Data Sheet Rev. 1.64 / July 2014 ZSC31014 RBiciLite™ Digital Output Sensor Signal Conditioner Multi-Market Sensing Platforms Precise and Deliberate ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Brief Description Benefits The ZSC31014 is a CMOS integrated circuit for highly accurate amplification and analog-to-digital conversion of differential and half-bridge input signals. The ZSC31014 can compensate the meast nd st sured signal for offset, 1 and 2 order span, and 1 nd and 2 order temperature (Tco and Tcg). It is well suited for sensor-specific correction of bridge sensors. Digital compensation of signal offset, sensitivity, temperature drift, and non-linearity is accomplished via an internal digital signal processor running a correction algorithm with calibration coefficients stored in a non-volatile EEPROM. The ZSC31014 is adjustable to nearly all piezoresistive bridge sensors. Measured and corrected bridge values are provided at digital output pins, 2 which can be configured as I C™* or SPI. The digital 2 I C™ interface can be used for a simple PCcontrolled calibration procedure to program calibration coefficients into an on-chip EEPROM. The calibrated ZSC31014 and a specific sensor are mated digitally: fast, precise, and without the cost overhead associated with trimming by external devices or laser trimming. Available Support The ZSC31014’s integrated diagnostics functions are well suited for safety-critical applications. High accuracy (±0.1% FSO @ -25 to +85°C; ±0.25% FSO @ -40 to +125°C) nd 2 order charge-balancing analog-to-digital converter provides low noise, 14-bit data at sample rates exceeding 2kHz Fast power-up to data output response: 3ms at 4MHz Digital compensation of sensor offset, sensitivity, temperature drift, and non-linearity Eight programmable analog gain settings combine with a digital gain term; accommodates bridges with spans <1mV/V and high offset Internal temperature compensation for sensor correction and for corrected temperature output 48-bit customer ID field for module traceability Evaluation Kit Application Notes Mass Calibration Solution Physical Characteristics Features Simple PC-controlled configuration and single2 pass digital calibration via I C™ interface – quick and precise; SPI option for measurement mode Eliminates need for external trimming components On-chip diagnostic features add safety to the application (e.g., EEPROM signature, bridge connection checks, bridge short detection). Low-power Sleep Mode lengthens battery life Enables multiple sensor networks Wide supply voltage capability: 2.7V to 5.5V Current consumption as low as 70μA depending on programmed sample rate Low-power Sleep Mode (<2μA @ 25°C) Operation temperature: -40°C to +125°C Small SOP8 package 2 ZSC31014 Application: I C™ Interface, Low-Power Bsink Option, Internal Temperature Correction Vsupply ZSC31014 VSS BSINK (2.7V to 5.5V) VDD INT/SS VBP SDA/MISO VBN SCL/SCLK 0.1µF GND * I2C™ is a trademark of NXP. For more information, contact ZMDI via [email protected]. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 —July 2, 2014. All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner VDD 0.1µF ZSC31014 Block Diagram (2.7V - 5.5V) Temperature Applications: RBiciLite™ Reference Sensor ZSC31014 Diagnostics Industrial: building automation, data loggers, pressure meters, leak detection monitoring VBP Medical: infusion pumps, blood pressure meters, air mattresses, apnea monitors POR/Oscillator A D VBN PreAmp INMUX 14-Bit ADC Optional Bsink White Goods / Appliances: fluid level, refrigerant EEPROM w/ Bsupply Consumer: body monitors, portable monitors, desktop weather stations, bathroom scales, toys/games DSP Core Charge Pump & Checksum INT/SS I2C™ or SPI Interface SDA/MISO SCL/SCLK VSS Application: Half-Bridge Voltage Measurement Application: Generic Differential A2D Converter Vsupply 5V ZSC31014 ZSC31014 VSS e.g. HIH4000 BSINK VSS VDD Differential Signal from Any Source BSINK INT/SS O VBP SDA/MISO U VBN T/ V Supply VDD INT/SS VBP SDA/MISO VBN SCL/SCLK 0 .1 µF SCL/SCLK 0.1µF GND GND Ordering Examples (Refer to section 10 in the data sheet for additional options.) Sales Code Description Package ZSC31014EAB ZSC31014 Die — Temperature range: -40°C to +125°C Unsawn on Wafer ZSC31014EAC ZSC31014 Die — Temperature range: -40°C to +125°C Sawn on Wafer Frame ZSC31014EAG1 ZSC31014 SOP8 (150 mil) — Temperature range: -40° to +125°C Tube: add “-T” to sales code / Reel: add “-R” ZSC31014KIT ZSC31014 SSC Evaluation Kit: Communication Board, SSC Board, Sensor Replacement Board, USB Cable, 5 IC Samples (software can downloaded on www.zmdi.com/zsc31014) Kit Sales and Further Information www.zmdi.com [email protected] Zentrum Mikroelektronik Dresden AG Global Headquarters Grenzstrasse 28 01109 Dresden, Germany ZMD America, Inc. 1525 McCarthy Blvd., #212 Milpitas, CA 95035-7453 USA Central Office: Phone:+49.351.8822.306 Fax: +49.351.8822.337 USA Phone 1.855.275.9634 Phone +1.408.883.6310 Fax +1.408.883.6358 European Technical Support Phone +49.351.8822.7.772 Fax +49.351.8822.87.772 DISCLAIMER: This information applies to a product under development. Its characteristics and specifications are subject to change without notice. Zentrum Mikroelektronik Dresden AG (ZMD AG) assumes no obligation regarding future manufacture unless otherwise agreed to in writing. The information furnished hereby is believed to be true and accurate. However, under no circumstances shall ZMD AG be liable to any customer, licensee, or any other third party for any special, indirect, incidental, or consequential damages of any kind or nature whatsoever arising out of or in any way related to the furnishing, performance, or use of this technical data. ZMD AG hereby expressly disclaims any liability of ZMD AG to any customer, licensee or any other third party, and any such customer, licensee and any other third party hereby waives any liability of ZMD AG for any damages in connection with or arising out of the furnishing, performance or use of this technical data, whether based on contract, warranty, tort (including negligence), strict liability, or otherwise. European Sales (Stuttgart) Phone +49.711.674517.55 Fax +49.711.674517.87955 Zentrum Mikroelektronik Dresden AG, Japan Office 2nd Floor, Shinbashi Tokyu Bldg. 4-21-3, Shinbashi, Minato-ku Tokyo, 105-0004 Japan ZMD FAR EAST, Ltd. 3F, No. 51, Sec. 2, Keelung Road 11052 Taipei Taiwan Phone +81.3.6895.7410 Fax +81.3.6895.7301 Phone +886.2.2377.8189 Fax +886.2.2377.8199 Zentrum Mikroelektronik Dresden AG, Korea Office U-space 1 Building 11th Floor, Unit JA-1102 670 Sampyeong-dong Bundang-gu, Seongnam-si Gyeonggi-do, 463-400 Korea Phone +82.31.950.7679 Fax +82.504.841.3026 © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 —July 2, 2014. All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Contents 1 IC Characteristics .......................................................................................................................... 8 1.1. Absolute Maximum Ratings ..................................................................................................... 8 1.2. Recommended Operating Conditions ...................................................................................... 8 1.3. Electrical Parameters .............................................................................................................. 9 1.4. Current Consumption ............................................................................................................ 11 1.4.1. Update Mode Current Consumption ................................................................................ 11 1.4.2. Sleep Mode Current Consumption ................................................................................... 12 1.5. Analog Input versus Output Resolution ................................................................................. 12 2 Circuit Description ....................................................................................................................... 15 2.1. Signal Flow and Block Diagram ............................................................................................. 15 2.2. Analog Front End .................................................................................................................. 16 2.2.1. Preamplifier (PreAmp) ..................................................................................................... 16 2.2.2. Analog-to-Digital Converter ............................................................................................. 17 2.2.3. Temperature Measurement ............................................................................................. 20 2.2.4. Bridge Supply (Bsink) ...................................................................................................... 21 2.2.5. Analog Front-End Configuration ...................................................................................... 21 2.3. Digital Signal Processor ........................................................................................................ 22 2.3.1. Digital Core...................................................................................................................... 22 2.3.2. Normal Operation Mode .................................................................................................. 22 2.3.3. EEPROM ......................................................................................................................... 22 2.3.4. Digital Interface – I2C™ ................................................................................................... 23 2.3.5. Digital Interface – SPI ...................................................................................................... 25 2.3.6. Clock Generator / Power-On Reset (CLKPOR) ............................................................... 26 2.4. Diagnostic Features .............................................................................................................. 26 2.4.1. EEPROM Integrity ........................................................................................................... 27 2.4.2. Sensor Connection Check ............................................................................................... 27 2.4.3. Sensor Short Check ........................................................................................................ 27 3 Functional Description ................................................................................................................. 28 3.1. General Working Mode ......................................................................................................... 28 3.1.1. Update Mode ................................................................................................................... 30 Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 4 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.1.2. Sleep Mode ..................................................................................................................... 32 3.2. ZSC31014 Read Operations with I2C™ ................................................................................. 35 3.2.1. I2C™ Read_MR (Measurement Request) ........................................................................ 36 3.2.2. I2C™ Read_DF (Data Fetch) ........................................................................................... 36 3.3. SPI Read Operations ............................................................................................................ 36 3.3.1. SPI Read_MR (Measurement Request) .......................................................................... 36 3.3.2. SPI Read_DF (Data Fetch) .............................................................................................. 37 3.4. I2C™ Write Operations .......................................................................................................... 38 3.4.1. I2C™ Write_MR (Measurement Request) ........................................................................ 38 3.4.2. Command Mode I2C™ Write Operations ......................................................................... 39 3.5. Command/Data Pair Encoding in Command Mode ............................................................... 39 3.6. EEPROM Bits ........................................................................................................................ 40 3.7. Calibration Sequence ............................................................................................................ 46 3.8. Calibration Math .................................................................................................................... 47 3.8.1. Bridge Signal Compensation ........................................................................................... 48 3.8.2. Temperature Signal Compensation ................................................................................. 49 3.8.3. Limits Imposed on Coefficient Ranges............................................................................. 49 3.8.4. Interpretation of Binary Numbers for Correction Coefficients ........................................... 