NEC 2SK3575-ZK

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
2SK3575
SWITCHING
N-CHANNEL POWER MOS FET
★ ORDERING INFORMATION
DESCRIPTION
The 2SK3575 is N-channel MOS FET device that
PART NUMBER
features a low on-state resistance and excellent switching
characteristics, designed for low voltage high current
applications such as DC/DC converter with synchronous
rectifier.
FEATURES
PACKAGE
2SK3575
TO-220AB
2SK3575-S
TO-262
2SK3575-ZK
TO-263
2SK3575-Z
TO-220SMDNote
Note TO-220SMD package is produced only in Japan.
•4.5V drive available
•Low on-state resistance
RDS(on)1 = 4.5 mΩ MAX. (VGS = 10 V, ID = 42 A)
•Low gate charge
QG = 70 nC TYP. (VDD = 24 V, VGS = 10 V, ID = 83 A)
•Avalanche capability ratings
•Surface mount device available
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V)
VDSS
30
V
Gate to Source Voltage (VDS = 0 V)
VGSS
±20
V
Drain Current (DC) (TC = 25°C)
ID(DC)
±83
A
ID(pulse)
±332
A
Total Power Dissipation (TA = 25°C)
PT1
1.5
W
Total Power Dissipation (TC = 25°C)
PT2
105
W
Drain Current (pulse)
Note1
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
–55 to +150
°C
Note2
IAS
57
A
Note2
EAS
325
mJ
Single Avalanche Current
Single Avalanche Energy
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1%
2. Starting Tch = 25°C, VDD = 15 V, RG = 25 Ω, VGS = 20 → 0 V
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. D16261EJ2V0DS00 (2nd edition)
Date Published September 2002 NS CP(K)
Printed in Japan
The mark ! shows major revised points.
©
2002
2SK3575
ELECTRICAL CHARACTERISTICS (TA = 25°°C)
CHARACTERISTICS
SYMBOL
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = 30 V, VGS = 0 V
10
µA
Gate Leakage Current
IGSS
VGS = ±20 V, VDS = 0 V
±100
nA
VGS(off)
VDS = 10 V, ID = 1 mA
1.5
2.5
V
| yfs |
VDS = 10 V, ID = 42 A
27
RDS(on)1
VGS = 10 V, ID = 42 A
3.3
4.5
mΩ
RDS(on)2
VGS = 4.5 V, ID = 42 A
4.3
6.4
mΩ
Gate Cut-off Voltage
Forward Transfer Admittance
Drain to Source On-state Resistance
S
Input Capacitance
Ciss
VDS = 10 V
3700
pF
Output Capacitance
Coss
VGS = 0 V
1430
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
500
pF
Turn-on Delay Time
td(on)
VDD = 15 V, ID = 42 A
26
ns
tr
VGS = 10 V
27
ns
td(off)
RG = 10 Ω
110
ns
40
ns
Rise Time
Turn-off Delay Time
Fall Time
tf
Total Gate Charge
QG
VDD = 24 V
70
nC
Gate to Source Charge
QGS
VGS = 10 V
12
nC
Gate to Drain Charge
QGD
ID = 83 A
20
nC
VF(S-D)
IF = 83 A, VGS = 0 V
1.0
V
Reverse Recovery Time
trr
IF = 83 A, VGS = 0 V
61
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/µs
94
nC
Body Diode Forward Voltage
★
TEST CONDITIONS
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
PG.
VGS = 20 → 0 V
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
L
50 Ω
VGS
RL
Wave Form
RG
PG.
VDD
VGS
0
VGS
10%
90%
VDD
VDS
90%
BVDSS
IAS
VDS
VDS
ID
Starting Tch
τ
τ = 1 µs
Duty Cycle ≤ 1%
TEST CIRCUIT 3 GATE CHARGE
PG.
2
50 Ω
10%
0
10%
Wave Form
VDD
D.U.T.
