dave heading and bp1

APRIL 28, 2009
TEST REPORT #209107-1 REV. 1.2
MIXED FLOWING GAS
TESTING
CONNECTOR PART NUMBERS
ERF8-050-05.0-X-DV
ERM8-050-05.0-X-DV-DS
SAMTEC, INC.
APPROVED BY: DOMINIC ARPINO
PROJECT ENGINEERING MANAGER
CONTECH RESEARCH, INC.
ATTLEBORO, MA
Test Laboratory
Contech Research
An Independent Test and Research Laboratory
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
4/28/2009
1.0
Initial Issue
DA
4/29/2009
1.1
Added the connector part numbers
to the cover page.
DA
4/15/2011
1.2
Added LLCR data sheet file
#20910714, see page 37.
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DA
Contech Research
An Independent Test and Research Laboratory
CERTIFICATION
This is to certify that the evaluation described herein was
designed and executed by personnel of Contech Research, Inc.
It was performed with the concurrence of Samtec, Inc., of New
Albany, IN who was the test sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1
and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
Dominic Arpino
Project Engineering Manager
Contech Research, Inc.
Attleboro, MA
DA:cf
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SCOPE
To perform Mixed Flowing Gas testing on ERF8/ERM8 connector
series as manufactured and submitted by the test sponsor
Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Standards: EIA Publication 364
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
TABLE 1
Connector Series
a) ERF8/ERM8 (30Au)
b) ERF8/ERM8 (50Au)
Samtec Reference
QTY
TC0906-2254
TC0906-2224
8
8
2.
Test samples were supplied assembled and terminated to test
boards by the test sponsor.
3.
The test samples were tested in their ‘as received’
condition.
4.
Spacers were assembled to each test sample to maintain
stability between the mated pair.
5.
Unless otherwise specified in the test procedures used, no
further preparation was used.
TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #1, for test sequences
used.
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TEST SELECTION -continued
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner
which remained legible for the test duration.
2.
The test samples were coded in the following manner:
Series
File ID#’s
ERF8/ERM8 (30Au)
20910702
20910704
20910705
20910706
20910707
20910708
20910775
20910776
ERF8/ERM8 (50Au)
20910709
20910710A
20910711
20910712
20910713
20910714
20910715
20910716
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FIGURE #1
TEST PLAN FLOW DIAGRAM
SAMPLE PREPARATION
LLCR
DURABILITY
LLCR
MFG
EXPOSURE
DURATION
7 DAYS
UNMATED
LLCR
1 CYCLE
MATE/UNMATE
LLCR
MFG
EXPOSURE
DURATION
7 DAYS
MATED
LLCR
1 CYCLE
MATE/UNMATE
LLCR
GROUP A
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DATA SUMMARY
TEST
REQUIREMENT
RESULT
GROUP A
LLCR
ERF8/ERM8
ERF8/ERM8
(30Au)
(50Au)
RECORD
RECORD
20.2 mΩ MAX.
18.9 mΩ MAX.
DURABILITY
ERF8/ERM8 (30Au)
ERF8/ERM8 (50Au)
NO DAMAGE
NO DAMAGE
PASSED
PASSED
LLCR
ERF8/ERM8
ERF8/ERM8
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+1.3 mΩ MAX.CHG.
+1.4 mΩ MAX.CHG.
MFG –UNMATED
ERF8/ERM8 (30Au)
ERF8/ERM8 (50Au)
NO DAMAGE
NO DAMAGE
CORROSION
CORROSION
LLCR
ERF8/ERM8
ERF8/ERM8
(30Au)
(50Au)
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+3.8 mΩ MAX.CHG.
OPEN(1)
1 CYCLE
ERF8/ERM8
ERF8/ERM8
(30Au)
(50Au)
NO DAMAGE
NO DAMAGE
CORROSION
CORROSION
LLCR
ERF8/ERM8
ERF8/ERM8
(30Au)
(50Au)
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+2.4 mΩ MAX.CHG.
+5.1 mΩ MAX.CHG.
MFG – MATED
ERF8/ERM8 (30Au)
ERF8/ERM8 (50Au)
NO DAMAGE
NO DAMAGE
CORROSION
CORROSION
LLCR
ERF8/ERM8
ERF8/ERM8
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+5.3 mΩ MAX.CHG.
OPEN (1)
(30Au)
(50Au)
(30Au)
(50Au)
Note: The data within the ( ) indicates the number of
positions with LLCR opens.
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DATA SUMMARY -continued
TEST
REQUIREMENT
RESULT
GROUP A -continued
1 CYCLE
ERF8/ERM8
ERF8/ERM8
(30Au)
(50Au)
NO DAMAGE
NO DAMAGE
CORROSION
CORROSION
LLCR
ERF8/ERM8
ERF8/ERM8
(30Au)
(50Au)
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG..
+8.9 mΩ MAX.CHG.
+7.1 mΩ MAX.CHG.
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EQUIPMENT LIST
ID#
Next Cal
Last Cal
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Cal
102
244
270
297
323
436
443
488
510
525
543
1027
1110
1116
1296
1381
1382
1507
1571
1595
1599
2/27/2010
9/22/2009
2/27/2009
9/22/2008
11/13/2009
11/13/2008
12/3/2009
12/3/2008
Data Acquisition Unit
Micro-Ohm Meter
MFG Chamber
Micro-Ohm Meter
Computer
Gas Regulator
Gas Regulator Valve
X-Y Table
Regulator
Gas Regulator
Analytical Balance
Computer
Elect.Liquid Level Control
Computer
MFG Control Panel
Air Dryer
Force Gage Stand
Temp Humid Transmitter
Chlorine Analyzer
H2S Analyzer
NO2 Analyzer
Hewlett Packard
Keithley Instr.
Contech Research
Keithley Instr.
Legatech
Liquid Carboinc Co.
Liquid Carbonic Co.
N.E.Affiliated Tech.
Liquid Carbonic
Superior Co.
Ohaus Co.
ARC Co.
Cole Parmer
ARC. Co.
Contech Research
Balston
Chatilon
Vaisala
IMS CO.
