100364 Low Power 16-Input Multiplexer General Description The 100364 is a 16-input multiplexer. Data paths are controlled by four Select lines (S0–S3). Their decoding is shown in the truth table. Output data polarity is the same as the seleted input data. All inputs have 50 kΩ pulldown resistors. n n n n n 2000V ESD protection Pin/function compatible with 100164 Voltage compensated operating range = −4.2V to −5.7V Available to industrial grade temperature range Standard Microcircuit Drawing (SMD) 5962-9459201 Features n 35% power reduction of the 100164 Logic Symbol Pin Names Description I0–I15 Data Inputs S0–S3 Select Inputs Z Data Output DS100301-1 Connection Diagrams 24-Pin DIP 24-Pin Quad Cerpak DS100301-3 DS100301-2 © 1998 National Semiconductor Corporation DS100301 www.national.com 100364 Low Power 16-Input Multiplexer August 1998 Logic Diagram DS100301-5 www.national.com 2 Truth Table Select Inputs Output S0 S1 S2 S3 Z L L L L I0 H L L L I1 L H L L I2 H H L L I3 L L H L I4 H L H L I5 L H H L I6 H H H L I7 L L L H I8 H L L H I9 L H L H I10 H H L H I11 L L H H I12 H L H H I13 L H H H I14 H H H H I15 H = HIGH Voltage Level L = LOW Voltage Level 3 www.national.com Absolute Maximum Ratings (Note 1) Output Current (DC Output HIGH) ESD (Note 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. −50 mA ≥ 2000V Recommended Operating Conditions Above which the useful life may be impaired −65˚C to +150˚C Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic +175˚C Pin Potential to −7.0V to +0.5V Ground Pin (VEE) Input Voltage (DC) VEE to +0.5V Case Temperature (TC) Military Supply Voltage (VEE) −55˚C to +125˚C −5.7V to −4.2V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C Symbol VOH VOL Parameter Output HIGH Voltage Output LOW Voltage Min Max Units TC −1025 −870 mV 0˚C to Conditions VIN = VIH (Max) Loading with +125˚C or VIL (Min) 50Ω to −2.0V −1085 −870 mV −1830 −1620 mV Notes (Notes 3, 4, 5) −55˚C 0˚C to +125˚C −1830 VOHC Output HIGH Voltage −1555 −1035 −1085 VOLC Output LOW Voltage mV −55˚C mV 0˚C to VIN = VIH (Min) Loading with +125˚C or VIL (Max) 50Ω to −2.0V mV −55˚C −1610 mV 0˚C to −1555 mV −55˚C −870 mV −55˚C to (Notes 3, 4, 5) +125˚C VIH Input HIGH Voltage −1165 +125˚C VIL Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C IIL Input LOW Current 0.50 µA −55˚C to IEE Input HIGH Current Power Supply Current 300 −95 µA for All Inputs Guaranteed LOW Signal for All Inputs VEE = −4.2V 0˚C to VIN = VIL (Min) VEE = −5.7V +125˚C VIN = VIH (Max) +125˚C IIH Guaranteed HIGH Signal 450 µA −55˚C −35 mA −55˚C to Inputs Open +125˚C (Notes 3, 4, 5, 6) (Notes 3, 4, 5, 6) (Notes 3, 4, 5) (Notes 3, 4, 5) (Notes 3, 4, 5) Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups, 1, 2, 3, 7 and 8. Note 5: Sampled tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7 and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL. www.national.com 4 AC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND Symbol Parameter tPLH Propagation Delay tPHL I0–I15 to Output tPLH Propagation Delay tPHL S0, S1 to Output tPLH Propagation Delay tPHL S2, S3 to Output tTLH Transition Time tTHL 20% to 80%, 80% to 20% TC = −55˚C TC = 25˚C TC = +125˚C Units Conditions Notes 2.80 ns Figures 1, 2 (Notes 7, 8, 9) 1.00 3.50 ns 2.60 0.60 3.00 ns 1.20 0.20 1.20 Min Max Min Max Min Max 0.50 2.60 0.60 2.40 0.60 0.70 3.30 0.90 3.10 0.50 2.90 0.70 0.20 1.20 0.20 (Note 10) ns Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25˚C, temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each Mfg. lot at +25˚C, Subgroup A9, and at +125˚C, and −55˚C temp., Subgroups A10 and A11. Note 10: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data). Test Circuit DS100301-6 FIGURE 1. AC Test Circuit 5 www.national.com Switching Waveforms DS100301-7 Note 11: VCC, VCCA = +2V, VEE = −2.5V Note 12: L1 and L2 = Equal length 50Ω impedance lines Note 13: RT = 50Ω terminator internal to scope Note 14: Decoupling 0.1 µF from GND to VCC and VEE Note 15: All unused outputs are loaded with 50Ω to GND Note 16: CL = Fixture and stray capacitance ≤ 3 pF Note 17: Pin numbers shown are for flatpak; for DIP see logic symbol FIGURE 2. Propagation Delay and Transition Times www.national.com 6 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Ceramic Dual-In-Line Package (0.400" Wide) (D) NS Package Number J24E 24-Lead Quad Cerpak (F) NS Package Number W24B 7 www.national.com 100364 Low Power 16-Input Multiplexer LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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