NSC 54ACT112

54ACT112
Dual JK Negative Edge-Triggered Flip-Flop
General Description
The ’ACT112 contains two independent, high-speed JK
flip-flops with Direct Set and Clear inputs. Synchronous state
changes are initiated by the falling edge of the clock. Triggering occurs at a voltage level of the clock and is not directly
related to the transition time. The J and K inputs can change
when the clock is in either state without affecting the flip-flop,
provided that they are in the desired state during the recommended setup and hold times relative to the falling edge of
the clock. A LOW signal on SD or CD prevents clocking and
forces Q or Q HIGH, respectively. Simultaneous LOW signals on SD and CD force both Q and Q HIGH.
Connection Diagram
Asynchronous Inputs:
LOW input to SD sets Q to HIGH level
LOW input to CD sets Q to LOW level
Clear and Set are independent of clock
Simultaneous LOW on CD and SD makes both Q and Q
HIGH
Features
n ’ACT112 has TTL-compatible inputs
n Outputs source/sink 24 mA
n Standard Microcircuit Drawing (SMD) 5962-8995001
Pin Descriptions
Pin Names
Pin Assigment for
DIP and Flatpack
Description
J1, J2, K1, K2
Data Inputs
CP1, CP2
Clock Pulse Inputs
(Active Falling Edge)
CD1, CD2
Direct Clear Inputs (Active LOW)
SD1, SD2
Direct Set Inputs (Active LOW)
Q1, Q2, Q1, Q2
Outputs
DS100976-3
Pin Assigment
for LCC
DS100976-5
FACT™ is a trademark of Fairchild Semiconductor Corporation.
© 1998 National Semiconductor Corporation
DS100976
www.national.com
54ACT112 Dual JK Negative Edge-Triggered Flip-Flop
September 1998
Logic Symbols
DS100976-2
DS100976-1
IEEE/IEC
DS100976-4
Truth Table
Inputs
Outputs
SD
CD
CP
J
K
Q
L
H
X
X
X
H
L
H
L
X
X
X
L
H
Q
L
L
X
X
X
H
H
H
H
M
h
h
Q0
Q0
H
H
M
l
h
L
H
H
H
M
h
l
H
L
H
H
M
l
l
Q0
Q0
H (h) = HIGH Voltage Level
L (l) = LOW Voltage Level
X = Immaterial
M = HIGH-to-LOW Clock Transition
Q0 (Q0) = Before HIGH-to-LOW Transition of Clock
Lower case letters indicate the state of the referenced input or output one setup time prior to the HIGH-to-LOW clock
transition.
www.national.com
2
Logic Diagram
(One Half Shown)
DS100976-6
3
www.national.com
Absolute Maximum Ratings (Note 1)
Junction Temperature (TJ)
CDIP
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (VCC)
DC Input Diode Current (IIK)
VI = −0.5V
VI = VCC + 0.5V
DC Input Voltage (VI)
DC Output Diode Current (IOK)
VO = −0.5V
VO = VCC + O.5
DC Output Voltage (VO)
DC Output Source
or Sink Current (IO)
DC VCC or Ground Current
per Output Pin (ICC or IGND)
Storage Temperature (TSTG)
175˚C
Recommended Operating
Conditions
−0.5V to +7.0V
Supply Voltage (VCC)
Input Voltage (VI)
Output Voltage (VO)
Operating Temperature (TA)
Minimum Input Edge Rate (∆V/∆t)
VIN from 0.8V to 2.0V
VCC @ 4.5V, 5.5V
−20 mA
+20 mA
−0.5V to VCC + 0.5V
−20 mA
+20 mA
−0.5V to VCC +0.5V
4.5V to 5.5V
0V to VCC
0V to VCC
−55˚C to +125˚C
125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. Fairchild does not recommend operation of FACT™ circuits outside databook specifications.