Teledyne Analyzer
Teledyne Analyzer
3421A
580-1
5 Cu Ft
580
286-12
702-S-3
DRK-2-48
N/A
SGS 160C
5113A
AP250D
Pent.133
7187
P111-450
N/A
75-20
20025
HMT333
Air Sentury
101-E
200E
2338A02027
467496
N/A
485414
N/A
392838
40197
932021
M2 42366
350218
MO9198
026871
15986
±. 5 %Of Indicated
See Cal Cert
N/A
See Cal Cert
N/A
N/A
See Manual
N/A
N/A
See Owners Manual
± .4mg
N/A
N/A
N/A
N/A
See Manual
N/A
See Cal Cert
See Manual
See Manual
See cert
12mon
12mon
Ea Test
12mon
N/A
N/A
N/A
N/A
N/A
N/A
12mon
N/A
N/A
N/A
N/A
N/A
N/A
12mon
EA Test
Each Test
12mon
4/6/2010
4/6/2009
Test Laboratory
TR#209107-1, REV.1.2
N/A
A03391
N/A
C1110019
1265AN
1231
289
Contech Research
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TEST RESULTS
GROUP A
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PROJECT NO.: 209107-1
SPECIFICATION: EIA-364
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 16 connectors
TECHNICIAN: DAM, AJP
-----------------------------------------------------------START DATE: 3/6/09
COMPLETE DATE: 3/10/09
-----------------------------------------------------------ROOM AMBIENT:
22°C
RELATIVE HUMIDITY: 25%
-----------------------------------------------------------EQUIPMENT ID#: 244, 297, 323, 1116
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23 with the following conditions.
2.
Test Conditions:
a) Test Current
: 100 milliamps maximum
b) Open Circuit Voltage
: 20 millivolts
c) No. of Positions Tested : 25 per test sample
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PROCEDURE: -continued
3.
The points of application are shown in Figure #2.
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
Avg.
Max.
Min.
GP 1 ERF8/ERM8-(30Au)
1-2
1-4
1-5
1-6
1-7
1-8
1-75
1-76
17.7
17.7
17.8
17.8
17.8
17.8
18.3
18.5
18.7
19.1
19.2
18.6
18.7
18.4
19.5
20.2
16.9
17.1
16.9
17.1
17.4
16.8
17.2
17.5
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
Avg.
Max.
Min.
GP 1 ERF8/ERM8-(50Au)
1-9
1-10A
1-11
1-12
1-13
1-14
1-15
1-16A
2.
17.6
17.1
17.1
17.3
17.4
17.2
17.6
17.6
18.9
17.7
18.1
18.4
18.1
18.7
18.5
18.3
16.8
16.1
16.5
16.7
17.0
16.6
16.7
16.8
See the attached data files for individual data points.
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FIGURE #2
TYPICAL LLCR SET UP
+V
+I
Connector pair
-V
-I
Buss wires are soldered to the 2 PTH’s
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PROJECT NO.: 209107-1
SPECIFICATION: EIA-364
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 16 connectors
TECHNICIAN: DAM
-----------------------------------------------------------START DATE: 3/10/09
COMPLETE DATE: 3/11/09
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY:
25%
-----------------------------------------------------------EQUIPMENT ID#: 488, 1382
-----------------------------------------------------------DURABILITY
PURPOSE:
1.
This is a preconditioning sequence which is used to induce
the type of wear on the contacting surfaces which may occur
under normal service conditions. The connectors are mated
and unmated a predetermined number of cycles. Upon
completion, the units being evaluated are exposed to the
environments as specified to assess any impact on
electrical stability resulting from wear or other wear
dependent phenomenon.
2.
This type or preconditioning sequence is also used to
mechanically stress the connector system as would normally
occur in actual service. This sequence in conjunction with
other tests is used to determine if a significant loss of
contact pressure occurs from said stresses which in turn,
may result in an unstable electrical condition to exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 09.
2.
Test Conditions:
a) No. of Cycles
b) Rate
3.
: 25X
: 1.0 inch per minute
The samples were cycled using an X Y Table and a drill
press stand.
-continued on next page.
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PROCEDURE: -continued
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples so tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
Sample ID#
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Avg.
Max.
Change
Change
GP 1 ERF8/ERM8-(30Au)
1-2
1-4
1-5
1-6
1-7
1-8
1-75
1-76
2.
+0.1
-0.2
-0.1
-0.5
+0.0
+0.0
-0.3
-0.3
+0.6
+0.6
+0.7
+0.6
+1.0
+1.3
+0.5
+1.3
See the attached data files for individual data points.
-continued on next page.
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RESULTS: -continued
3.
The following is a summary of the data observed:
Sample ID#
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Avg.
Max.
Change
Change
GP 1 ERF8/ERM8-(50Au)
1-9
1-10A
1-11
1-12
1-13
1-14
1-15
1-16A
+0.0
+0.2
+0.0
-0.1
+0.0
+0.1
+0.0
+0.5
+0.8
+0.9
+0.6
+0.5
+0.9
+1.2
+0.5
+1.4
4. See the attached data files for individual data points.
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PROJECT NO.: 209107-1
SPECIFICATION: EIA-364-65
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 16 connectors
TECHNICIAN: WJC
-----------------------------------------------------------START DATE: 3/13/09
COMPLETE DATE: 3/30/09
-----------------------------------------------------------ROOM AMBIENT: 21°C
RELATIVE HUMIDITY: 48%
-----------------------------------------------------------EQUIPMENT ID#: 102, 270, 436, 443, 510, 525, 543, 1027, 1110
1296, 1381, 1507, 1571, 1595, 1599
-----------------------------------------------------------MIXED FLOWING GAS
PURPOSE:
1.
To determine the impact on electrical stability of contact
interfaces when the test samples are exposed to a mixed
flowing gas environment. Said environment is based on
field data simulating typical, severe, non-benign
environments. Said exposure is indicative of expected
behavior in the field.
2.
Mixed flowing gas tests (MFG) are environmental test
procedures whose primary purpose is to evaluate product
performance under simulated storage or operating (field)
conditions. For parts involving plated contact surfaces,
such tests are also used to measure the effect of plating
degradation (due to the environment) on the electrical and
durability properties of a contact or connector system.
The specific test conditions are usually chosen so as to
simulate, in the test laboratory, the effects of certain
representative field environments or environmental severity
levels on standard metallic surfaces.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 65 with the following conditions.
-continued on next page.
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PROCEDURE: -continued
2.
Environmental Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Temperature
Relative Humidity
C12
NO2
H2S
SO2
Exposure Time
Mating Conditions
:
:
:
:
:
:
:
:
30°C ± 1°C
70% ± 2%
10 ± 3 ppb
200 ± 50 ppb
10 ± 5 ppb
100 ± 20 ppb
14 days
First 7 days -unmated
Second 7 days -mated
3.
The test chamber was allowed to stabilize at the specified
conditions indicated.
4.
After stabilization, the test samples and control coupons
were placed in the chamber such that they were no closer
than 2.0" from each other and/or the chamber walls.
5.
The test samples were handled in a manner so as not to
disturb the contact interface.
6.
After placement of the test samples in the chamber, it was
allowed to re-stabilize and adjusted as required to
maintain the specified concentrations and conditions.
