PHILIPS N74F114N

Philips Semiconductors
Product specification
Dual J-K negative edge-triggered flip-flop
with common clock and reset
DESCRIPTION
74F114
PIN CONFIGURATION
The 74F114, Dual Negative edge-triggered JK-Type Flip-Flop with
common clock and reset inputs, features individual J, K, Clock (CP),
Set (SD) and Reset (RD) inputs, true and complementary outputs.
The SD and RD inputs, when Low, set or reset the outputs as shown
in the Function Table regardless of the level at the other inputs.
A High level on the clock (CP) input enables the J and K inputs and
data will be accepted. The logic levels and data will be accepted.
The logic levels at the J and K inputs may be allowed to change
while the CP is High and flip-flop will perform according to the
Function Table as long as minimum setup and hold times are
observed. Output changes are initiated by the High-to-Low transition
of the CP.
TYPE
TYPICAL fMAX
TYPICAL
SUPPLY CURRENT
(TOTAL)
100MHz
15mA
74F114
RD
1
14
VCC
K0
2
13
CP
J0
3
12
K1
SD0
4
11
J1
Q0
5
10
SD1
Q0
6
9
Q1
GND
7
8
Q1
SF00110
ORDERING INFORMATION
DESCRIPTION
COMMERCIAL RANGE
VCC = 5V ±10%,
Tamb = 0°C to +70°C
PKG. DWG. #
14-pin plastic DIP
N74F114N
SOT27-1
14-pin plastic SO
N74F114D
SOT108-1
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS
DESCRIPTION
74F (U.L.) HIGH/LOW
LOAD VALUE HIGH/LOW
J0, J1
J inputs
1.0/1.0
20µA/0.6mA
K0, K1
K inputs
1.0/1.0
20µA/0.6mA
Set inputs (active Low)
1.0/5.0
20µA/3.0mA
RD
Reset input (active Low)
1.0/10.0
20µA/6.0mA
CP
Clock Pulse input (active falling edge)
1.0/8.0
20µA/4.8mA
Data outputs
50/33
1.0mA/20mA
SD0, SD1
Q0, Q0; Q1, Q1
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC SYMBOL
IEC/IEEE SYMBOL
3
11
2
12
1
R
13
J0
13
J1
K0
CP
4
SD0
1
RD0
10
SD1
4
3
2
Q0
Q0
Q1
C1
K1
Q1
10
S
5
1K
1J
6
9
11
12
5
6
9
VCC = Pin 14
GND = Pin 7
SF00112
SF00111
1996 Mar 14
8
8
1
853–0340 16572
Philips Semiconductors
Product specification
Dual J-K negative edge-triggered flip-flop
with common clock and reset
74F114
LOGIC DIAGRAM
Q
Q
SD
RD
K
J
CP
TO OTHER
FLIP-FLOP
SF00113
FUNCTION TABLE
INPUTS
OUTPUTS
OPERATING MODE
SD
RD
CP
J
K
Q
Q
L
H
X
X
X
H
L
Asynchronous Set
H
L
X
X
X
L
H
Asynchronous Reset
L
L
X
X
X
H*
H*
Undetermined *
H
H
↓
h
l
q
q
Toggle
H
H
↓
l
h
L
H
Load “0” (Reset)
H
H
↓
h
l
H
L
Load “1” (Set)
H
H
↓
l
l
q
q
Hold “no change”
H = High voltage level
h = High voltage level one setup time prior to High-to-Low clock transition
L = Low voltage level
l = Low voltage level one setup time prior to High-to-Low clock transition
q = Lower case letters indicate the state of the reference output prior to the High-to-Low clock transition
X = Don’t care
↓ = High-to-Low clock transition
Asynchronous inputs: Low input to SD sets Q to High level, Low input to RD sets Q to Low level
Set and Reset are independent of clock
Simultaneous Low on both SD and RD makes both Q and Q High.
* = Both outputs will be High while both SD and RD are Low, but the output states are unpredictable if SD and RD go High simultaneously.
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
PARAMETER
SYMBOL
RATING
UNIT
VCC
Supply voltage
–0.5 to +7.0
V
VIN
Input voltage
–0.5 to +7.0
V
IIN
Input current
–30 to +5
mA
VOUT
Voltage applied to output in High output state
–0.5 to VCC
V
IOUT
Current applied to output in Low output state
40
mA
Tamb
Operating free-air temperature range
0 to +70
°C
Tstg
Storage temperature range
–65 to +150
°C
1996 Mar 14
2
Philips Semiconductors
Product specification
Dual J-K negative edge-triggered flip-flop
with common clock and reset
74F114
RECOMMENDED OPERATING CONDITIONS
LIMITS
SYMBOL
PARAMETER
UNIT
MIN
NOM
MAX
5.0
5.5
VCC
Supply voltage
4.5
V
VIH
High-level input voltage
2.0
VIL
Low-level input voltage
0.8
V
IIK
Input clamp current
–18
mA
IOH
High-level output current
–1
mA
IOL
Low-level output current
20
mA
Tamb
Operating free-air temperature range
+70
°C
V
0
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
TEST CONDITIONS1
PARAMETER
LIMITS
MIN
TYP2
±10%VCC
2.5
VIH = MIN, IOH = MAX
±5%VCC
2.7
VCC = MIN, VIL = MAX
±10%VCC
0.35
0.50
VIH = MIN, IOL = MAX
±5%VCC
0.35
0.50
–0.73
–1.2
V
VCC = MAX, VI = 7.0V
100
µA
VCC = MAX, VI = 2.7V
20
µA
–0.6
mA
–4.8
mA
–3.0
mA
–6.0
mA
–150
mA
21
mA
High-level output voltage
VOL
Low-level output voltage
VIK
Input clamp voltage
VCC = MIN, II = IIK
II
Input current at maximum input voltage
IIH
High-level input current
V
3.4
V
Jn, Kn
CP
L
Low-level
l
l input
i
current
SDn
VCC = MAX,
MAX VI = 0
0.5V
5V
RD
current3
IOS
Short-circuit output
ICC
Supply current (total)4
UNIT
VCC = MIN, VIL = MAX
VOH
IIL
MAX
VCC = MAX
VCC = MAX
–60
15
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Measure ICC with the clock input grounded and all outputs open, with the Q and Q outputs High in turn.
