H7N0401LD, H7N0401LS, H7N0401LM Silicon N Channel MOS FET High Speed Power Switching ADE-208-1527C (Z) 4th. Edition May 2002 Features • Low on-resistance RDS(on) = 3.1 mΩ typ. • 4.5 V gate drive devices • High Speed Switching Outline LDPAK 4 4 4 D 1 G 1 S 2 2 1 3 2 3 H7N0401LS H7N0401LM 3 H7N0401LD 1. Gate 2. Drain 3. Source 4. Drain H7N0401LD, H7N0401LS, H7N0401LM Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 40 V Gate to source voltage VGSS ±20 V Drain current ID 95 A 380 A 95 A 70 A 650 mJ 100 W Drain peak current ID (pulse) Body-drain diode reverse drain current IDR Avalanche current IAPNote Avalanche energy 3 Note3 EAR Note2 Note1 Channel dissipation Pch Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Value at Tc = 25°C 3. Value at Tch = 25°C, Rg ≥ 50 Ω Rev.3, May 2002, page 2 of 11 H7N0401LD, H7N0401LS, H7N0401LM Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V(BR)DSS 40 — — V ID = 10 mA, VGS = 0 Zero gate voltage drain current IDSS — — 10 µA VDS = 40 V, VGS = 0 Gate to source leak current IGSS — — ±0.1 µA VGS = ±20 V, VDS = 0 Gate to source cutoff voltage VGS(off) 1.5 — 2.5 V VDS = 10 V, ID = 1 mANote Forward transfer admittance |yfs| 60 100 — S ID = 47.5 A, VDS = 10 VNote Static drain to source on state resistance RDS(on) — 3.1 4.2 mΩ ID = 47.5 A, VGS= 10 VNote Static drain to source on state resistance RDS(on) — 4.8 7.0 mΩ ID = 47.5 A, VGS=4.5 VNote Input capacitance Ciss — 9300 — pF VDS = 10 V Output capacitance Coss — 1300 — pF VGS = 0 Reverse transfer capacitance Crss — 670 — pF f = 1 MHz 1 1 1 1 Total gate charge Qg — 160 — nc VDD = 25 V Gate to source charge Qgs — 36 — nc VGS = 10 V Gate to drain charge Qgd — 40 — nc ID = 95 A Turn-on delay time td(on) — 45 — ns VGS = 10V Rise time tr — 270 — ns ID= 47.5 A Turn-off delay time td(off) — 130 — ns RL = 0.63 Ω Fall time tf — 85 — ns RG = 4.7 Ω Body–drain diode forward voltage VDF — 0.95 — V IF = 95 A, VGS = 0 Body–drain diode reverse recovery time — 50 — ns IF = 95 A, VGS = 0 diF/dt = 100A/µs trr Notes: 1. Pulse test Rev.3, May 2002, page 3 of 11 H7N0401LD, H7N0401LS, H7N0401LM Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area 1000 (A) ID Drain Current 50 100 Case Temperature 150 3 Operation in 1 this area is Tc (°C) Typical Output Characteristics 3 10 30 Drain to Source Voltage VDS 100 (V) Typical Transfer Characteristics 200 200 VGS = 10 V V DS = 10 V Pulse Test Pulse Test 6.0 V (A) 160 limited by RDS(on) Ta = 25°C 0.1 0.1 0.3 1 200 µs t) ho 1s s( ) n 0m tio 5°C era 2 Op (Tc = 10 0.3 0 (A) s 100 µs =1 40 0 1m 30 80 10 DC Channel Dissipation 120 10 300 PW Pch (W) 160 4.5 V 160 ID 120 80 3.5 V 40 Drain Current Drain Current ID 4.0 V 120 80 40 75°C 25°C Tc = –25°C 3V 0 2 4 6 Drain to Source Voltage Rev.3, May 2002, page 4 of 11 8 VDS 10 (V) 0 1 2 3 Gate to Source Voltage 4 VGS 5 (V) H7N0401LD, H7N0401LS, H7N0401LM 0.2 (mΩ) Drain to Source on State Resistance RDS(on) I D = 50 A 0.1 20 A 12 4 8 Gate to Source Voltage 10 A 16 20 VGS (V) Static Drain to Source on State Resistance vs. Temperature 10 Pulse Test 10, 20, 50 A 8 6 4.5 V 4 10, 20, 50 A VGS = 10 V 2 0 –50 0 50 100 Case Temperature 150 Tc (°C) 200 Drain to Source on State Resistance RDS(on) 0.3 Static Drain to Source on State Resistance vs. Drain Current 100 Pulse Test 0.4 0 (mΩ) 0.5 Pulse Test 30 10 VGS = 4.5 V 3 10 V 1 0.3 0.1 1 3 30 100 300 1000 10 Drain Current ID (A) Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) Drain to Source Saturation Voltage VDS(on) (V) Drain to Source Saturation Voltage vs. Gate to Source Voltage 1000 300 Tc = –25°C 100 25°C 30 75°C 10 3 1 V DS = 10 V Pulse Test 1 3 