APRIL 28, 2009 TEST REPORT #209107-2 REV.1.1 MIXED FLOWING GAS TESTING CONNECTOR PART NUMBERS SEAF-50-05.0-X-10-1-A SEAM-50-02.0-X-10-1-A SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROJECT ENGINEERING MANAGER CONTECH RESEARCH, INC. ATTLEBORO, MA Test Laboratory Contech Research An Independent Test and Research Laboratory REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 4/28/2009 1.0 Initial Issue DA 4/29/2009 1.1 Added the connector part numbers to the cover page. DA Test Laboratory TR#209107-2, REV.1.1 2 of 39 Contech Research An Independent Test and Research Laboratory CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed with the concurrence of Samtec, Inc., of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and Contech Research. Dominic Arpino Project Engineering Manager Contech Research, Inc. Attleboro, MA DA:cf Test Laboratory TR#209107-2, REV.1.1 3 of 39 Contech Research An Independent Test and Research Laboratory SCOPE To perform Mixed Flowing Gas testing on SEAF/SEAM connector series as manufactured and submitted by the test sponsor Samtec, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Standards: EIA Publication 364 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Samtec, Inc., for the evaluation to be performed by Contech Research, Inc. TABLE 1 Connector Series a) SEAF/SEAM (30Au) b) SEAF/SEAM (50Au) Samtec Reference QTY TC0904-2208 TC0903-2181 8 8 2. Test samples were supplied assembled and terminated to test boards by the test sponsor. 3. The test samples were tested in their ‘as received’ condition. 4. Spacers were assembled to each test sample to maintain stability between the mated pair. 5. Unless otherwise specified in the test procedures used, no further preparation was used. TEST SELECTION 1. See Test Plan Flow Diagram, Figure #1, for test sequences used. Test Laboratory TR#209107-2, REV.1.1 4 of 39 Contech Research An Independent Test and Research Laboratory TEST SELECTION -continued 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification. SAMPLE CODING 1. All samples were coded. Mated test samples remained with each other throughout the test group/sequences for which they were designated. Coding was performed in a manner which remained legible for the test duration. 2. The test samples were coded in the following manner: Series File ID#’s SEAM/SEAF (30Au) 20910717 20910718A 20910719 20910720 20910722 20910723 20910760 20910777 SEAM/SEAF (50Au) 20910725 20910726 20910727 20910728 20910729 20910730A 20910731 20910732 Test Laboratory TR#209107-2, REV.1.1 5 of 39 Contech Research An Independent Test and Research Laboratory FIGURE #1 TEST PLAN FLOW DIAGRAM SAMPLE PREPARATION LLCR DURABILITY LLCR MFG EXPOSURE DURATION 7 DAYS UNMATED LLCR 1 CYCLE MATE/UNMATE LLCR MFG EXPOSURE DURATION 7 DAYS MATED LLCR 1 CYCLE MATE/UNMATE LLCR Group A Test Laboratory TR#209107-2, REV.1.1 6 of 39 Contech Research An Independent Test and Research Laboratory DATA SUMMARY TEST REQUIREMENT RESULT GROUP A LLCR SEAF/SEAM (30Au) SEAF/SEAM (50Au) RECORD RECORD 8.3 mΩ MAX. 8.9 mΩ MAX. DURABILITY SEAF/SEAM (30Au) SEAF/SEAM (50Au) NO DAMAGE NO DAMAGE PASSED PASSED LLCR SEAF/SEAM (30Au) SEAF/SEAM (50Au) +10.0 mΩ MAX.CHG. +10.0 mΩ MAX.CHG. +1.1 mΩ MAX.CHG. +2.9 mΩ MAX.CHG. MFG –UNMATED SEAF/SEAM (30Au) SEAF/SEAM (50Au) NO DAMAGE NO DAMAGE CORROSION CORROSION LLCR SEAF/SEAM (30Au) SEAF/SEAM (50Au) +10.0 mΩ MAX.CHG. +10.0 mΩ MAX.CHG. +4.4 mΩ MAX.CHG. +1.2 mΩ MAX.CHG. 1 CYCLE SEAF/SEAM (30Au) SEAF/SEAM (50Au) NO DAMAGE NO DAMAGE CORROSION CORROSION LLCR SEAF/SEAM (30Au) SEAF/SEAM (50Au) +10.0 mΩ MAX.CHG. +10.0 mΩ MAX.CHG. +2.9 mΩ MAX.CHG. +1.9 mΩ MAX.CHG. MFG – MATED SEAF/SEAM (30Au) SEAF/SEAM (50Au) NO DAMAGE NO DAMAGE CORROSION CORROSION LLCR SEAF/SEAM (30Au) SEAF/SEAM (50Au) +10.0 mΩ MAX.CHG. +10.0 mΩ MAX.CHG. +3.2 mΩ MAX.CHG. +0.9 mΩ MAX.CHG. Test Laboratory TR#209107-2, REV.1.1 7 of 39 Contech Research An Independent Test and Research Laboratory DATA SUMMARY -continued TEST REQUIREMENT RESULT GROUP A -continued 1 CYCLE SEAF/SEAM (30Au) SEAF/SEAM (50Au) NO DAMAGE NO DAMAGE CORROSION CORROSION LLCR SEAF/SEAM (30Au) SEAF/SEAM (50Au) +10.0 mΩ MAX.CHG. +10.0 mΩ MAX.CHG.. +7.3 mΩ MAX.CHG. +4.9 mΩ MAX.CHG. Test Laboratory TR#209107-2, REV.1.1 8 of 39 Contech Research An Independent Test and Research Laboratory EQUIPMENT LIST ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal 102 244 270 297 323 436 443 488 510 525 543 1027 1110 1116 1296 1381 1382 1507 1571 1595 1599 2/27/2010 9/22/2009 2/27/2009 9/22/2008 