50 4 Application Circuit Examples ....................................................................................................... 52 4.1. I2C™ Interface – Bridge using Low Power Bsink Option ........................................................ 52 4.2. Generic Differential A2D Converter ....................................................................................... 53 4.3. Half-Bridge Measurement...................................................................................................... 54 5 ESD/Latch-Up-Protection ............................................................................................................ 55 6 Pin Configuration and Package ................................................................................................... 55 7 Test ............................................................................................................................................. 56 8 Reliability ..................................................................................................................................... 56 9 Customization ............................................................................................................................. 57 10 Ordering Codes ........................................................................................................................... 57 11 Related Documents ..................................................................................................................... 57 12 Definitions of Acronyms ............................................................................................................... 58 13 Document Revision History ......................................................................................................... 58 Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 5 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner List of Figures Figure 1.1 Figure 1.2 Figure 1.3 Figure 2.1 Figure 2.2 Figure 2.3 Figure 2.4 Figure 2.5 Figure 3.1 Figure 3.2 Figure 3.3 Figure 3.4 Figure 3.5 Figure 3.6 Figure 3.7 Figure 3.8 Figure 3.9 Figure 4.1 Figure 4.2 Figure 4.3 Figure 6.1 Data Sheet July 2, 2014. Update Mode Current Consumption with Minimum Update Rate .................................................... 11 Update Mode Current Consumption with Maximum Update Rate ................................................... 11 Sleep Mode Current Consumption ................................................................................................... 12 ZSC31014 Block Diagram ................................................................................................................ 15 Functional Diagram of the ADC ........................................................................................................ 19 Format for AFE Configuration Registers B_Config and T_Config .................................................... 21 2 I C™ Timing Diagram ....................................................................................................................... 24 SPI Bus Data Output Timing ............................................................................................................. 25 General Working Mode ..................................................................................................................... 29 Power-Up Sequence and Timing for Update Mode with EEPROM Locked .................................... 30 Measurement Sequence in Update Mode ........................................................................................ 32 2 Power-on Sequence in Sleep Mode for I C™ or SPI Read_MR (Typical Timing Values) ............... 34 2 **) Sequence during Sleep Mode Using an I C™ Write_MR to Wake Up (Typical Timing Values .... 34 2 I C™ Measurement Packet Reads ................................................................................................... 35 SPI Read_MR ................................................................................................................................... 36 SPI Output Packet with Falling Edge SPI_Polarity ........................................................................... 37 2 I C™ Measurement Packet Writes ................................................................................................... 38 2 Example 1 Circuit Diagram: Bsink Option and Internal Temperature Correction and I C™ Output 52 Example 2 Circuit Diagram: Generic Differential A2D Converter ..................................................... 53 Half-Bridge Voltage Measurement with Internal Temperature Correction........................................ 54 ZSC31014 Pin-Out Diagram ............................................................................................................. 56 © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 6 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner List of Tables Table 1.1 Table 1.2 Table 1.3 Table 1.4 Table 2.1 Table 2.2 Table 2.3 Table 2.4 Table 2.5 Table 2.6 Table 2.7 Table 2.8 Table 2.9 Table 3.1 Table 3.2 Table 3.3 Table 3.4 Table 3.5 Table 3.6 Table 3.7 Table 3.8 Table 3.9 Table 3.10 Table 4.1 Table 4.2 Table 4.3 Table 6.1 Table 6.2 Data Sheet July 2, 2014. ZSC31014 Maximum Ratings ............................................................................................................. 8 ZSC31014 Recommended Operating Conditions .............................................................................. 8 ZSC31014 Electrical Parameters ....................................................................................................... 9 Minimum Guaranteed Resolution for the Analog Gain Settings ....................................................... 13 Preamplifier Gain Control Signals .................................................................................................... 16 Gain Polarity Control Signal .............................................................................................................. 16 Disable Nulling Control Signal .......................................................................................................... 17 A2D_Offset Signals .......................................................................................................................... 18 Parameters of the Internal Temperature Sensor Bridge .................................................................. 20 2 Supported I C™ Bit Rates ................................................................................................................ 23 2 I C™ Parameters .............................................................................................................................. 24 SPI Parameters................................................................................................................................. 25 2 MSB of Data Packet Encoding ...................................................................................................... 26 Command Types .............................................................................................................................. 28 Update Rate Settings (Normal Integration Mode: 9 Coarse + 5 Fine) ............................................. 31 Update Rate Settings (Long Integration Mode: 10 Coarse + 5 Fine) ............................................... 31 Sleep Mode Response Times (Normal Integration Mode: 9 Coarse + 5 Fine) ................................ 33 Sleep Mode Response Times (Long Integration Mode: 10 Coarse + 5 Fine) .................................. 33 Command List and Encodings .......................................................................................................... 39 EEPROM Word/Bit Assignments ...................................................................................................... 40 Restrictions on Coefficient Ranges................................................................................................... 49 Gain_B Weightings ........................................................................................................................... 50 Offset_B Weightings ......................................................................................................................... 51 Register Settings—Example 1 .......................................................................................................... 52 Register Settings—Example 2 .......................................................................................................... 53 Register Settings—Example 3 .......................................................................................................... 54 Storage and Soldering Conditions for the SOP-8 Package .............................................................. 55 ZSC31014 Pin Assignments ............................................................................................................. 56 © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 7 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 1 IC Characteristics 1.1. Absolute Maximum Ratings Table 1.1 ZSC31014 Maximum Ratings PARAMETER SYMBOL MIN Analog Supply Voltage VDD Voltages at Digital and Analog I/O – In Pin TYP MAX UNITS -0.3 6.0 V VINA -0.3 VDD+0.3 V Voltages at Digital and Analog I/O – Out Pin VOUTA -0.3 VDD+0.3 V Storage Temperature Range (10 hours) TSTOR -50 150 °C Storage Temperature Range (<10 hours) TSTOR<10h -50 170 °C Note: Also see Table 6.1 regarding soldering temperature and storage conditions for the SOP-8 package. 1.2. Recommended Operating Conditions Table 1.2 ZSC31014 Recommended Operating Conditions PARAMETER Analog Supply Voltage to Gnd Ambient Temperature Range CM Voltage Range 1) 2) SYMBOL MIN VDD MAX UNITS 2.7 5.5 V TAMB -40 125 C VDD -1.2 V 470 nF VIN 1 External Capacitance between VDD and Gnd CVDD 100 Pull-up on SDA and SCL RPU 1 Bridge Resistance RBR 0.2 TYP 220 k 100 k 1) If buying die, designers should use caution not to exceed maximum junction temperature by proper package selection. 2) Both BP and BN input voltage must be within the specified range. In Half-Bridge Mode, this requirement applies only to the BP input (gain 1.5 and 3). In this mode, BN is connected internally to VDD/2. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 8 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 1.3. Electrical Parameters Note: See important notes at the end of the table. Table 1.3 ZSC31014 Electrical Parameters PARAMETER SYMBOL CONDITIONS MIN TYP 70 120 MAX UNITS SUPPLY IDD At minimum update rate (1MHz clock) Update Mode Supply Current (See section 1.4.1) At maximum update rate (4MHz clock). See section 3.1.1 for more details. Minimum current is achieved at slow update rates. Sleep Mode Supply Current (See section 1.4.2) Isndby Power-On-Reset Level POR μA 2000 2500 -40°C to +85°C 0.5 5 μA -40°C to +125°C 0.5 32 μA 2.5 V 20 nA 1.8 ANALOG FRONT END (AFE) Leakage Current Pins VBP,VBN IIN_LEAK Sensor connection and short checks must be disabled. EEPROM Number of Erase/Write Cycles nWRI_EEP At 85C 100k Cycles Data Retention tWRI_EEP At 100C 10 Years ANALOG-TO-DIGITAL CONVERTER (ADC) rADC Resolution 14 11 Bits -4 +4 LSB -1 +1 LSB Temperature Resolution Integral Nonlinearity (INL) Differential Nonlinearity 2) 1) (DNL) INLADC Based on ideal slope DNLADC Bits 2 I C™ INTERFACE & SPI INTERFACE Input Low Level VIN_low SDA/MISO and SCL/SCLK 0 0.2 VDD Input High Level VIN_ high SDA/MISO and SCL/SCLK 0.8 1 VDD Iil SDA/MISO, SCL/SCLK, and INT/SS with output disabled -1.0 +1.0 µa Iih SDA/MISO and INT/SS with output disabled -1.0 +1.0 µa Iih_PU SCL/SCLK with weak pull-up -1.2 -5 µa IOH_SDA/MISO SDA/MISO @VOH = VDD -0.2v -1.9 -3.1 -4.8 mA INT/SS @VOH= VDD -0.2v -0.63 -1.2 -1.9 mA Input leakage to VSS Input leakage to VDD Output Sourcing Current IOH_INT/SS Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 9 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS IOL_SDA/MISO SDA/MISO @VOl = 0.2v 2.3 3.9 6.2 mA INT/SS @VOl= 0.2v 0.85 1.7 3.0 mA 200 pF Output Sink Current IOL_INT/SS Load Capacitance at SDA CSDA Pull-up Resistor RI2C_PU Input Capacitance (each pin) CI2C_IN @ 400kHz 500 10 pF ±15 % TOTAL SYSTEM fvar Frequency Variation All timing in the specification is subject to this variation. @ 4MHz(EEPROM locked) 3), 4), 5) Start-Up-Time (Power-up to data ready) tSTA @ 4MHz(EEPROM unlocked) @ 1MHz(EEPROM locked) @ 1MHz(EEPROM unlocked) 3), 4), 5) Response Time (Time to data ready) Overall Linearity Error fmeas 6), 7), 8) Overall Ratiometricity Error Overall Absolute Error 6), 9) 6), 10) 3.2 8.4 6.0 10.4 6.9 12 @ 4MHz 0.5 @ 1MHz 1.6 ELIND Within 5% to 95% of full-scale differential input. REout VDD ± 10% ACout 2.8 7.3 ms ms ±0.05 %FSO ±0.1 %FSO -25°C to +85°C, VDD ± 10% ±0.1 %FSO -40°C to +125°C, VDD ± 10% ±0.25 %FSO ±0.025 1) Measured at highest PreAmp_Gain setting and -1/2 to 1/2 A2D_Offset setting. 2) Parameter not tested during production test but guaranteed by design. 3) In Update Rate Mode at fastest update rate. 4) See section 3.1 for more details. 5) Parameter indirectly tested during production test. 6) Bridge input to digital output. 7) For applications where Vdd <3.5V using A2D offsets 15/16, 7/8, 1/8, or 1/16, a slight overall linearity improvement of 0.015% FSO can be achieved. 8) FSO = percent full-scale output. 