10 30 100 Drain Current ID 300 1000 (A) Rev.3, May 2002, page 5 of 11 H7N0401LD, H7N0401LS, H7N0401LM Body-Drain Diode Reverse Recovery Time 30000 di / dt = 100 A / µs V GS = 0, Ta = 25°C 500 Capacitance C (pF) Reverse Recovery Time trr (ns) 1000 200 100 50 10000 10 3 10 30 Reverse Drain Current Ciss 3000 Coss 1000 Crss 300 20 1 Typical Capacitance vs. Drain to Source Voltage VGS = 0 f = 1 MHz 100 0 100 IDR (A) V DS 12 40 8 20 0 VDS = 40 V 25 V 10 V 40 80 Gate Charge Rev.3, May 2002, page 6 of 11 120 160 Qg (nc) 4 0 200 (V) 1000 40 50 (V) V GS = 10 V, V DD = 30 V PW = 5 µs, duty < 1 % Rg = 4.7 Ω 500 Switching Time t (ns) V DS = 10 V 25 V 40 V 60 16 VGS V GS Gate to Source Voltage VDS (V) Drain to Source Voltage 80 30 Switching Characteristics 20 I D = 95 A 20 Drain to Source Voltage VDS Dynamic Input Characteristics 100 10 200 t d(off) 100 tf 50 t d(on) tr 20 10 0.1 0.3 1 3 Drain Current 10 30 ID (A) 100 H7N0401LD, H7N0401LS, H7N0401LM Reverse Drain Current vs. Source to Drain Voltage Reverse Drain Current IDR (A) 200 160 10 V 120 80 5V V GS = 0, –5 V 40 Pulse Test 0 0.4 0.8 1.2 Source to Drain Voltage 1.6 2.0 VSD Repetitive Avalanche Energy EAR (mJ) Maximum Avalanche Energy vs. Channel Temperature Derating 800 I AP = 65 A V DD = 25 V duty < 0.1 % Rg > 50 W 640 480 320 160 0 25 (V) 50 Avalanche Test Circuit V DS Monitor 75 100 125 150 Channel Temperature Tch (°C) Avalanche Waveform EAR = L 1 2 • L • I AP • 2 I AP Monitor VDSS VDSS – V DD V (BR)DSS I AP Rg D. U. T V DS VDD ID Vin 15 V 50 W 0 VDD Rev.3, May 2002, page 7 of 11 H7N0401LD, H7N0401LS, H7N0401LM Normalized Transient Thermal Impedance gs (t) Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 q ch 0.1 q ch - c(t) = gs (t) • q ch - c - c = 1.25°C/ W, Tc = 25°C 0.05 0.03 PDM D= 1 0.0 PW T PW T 0.01 10 µ 100 µ 1m 10 m 100 m 1 10 Pulse Width PW (S) Switching Time Test Circuit Vout Monitor Vin Monitor Rg Waveform 90% D.U.T. RL Vin Vout Vin 10 V V DS = 30 V 10% 90% td(on) Rev.3, May 2002, page 8 of 11 10% tr 10% 90% td(off) tf H7N0401LD, H7N0401LS, H7N0401LM Package Dimensions As of January, 2002 Unit: mm (1.4) 4.44 ± 0.2 1.27 ± 0.2 0.2 0.86 +– 0.1 0.76 ± 0.1 2.54 ± 0.5 2.54 ± 0.5 11.0 ± 0.5 10.0 1.2 ± 0.2 11.3 ± 0.5 1.3 ± 0.15 + 0.3 – 0.5 8.6 ± 0.3 10.2 ± 0.3 2.59 ± 0.2 0.4 ± 0.1 Hitachi Code JEDEC JEITA Mass (reference value) LDPAK (L) — — 1.4 g Rev.3, May 2002, page 9 of 11 H7N0401LD, H7N0401LS, H7N0401LM As of January, 2002 Unit: mm 7.8 7.0 (1.5) 10.0 + 0.3 – 0.5 8.6 ± 0.3 (1.5) 7.8 6.6 1.3 ± 0.15 1.7 (1.4) 4.44 ± 0.2 10.2 ± 0.3 0.2 0.1 +– 0.1 2.2 1.27 ± 0.2 2.54 ± 0.5 0.2 0.86 +– 0.1 2.54 ± 0.5 0.4 ± 0.1 0.3 3.0 +– 0.5 1.2 ± 0.2 Hitachi Code JEDEC JEITA Mass (reference value) LDPAK (S)-(1) — — 1.3 g As of January, 2002 Unit: mm 7.8 7.0 (2.3) 10.0 + 0.3 – 0.5 8.6 ± 0.3 (1.5) 7.8 6.6 1.3 ± 0.2 1.7 (1.4) 4.44 ± 0.2 10.2 ± 0.3 0.2 0.1 +– 0.1 2.2 1.27 ± 0.2 2.54 ± 0.5 0.2 0.86 +– 0.1 2.54 ± 0.5 0.4 ± 0.1 0.3 5.0 +– 0.5 1.2 ± 0.2 Hitachi Code JEDEC JEITA Mass (reference value) Rev.3, May 2002, page 10 of 11 LDPAK (S)-(2) — — 1.35 g H7N0401LD, H7N0401LS, H7N0401LM Disclaimer 1. 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(Taipei Branch Office) 4/F, No. 167, Tun Hwa North Road Hung-Kuo Building Taipei (105), Taiwan Tel : <886>-(2)-2718-3666 Fax : <886>-(2)-2718-8180 Telex : 23222 HAS-TP URL : http://www.hitachi.com.tw Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon Hong Kong Tel : <852>-2735-9218 Fax : <852>-2730-0281 URL : http://semiconductor.hitachi.com.hk Copyright © Hitachi, Ltd., 2002. All rights reserved. Printed in Japan. Colophon 6.0 Rev.3, May 2002, page 11 of 11