ETC 2SK2796(L)|2SK2796(S)

2SK2796(L), 2SK2796(S)
Silicon N Channel MOS FET
High Speed Power Switching
ADE-208-534C (Z)
4th. Edition
Jul. 1998
Features
• Low on-resistance
R DS(on) = 0.12Ω typ.
• 4V gate drive devices.
• High speed switching
Outline
DPAK |1
4
4
D
1 2
3
G
S
1 2
3
1. Gate
2. Drain
3. Source
4. Drain
2SK2796(L), 2SK2796(S)
Absolute Maximum Ratings (Ta = 25°C)
Item
Symbol
Ratings
Unit
Drain to source voltage
VDSS
60
V
Gate to source voltage
VGSS
±20
V
Drain current
ID
5
A
20
A
5
A
5
A
2.14
mJ
20
W
Drain peak current
I D(pulse)
Body-drain diode reverse drain current
I DR
Avalanche current
Avalanche energy
I AP
Note1
Note3
EAR
Note3
Note2
Channel dissipation
Pch
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Note:
2
1. PW ≤ 10µs, duty cycle ≤ 1 %
2. Value at Tc = 25°C
3. Value at Tch = 25°C, Rg ≥ 50 Ω
2SK2796(L), 2SK2796(S)
Electrical Characteristics (Ta = 25°C)
Item
Symbol Min
Typ
Max
Unit
Test Conditions
Drain to source breakdown voltage V(BR)DSS
60
—
—
V
I D = 10mA, VGS = 0
Gate to source breakdown voltage
V(BR)GSS
±20
—
—
V
I G = ±100µA, VDS = 0
Zero gate voltege drain current
I DSS
—
—
10
µA
VDS = 60 V, VGS = 0
Gate to source leak current
I GSS
—
—
±10
µA
VGS = ±16V, VDS = 0
Gate to source cutoff voltage
VGS(off)
1.0
—
2.0
V
I D = 1mA, VDS = 10V
Static drain to source on state
resistance
RDS(on)
—
0.12
0.16
Ω
I D = 3 A, VGS = 10V Note4
Static drain to source on state
resistance
RDS(on)
—
0.16
0.25
Ω
I D = 3A, VGS = 4V Note4
Forward transfer admittance
|yfs|
2.5
4.0
—
S
I D = 3A, VDS = 10V Note4
Input capacitance
Ciss
—
180
—
pF
VDS = 10V
Output capacitance
Coss
—
90
—
pF
VGS = 0
Reverse transfer capacitance
Crss
—
30
—
pF
f = 1MHz
Turn-on delay time
t d(on)
—
9
—
ns
VGS = 10V, ID = 3A
Rise time
tr
—
25
—
ns
RL = 10Ω
Turn-off delay time
t d(off)
—
35
—
ns
Fall time
tf
—
55
—
ns
Body–drain diode forward voltage
VDF
—
1.0
—
V
I F = 5A, VGS = 0
Body–drain diode reverse
recovery time
t rr
—
40
—
ns
I F = 5A, VGS = 0
diF/ dt =50A/µs
Note:
4. Pulse test
3
2SK2796(L), 2SK2796(S)
Main Characteristics
Power vs. Temperature Derating
Maximum Safe Operation Area
100
m
s(
1s
°C
I D (A)
Ta = 25°C
0.1
50 100
0.2 0.5 1 2
5 10 20
Drain to Source Voltage V DS(V)
200
Typical Transfer Characteristics
5
25°C
Pulse Test
–25°C
I D (A)
4
Typical Output Characteristics
10 V 6 V
5V
4V
3.5 V
3V
Drain Current
3
2
2.5 V
1
4
2
4
6
Drain to Source Voltage V
8
DS(V)
Tc = 75°C
3
2
1
V DS = 10 V
Pulse Test
VGS = 2 V
0
)
150
t)
25
100
ho
=
5
I D (A)
10
c
(T
50
Ambient Temperature Ta (°C)
4
Operation in
this area is
limited by R DS(on)
0
µ
m s
s
n
1
=
0.3
0
Drain Current
3
µs
10
1
tio
ra
pe
10
PW
O
20
10
C
Drain Current
30
10
30
D
Channel Dissipation
Pch (W)
40
10
0
2
4
6
Gate to Source Voltage V
8
(V)
GS
10
2SK2796(L), 2SK2796(S)
1.6
1.2
0.8
ID=5A
0.4
0
Static Drain to Source on State Resistance
R DS(on) ( W)
Pulse Test
2A
1A
6
2
4
Gate to Source Voltage
8
10
0.4
1A
2A
ID=5A
V GS = 4 V
0.2
5A
0.1
1, 2 A
10 V
0
–40
2
1
0.5
0.2
VGS = 4 V
0.1
10 V
0.3
V GS (V)
Static Drain to Source on State Resistance
vs. Temperature
0.5
Pulse Test
0.3
Static Drain to Source on State Resistance
vs. Drain Current
5
Pulse Test
0.05
0.1
0
40
80
120
160
Case Temperature Tc (°C)
3
1
Drain Current
30
10
I D (A)
100
Forward Transfer Admittance vs.