9) For high preamp gain (≥96) in conjunction with high clock frequency and normal integration (4MHz, longInt=0), the ratiometricity error can be 0.3%. 10) For applications requiring high preamp gain (≥96) in conjunction with a high clock frequency (4 MHz), calibration using three temperature points is required in order to achieve the specified “Overall Absolute Error.” If calibration is performed using only two temperature points, the specified maximum error values must be increased by a factor of 3. A calibration using only one temperature point is not recommended for applications with high preamp gain (≥96) in conjunction with a high clock frequency (4 MHz). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 10 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 1.4. Current Consumption 1.4.1. Update Mode Current Consumption Figure 1.1 Update Mode Current Consumption with Minimum Update Rate Figure 1.2 Update Mode Current Consumption with Maximum Update Rate IDD at Fastest Update Rate with 3-Sigma Deviation 1 MHz, VDD=5.5V 2.40 4 MHz, VDD=5.5V 2.20 IDD (mA) 2.00 1.80 1.60 1.40 1.20 1.00 -50 -30 -10 10 30 50 70 90 110 130 150 Temperature (°C) Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 11 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 1.4.2. Sleep Mode Current Consumption Figure 1.3 Sleep Mode Current Consumption Sleep IDD at with 3 Sigma Sleep IDD Vdd at VDD== 5.5V 5.5V with 3 Sigma 100.000 IDD (μA) 10.000 -50.000 1.000 0.000 50.000 100.000 150.000 0.100 Temperature (°C) 1.5. Analog Input versus Output Resolution The ZSC31014 has a fully differential chopper-stabilized preamplifier with 8 programmable gain settings through a 14-bit analog-to-digital converter (ADC). The resolution of the output depends on the input span (bridge sensitivity) and the analog gain setting programmed. Analog gains available are 1.5, 3, 6, 12, 24, 48, 96, and 192.* Table 1.4 gives the guaranteed minimum resolution for a given bridge sensitivity range for the eight analog gain settings. At higher analog gain settings, there will be higher output resolution, but the ability of the ASIC to handle large offsets decreases. This is expected because the offset is also amplified by the analog gain and can therefore saturate the ADC input. * For previous silicon revision A, the available analog gain settings are 1, 3, 5, 15, 24, 40, 72, and 120. See ZSC31014_AFE_Settings.xls for table values for revision A. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 12 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Table 1.4 Minimum Guaranteed Resolution for the Analog Gain Settings Analog Gain = 1.5 Input Span (mV/V) Min Typ Max Allowed Offset (mV/V) 289 400 529 69 235 325 430 181 250 126 Analog Gain = 3 Min. Guaranteed Resolution (Bits) Input Span (mV/V) Min. Guaranteed Resolution (Bits) Min Typ Max Allowed Offset (mV/V) 12.7 145 200 265 34 12.7 118 12.4 123 170 225 54 12.5 331 168 12.1 101 140 185 74 12.2 175 231 218 11.6 80 110 145 94 11.9 90 125 165 251 11.1 58 80 106 114 11.4 54 75 99 284 10.3 36 50 66 134 10.7 43 60 79 294 10.0 22 30 40 147 10.0 Analog Gain = 6 Input Span (mV/V) Min Typ Max Allowed Offset (mV/V) 65 90 119 24 61 85 112 51 70 43 Analog Gain = 12 Min. Guaranteed Resolution (Bits) Input Span (mV/V) Min. Guaranteed Resolution (Bits) Min Typ Max Allowed Offset (mV/V) 12.6 36 50 66 9 12.7 27 12.5 30 42 56 14 12.5 93 37 12.2 25 34 45 19 12.2 60 79 44 12.0 19 26 34 24 11.8 40 55 73 47 11.9 13 18 24 30 11.3 36 50 66 50 11.7 7 10 13 35 10.4 29 40 53 57 11.4 6 8 11 36 10.1 Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 13 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Analog Gain = 24 Input Span (mV/V) Min Typ Max Allowed Offset (mV/V) 18.1 25.0 33.1 4.3 15.2 21.0 27.8 12.3 17.0 9.4 Analog Gain = 48 Min. Guaranteed Resolution (Bits) Input Span (mV/V) Min. Guaranteed Resolution (Bits) Min Typ Max Allowed Offset (mV/V) 12.7 8.7 12.0 15.9 0.4 12.7 6.9 12.5 7.2 10.0 13.2 1.7 12.4 22.5 9.6 12.2 5.8 8.0 10.6 2.9 12.1 13.0 17.2 12.2 11.8 4.3 6.0 7.9 4.2 11.7 6.5 9.0 11.9 14.9 11.3 2.9 4.0 5.3 5.4 11.1 3.6 5.0 6.6 17.5 10.4 2.2 3.0 4.0 6.7 10.7 2.9 4.0 5.3 18.2 10.1 1.4 2.0 2.6 7.3 10.1 Analog Gain = 96 Input Span (mV/V) Min Typ Max Allowed Offset (mV/V) 4.3 6.0 7.9 1.2 2.9 4.0 5.3 1.8 2.5 1.4 Analog Gain = 192 Min. Guaranteed Resolution (Bits) Input Span (mV/V) Min. Guaranteed Resolution (Bits) Min Typ Max Allowed Offset (mV/V) 12.7 1.81 2.50 3.31 1.0 12.4 2.6 12.1 1.45 2.00 2.65 1.3 12.1 3.3 3.6 11.4 1.08 1.50 1.98 1.6 11.7 2.0 2.6 3.9 11.1 0.90 1.25 1.65 1.8 11.4 1.2 1.6 2.1 4.2 10.8 0.72 1.00 1.32 1.9 11.1 0.9 1.3 1.7 4.3 10.5 0.51 0.70 0.93 2.1 10.6 0.7 1.0 1.3 4.5 10.1 0.36 0.50 0.66 2.3 10.1 Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 14 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2 Circuit Description 2.1. Signal Flow and Block Diagram The ZSC31014 uses a charge-balancing ADC that provides low noise 14-bit samples. The system clock can operate at 1MHz (lower power, better noise performance) or 4MHz (faster sample rates). The PreAmp nulls its offset over temperature and offers a wide range of selectable analog gain settings. The on-chip digital signal processor (DSP) core uses coefficients stored in EEPROM to precisely calibrate/condition the amplified differential input signal. Temperature can be measured from an internal temperature sensor, which can be calibrated and output as well as used to compensate for temperature effects of the sensor bridge. 2 2 Direct interfacing to µP controllers is facilitated via I C™ digital protocol or optional SPI. I C™ is used as the calibration interface and can be used in the final application. SPI is only supported for end applications. Figure 2.1 ZSC31014 Block Diagram 0.1µF VDD (2.7V - 5.5V) Temperature Reference Sensor Diagnostics RBiciLite™ ZSC31014 VBP POR/Oscillator A D VBN INMUX PreAmp 14-Bit ADC Optional Bsink EEPROM w/ Bsupply Charge Pump & Checksum DSP Core I2C™ or SPI Interface INT/SS SDA/MISO SCL/SCLK VSS Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 15 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2.2. Analog Front End 2.2.1. Preamplifier (PreAmp) The preamplifier has a chopper-stabilized two-stage design. The first stage instrumentation-type amplifier has an internal auto-zero (AZ) function in order to prevent the second stage from being overdriven by the amplified offset. The overall chopper guarantees that the whole PreAmp has negligible offset. There are eight analog gain settings selectable in EEPROM. The polarity of the gain can be changed by shifting the chopper phase between input and output by 180 degrees via the EEPROM setting Gain_Polarity. Changing the polarity can help prevent board layout crossings in cases where the sensor chip layout does not match the ZSC31014 pad/pin layout. PreAmp_Gain for the bridge measurement is controlled by bits [6:4] in EEPROM Word 0F HEX (B_Config register). PreAmp_Gain for temperature is set by bits [6:4] in Word 10HEX (T_Config register). These 3 bits are referred to as [G2:G0]. See section 2.2.3 for recommended temperature measurements settings. Table 2.1 Preamplifier Gain Control Signals † G2 G1 G0 PreAmp_Gain 0 0 0 1.5 1 0 0 3 0 0 1 6 1 0 1 12 0 1 0 24 1 1 0 48 0 1 1 96 1 1 1 192 Gain Polarity for the bridge is controlled by bit [7] (Gain_Polarity) in the B_Config register. Table 2.2 Gain Polarity Control Signal Gain_Polarity † Overall Gain 0 (-1) GAIN 1 (+1) GAIN For previous silicon revision A, the available analog gain settings are 1 (G2:G0=000); 3 (G2:G0=100); 5 (G2:G0=001); 15 (G2:G0=101); 24 (G2:G0=010); 40 (G2:G0=011); 72 (G2:G0=110); and 120 (G2:G0=111). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 16 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Before a measurement conversion is started, the PreAmp has a phase called nulling. During the nulling phase, the PreAmp measures its internal offset so that it can be removed during the measurement. It is especially useful at higher gains where a small offset could cause the PreAmp to saturate. If bit[12] of the configuration register is set to one, then the nulling feature is disabled as shown in Table 2.3. At lower PreAmp gains, nulling can adversely affect the linearity and ratiometricity of the part, so the recommended setting for this bit is zero for gains of 6 or higher and one for all other gains. Table 2.3 Disable Nulling Control Signal Disable_Nulling Effect 0 Nulling is on 1 Nulling is off 2.2.2. Analog-to-Digital Converter nd A 14-bit 2 order charge-balancing analog-to-digital converter (ADC, A2D) is used to convert signals coming from the PreAmp. By default, each conversion is split into a 9-bit coarse conversion and a 5-bit fine conversion. During the coarse conversion, the amplified signal is integrated (averaged). One coarse conversion covers exactly 4 chopper periods of the PreAmp. A configurable setting stored in EEPROM allows quadrupling the period of the coarse conversion. In Table 3.7, see the LongInt bit in EEPROM words B_Config (0F HEX) and T_Config (10HEX). When LongInt = 1, the conversion is performed as 11 bits coarse + 3 bits fine. The advantage of this mode is more noise suppression; however, sampling rates will fall significantly because A2D conversion periods are quadrupled. An auto-zero (AZ) measurement is performed periodically and subtracted from all ADC results used in calculations. This compensates for any drift of offset vs. temperature. The ADC uses switched capacitor technique and complete full-differential architecture to increase its stability and noise immunity. Part of the switched capacitor network is a 4-bit digital-to-analog conversion (DAC) function, which allows adding or subtracting a defined offset value resulting in an A2D_Offset shift. This allows for a rough compensation of the bridge offset, which allows a higher PreAmp_Gain to be used and consequently more end resolution of the measured signal. Table 2.4 shows the A2D_Offset adjustment. Using this function, the ADC input range can be shifted in order to optimize the coverage of the sensor signal and sensor offset values as large as the sensor span can be processed without losing resolution. The A2D_Offset setting for the bridge is controlled by bits [3:0] in Word 0FHEX (B_Config). These 4 bits are referred to as [Z3:Z0]. Note: To collect uncalibrated raw bridge values from the ADC, the Offset_B coefficient must be programmed as shown in Table 2.4. Note: The ADC offset for the internal temperature measurement is trimmed at production test to avoid saturation and the setting, which is stored in bits [3:0] in word 10 HEX (T_Config), should not be changed (see Table 3.7). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 17 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Table 2.4 A2D_Offset Signals A2D_Offset[3:0] Auto-Zero Output Count of A2D (+/- 250 Codes) A2D Input Range [VREF] A2D_Offset Offset_B[15:0] FHEX 15360 -15/16 to 1/16 15/16 1C00HEX EHEX 14336 -7/8 to 1/8 7/8 1800HEX DHEX 13312 -13/16 to 3/16 13/16 1400HEX CHEX 12288 -3/4 to 1/4 3/4 1000HEX BHEX 11264 -11/16 to 5/16 11/16 0C00HEX AHEX 10240 -5/8 to 3/8 5/8 0800HEX 9HEX 9216 -9/16 to 7/16 9/16 0400HEX 8HEX 8192 -1/2 to 1/2 1/2 0000HEX 7HEX 7168 -7/16 to 9/16 7/16 FC00HEX 6HEX 6144 -3/8 to 5/8 3/8 F800HEX 5HEX 5120 -5/16 to 11/16 5/16 F400HEX 4HEX 4096 -1/4 to 3/4 1/4 F000HEX 3HEX 3072 -3/16 to 13/16 3/16 EC00HEX 2HEX 2048 -1/8 to 7/8 1/8 E800HEX 1024 -1/16 to 15/16 1/16 E400HEX 0 0 to 16/16 0 E000HEX 1HEX 0HEX 1) 1) A setting of 0000BIN for the A2D offset can only be used for internal temperature measurements, which are factory-trimmed (do not change default setting). If it is used for bridge measurements, it could lead to the auto-zero saturating, which results in poor performance of the IC. Figure 2.2 shows a functional diagram of the ADC. The A/D block at the right side is assumed to be an ideal differential ADC. The summing node B models the offset voltage, which is caused by the tolerance of process parameters and other influences including temperature and changes of power supply. The summing node A adds a voltage, which is controlled by the digital input A2D_Offset. This internal digital-to-analog converter (DAC, D2A) uses binary-weighted capacitors, which are part of the switched capacitor network of the ADC. This DAC function allows optimal adjustment of the input voltage range of the ADC to the amplified output voltage range of the sensor. All signals in this diagram are shown as single-ended for simplicity in understanding the concept; all signals are actually differential. An auto-zero reading is accomplished by short-circuiting the differential ADC input. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 18 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Figure 2.2 Functional Diagram of the ADC VREF VINGAIN Node A Node B ∑ ∑ A Z VREFA2D_Offset VOFF A D D A2D_Offset[3:0] Digital representation of the input voltage as a signed number requires calculating the difference ZSENSOR ZAUTOZERO. 14 ZSENSOR = 2 ZAUTOZERO = 2 (GAIN VIN / VDD + A2D_Offset + VOFF / VREF) 14 (A2D_Offset + VOFF / VREF) (1) (2) where GAIN PreAmp_Gain (B_Config bits [6:4] for bridge measurement; fixed value 6 for temperature measurement) (See Table 2.1) A2D_Offset Zero Shift of ADC (B_Config or T_Config bits [3:0]) (See Table 2.4) VREF ~ VDD Supply Voltage to ZSC31014 VIN Input Voltage = (VBP-VBN) in differential mode; = (VBP-VDD/2) in half-bridge mode VOFF Data Sheet July 2, 2014. Small random offset voltage that varies part-to-part and with temperature. The periodic auto-zero cycle will subtract this error. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 19 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner The digital output Z as a function of the analog input of the analog front-end (including the PreAmp) can be described as Z = ZSENSOR - ZAUTOZERO 14 Z=2 With (GAIN VIN / VREF ) (3) VREF = VDD - VBSink (see section 2.2.4) where VBSink is the voltage at the BSINK pin. 2.2.3. Temperature Measurement The temperature signal comes from an internal measurement of the die temperature. The temperature signal is generated from a bridge-type sensor using resistors with different TC values. Table 2.5 shows the characteristic nd parameters. This temperature signal can be corrected with offset, span, and 2 order non-linearity coefficients. 2 The corrected temperature can then be read on the digital output I C™ or SPI with either an 8 or 11 bit resolution. st The raw temperature reading can also be used to compensate the sensor bridge reading. 1 order Tco and Tcg, nd and 2 order Tco and Tcg coefficients are available to correct sensor bridge offset and span variations with temperature. Table 2.5 Parameters of the Internal Temperature Sensor Bridge Parameter Min Typ Max Units Sensitivity 0.28 0.38 0.5 mV/V/K Offset voltage -75 65 mV/V 2 °C 0.25 °C 25 kΩ Nonlinearity (-20 to 80°C) first order fit Nonlinearity (-20 to 80°C) second-order fit Bridge resistance 15 20 NOTE: The T_CONFIG register description is given in section 2.2.5. Most fields within this EEPROM register are programmed to default settings on the production test and should not be changed. Only the LongInt field (bit 8) setting is user-selectable if desired. Other settings for the remaining T_Config bits might cause temperature measurements to saturate. Section 2.2.5 gives the details of how PreAmp_Gain and A2D_Offset Mode are configured for temperature measurements. For ZSC31014 SOP8-packaged parts, the on-chip temperature sensor is calibrated by ZMDI using three temperature points: -40°C, room temperature (RT), and +85°C, which provides a 2nd-order fit. The error of the conditioned temperature output data at delivery is specified as ≤ 2.5 Kelvin over the full operational temperature range of -40 to +125°C. Note: This calibration causes a change in the EEPROM default data in the EEPROM registers 0AHEX to 0DHEX for all SOP8-packaged forms of the ZSC31014. See Table 3.7 for details. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 20 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2.2.4. Bridge Supply (Bsink) The ZSC31014 provides a Bsink (bridge sink) pin to drive the bottom of the sensor bridge. Internal to the ZSC31014, Bsink is driven by a large NMOS pull-down (RDS(ON)≈20). There will be some IR drop across this device, but the Bsink node also forms the bottom reference of the ADC. Therefore, any ratiometricity error this IR drop would normally cause is cancelled out. Bsink is turned on 190s/50s (depending on 1MHz or 4MHz clock setting) prior to the start of a conversion to allow settling time for the bridge and the internal front-end (PreAmp and ADC) path. The entire conversion is then performed, and Bsink is then turned off. This can achieve significant power savings when used in conjunction with slower update rates. For example, a 2.5k bridge would consume 2mA with a constant 5V bias. However, if used with the Bsink feature at an update rate of 6.35ms, the same bridge would draw on average only 112μA since it would be biased on only 5.6% of the time. Savings at slower update rates can be even more significant. 2.2.5. Analog Front-End Configuration As shown in Figure 2.3, the analog front-end (AFE) has much flexibility/configurability in how its measurement is performed. The preferred settings for the AFE configuration are typically different for a bridge reading than for a temperature reading. The EEPROM contains two words for configuring the AFE for each measurement: B_Config (0FHEX) and T_Config (10HEX). 13 11 10 9 8 Gain_Polarity Longint 12 14 Bsink 15 PreAmp_Mux [1:0] Reserved [2:0] Disable Nulling Figure 2.3 Format for AFE Configuration Registers B_Config and T_Config 7 PreAmp_Gain [2:0] 6 5 4 A2D_Offset [3:0] 3 2 1 0 The B_Config register is loaded from EEPROM and written to the AFE configuration register just before a measurement of the bridge begins. The T_Config register is loaded from EEPROM and written to the AFE configuration register immediately before a temperature measurement begins. For more details, refer to Table 3.7, EEPROM words 0FHEX (B_Config) and 10HEX (T_Config), in section 3.6. Note: for T_Config, only bit 8 (LongInt) is user-configurable. All other settings are factory programmed and should not be changed. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 21 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2.3. Digital Signal Processor A digital signal processor (DSP) is used for processing the converted differential signal as well as performing temperature correction and computing the temperature value for digital output. 2.3.1. Digital Core The digital core reads correction coefficients from EEPROM and can correct for the following: 1. Signal offset (Offset_B term) 2. Signal gain (Gain_B term) st 3. Temperature coefficient of the bridge offset 1 order (Tco term) st 4. Temperature coefficient of the bridge gain 1 order (Tcg term) 5. Second-order non-linearity of signal (SOT_bridge term) 6. Second-order non-linearity of Tco (SOT_tco term) 7. Second-order non-linearity of Tcg (SOT_tcg term) See sections 3.7 and 3.8 for a full discussion of calibration and correction math. 2.3.2. Normal Operation Mode Two operation modes are available for normal operation: Update Rate Mode (continuous conversion at a select2 able update rate) or Sleep Mode (low power). (See section 3.1.) Both modes can operate in either I C™ digital output or SPI digital output. These selections are made in configuration registers of the EEPROM. 2.3.3. EEPROM The EEPROM array contains the calibration coefficients for gain and offset, etc., and the configuration bits, such as output mode, update rate, etc. When programming the EEPROM, an internal charge pump voltage is used; therefore a high voltage supply is not needed. (See section 3.5 for instructions on programming the EEPROM.) Important: After the ZMDI_Config_1 or ZMDI_Config_2 EEPROM word has been changed, the IC must be power cycled for the changes to be loaded. The EEPROM array is arranged as twenty 16-bit words. Three words are dedicated to the customer serial number for module traceability. The integrity of the contents of the EEPROM array is ensured by a 16-bit signature word which is checked after each power-on of the device. The signature word is automatically updated whenever the Start_NOM command (starts Normal Operating Mode; see section 3.5) is executed after EEPROM contents have been changed. After calibration is completed and all coefficients are written to EEPROM, the user can lock the EEPROM so that no further writes can occur (see section 3.6 regarding EEP_Lock, bits [15:13] of EEPROM word 02HEX). IMPORTANT: Care must be taken when performing this function. After the command to lock EEPROM, the next command must be Start_NOM so that the EEPROM checksum is calculated and written. If the part is power cycled instead, the lock will take effect, and the checksum will be wrong. In this case, the part will always output a diagnostic state, and since the EEPROM is permanently locked, it can never be recovered. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 22 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2.3.4. Digital Interface – I2C™ 2 The IC can communicate via an addressable two-wire (I C™) interface. Commands are available for the following: Sending calibration commands in Command Mode Starting measurements in Sleep Mode Reading data ‡ 2 The ZSC31014 uses an I C™-compatible communication protocol with support for the bit rates listed in Table 2.6. Table 2.6 2 Supported I C™ Bit Rates Clock Setting Bit Rates 4MHz 400kHz or 100kHz 1MHz 100kHz See section 2.3.6 for clock setting details. 2 2 I C™ is the protocol used during calibration (Command Mode). The ZSC31014 I C™ slave address (00HEX to 7FHEX) is selected by bits [9:3] of EEPROM word 02HEX. If the communication lock pattern Comm_lock (bits [5:3], EEPROM word 02HEX) is programmed to 011, the device will respond only to this address. Otherwise, the device 2 2 will respond to all I C™ addresses. The factory setting for I C™ slave address is 28HEX with Comm_lock set. 2 When programmed as an I C™ device, the INT/SS pin operates as an interrupt. The INT pin rises when new 2 output data is ready and falls when the next I C™ communication occurs. It is most useful if the part is configured in Sleep Mode to indicate to the system that a new conversion is ready. 2 See Figure 2.4 for the I C™ timing diagram and Table 2.7 for definitions of the parameters shown in the timing diagram. ‡ For more details, refer to http://www.standardics.nxp.com or other websites for this specification. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 23 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Table 2.7 2 I C™ Parameters PARAMETER SYMBOL MIN fSCL 100 tHDSTA 0.1 s tLOW 0.6 s tHIGH 0.6 s Start condition setup time relative to SCL edge tSUSTA 0.1 s Data hold time on SDA relative to SCL edge tHDDAT 0 s Data setup time on SDA relative to SCL edge tSUDAT 0.1 s Stop condition setup time on SCL tSUSTO 0.1 s tBUS 2 s SCL clock frequency Start condition hold time relative to SCL edge Minimum SCL clock low width 1) Minimum SCL clock high width 1) Bus free time between stop condition and start condition 1) TYP MAX UNITS 400 kHz Combined low and high widths must equal or exceed minimum SCLK period. 2 Figure 2.4 I C™ Timing Diagram SDA tSUDAT tLOW tBUS tHDSTA SCL tHDSTA tHDDAT tHIGH tSUSTA tSUSTO (See section 3.1 for data transmission details.) 2 Note: There are three differences in the ZSC31014 protocol compared with the original I C™ protocol: Sending a start-stop condition without any transitions on the CLK line (no clock pulses in between) creates a communication error for the next communication, even if the next start condition is correct and the clock pulse is applied. An additional start condition must be sent, which results in restoration of proper communication. The restart condition—a falling SDA edge during data transmission when the CLK clock line is still high— creates the same situation. The next communication fails, and an additional start condition must be sent for correct communication. A falling SDA edge is not allowed between the start condition and the first rising SCL edge. If using an 2 I C™ address with the first bit 0, SDA must be held low from the start condition through the first bit. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 24 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2.3.5. Digital Interface – SPI SPI is available only as half duplex (read-only from the ZSC31014). SPI cannot be used in the calibration environment (Command Mode) because it does not support receiving commands. SPI speeds of up to 200kHz can be supported in 1MHz Mode, and up to 800kHz can be supported in 4MHz Mode. See Figure 2.5 for the SPI timing diagram and Table 2.8 for definitions of the parameters shown in the timing diagram. Table 2.8 SPI Parameters PARAMETER SYMBOL MIN SCLK clock frequency (4MHz clock) fSCL SCLK clock frequency (1MHz clock) SS drop to first clock edge MAX UNITS 50 800 kHz fSCL 50 200 kHz tHDSS 2.5 s tLOW 0.6 s tHIGH 0.6 s Clock edge to data transition tCLKD 0 Rise of SS relative to last clock edge tSUSS 0.1 s Bus free time between rise and fall of SS tBUS 2 s Minimum SCLK clock low width 1) Minimum SCLK clock high width 1) 1) TYP s 0.1 Combined low and high widths must equal or exceed minimum SCLK period. Figure 2.5 SPI Bus Data Output Timing tHDSS tHIGH SCLK tSUSS tLOW MISO HiZ HiZ tCLKD tCLKD SS tBUS (See section 3.1 for data transmission details.) Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 25 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2.3.6. Clock Generator / Power-On Reset (CLKPOR) The ZSC31014 has an internal 4MHz temperature-compensated oscillator that provides the time base for all operations. This oscillator feeds into a 4:1 post scalar that can optionally form the clock source for the device. Using ClkSpeed (bit 3 of EEPROM word 01HEX; see section 3.6) the user can select a 4MHz clock or a 1MHz digital core clock for the ZSC31014. If the fast response times and sampling periods provided by the 4MHz clock are not needed, then choosing the 1MHz clock will result in better noise performance. If the power supply exceeds the power-on reset level (see Table 1.3), the reset signal de-asserts and the clock generator starts working at the selected frequency (approximately 1MHz or 4MHz). The exact value only influences the conversion cycle time. To minimize the oscillator error as the V DD voltage changes, an on-chip regulator supplies the oscillator block. 