H7N0602LD, H7N0602LS, H7N0602LM Silicon N Channel MOS FET High Speed Power Switching ADE-208-1526C (Z) 4th. Edition May 2002 Features • Low on-resistance RDS(on) = 4.1 mΩ typ. • 4.5 V gate drive devices • High Speed Switching Outline LDPAK 4 4 4 D 1 G 1 S 2 2 1 3 2 3 H7N0602LS H7N0602LM 3 H7N0602LD 1. Gate 2. Drain 3. Source 4. Drain H7N0602LD, H7N0602LS, H7N0602LM Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 60 V Gate to source voltage VGSS ±20 V Drain current ID 85 A 340 A 85 A 65 A 362 mJ 100 W Drain peak current ID (pulse) Body-drain diode reverse drain current IDR Avalanche current IAPNote Avalanche energy 3 Note3 EAR Note2 Note1 Channel dissipation Pch Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Value at Tc = 25°C 3. Value at Tch = 25°C, Rg ≥ 50 Ω Rev.3, May 2002, page 2 of 11 H7N0602LD, H7N0602LS, H7N0602LM Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V(BR)DSS 60 — — V ID = 10 mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS ±20 — — V IG = ±100 µA, VDS = 0 Zero gate voltage drain current IDSS — — 10 µA VDS = 60 V, VGS = 0 Gate to source leak current IGSS — — ±10 µA VGS = ±16 V, VDS = 0 Gate to source cutoff voltage VGS(off) 1.5 — 2.5 V VDS = 10 V, ID = 1 mANote Forward transfer admittance |yfs| 70 120 — S ID = 45 A, VDS = 10 VNote 1 1 note1 Static drain to source on state resistance RDS(on) — 4.1 5.2 mΩ ID = 45 A, VGS= 10 V Static drain to source on state resistance RDS(on) — 6.2 9.0 mΩ ID = 45 A, VGS=4.5 VNote Input capacitance Ciss — 9000 — pF VDS = 10 V Output capacitance Coss — 1000 — pF VGS = 0 Reverse transfer capacitance Crss — 470 — pF f = 1 MHz Total gate charge Qg — 140 — nc VDD = 25 V Gate to source charge Qgs — 30 — nc VGS = 10 V Gate to drain charge Qgd — 30 — nc ID = 85 A Turn-on delay time td(on) — 55 — ns VGS = 10 V Rise time tr — 290 — ns ID= 45 A Turn-off delay time td(off) — 140 — ns RL = 0.67 Ω Fall time tf — 50 — ns Rg = 4.7 Ω Body–drain diode forward voltage VDF — 0.95 — V IF = 85 A, VGS = 0 Body–drain diode reverse recovery time — 45 — ns IF = 85 A, VGS = 0 diF/dt = 100 A/µs trr 1 Notes: 1. Pulse test Rev.3, May 2002, page 3 of 11 H7N0602LD, H7N0602LS, H7N0602LM Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area (A) 1000 120 300 ID Drain Current 10 100 150 Case Temperature 1 Operation in Tc (°C) (A) ID 4.5 V 120 10 30 Drain to Source Voltage VDS 4.0 V 80 3.5 V 40 2 4 6 Drain to Source Voltage Rev.3, May 2002, page 4 of 11 8 VDS (V) 160 V DS = 10 V Pulse Test 120 80 40 Tc=75°C 25°C –25°C 3V 0 100 Typical Transfer Characteristics Drain Current (A) ID 160 6.0 V 3 200 Pulse Test VGS = 10 V this area is limited by RDS(on) 0.1 Ta = 25°C 0.1 0.3 1 200 Typical Output Characteristics 200 PW = 10 ms (1 shot) 3 0.3 50 DC Operation (Tc = 25°C) s 40 µs µs m 80 0 Drain Current 0 100 30 10 10 1 Channel Dissipation Pch (W) 160 10 (V) 0 1 2 3 Gate to Source Voltage 4 VGS 5 (V) H7N0602LD, H7N0602LS, H7N0602LM 100 Pulse Test 400 300 I D = 50 A 200 100 20 A 12 4 8 Gate to Source Voltage Drain to Source on State Resistance RDS(on) (mΩ) 0 10 A 20 VGS (V) 16 Static Drain to Source on State Resistance vs. Temperature 20 Pulse Test 16 12 50 A 10, 20 A 8 4.5 V 4 0 –50 VGS = 10 V 0 50 10, 20, 50 A 100 Case Temperature 150 Tc Drain to Source on State Resistance RDS(on) (mΩ) 500 Static Drain to Source on State Resistance vs. Drain Current (°C) 200 Pulse Test 30 10 VGS = 4.5 V 10 V 3 1 1 3 30 100 300 1000 10 Drain Current ID (A) Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) Drain to Source Saturation Voltage VDS(on) (V) Drain to Source Saturation Voltage vs. Gate to Source Voltage 1000 Tc = –25°C 300 100 25°C 30 75°C 10 3 1 V DS = 10 V Pulse Test 1 3 10 30 100 Drain Current ID 300 1000 (A) Rev.3, May 2002, page 5 of 11 H7N0602LD, H7N0602LS, H7N0602LM Body-Drain Diode Reverse Recovery Time 100000 di / dt = 100 A / µs V GS = 0, Ta = 25°C 300 Capacitance C (pF) Reverse Recovery Time trr (ns) 1000 Typical Capacitance vs. Drain to Source Voltage 100 30 10 30000 3000 1000 Coss 300 3 1 0.1 0.3 1 3 10 Reverse Drain Current 30 Ciss 10000 VGS = 0 f = 1 MHz 100 0 100 10 IDR (A) 12 40 8 20 0 VDD = 50 V 25 V 10 V 40 80 Gate Charge Rev.3, May 2002, page 6 of 11 120 160 Qg (nc) 40 50 (V) 4 0 200 (V) 1000 tf 300 Switching Time t (ns) V DD = 50 V 25 V 10 V VGS V GS 16 Gate to Source Voltage VDS (V) Drain to Source Voltage I D = 85 A 60 V DS 30 Switching Characteristics 20 80 20 Drain to Source Voltage VDS Dynamic Input Characteristics 100 Crss 100 tr t d(off) t d(on) 30 t r tf 10 V GS = 10 V, V DD = 30 V 3 PW = 5 µs, duty < 1 % Rg=4.7Ω 1 0.1 0.3 1 3 10 Drain Current ID 30 (A) 100 H7N0602LD, H7N0602LS, H7N0602LM Reverse Drain Current vs. Source to Drain Voltage Maximum Avalanche Energy vs. Channel Temperature Derating Reverse Drain Current IDR (A) Repetitive Avalanche Energy EAR (mJ) 200 10 V 160 120 80 5V V GS = 0, –5 V 40 Pulse Test 0 0.4 0.8 1.2 Source to Drain Voltage 1.6 2.0 VSD 500 I AP = 65 A V DD = 25V duty < 0.1 % Rg > 50 W 400 300 200 100 0 25 (V) 50 Avalanche Test Circuit V DS Monitor 75 100 125 150 Channel Temperature Tch (°C) Avalanche Waveform EAR = L 1 2 • L • I AP • 2 I AP Monitor VDSS VDSS – V DD V (BR)DSS I AP Rg D. U. T V DS VDD ID Vin 15 V 50 W 0 VDD Rev.3, May 2002, page 7 of 11 H7N0602LD, H7N0602LS, H7N0602LM Normalized Transient Thermal Impedance gs (t) Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 q ch 0.1 q ch - c(t) = gs (t) • q ch - c - c = 1.25°C/ W, Tc = 25°C 0.05 0.03 PDM D= 1 0.0 PW T PW T 0.01 10 µ 100 µ 1m 10 m 100 m 1 10 Pulse Width PW (S) Switching Time Test Circuit Vout Monitor Vin Monitor Rg Waveform 90% D.U.T. RL Vin Vout Vin 10 V V DS = 30V 10% 90% td(on) Rev.3, May 2002, page 8 of 11 10% tr 10% 90% td(off) tf H7N0602LD, H7N0602LS, H7N0602LM Package Dimensions As of January, 2002 Unit: mm (1.4) 4.44 ± 0.2 1.27 ± 0.2 0.2 0.86 +– 0.1 0.76 ± 0.1 2.54 ± 0.5 2.54 ± 0.5 11.0 ± 0.5 10.0 1.2 ± 0.2 11.3 ± 0.5 1.3 ± 0.15 + 0.3 – 0.5 8.6 ± 0.3 10.2 ± 0.3 2.59 ± 0.2 0.4 ± 0.1 Hitachi Code JEDEC JEITA Mass (reference value) LDPAK (L) — — 1.4 g Rev.3, May 2002, page 9 of 11 H7N0602LD, H7N0602LS, H7N0602LM As of January, 2002 Unit: mm 7.8 7.0 (1.5) 10.0 + 0.3 – 0.5 8.6 ± 0.3 (1.5) 7.8 6.6 1.3 ± 0.15 1.7 (1.4) 4.44 ± 0.2 10.2 ± 0.3 0.2 0.1 +– 0.1 2.2 1.27 ± 0.2 2.54 ± 0.5 0.2 0.86 +– 0.1 2.54 ± 0.5 0.4 ± 0.1 0.3 3.0 +– 0.5 1.2 ± 0.2 Hitachi Code JEDEC JEITA Mass (reference value) LDPAK (S)-(1) — — 1.3 g As of January, 2002 Unit: mm 7.8 7.0 (2.3) 10.0 + 0.3 – 0.5 8.6 ± 0.3 (1.5) 7.8 6.6 1.3 ± 0.2 1.7 (1.4) 4.44 ± 0.2 10.2 ± 0.3 0.2 0.1 +– 0.1 2.2 1.27 ± 0.2 2.54 ± 0.5 0.2 0.86 +– 0.1 2.54 ± 0.5 0.4 ± 0.1 0.3 5.0 +– 0.5 1.2 ± 0.2 Hitachi Code JEDEC JEITA Mass (reference value) Rev.3, May 2002, page 10 of 11 LDPAK (S)-(2) — — 1.35 g H7N0602LD, H7N0602LS, H7N0602LM Disclaimer 1. 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(Taipei Branch Office) 4/F, No. 167, Tun Hwa North Road Hung-Kuo Building Taipei (105), Taiwan Tel : <886>-(2)-2718-3666 Fax : <886>-(2)-2718-8180 Telex : 23222 HAS-TP URL : http://www.hitachi.com.tw Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon Hong Kong Tel : <852>-2735-9218 Fax : <852>-2730-0281 URL : http://semiconductor.hitachi.com.hk Copyright © Hitachi, Ltd., 2002. All rights reserved. Printed in Japan. Colophon 6.0 Rev.3, May 2002, page 11 of 11