IG = 2 mA
90%
VDS
VGS
0
RL
VDD
Data Sheet D16261EJ2V0DS
td(on)
tr
ton
td(off)
tf
toff
2SK3575
TYPICAL CHARACTERISTICS (TA = 25°°C)
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
120
120
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
100
80
60
40
20
0
0
0
25
50
75
100
125
150
175
0
25
TC - Case Temperature - °C
50
75
100
125
150
175
TC - Case Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
1000
PW =
10 µs
100
100 µs
I D (D C )
10
1 ms
Power Dissipation
Lim ited
10 m s
DC
1
T C = 25°C
Single pulse
0.1
0.1
1
10
100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
rth(t) - Transient Thermal Resistance - °C/W
ID - Drain Current - A
ID (pulse)
R DS(on)
Lim ited
Rth(ch-A) = 83.3°C/W
10
Rth(ch-C) = 1.19°C/W
1
0.1
Single pulse
0.01
10 µ
100 µ
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
Data Sheet D16261EJ2V0DS
3
2SK3575
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
350
1000
Pulsed
ID - Drain Current - A
ID - Drain Current - A
300
250
V GS = 10 V
200
4.5 V
150
100
100
T ch = 150°C
75°C
25°C
−55°C
10
1
0.1
50
V DS = 10 V
Pulsed
0.01
0
0
0.5
1
1.5
0
2
1
VGS(off) - Gate Cut-off Voltage - V
V DS = 10 V
ID = 1 mA
2.5
2
1.5
1
0.5
0
0
50
100
T ch = −55°C
25°C
75°C
150°C
10
1
V DS = 10 V
Pulsed
0.1
150
0.1
1
Pulsed
8
6
V GS = 4.5 V
4
10 V
2
0
1000
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
10
100
100
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
10
ID - Drain Current - A
4
10
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
10
5
100
Tch - Channel Temperature - °C
1
4
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
| yfs | - Forward Transfer Admittance - S
GATE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
-50
3
VGS - Gate to Source Voltage - V
VDS - Drain to Source Voltage - V
3
2
Pulsed
8
6
4
ID = 42 A
2
0
0
2
4
6
8
10
12
14
16
VGS - Gate to Source Voltage - V
Data Sheet D16261EJ2V0DS
18
20
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
8
1000 0
ID = 42 A
Pulsed
6
Ciss, Coss, Crss - Capacitance - pF
VGS = 4.5 V
4
10 V
2
C iss
1000
C o ss
C rss
100
VGS = 0 V
f = 1 MHz
0
10
-50
0
50
100
150
0.1
Tch - Channel Temperature - °C
10
100
VDS - Drain to Source Voltage - V
SWITCHING CHARACTERISTICS
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
1000
30
V D D = 10 V
V G S = 10 V
R G = 10 Ω
VDS - Drain to Source Voltage - V
td(on), tr, td(off), tf - Switching Time - ns
1
t d (o ff)
100
tf
t d (o n)
tr
10
12
25
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-state Resistance - mΩ
2SK3575
10
V DD = 24 V
15 V
20
8
VGS
15
6
10
4
5
2
V DS
I D = 83 A
1
0
0.1
1
10
100
0
0
20
ID - Drain Current - A
60
80
QG - Gate Change - nC
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1000
trr - Reverse Recovery Time- ns
1000
IF - Diode Forward Current - A
40
100
V G S = 10 V
0V
10
1
0.1
di/dt = 100 A/µs
VGS = 0 V
100
10
pulsed
0.01
1
0
0.2
0.4
0.6
0.8
1
1.2
1.4
VF(S-D) - Source to Drain Voltage - V
0.1
1
10
100
ID - Drain Current - A
Data Sheet D16261EJ2V0DS
5
2SK3575
SINGLE AVALANCHE CURRENT vs.
INDUCTIVE LOAD
SINGLE AVALANCHE ENERGY
DERATING FACTOR
120
100
Energy Derating Factor - %
IAS - Single Avalanche Current - A
1000
I A S = 57 A
E A S = 325 m J
10
V D D = 15 V
R G =25 Ω
V G S = 20→ 0 V
Starting T ch = 25°C
1
0.01
100
80
60
40
20
0
0.1
1
10
L - Inductive Load - mH
6
V DD = 15 V
R G = 25 Ω
V GS = 20→ 0 V
IAS ≤ 57 A
25
50
75
100
125
150
Starting Tch - Starting Channel Temperature - °C
Data Sheet D16261EJ2V0DS
2SK3575
PACKAGE DRAWINGS (Unit: mm)
TO-220AB(MP-25)
2)
TO-262(MP-25 Fin Cut)
φ 3.6±0.2
1.0±0.5
4.8 MAX.
10.6 MAX.
10 TYP.
1.3±0.2
4
1.3±0.2
2.54 TYP.
2.8±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
2.54 TYP.
1.Gate
2.Drain
3.Source
4.Fin (Drain)
4)
TO-263(MP-25ZK)
4
1.4±0.2
0.5±
0.2
0.7±0.15
0 to
2.54
0.75±0.3
2.54 TYP.
2
8.5±0.2
1
3
P.
TY P.
R
Y
0.5 R T
.8
0
2.54 TYP.
8o
0.25
2
3
2.8±0.2
1
1.Gate
2.Drain
3.0±0.5
0.025 to
0.25
1.1±0.4
9.15±0.2
1.3±0.2
1.3±0.2
1.0±0.5
8.4 TYP.
4
2.45±0.25
0.4
8.0 TYP.
No plating
4.8 MAX.
4.45±0.2
15.25±0.5
10.0±0.2
Note
TO-220SMD(MP-25Z)
10 TYP.
1.35±0.3
3)
2.8±0.2
0.5±0.2
0.75±0.3
2.54 TYP.
0.5±0.2
0.75±0.1
2.54 TYP.
3
1.3±0.2
12.7 MIN.
6.0 MAX.
1 2 3
2
1.3±0.2
8.5±0.2
4
1
4.8 MAX.
12.7 MIN.
5.9 MIN.
10.0 TYP.
15.5 MAX.
1)
3.0±0.3
0.5±0.2
1.Gate
2.Drain
3.Source
4.Fin (Drain)
3.Source
2.5
★
4.Fin (Drain)
Note This package is produced only in Japan.
EQUIVALENT CIRCUIT
Drain
Remark Strong electric field, when exposed to this device, can
cause destruction of the gate oxide and ultimately
Body
Diode
Gate
degrade the device operation. Steps must be taken to
stop generation of static electricity as much as possible,
and quickly dissipate it once, when it has occurred.
Source
Data Sheet D16261EJ2V0DS
7
2SK3575
• The information in this document is current as of September, 2002. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
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third parties by or arising from the use of NEC semiconductor products listed in this document or any other
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• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
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parties arising from the use of these circuits, software and information.
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
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redundancy, fire-containment, and anti-failure features.
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(Note)
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(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
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M8E 00. 4