dave heading and bp1

OCTOBER 18, 2012
TEST REPORT #212459
REVISION 1.1
MIXED FLOWING GAS
TESTING
SEAM8/SEAF8 CONNECTOR SERIES
SAMTEC, INC.
APPROVED BY: DOMINIC ARPINO
PROJECT ENGINEERING MANAGER
CONTECH RESEARCH, INC.
ATTLEBORO, MA
Test Laboratory
Contech Research
An Independent Test and Research Laboratory
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
10/18/2012
1.0
Initial Issue
DA
10/31/2012
1.1
Editorial changes on the cover
page and on page 4.
DA
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CERTIFICATION
This is to certify that the evaluation described herein was
designed and executed by personnel of Contech Research, Inc.
It was performed with the concurrence of Samtec, Inc., of New
Albany, IN who was the test sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1
and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
Dominic Arpino
Project Engineering Manager
Contech Research, Inc.
Attleboro, MA
DA: cf
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SCOPE
To perform Mixed Flowing Gas testing on the SEAM8/SEAF8
connector series as manufactured and submitted by the test
sponsor Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Standard: EIA Publication 364
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
SAMPLE SIZE:
Quantity 8
Part Numbers:
SEAM8-30-S05.0-S-06-2
SEAF8-30-05.0-S-06-2
PCB-102170-TST-XX
2.
Test samples were supplied assembled and terminated to test
boards by the test sponsor.
3.
Test leads were attached to the appropriate measurement
areas of the test samples and applicable mating elements.
4.
The test samples were tested in their ‘as received’
condition.
5.
Spacers were assembled to each test sample to maintain
stability between the mated pairs during LLCR measurements
and mated Mixed Flowing Gas exposure.
6.
Unless otherwise specified in the test procedures used, no
further preparation was used.
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TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #1, for test sequences
used.
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner
which remained legible for the test duration.
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FIGURE #1
TEST PLAN FLOW DIAGRAM
SAMPLE PREPARATION
LLCR
DURABILITY
(20x)
LLCR
MIXED FLOWING GAS
7 DAYS UNMATED
LLCR
CYCLE 1X
LLCR
MIXED FLOWING GAS
7 DAYS MATED
LLCR
CYCLE 1X
LLCR
SEAM8/SEAF8 CONNECTOR SERIES
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DATA SUMMARY
TEST
REQUIREMENT
RESULTS
LLCR
RECORD
18.8 mΩ MAX.
DURABILITY
NO DAMAGE
PASSED
LLCR
+10.0 mΩ MAX.CHG.
+7.9 mΩ MAX.CHG.
MFG –UNMATED
NO DAMAGE
PASSED
LLCR
+10.0 mΩ MAX.CHG.
+9.8 mΩ MAX.CHG.
CYCLE 1X
NO DAMAGE
PASSED
LLCR
+10.0 mΩ MAX.CHG.
+6.0 mΩ MAX.CHG.
MFG –MATED
NO DAMAGE
PASSED
LLCR
+10.0 mΩ MAX.CHG.
+8.3 mΩ MAX.CHG.
CYCLE 1X
NO DAMAGE
PASSED
LLCR
+10.0 mΩ MAX.CHG.
+6.7 mΩ MAX.CHG.
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EQUIPMENT LIST
ID#
340
436
443
510
525
543
601
650
677
1011
1108
1294
1371
1380
1381
1571
1589
1595
1599
1651
Next Cal
Last Cal
11/1/2012
11/1/2011
3/2/2013
11/3/2012
3/2/2012
11/3/2011
5/29/2013
5/29/2012
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Cal
X-Y Table
Gas Regulator
Gas Regulator Valve
Regulator
Gas Regulator
Analytical Balance
Computer
Digital Multimeter
Micro-Ohm Meter
MFG Chamber
Elect.Liquid Level Control
MFG Control Panel
Drill Press Stand
Scanner Main Frame
Air Dryer
Chlorine Analyzer
Computer
H2S Analyzer
NO2 Analyzer
Temp/Humidity Transmitter
NE Affiliated Tech.
Liquid Carboinc Co.
Liquid Carbonic Co.
Liquid Carbonic
Superior Co.
Ohaus Co.
A.M.I.
Hewlett Packard
Keithley Instr.
