H5N2509P Silicon N Channel MOS FET High Speed Power Switching REJ03G1109-0200 (Previous: ADE-208-1378) Rev.2.00 Sep 07, 2005 Features • • • • • Low on-resistance: R DS (on) = 0.053 Ω typ. Low leakage current: IDSS = 1 µA max (at VDS = 250 V, VGS = 0 V) High speed switching: tf = 110 ns typ (at ID = 15 A, RL = 8.3 Ω, VGS = 10 V) Low gate charge: Qg = 110 nC typ (at VDD = 200 V, VGS = 10 V, ID = 30 A) Avalanche ratings Outline RENESAS Package code: PRSS0004ZE-A (Package name: TO-3P) D 1. Gate 2. Drain (Flange) 3. Source G 1 Rev.2.00 Sep 07, 2005 page 1 of 6 2 3 S H5N2509P Absolute Maximum Ratings (Ta = 25°C) Item Drain to source voltage Symbol VDSS Value 250 Unit V VGSS ID ±30 30 V A 120 30 A A 120 30 A A 150 0.833 W °C/W 150 –55 to +150 °C °C Gate to source voltage Drain current Note 1 Drain peak current Body-drain diode reverse drain current ID (pulse) IDR Body-drain diode reverse drain peak current Avalanche current IDR (pulse) Note 3 IAP Note 1 Note 2 Channel dissipation Channel to case thermal Impedance Pch θ ch-c Channel temperature Storage temperature Tch Tstg Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Value at Tc = 25°C 3. Tch ≤ 150°C Electrical Characteristics (Ta = 25°C) Item Drain to source breakdown voltage Symbol V (BR) DSS Min 250 Typ — Max — Unit V Test Conditions ID = 10 mA, VGS = 0 IGSS IDSS — — — — ±0.1 1 µA µA VGS = ±30 V, VDS = 0 VDS = 250 V, VGS = 0 VGS (off) RDS (on) 3.0 — — 0.053 4.0 0.069 V Ω VDS = 10 V, ID = 1 mA Note 4 ID = 15 A, VGS = 10 V Forward transfer admittance Input capacitance |yfs| Ciss 17 — 28 3600 — — S pF Output capacitance Reverse transfer capacitance Coss Crss — — 450 115 — — pF pF ID = 15 A, VDS = 10 V VDS = 25 V VGS = 0 f = 1 MHz Turn-on delay time Rise time td (on) tr — — 48 120 — — ns ns Turn-off delay time Fall time td (off) tf — — 190 110 — — ns ns Total gate charge Gate to source charge Qg Qgs — — 110 19 — — nC nC Gate to drain charge Body-drain diode forward voltage Qgd VDF — — 53 0.9 — 1.35 nC V IF = 30 A, VGS = 0 trr Qrr — — 210 1.8 — — ns µC IF = 30 A, VGS = 0 diF/dt = 100 A/µs Gate to source leak current Zero gate voltage drain current Gate to source cutoff voltage Static drain to source on state resistance Body-drain diode reverse recovery time Body-drain diode reverse recovery charge Note: 4. Pulse test Rev.2.00 Sep 07, 2005 page 2 of 6 ID = 15 A VGS = 10 V RL = 8.3 Ω Rg = 10 Ω VDD = 200 V VGS = 10 V ID = 30 A Note 4 H5N2509P Main Characteristics Maximum Safe Operation Area 1000 200 ID (A) 300 150 Drain Current Channel Dissipation Pch (W) Power vs. Temperature Derating 100 50 10 100 PW µs 1 10 m 0 =1 s µs 0m O s 10 pe (1s ra ho tio t) n (T 3 c= Operation in 25 °C 1 this area is ) 30 DC limited by RDS(on) 0.3 Ta = 25°C 0.1 0 0 50 100 150 Case Temperature 1 200 Tc (°C) 30 300 1000 VDS (V) 100 10 V VDS = 10 V Pulse Test Pulse Test 80 ID (A) 8V 7V 60 Drain Current 40 5.5 V 20 80 60 6V 5V 40 Tc = 75°C 20 –25°C 25°C VGS = 4.5 V 0 0 0 4 8 12 Drain to Source Voltage 16 20 Pulse Test 4 3 ID = 30 A 15 A 1 5A 0 0 4 8 12 Gate to Source Voltage Rev.2.00 Sep 07, 2005 page 3 of 6 16 20 VGS (V) 2 4 6 8 Gate to Source Voltage 10 VGS (V) Static Drain to Source on State Resistance vs. Drain Current Drain to Source on State Resistance RDS(on) (mΩ) 5 