on
L10C23 BLOCK DIAGRAM
BOUT
AOUT
AIN
CLK A
A1
A2
A64
C LATCH
B64
B2
B1
BIN
CLK B
C64
C2
C1
LCL
MOUT
M64
M2
M1
MIN
CLK M
7
THRESHOLD REG
CLK S
3-STAGE PIPELINED
CLK S
REGISTER
DIGITAL
REGISTER
SUMMER
REGISTER
7
INV
COMPARATOR
CLK S
7
OE
R6-0
The outputs of the B register drive a
64-bit transparent latch, denoted the
C latch. The C latch is controlled by
the LCL (Load C Latch) input. A
HIGH level on the LCL input causes
the C latch to be transparent, allowing
the contents of the B register to be
applied directly to the correlator
array. When the LCL input is LOW,
the data in the C latch is held, so that
the B input may be loaded with a new
correlation reference without affecting
the current reference value stored in C.
Each bit in the A register is exclusive
NOR’ed with the corresponding bit in
the C latch, implementing a single bit
multiplication at each bit position.
The mask register, denoted by M, is
a third 64-bit register, which is
serially loaded from the M input on
the rising edge of CLK M. Bit
positions in the M register which are
set to zero mask the corresponding
bits in the A and C registers from
participating in the correlation
score. This can be used to reduce
the effective length of the correlation, or to correlate against only
one channel of a bit-multiplexed
datastream without deinterleaving
the data.
The output of the masking process is a 64bit vector which contains ones in the
locations in which A and B data match,
and which are unmasked (M register
contains a ‘1’). This 64-bit vector is
applied to a pipelined digital summer
which calculates the total number of ones
in the vector (the correlation score). The
summer network contains three pipeline
stages, which are clocked on the rising
edge of CLK S. Calculation of a
7
D Q
CLK C
the rising edge of CLK A, and the B
register is clocked on the rising edge
of CLK B.
CFL
Special Arithmetic Functions
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08/16/2000–LDS.23-K
L10C23
DEVICES INCORPORATED
correlation score therefore requires
three clock cycles, but a new result can
be obtained on each cycle once the
pipeline is filled.
Because a portion of the summer logic
is located between the input registers
and the first pipeline register, some
timing restrictions exist between
CLK S and CLK A, CLK B, or CLK M.
CLK S may be tied to an input clock
(usually CLK A) to obtain a continuously updated correlation score,
delayed by three cycles from the data.
Under this condition, CLK S may be
skewed later than CLK A by no more
than tSK to assure that the A register
outputs have not changed before the
S clock occurs.
Alternatively, CLK S may be asyncronous to the input clocks, as long as
data is stable at the pipeline register
inputs prior to the CLK S rising edge.
This condition can be met by assuring
that CLK S occurs at least tPS after the
input clock.
The summer output represents a
count of the number of matching
positions in the input data streams.
This 7-bit result can be inverted (one’s
complemented) by loading a ‘1’ into
the INV register.
64-bit Digital Correlator
Correlation values which exceed a
predetermined threshold can be
detected via the Threshold register
and Comparator. The Threshold
register is loaded with a 7-bit value
via the R 6-0 pins at the rising edge of
CLK C and while OE is HIGH. To
achieve synchronization with the
digital summer, the Threshold register
contents are fed into pipeline registers
clocked by CLK S. The compare flag
output (CFL) goes HIGH when the
summer output is equal to or greater
than the contents of the Threshold
register.
Cascading the L10C23 devices for
longer correlation lengths and more
bits of reference or data precision is
easily accomplished. The A, B, and M
registers have serial outputs to
directly drive the corresponding
inputs of succeeding devices. The
correlation scores of multiple devices
in such a system should be added
together to obtain the overall correlation score.
Correlation on data exceeding one bit
of precision can be accomplished by
first calculating single-bit correlation
scores at each bit position, then
adding the results after weighting
them appropriately. Thus, one
L10C23 would be used for each bit of
precision in the data.
LOGIC Devices’ L4C381 16-bit ALU
can be used to assist in adding the
outputs of several L10C23 correlators.
When adding several 7-bit correlation
scores, advantage can be taken of the
fact that the sum of two 7-bit numbers
will not exceed 8 bits. Thus the
L4C381 can simultaneously perform
two 7-bit additions. The first two
operands are applied to A6 -0 and B 6 -0,
with the result appearing on F 7 -0. The
second pair of operands are applied to
A14 -8 and B14 -8, with the result
appearing in F15 -8. The unused inputs
are tied to ground. If it can be guaranteed that at least one of the input
scores will not reach its maximum
value of 64, then this technique can
also be applied in the second tier of
adders. In this case, while the inputs
have 8 bits of precision, the maximum
value that their sum can assume is
255, which is expressable in 8 bits.
Alternatively, when performing long
correlations on relatively slow datastreams, one L4C381 can be configured using its feedback mode to
accumulate the correlation scores of a
number of L10C23s. To accomplish
this, the outputs of all the correlators
are tied together on a three-state bus.
Each one is sequentially enabled and
clocked into the L4C381, which
accumulates the total resulting score.