Contech Research
Cole Parmer
Contech Research
Sears
Keithley
Balston
IMS CO.
IBM
Teledyne Analyzer
Teledyne Analyzer
Vaisala
XY-6060
702-S-3
DRK-2-48
SGS 160C
5113A
AP250D
P111-450
34401A
580
8 Cu Ft
2225
N/A
335
7011
75-20
Air Sentury
Dans Office
101-E
200E
HMT333
N/A
392838
40197
M2 42366
350218
MO9198
082714
US36032126
0685122
N/A
026286
N/A
25926
0672970
A03391
1265AN
N/A
1231
289
F1250116
N/A
N/A
See Manual
N/A
See Manual
± .4mg
N/A
See Cal Cert
See Cal Cert
N/A
N/A
N/A
N/A
See Manual
See Manual
See Cal Cert
N/A
N/A
N/A
See Cal Cert
N/A
N/A
N/A
N/A
N/A
12 mon
N/A
12 mon
12 mon
N/A
N/A
N/A
N/A
Ea Test
N/A
EA Test
N/A
N/A
N/A
12 mon
Contech Research
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TEST RESULTS
SEQUENCE 1
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PROJECT NO.: 212459
SPECIFICATION: EIA-364-23
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 connectors
TECHNICIAN: BE
-----------------------------------------------------------START DATE: 9/25/12
COMPLETE DATE: 9/25/12
-----------------------------------------------------------ROOM AMBIENT:
22°C
RELATIVE HUMIDITY: 41%
-----------------------------------------------------------EQUIPMENT ID#: 601, 677
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23.
-continued on next page.
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PROCEDURE: -continued
2.
Test Conditions:
a) Test Current
: 10 milliamps maximum
b) Open Circuit Voltage
: 20 millivolts
c) No. of Positions Tested : 24 per test sample
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
A-1
A-2
A-3
A-4
A-5
A-6
A-7
A-8
2.
Avg.
17.2
16.7
17.1
16.9
16.5
16.8
16.8
16.9
Max.
18.8
17.8
18.1
18.6
17.8
18.6
17.7
18.5
Min.
16.3
16.0
16.2
16.1
15.5
16.0
16.2
16.2
See the attached data files for individual data points.
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PROJECT NO.: 212459
SPECIFICATION: EIA-364-09
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 connectors
TECHNICIAN: BE
-----------------------------------------------------------START DATE: 9/25/12
COMPLETE DATE: 9/25/12
-----------------------------------------------------------ROOM AMBIENT: 21°C
RELATIVE HUMIDITY: 44%
-----------------------------------------------------------EQUIPMENT ID#: 340, 1371
-----------------------------------------------------------DURABILITY
PURPOSE:
1.
This is a preconditioning sequence which is used to induce
the type of wear on the contacting surfaces which may occur
under normal service conditions. The connectors are mated
and unmated a predetermined number of cycles. Upon
completion, the units being evaluated are exposed to the
environments as specified to assess any impact on
electrical stability resulting from wear or other wear
dependent phenomenon.
2.
This type or preconditioning sequence is also used to
mechanically stress the connector system as would normally
occur in actual service. This sequence in conjunction with
other tests is used to determine if a significant loss of
contact pressure occurs from said stresses which in turn,
may result in an unstable electrical condition to exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 09.
2.
Test Conditions:
a) No. of Cycles : 20X
b) Rate
: 1.0 inch per minute
3.
The mating part (small board) was assembled to special
holding devices; the part (large board) was attached to an
X-Y table. Speed is approximate.
-continued on next page.
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PROCEDURE: -continued
4.
The test samples were axially aligned to accomplish the
mating and unmating function allowing for self centering
movement.
5.
Care was taken to prevent the mating faces of the test
samples from contacting each other.
6.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples so tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
A-1
A-2
A-3
A-4
A-5
A-6
A-7
A-8
3.
Avg.
Change
+0.8
+0.6
0.0
0.0
+1.2
-0.1
+0.1
+0.7
Max.
Change
+5.9
+7.9
+1.2
+1.1
+4.9
+1.4
+1.2
+4.4
See the attached data files for individual data points.