2.4. Diagnostic Features The ZSC31014 offers a full suite of diagnostic features to ensure robust system operation in the most “missioncritical” applications. The diagnostic states are indicated by a transmission of the status of the 2 MSBs of the bridge high byte data. Table 2.9 2 MSB of Data Packet Encoding Status Bits Definition (2 MSBs of Output Packet) 00 Normal operation, good data packet 01 Device in Command Mode 10 Stale data: Data that has already been fetched since the last measurement cycle. Note: If a data fetch is performed before or during the first measurement after power-on reset, then “stale” will be returned, but this data is actually invalid because the first measurement has not been completed. 11 Diagnostic condition exists When the two MSBs are 11, one of the following faults listed below is indicated. Invalid EEPROM signature Loss of bridge positive or negative Bridge input short Loss of bridge source Loss of bridge sink All diagnostics are detected in the next measurement cycle and reported in the subsequent data fetch. Once a diagnostic is reported, the diagnostic status bits will not change unless both the cause of the diagnostic is fixed and a power-on-reset is performed. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 26 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2.4.1. EEPROM Integrity The contents of the EEPROM are protected by a 16-bit signature generated by a multiple input shift register (MISR). This signature is generated and stored in EEPROM (word 12HEX) upon leaving Command Mode if an EEPROM write has occurred. This signature is re-generated and checked for a match after Power-On-Reset prior to entering Normal Operation Mode. If the generated signature fails to match, the part will output a diagnostic state on the output. The customer ID fields (words 00HEX, 0EHEX, and 13HEX) are not included in the signature. 2.4.2. Sensor Connection Check Four dedicated comparators constantly check the range of the bridge inputs (BP/BN) to ensure they are within the envelope of 0.15VDD to 0.85VDD during all conversions. The two sensor inputs have switched ohmic paths to ground and if not driven, would discharge during the fine conversion phase. If any of the connections to the bridge break, this mechanism will detect it and put the ASIC in a diagnostic state. This diagnostic feature can be enabled/disabled with bit 0 of Diag_cfg (bits [2:1] of EEPROM word 02HEX). 2.4.3. Sensor Short Check If a short occurs between BP/BN (bridge inputs), it would normally produce a mid-range output signal and therefore would not be detected as a fault. If enabled via bit 1 of Diag_cfg (bits [2:1] of EEPROM word 02HEX), the sensor short diagnostic detects BP/BN shorts. After the measurement cycle of the bridge, it will deliberately pull the BP bridge input to ground for 8sec with a 1MHz clock or 2sec with a 4MHz clock. At the end of this 8sec/2sec window, it will check to see if the BN input “followed” it down below the 15%VDD comparator check point. If so, a short must exist between BP/BN, and the part will output a diagnostic state. The bridge will have a minimum recovery time of 100 sec for a 1MHz clock or 25 sec for a 4MHz clock prior to the next measurement. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 27 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3 Functional Description 3.1. General Working Mode See Figure 3.1 for an overview of the general working mode of the ZSC31014. There are three types of commands as detailed in Table 3.1. Table 3.1 Command Types Type Communication Supported Description Reference Sections 2 Sections 3.2.2 and 3.3.2 2 Sections 3.1.2, 3.3.1, and 3.4.1 Data Fetch (DF) Used to fetch data in any mode I C™ and SPI Measurement Request (MR) Used to start measurements in Sleep Mode I C™ and SPI Calibration Commands Used to calibrate part in Command Mode 2 I C™ Only Section 3.5 2 On system power-on reset (POR), the ZSC31014 wakes as an I C™ device regardless of the digital protocol programmed in EEPROM. It then waits for a Start_CM command for 6ms if EEPROM is unlocked or for 1.5ms if EEPROM is locked (the command window). If the ZSC31014 receives the Start_CM command during the 2 command window, it goes into Command Mode. The communication protocol in Command Mode is always I C™ regardless of the setting programmed in EEPROM. During Command Mode, the device executes commands sent 2 by the I C™ master. Command Mode is primarily used in the calibration environment. See section 3.5 for details on Command Mode. The part remains in Command Mode until it receives the Start_NOM command, which starts the Normal Operation Mode. If instead during the power-on sequence, the command window expires without receiving a Start_CM, the device 2 will immediately assume its programmed output mode (I C™ or SPI) and start performing the required A2D conversions (Temp, AZ, Bridge). When Update Mode has been selected, the first corrected data will be written to the digital interface within 6ms of power-on with a 1MHz clock and the EEPROM locked. Operation after the power-on sequence depends on whether the part is programmed in Sleep Mode or in Update Mode. In Sleep Mode, the part waits for commands from the master before taking measurements. In Update Mode, data is taken at a fixed, selectable rate. More detail is given about Update Mode and Sleep Mode in sections 3.1.1 and 3.1.2 respectively. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 28 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Figure 3.1 General Working Mode MR DF Power On Yes Command Window (6ms / 1.5ms) Measurement Request Data Fetch Start_CM Command = Start_CM? No (after 6ms / 1.5ms) Start_NOM Normal Operation Mode UPDATE MODE SLEEP MODE Power Down (Wait for command) Perform Measurement Command Received Power Down Update Period Over Command Mode (No measurement cycle. Full command set is available.) Command = I2C Read_MR or I2C Write_MR or SPI Read_MR ? Update rate period over or command received? Yes Command Received. Command = Start_NOM? No No Execute Command Yes Perform Measurement Command Received Power Down (Wait for command) Command Received Command = I2C Read_DF or SPI Read_DF ? Yes July 2, 2014. No Yes Fetch Data Data Sheet No Command = I2C Read_DF or SPI Read_DF ? Fetch Data © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 29 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.1.1. Update Mode In Update Mode, the digital core will perform measurements and correction calculations at a selectable update 2 rate and update the I C™/SPI output register. The power-on measurement sequence for the Update Mode is shown in Figure 3.2. Figure 3.2 Power-Up Sequence and Timing for Update Mode with EEPROM Locked POR With 1MHz CLK execution time Command Window 1.5ms Power applied to device. Command window starts after a short power-on-reset window. 1.4ms 400s Temperature Measurement § 1.4ms 400s AutoZero (AZ) Measurement Bridge Measurement DSP Calculations 1.4ms 400s 220s 60s st With 4MHz CLK execution time 1 corrected signal measurement written to digital output register 2 (I C™ or SPI) If the part is programmed for the fastest update rate, conversions will continue to happen after the power-up sequence. If the ZSC31014 is not in the fastest update rate, the part will power down after writing to the digital output register. The duration of the power-down period is determined by the Update_Rate setting (bits [7:6] in EEPROM word 01HEX; see section 3.6) and the digital core clock speed (see section 2.3.6). See Table 3.2 and Table 3.3 for the update rates. After the power-down period has expired, the ZSC31014 will power up; take another bridge reading followed by calculations; write to the digital output register; and power down. Temperature and Auto-Zero (AZ) are slower moving quantities but must be updated periodically. When the part is configured in Update Mode, these two quantities are measured periodically (referred to as special measurements). As illustrated in Figure 3.3, valid data output to the digital register occurs after the measurement and the DSP 2 calculations are complete. At this point the master can fetch the data in I C™ or SPI with a Read_DF command. Specifics of the Read_DF command are given in sections 3.2 and 3.3. After a valid output has been read by the master, the status bits are set to “stale,” indicating that the measurement has not been updated since the last Read_DF. This mode allows the application to simply read the digital output at any time and be assured the data is no older than the selected update period. See Table 2.9 for more information on the status bits. The chip should be polled at a frequency slower than 20% more of the update rate period listed in Table 3.2 and Table 3.3. 2 In I C™ Mode only, the INT/SS pin will assume the INT (interrupt) function. Instead of polling until a “valid” response is received, the application can look for a rise on the INT pin. This will indicate that the measurement 2 and calculations are complete and new valid data is ready to be read on the I C™ interface. § When EEPROM is not locked, the command window is 4.5ms longer (= 6ms). All time values shown are typical; for the worst case values, multiply by 1.15 (nominal frequency ±15%). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 30 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Table 3.2 Update Rate Settings (Normal Integration Mode: 9 Coarse + 5 Fine) Update_Rate 00 2) Update Period/1MHz 1) Clock Update Period/4MHz 1) Clock Measurement Cycles between Special Measurements (Temperature or AZ) 1.6ms 0.5ms 255 01 5.0ms 1.5ms 127 10 25.0 ms 6.5ms 31 11 125.0ms 32.0ms 15 1) All time values shown are typical; for worst case values, multiply by 1.15 (nominal frequency ±15%). 2) With the fastest update rate setting, there is no power down period between measurements. Table 3.3 Update Rate Settings (Long Integration Mode: 10 Coarse + 5 Fine) Update_Rate 00 2) Update Period/1MHz 1) Clock Update Period/4MHz 1) Clock Number of Measurement Cycles between Special Measurements (Temperature or AZ) 5ms 1.5ms 255 01 8.5ms 2.5ms 127 10 30.0 ms 7.5ms 31 11 130.0ms 33.0ms 15 1) All time values shown are typical; for worst case values, multiply by 1.15 (nominal frequency ±15%). 2) With the fastest update rate setting, there is no power down period between measurements. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 31 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Figure 3.3 Measurement Sequence in Update Mode Power down period depends on selected update rate ZSC31014 Core Activity Measure DSP Bridge Calcs Power Down Measure DSP Power Down Bridge Calcs Write new data to digital output register Special Temp/AZ Write new data to digital output register Measure Bridge DSP Power Down Calcs Write new data to digital output register (1) I2C™/SPI I2C™/SPI I2C™/SPI I2C™/SPI I2C™/SPI Read_DF Read_DF Read_DF Read_DF Read_DF Serial Interface Activity Valid read occurs Stale values Valid read occurs Stale values Valid read occurs (1) When special measurements of Temp or AZ are periodically performed, the update period will be lengthened. The benefit of slower update rates is power savings. If the update period is increased, the device will be powered down for longer periods of time, so power consumption will be reduced. When a special measurement occurs, a BP/BN (bridge) measurement will occur directly afterward. The update period during this special measurement will be increased by one conversion time over the standard measurement period. 3.1.2. Sleep Mode In Sleep Mode, after the command window, the ZSC31014 will power down until the master sends a Read_MR 2 2 (either I C™ or SPI) or a Write_MR (I C™ only). Specifics on the Read_MR and Write_MR commands are given in sections 3.2.1, 3.3.1, and 3.4.1. A Read_MR or Write_MR wakes the ZSC31014 and starts a measurement cycle. If the command is Read_MR, the part performs temperature, auto-zero (AZ), and a bridge measurement followed by the DSP correction calculations (see Figure 3.4). If the command is Write_MR, the part measures only the bridge and performs the correction calculations using previously measured temperature and auto-zero data (see Figure 3.5). Valid values are then written to the digital output register, and the ZSC31014 powers down again. Following a measurement sequence and before the next measurement can be performed, the master must send a Read_DF command, which will fetch the data as 2, 3 or 4 bytes (see section 3.2.2), without waking the ZSC31014. When a Read_DF is performed, the data packet returned will be the last measurement made with the status bits set to “valid.” See Table 2.9 for more information on the status bits. After the Read_DF is completed, the status bits will be set to “stale.” The next Read_MR or Write_MR will wake the part again and start a new measurement cycle. If a Read_DF is sent while the measurement cycle is still in progress, then the status bits of the packet will read as “stale.” The chip should be polled at a frequency slower than 20% more than the Sleep Mode response times listed in Table 3.4 and Table 3.5. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 32 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Note: Data is considered invalid from system power-on reset (POR) until the first measured data is written to the 2 digital register. Sending an I C™ Write_MR as the first command after power-on delivers invalid data; even though the status bits report it as “valid”. This is due to the correction calculations being performed with an uninitialized temperature and Auto-Zero value. 2 In I C™ Mode only, the INT/SS pin will assume the INT (interrupt) function. Instead of polling until a “valid” response is received, the application can look for a rise on the INT pin. This will indicate that the measurement 2 and calculations are complete, and new valid data is ready to be read on the I C™ interface. Table 3.4 Sleep Mode Response Times (Normal Integration Mode: 9 Coarse + 5 Fine) Measurement Request 1) 1) Response/4MHz Clock Read MR 4.5ms 1.5ms Write MR 1.5 ms 0.5ms 1) All time values shown are typical; for worst case values, multiply by 1.15 (nominal frequency ±15%). Table 3.5 Sleep Mode Response Times (Long Integration Mode: 10 Coarse + 5 Fine) Measurement Request 1) Response/1MHz Clock Response/1MHz Clock 1) Response/4MHz Clock Read MR 12ms 4.5ms Write MR 5.5 ms 1.5ms 1) All time values shown are typical; for worst case values, multiply by 1.15 (nominal frequency ±15%). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 33 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 2 ** Figure 3.4 Power-on Sequence in Sleep Mode for I C™ or SPI Read_MR (Typical Timing Values ) Measurement time depends on clock CLK = 4MHz (approx 1.26ms) CLK=1MHz (approx 4.42ms) POR ZSC31014 Core Activity Command Window Meas Temp Power Down Power ON Power Down Serial Interface Activity Meas AZ Meas Bridge DSP Calcs Write new data to digital output register Read wakes ZSC31014 Meas Temp Power Down Read wakes ZSC31014 I2C™/SPI I2C™/SPI I2C™/SPI I2C™/SPI Read_MR Read_DF Read_DF Read_MR Invalid values Valid read occurs 2 Figure 3.5 Sequence during Sleep Mode Using an I C™ Write_MR to Wake Up (Typical Timing Values Measurement time depends on clock CLK = 4MHz (approx 460µs) CLK=1MHz (approx 1.62ms) ZSC31014 Core Activity DSP Calcs Power Down Meas Bridge DSP Calcs Power Down Power Down Special Meas. Temp AZ Bridge Write new data to digital output register Write wakes ZSC31014 Serial Interface Activity I2C™ I2C™ Write_MR Read_DF DSP Calcs Power Down Write new data to digital output register Read wakes ZSC31014 I2C™ I2C™ Read_DF Read_MR I2C™ I2C™ Read_DF Read_DF Valid read occurs Stale values ** **) Valid read occurs Stale values All time values shown are typical; for worst case values, multiply by 1.15 (nominal frequency ±15%). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 34 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.2. ZSC31014 Read Operations with I2C™ 2 th For read operations, the I C™ master command starts with the 7bit slave address with the 8 bit =1 (READ). The 2 ZSC31014 as the slave sends an acknowledge (ACK) indicating success. The ZSC31014 has four I C™ read commands: Read_MR, Read_DF2, Read_DF3, and Read_DF4. Figure 3.6 shows the structure of the 2 measurement packet for three of the four I C™ read commands, which are explained in sections 3.2.1 and 3.2.2. 2 Figure 3.6 I C™ Measurement Packet Reads (1) I2C Read_MR – Measurement Request: Slave starts a measurement and DSP calculation cycle. S Start Condition S 6 5 4 3 2 1 0 R A S Device Slave Address [6:0] Wait for Slave ACK (2) I2C Read_DF2 – Data Fetch 2 Bytes: Slave returns only bridge data to the master in 2 bytes. Wait for Slave ACK Bridge Data [13:8] Master ACK Device Slave Address (example: Bit 5) 2 Data Bit (example: Bit 2) R Read/Write Bit (example: Read=1) A Acknowledge (ACK) S 6 5 4 3 2 1 0 R A 15 14 13 12 11 10 9 8 A 7 6 5 4 3 2 1 0 N S Device Slave Address [6:0] 5 Bridge Data [7:0] N Master NACK No Acknowledge (NACK) S Stop Condition Status Bit 2 (3) I C Read_DF3 – Data Fetch 3 Bytes: Slave returns 2 bridge data bytes & temperature high byte (T[10:3]) to master. S 6 5 4 3 2 1 0 R A 15 14 13 12 11 10 9 8 A 7 6 5 4 3 2 1 0 A 10 9 8 7 6 5 4 3 N S Device Slave Address [6:0] Wait for Slave ACK Bridge Data [13:8] Master ACK Bridge Data [7:0] Master ACK Temperature Data [10:3] Master NACK (4) I2C Read_DF4 – Data Fetch 4 Bytes: Slave returns 2 bridge data bytes & 2 temperature bytes (T[10:3]) and (T[2:0]xxxxx) to master. S 6 5 4 3 2 1 0 R A 15 14 13 12 11 10 9 8 A 7 6 Device Slave Address [6:0] Data Sheet July 2, 2014. Wait for Slave ACK Bridge Data [13:8] 1 0 A 10 9 8 7 6 5 4 3 A 2 1 0 x x x x x N S Master Bridge ACK Data [7:0] Master ACK Temperature Data [10:3] Master ACK Temperature Data [2:0] © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. Master NACK 35 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.2.1. I2C™ Read_MR (Measurement Request) The Read_MR (see example 1 in Figure 3.6) communication contains only the slave address and the READ bit (1) sent by the master. After the ZSC31014 responds with the slave ACK, the master must create a stop condition. This is only used in Sleep Mode (see section 3.1.2) to wake up the device and start a complete measurement cycle (including the special measurements) followed by the DSP calculations and writing the results to the digital output register. 2 2 Note: The I C™ Read_MR function can also be accomplished using the I C™ Read_DF2 or Read_DF3 command and ignoring the “stale” data that will be returned. 3.2.2. I2C™ Read_DF (Data Fetch) For Data Fetch commands, the number of data bytes returned by the ZSC31014 is determined by when the master sends the NACK and stop condition. For the Read_DF3 data fetch command (Data Fetch 3 Bytes; see example 3 in Figure 3.6), the ZSC31014 returns three bytes in response to the master sending the slave address and the READ bit (1): two bytes of bridge data with the two status bits as the MSBs and then 1 byte of temperature data (8-bit accuracy). After receiving the required number of data bytes, the master sends the NACK and stop condition to terminate the read operation. For the Read_DF4 command, the master delays sending the NACK and continues reading an additional final byte to acquire the full corrected 11-bit temperature measurement. In this case, the last 5 bits of the final byte of the packet are undetermined and should be masked off in the application. The Read_DF2 command is used if corrected temperature is not required. The master terminates the READ operation after the two bytes of bridge data (see example 2 in Figure 3.6). 3.3. SPI Read Operations The SPI interface of ZSC31014 can be programmed for falling-edge MISO change or rising-edge MISO change (see SPI_Polarity, bit 0 of EEPROM word 02HEX, in section 3.6). 3.3.1. SPI Read_MR (Measurement Request) A special SPI Read_MR command is used for waking up the part in Sleep Mode (see section 3.1.2). It performs a measurement cycle including the special measurements and a correction calculation. The SPI Read_MR command only requires that the SS line be dropped low for a minimum of 8µs then raised high again. The rise of SS will trigger the part to power up and perform the measurements. Figure 3.7 SPI Read_MR SS 8 µs Note: The SPI Read_MR function can also be accomplished using the SPI Read_DF command (see section 3.3.2) and ignoring the “stale” data that will be returned. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 36 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.3.2. SPI Read_DF (Data Fetch) For simplifying explanations and illustrations, only falling edge SPI polarity will be discussed in the following sections. The SPI interface will have data change after the falling edge of SCLK. The master should sample MISO on the rise of SCLK. The entire output packet is 4 bytes (32 bits). The high bridge data byte comes first, followed by the low bridge data byte. Then 11 bits of corrected temperature (T[10:0]) are sent: first the T[10:3] byte and then the {T[2:0],xxxxx} byte. The last 5 bits of the final byte are undetermined and should be masked off in the nd application. If the user only requires the corrected bridge value, the read can be terminated after the 2 byte. If rd the corrected temperature is also required but only at an 8-bit resolution, the read can be terminated after the 3 byte is read. Figure 3.8 SPI Output Packet with Falling Edge SPI_Polarity … SCLK MISO HiZ S1 S0 B13 B12 … … B7 B6 … … B0 T10 T9 … T1 T0 x HiZ SS Packet = [ {S(1:0),B(13:8)}, {B(7:0)}, {T(10:3)},{T(2:0),xxxxx}] Where S(1:0) = Status bits of packet (normal, command, busy, diagnostic) B(13:8) = Upper 6 bits of 14-bit bridge data. B(7:0) = Lower 8 bits of 14-bit bridge data. T(10:3) = Corrected temperature data (if application does not require corrected temperature, terminate read early) T(2:0),xxxxx =. Remaining bits of corrected temperature data for full 11-bit resolution HiZ = High impedance Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 37 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.4. I2C™ Write Operations 2 th For write operations, the I C™ master command starts with the 7-bit slave address with the 8 bit =0 (WRITE). The ZSC31014 as the slave sends an acknowledge (ACK) indicating success. The ZSC31014 has two general 2 2 2 I C™ write command formats: I C™ WRITE and I C™ Write_MR. Figure 3.9 shows the structure of the write 2 packet for the two I C™ write commands, which are explained in sections 3.4.1 and 3.4.2. 2 Figure 3.9 I C™ Measurement Packet Writes (1) I2C Write, Command Byte, and 2 Data Bytes. S 6 5 4 3 2 1 0 W A 7 6 5 4 3 2 1 0 A 7 6 5 4 3 2 1 0 A 7 6 5 4 3 2 1 0 A S Device Slave Address Wait for Slave ACK Command Wait for Byte Slave ACK Data Byte Wait for Slave ACK Data Byte Wait for Slave ACK (2) I2C Write_MR – Measurement Request: Slave starts a bridge only measurement and DSP calculation cycle. S 6 5 4 3 2 1 0 W A S Device Slave Address [6:0] Wait for Slave ACK S Start Condition 5 S Stop Condition Device Slave Address (example: Bit 5) W Read/Write Bit (example: Write=0) A Acknowledge (ACK) 4 Command Bit (example: Bit 4) No Acknowledge (NACK) 2 Data Bit (example: Bit 2) N 3.4.1. I2C™ Write_MR (Measurement Request) 2 Write_MR is a special I C™ write operation, which only includes the 7-bit slave address and the WRITE bit (0). This command can only be sent in Sleep Mode (see section 3.1.2). It wakes up the part and starts a measurement cycle for the bridge values only (no special measurement) and a DSP calculation based on former AZ and Temperature values. After finishing the calculation with valid results written to the digital register, the ZSC31014 powers down again and a Read_DF (see section 3.2.2) is required to read the valid values. See Figure 3.9 for an illustration of Write_MR. 2 2 Note: The I C™ Write_MR function can also be accomplished using the I C™ WRITE command with “don’t care” data in Sleep Mode. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 38 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.4.2. Command Mode I2C™ Write Operations 2 With the exception of the I C™ Write_MR command, write operations typically only occur in Command Mode (see 2 section 3.1) and are only supported for the I C™ protocol. Command Mode write commands to the ZSC31014 are nd in 32-bit packets. After the write command byte (7-bit slave address followed by 0 for write), the next (2 ) byte is considered the command byte, and the subsequent two bytes form a 16-bit data field. See Figure 3.9 for an 2 illustration of the Command Mode I C™ WRITE command sequence. Note: If data is not needed for the command, all zeros must be supplied as data to complete the 32-bit packet. 3.5. Command/Data Pair Encoding in Command Mode 2 In Command Mode (see section 3.1), the master uses the I C™ protocol to send 4-byte commands to the ZSC31014 (see section 3.4.2). Table 3.6 shows the available commands with their description and encodings. Note: Only the commands listed in Table 3.6 below are valid for the ZSC31014 in Command Mode. Other encodings might cause unpredictable results. If data is not needed for the command, zeros must be supplied as data to complete the 32-bit packet. Table 3.6 Command List and Encodings Command Byte 8 Command Bits (Hex) 00HEX to 13HEX 40HEX to 53HEX 80HEX A0HEX †† Third and Fourth Bytes 16 Data Bits(Hex) 0000HEX Processing †† Time Description 4MHz/1MHz EEPROM Read of addresses 00HEX to 13HEX. After this command has been sent and executed, a data fetch of three bytes must be performed. The first byte will be a response byte, which should be a 5AHEX, and then the next two bytes will be the EEPROM data. 10μs YYYYHEX (Y= data) Write to EEPROM addresses 00HEX to 13HEX. If the command is an EEPROM write, then the 16 bits of data sent will be written to the address specified in the 6 LSBs of the command byte. 15ms 0000HEX Start_NOM => Ends Command Mode and transitions to Normal Operation Mode. When a Start_NOM command is executed, a flag is checked to see if EEPROM was programmed during Command Mode. If so, the device will regenerate the checksum and update the signature EEPROM word. 0000HEX 15ms if EEPROM signature is updated; 10μs otherwise Start_CM => Start Command Mode; used to enter Command Mode. Start_CM is only valid during the power-on command window. 10μs All time values shown are typical; for worst case values, multiply by 1.15 (nominal frequency ±15%). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 39 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner In Command Mode, the INT/SS pin operates as an interrupt by rising when a command has finished executing. With this form of positive acknowledgement, the master does not need to poll the ZSC31014 to determine if the command was received and completed. This is particularly useful for commands that take the ZSC31014 longer to complete, such as EEPROM programming. If needed, a response byte of 5A HEX can be fetched after a command has been executed. In the case of an EEPROM read, this byte is included as the first byte of the data fetch. 3.6. EEPROM Bits Table 3.7 provides a summary of the EEPROM contents, which determine ZSC31014 operation, including communication, and store the calibration coefficients and the customer ID. The ZSC31014 EEPROM contains 2 twenty 16-bit words. See section 3.4.2 for instructions for writing to the EEPROM in Command Mode via the I C™ interface. Table 3.7 EEPROM Word/Bit Assignments Note: IC default setting bits with the designation “s” indicate that the bit is set at the factory to a value determined at final test/programming. EEPROM Word Bit Range IC Default Description Note ssss ssssBIN 7:0 00HEX X coordinate on wafer test s ssssBIN 12:8 Wafer number Cust_ID0 Customer ID word 0 (combines with EEPROM words 0EHEX and 13HEX to form the customer ID). Programmed with the X coordinate on wafer test, the wafer number, and the 3 LSBs of lot number as the default values. sssBIN 15:13 Data Sheet July 2, 2014. 3 LSBs of lot number © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 40 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner EEPROM Word Bit Range IC Default Description ZMDI_Config_1 001 BIN ZMDI Reserved Must preserve factory settings. 3 1BIN ClkSpeed Digital Core Clock Frequency 0 = 4MHz 1 = 1MHz 4 0BIN Comm_Type Serial Communication Type 2 0 = I C™ 1 = SPI 5 0BIN Sleep_Mode Normal Operation Mode 0 = Update Mode 1 = Sleep Mode The following time values are typical; for worst case values, multiply by 1.15 (nominal frequency ±15%). 7:6 01BIN Update_Rate 8 0 BIN ZMDI Reserved 1MHz Clock 4MHz Clock 00 = 1.6ms 01 = 5.0ms 10 = 25.0ms 11 = 125.0ms 00 = 0.5ms 01 = 1.5ms 10 = 6.5ms 11 = 32.0ms Must preserve factory settings. Type of second-order curve correction on bridge. If set to 0, the bridge SOT will correct for a parabolic curve. If set to 1, the bridge SOT will correct for an S-shaped curve. 9 0 BIN SOT_curve 11:10 00 BIN TC_Sign TC_Sign[0] = 1, Tco is a negative number. TC_Sign[1] = 1, Tcg is a negative number. SOT_Sign SOT_Sign[0] =1, SOT_bridge is negative. SOT_Sign[1] =1, SOT_tco is negative. SOT_Sign[2] =1, SOT_tcg is negative. SOT_Sign[3] =1, SOT_T is negative. 15:12 July 2, 2014. Bits in the ZMDI_Config_1 EEPROM word control the following settings. Important: IC must be power-cycled after changes to this word. 2:0 01HEX Data Sheet Note 0000 BIN © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 41 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner EEPROM Word Bit Range IC Default Description ZMDI_Config_2 Bits in the ZMDI_Config_2 EEPROM word control the following settings. Important: IC must be power-cycled after changes to this word. 0 0 BIN SPI_Polarity Configure clock polarity of SPI interface 0 = MISO changes on SCLK negative edge. 1 = MISO changes on SCLK positive edge. 2:1 00 BIN Diag_cfg 2-bit diagnostic configuration field. Diag_cfg[0] enables sensor connection check. Diag_cfg[1] enables sensor short checking. 9:3 0101000BIN Slave_Addr I C™ slave address (default = 28HEX). Valid range is 00HEX to 7FHEX. Comm_lock Communications address lock 011 => locked All other => unlocked 2 When communication is locked, I C™ communication will only respond to its programmed address. 2 Otherwise if communication is unlocked, I C™ will respond to any address. 02HEX 12:10 03HEX Note 011BIN ‡‡ 2 15:13 000BIN EEP_Lock EEPROM lock 011 = locked All other = unlocked When EEPROM is locked, the internal charge pump is disabled and the EEPROM can never be programmed again. NOTE: Next command must be Start_NOM so that the signature is calculated and written to §§ EEPROM before power down. 15:0 0000HEX Offset_B Signed 16-bit offset for bridge correction. See section 2.2.2 for details on programming Offset_B for raw data collection. 14:0 010 0000 0000 0000 BIN Gain_B 15-bit magnitude of bridge gain. Always positive. Unity is 2000HEX. 15 0BIN Gain8x_B 04HEX Multiple Gain_B by 8 0 = Gain_B x 1 1 = Gain_B x 8 ‡‡ The Comm_lock is set to 000BIN during wafer test for parts manufactured in workweek (ww) ≥13/2009. §§ Caution: If the part is power cycled instead, the lock will take effect, and the checksum will be permanently wrong. In this case, the part will always output a diagnostic state. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 42 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner EEPROM Word Bit Range IC Default Description 05HEX 15:0 0000HEX Tcg Coefficient for temperature correction of bridge gain term. Tcg = 16-bit magnitude of Tcg term with sign determined by TC_Sign[1]. 06HEX 15:0 0000HEX Tco Coefficient for temperature correction of bridge offset term. Tco = 16-bit magnitude of Tco term with sign determined by TC_Sign[0]. 07HEX 15:0 0000HEX SOT_tco 2 order term applied to Tco. This term is a 16-bit magnitude with sign determined by SOT_Sign[1]. 08HEX 15:0 0000HEX SOT_tcg 2 order term applied to Tcg. This term is a 16-bit magnitude with sign determined by SOT_Sign[2]. Note nd nd nd 2 order term applied to the bridge measurement. This term is a 16-bit magnitude with sign determined by SOT_Sign[0]. SOT_curve selects parabolic or S-shaped fit. 09HEX 15:0 0000HEX SOT_bridge 0AHEX 15:0 Die: 0000HEX SOP8: ddddHEX Offset_T Temperature offset correction coefficient.*** Temperature gain correction coefficient.*** Die: 010 0000 0000 0000 BIN 14:0 SOP8: ddd dddd dddd dddd BIN Gain_T 15 0BIN Gain8x_T 0CHEX 15:0 Die: 0000HEX SOP8: ddddHEX SOT_T 0DHEX 15:0 Die: 0000HEX SOP8: ddddHEX TSETL Stores raw temperature reading at the temperature at which low calibration points were taken.*** Cust_ID1 Customer ID word 1 (combines with EEPROM words 00HEX and 13HEX to form the customer ID). Programmed with the Y coordinate of wafer location as the default. 0BHEX 00ssHEX 0EHEX *** 15:0 Set to Y coordinate (ss) at the factory. Multiple Gain_T by 8 0 = Gain_T x 1 1 = Gain_T x 8 nd 2 order term applied to the temperature reading. This term is a 16-bit magnitude with sign determined by SOT_Sign[3]. Always a parabolic fit.*** For SOP8 packaged parts, the letter “d” refers to the factory setting that is calculated at ZMDI production test for calibrated temperature data. Before performing a new sensor calibration over temperature, change the “d” values to the die default setting. Also see section 2.2.3. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 43 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner EEPROM Word Bit Range IC Default Description B_Config Register 3:0 1000 BIN A2D_Offset [3:0] Note Front-end configuration for bridge measurement [3:0] A2D Range 1010 5/8 to 3/8 0100 -1/4 to 3/4 1001 -9/16 to 7/16 0011 -3/16 to 13/16 1000 -1/2 to 1/2 0010 -1/8 to 7/8 0111 -7/16 to 9/16 0001 -1/16 to 15/16 0110 -3/8 to 5/8 0000 0 to 16/16 0101 -5/16 to 11/16 [2:0] PreAmp_Gain 6:4 010 BIN PreAmp_Gain [2:0] 0FHEX 7 1 BIN Gain_Polarity 8 1 BIN LongInt 9 1 BIN Bsink 11:10 10 BIN PreAmp_Mux [1:0] [3:0] A2D Range See Table 2.4 for more details. GAIN 000 1.5 100 3 001 6 101 12 010 24 110 48 011 96 111 192 Gain polarity: 0=negative gain, 1=positive gain If 1, selects long integration period (11-coarse + 3 fine), which results in lower noise, slower conversion; If 0, the conversion is done as (9 coarse + 5 fine). If 1, Bsink pull-down will be enabled during the measurement. PreAmp_Mux [1:0] 10 11 Measurement Bridge Half-bridge input 0 BIN 12 15:13 Data Sheet July 2, 2014. (Must be 0 if using PreAmp Gain ≥ 6.) 000 BIN Disable_Nulling ZMDI Reserved Disable Nulling 0 = Nulling On 1 = Nulling Off (Use this setting if PreAmp gain <6.) Must preserve factory settings. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 44 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner EEPROM Word Bit Range IC Default Description T_Config Register Note Front-end configuration for temperature measurement DO NOT CHANGE default setting. Trimmed at production test to avoid saturation. 3:0 ssss BIN A2D_Offset [3:0] [3:0] A2D Range [3:0] A2D Range 1010 5/8 to 3/8 0100 -1/4 to 3/4 1001 -9/16 to 7/16 0011 -3/16 to 13/16 1000 -1/2 to 1/2 0010 -1/8 to 7/8 0111 -7/16 to 9/16 0001 -1/16 to 15/16 0110 -3/8 to 5/8 0000 0101 -5/16 to 11/16 0 to 16/16 See Table 2.4 for more details. DO NOT CHANGE default setting. Temperature measurement requires a gain of 6 to avoid saturation. [6:4] 6:4 001 BIN PreAmp_ Gain[2:0] 10HEX 7 1 BIN Gain_Polarity Gain [6:4] Gain 000 1.5 010 24 100 3 110 48 001 6 011 96 101 12 111 192 DO NOT CHANGE default setting. Gain_Polarity must be positive for internal temperature measurements. Gain polarity; 0 = negative, 1= positive gain. 11HEX 0 BIN LongInt 9 0 BIN Bsink 11:10 01 BIN PreAmp_Mux [1:0] 12 0 BIN Disable_Nulling DO NOT CHANGE default setting. Nulling is enabled for temperature measurements 15:13 000 BIN ZMDI Reserved DO NOT CHANGE default setting. Must preserve factory settings. 7:0 0011ssss BIN Osc_Trim DO NOT CHANGE default setting. Must preserve factory settings. 15:8 Data Sheet July 2, 2014. If 1, selects long integration period (11-coarse + 3 fine), for lower noise, slower conversion; otherwise, the conversion is (9 coarse + 5 fine). 8 DO NOT CHANGE default setting. Bsink must be disabled for internal temperature measurements. DO NOT CHANGE default setting. Unused © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 45 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner EEPROM Word Bit Range IC Default Description Note 12HEX 15:0 - Signature Generated through a linear feedback shift register (LFSR). After EEPROM changes, the next command that is sent must be Start_NOM so that the signature is calculated and written to EEPROM. Signature checked on power-up to ensure EEPROM contents integrity. 13HEX 15:0 MSB of Lot Number Cust_ID2 Customer ID word 2 (combines with EEPROM words 00HEX and 0EHEX to form customer ID). Programmed with the MSB of the lot number as the default. 3.7. Calibration Sequence Although the ZSC31014 can work with many different sources of differential signals, assume a pressure bridge for the following discussion on calibration. Calibration essentially involves collecting raw signal and temperature data from the device for different known pressures and temperatures. This raw data can then be processed by the calibration master (assumed to be a PC), and the calculated calibration coefficients can then be written to EEPROM. ZMDI can provide software and hardware with samples to perform the calibration. Below is a brief overview of the steps involved in calibrating a ZSC31014. See ZSC31014_SSC_Evaluation_Kit_Description_Rev_X.xy.pdf for a complete description and detailed examples. For SOP8-packaged parts, the on-chip temperature sensor is calibrated by ZMDI production test with an error ≤ 2.5K over the full operational temperature range of -40°C to +125°C. The resulting IC-specific correction coefficients required for the signal conditioning of the temperature output data are stored in the EEPROM registers 0AHEX to 0DHEX and must remain unchanged if these temperature signal conditioning coefficients are used without re-calibration over temperature. If instead the SOP8 parts are recalibrated, EEPROM registers 0AHEX to 0DHEX must be changed to the same default values as for the die prior to calibration (see Table 3.7). There are three main steps to calibration: 1. Assigning a unique identification to the IC. This identification is programmed in EEPROM and can be used as an index into a database stored on the calibration PC. This database will contain all the raw values of bridge readings and temperature readings for that part, as well as the known pressure and temperature the bridge was exposed to. This unique identification can be stored in the three 16-bit EEPROM registers dedicated to customer ID. 2. Data collection. Data collection involves getting uncorrected data from the bridge at different known pressures and temperatures. This data is then stored on the calibration PC using the unique identification of the device as the index to the database. 3. Coefficient calculation and storage in EEPROM. After enough data points have been collected to calculate all the desired coefficients, then the coefficients can be calculated by the calibrating PC and written to the EEPROM of the device. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 46 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Step 1 – Assigning Unique Identification Assigning a unique identification number is as simple as using the EEPROM WRITE command (see section 3.5) to write the identification number to Cust_ID0 (EEPROM word 00 HEX), Cust_ID1 (EEPROM word 0EHEX), and Cust_ID2 (EEPROM word 13HEX); see section 3.6). These three 16-bit registers allow for more than 280 trillion unique devices. Step 2 – Data Collection The number of unique points (pressure and/ or temperature) at which calibration must be performed depends on the requirements of the application and the behavior of the resistive bridge in use. The minimum number of points required is equal to the number of bridge coefficients to be corrected. The available calibration methods and the required number of points for each are listed below: 1. 