11/13/2009 11/13/2008 12/3/2009 12/3/2008 Data Acquisition Unit Micro-Ohm Meter MFG Chamber Micro-Ohm Meter Computer Gas Regulator Gas Regulator Valve X-Y Table Regulator Gas Regulator Analytical Balance Computer Elect.Liquid Level Control Computer MFG Control Panel Air Dryer Force Gage Stand Temp Humid Transmitter Chlorine Analyzer H2S Analyzer NO2 Analyzer Hewlett Packard Keithley Instr. Contech Research Keithley Instr. Legatech Liquid Carboinc Co. Liquid Carbonic Co. N.E.Affiliated Tech. Liquid Carbonic Superior Co. Ohaus Co. ARC Co. Cole Parmer ARC. Co. Contech Research Balston Chatilon Vaisala IMS CO. Teledyne Analyzer Teledyne Analyzer 3421A 580-1 5 Cu Ft 580 286-12 702-S-3 DRK-2-48 N/A SGS 160C 5113A AP250D Pent.133 7187 P111-450 N/A 75-20 20025 HMT333 Air Sentury 101-E 200E 2338A02027 467496 N/A 485414 N/A 392838 40197 932021 M2 42366 350218 MO9198 026871 15986 ±. 5 %Of Indicated See Cal Cert N/A See Cal Cert N/A N/A See Manual N/A N/A See Owners Manual ± .4mg N/A N/A N/A N/A See Manual N/A See Cal Cert See Manual See Manual See cert 12mon 12mon Ea Test 12mon N/A N/A N/A N/A N/A N/A 12mon N/A N/A N/A N/A N/A N/A 12mon EA Test Each Test 12mon 4/6/2010 4/6/2009 N/A A03391 N/A C1110019 1265AN 1231 289 Test Laboratory Contech Research TR#209107-2, REV.1.1 9 of 39 An Independent Test and Research Laboratory TEST RESULTS GROUP A Test Laboratory TR#209107-2, REV.1.1 10 of 39 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209107-2 SPECIFICATION: EIA-364 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: See page 4 -----------------------------------------------------------SAMPLE SIZE: 16 connectors TECHNICIAN: DAM, AJP -----------------------------------------------------------START DATE: 3/6/09 COMPLETE DATE: 3/10/09 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 25% -----------------------------------------------------------EQUIPMENT ID#: 244, 297, 323, 1116 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23 with the following conditions. 2. Test Conditions: a) Test Current : 100 milliamps maximum b) Open Circuit Voltage : 20 millivolts c) No. of Positions Tested : 25 per test sample Test Laboratory TR#209107-2, REV.1.1 11 of 39 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 3. The points of application are shown in Figure #2. -----------------------------------------------------------REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# Avg. Max. Min. 5.3 5.9 5.5 5.7 5.5 5.6 5.7 6.2 5.9 6.7 6.2 6.4 6.1 7.0 6.4 8.3 4.9 4.9 4.8 4.8 4.9 4.8 5.1 5.0 GP 1 SEAF/SEAM-(30Au) 2-17 2-18A 2-19 2-20 2-22 2-23 2-60 2-77 LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# Avg. Max. Min. 6.6 5.5 5.8 5.6 5.7 5.4 6.0 6.2 8.9 6.4 7.6 7.3 7.5 6.1 8.0 7.9 5.1 5.0 4.9 5.0 4.6 4.8 5.2 4.9 GP 1 SEAF/SEAM -(50Au) 2-25 2-26 2-27 2-28 2-29 2-30A 2-31 2-32 2. See the attached data files for individual data points. Test Laboratory TR#209107-2, REV.1.1 12 of 39 Contech Research An Independent Test and Research Laboratory FIGURE #2 TYPICAL LLCR SET UP +V +I Connector pair -V -I Buss wires are soldered to the 2 PTH’s Test Laboratory TR#209107-2, REV.1.1 13 of 39 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209107-2 SPECIFICATION: EIA-364 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: See page 4 -----------------------------------------------------------SAMPLE SIZE: 16 connectors TECHNICIAN: DAM -----------------------------------------------------------START DATE: 3/10/09 COMPLETE DATE: 3/11/09 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 25% -----------------------------------------------------------EQUIPMENT ID#: 488, 1382 -----------------------------------------------------------DURABILITY PURPOSE: 1. This is a preconditioning sequence which is used to induce the type of wear on the contacting surfaces which may occur under normal service conditions. The connectors are mated and unmated a predetermined number of cycles. Upon completion, the units being evaluated are exposed to the environments as specified to assess any impact on electrical stability resulting from wear or other wear dependent phenomenon. 2. This type or preconditioning sequence is also used to mechanically stress the connector system as would normally occur in actual service. This sequence in conjunction with other tests is used to determine if a significant loss of contact pressure occurs from said stresses which in turn, may result in an unstable electrical condition to exist. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 09. 