7.
The test chamber was monitored periodically during the
exposure period to assure the environmental conditions as
specified were maintained.
8.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of damage or corrosion to the
test samples as exposed which will cause mechanical or
electrical malfunction of the said samples.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS: See Next Page
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RESULTS:
1.
Some evidence of corrosion was observed on the contact
interface.
2.
The following is a summary of the data observed following
the 7 days unmated portion of the exposure:
MAXIMUM CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
Avg.
Change
Max.
Change
Avg.
Change
Max.
Change
GP 1 ERF8/ERM8-(30Au)
@ 7 Days
1-2
1-4
1-5
1-6
1-7
1-8
1-75
1-76
+0.2
-0.1
-0.1
+0.3
+0.1
+0.5
-0.1
-0.5
1 Cycle
+1.2
+1.6
+2.4
+1.6
+1.2
+2.1
+3.8
+0.9
+0.5
+0.1
+0.3
-0.1
+0.3
+1.0
-0.2
-0.6
+1.2
+1.2
+1.7
+1.1
+1.7
+2.4
+1.3
+0.5
MAXIMUM CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
GP 1 ERF8/ERM8-(50Au)
1-9
1-10A
1-11
1-12
1-13
1-14
1-15
1-16A
Avg.
Change
Max.
Change
Avg.
Change
@ 7 Days
+0.2
+0.4
+0.4
+0.3
+0.1
+0.0
+0.1
+0.1
Max.
Change
1 Cycle
+1.5
+1.7
+1.0
+1.1
+1.1
OPEN(1)
+1.3
+0.9
+0.1
+0.4
+0.7
+0.3
+0.1
+0.4
+0.1
+0.4
+1.5
+1.4
+2.1
+1.0
+0.7
+5.1
+1.3
+1.0
Note: The data within the ( ) indicates the number of
positions with LLCR opens.
-continued on next page.
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RESULTS: -continued
3.
The following is a summary of the data observed following
the 14 days portion of the exposure:
MAXIMUM CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
GP 1 ERF8/ERM8-(30Au)
1-2
1-4
1-5
1-6
1-7
1-8
1-75
1-76
Avg.
Change
Max.
Change
@ 14 Days
+0.2
+0.2
+0.2
+0.0
+0.3
+0.6
+0.7
+0.2
Avg.
Change
Max.
Change
1 Cycle
+0.8
+3.5
+5.2
+5.3
+4.8
+2.5
+3.5
+2.2
+0.7
+0.5
+0.1
-0.1
+0.8
+0.8
+1.3
+0.3
+3.5
+2.8
+1.8
+1.1
+8.9
+2.7
+7.0
+2.9
MAXIMUM CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
GP 1 ERF8/ERM8-(50Au)
1-9
1-10A
1-11
1-12
1-13
1-14
1-15
1-16A
Avg.
Change
Max.
Change
Avg.
Change
@ 14 Days
+0.1
+0.3
+0.5
+0.3
-0.1
-0.1
-0.1
+0.1
Max.
Change
1 Cycle
+3.0
+1.5
+4.0
+1.2
+0.4
OPEN(1)
+0.7
+1.2
-0.1
+0.2
+0.1
+0.3
+0.0
+0.1
+0.0
+0.1
+1.0
+1.1
+1.4
+1.4
+0.9
+1.6
+1.1
+7.1
Note: The data within the ( ) indicates the number of
positions with LLCR opens.
4.
See the attached data files for individual data points.
-continued on next page.
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RESULTS: -continued
5.
Five copper coupons were placed in the chamber. Upon
removal said coupons were evaluated via weight gain
technique with the following results:
WEIGHT GAIN (µgm/cm2/Day)
Coupon No.
Unmated
1
2
3
4
5
12+
13
14
13+
14+
Requirement:
Mated
15
13+
14
14
13
12 to 16 µgm/cm2/Day
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LLCR DATA FILES
FILE NUMBERS
30 Au
Group 1
20910702
20910704
20910705
20910706
20910707
20910708
20910775
20910776
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Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
22
25
06Mar09
Initial
21
28
10Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.4
17.8
17.4
18.7
17.7
17.8
17.3
17.3
17.4
17.8
17.4
16.9
17.1
17.8
17.4
17.7
17.3
17.3
17.5
17.7
18.3
17.5
18.3
17.9
18.4
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 2
File No:
20910702
Tech:
DAM
Current:
100ma
21
25
20Mar09
1X
-0.5
0.2
0.2
0.1
0.0
0.1
0.3
0.0
-0.2
-0.3
-0.1
0.5
0.3
-0.1
0.3
0.6
0.0
0.5
0.5
0.0
0.0
-0.2
-0.3
-0.2
-0.3
21
25
20Mar09
MFG 7Days
Unmated
0.5
0.8
0.2
-0.1
0.1
1.2
0.1
-0.2
0.0
0.6
-0.3
0.6
0.1
-0.1
-0.1
0.1
-0.1
0.7
0.2
1.2
0.0
0.3
0.2
0.2
-0.4
22
27
31Mar09
1X
0.6
0.3
0.4
0.4
0.2
0.3
0.3
0.5
0.5
0.4
0.4
1.0
0.4
0.1
0.3
0.3
0.8
1.2
0.5
0.8
0.9
0.3
0.4