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PROJECT NO.: 212459
SPECIFICATION: EIA-364-65
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8
TECHNICIAN: AJP
-----------------------------------------------------------START DATE: 9/26/12
COMPLETE DATE: 10/11/12
-----------------------------------------------------------ROOM AMBIENT: 21°C
RELATIVE HUMIDITY: 48%
-----------------------------------------------------------EQUIPMENT ID#: 436, 443, 510, 525, 543, 650, 1011, 1108, 1294,
1380, 1381, 1571, 1589, 1595, 1599, 1651
-----------------------------------------------------------MIXED FLOWING GAS
PURPOSE:
1.
To determine the impact on electrical stability of contact
interfaces when the test samples are exposed to a mixed
flowing gas environment. Said environment is based on
field data simulating typical, severe, non-benign
environments. Said exposure is indicative of expected
behavior in the field.
2.
Mixed flowing gas tests (MFG) are environmental test
procedures whose primary purpose is to evaluate product
performance under simulated storage or operating (field)
conditions. For parts involving plated contact surfaces,
such tests are also used to measure the effect of plating
degradation (due to the environment) on the electrical and
durability properties of a contact or connector system.
The specific test conditions are usually chosen so as to
simulate, in the test laboratory, the effects of certain
representative field environments or environmental severity
levels on standard metallic surfaces.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364-55B, Class IIA.
-continued on next page.
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PROCEDURE:
2.
-continued
Environmental Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Temperature
Relative Humidity
C12
NO2
H2S
SO2
Exposure Time
Mating Conditions
:
:
:
:
:
:
:
:
30°C ± 1°C
70% ± 2%
10 ± 3 ppb
200 ± 50 ppb
10 ± 5 ppb
100 ± 20 ppb
14 days
unmated/mated
3.
The test chamber was allowed to stabilize at the specified
conditions indicated.
4.
After stabilization, the test samples and control coupons
were placed in the chamber such that they were no closer
than 2.0" from each other and/or the chamber walls.
5.
The test samples were handled in a manner so as not to
disturb the contact interface.
6.
After placement of the test samples in the chamber, it was
allowed to re-stabilize and adjusted as required to
maintain the specified concentrations and conditions.
7.
The test chamber was monitored periodically during the
exposure period to assure the environmental conditions as
specified were maintained.
8.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of damage or corrosion to the
test samples as exposed which will cause mechanical or
electrical malfunction of the said samples.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS: See Next Page
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RESULTS:
1.
There was no evidence of any mechanical or electrical
malfunction following the Mixed Flowing Gas (MFG) exposure.
2.
The low level circuit resistance did not exceed the +10.0
milliohms. See the attached data files for individual data
points.
3.
The following is a summary of the data observed following
the 7 days unmated exposure.
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Avg.
Change
Sample ID#
A-1
A-2
A-3
A-4
A-5
A-6
A-7
A-8
4.
+2.0
+0.3
-0.2
+0.5
+0.4
+0.5
+0.7
+0.4
Max.
Change
+9.8
+4.9
+1.6
+2.6
+2.1
+3.7
+4.6
+5.3
The following is a summary of the data observed following
1X cycle.
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
A-1
A-2
A-3
A-4
A-5
A-6
A-7
A-8
Avg.
Change
+0.4
+0.2
+0.7
+0.2
+0.5
+0.3
+0.3
+0.3
Max.
Change
+5.9
+1.1
+5.5
+6.0
+2.3
+3.0
+2.6
+4.1
-continued on next page.
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RESULTS: -continued
5.
The following is a summary of the data observed following
the 7 days mated exposure, (14 days total).
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Avg.
Change
Sample ID#
A-1
A-2
A-3
A-4
A-5
A-6
A-7
A-8
6.
+0.7
+0.8
+0.9
+2.3
+1.4
+0.7
+2.0
+2.1
Max.
Change
+8.3
+3.3
+4.1
+7.7
+4.4
+5.6
+8.3
+5.2
The following is a summary of the data observed following
1X cycle.
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
A-1
A-2
A-3
A-4
A-5
A-6
A-7
A-8
7.
Avg.
Change
+1.6
+1.4
+1.4
+0.9
+1.2
+0.9
+0.9
+1.8
Max.
Change
+5.5
+6.2
+6.6
+6.7
+3.8
+4.5
+4.5
+6.1
See the attached data files for individual data points.
-continued on next page.