Drain Current
Forward Transfer Admittance |y fs | (S)
Drain to Source Saturation Voltage
V DS(on) (V)
2.0
Drain to Source On State Resistance
R DS(on) ( W)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
10
Tc = –25 °C
5
25 °C
2
75 °C
1
0.5
0.2
0.1
0.1
V DS = 10 V
Pulse Test
0.2
0.5
1
2
5
Drain Current I D (A)
10
5
2SK2796(L), 2SK2796(S)
Body–Drain Diode Reverse
Recovery Time
1000
500
VGS = 0
f = 1 MHz
500
200
Capacitance C (pF)
Reverse Recovery Time trr (ns)
Typical Capacitance vs.
Drain to Source Voltage
100
50
20
10
5
0.1
200
Ciss
100
50
Coss
20
di / dt = 50 A / µs
V GS = 0, Ta = 25 °C
Crss
10
0
0.2
0.5
1
2
5
10
Reverse Drain Current I DR (A)
20
12
V DS
V GS
V DD = 50 V
25 V
10 V
2
4
6
8
Gate Charge Qg (nc)
40
50
8
4
0
10
V GS (V)
100
t d(off)
50
Switching Time t (ns)
40
16
Gate to Source Voltage
V DS (V)
Drain to Source Voltage
60
0
6
V DD = 10 V
25 V
50 V
80
30
Switching Characteristics
20
ID=5A
20
Drain to Source Voltage V DS (V)
Dynamic Input Characteristics
100
10
tf
20
tr
t d(on)
10
5
V GS = 10 V, V DD = 30 V
PW = 5 µs, duty < 1 %
2
1
0.1
0.2
0.5
1
Drain Current
2
5
I D (A)
10
2SK2796(L), 2SK2796(S)
Repetitive Avalanche Energy E AR (mJ)
Reverse Drain Current vs.
Source to Drain Voltage
Reverse Drain Current I DR (A)
10
8
6
5V
10 V
V GS = 0, –5 V
4
2
Pulse Test
0
0.4
0.8
1.2
Source to Drain Voltage
1.6
Maximun Avalanche Energy vs.
Channel Temperature Derating
2.5
I AP = 5 A
V DD = 25 V
duty < 0.1 %
Rg > 50 W
2.0
1.5
1.0
0.5
2.0
0
25
50
V SD (V)
100
125
150
Channel Temperature Tch (°C)
Avalanche Test Circuit
V DS
Monitor
75
Avalanche Waveform
EAR =
L
1
2
• L • I AP •
2
I AP
Monitor
VDSS
VDSS – V DD
V (BR)DSS
I AP
Rg
D. U. T
V DS
VDD
ID
Vin
15 V
50W
0
VDD
7
2SK2796(L), 2SK2796(S)
Normalized Transient Thermal Impedance vs. Pulse Width
Normalized Transient Thermal Impedance
g s (t)
3
Tc = 25°C
D=1
1
0.5
0.3
0.2
0.1
0.05
0.1
q ch – c(t) = g s (t) • q ch – c
q ch – c = 6.25 °C/W, Tc = 25 °C
0.02
e
uls
1
0.0
0.03
PDM
P
ot
D=
h
1s
PW
T
PW
T
0.01
10 µ
100 µ
1m
10 m
Pulse Width
100 m
1
10
PW (S)
Switching Time Test Circuit
Waveform
Vout
Monitor
Vin Monitor
90%
D.U.T.