2. Test Conditions: a) No. of Cycles b) Rate 3. : 25X : 1.0 inch per minute The samples were cycled using an X Y Table and a drill press stand. -continued on next page. Test Laboratory TR#209107-2, REV.1.1 14 of 39 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples so tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: Sample ID# CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Avg. Max. Change Change GP 1 SEAF/SEAM -(30Au) 2-17 2-18A 2-19 2-20 2-22 2-23 2-60 2-77 2. +0.2 -0.1 -0.1 +0.0 +0.2 -0.1 -0.4 -0.7 +0.7 +0.9 +0.7 +0.8 +1.1 +0.5 -0.1 +0.6 See the attached data files for individual data points. -continued on next page. Test Laboratory TR#209107-2, REV.1.1 15 of 39 Contech Research An Independent Test and Research Laboratory RESULTS: -continued 3. The following is a summary of the data observed: Sample ID# CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Avg. Max. Change Change GP 1 SEAF/SEAM -(50Au) 2-25 2-26 2-27 2-28 2-29 2-30A 2-31 2-32 -0.8 -0.4 -0.5 -0.6 -0.6 +0.3 -0.8 -0.7 +2.9 +0.3 +0.3 +0.1 +0.4 +1.5 +0.0 +0.4 4. See the attached data files for individual data points. Test Laboratory TR#209107-2, REV.1.1 16 of 39 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209107-2 SPECIFICATION: EIA-364-65 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: See page 4 -----------------------------------------------------------SAMPLE SIZE: 16 connectors TECHNICIAN: WJC -----------------------------------------------------------START DATE: 3/13/09 COMPLETE DATE: 3/30/09 -----------------------------------------------------------ROOM AMBIENT: 21°C RELATIVE HUMIDITY: 48% -----------------------------------------------------------EQUIPMENT ID#: 102, 270, 436, 443, 510, 525, 543, 1027, 1110 1296, 1381, 1507, 1571, 1595, 1599 -----------------------------------------------------------MIXED FLOWING GAS PURPOSE: 1. To determine the impact on electrical stability of contact interfaces when the test samples are exposed to a mixed flowing gas environment. Said environment is based on field data simulating typical, severe, non-benign environments. Said exposure is indicative of expected behavior in the field. 2. Mixed flowing gas tests (MFG) are environmental test procedures whose primary purpose is to evaluate product performance under simulated storage or operating (field) conditions. For parts involving plated contact surfaces, such tests are also used to measure the effect of plating degradation (due to the environment) on the electrical and durability properties of a contact or connector system. The specific test conditions are usually chosen so as to simulate, in the test laboratory, the effects of certain representative field environments or environmental severity levels on standard metallic surfaces. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 65 with the following conditions. -continued on next page. Test Laboratory TR#209107-2, REV.1.1 17 of 39 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 2. Environmental Conditions: a) b) c) d) e) f) g) h) Temperature Relative Humidity C12 NO2 H2S SO2 Exposure Time Mating Conditions : : : : : : : : 30°C ± 1°C 70% ± 2% 10 ± 3 ppb 200 ± 50 ppb 10 ± 5 ppb 100 ± 20 ppb 14 days First 7 days -unmated Second 7 days -mated 3. The test chamber was allowed to stabilize at the specified conditions indicated. 4. After stabilization, the test samples and control coupons were placed in the chamber such that they were no closer than 2.0" from each other and/or the chamber walls. 5. The test samples were handled in a manner so as not to disturb the contact interface. 6. After placement of the test samples in the chamber, it was allowed to re-stabilize and adjusted as required to maintain the specified concentrations and conditions. 7. The test chamber was monitored periodically during the exposure period to assure the environmental conditions as specified were maintained. 8. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of damage or corrosion to the test samples as exposed which will cause mechanical or electrical malfunction of the said samples. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: See Next Page Test Laboratory TR#209107-2, REV.1.1 18 of 39 Contech Research An Independent Test and Research Laboratory RESULTS: 1. Some evidence of corrosion was observed on the contact interface. 