Special Arithmetic Functions
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08/16/2000–LDS.23-K
L10C23
DEVICES INCORPORATED
64-bit Digital Correlator
MAXIMUM RATINGS Above which useful life may be impaired (Notes 1, 2, 3, 8)
Storage temperature ........................................................................................................... –65°C to +150°C
Operating ambient temperature ........................................................................................... –55°C to +125°C
VCC supply voltage with respect to ground ............................................................................ –0.5 V to +7.0 V
Input signal with respect to ground ........................................................................................ –3.0 V to +7.0 V
Signal applied to high impedance output ............................................................................... –3.0 V to +7.0 V
Output current into low outputs ............................................................................................................. 25 mA
Latchup current ............................................................................................................................... > 400 mA
OPERATING CONDITIONS To meet specified electrical and switching characteristics
Mode
Temperature Range (Ambient)
Active Operation, Commercial
Active Operation, Military
Supply Voltage
0°C to +70°C
4.75 V ≤ VCC ≤ 5.25 V
–55°C to +125°C
4.50 V ≤ VCC ≤ 5.50 V
ELECTRICAL CHARACTERISTICS Over Operating Conditions (Note 4)
Symbol
Parameter
Test Condition
Min
VOH
Output High Voltage
VCC = Min., IOH = –2.0 mA
VOL
Output Low Voltage
VCC = Min., IOL = 4.0 mA
VIH
Input High Voltage
VIL
Input Low Voltage
(Note 3)
IIX
Input Current
IOZ
Typ
Max
3.5
Unit
V
0.5
V
2.0
VCC
V
0.0
0.8
V
Ground ≤ VIN ≤ VCC (Note 12)
±20
µA
Output Leakage Current
Ground ≤ VOUT ≤ VCC (Note 12)
±20
µA
ICC1
VCC Current, Dynamic
(Notes 5, 6)
100
mA
ICC2
VCC Current, Quiescent
(Note 7)
0.5
mA
25
Special Arithmetic Functions
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08/16/2000–LDS.23-K
L10C23
DEVICES INCORPORATED
64-bit Digital Correlator
SWITCHING CHARACTERISTICS
COMMERCIAL OPERATING RANGE (0°C to +70°C) Notes 9, 10 (ns)
Symbol
Parameter
tPABM
A, B, M Clock Period
tPW
A, B, M, S, C Clock Pulse Width
tS
Input Setup Time
tH
Input Hold Time
tBLCL
B Clock to LCL Hold
tCS
C Clock to S Clock
tDABM
A, B, M Clock to A, B, M Out
tPS
S Clock Period, A, B, M Clock to S Clock Delay
tSK
A, B, M Clock to S Clock Skew (Note 8)
tDR
S Clock to R6-0
tDC
S Clock to CFL
tENA
Output Enable Time (Note 11)
tDIS
Output Disable Time (Note 11)
L10C23–
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30
20
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Max
Min
Max
Min
Max
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28
20
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12
8
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10
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0
0
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12
8
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16
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*DISCONTINUED SPEED GRADE
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SWITCHING WAVEFORMS
tPS
tS
tPW
tH
A, B, M
DATA
tPW
tPW
CLK
A, B, M
tDABM
A, B, M
OUT
tBLCL
LCL
tPS
tSK
tPW
tPW
CLK S
tCS
CLK C
tPW
OE
tDR
tDIS
R6-0
OUT
tS
tH
IN
tENA
OUT
tDC
CFL
Special Arithmetic Functions
4
08/16/2000–LDS.23-K
L10C23
DEVICES INCORPORATED
64-bit Digital Correlator
SWITCHING CHARACTERISTICS
MILITARY OPERATING RANGE (-55°C to +125°C) Notes 9, 10 (ns)
Symbol
Parameter
tPABM
A, B, M Clock Period
tPW
A, B, M, S, C Clock Pulse Width
tS
Input Setup Time
tH
Input Hold Time
tBLCL
B Clock to LCL Hold
tCS
C Clock to S Clock
tDABM
A, B, M Clock to A, B, M Out
tPS
S Clock Period, A, B, M Clock to S Clock Delay
tSK
A, B, M Clock to S Clock Skew (Note 8)
tDR
S Clock to R6-0
tDC
S Clock to CFL
tENA
Output Enable Time (Note 11)
tDIS
Output Disable Time (Note 11)
L10C23–
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60
35*
20*
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Min
Max
Min
Max
Min
Max
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58
33
20
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14
8
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22
12
12
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0
0
0
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14
8
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33
20
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33
20
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3
3
3
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40
35
27
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23
18
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35
20
18
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40
18
16
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*DISCONTINUED SPEED GRADE
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SWITCHING WAVEFORMS
tPS
tS
tPW
tH
A, B, M
DATA
tPW
tPW
CLK
A, B, M
tDABM
A, B, M
OUT
tBLCL
LCL
tPS
tSK
tPW
tPW
CLK S
tCS
CLK C
tPW
OE
tDR
tDIS
R6-0
OUT
tS
tH
IN
tENA
OUT
tDC
CFL
Special Arithmetic Functions
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08/16/2000–LDS.23-K
L10C23
DEVICES INCORPORATED
64-bit Digital Correlator
NOTES
1. Maximum Ratings indicate stress
specifications only. Functional operation of these products at values beyond
those indicated in the Operating Conditions table is not implied. Exposure to
maximum rating conditions for extended periods may affect reliability.