0.8
0.8
21
30
30Mar09
MFG 7Days
mated
0.5
0.3
0.1
0.1
0.3
0.7
0.1
0.2
0.4
0.0
0.0
0.3
0.1
0.8
0.6
0.1
0.2
0.2
0.2
0.2
-0.2
0.2
0.5
-0.1
-0.5
18.7
16.9
17.7
0.4
0
AJP
0.6
-0.5
0.1
0.3
0
AJP
1.2
-0.4
0.2
0.4
0
DAM
1.2
0.1
0.5
0.3
0
DAM
0.8
-0.5
0.2
0.3
0
DAM
3.5
0.1
0.7
0.8
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
23 of 39
0.1
3.5
0.3
0.6
0.1
0.5
1.6
0.1
0.2
0.7
0.4
1.0
0.6
0.4
0.1
1.0
0.8
2.0
0.8
0.9
0.1
0.8
0.1
0.4
0.1
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
22
25
06Mar09
Initial
21
28
10Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
17.7
17.8
17.5
18.1
17.5
17.4
17.2
17.9
17.7
17.1
17.6
17.3
17.1
17.5
17.9
19.1
17.3
18.7
18.2
18.1
17.5
17.3
18.3
17.5
18.0
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 4
File No:
20910704
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
-0.2
-0.5
-0.2
-0.2
0.2
0.6
0.0
-0.5
-0.2
-0.2
0.3
-0.3
0.3
0.0
-0.5
-0.8
0.2
-1.0
-0.4
0.2
0.3
-0.1
-0.4
-0.2
-0.4
21
25
20Mar09
MFG 7Days
Unmated
0.3
-0.8
-0.8
-1.0
-0.4
0.4
0.3
0.6
0.0
0.5
0.1
0.6
0.7
0.1
-0.9
-0.9
0.1
-0.2
0.1
1.6
-0.5
-0.5
-1.5
-0.7
-0.5
22
27
31Mar09
1X
1.0
0.3
0.1
0.0
0.6
0.9
0.4
-0.2
0.2
0.2
-0.1
0.2
1.0
0.3
-0.1
-0.2
-0.2
-0.5
0.0
0.0
-0.3
1.2
-0.6
-0.1
-0.4
21
30
30Mar09
MFG 7Days
mated
3.5
0.1
-0.3
-0.7
-0.1
0.7
0.6
0.7
0.0
0.5
0.3
0.0
0.4
-0.2
-0.3
0.3
0.2
-0.2
0.1
0.6
-0.1
0.1
-1.0
-0.4
0.0
19.1
17.1
17.7
0.5
0
AJP
0.6
-1.0
-0.2
0.4
0.0
AJP
1.6
-1.5
-0.1
0.7
0
DAM
1.2
-0.6
0.1
0.5
0
DAM
3.5
-1.0
0.2
0.8
0
DAM
2.8
-0.8
0.5
1.1
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
24 of 39
2.4
-0.7
-0.5
-0.8
0.2
1.4
0.0
0.6
-0.1
1.1
0.1
0.6
2.5
-0.1
-0.3
1.2
-0.2
-0.5
-0.3
2.8
0.0
2.3
-0.8
0.1
1.0
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
22
25
06Mar09
Initial
21
28
10Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.1
17.6
17.0
17.4
17.1
17.9
16.9
17.6
17.0
17.4
18.0
17.5
17.8
18.0
17.6
18.9
17.6
19.0
17.7
18.5
18.1
17.4
18.6
17.2
19.2
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 5
File No:
20910705
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
-0.6
-0.2
0.4
0.0
0.7
-0.1
0.4
-0.7
-0.3
-0.3
-1.1
-0.1
-0.3
-0.6
0.4
0.0
-0.1
0.6
0.0
-0.8
0.2
0.7
-0.5
0.3
-1.3
21
25
20Mar09
MFG 7Day
Unmated
-0.7
-0.4
-0.1
-0.3
-0.3
-0.3
0.6
0.3
1.7
2.4
-0.9
-0.8
-0.6
-0.6
-0.4
-0.3
-0.3
-0.7
0.0
-0.6
0.4
0.4
-1.2
0.6
-0.9
22
27
31Mar09
1X
1.7
0.3
0.5
0.0
0.7
0.2
1.5
0.2
0.8
1.0
-0.6
-0.1
-0.6
-0.1
0.1
-0.7
0.0
0.5
1.1
-0.2
-0.1
0.6
-0.3
0.5
0.0
21
30
30Mar09
MFG 7Day
mated
-0.8
-0.7
0.1
-0.5
0.2
-0.1
0.3
0.6
2.8
5.2
-0.9
-0.3
-0.2
-0.2
0.4
-0.6
0.0
0.5
-0.1
-0.4
-0.2
0.3
-0.2
0.0
-1.2
19.2
16.9
17.8
0.6
0
AJP
0.7
-1.3
-0.1
0.5
0
AJP
2.4
-1.2
-0.1
0.8
0
DAM
1.7
-0.7
0.3
0.6
0
DAM
5.2
-1.2
0.2
1.3
0
DAM
1.8
-0.9
0.1
0.8
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
25 of 39
0.0
-0.4
0.0
-0.5
-0.4
-0.1
0.5
0.0
1.8
1.8
-0.9
-0.3
0.0
-0.3
-0.3
1.5
-0.3
-0.3
1.0
-0.6
0.2
-0.2
1.5
0.2
-0.6
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
22
25
06Mar09
Initial
21
28
10Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.4
17.5
17.4
17.8
17.5
18.0
17.4
17.2
17.6
17.8
18.6
17.7
17.4
17.8
17.7
18.5
17.7
17.5
17.4
17.8
18.4
18.1
18.1
17.1
17.9
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 6
File No:
20910706
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
-0.9
0.0
-0.4
-0.8
-0.7
-1.0
-0.2
-0.5
-0.8
-0.6
-1.3
-0.3
-0.4
0.6
-0.4
-0.5
-0.7
0.0
0.3
-0.1
-0.7
-1.0
-0.6
0.1
-0.8
21
25
20Mar09
MFG 7Days
Unmated
0.5
0.9
0.1
0.4
-0.6
0.2
0.2
0.8
-0.2
0.1
-0.9
-0.2
0.4
1.6
0.9
0.1
0.0
1.4
1.0
0.8
-0.8
-0.9
0.1
1.4
0.1
22
27
31Mar09
1X
0.3
0.8
0.3
-0.7
-0.3
-0.3
0.2
1.1
-0.2
-0.3
-0.9
-0.6
0.3
0.4
-0.4
-0.6
-0.2
0.6
0.7
0.7
-0.6
-1.1
-0.8
0.5
-0.8
21
30
30Mar09
MFG 7Days
mated
-0.5
0.4
-0.7
-0.7
-0.8
0.0
0.5
5.3
-0.1
-0.3
-0.9
-0.3
0.0
-0.2
-0.2
0.4