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RESULTS: -continued
8.
Five copper coupons were placed in the chamber for 2 of the
first 7 days. Five additional coupons were placed in the
chamber for 2 of the last 7 days of exposure. Upon removal
said coupons were evaluated via weight gain technique with
the following results:
WEIGHT GAIN (µgm/cm2/Day)
Coupon No.
1st 7 days
Last 7 days
1
12+
12+
2
12
13
3
13+
13+
4
14+
12+
5
12
14+
Requirement:
9.
12 to 16 µgm/cm2/Day
Figure #2 illustrates the samples as exposed to the
environment.
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FIGURE #2
TEST SAMPLES EXPOSED INSIDE THE MFG CHAMBER
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LLCR DATA FILES
FILE NUMBERS
Group A
21245901
21245902
21245903
21245904
21245905
21245906
21245907
21245908
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Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
0.0
1.8
9.1
0.5
3.1
3.0
5.6
4.4
0.2
-1.3
0.3
0.7
0.2
0.2
1.2
0.1
0.8
4.5
0.9
-0.4
1.2
0.5
9.8
0.2
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245901
BE
10mA
A-1-1
A-1-2
A-1-3
A-1-4
A-1-5
A-1-6
A-1-7
A-1-8
A-1-9
A-1-10
A-1-11
A-1-12
A-1-13
A-1-14
A-1-15
A-1-16
A-1-17
A-1-18
A-1-19
A-1-20
A-1-21
A-1-22
A-1-23
A-1-24
16.9
17.3
17.8
17.6
17.2
16.6
17.4
18.1
18.2
18.0
17.5
16.9
17.0
16.5
16.9
18.8
16.5
16.6
16.3
18.6
16.4
16.5
16.7
16.7
21
44
25Sep12
Durability
20X
0.0
0.8
5.9
0.0
2.7
4.9
1.5
4.5
-0.5
-1.4
-0.1
-0.1
-0.4
0.2
-0.3
0.1
0.6
0.3
0.8
-0.7
0.5
0.2
-0.5
-0.3
MAX
MIN
AVG
STD
Open
Tech
18.8
16.3
17.2
0.7
0
BE
5.9
-1.4
0.8
1.9
0
BE
9.8
-1.3
2.0
2.9
0
BE
5.9
-1.2
0.4
1.3
0
BE
8.3
-1.0
0.7
1.9
0
BE
5.5
-0.2
1.6
1.6
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
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11Oct12
1X
0.3
0.3
0.2
-0.6
0.8
1.0
0.7
-0.5
-1.2
-0.9
0.4
0.5
-0.1
1.1
-0.3
5.9
0.9
0.8
0.5
-0.5
0.4
0.5
0.0
-0.4
21
43
11Oct12
MFG 14d
Mated
0.6
0.1
1.9
-1.0
-0.1
1.2
2.9
-0.7
2.3
-0.7
-0.3
-0.2
-0.6
0.1
-0.4
8.3
0.7
1.1
0.2
-0.1
0.6
0.8
0.5
-0.2
1.4
0.1
2.8
1.0
5.5
1.9
0.2
3.8
0.1
0.3
2.2
0.8
0.9
0.6
1.7
1.0
0.9
5.4
0.8
-0.2
1.9
0.4
4.1
0.8
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
0.3
0.3
0.8
4.9
0.9
-0.1
0.3
0.1
0.7
0.2
0.6
0.0
0.1
0.8
-0.2
0.7
-1.0