2. The following is a summary of the data observed following the 7 days unmated portion of the exposure: MAXIMUM CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# GP 1 SEAF/SEAM -(30Au) 2-17 2-18A 2-19 2-20 2-22 2-23 2-60 2-77 Avg. Change Max. Change @ 7 Days +0.3 +0.5 +0.5 +0.2 +0.6 +0.2 +0.0 -0.8 Avg. Change Max. Change 1 Cycle +1.4 +4.4 +2.1 +1.1 +2.0 +1.6 +1.2 +0.1 +0.6 +0.3 +0.4 +0.3 +0.8 +0.0 +0.4 -0.9 +2.3 +2.3 +1.3 +1.3 +2.9 +1.0 +1.5 +0.1 MAXIMUM CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# GP 1 SEAF/SEAM -(50Au) 2-25 2-26 2-27 2-28 2-29 2-30A 2-31 2-32 Avg. Change Max. Change Avg. Change @ 7 Days -0.7 -0.3 -0.2 -0.5 -0.3 -0.10 -0.7 -0.9 Max. Change 1 Cycle +1.2 +0.4 +0.8 +0.4 +0.8 +0.6 +0.5 +0.6 -0.9 -0.4 -0.5 -0.5 -0.3 -0.1 -0.8 -0.9 +1.9 +0.0 +0.8 +0.3 +1.1 +0.4 +0.0 +0.5 -continued on next page. Test Laboratory TR#209107-2, REV.1.1 19 of 39 Contech Research An Independent Test and Research Laboratory RESULTS: -continued 3. The following is a summary of the data observed following the 14 days portion of the exposure: MAXIMUM CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# GP 1 SEAF/SEAM -(30Au) 2-17 2-18A 2-19 2-20 2-22 2-23 2-60 2-77 Avg. Change Max. Change @ 14 Days +0.3 +0.4 +0.2 +0.3 +0.4 -0.2 +0.1 -0.9 Avg. Change Max. Change 1 Cycle +1.6 +3.2 +1.3 +1.7 +1.6 +0.6 +1.7 +0.1 +0.7 +0.4 +1.1 +0.4 +0.6 +0.0 +0.2 +0.2 +2.2 +1.7 +7.3 +2.3 +1.7 +2.7 +2.5 +2.6 MAXIMUM CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# GP 1 SEAF/SEAM -(50Au) 2-25 2-26 2-27 2-28 2-29 2-30A 2-31 2-32 4. Avg. Change Max. Change Avg. Change @ 14 Days -1.3 -0.5 -0.8 -0.5 -0.5 -0.2 +0.6 +0.8 Max. Change 1 Cycle +0.2 +0.2 +0.0 +0.6 +0.8 +0.3 +0.0 +0.9 -1.1 -0.3 -0.3 -0.2 -0.1 +0.1 +0.6 +0.9 +0.7 +0.3 +1.3 +4.9 +1.5 +0.8 +0.1 +1.0 See the attached data files for individual data points. -continued on next page. Test Laboratory TR#209107-2, REV.1.1 20 of 39 Contech Research An Independent Test and Research Laboratory RESULTS: -continued 5. Five copper coupons were placed in the chamber. Upon removal said coupons were evaluated via weight gain technique with the following results: WEIGHT GAIN (µgm/cm2/Day) Coupon No. Unmated 1 2 3 4 5 Requirement: 12+ 13 14 13+ 14+ Mated Mated 15 13+ 14 14 13 14+ 14 12+ 13 13+ 12 to 16 µgm/cm2/Day Note: Third column of coupon data represents the coupon data for the additional samples tested. Test Laboratory TR#209107-2, REV.1.1 21 of 39 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES FILE NUMBERS 30 Au Group 20910717 20910718A 20910719 20910720 20910722 20910723 20910760 20910777 Test Laboratory TR#209107-2, REV.1.1 22 of 39 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30AU Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 5.1 5.2 5.3 5.7 5.5 4.9 5.0 5.9 5.2 5.4 5.4 5.0 5.0 5.0 5.2 5.0 5.4 5.2 5.2 5.2 5.2 5.3 5.8 5.6 5.7 MAX MIN AVG STD Open Tech Equip ID 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 17 File No: 20910717 Tech: DAM Current: 100mv 21 25 20Mar09 1X 0.4 -0.2 0.4 -0.5 0.1 0.1 0.2 0.7 0.0 0.4 0.7 0.1 0.3 0.5 -0.1 -0.1 0.1 0.1 -0.2 0.6 0.4 0.0 -0.3 0.7 0.0 21 25 20Mar09 7 Days Unmated 0.5 -0.2 0.1 -0.5 0.3 0.2 0.1 0.6 -0.3 0.1 0.3 0.1 0.1 0.5 0.4 0.6 0.5 0.2 0.1 1.4 0.6 0.3 1.3 0.3 0.0 22 27 31Mar09 1X 0.2 0.2 0.5 0.1 0.7 0.1 0.0 0.7 -0.1 0.8 0.2 1.8 0.9 2.3 1.0 0.5 1.6 0.4 0.5 1.0 0.8 0.0 -0.1 0.7 0.2 21 30 30Mar09 7 Days mated 0.0 -0.1 0.3 -0.2 0.2 0.1 -0.1 0.4 -0.2 0.4 0.0 1.0 0.5 1.6 0.4 0.1 0.8 0.1 -0.1 0.8 0.5 0.0 -0.4 0.4 0.2 5.9 4.9 5.3 0.3 0 DAM 0.7 -0.5 0.2 0.3 0 AJP 1.4 -0.5 0.3 0.4 0 MHB 2.3 -0.1 0.6 0.6 0 MHB 1.6 -0.4 0.3 0.4 0 DAM 2.2 -0.6 0.7 0.7 0 DAM 323 297 244 1116 1276 207 1276 207 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 23 of 39 1.3 0.2 0.3 -0.6 0.7 0.6 0.4 1.7 0.1 0.0 0.5 0.2 1.3 0.7 0.5 0.9 0.5 1.2 0.0 1.6 0.9 2.2 0.0 1.9 -0.2 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30AU Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 26 12Mar09 25X 4.9 6.3 5.3 6.2 5.6 5.5 6.2 5.1 6.6 5.6 5.4 5.7 5.9 6.3 5.6 5.6 5.9 6.7 5.4 6.4 6.0 6.4 5.7 6.4 6.2 MAX MIN AVG STD Open Tech Equip ID 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 18A File No: 20910718A Tech: DAM Current: 100mv 22 30 06Apr09 1X 0.3 -0.1 0.4 -0.6 0.7 -0.1 -0.4 -0.1 -1.0 0.0 0.1 0.2 -0.7 -0.8 0.6 0.9 0.0 0.1 0.1 -0.9 0.2 -0.3 -0.7 -0.8 -1.0 21 25 20Mar09 7 Days Unmated 0.4 0.1 0.5 -0.8 0.3 3.7 -0.1 0.0 -0.1 1.0 0.2 1.1 -0.6 -0.8 2.9 1.0 -0.1 4.4 1.0 -0.2 1.2 -0.6 -0.3 -1.2 -0.4 22 26 13Apr09 1X 0.5 0.4 0.1 -1.1 -0.1 2.3 2.0 -0.1 0.8 0.5 0.9 0.6 0.0 -0.7 0.5 1.2 0.0 -0.2 0.6 -0.3 0.2 -0.3 0.4 -0.8 -0.5 22 26 13Apr09 7 Days Mated 0.4 0.7 0.5 -0.4 0.1 1.2 1.7 0.0 0.4 0.5 0.8 0.4 0.2 -0.4 0.4 3.2 -0.1 -0.1 0.1 -0.2 0.1 0.2 0.8 -0.2 0.0 6.7 4.9 5.9 0.5 0 DAM 0.9 -1.0 -0.1 0.5 0 AJP 4.4 -1.2 0.5 1.4 0 MHB 2.3 -1.1 0.3 0.8 0 DAM 3.2 -0.4 0.4 0.8 0 DAM 1.7 -1.0 0.4 0.6 0 DAM 323 297 244 1116 1276 207 323 297 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 24 of 39 0.4 -0.4 1.1 -0.8 0.7 1.0 0.4 0.9 1.2 1.7 0.6 0.3 0.4 0.2 0.7 1.5 0.0 0.0 0.4 -0.2 0.2 0.9 0.6 -1.0 0.4 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30AU Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 4.8 5.5 5.3 5.8 5.1 5.0 6.2 5.1 4.9 5.4 5.6 5.3 5.3 5.5 6.0 5.8 5.6 5.2 5.8 5.9 5.7 5.8 5.9 6.0 6.1 MAX MIN AVG STD Open Tech Equip ID 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 19 File No: 20910719 Tech: DAM Current: 100mv 21 25 20Mar09 1X 0.5 -0.1 -0.2 -0.4 -0.1 0.0 -0.7 -0.1 0.0 -0.2 0.2 -0.4 0.1 -0.7 -0.6 0.5 -0.4 0.0 -0.3 -0.4 -0.1 0.3 0.7 -0.3 -0.2 21 25 20Mar09 7 Days Unmated 1.3 0.5 0.3 1.0 1.3 0.1 -0.3 -0.1 0.9 0.8 1.5 0.4 0.3 -0.1 0.3 2.1 -0.2 0.2 0.3 -0.3 -0.2 0.3 2.1 0.8 -0.1 22 27 31Mar09 1X 1.3 0.4 0.3 0.3 0.7 0.4 -0.1 0.1 0.5 0.3 1.0 0.4 0.2 -0.2 0.4 1.1 0.2 0.1 0.4 -0.1 0.5 0.8 0.8 0.3 -0.1 21 30 30Mar09 7 Days mated 1.3 0.5 0.2 0.4 0.5 0.2 -0.3 0.0 0.3 0.3 0.8 0.2 0.1 -0.4 0.0 0.6 -0.3 0.1 -0.2 -0.2 0.0 0.3 0.6 -0.2 -0.3 6.2 4.8 5.5 0.4 0 DAM 0.7 -0.7 -0.1 0.4 0 DAM 2.1 -0.3 0.5 0.7 0 MHB 1.3 -0.2 0.4 0.4 0 MHB 1.3 -0.4 0.2 0.4 0 DAM 7.3 0.0 1.1 1.4 0 DAM 323 297 323 297 1276 207 1276 207 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 25 of 39 7.3 1.2 0.9 1.1 0.4 0.3 0.8 0.8 0.2 0.8 0.8 0.5 0.4 0.0 1.0 1.8 0.5 0.4 1.2 0.9 1.2 2.6 1.7 0.7 0.0 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30AU Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 5.0 6.4 5.2 5.9 5.8 6.0 5.9 5.4 4.8 6.1 5.8 5.9 5.2 5.6 5.9 5.8 5.2 6.0 5.3 5.7 6.0 6.1 6.1 6.1 6.2 MAX MIN AVG STD Open Tech Equip ID 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 20 File No: 20910720 Tech: DAM Current: 100mv 21 25 20Mar09 1X 0.2 0.8 0.1 -0.7 0.3 -0.5 0.1 0.0 0.3 0.0 0.5 -0.2 -0.1 -0.4 -0.5 -0.2 -0.2 -0.1 0.5 0.1 0.1 0.1 0.3 0.0 0.0 21 25 20Mar09 7 Days Unmated 0.1 0.7 0.0 -0.5 -0.5 -0.6 0.1 0.0 0.2 -0.8 1.1 -0.7 0.1 -0.3 -0.1 0.6 -0.2 0.6 0.6 0.9 1.0 -0.2 0.8 0.8 0.3 22 27 31Mar09 1X 0.6 0.7 0.0 0.2 0.2 -0.6 0.2 -0.1 0.2 1.3 0.7 0.0 0.1 0.6 0.4 0.3 -0.2 0.9 0.7 0.9 1.0 -0.2 0.4 0.2 0.2 21 30 30Mar09 7 Days mated 0.6 0.5 -0.1 -0.7 0.1 -0.8 0.2 -0.3 0.0 0.3 0.2 -0.5 -0.2 0.2 0.0 0.6 0.0 1.7 0.7 0.9 1.1 0.5 1.3 0.2 0.6 6.4 4.8 5.7 0.4 0 DAM 0.8 -0.7 0.0 0.3 0 DAM 1.1 -0.8 0.2 0.6 0 MHB 1.3 -0.6 0.3 0.4 0 AJP 1.7 -0.8 0.3 0.6 0 DAM 2.3 -0.9 0.4 0.8 0 DAM 323 297 323 297 1276 207 244 1116 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 26 of 39 0.7 1.5 0.5 -0.7 0.4 1.0 0.3 0.3 0.3 -0.7 0.5 -0.9 0.1 0.0 -0.6 0.7 -0.3 0.1 2.3 1.0 0.1 -0.1 1.7 2.2 0.7 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30AU Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 5.4 5.6 5.7 5.1 5.3 5.3 5.7 5.7 5.8 6.0 5.8 5.5 4.9 5.2 5.0 5.2 4.9 5.7 5.1 6.1 5.5 5.3 5.9 5.3 5.5 MAX MIN AVG STD Open Tech Equip ID 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 22 File No: 20910722 Tech: DAM Current: 100mv 21 25 20Mar09 1X -0.1 0.0 0.3 -0.1 0.3 -0.2 -0.1 0.3 0.3 1.1 0.2 0.3 0.0 0.1 0.4 0.2 0.6 0.1 0.6 -0.1 0.6 0.0 1.0 -0.2 0.0 21 25 20Mar09 7 Days Unmated 2.0 0.9 0.4 -0.2 1.3 -0.1 1.2 1.0 0.1 1.7 0.4 -0.2 0.3 0.6 0.3 1.1 0.8 0.1 0.7 -0.5 1.8 0.0 1.6 -0.3 0.7 22 27 31Mar09 1X 0.8 1.7 1.2 0.0 2.3 0.4 0.8 0.6 0.2 1.1 0.4 0.9 0.1 0.9 0.5 0.5 2.9 0.2 1.7 -0.3 1.0 0.0 1.7 0.6 0.1 21 30 30Mar09 7 Days mated 0.4 0.1 0.5 -0.2 1.2 0.2 0.2 0.0 -0.2 0.3 0.2 0.4 0.0 0.8 0.4 0.4 1.6 0.2 1.0 0.3 1.1 0.1 0.7 0.1 0.1 6.1 4.9 5.5 0.3 0 DAM 1.1 -0.2 0.2 0.3 0 AJP 2.0 -0.5 0.6 0.7 0 MHB 2.9 -0.3 0.8 0.8 0 AJP 1.6 -0.2 0.4 0.4 0 DAM 1.7 -0.2 0.6 0.5 0 DAM 323 297 244 1116 1276 207 244 1116 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 27 of 39 1.1 0.3 0.5 -0.2 0.8 0.3 0.0 0.2 -0.1 1.0 0.7 0.2 0.3 0.7 0.4 1.7 0.8 0.4 0.6 0.4 0.9 1.5 0.7 0.0 1.5 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30Au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 22 30 11Mar09 Initial 22 26 12Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 4.8 6.1 5.8 7.0 5.8 5.6 5.4 5.7 5.2 6.3 5.2 5.9 5.5 5.4 5.5 5.2 5.4 5.8 5.2 5.9 5.6 5.3 5.4 5.7 5.5 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 23 File No: 20910723 Tech: DAM Current: 100mv 22 30 06Apr09 1X 0.3 -0.3 0.1 -1.5 0.2 -0.7 0.1 -0.2 -0.1 -1.1 -0.4 0.0 -0.3 0.1 -0.1 -0.2 0.5 0.4 0.2 -0.5 0.3 0.1 -0.2 0.1 -0.1 21 25 20Mar09 7 