-0.4
0.2
1.0
0.2
-0.4
-1.1
-0.7
-0.1
-0.7
18.6
17.1
17.8
0.4
0
AJP
0.6
-1.3
-0.5
0.4
0
AJP
1.6
-0.9
0.3
0.7
0
DAM
1.1
-1.1
-0.1
0.6
0
DAM
5.3
-1.1
0.0
1.2
0
DAM
1.1
-1.4
-0.1
0.5
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
26 of 39
0.3
0.1
-0.1
-0.6
-0.5
0.0
0.0
0.3
0.3
-0.2
-1.4
-0.6
-0.1
-0.4
-0.4
-0.6
-0.2
0.8
0.0
1.1
-0.6
-1.0
-0.5
0.4
0.0
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
22
25
06Mar09
Initial
21
28
10Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
17.9
17.7
17.9
18.7
17.8
18.2
18.2
18.0
17.6
17.4
17.4
17.6
17.9
17.8
17.4
17.7
17.7
17.5
17.5
17.6
18.7
17.6
18.2
17.7
17.8
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 7
File No:
20910707
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
21
30
30Mar09
MFG 7days
22
27
31Mar09
1X
0.2
-0.4
-0.6
-1.2
0.0
-0.2
-0.6
-0.3
0.2
0.1
0.0
0.2
-0.6
0.1
0.5
0.4
0.4
0.7
0.5
1.0
-0.6
0.1
-0.2
0.0
-0.3
21
25
20Mar09
MFG 7 Days
Unmated
0.5
0.2
-0.1
-0.3
-0.3
0.3
-0.3
-0.1
0.2
1.0
-0.1
0.4
-0.6
-0.1
1.2
-0.1
-0.3
0.1
0.5
0.8
-0.6
0.5
-0.6
0.4
-0.3
-0.1
-0.4
-0.3
-0.7
0.0
-0.5
-0.4
-0.3
0.1
1.7
0.5
0.4
0.8
1.4
0.6
0.7
-0.1
0.3
0.1
1.6
-0.2
0.4
0.8
0.0
0.1
0.0
-0.4
-0.4
-1.6
-0.6
-0.6
-0.5
0.0
-0.2
3.3
0.6
0.2
-0.3
1.2
0.0
4.8
-0.2
0.0
0.0
1.0
-0.1
0.4
0.3
0.6
-0.1
0.7
0.1
-0.2
-1.0
0.2
-0.1
-0.8
0.1
0.5
3.2
-0.1
0.3
-0.2
3.5
0.7
8.9
0.6
0.6
0.4
0.8
-0.2
0.4
-0.2
0.9
0.1
18.7
17.4
17.8
0.4
0
AJP
1.0
-1.2
0.0
0.5
0
AJP
1.2
-0.6
0.1
0.5
0
DAM
1.7
-0.7
0.3
0.7
0
DAM
4.8
-1.6
0.3
1.3
0
DAM
8.9
-1.0
0.8
2.0
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
27 of 39
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
22
25
06Mar09
Initial
21
28
10Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
17.5
17.4
16.8
17.2
17.5
17.7
17.8
17.2
17.7
17.5
18.1
17.4
18.1
18.0
17.8
17.8
18.3
17.9
18.4
18.4
17.8
17.8
17.8
17.8
18.1
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 8
File No:
20910708
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
-0.2
-0.2
0.5
-0.4
0.0
0.6
-0.1
0.0
-0.1
0.3
-0.4
0.0
-0.2
0.2
-0.4
1.3
-0.5
0.7
-0.5
0.2
-0.6
-0.6
0.1
0.1
-0.3
21
25
20Mar09
MFG 7Days
Unmated
0.8
0.4
0.2
0.3
-0.1
0.4
0.3
1.2
1.3
2.0
1.5
0.5
-0.4
0.7
0.4
2.1
-0.4
1.4
0.4
0.6
-0.4
-0.3
0.1
-0.3
-0.7
22
27
31Mar09
1X
1.1
0.8
1.2
1.4
1.2
1.1
0.8
1.9
1.1
1.8
0.7
1.1
0.8
1.5
0.8
2.4
-0.2
1.7
0.9
1.0
0.1
-0.3
1.0
0.1
-0.1
21
30
30Mar09
MFG 7Days
mated
0.3
0.1
0.6
0.1
0.1
0.7
0.1
0.9
0.3
1.8
1.9
0.3
0.4
0.6
0.6
2.5
0.2
1.0
0.3
0.5
0.1
0.0
0.3
0.2
-0.2
18.4
16.8
17.8
0.4
0
AJP
1.3
-0.6
0.0
0.5
0
AJP
2.1
-0.7
0.5
0.8
0
DAM
2.4
-0.3
1.0
0.7
0
DAM
2.5
-0.2
0.6
0.7
0
DAM
2.7
-0.6
0.8
0.9
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
28 of 39
1.7
0.0
0.6
0.8
-0.1
0.9
0.9
2.6
1.1
2.7
0.1
1.6
1.1
0.4
0.5
2.7
-0.6
1.3
0.4
0.3
1.2
0.0
0.8
0.5
-0.4
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
25
20Mar09
Initial
22
21
23Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.3
17.2
17.5
18.0
17.6
18.4
17.5
18.9
18.6
18.3
18.2
18.4
18.4
18.9
18.1
19.4
17.9
18.3
18.6
18.6
19.5
17.8
18.7
18.4
18.4
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 75
File No:
20910775
Tech:
DAM
Current:
100mv
21
30
30Mar09
1X
-0.3
0.5
0.5
-0.3
-0.2
0.1
0.3
-0.3
-0.8
-0.9
-0.4
-0.4
-0.7
-0.4
-0.5
-0.9
0.1
0.3
-0.4
0.1
-1.6
0.2
0.0
-0.7
-0.2
21
30
30Mar09
MFG 7days
Unmated
-0.3
-0.1
-0.5
3.8
0.0
0.9
-0.2
-0.5
-0.8
-0.6
-0.3
-1.0
-0.6
-0.8
-0.3
0.7
0.0
1.1
0.1
0.8
-2.0
-0.5
-0.8
-0.7
-0.4
22
26
13Apr09
1X
1.3
0.0
0.0
0.6
0.1
0.8
0.0
0.6
-0.6
-0.3
0.4
-0.9
-0.2
0.3
-0.2
-0.6
-0.4
-0.2
0.1
-0.2
-2.2
-0.3
-1.2
-0.9
-0.5
22
26
13Apr09
MFG 7days
Mated
2.3
0.7
0.1
2.5
1.4
1.3
0.4
0.9
1.2
0.6
2.4
2.9
3.5
1.0
0.0
0.4
-0.4
0.1
-0.3
-0.1
-1.3
-0.3
-0.8
0.0
-0.6
19.5
17.2
18.3
0.6
0
DAM
0.5
-1.6
-0.3
0.5
0
DAM
3.8
-2.0
-0.1
1.1
0
DAM
1.3
-2.2
-0.2
0.7
0
DAM
3.5
-1.3