2 0 VDS (V) Drain to Source Saturation Voltage vs. Gate to Source Voltage Drain to Source Saturation Voltage VDS(on) (V) 100 Typical Transfer Characteristics 100 ID (A) 10 Drain to Source Voltage Typical Output Characteristics Drain Current 3 200 Pulse Test 100 VGS = 10 V, 15 V 50 20 10 1 2 5 10 Drain Current 20 50 ID (A) 100 Forward Transfer Admittance vs. Drain Current Static Drain to Source on State Resistance vs. Temperature 200 Forward Transfer Admittance |yfs| (S) Static Drain to Source on State Resistance RDS(on) (mΩ) H5N2509P Pulse Test VGS = 10 V 160 ID = 30 A 120 15 A 80 5A 40 0 –40 0 40 80 120 Case Temperature 160 100 50 Tc = –25°C 20 10 5 25°C 75°C 2 1 0.5 0.2 0.2 50 20 ID (A) VGS = 0 f = 1 MHz 10000 5000 Ciss 2000 1000 500 Coss 200 Crss 1 3 10 30 100 0 20 12 VDS 8 200 100 4 VDD = 200 V 100 V 50 V 40 80 Gate Charge Rev.2.00 Sep 07, 2005 page 4 of 6 120 160 Qg (nC) 80 100 VDS (V) 0 200 10000 Switching Time t (ns) 16 VGS (V) VGS Gate to Source Voltage ID = 30 A VDD = 50 V 100 V 200 V 60 Switching Characteristics 20 500 40 Drain to Source Voltage IDR (A) Dynamic Input Characteristics VDS (V) 50 100 50 0.3 Reverse Drain Current Drain to Source Voltage 10 20 100 10 0.1 0 0 5 20000 100 300 2 50000 di / dt = 100 A / µs VGS = 0, Ta = 25°C 200 400 1 Typical Capacitance vs. Drain to Source Voltage Capacitance C (pF) Reverse Recovery Time trr (ns) 500 0.5 Drain Current Tc (°C) Body-Drain Diode Reverse Recovery Time 1000 VDS = 10 V Pulse Test VGS = 10 V, VDD = 125 V PW = 10 µs, duty ≤ 1 % RG = 10 Ω 1000 td(off) 100 tf td(on) tr 10 0.1 0.3 1 3 Drain Current 10 30 ID (A) 100 H5N2509P Reverse Drain Current IDR (A) 100 Pulse Test 80 VGS = 0 V 60 40 20 5 V 10 V 0 0 0.4 0.8 1.2 1.6 Source to Drain Voltage Gate to Source Cutoff Voltage vs. Case Temperature Gate to Source Cutoff Voltage VGS(off) (V) Reverse Drain Current vs. Source to Drain Voltage 2.0 5 4 ID = 10 mA 3 1 mA 0.1 mA 2 1 VDS = 10 V 0 –50 VSD (V) 0 50 100 150 Case Temperature 200 Tc (°C) Normalized Transient Thermal Impedance γ s (t) Normalized Transient Thermal Impedance vs. Pulse Width 3 1 Tc = 25°C D=1 0.5 0.3 0.2 0.1 θch – c (t) = γ s (t) • θch – c θch – c = 0.833°C/W, Tc = 25°C 0.1 0.05 0.03 PDM 0.02 1 0.0 0.01 10 µ D= PW e uls p ot T h 1s PW T 100 µ 1m 10 m Pulse Width 100 m 1 PW (S) Switching Time Test Circuit Vin Monitor 10 Waveform 90% Vout Monitor D.U.T. Vin 10% RL Vout 10 Ω Vin 10 V VDD = 125 V 10% 90% td(on) Rev.2.00 Sep 07, 2005 page 5 of 6 10% tr 90% td(off) tf H5N2509P Package Dimensions RENESAS Code Package Name MASS[Typ.] SC-65 PRSS0004ZE-A TO-3P / TO-3PV 5.0g 15.6 ± 0.3 Unit: mm 4.8 ± 0.2 1.5 0.3 19.9 ± 0.2 2.0 14.9 ± 0.2 0.5 1.0 φ3.2 ± 0.2 5.0 ± 0.3 JEITA Package Code 1.6 2.0 1.4 Max 18.0 ± 0.5 2.8 1.0 ± 0.2 3.6 0.6 ± 0.2 0.9 1.0 5.45 ± 0.5 5.45 ± 0.5 Ordering Information Part Name Quantity Shipping Container H5N2509P-E 360 pcs Box (Tube) Note: For some grades, production may be terminated. Please contact the Renesas sales office to check the state of production before ordering the product. Rev.2.00 Sep 07, 2005 page 6 of 6 Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corp. product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corp. or a third party. 2. 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