Days Unmated 0.8 1.6 -0.5 -0.5 0.8 -0.7 -0.1 0.0 0.1 -0.6 1.0 0.4 0.8 0.1 -0.2 0.0 0.6 0.5 0.0 0.0 0.4 -0.1 0.1 -0.1 0.8 20 27 14Apr09 1X 1.0 0.4 -0.6 -1.1 0.4 -0.7 -0.2 -0.6 0.4 -0.8 0.6 -0.6 0.9 0.6 -0.1 -0.1 -0.2 -0.2 -0.1 -0.2 0.7 0.0 0.1 -0.4 0.2 22 26 13Apr09 7 Days mated 0.6 0.2 -0.8 -1.4 0.1 -0.7 -0.2 -0.8 0.0 -1.0 0.0 -0.8 0.4 0.6 -0.4 -0.2 -0.1 -0.2 0.3 0.0 0.4 0.0 0.1 -0.4 0.3 7.0 4.8 5.6 0.4 0 AJP 0.5 -1.5 -0.1 0.5 0 AJP 1.6 -0.7 0.2 0.5 0 MHB 1.0 -1.1 0.0 0.6 0 DAM 0.6 -1.4 -0.2 0.5 0 DAM 2.7 -0.9 0.0 0.8 0 DAM 244 1116 244 1116 1276 207 323 297 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 28 of 39 2.7 0.2 -0.5 -0.9 0.2 -0.6 -0.3 -0.5 -0.1 -0.6 0.1 -0.7 0.0 0.1 0.4 -0.3 1.8 -0.1 -0.1 -0.2 0.2 0.1 -0.2 -0.4 1.0 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30AU Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 6.0 5.4 5.7 5.5 6.1 5.1 5.4 5.4 5.5 6.2 6.0 5.2 6.4 5.5 5.4 5.7 5.7 5.9 5.2 5.3 5.6 5.8 5.7 6.3 6.2 MAX MIN AVG STD Open Tech Equip ID 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 60 File No: 20910760 Tech: DAM Current: 100mv 22 30 06Apr09 1X 22 26 13Apr09 7 Days 22 26 13Apr09 1X -0.4 -0.3 -0.5 -0.5 -0.3 -0.2 -0.4 -0.2 -0.3 -1.0 -0.8 -0.4 -0.8 -0.9 -0.2 -0.2 -0.2 -0.5 -0.2 -0.2 -0.2 -0.5 -0.3 -0.1 -0.3 21 25 20Mar09 7 Days Unmated -0.4 -0.3 -0.4 -0.5 -0.7 0.0 -0.3 -0.3 -0.2 -0.8 -0.7 0.3 0.8 -0.1 0.6 -0.3 1.0 1.2 -0.1 -0.2 0.1 -0.1 0.2 0.4 -0.2 -0.1 0.3 0.3 0.1 1.5 0.7 0.2 0.0 0.6 0.5 1.5 0.6 1.5 0.1 0.4 0.4 1.5 0.7 0.0 -0.1 0.0 -0.1 0.3 -0.3 -0.2 -0.2 0.1 -0.1 -0.2 0.1 0.5 0.0 -0.5 -0.4 -0.7 0.4 -0.3 0.2 -0.4 0.1 -0.2 0.3 1.7 0.0 0.3 0.1 0.9 0.7 0.0 -0.1 -0.4 -0.1 0.1 0.0 -0.6 2.3 -0.2 -0.1 -0.2 2.5 -0.5 0.4 1.3 -0.1 0.6 -0.2 -0.2 0.5 -0.1 0.0 -0.2 -0.3 0.0 0.3 0.1 6.4 5.1 5.7 0.4 0 DAM -0.1 -1.0 -0.4 0.2 0 DAM 1.2 -0.8 0.0 0.5 0 MHB 1.5 -0.3 0.4 0.6 0 DAM 1.7 -0.7 0.1 0.5 0 DAM 2.5 -0.6 0.2 0.8 0 DAM 323 297 323 297 1276 207 323 297 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 29 of 39 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 30AU Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 22 30 06Apr09 Initial 22 30 06Apr09 25x 5.0 5.9 5.6 5.9 5.5 5.2 5.2 7.6 6.7 6.7 6.8 5.4 6.6 5.7 7.4 8.3 5.6 7.9 5.7 6.6 6.3 6.2 6.5 5.6 5.9 MAX MIN AVG STD Open Tech Equip ID 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 77 File No: 20910777 Tech: DAM Current: 100mv 22 26 13Apr09 1X 0.6 0.4 0.0 -0.3 -0.2 0.1 -0.1 -1.8 -1.2 -0.3 -1.6 -0.4 -1.5 -0.3 -2.0 -3.1 -0.6 -1.7 0.1 -0.6 -0.6 0.3 -1.4 -0.3 -0.4 22 26 13Apr09 MFG 7 Days Unmated 0.2 0.4 -0.5 -0.6 -0.3 -0.2 0.2 -2.0 -1.3 -0.8 -1.5 -0.5 -0.5 -0.6 -1.9 -2.7 -0.5 -1.9 -0.2 -0.9 -0.6 0.3 -1.0 -0.2 -0.5 21 40 22Apr09 1X 0.0 0.0 -0.6 -0.5 -0.5 -0.2 0.1 -2.1 -1.4 -0.9 -1.6 -0.5 -0.8 -0.7 -1.9 -2.1 -0.6 -2.3 -0.3 -1.0 -0.6 -0.1 -0.6 -0.3 -0.3 21 40 22Apr09 MFG 7 Days mated 0.1 -0.1 -0.6 -0.6 -0.6 -0.2 0.0 -2.1 -1.6 -1.2 -1.7 -0.6 -1.2 -0.7 -2.1 -2.3 -0.6 -2.2 -0.3 -1.2 -0.5 0.0 -1.0 -0.4 -0.3 8.3 5.0 6.2 0.9 0 DAM 0.6 -3.1 -0.7 0.9 0 DAM 0.4 -2.7 -0.7 0.8 0 DAM 0.1 -2.3 -0.8 0.7 0 DAM 0.1 -2.3 -0.9 0.7 0 DAM 2.6 -2.4 0.2 1.3 0 DAM 323 297 323 297 323 297 323 297 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 30 of 39 1.7 1.4 -0.3 -0.3 2.5 0.1 2.6 -1.3 -1.0 0.1 -1.4 -0.5 2.4 -0.5 -1.5 1.2 -0.3 -2.4 -0.3 0.0 0.8 1.2 -1.0 0.6 0.1 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES FILE NUMBERS 50 Au Group 20910725 20910726 20910727 20910728 20910729 20910730A 20910731 20910732 Test Laboratory TR#209107-2, REV.1.1 31 of 39 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50Au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 22 30 11Mar09 Initial 22 26 12Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.1 6.8 6.8 7.1 5.5 5.5 5.8 6.2 7.1 7.3 6.9 6.4 7.9 6.1 6.3 8.9 6.5 7.8 5.5 6.5 6.5 7.1 6.0 6.5 6.4 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 25 File No: 20910725 Tech: DAM Current: 100mv 21 25 20Mar09 1X 0.0 -0.5 -1.6 -1.6 -0.4 -0.5 -0.3 -0.9 -1.9 -2.2 -1.7 -1.3 -2.4 0.5 -0.9 -2.9 -1.1 -1.8 -0.4 0.5 -0.2 2.9 1.0 -0.8 -0.8 21 25 20Mar09 MFG 7 Days Unmated -0.1 -0.7 -0.5 -1.6 -0.2 -0.2 0.2 -0.9 -1.5 -1.0 -1.3 -1.0 -1.7 -0.7 -0.5 -0.9 -1.0 -2.2 -0.2 -0.5 -0.6 -0.6 1.2 -0.4 -0.7 21 30 30Mar09 1X -0.1 -1.3 -1.5 -1.9 -0.4 -0.1 0.3 -0.7 -1.6 -1.4 -1.5 -1.4 -1.9 -1.0 -1.2 -2.4 -1.4 -2.6 -0.6 0.1 -0.6 -0.3 1.9 -1.0 -1.0 21 30 30Mar09 MFG 7 Day Mated -0.4 -1.1 -1.8 -2.1 -0.4 -0.5 0.2 -0.9 -1.9 -1.7 -1.8 -1.6 -2.9 -1.3 -1.2 -3.2 -1.6 -2.5 -0.7 -0.3 -1.1 -1.0 0.2 -1.3 -1.1 8.9 5.1 6.6 0.8 0 AJP 2.9 -2.9 -0.8 1.2 0 