± 50 mA
± 50 mA
−65˚C to +150˚C
DC Characteristics for ’ACT Family Devices
Symbol
VIH
VIL
VOH
Parameter
VCC
TA = −55˚C to +125˚C
(V)
Guaranteed Limits
Minimum High Level
4.5
2.0
Input Voltage
5.5
2.0
Maximum Low Level
4.5
0.8
Input Voltage
5.5
0.8
Minimum High Level
4.5
4.4
Output Voltage
5.5
5.4
4.5
3.70
5.5
4.70
Maximum Low Level
4.5
0.1
Output Voltage
5.5
0.1
4.5
0.5
5.5
0.5
5.5
± 1.0
Units
V
Conditions
VOUT = 0.1V
or VCC − 0.1V
V
VOUT = 0.1V
or VCC − 0.1V
V
IOUT = −50 µA
VIN = VIL or VIH
V
IOH = −24 mA
IOH = −24 mA
(Note 2)
VOL
V
IOUT = 50 µA
VIN = VIL or VIH
V
IOL = 24 MA
IOL = 24 mA
(Note 2)
IIN
Maximum Input Leakage
Current
µA
VI = VCC, GND
ICCT
Maximum ICC/Input
5.5
1.6
mA
VI = VCC − 2.1V
IOLD
Minimum Dynamic
5.5
50
mA
VOLD = 1.65V Max
IOHD
Output Current(Note 3)
5.5
−50
mA
VOHD = 3.85V Min
ICC
Maximum Quiescent
Supply Current
5.5
80.0
µA
VIN = VCC or GND
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
www.national.com
4
AC Electrical Characteristics for ’ACT Family Devices
Symbol
fmax
Parameter
Maximum Clock
VCC
TA = −55˚C to +125˚C
(V)
CL = 50 pF
Units
(Note
4)
Min
Max
5.0
80
5.0
1.0
14.0
ns
5.0
1.0
14.0
ns
5.0
1.0
13.5
ns
5.0
1.0
13.5
ns
MHz
Frequency
tPLH
Propagation Delay
CPn to Qn or Qn
tPHL
Propagation Delay
CPn to Qn or Qn
tPLH
Propagation Delay
CDn or SDn to Qn or Qn
tPHL
Propagation Delay
CDn or SDn to Qn or Qn
Note 4: Voltage Range 5.0 is 5.0V ± 0.5V
AC Operating Requirements:
Symbol
tS
Parameter
Setup Time, HIGH or
LOW
VCC
TA = −55˚C to +125˚C
(V)
CL = 50 pF
(Note 5)
Guaranteed Minimum
5.0
8.0
ns
5.0
1.5
ns
5.0
5.0
ns
5.0
3.0
ns
Units
Jn or Kn to CPn
tH
Hold Time, HIGH or
LOW
Jn or Kn to CPn
tW
Pulse Width
CPn or CDn or SDn
trec
Recovery Time
CDn or SDn to CPn
Note 5: Voltage Range 5.0 is 5.0V ± 0.5V
Capacitance
Symbol
Parameter
CIN
Input Capacitance
CPD
Power Dissipation Capacitance
5
Max
Units
10.0
pF
60
pF
Conditions
VCC = OPEN
VCC = 5.0V
www.national.com
Physical Dimensions
inches (millimeters) unless otherwise noted
16-Lead Ceramic Dual-in-line
Package Number J16A
16-Lead Cerpack
Package Number W16A
www.national.com
6
54ACT112 Dual JK Negative Edge-Triggered Flip-Flop
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
20-Lead Ceramic Leadless Chip Carrier
Package Number E20A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into
sonably expected to cause the failure of the life support
the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness.
ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
National Semiconductor
Corporation
Americas
Tel: 1-800-272-9959
Fax: 1-800-737-7018
Email: [email protected]
www.national.com
National Semiconductor
Europe
Fax: +49 (0) 1 80-530 85 86
Email: [email protected]
Deutsch Tel: +49 (0) 1 80-530 85 85
English Tel: +49 (0) 1 80-532 78 32
Français Tel: +49 (0) 1 80-532 93 58
Italiano Tel: +49 (0) 1 80-534 16 80
National Semiconductor
Asia Pacific Customer
Response Group
Tel: 65-2544466
Fax: 65-2504466
Email: [email protected]
National Semiconductor
Japan Ltd.
Tel: 81-3-5620-6175
Fax: 81-3-5620-6179
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.