MOTOROLA MRF151G

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by MRF151G/D
SEMICONDUCTOR TECHNICAL DATA
The RF MOSFET Line
N–Channel Enhancement–Mode MOSFET
Designed for broadband commercial and military applications at frequencies
to 175 MHz. The high power, high gain and broadband performance of this
device makes possible solid state transmitters for FM broadcast or TV channel
frequency bands.
• Guaranteed Performance at 175 MHz, 50 V:
Output Power — 300 W
Gain — 14 dB (16 dB Typ)
Efficiency — 50%
300 W, 50 V, 175 MHz
N–CHANNEL
BROADBAND
RF POWER MOSFET
• Low Thermal Resistance — 0.35°C/W
• Ruggedness Tested at Rated Output Power
• Nitride Passivated Die for Enhanced Reliability
D
G
S
(FLANGE)
G
CASE 375–04, STYLE 2
D
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Drain–Source Voltage
VDSS
125
Vdc
Drain–Gate Voltage
VDGO
125
Vdc
VGS
± 40
Vdc
Drain Current — Continuous
ID
40
Adc
Total Device Dissipation @ TC = 25°C
Derate above 25°C
PD
500
2.85
Watts
W/°C
Storage Temperature Range
Tstg
– 65 to +150
°C
TJ
200
°C
Symbol
Max
Unit
RθJC
0.35
°C/W
Gate–Source Voltage
Operating Junction Temperature
THERMAL CHARACTERISTICS
Characteristic
Thermal Resistance, Junction to Case
NOTE — CAUTION — MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
REV 8
RF DEVICE DATA
MOTOROLA
Motorola, Inc. 1997
MRF151G
1
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted.)
Characteristic
Symbol
Min
Typ
Max
Unit
V(BR)DSS
125
—
—
Vdc
Zero Gate Voltage Drain Current (VDS = 50 V, VGS = 0)
IDSS
—
—
5.0
mAdc
Gate–Body Leakage Current (VGS = 20 V, VDS = 0)
IGSS
—
—
1.0
µAdc
Gate Threshold Voltage (VDS = 10 V, ID = 100 mA)
VGS(th)
1.0
3.0
5.0
Vdc
Drain–Source On–Voltage (VGS = 10 V, ID = 10 A)
VDS(on)
1.0
3.0
5.0
Vdc
gfs
5.0
7.0
—
mhos
Input Capacitance (VDS = 50 V, VGS = 0, f = 1.0 MHz)
Ciss
—
350
—
pF
Output Capacitance (VDS = 50 V, VGS = 0, f = 1.0 MHz)
Coss
—
220
—
pF
Reverse Transfer Capacitance (VDS = 50 V, VGS = 0, f = 1.0 MHz)
Crss
—
15
—
pF
Common Source Amplifier Power Gain
(VDD = 50 V, Pout = 300 W, IDQ = 500 mA, f = 175 MHz)
Gps
14
16
—
dB
Drain Efficiency
(VDD = 50 V, Pout = 300 W, f = 175 MHz, ID (Max) = 11 A)
η
50
55
—
%
Load Mismatch
(VDD = 50 V, Pout = 300 W, IDQ = 500 mA,
VSWR 5:1 at all Phase Angles)
ψ
OFF CHARACTERISTICS (Each Side)
Drain–Source Breakdown Voltage (VGS = 0, ID = 100 mA)
ON CHARACTERISTICS (Each Side)
Forward Transconductance (VDS = 10 V, ID = 5.0 A)
DYNAMIC CHARACTERISTICS (Each Side)
FUNCTIONAL TESTS
No Degradation in Output Power
R1
L2
+
C4
BIAS 0 – 6 V
C5
C9
+
C10
C11
–
50 V
–
L1
D.U.T.
R2
C1
INPUT
T2
OUTPUT
C12
T1
C6
C2
C3
C7
R1 — 100 Ohms, 1/2 W
R2 — 1.0 kOhm, 1/2 W
C1 — Arco 424
C2 — Arco 404
C3, C4, C7, C8, C9 — 1000 pF Chip
C5, C10 — 0.1 µF Chip
C6 — 330 pF Chip
C11 — 0.47 µF Ceramic Chip, Kemet 1215 or
C11 — Equivalent (100 V)
C12 — Arco 422
L1 — 10 Turns AWG #18 Enameled Wire,
L1 — Close Wound, 1/4″ I.D.
L2 — Ferrite Beads of Suitable Material for
L2 — 1.5 – 2.0 µH Total Inductance
C8
T1 — 9:1 RF Transformer. Can be made of 15 – 18 Ohms
T1 — Semirigid Co–Ax, 62 – 90 Mils O.D.
T2 — 1:4 RF Transformer. Can be made of 16 – 18 Ohms
T2 — Semirigid Co–Ax, 70–90 Mils O.D.