AJP 1.2 -2.2 -0.7 0.7 0 AJP 1.9 -2.6 -0.9 1.0 0 AJP 0.2 -3.2 -1.3 0.9 0 AJP 0.7 -2.8 -1.1 0.9 0 AJP 244 1116 244 1116 244 1116 244 1116 244 1116 244 1116 Test Laboratory TR#209107-2, REV.1.1 32 of 39 -0.1 -1.4 -1.7 -1.9 -0.5 -0.5 0.0 -1.1 -2.1 -1.7 -1.5 -1.6 -2.2 -1.1 -1.1 -2.8 -1.4 -2.6 -0.7 -0.5 -0.7 -0.8 0.7 -1.1 0.0 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.3 6.1 5.4 5.3 5.3 5.3 5.6 5.1 5.0 5.3 5.7 5.1 5.3 5.3 5.7 6.0 5.2 5.9 5.0 5.9 6.4 5.7 5.4 5.8 6.0 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 26 File No: 20910726 Tech: DAM Current: 100mv 21 25 20Mar09 1X -0.5 -0.3 -0.2 -0.4 -0.4 -0.2 0.0 -0.1 -0.1 -0.7 -0.5 -0.5 -0.6 -0.4 -0.9 -0.3 0.0 -0.9 -0.3 -0.3 -1.1 -0.3 0.3 -0.2 -0.7 21 25 20Mar09 MFG 7 Days Unmated -0.3 -0.1 0.1 0.4 -0.3 -0.2 0.1 -0.2 -0.2 -0.2 0.2 -0.1 -0.5 -0.5 -0.9 -0.6 0.1 -1.3 -0.4 -0.4 -1.0 -0.6 0.1 -0.5 -0.1 21 30 30Mar09 1X -0.2 -0.3 -0.2 -0.4 -0.2 -0.5 -0.2 -0.1 0.0 -0.4 -0.3 -0.5 -0.4 -0.5 -0.8 -0.8 -0.1 -1.0 -0.3 -0.1 -1.1 -0.4 0.0 0.0 0.0 21 30 30Mar09 MFG 7 Days Mated -0.2 -0.4 -0.4 -0.5 -0.2 -0.3 -0.2 -0.4 0.0 -0.4 -0.5 -0.5 -0.7 -0.7 -1.1 -0.9 -0.2 -1.2 -0.2 -0.5 -1.3 -0.5 -0.3 -0.3 0.2 6.4 5.0 5.5 0.4 0 AJP 0.3 -1.1 -0.4 0.3 0 AJP 0.4 -1.3 -0.3 0.4 0 AJP 0.0 -1.1 -0.4 0.3 0 AJP 0.2 -1.3 -0.5 0.3 0 AJP 0.3 -1.0 -0.3 0.4 0.0 AJP 244 1116 244 1116 244 1116 244 1116 244 1116 244 1116 Test Laboratory TR#209107-2, REV.1.1 33 of 39 0.1 -0.4 0.0 -0.3 -0.2 0.2 0.1 -0.4 0.2 -0.4 0.3 -0.2 -0.4 -0.6 -0.9 -0.3 -0.2 -1.0 -0.3 0.0 -0.9 -0.5 -0.2 -0.5 0.0 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.3 5.7 5.3 5.6 5.6 5.4 5.7 5.1 5.6 6.6 5.4 4.9 7.0 5.2 7.4 5.2 5.2 7.6 5.3 5.6 6.5 6.3 6.5 6.1 5.9 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 27 File No: 20910727 Tech: DAM Current: 100mv 21 25 20Mar09 1X 0.0 0.3 -0.2 -0.2 0.0 0.1 -0.2 0.1 -0.1 -0.7 -0.1 -0.3 -1.9 -0.3 -2.3 -0.3 -0.5 -2.1 -0.3 -0.2 -1.3 -0.1 0.0 -0.7 -0.2 21 25 20Mar09 MFG 7 Days Unmated -0.1 -0.3 0.0 0.7 0.4 0.8 0.0 0.0 -0.1 -0.1 0.2 0.0 -1.2 0.0 -1.5 0.0 -0.2 -1.5 -0.2 -0.1 -0.9 -0.3 -0.7 -0.5 0.0 21 30 30Mar09 1X -0.2 -0.1 -0.3 -0.4 0.8 0.3 0.0 0.2 -0.4 -1.2 0.0 -0.1 -1.4 -0.3 -2.2 -0.3 -0.1 -2.4 -0.4 -0.1 -1.3 -0.4 -0.4 -0.9 -0.3 21 30 30Mar09 MFG 7 Day Mated -0.2 -0.6 -0.7 -0.7 0.0 -0.1 -0.5 -0.3 -0.7 -1.4 -0.3 -0.2 -1.8 -0.5 -2.4 -0.5 -0.2 -2.5 -0.6 -0.3 -1.5 -0.8 -0.6 -1.2 -0.3 7.6 4.9 5.8 0.7 0 AJP 0.3 -2.3 -0.5 0.7 0 AJP 0.8 -1.5 -0.2 0.6 0 AJP 0.8 -2.4 -0.5 0.7 0 AJP 0.0 -2.5 -0.8 0.7 0.0 AJP 1.3 -2.4 -0.3 0.8 0.0 AJP 244 1116 244 1116 244 1116 244 1116 244 1116 244 1116 Test Laboratory TR#209107-2, REV.1.1 34 of 39 0.0 0.0 -0.2 0.0 0.2 1.3 0.2 0.0 -0.4 -0.5 -0.2 -0.2 -1.8 -0.3 -2.3 -0.4 -0.4 -2.4 -0.4 -0.5 -1.2 0.7 0.5 -0.7 0.2 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.6 5.3 5.2 7.3 5.6 5.1 5.2 5.5 5.0 5.7 5.3 5.6 5.2 5.2 5.9 5.4 5.2 5.4 5.9 5.4 5.6 5.8 6.1 6.1 5.4 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 28 File No: 20910728 Tech: DAM Current: 100mv 21 25 20Mar09 1X -0.3 -0.3 -0.5 -2.2 -0.8 0.1 -0.3 -0.3 -0.4 -1.1 -0.6 -0.2 -0.5 -0.5 -1.3 -0.6 -0.4 -0.6 -1.0 -0.4 -0.4 -0.3 -0.5 -0.4 -0.1 21 25 20Mar09 MFG 7 Days Unmated -0.4 -0.4 -0.6 -2.1 -0.7 0.4 -0.4 -0.2 0.0 -1.0 -0.3 -0.6 -0.4 -0.5 -1.1 -0.7 -0.5 -0.6 -1.0 0.0 -0.3 -0.8 -0.5 -0.6 0.0 21 30 30Mar09 1X -0.5 -0.4 -0.7 -2.1 -0.7 0.3 -0.5 -0.2 0.0 -1.0 -0.3 -0.6 -0.4 -0.5 -1.0 -0.7 -0.5 -0.6 -1.0 0.0 -0.3 -0.8 -0.5 -0.7 0.0 21 30 30Mar09 MFG 7 Day Unmated -0.5 -0.6 -0.6 -2.2 -0.7 0.6 -0.3 -0.3 -0.2 -0.9 -0.4 -0.7 -0.4 -0.4 -0.9 -0.8 -0.5 -0.7 -1.2 0.6 -0.5 -0.7 -0.4 -0.5 0.2 7.3 5.0 5.6 0.5 0 AJP 0.1 -2.2 -0.6 0.5 0 AJP 0.4 -2.1 -0.5 0.5 0 AJP 0.3 -2.1 -0.5 0.5 0 AJP 0.6 -2.2 -0.5 0.5 0 AJP 4.9 -2.3 -0.2 1.2 0 AJP 244 1116 244 1116 244 1116 244 1116 244 1116 244 1116 Test Laboratory TR#209107-2, REV.1.1 35 of 39 1.2 -0.1 -0.3 -2.3 -0.8 4.9 -0.3 -0.2 -0.1 -0.7 -0.4 -0.7 -0.4 -0.4 -1.1 -0.7 -0.5 -0.5 -1.1 0.6 -0.5 -0.6 -0.4 -0.5 -0.2 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 4.8 6.3 7.5 6.2 7.3 5.8 5.9 5.5 4.9 6.3 5.6 7.2 5.5 5.2 6.8 5.2 5.0 5.2 4.6 5.6 6.1 5.7 5.1 5.0 5.0 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 29 File No: 20910729 Tech: DAM Current: 100mv 21 25 20Mar09 1X 0.0 -0.6 -2.6 -1.0 -1.9 -0.5 -0.9 -0.7 -0.1 -1.2 0.0 -2.4 -0.4 -0.6 -0.7 -0.4 0.0 -0.5 0.0 0.4 -0.9 -0.2 -0.2 0.1 0.2 21 25 20Mar09 MFG 7 Days Unmated 0.0 0.8 -2.5 0.2 -0.5 -0.7 0.3 -0.4 -0.1 -1.1 -0.1 -2.3 -0.6 -0.3 -1.3 -0.2 -0.1 -0.5 0.2 0.4 -0.9 0.1 0.2 0.3 0.4 21 30 30Mar09 1X 0.4 -0.2 -2.3 1.1 -0.8 -0.3 0.0 -0.4 0.1 -1.3 0.7 -1.8 -0.5 0.0 -1.5 -0.1 0.0 -0.5 0.2 0.3 -0.6 0.2 0.0 0.3 0.7 21 30 30Mar09 MFG 7 Day Mated 0.5 -0.2 -2.5 0.8 -1.8 -0.9 -0.2 -0.5 0.0 -1.3 0.2 -1.6 -0.6 -0.4 -1.9 -0.3 -0.1 -0.5 0.1 0.3 -0.4 -0.7 0.0 0.3 -0.5 7.5 4.6 5.7 0.8 0 AJP 0.4 -2.6 -0.6 0.8 0 AJP 0.8 -2.5 -0.3 0.8 0 AJP 1.1 -2.3 -0.3 0.8 0 AJP 0.8 -2.5 -0.5 0.8 0 AJP 1.5 -2.1 -0.1 0.7 0 AJP 244 1116 244 1116 244 1116 244 1116 244 1116 244 1116 Test Laboratory TR#209107-2, REV.1.1 36 of 39 0.3 -0.3 -2.1 -0.3 -1.3 -0.7 -0.1 -0.1 0.0 -0.8 0.5 -1.6 -0.1 0.0 -0.4 0.5 0.4 -0.1 0.2 0.8 -0.1 0.0 0.2 0.0 1.5 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.1 5.7 5.1 5.3 5.9 5.3 6.1 5.1 5.1 5.5 5.0 4.8 5.5 5.2 5.9 5.7 5.5 5.8 5.2 5.6 5.8 5.4 5.6 5.3 5.6 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 30A File No: 20910730A Tech: DAM Current: 100mv 22 30 06Apr09 1X 0.1 0.1 0.3 0.1 -0.5 0.4 0.1 0.2 0.9 0.3 1.1 0.4 -0.3 0.4 1.5 0.9 -0.2 0.1 -0.1 0.0 0.1 0.4 0.3 0.4 -0.3 21 25 20Mar09 MFG 7 days unmated -0.3 -0.6 0.0 -0.3 0.1 -0.2 -1.0 0.0 -0.2 -0.5 0.6 0.1 -0.4 -0.2 0.6 -0.2 -0.5 -0.2 -0.4 -0.5 0.4 0.4 0.1 0.0 -0.3 20 27 14Apr09 1X -0.2 -0.1 0.0 -0.2 -0.2 -0.1 -0.6 0.0 -0.2 -0.3 0.2 0.2 -0.1 -0.2 0.4 0.0 -0.2 -0.2 -0.3 -0.5 -0.3 -0.1 0.1 0.1 -0.1 22 26 13Apr09 MFG 7 days Mated -0.2 -0.4 -0.1 -0.2 -0.5 -0.3 -0.7 -0.2 -0.3 -0.5 -0.1 0.3 -0.2 -0.1 -0.1 -0.3 -0.2 -0.4 -0.4 -0.4 -0.1 -0.3 0.0 -0.1 -0.1 6.1 4.8 5.4 0.3 0 AJP 1.5 -0.5 0.3 0.5 0 AJP 0.6 -1.0 -0.1 0.4 0 AJP 0.4 -0.6 -0.1 0.2 0 DAM 0.3 -0.7 -0.2 0.2 0 DAM 0.8 -0.8 0.1 0.4 0 DAM 244 1116 244 1116 244 1116 323 297 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 37 of 39 0.0 0.1 0.7 0.2 0.2 0.5 -0.8 -0.2 0.1 -0.2 0.0 0.5 -0.5 0.1 0.5 0.6 -0.3 -0.3 0.5 -0.6 0.8 0.0 0.1 0.2 0.3 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 22 30 11Mar09 Initial 22 26 12Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.5 5.5 5.3 6.9 6.3 5.2 5.4 5.6 7.5 6.2 6.3 5.6 6.2 5.6 6.0 5.9 5.5 5.9 5.2 5.7 5.5 8.0 6.4 6.1 6.5 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 31 File No: 20910731 Tech: DAM Current: 100mv 21 25 20Mar09 1X -0.7 -0.6 -0.5 -1.7 -1.3 -0.2 -0.7 -0.6 -2.0 -0.8 -1.3 -0.7 -1.2 -0.4 -0.7 -0.8 -0.5 -0.5 0.0 0.0 0.0 -2.2 -0.6 -0.8 -0.8 21 25 20Mar09 MFG 7 Days Unmated -0.6 -0.7 -0.6 -1.9 -1.2 0.1 -0.7 0.0 -2.3 -0.3 -1.4 -0.6 -0.4 -0.5 -0.6 -1.0 -0.2 0.5 -0.2 0.2 0.1 -1.9 -0.7 -0.8 -0.8 21 30 30Mar09 1X -0.7 -0.8 -0.4 -1.6 -1.3 0.0 -0.8 -0.4 -1.9 -0.4 -1.3 -0.6 -0.7 -0.7 -0.7 -1.1 -0.7 -0.5 0.0 -0.2 -0.2 -2.0 -1.1 -0.5 -1.0 21 30 30Mar09 MFG 7 Day Unmated -0.6 -0.8 -0.6 -1.9 -1.4 -0.1 -0.7 -0.7 -2.3 -0.6 -1.5 -0.9 -1.2 -0.9 -1.0 -1.1 -0.7 -0.7 0.0 -0.4 -0.3 -2.4 -1.2 -1.0 -1.3 8.0 5.2 6.0 0.7 0 AJP 0.0 -2.2 -0.8 0.6 0 DAM 0.5 -2.3 -0.7 0.7 0 AJP 0.0 -2.0 -0.8 0.5 0 AJP 0.0 -2.4 -1.0 0.6 0 AJP 0.1 -2.2 -0.7 0.6 0 AJP 244 1116 323 297 244 1116 244 1116 244 1116 244 1116 Test Laboratory TR#209107-2, REV.1.1 38 of 39 -0.5 -0.6 -0.5 -1.6 -1.1 -0.3 -0.6 -0.5 -2.2 0.1 -1.4 -0.7 -0.3 -0.3 -0.9 -1.2 -0.6 -0.1 -0.4 -0.2 -0.2 -1.8 -1.2 -0.8 -0.9 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209107 Customer: Samtec Product: SEAF/SEAM Description: 50au Open circuit voltage: 20mv Units: milliohms Temp ºC R.H. % Date: Pos. ID 21 30 09Mar09 Initial 22 30 11Mar09 25X 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 4.9 6.2 5.4 7.0 5.2 4.9 5.3 5.2 5.5 7.1 7.9 6.3 6.1 7.2 6.8 6.4 5.9 7.1 7.4 5.8 5.9 6.1 6.4 5.7 6.6 MAX MIN AVG STD Open Tech Equip ID Spec: EIA 364 TP 23 Subgroup: 2 SampleID# 32 File No: 20910732 Tech: DAM Current: 100mv 22 30 06Apr09 1X -0.2 -0.6 0.4 -1.6 0.0 0.3 -0.2 0.0 0.3 -1.5 -2.4 -1.1 -0.7 -1.6 -0.4 -1.2 -0.4 -1.4 -1.8 -0.1 -0.3 -0.5 -0.6 0.0 -1.0 21 25 20Mar09 MFG 7 Days Unmated 0.0 -1.0 -0.7 -1.9 0.1 0.5 0.0 0.6 -0.4 -2.0 -2.2 -1.8 -0.7 -2.5 -1.3 -1.3 -1.0 -2.2 -2.1 -0.3 -0.6 -0.5 -0.5 -0.6 0.0 20 27 14Apr09 1X 0.1 -1.0 -0.6 -1.1 -0.1 0.4 0.0 0.5 -0.2 -2.2 -2.1 -1.6 -0.4 -2.5 -1.3 -1.4 -1.1 -2.2 -1.9 -0.5 -0.7 -0.9 -0.8 -0.5 -0.5 22 26 13Apr09 MFG 7 Days Mated -0.1 -0.8 -0.5 -1.1 0.1 0.9 -0.3 0.8 -0.3 -1.9 -2.2 -1.5 -0.9 -2.3 -1.4 -1.3 -0.9 -2.2 -1.9 -0.4 -0.6 -0.7 -0.5 -0.6 -0.5 7.9 4.9 6.2 0.8 0 AJP 0.4 -2.4 -0.7 0.7 0 AJP 0.6 -2.5 -0.9 0.9 0 AJP 0.5 -2.5 -0.9 0.8 0 DAM 0.9 -2.3 -0.8 0.8 0 DAM 1.0 -2.5 -1.1 0.9 0 DAM 244 1116 244 1116 244 1116 323 297 323 297 323 297 Test Laboratory TR#209107-2, REV.1.1 39 of 39 0.0 -1.3 -0.7 -1.8 -0.2 1.0 -0.2 0.3 -0.5 -2.3 -2.3 -1.7 -0.8 -2.5 -1.7 -1.5 -1.1 -2.1 -2.3 -0.7 -0.9 -0.9 -1.1 -0.7 -0.9 Contech Research An Independent Test and Research Laboratory