-1.4
-0.1
-0.3
-0.7
0.4
0.7
0.1
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245902
BE
10mA
A-2-1
A-2-2
A-2-3
A-2-4
A-2-5
A-2-6
A-2-7
A-2-8
A-2-9
A-2-10
A-2-11
A-2-12
A-2-13
A-2-14
A-2-15
A-2-16
A-2-17
A-2-18
A-2-19
A-2-20
A-2-21
A-2-22
A-2-23
A-2-24
16.6
17.0
16.8
16.6
16.6
16.7
16.3
17.0
16.3
16.3
16.7
16.4
16.0
16.7
16.9
17.5
17.8
17.6
16.3
17.5
17.4
16.6
16.1
16.2
21
44
25Sep12
Durability
20X
-0.2
-0.3
7.9
0.1
1.6
1.9
3.8
2.4
0.2
-0.2
0.4
-0.6
0.8
-0.5
0.6
-1.2
-0.5
-0.9
0.3
-1.4
-1.3
0.5
0.7
0.5
MAX
MIN
AVG
STD
Open
Tech
17.8
16.0
16.7
0.5
0
BE
7.9
-1.4
0.6
2.0
0
BE
4.9
-1.4
0.3
1.1
0
BE
1.1
-0.9
0.2
0.5
0
BE
3.3
-0.7
0.8
0.9
0
BE
6.2
-0.2
1.4
1.7
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
Test Laboratory
TR#212459, REV.1.1
22 of 28
21
43
11Oct12
1X
0.4
0.7
1.1
-0.1
0.9
0.0
0.1
0.2
0.6
0.4
0.3
-0.1
0.3
0.4
-0.4
-0.3
-0.9
0.6
-0.1
-0.1
-0.4
0.7
0.8
0.1
21
43
11Oct12
MFG 14d
Mated
0.4
0.4
1.3
0.6
1.5
0.1
0.4
2.3
1.8
0.6
3.3
0.0
0.4
0.4
1.2
1.5
-0.7
0.7
-0.1
0.1
-0.6
1.3
1.1
0.4
1.4
0.5
3.3
-0.2
6.2
0.4
0.0
3.1
0.2
0.5
5.0
0.2
0.9
2.6
0.2
0.9
0.1
3.6
0.4
1.9
0.2
1.1
0.5
0.4
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
-0.4
-0.6
0.0
0.4
-0.4
-0.5
1.6
-0.4
-0.7
0.1
-0.1
0.4
-0.6
-0.8
-0.2
-0.6
-0.5
-0.8
-0.4
0.3
0.5
0.3
-0.6
0.1
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245903
BE
10mA
A-3-1
A-3-2
A-3-3
A-3-4
A-3-5
A-3-6
A-3-7
A-3-8
A-3-9
A-3-10
A-3-11
A-3-12
A-3-13
A-3-14
A-3-15
A-3-16
A-3-17
A-3-18
A-3-19
A-3-20
A-3-21
A-3-22
A-3-23
A-3-24
16.8
16.9
17.3
16.8
17.1
17.4
16.4
17.2
17.7
16.6
16.5
16.2
17.5
17.5
16.4
17.5
17.2
17.6
16.6
17.6
18.0
16.8
18.1
17.0
21
44
25Sep12
Durability
20X
0.1
-0.5
0.5
0.5
0.8
-0.1
0.2
0.3
-0.6
-0.1
1.2
0.4
-0.4
0.0
0.2
-0.8
-0.6
0.3
-0.2
-0.1
0.2
0.0
-0.8
-0.3
MAX
MIN
AVG
STD
Open
Tech
18.1
16.2
17.1
0.5
0
BE
1.2
-0.8
0.0
0.5
0
BE
1.6
-0.8
-0.2
0.6
0
BE
5.5
-1.4
0.7
1.7
0
BE
4.1
-1.3
0.9
1.5
0
BE
6.6
-1.0
1.4
2.0
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
Test Laboratory
TR#212459, REV.1.1
23 of 28
21
43
11Oct12
1X
-0.1
0.0
5.5
-0.3
2.9
0.4
4.3
4.0
0.6
0.1
0.6
0.6
0.2
-0.4
0.7
-0.3
-0.4
-0.5
0.6
-0.4
-0.8
0.3
-1.4
0.1
21
43
11Oct12
MFG 14d
Mated
-0.2
0.1
4.1
2.2
4.0
0.1
4.0
2.4
0.7
0.0
0.5
1.1
0.3
-0.3
0.8