Board Material — 0.062″ Fiberglass (G10),
1 oz. Copper Clad, 2 Sides, εr = 5.0
NOTE: For stability, the input transformer T1 must be loaded
NOTE: with ferrite toroids or beads to increase the common
NOTE: mode inductance. For operation below 100 MHz. The
NOTE: same is required for the output transformer.
Unless Otherwise Noted, All Chip Capacitors are ATC Type 100 or
Equivalent.
See Figure 6 for construction details of T1 and T2.
Figure 1. 175 MHz Test Circuit
MRF151G
2
MOTOROLA RF DEVICE DATA
TYPICAL CHARACTERISTICS
2000
500
Ciss
200
Coss
100
1000
50
Crss
20
0
VDS = 30 V
f T, UNITY GAIN FREQUENCY (MHz)
C, CAPACITANCE (pF)
1000
0
10
20
30
40
VDS, DRAIN–SOURCE VOLTAGE (VOLTS)
0
50
Figure 2. Capacitance versus
Drain–Source Voltage*
15 V
0
2
4
8
12
6
10
14
ID, DRAIN CURRENT (AMPS)
16
18
20
Figure 3. Common Source Unity Gain Frequency
versus Drain Current*
1.04
1.03
1.02
1.01
1
0.99
0.98
0.97
0.96
0.95
0.94
0.93
0.92
0.91
0.9
– 25
100
ID = 5 A
I D, DRAIN CURRENT (AMPS)
VGS , DRAIN-SOURCE VOLTAGE (NORMALIZED)
*Data shown applies to each half of MRF151G.
4A
2A
1A
TC = 25°C
10
250 mA
0
100 mA
25
50
75
TC, CASE TEMPERATURE (°C)
100
1
2
20
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 4. Gate–Source Voltage versus
Case Temperature*
HIGH IMPEDANCE
WINDINGS
CENTER
TAP
200
Figure 5. DC Safe Operating Area
9:1
IMPEDANCE
RATIO
CENTER
TAP
4:1
IMPEDANCE
RATIO
CONNECTIONS
TO LOW IMPEDANCE
WINDINGS
Figure 6. RF Transformer
MOTOROLA RF DEVICE DATA
MRF151G
3
TYPICAL CHARACTERISTICS
350
300
200 MHz
25
GPS, POWER GAIN (dB)
Pout , OUTPUT POWER (WATTS)
30
175 MHz
f = 150 MHz
250
200
150
VDD = 50 V
IDQ = 2 x 250 mA
100
20
15
VDD = 50 V
IDQ = 2 x 250 mA
Pout = 150 W
10
50
0
0
5
Pin, INPUT POWER (WATTS)
5
10
2
Figure 7. Output Power versus Input Power
5
10
30
f, FREQUENCY (MHz)
100
200
Figure 8. Power Gain versus Frequency
f = 175 MHz
150
125
100
INPUT, Zin
(GATE TO GATE)
Zo = 10 Ω
30
125 150
f = 175 MHz
100
30
OUTPUT, ZOL*
(DRAIN TO DRAIN)
ZOL* = Conjugate of the optimum load impedance
ZOL* = into which the device output operates at a
ZOL* = given output power, voltage and frequency.
Figure 9. Input and Output Impedance
MRF151G
4
MOTOROLA RF DEVICE DATA
RF POWER MOSFET CONSIDERATIONS
MOSFET CAPACITANCES
The physical structure of a MOSFET results in capacitors
between the terminals. The metal anode gate structure determines the capacitors from gate–to–drain (Cgd), and gate–
to–source (C gs ). The PN junction formed during the
fabrication of the RF MOSFET results in a junction capacitance from drain–to–source (Cds).
These capacitances are characterized as input (Ciss), output (Coss) and reverse transfer (Crss) capacitances on data
sheets. The relationships between the inter–terminal capacitances and those given on data sheets are shown below. The
Ciss can be specified in two ways:
1. Drain shorted to source and positive voltage at the gate.
2. Positive voltage of the drain in respect to source and zero
volts at the gate. In the latter case the numbers are lower.
However, neither method represents the actual operating conditions in RF applications.
DRAIN
Cgd
GATE
Cds
Cgs
Ciss = Cgd = Cgs
Coss = Cgd = Cds
Crss = Cgd
SOURCE
LINEARITY AND GAIN CHARACTERISTICS
In addition to the typical IMD and power gain data presented, Figure 3 may give the designer additional information
on the capabilities of this device. The graph represents the
small signal unity current gain frequency at a given drain current level. This is equivalent to fT for bipolar transistors.
Since this test is performed at a fast sweep speed, heating of
the device does not occur. Thus, in normal use, the higher
temperatures may degrade these characteristics to some extent.