0.7
1.2
0
DAM
7.0
-1.4
1.3
2.3
0
DAM
323
297
323
297
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
29 of 39
2.8
2.9
0.7
7.0
2.2
7.0
0.7
-0.2
5.2
0.8
2.5
-0.2
-0.6
0.5
-0.3
0.9
-0.1
2.1
1.2
0.3
-1.4
-0.5
-0.6
-0.4
-0.2
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 30au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
20
24Mar09
Initial
21
20
24Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.5
17.5
17.6
17.9
18.1
18.1
18.3
18.8
19.0
20.2
20.0
18.7
17.9
17.8
18.6
18.6
18.0
18.5
18.3
18.6
18.3
18.1
19.2
17.9
19.4
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 76
File No:
20910776
Tech:
DAM
Current:
100mv
21
30
30Mar09
1X
-0.4
0.4
-0.1
-0.3
-0.2
0.6
-0.5
-0.6
-1.3
-1.8
-1.9
-0.3
-0.1
1.0
-0.6
-0.6
0.1
-0.3
0.1
-0.1
-0.1
-0.6
-0.8
1.3
-0.1
21
30
30Mar09
MFG 7days
Unmated
-0.2
0.2
0.2
0.8
-0.9
-0.4
-0.4
-1.0
-1.0
-2.2
-2.7
-1.4
-0.2
-0.5
-0.1
-0.9
0.3
0.5
-0.1
-0.5
-0.5
-0.8
-1.4
0.9
-0.6
20
27
14Apr09
1X
-0.3
0.4
-0.1
-0.3
-0.5
0.2
0.0
-0.8
-0.3
-1.8
-1.7
-1.0
-0.6
-0.3
-0.6
-1.1
-0.1
-1.2
-0.6
0.2
-0.9
-1.1
-2.1
0.5
-1.4
22
26
13Apr09
MFG 7days
Mated
2.2
0.4
0.6
0.6
-0.5
1.2
1.7
0.1
-1.1
0.1
-1.9
0.0
-0.1
1.2
0.6
1.5
-0.3
1.8
-0.5
-0.8
-0.6
0.2
-1.0
0.5
-0.3
20.2
17.5
18.5
0.7
0
DAM
1.3
-1.9
-0.3
0.7
0
DAM
0.9
-2.7
-0.5
0.8
0
DAM
0.5
-2.1
-0.6
0.7
0
DAM
2.2
-1.9
0.2
1.0
0
DAM
2.9
-1.7
0.3
1.2
0
DAM
323
297
323
297
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
30 of 39
1.1
0.2
0.2
0.1
-0.4
1.5
1.9
-1.0
2.0
0.2
-1.7
-0.9
-0.5
-0.1
1.3
1.5
-0.2
2.2
-0.2
2.9
-0.3
-0.9
-1.0
-0.4
-1.0
Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
FILE NUMBERS
50 Au
Group 1
20910709
20910710A
20910711
20910712
20910713
20910714
20910715
20910716A
Test Laboratory
TR#209107-1, REV.1.2
31 of 39
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.1
16.8
17.8
16.9
16.8
18.0
17.0
17.2
17.4
16.8
17.1
17.5
17.6
17.8
17.8
18.4
17.7
18.9
17.9
18.4
17.7
17.6
17.6
17.4
17.4
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 9
File No:
20910709
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
0.0
0.2
0.5
0.3
0.5
0.4
0.5
0.1
0.0
0.1
0.5
-0.4
-0.5
-0.5
0.6
-0.8
0.2
-1.4
0.1
-0.4
-0.4
-0.4
-0.4
0.8
0.1
21
25
20Mar09
MFG 7Days
Unmated
-0.3
-0.1
-0.1
0.8
0.6
-0.4
0.7
0.3
0.0
0.2
0.4
-0.1
0.3
0.1
0.5
-1.0
0.3
-0.8
0.3
-0.2
0.2
0.0
0.3
0.6
1.5
22
27
31Mar09
1X
-0.2
-0.4
-0.1
-0.1
0.0
-0.5
1.3
0.0
0.0
0.0
0.2
-0.2
-0.1
-0.4
0.2
-1.0
-0.1
-0.8
1.0
0.7
0.0
0.1
0.0
1.5
0.7
21
30
30Mar09
MFG 7Days
mated
-0.2
0.1
0.0
-0.1
0.4
-0.8
3.0
-0.3
0.0
0.1
0.3
-0.2
-0.3
-0.1
0.2
-0.7
0.3
-1.2
0.5
0.7
-0.2
-0.2
0.4
0.4
0.7
18.9
16.8
17.6
0.5
0
AJP
0.8
-1.4
0.0
0.5
0
AJP
1.5
-1.0
0.2
0.5
0
DAM
1.5
-1.0
0.1
0.6
0
DAM
3.0
-1.2
0.1
0.8
0
DAM
1.0
-1.2
-0.1
0.5
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
32 of 39
-0.8
-0.4
0.0
0.2
0.4
-0.8
0.2
0.1
-0.4
0.1
0.0
-0.4
-0.4
-0.5
0.1
-1.0
0.2
-1.2
0.4
0.0
-0.1
-0.3
-0.2
1.0
1.0
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
17.3
17.2
17.0
16.6
16.6
17.7
17.0
16.7
17.1
16.1
16.5
16.7
16.4
16.8
17.2
16.8
17.4
17.4
17.6
17.5
16.8
17.2
17.7
17.3
17.4
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 10A
File No:
20910710A
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
0.3
0.0
0.0
0.2
0.1
0.1
0.3
0.5
0.0
0.9
0.4
0.3
0.3
0.1
0.5
0.2
0.0
-0.2
0.7
-0.4
0.4
0.4
0.4
0.0
-1.5
21
25
20Mar09
MFG 7Days
Unmated
0.9
-0.5
0.9
0.8
0.2
-0.5
0.4
0.6
-0.1
1.7
0.7
0.2
0.6
0.3
0.6
1.0
0.8
-0.2
1.3
-0.5
0.5
0.3
-0.1
0.2
-0.1
22
27
31Mar09
1X
0.5
0.6
0.2
0.8
0.8
0.1
0.7
0.7
0.3
1.4
1.1
0.0
0.7
0.2
1.3
0.2
0.1
0.0
0.3
-0.2
0.3
0.6
-0.5
0.1
-0.5
21
30
30Mar09
MFG 7Days
mated
0.3
0.1
0.3
0.8
0.1
0.1
0.2
0.2
0.1
1.1
0.8
-0.1
0.6
0.1
1.5
0.4
0.0
-0.4
0.5
-0.1
0.2
0.1
0.6
0.3
-0.2
17.7
16.1
17.1
0.4
0
AJP
0.9
-1.5
0.2
0.4
0
AJP
1.7
-0.5
0.4
0.6
0
DAM
1.4
-0.5
0.4
0.5
0
DAM
1.5