-0.3
1.0
-0.5
0.7
0.8
-1.3
1.0
-1.3
2.3
0.7
0.3
2.8
2.8
6.6
4.3
5.6
3.6
-0.4
1.5
0.8
1.4
1.4
-0.5
2.1
-0.4
1.0
0.8
-0.2
0.1
-1.0
0.1
-0.9
0.4
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
0.1
1.0
-0.1
0.3
0.6
0.8
-0.1
0.7
-0.5
-0.2
-0.5
0.3
0.2
-0.2
0.5
0.7
0.2
2.6
1.4
0.6
-0.2
2.1
0.6
0.0
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245904
BE
10mA
A-4-1
A-4-2
A-4-3
A-4-4
A-4-5
A-4-6
A-4-7
A-4-8
A-4-9
A-4-10
A-4-11
A-4-12
A-4-13
A-4-14
A-4-15
A-4-16
A-4-17
A-4-18
A-4-19
A-4-20
A-4-21
A-4-22
A-4-23
A-4-24
16.5
16.7
16.7
16.1
16.6
16.3
16.6
16.4
17.1
16.3
17.0
16.2
16.4
17.6
16.5
18.2
17.0
16.9
16.3
18.5
18.4
18.6
16.5
16.5
21
44
25Sep12
Durability
20X
-0.3
0.6
0.9
0.1
-0.2
0.8
1.0
1.1
0.4
-0.4
0.5
0.2
0.3
0.1
0.4
-1.0
-0.6
0.0
0.5
-0.8
-2.2
-2.4
-0.5
0.4
MAX
MIN
AVG
STD
Open
Tech
18.6
16.1
16.9
0.8
0
BE
1.1
-2.4
0.0
0.9
0
BE
2.6
-0.5
0.5
0.8
0
BE
6.0
-1.9
0.2
1.6
0
BE
7.7
-0.8
2.3
2.9
0
BE
6.7
-0.9
0.9
1.6
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
Test Laboratory
TR#212459, REV.1.1
24 of 28
21
43
11Oct12
1X
0.1
-0.2
-0.1
0.2
6.0
-0.2
-0.4
2.1
-1.1
-0.3
-0.3
-0.2
-0.1
-1.3
-0.2
-0.5
-0.8
3.4
-0.1
-0.3
-0.7
-1.9
1.7
0.1
21
43
11Oct12
MFG 14d
Mated
0.7
-0.3
7.5
7.7
7.6
0.4
0.1
2.1
1.0
0.3
-0.2
1.7
0.3
-0.1
1.1
5.1
-0.7
5.0
1.4
5.7
0.7
-0.8
2.1
7.3
0.4
0.2
0.4
0.2
1.7
1.4
0.7
1.9
0.7
1.5
0.0
2.1
0.8
-0.8
0.8
-0.7
0.0
6.7
1.5
-0.5
-0.9
-0.3
3.2
0.7
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
-0.3
0.1
2.1
0.4
1.4
1.2
0.0
0.5
0.6
-0.1
0.6
0.3
0.2
-0.3
-0.4
1.4
-0.3
-0.2
0.5
1.1
-0.3
-1.3
1.5
1.9
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245905
BE
10mA
A-5-1
A-5-2
A-5-3
A-5-4
A-5-5
A-5-6
A-5-7
A-5-8
A-5-9
A-5-10
A-5-11
A-5-12
A-5-13
A-5-14
A-5-15
A-5-16
A-5-17
A-5-18
A-5-19
A-5-20
A-5-21
A-5-22
A-5-23
A-5-24
16.4
16.6
16.4
16.3
15.9
16.5
16.7
16.4
16.4
16.1
16.1
15.9
16.3
16.4
16.4
17.0
16.3
17.2
15.5
17.1
16.7
17.8
16.4
16.1
21
44
25Sep12
Durability
20X
0.1
0.3
4.9
0.6
2.7
4.8
3.8
4.4
1.1
1.5
1.2
1.5
0.7
1.1
0.9
-0.2
0.7
-0.5
0.6
0.3
0.5
-1.3
-0.2
0.2
MAX
MIN
AVG
STD
Open
Tech
17.8
15.5
16.5
0.5
0
BE
4.9
-1.3
1.2
1.7
0
BE
2.1
-1.3
0.4
0.8
0
BE
2.3
-1.8
0.5
0.7
0
BE
4.4
-0.3
1.4
1.2
0
BE
3.8
-2.0
1.2
1.3
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