DRAIN CHARACTERISTICS
One figure of merit for a FET is its static resistance in the
full–on condition. This on–resistance, VDS(on), occurs in the
linear region of the output characteristic and is specified under specific test conditions for gate–source voltage and drain
current. For MOSFETs, VDS(on) has a positive temperature
coefficient and constitutes an important design consideration
at high temperatures, because it contributes to the power
dissipation within the device.
GATE CHARACTERISTICS
The gate of the MOSFET is a polysilicon material, and is
electrically isolated from the source by a layer of oxide. The
input resistance is very high — on the order of 109 ohms —
resulting in a leakage current of a few nanoamperes.
Gate control is achieved by applying a positive voltage
slightly in excess of the gate–to–source threshold voltage,
VGS(th).
Gate Voltage Rating — Never exceed the gate voltage
rating. Exceeding the rated VGS can result in permanent
damage to the oxide layer in the gate region.
Gate Termination — The gates of these devices are essentially capacitors. Circuits that leave the gate open–cirMOTOROLA RF DEVICE DATA
cuited or floating should be avoided. These conditions can
result in turn–on of the devices due to voltage build–up on
the input capacitor due to leakage currents or pickup.
Gate Protection — These devices do not have an internal
monolithic zener diode from gate–to–source. If gate protection is required, an external zener diode is recommended.
Using a resistor to keep the gate–to–source impedance
low also helps damp transients and serves another important
function. Voltage transients on the drain can be coupled to
the gate through the parasitic gate–drain capacitance. If the
gate–to–source impedance and the rate of voltage change
on the drain are both high, then the signal coupled to the gate
may be large enough to exceed the gate–threshold voltage
and turn the device on.
HANDLING CONSIDERATIONS
When shipping, the devices should be transported only in
antistatic bags or conductive foam. Upon removal from the
packaging, careful handling procedures should be adhered
to. Those handling the devices should wear grounding straps
and devices not in the antistatic packaging should be kept in
metal tote bins. MOSFETs should be handled by the case
and not by the leads, and when testing the device, all leads
should make good electrical contact before voltage is applied. As a final note, when placing the FET into the system it
is designed for, soldering should be done with a grounded
iron.
DESIGN CONSIDERATIONS
The MRF151G is an RF Power, MOS, N–channel enhancement mode field–effect transistor (FET) designed for
HF and VHF power amplifier applications.
Motorola Application Note AN211A, FETs in Theory and
Practice, is suggested reading for those not familiar with the
construction and characteristics of FETs.
The major advantages of RF power MOSFETs include
high gain, low noise, simple bias systems, relative immunity
from thermal runaway, and the ability to withstand severely
mismatched loads without suffering damage. Power output
can be varied over a wide range with a low power dc control
signal.
DC BIAS
The MRF151G is an enhancement mode FET and, therefore, does not conduct when drain voltage is applied. Drain
current flows when a positive voltage is applied to the gate.
RF power FETs require forward bias for optimum performance. The value of quiescent drain current (IDQ) is not critical for many applications. The MRF151G was characterized
at IDQ = 250 mA, each side, which is the suggested minimum
value of IDQ. For special applications such as linear amplification, IDQ may have to be selected to optimize the critical
parameters.
The gate is a dc open circuit and draws no current. Therefore, the gate bias circuit may be just a simple resistive divider network. Some applications may require a more elaborate
bias sytem.
GAIN CONTROL
Power output of the MRF151G may be controlled from its
rated value down to zero (negative gain) by varying the dc
gate voltage. This feature facilitates the design of manual
gain control, AGC/ALC and modulation systems.
MRF151G
5
PACKAGE DIMENSIONS
U
G
Q
RADIUS 2 PL
0.25 (0.010)
1
M
T A
M
DIM
A
B
C
D
E
G
H
J
K
N
Q
R
U
–B–
5
3
4
D
E
B
2
R
K
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
J
N
H
–T–
–A–
SEATING
PLANE
C
INCHES
MIN
MAX
1.330
1.350
0.370
0.410
0.190
0.230
0.215
0.235
0.050
0.070
0.430
0.440
0.102
0.112
0.004
0.006
0.185
0.215
0.845
0.875
0.060
0.070
0.390
0.410
1.100 BSC
STYLE 2:
PIN 1.
2.
3.
4.
5.
MILLIMETERS
MIN
MAX
33.79
34.29
9.40
10.41
4.83
5.84
5.47
5.96
1.27
1.77
10.92
11.18
2.59
2.84
0.11
0.15
4.83
5.33
21.46
22.23
1.52
1.78
9.91
10.41
27.94 BSC
DRAIN
DRAIN
GATE
GATE
SOURCE
CASE 375–04
ISSUE D
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MRF151G
6
◊
*MRF151G/D*
MRF151G/D
MOTOROLA RF DEVICE
DATA