RL
Vin
Vin
10 V
50W
V DD
= 30 V
Vout
10%
10%
90%
td(on)
8
tr
10%
90%
td(off)
tf
2SK2796(L), 2SK2796(S)
Package Dimensions
As of January, 2001
1.7 ± 0.5
Unit: mm
2.3 ± 0.2
0.55 ± 0.1
5.5 ± 0.5
6.5 ± 0.5
5.4 ± 0.5
2.29 ± 0.5
16.2 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
3.1 ± 0.5
1.2 ± 0.3
2.29 ± 0.5
0.55 ± 0.1
Hitachi Code
JEDEC
EIAJ
Mass (reference value)
DPAK (L)-(1)
—
Conforms
0.42 g
9
2SK2796(L), 2SK2796(S)
As of January, 2001
2.3 ± 0.2
0.55 ± 0.1
(4.9)
(5.3)
6.5 ± 0.5
5.4 ± 0.5
1.2 Max
5.5 ± 0.5
1.7 ± 0.5
Unit: mm
0 – 0.25
2.5 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
2.29 ± 0.5
0.55 ± 0.1
2.29 ± 0.5
Hitachi Code
JEDEC
EIAJ
Mass (reference value)
10
DPAK (S)-(1),(2)
—
Conforms
0.28 g
2SK2796(L), 2SK2796(S)
As of January, 2001
(0.1)
2.3 ± 0.2
0.55 ± 0.1
(5.1)
(5.1)
(0.1)
6.5 ± 0.5
5.4 ± 0.5
1.2 Max
5.5 ± 0.5
1.5 ± 0.5
Unit: mm
0 – 0.25
2.5 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
2.29 ± 0.5
0.55 ± 0.1
2.29 ± 0.5
Hitachi Code
JEDEC
EIAJ
Mass (reference value)
DPAK (S)-(3)
—
Conforms
0.28 g
11
2SK2796(L), 2SK2796(S)
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL
NorthAmerica
Europe
Asia
Japan
:
:
:
:
http://semiconductor.hitachi.com/
http://www.hitachi-eu.com/hel/ecg
http://sicapac.hitachi-asia.com
http://www.hitachi.co.jp/Sicd/indx.htm
For further information write to:
Hitachi Semiconductor
(America) Inc.
179 East Tasman Drive,
San Jose,CA 95134
Tel: <1> (408) 433-1990
Fax: <1>(408) 433-0223
Hitachi Europe GmbH
Electronic Components Group
Dornacher Straβe 3
D-85622 Feldkirchen, Munich
Germany
Tel: <49> (89) 9 9180-0
Fax: <49> (89) 9 29 30 00
Hitachi Asia Ltd.
Hitachi Tower
16 Collyer Quay #20-00,
Singapore 049318
Tel : <65>-538-6533/538-8577
Fax : <65>-538-6933/538-3877
URL : http://www.hitachi.com.sg
Hitachi Europe Ltd.
Electronic Components Group.
Whitebrook Park
Lower Cookham Road
Maidenhead
Berkshire SL6 8YA, United Kingdom
Tel: <44> (1628) 585000
Fax: <44> (1628) 585160
Hitachi Asia Ltd.
(Taipei Branch Office)
4/F, No. 167, Tun Hwa North Road,
Hung-Kuo Building,
Taipei (105), Taiwan
Tel : <886>-(2)-2718-3666
Fax : <886>-(2)-2718-8180
Telex : 23222 HAS-TP
URL : http://www.hitachi.com.tw
Hitachi Asia (Hong Kong) Ltd.
Group III (Electronic Components)
7/F., North Tower,
World Finance Centre,
Harbour City, Canton Road
Tsim Sha Tsui, Kowloon,
Hong Kong
Tel : <852>-(2)-735-9218
Fax : <852>-(2)-730-0281
URL : http://www.hitachi.com.hk
Copyright  Hitachi, Ltd., 2000. All rights reserved. Printed in Japan.
Colophon 2.0
12