Test Laboratory
TR#212459, REV.1.1
25 of 28
21
43
11Oct12
1X
-0.1
0.4
1.7
0.5
1.4
0.2
1.1
1.1
0.2
0.3
0.4
0.3
0.0
0.7
-0.1
0.3
0.3
0.1
0.2
0.4
0.4
-1.8
2.3
0.5
21
43
11Oct12
MFG 14d
Mated
0.2
0.6
3.2
0.8
3.9
1.5
4.4
1.8
1.5
0.8
0.3
0.8
-0.3
0.9
0.7
0.9
0.9
0.4
0.2
2.6
0.8
0.7
2.5
2.9
0.6
0.9
3.3
1.0
2.6
1.4
0.3
3.8
1.0
0.4
2.4
1.1
0.8
1.2
0.4
0.0
1.4
0.5
0.4
3.2
1.1
-2.0
3.4
0.5
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
0.7
0.4
3.7
0.1
0.5
0.5
0.3
1.4
0.3
0.0
-0.1
0.3
0.6
1.9
0.6
-1.0
0.0
0.5
-0.2
-0.1
-0.3
1.0
0.8
0.4
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245906
BE
10mA
A-6-1
A-6-2
A-6-3
A-6-4
A-6-5
A-6-6
A-6-7
A-6-8
A-6-9
A-6-10
A-6-11
A-6-12
A-6-13
A-6-14
A-6-15
A-6-16
A-6-17
A-6-18
A-6-19
A-6-20
A-6-21
A-6-22
A-6-23
A-6-24
16.0
16.2
16.5
16.5
16.4
16.7
16.7
16.7
16.7
16.4
17.4
16.3
16.8
16.3
16.6
18.6
16.8
17.0
16.5
18.0
17.9
16.6
16.8
16.1
21
44
25Sep12
Durability
20X
0.0
1.1
0.1
0.3
-0.1
-0.3
0.3
0.5
-0.5
-0.5
-1.4
-0.6
-0.5
0.3
-0.8
-0.5
-0.4
1.4
-0.3
0.4
-0.1
-0.4
-0.5
0.0
MAX
MIN
AVG
STD
Open
Tech
18.6
16.0
16.8
0.6
0
BE
1.4
-1.4
-0.1
0.6
0
BE
3.7
-1.0
0.5
0.9
0
BE
3.1
-1.7
0.3
1.0
0
BE
5.6
-0.5
0.7
1.4
0
BE
4.5
-0.3
0.9
1.2
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
Test Laboratory
TR#212459, REV.1.1
26 of 28
21
43
11Oct12
1X
0.7
0.3
0.5
1.1
1.0
-0.3
0.3
2.0
-0.6
-0.3
-0.3
-0.1
0.0
0.7
-0.2
-0.4
-0.4
2.3
-0.2
3.1
-1.7
0.3
-0.1
-0.1
21
43
11Oct12
MFG 14d
Mated
1.2
0.2
0.4
1.7
1.1
-0.2
0.9
2.6
-0.2
0.0
0.6
-0.3
-0.1
0.5
-0.3
0.2
-0.5
2.7
-0.3
5.6
0.4
0.3
-0.3
0.1
0.8
0.6
1.2
0.5
0.7
-0.3
0.2
2.8
0.2
0.6
0.8
1.2
0.7
1.1
0.1
1.0
-0.1
4.4
-0.3
4.5
0.6
-0.1
0.9
0.9
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
0.1
0.3
0.4
1.0
0.1
0.2
-0.6
4.0
0.3
1.0
1.2
0.9
0.5
0.3
0.6
-0.1
0.1
4.6
-0.3
0.3
0.3
0.5
1.0
-0.1
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245907
BE
10mA
A-7-1
A-7-2
A-7-3
A-7-4
A-7-5
A-7-6
A-7-7
A-7-8
A-7-9
A-7-10
A-7-11
A-7-12
A-7-13
A-7-14
A-7-15
A-7-16
A-7-17
A-7-18
A-7-19
A-7-20
A-7-21
A-7-22
A-7-23
A-7-24
16.3
16.6
17.2
16.6
17.5
17.2
17.5
16.8
17.2
16.2
16.4
16.4
16.5
16.7
16.4
17.7
16.6
17.1
16.9
17.2
16.8
16.6
16.4
16.8
21
44
25Sep12
Durability
20X
-0.2
0.7
-0.4
-0.1
0.2
0.0
-0.4
1.2
0.2
0.0
0.5
0.1
-0.1