-0.4
0.3
0.4
0
DAM
1.1
-0.4
0.2
0.4
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
33 of 39
0.4
0.1
0.2
0.7
0.5
0.2
0.2
0.4
-0.3
1.1
0.5
-0.2
0.3
0.1
0.8
0.3
-0.1
-0.4
0.0
0.3
0.6
0.0
-0.3
0.2
-0.3
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
17.5
16.9
17.0
16.9
16.9
16.5
17.2
16.9
17.2
17.8
17.1
16.8
17.1
17.4
18.1
17.6
17.7
17.3
17.4
17.0
16.9
16.7
16.7
17.2
16.9
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 11
File No:
20910711
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
0.1
0.1
0.1
0.6
0.0
0.3
-0.1
-0.1
-0.3
-0.6
-0.3
-0.3
0.0
-0.4
-0.8
-0.7
-0.1
-0.1
0.0
0.3
0.5
0.5
0.4
0.1
0.1
21
25
20Mar09
MFG 7Days
Unmated
0.7
0.4
0.7
0.9
0.2
0.7
0.4
0.0
0.0
-0.4
0.1
0.3
0.2
0.4
0.2
-0.3
0.2
0.6
0.3
0.7
0.9
0.5
1.0
0.7
0.9
22
27
31Mar09
1X
1.6
1.4
2.1
1.1
0.7
1.8
0.9
0.8
0.7
-0.2
0.4
0.4
0.7
0.5
-0.6
-0.1
0.3
0.2
1.6
0.7
0.8
0.6
0.5
0.4
0.9
21
30
30Mar09
MFG 7Days
mated
4.0
1.1
1.3
0.6
0.6
1.6
0.7
0.7
0.2
-0.4
0.4
0.2
0.0
-0.3
-0.8
-0.4
0.4
0.1
0.3
0.1
0.3
0.1
1.2
-0.2
0.5
18.1
16.5
17.1
0.4
0
AJP
0.6
-0.8
0.0
0.4
0
AJP
1.0
-0.4
0.4
0.4
0
DAM
2.1
-0.6
0.7
0.6
0
DAM
4.0
-0.8
0.5
0.9
0
DAM
1.4
-0.9
0.1
0.5
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
34 of 39
1.4
-0.2
-0.6
-0.1
0.0
0.1
-0.1
-0.4
-0.3
-0.3
-0.2
0.1
0.1
0.0
-0.9
-0.2
0.6
-0.1
0.3
0.8
0.7
0.9
0.7
0.4
0.6
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25x
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.4
17.2
16.9
16.7
17.0
16.8
18.0
16.8
16.8
16.9
16.7
17.0
17.1
17.0
17.2
17.7
17.6
17.9
17.2
17.4
17.3
17.1
17.7
18.4
17.1
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 12
File No:
20910712
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
-0.8
0.3
0.5
0.2
0.1
0.5
-0.1
0.3
0.0
-0.2
0.1
-0.6
-0.2
-0.3
-0.3
0.1
-0.2
-0.4
-0.4
-0.2
0.3
-0.2
-0.1
-0.8
0.0
21
25
20Mar09
MFG 7Days
Unmated
-0.3
0.4
0.7
0.7
0.1
1.1
0.9
0.9
0.8
0.6
0.3
0.2
0.5
-0.3
0.0
-0.2
-0.2
-0.4
0.4
-0.3
0.1
0.6
0.1
0.0
0.1
22
27
31Mar09
1X
0.2
0.4
0.5
0.4
0.5
0.0
0.0
1.0
0.8
0.2
0.7
0.1
0.5
-0.2
0.0
-0.6
-0.1
0.2
0.9
0.2
0.1
0.4
0.1
-0.6
0.7
21
30
30Mar09
MFG 7Days
mated
-0.2
0.3
1.2
0.1
-0.1
0.6
-0.5
0.8
0.7
0.2
0.7
0.5
0.7
-0.1
0.0
-0.4
-0.1
-0.4
0.4
-0.4
0.7
0.2
0.6
0.6
0.9
18.4
16.7
17.3
0.5
0
AJP
0.5
-0.8
-0.1
0.3
0
AJP
1.1
-0.4
0.3
0.4
0
DAM
1.0
-0.6
0.3
0.4
0
DAM
1.2
-0.5
0.3
0.5
0
DAM
1.4
-0.4
0.3
0.4
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
35 of 39
0.1
1.1
0.9
0.2
0.6
0.8
-0.4
0.0
0.1
0.1
0.3
-0.1
0.5
0.4
0.6
0.1
0.0
-0.3
0.6
0.0
1.4
0.2
0.2
-0.3
-0.1
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25x
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.0
17.9
17.6
17.5
17.1
17.1
17.3
17.0
17.5
17.4
17.4
17.4
17.3
17.0
17.1
17.1
18.1
17.1
18.0
17.6
17.3
17.0
17.3
17.1
17.4
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 13
File No:
20910713
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
-0.9
0.0
0.2
-0.1
0.0
-0.2
0.0
-0.2
-0.2
-0.3
-0.4
-0.4
0.2
0.0
0.2
-0.1
-0.1
0.3
0.5
-0.2
0.3
0.6
0.2
0.9
0.6
21
25
20Mar09
MFG 7Days
Unmated
-0.5
1.1
0.1
-0.7
0.1
0.4
0.1
0.1
-0.5
-0.4
-0.4
-0.4
-0.4
0.0
0.0
0.1
0.0
0.9
0.3
-0.3
0.4
0.1
0.1
0.7
0.6
22
27
31Mar09
1X
-0.5
0.6
-0.4
0.4
0.2
0.7
0.2
0.0
-0.6
0.0
0.0
-0.6
-0.2
0.3
0.4
0.3
-0.5
0.6
0.2
-0.3
0.7
0.0
0.1
0.2
0.3
21
30
30Mar09
MFG 7Days
mated
-0.8
-0.1
0.3
-0.1
0.3
0.2
0.1
0.4
-0.4
-0.3
-0.4
-0.6
-0.4
0.0
0.3
-0.3
-0.1
0.2
-0.4
-0.4
0.2
0.2
0.0
-0.1
0.0
18.1
17.0
17.4
0.3
0
AJP
0.9
-0.9
0.0
0.4
0
AJP
1.1
-0.7
0.1
0.5
0
DAM
0.7
-0.6
0.1
0.4
0
DAM
0.4
-0.8
-0.1
0.3
0
DAM
0.9
-0.6
0.0
0.4
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
36 of 39
-0.2
0.2
0.3
-0.4
0.2
0.6
0.2
0.1
-0.4
-0.4
0.0
-0.5
-0.4
0.0
0.0
-0.1
-0.6
0.9
0.0
-0.4
0.2
0.2
0.1
0.6
0.3
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25x
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