1996 Mar 14
3
Philips Semiconductors
Product specification
Dual J-K negative edge-triggered flip-flop
with common clock and reset
74F114
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
TEST
CONDITION
PARAMETER
MIN
TYP
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
MAX
MIN
UNIT
MAX
fMAX
Maximum clock frequency
Waveform 1
85
100
80
MHz
tPLH
tPHL
Propagation delay
CP to Qn or Qn
Waveform 1
2.0
2.0
5.0
5.5
6.5
7.5
2.0
2.0
7.5
8.5
ns
tPLH
tPHL
Propagation delay
SDn, RD to Qn or Qn
Waveform 2,3
2.0
2.0
4.5
4.5
6.5
6.5
2.0
2.0
7.5
7.5
ns
TEST
CONDITION
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
AC SETUP REQUIREMENTS
LIMITS
SYMBOL
PARAMETER
MIN
TYP
MAX
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
MIN
UNIT
MAX
tS(H)
tS(L)
Setup time, High or Low
Jn, Kn to CP
Waveform 1
4.0
3.5
5.0
4.0
ns
th(H)
th(L)
Hold time, High or Low
Jn, Kn to CP
Waveform 1
0.0
0.0
0.0
0.0
ns
tW(H)
tW(L)
CP Pulse width
High or Low
Waveform 1
4.5
4.5
5.0
5.0
ns
tW(L)
SDn, RD Pulse width
Low
Waveform 2,3
4.5
5.0
ns
tREC
Recovery time
SDn, RD to CP
Waveform 2,3
4.5
5.0
ns
AC WAVEFORMS
For all waveforms, VM = 1.5V.
The shaded areas indicate when the input is permitted to change for predictable output performance.
Kn
Jn, Kn
VM
ts(L)
Jn
Jn
VM
VM
ts(H)
th(L)
Kn
VM
th(H)
fmax
CP
VM
tw(L)
VM
tw(H)
tPHL
Qn
tPLH
VM
VM
tPHL
tPLH
Qn
VM
VM
VM
SF00114
Waveform 1. Propagation Delay for Data to Output, Data Setup Time and Hold Times, and Clock Pulse Width
1996 Mar 14
4
Philips Semiconductors
Product specification
Dual J-K negative edge-triggered flip-flop
with common clock and reset
74F114
Jn, Kn
SDn
VM
tw(L)
VM
tREC
CP
VM
tPLH
Qn
VM
tPHL
VM
Qn
SF00115
Waveform 2. Propagation Delay for Set to Output, Set Pulse Width, and Recovery Time for Set to Clock
Jn, Kn
RD
VM
tw(L)
VM
tREC
CP
VM
tPHL
Qn
VM
tPLH
Qn
VM
SF00116
Waveform 3. Propagation Delay for Reset to Output, Reset Pulse Width, and Recovery Time for Reset to Clock
1996 Mar 14
5
Philips Semiconductors
Product specification
Dual J-K negative edge-triggered flip-flop
with common clock and reset
74F114
TEST CIRCUIT AND WAVEFORMS
VCC
VIN
tw
90%
NEGATIVE
PULSE
10%
D.U.T.
RT
CL
RL
AMP (V)
VM
VM
VOUT
PULSE
GENERATOR
90%
10%
tTHL (tf )
tTLH (tr )
tTLH (tr )
tTHL (tf )
0V
AMP (V)
90%
POSITIVE
PULSE
VM
VM
10%
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
RL = Load resistor;
see AC ELECTRICAL CHARACTERISTICS for value.
CL = Load capacitance includes jig and probe capacitance;
see AC ELECTRICAL CHARACTERISTICS for value.
RT = Termination resistance should be equal to ZOUT of
pulse generators.
90%
10%
tw
0V
Input Pulse Definition
INPUT PULSE REQUIREMENTS
family
amplitude VM
74F
3.0V
1.5V
rep. rate
tw
tTLH
tTHL
1MHz
500ns
2.5ns
2.5ns
SF00006
1996 Mar 14
6