9. AC specifications are tested with
input transition times less than 3 ns,
output reference levels of 1.5 V (except
tDIS test), and input levels of nominally
0 to 3.0 V. Output loading may be a
resistive divider which provides for
specified IOH and IOL at an output
voltage of VOH min and VOL max
2. The products described by this spec- respectively. Alternatively, a diode
ification include internal circuitry de- bridge with upper and lower current
signed to protect the chip from damagsources of IOH and I OL respectively,
ing substrate injection currents and ac- and a balancing voltage of 1.5 V may be
cumulations of static charge. Neverthe- used. Parasitic capacitance is 30 pF
less, conventional precautions should minimum, and may be distributed.
be observed during storage, handling,
and use of these circuits in order to This device has high-speed outputs caavoid exposure to excessive electrical pable of large instantaneous current
stress values.
pulses and fast turn-on/turn-off times.
As a result, care must be exercised in the
3. This device provides hard clamping of testing of this device. The following
transient undershoot and overshoot. In- measures are recommended:
put levels below ground or above VCC
will be clamped beginning at –0.6 V and a. A 0.1 µF ceramic capacitor should be
VCC + 0.6 V. The device can withstand installed between VCC and Ground
indefinite operation with inputs in the leads as close to the Device Under Test
range of –0.5 V to +7.0 V. Device opera- (DUT) as possible. Similar capacitors
tion will not be adversely affected, how- should be installed between device VCC
ever, input current levels will be well in and the tester common, and device
ground and tester common.
excess of 100 mA.
4. Actual test conditions may vary from b. Ground and VCC supply planes
those designated but operation is guar- must be brought directly to the DUT
anteed as specified.
socket or contactor fingers.
5. Supply current for a given applica- c. Input voltages should be adjusted to
tion can be accurately approximated by: compensate for inductive ground and VCC
noise to maintain required DUT input
NCV2 F
levels relative to the DUT ground pin.
4
where
10. Each parameter is shown as a minN = total number of device outputs
C = capacitive load per output
V = supply voltage
F = clock frequency
6. Tested with all outputs changing every cycle and no load, at a 5 MHz clock
rate.
7. Tested with all inputs within 0.1 V of
VCC or Ground, no load.
8. These parameters are guaranteed
but not 100% tested.
11. For the tENA test, the transition is
measured to the 1.5 V crossing point
with datasheet loads. For the tDIS test,
the transition is measured to the
±200mV level from the measured
steady-state output voltage with
±10mA loads. The balancing voltage, V TH , is set at 3.5 V for Z-to-0
and 0-to-Z tests, and set at 0 V for Zto-1 and 1-to-Z tests.
12. These parameters are only tested at
the high temperature extreme, which is
the worst case for leakage current.
FIGURE A. OUTPUT LOADING CIRCUIT
S1
DUT
IOL
VTH
CL
IOH
FIGURE B. THRESHOLD LEVELS
tENA
OE
Z
tDIS
1.5 V
1.5 V
3.5V Vth
0
1.5 V
1.5 V
Z
1
VOL*
0.2 V
VOH*
0.2 V
0
Z
1
Z
0V Vth
VOL* Measured VOL with IOH = –10mA and IOL = 10mA
VOH* Measured VOH with IOH = –10mA and IOL = 10mA
imum or maximum value. Input requirements are specified from the point
of view of the external system driving
the chip. Setup time, for example, is
specified as a minimum since the external system must supply at least that
much time to meet the worst-case requirements of all parts. Responses from
the internal circuitry are specified from
the point of view of the device. Output
delay, for example, is specified as a
maximum since worst-case operation of
any device always provides data within
that time.
Special Arithmetic Functions
6
08/16/2000–LDS.23-K
L10C23
DEVICES INCORPORATED
64-bit Digital Correlator
ORDERING INFORMATION
24-pin — 0.3" wide
VCC
MIN
AIN
BIN
CLK C
CLK S
INV
OE
R6
R5
R4
R3
Speed
24-pin — 0.6" wide
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
CLK B
CLK M
CLK A
LCL
MOUT
AOUT
BOUT
CFL
GND
R0
R1
R2
VCC
MIN
AIN
BIN
CLK C
CLK S
INV
OE
R6
R5
R4
R3
Plastic DIP
(P1)
Plastic DIP
(P2)
0°C to +70°C — COMMERCIAL SCREENING
30 ns
20 ns
L10C23PC30
L10C23PC20
L10C23NC30
L10C23NC20
–55°C to +125°C — COMMERCIAL SCREENING
–55°C to +125°C — MIL-STD-883 COMPLIANT
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
CLK B
CLK M
CLK A
LCL
MOUT
AOUT
BOUT
CFL
GND
R0
R1
R2
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Ceramic DIP
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(C4)
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Discontinued Package
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7
08/16/2000–LDS.23-K