17.5
16.8
17.4
16.6
17.1
16.8
17.0
16.8
17.3
17.0
17.4
17.2
17.0
17.2
17.1
17.0
17.5
18.7
17.6
17.1
17.3
17.0
17.3
17.5
16.8
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 14
File No:
20910714
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
0.2
0.1
-0.7
-0.1
-0.2
0.4
0.1
0.4
-0.2
-0.2
0.2
0.0
-0.1
0.3
1.2
0.8
0.4
-1.0
-0.2
0.3
0.5
-0.1
-0.5
0.7
0.4
21
25
20Mar09
MFG 7Days
Unmated
-0.4
0.0
0.2
0.0
-0.1
-0.1
-0.1
0.0
-0.3
0.1
Open
-0.3
0.0
0.0
0.1
0.4
0.7
-0.6
-0.3
-0.3
0.1
0.5
-0.3
-0.2
0.9
22
27
31Mar09
1X
0.0
0.1
-0.2
0.0
0.3
0.1
1.7
0.3
-0.1
-0.3
5.1
0.0
0.0
0.5
0.7
0.5
0.2
-0.1
-0.2
0.1
0.0
0.9
0.4
0.2
0.6
21
30
30Mar09
MFG 7Days
mated
-0.2
0.1
-0.5
-0.2
-0.2
0.2
1.0
-0.2
-0.1
0.1
Open
-0.5
-0.2
0.1
0.1
0.2
-0.1
-0.4
-0.4
-0.1
-0.2
0.0
0.0
-0.2
0.3
18.7
16.6
17.2
0.4
0
AJP
1.2
-1.0
0.1
0.5
0
AJP
0.9
-0.6
0.0
0.3
1
DAM
5.1
-0.3
0.4
1.1
0
DAM
1.0
-0.5
-0.1
0.3
1
DAM
1.6
-0.9
0.1
0.5
0.0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
37 of 39
0.0
-0.1
-0.9
0.0
0.3
0.2
-0.2
0.6
-0.2
0.2
1.6
0.3
-0.1
0.1
0.3
0.5
0.4
-0.7
-0.4
-0.3
0.2
0.1
-0.3
-0.3
0.1
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25X
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
17.8
17.6
17.4
16.7
17.1
17.3
17.2
17.1
17.1
18.2
18.5
17.3
17.6
17.7
17.3
17.4
17.6
18.2
17.6
18.1
17.7
17.8
17.4
17.3
18.1
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 15
File No:
20910715
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
0.4
0.2
-0.1
0.3
0.3
-0.1
0.3
0.4
-0.1
-1.0
-0.7
-0.4
-0.3
-0.6
0.1
0.2
0.0
0.3
0.3
-0.3
0.0
0.5
0.3
0.3
0.2
21
25
20Mar09
MFG 7Days
Unmated
1.0
0.6
0.0
0.7
0.4
-0.1
0.1
0.1
-0.2
-1.0
0.5
-0.2
-0.2
-0.1
0.3
0.4
-0.3
0.1
-0.2
-0.4
-0.3
1.3
-0.1
-0.2
0.0
22
27
31Mar09
1X
0.2
0.3
-0.4
0.0
-0.2
-0.2
-0.2
-0.2
-0.2
-1.1
-0.5
0.1
-0.3
-0.6
0.5
0.0
0.6
0.6
0.2
1.3
-0.4
0.5
0.8
0.0
0.8
21
30
30Mar09
MFG 7Days
mated
0.0
-0.1
-0.3
0.3
-0.6
-0.3
-0.2
0.1
-0.3
-1.0
-0.4
-0.3
0.3
-0.2
-0.2
-0.3
0.1
-0.2
0.0
0.1
-0.2
0.7
-0.1
-0.2
0.0
18.5
16.7
17.6
0.4
0
AJP
0.5
-1.0
0.0
0.4
0
AJP
1.3
-1.0
0.1
0.5
0
DAM
1.3
-1.1
0.1
0.5
0
DAM
0.7
-1.0
-0.1
0.3
0
DAM
1.1
-1.3
0.0
0.5
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
38 of 39
0.4
1.1
0.6
0.7
0.2
0.0
0.1
0.1
-0.1
-1.3
-0.3
-0.2
-0.2
-0.3
0.0
-0.2
0.2
-0.6
0.1
-0.4
-0.2
0.9
-0.1
0.2
0.2
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209107
Customer:
Samtec
Product:
ERF8/ERM8
Description: 50Au
Open circuit voltage:
20mv
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
30
09Mar09
Initial
22
30
11Mar09
25x
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
18.2
17.5
17.6
17.2
17.3
17.6
17.4
17.0
18.3
16.8
17.1
17.0
17.0
17.5
18.0
17.6
17.7
17.6
17.5
17.7
17.4
18.0
18.0
18.0
18.0
MAX
MIN
AVG
STD
Open
Tech
Equip ID
Spec: EIA 364 TP 23
Subgroup: 1 SampleID# 16A
File No:
20910716A
Tech:
DAM
Current:
100mv
21
25
20Mar09
1X
0.8
0.6
0.2
0.8
0.6
0.2
0.0
0.5
-0.4
0.2
0.5
0.2
0.3
0.5
0.5
0.4
0.8
0.1
1.4
0.8
0.4
0.8
0.2
1.2
-0.1
21
25
20Mar09
MFG 7Days
Unmated
0.8
0.9
0.2
0.4
0.5
-0.5
0.0
0.7
-1.0
0.5
0.3
0.5
0.4
0.2
-0.2
0.4
-0.4
0.5
0.1
-0.4
0.5
-0.4
-0.3
-0.4
-0.2
22
27
31Mar09
1X
0.7
0.9
0.1
1.0
0.8
-0.2
-0.2
0.0
-0.8
0.6
0.3
0.3
0.3
0.6
-0.5
0.9
0.7
0.8
0.8
-0.1
0.2
0.5
0.3
0.3
0.6
21
30
30Mar09
MFG 7Days
mated
0.2
0.1
-0.4
-0.1
0.3
-0.3
0.0
0.3
-1.1
0.0
0.2
0.5
-0.1
0.1
-0.2
-0.1
0.8
0.0
1.2
-0.2
0.6
0.1
0.1
0.0
-0.1
18.3
16.8
17.6
0.4
0
AJP
1.4
-0.4
0.5
0.4
0
AJP
0.9
-1.0
0.1
0.5
0
DAM
1.0
-0.8
0.4
0.5
0
DAM
1.2
-1.1
0.1
0.4
0
DAM
7.1
-1.4
0.1
1.5
0
DAM
244
1116
244
1116
323
297
323
297
323
297
323
297
Test Laboratory
TR#209107-1, REV.1.2
39 of 39
7.1
0.3
-0.3
0.5
0.1
-0.2
0.0
0.4
-1.4
0.0
0.1
0.0
0.4
-0.2
-0.3
-0.5
0.2
-0.3
-0.3
-0.8
-0.3
-0.8
-0.4
-0.5
-0.9
Contech Research
An Independent Test and Research Laboratory