0.7
0.0
0.4
-0.7
-0.4
-0.8
0.1
0.3
0.1
0.1
-0.3
MAX
MIN
AVG
STD
Open
Tech
17.7
16.2
16.8
0.4
0
BE
1.2
-0.8
0.1
0.4
0
BE
4.6
-0.6
0.7
1.2
0
BE
2.6
-1.1
0.3
0.8
0
BE
8.3
-0.9
2.0
2.0
0
BE
4.5
-0.5
0.9
1.2
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
Test Laboratory
TR#212459, REV.1.1
27 of 28
21
43
11Oct12
1X
-0.4
-0.4
1.2
-0.1
0.4
0.0
-1.1
1.1
0.0
0.4
0.3
0.2
0.2
-0.2
-0.3
2.6
-0.7
1.5
-0.4
0.6
-0.1
0.9
0.7
-0.2
21
43
11Oct12
MFG 14d
Mated
1.5
0.0
8.3
1.0
3.6
0.7
-0.9
3.1
4.2
1.7
1.5
0.7
1.5
1.3
0.0
2.8
-0.2
2.4
-0.4
2.2
4.5
2.9
1.4
3.1
0.7
0.0
1.1
0.6
2.5
-0.2
-0.4
4.5
-0.5
1.7
1.9
0.2
0.8
0.1
0.0
1.2
-0.1
1.9
-0.4
1.9
2.1
0.8
1.6
0.2
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance - Delta Values
Project:
212459
Customer:
Samtec
Product:
SEAF8-30-05.0-S-06-2 / SEAM8-30-S05.0-S-06-2
Description: Connectors
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
21
44
9/25/2012
Initial
21
57
03Oct12
MFG 7d
Unmated
0.2
0.6
-1.7
0.1
-0.9
-0.6
-0.7
-0.6
0.0
0.4
-0.6
-0.3
0.0
1.0
0.7
1.0
0.3
1.1
0.2
1.6
5.3
0.8
0.9
0.9
21
57
03Oct12
1X
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364,TP 23
Sequence 1
21245908
BE
10mA
A-8-1
A-8-2
A-8-3
A-8-4
A-8-5
A-8-6
A-8-7
A-8-8
A-8-9
A-8-10
A-8-11
A-8-12
A-8-13
A-8-14
A-8-15
A-8-16
A-8-17
A-8-18
A-8-19
A-8-20
A-8-21
A-8-22
A-8-23
A-8-24
16.8
16.8
18.5
16.6
17.5
17.6
17.4
18.0
16.9
16.6
17.3
16.8
16.5
16.5
16.6
16.5
16.9
16.9
16.3
16.8
16.2
16.4
16.2
16.4
21
44
25Sep12
Durability
20X
0.0
-0.1
3.5
-0.1
1.4
3.0
1.5
4.4
0.8
0.5
-0.1
0.2
-0.7
0.2
0.6
0.5
0.1
0.1
0.5
-0.3
0.4
0.6
0.2
0.4
MAX
MIN
AVG
STD
Open
Tech
18.5
16.2
16.9
0.6
0
BE
4.4
-0.7
0.7
1.2
0
BE
5.3
-1.7
0.4
1.3
0
BE
4.1
-0.7
0.3
1.0
0
BE
5.2
0.2
2.1
1.4
0
BE
6.1
-0.1
1.8
1.8
0
BE
Equip ID
601
677
601
677
601
677
601
677
601
677
601
677
Test Laboratory
TR#212459, REV.1.1
28 of 28
21
43
11Oct12
1X
-0.4
1.2
-0.6
0.2
-0.3
0.3
-0.3
0.3
0.4
2.0
-0.4
0.0
0.6
-0.1
-0.6
0.1
-0.7
0.4
-0.4
-0.2
4.1
0.3
0.6
-0.3
21
43
11Oct12
MFG 14d
Mated
0.2
5.2
4.8
2.2
1.1
2.8
3.3
0.4
3.8
2.2
1.2
1.0
2.0
0.8
1.8
2.6
1.1
1.4
1.0
3.6
4.0
2.0
0.8
0.7
0.2
0.1
-0.1
1.9
1.0
0.3
0.5
0.3
-0.1
3.4
2.0
1.9
6.1
5.3
1.5
2.1
0.9
2.7
0.5
2.8
2.7
0.9
5.6
0.5
Contech Research
An Independent Test and Research Laboratory