2-point calibration can be used if only a gain and offset term are needed for a bridge with no temperature compensation for either term. st 2. 3-point calibration would be used to obtain 1 order compensation for either a Tco or Tcg term but not both. 3. 3-point calibration could also be used to obtain 2 temperature compensation of the bridge output. nd order correction for the bridge (SOT_bridge) but no st 4. 4-point calibration would be used to obtain 1 order compensation for both Tco and Tcg. st 5. 4-point calibration could also be used to obtain 1 order compensation for either Tco or Tcg (but not both) nd and a 2 order correction for the bridge measurement. st st 6. 5-point calibration could be used to obtain both 1 order Tco correction and 1 order Tcg correction, plus nd nd a 2 order correction that could be applied to one and only one of the following: 2 order Tco (SOT_tco); nd nd 2 order Tcg (SOT_tcg); or 2 order bridge. st 7. There are many options for a 6-point calibration; however, the most likely would be for both 1 and 2 order correction of Tco and Tcg. 8. 7-point calibration would have all three 2 nd nd order terms applied: SOT_tco, SOT_tcg, and SOT_bridge. Step 3 – Coefficient Calculations The math to perform the coefficient calculation is complicated and will not be discussed in detail. There is a rough overview in section 3.8. ZMDI provides software (DLLs) to perform the coefficient calculation. After the coefficients are calculated, the final step is to write them to the EEPROM of the ZSC31014. 3.8. Calibration Math ZMDI can provide software and hardware with samples to perform the calibration. For a complete description and detailed examples, see ZSC31014_SSC_Evaluation_Kit_Description_Rev_X.xy.pdf. For more details on the following equations, refer to ZSC31014 Technical Note—Detailed Equations for ZSC31014 Math (available on request). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 47 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.8.1. Bridge Signal Compensation SOT_curve (bit 9 in EEPROM word 01HEX; see section 3.6) selects whether second-order equations compensate for sensor nonlinearity with a parabolic or S-shaped curve. The correction formula for the differential signal reading is represented as a two-step process depending on the SOT_curve setting. Note: The following equations are only meant to show the general form and capabilities of the ZSC31014 sensor signal conditioning. Full details of the equations are not given. Equations for the parabolic SOT_curve setting (SOT_curve = 0): ZB = Gain_B [1 + T(SOT_tcgT + Tcg)][BR_Raw + Offset_B – ADC_Offset+ T(SOT_tcoT + Tco)] + 2000 HEX B = ZB(1+SOT_bridge ZB) (4) (5) Equations for the S-shaped SOT_curve setting (SOT_curve = 1): ZB = Gain_B [1 + T(SOT_tcgT + Tcg)][BR_Raw + Offset_B – ADC_Offset + T(SOT_tcoT + Tco)] B = ZB(1+SOT_bridge |ZB|) + 2000HEX (6) (7) Where 2 B = Corrected bridge reading output via I C™ or SPI ZB = Intermediate result in the calculations BR_Raw = Raw bridge reading from ADC after AZ correction Gain_B = Bridge gain term Offset_B = Bridge offset term Tcg = Temperature coefficient gain term Tco = Temperature coefficient offset term T_Raw = Raw temperature reading TSETL = T_Raw reading at which low calibration was performed (typically 25°C) T = (T_Raw - TSETL) SOT_tcg = Second-order term for Tcg non-linearity SOT_tco = Second-order term for Tco non-linearity SOT_bridge = Second-order term for bridge non-linearity 2000HEX Converts result to the unsigned domain = ADC_Offset = Data Sheet July 2, 2014. 14 2 * ratio of the selected A2D_Offset (EEPROM word B_Config) © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 48 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.8.2. Temperature Signal Compensation If a compensated temperature output is also required, a temperature calibration is necessary. Temperature correction contains both linear gain and offset terms as well as a second-order term to correct for any nonlinearities. For temperature, second-order compensation for nonlinearity is always parabolic. The following equations are only meant to show the general form and capabilities of the ZSC31014 sensor signal conditioning. Full details of the equations are not given. Again, the correction formula is best represented as a two-step process as follows: ZT = Gain_T[T_Raw + Offset_T] (8) T = ZT (1+SOT_T ZT) (9) Gain_T = Gain coefficient for temperature T_Raw = Raw temperature reading Offset_T = Offset coefficient for temperature SOT_T = Second-order term for temperature source non-linearity Where: 3.8.3. Limits Imposed on Coefficient Ranges There are range limits on some of the calibration coefficients that will be enforced by software and DLLs provided by ZMDI. These limits ensure the integrity of the internal calculations and would only limit the most extreme cases of sensor correction. The limits are outlined in Table 3.8. Table 3.8 Restrictions on Coefficient Ranges Coefficient Valid Range Comment Gain_B, Gain_T When Gain8x=0: 2000 to 7FFF When Gain8x=1: 400 to 7FFF A gain less than unity (attenuating) implies the range of interest is being clipped in the A2D. In this case, a lower PreAmp_Gain should be chosen. Gains greater than 7FFF (≈4.0) can cause overflow in the internal calculations. If digital gains greater than 4.0 are needed for the bridge, use the Gain8x feature. Offset_B, Offset_T Positive offset (0 to 1FFF) Negative offset (E000 to FFFF) Offsets are a signed number that is added to the result of a 14-bit A2D conversion. Although the EEPROM register is 16-bits wide, the coefficient cannot exceed the range of a signed 14-bit number. SOT_B, SOT_T Positive SOT (0 to 7FFF) Negative SOT (0 to 3FF) Positive SOTs greater than 7FFF can cause overflow in the internal math. Negative SOTs greater in magnitude than 3FF are invalid because the function becomes double definite. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 49 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.8.4. Interpretation of Binary Numbers for Correction Coefficients BR_Raw should be interpreted as a signed number in the set [-8192,8191] with a resolution of 1 when the Offset Mode is [-1/2.1/2]. T_Raw should be interpreted as an unsigned number in the set [0,16383] with a resolution of 1. 3.8.4.1. Gain_B and Gain_T Interpretation Gain_B and Gain_T should be interpreted as a number in the set [0,4). 2000HEX represents unity. Bit 14 has a weight of 2, and each subsequent bit has a weighting of ½ the previous bit. Bit 15 scales Gain_B or Gain_T by an additional factor of 8. This allows Gain_B or Gain_T to be a number in the range [0,32). Table 3.9 Gain_B Weightings Bit Position Weighting 15 Gain8x 14 2 13 1 12 -1 2 . . -12 1 2 0 2 -13 Examples: The binary number: 0100 1010 0110 0010 = 2.3245 The binary number: 1101 1000 1001 0110 = 22.146 Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 50 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 3.8.4.2. Offset_B and Offset_T Interpretation Offset_B and Offset_T are 16-bit signed binary numbers in two’s complement form. The MSB has a weighting of -32768. The following bits then have a weighting of: 16384, 8192, 4096 … Table 3.10 Offset_B Weightings Bit Position Weighting 15 -32768 14 16384 13 8192 … 1 1 2 =2 0 2 =1 0 For example, the binary number 1111 1111 1111 1100 = -4. 3.8.4.3. Tco Interpretation Tco is specified as having a 16-bit magnitude with its sign determined by TC_Sign (bits [11:10] of EEPROM word 01HEX; see section 3.6). 3.8.4.4. Tcg Interpretation Tcg is specified as having a 16-bit magnitude with its sign determined by TC_Sign (bits [11:10] of EEPROM word 01HEX; see section 3.6). 3.8.4.5. SOT_tco, SOT_tcg, SOT_bridge, and SOT_T Interpretation All SOT_terms are specified as having a 16-bit magnitude with the sign determined by SOT_Sign (bits [15:12] of EEPROM word 01HEX; see section 3.6). SOT_curve selects parabolic or S-shaped fit for the bridge compensation. For temperature compensation, parabolic is always used. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 51 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 4 Application Circuit Examples 2 The digital output of the ZSC31014 can be read via I C™ or SPI. The ZSC31014 can be configured in Sleep or Update Mode for the Normal Operation Mode, which outputs the corrected measurement readings. The B_Config settings for Gain_Polarity, PreAmp_Gain and A2D_Offset are given only as examples because these values must be adapted specifically to the sensor signal range. 4.1. I2C™ Interface – Bridge using Low Power Bsink Option This example demonstrates the low power Bsink option with 2 internal temperature sensing. Data is output via the I C™ interface. For this application, VDD is assumed to be 5V and the bridge sensor voltage is 16.5mV to 61.5mV. In this case, the B_Config register setting for PreAmp_Gain is 24, which means nulling should be on, and the A2D_Offset is ½ to - ½. Update Mode with a slower update rate and Bsink are enabled to save power. Vsupply (2.7 to 5.5V) ZSC31014 VSS VDD BSINK For temperature correction, use the T_Config settings that are pre-programmed in production test. (See the T_Config defaults in Table 3.7.) INT/SS VBP SDA/MISO VBN SCL/SCLK 0.1µF NOTE: The A2D_Offset and PreAmp_Gain terms in T_Config are programmed during test to avoid saturation of the internal temperature bridge. Do not change these parameters (designated with † in Table 4.1). GND B_Config 0FHEX T_Config 10HEX 0 0 0 0 0 0 0 0 1 0 0 1 1 0 0 † 0 Gain_Polarity[7] PreAmp_ Mux [11:10] Longint[8] Reserved [15:13] Example 1 Circuit Diagram: Bsink Option and Internal Temperature 2 Correction and I C™ Output Bsink[9] Table 4.1 Register Settings—Example 1 Disable Nulling [12] Figure 4.1 1 1 A2D_Offset [3:0] PreAmp_Gain [6:4] 0 1 0 1 0 0 0 † † † † † † † 0 0 1 † Reserved setting – do not change factory settings. If factory trim settings have been lost, program T_Config to 149xHEX. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 52 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 4.2. Generic Differential A2D Converter The ZSC31014 has many PreAmp_Gain settings available and makes an excellent 14-bit analog-to2 digital converter with I C™ or SPI output for any differential signal source. In this application, the ZSC31014 is being used as a generic differential A2D converter. The PreAmp_Mux bit in B_Config must be set to 10. The PreAmp_Gain is set to 24, which means nulling should be on, and the A2D_Offset is set to -1/2, 1/2 in this example. Vsupply +2.7V to 5.5V ZSC31014 VSS VDD BSINK For temperature correction, use the T_Config settings that are pre-programmed in production test. (See the T_Config defaults in Table 3.7.) Differential Signal from Any Source INT/SS VBP SDA/MISO VBN SCL/SCLK 0.1µF NOTE: The A2D_Offset and PreAmp_Gain terms in T_Config are programmed during test to avoid saturation of the internal temperature bridge. Do not change these parameters (designated with † in Table 4.2). GND Gain_Polarity[7] PreAmp_ Mux [11:10] 0 0 1 0 0 1 0 B_Config 0FHEX 0 0 0 0 1 0 T_Config 10HEX 0 0 0 0 0 1 0 † A2D_Offset [3:0] PreAmp_ Gain[6:4] Longint[8] Reserved [15:13] Example 2 Circuit Diagram: Generic Differential A2D Converter Bsink[9] Table 4.2 Register Settings—Example 2 Disable Nulling [12] Figure 4.2 † 1 0 † 0 1 0 0 0 † † † † † 1 † Reserved setting – do not change factory settings. If factory trim settings have been lost, program T_Config to 149xHEX. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 53 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 4.3. Half-Bridge Measurement In this application, the ZSC31014 is being used as a signal conditioner for a half-bridge signal from a Honeywell HIH4000 humidity sensor. This application shows the option of measuring a single voltage (1V to 3.8V) and using the internal temperature sensor for temperature correction. Vsupply 5V ZSC31014 e.g. HIH4000 VSS VBN is internally connected to a voltage divider as a reference (VDD/2). In this case, the PreAmp_Mux bit in B_Config must be 11 and the PreAmp_Gain must be set to the lowest value (1.5), which means nulling should be off. VDD BSINK OU INT/SS T/O VBP SDA/MISO WI VBN SCL/SCLK 0.1µF GND For temperature correction, use the T_Config settings that are pre-programmed in production test. (See the T_Config defaults in Table 3.7.) Figure 4.3 Half-Bridge Voltage Measurement with Internal Temperature Correction NOTE: The A2D_Offset and PreAmp_Gain terms in T_Config are programmed during test to avoid saturation of the internal temperature bridge. Do not change these parameters (designated with † in Table 4.3). B_Config 0FHEX T_Config 10HEX 0 0 0 0 0 0 1 0 1 0 1 1 0 0 0 † 0 Gain_Polarity[7] PreAmp_ Mux [11:10] Longint[8] Reserved [15:13] Bsink[9] Register Settings—Example 3 Disable Nulling [12] Table 4.3 1 1 A2D_Offset [3:0] PreAmp_ Gain[6:4] 0 0 0 0 0 1 0 † † † † † † † 0 0 1 † Reserved setting – do not change factory settings. If factory trim settings have been lost, program T_Config to 149xHEX. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 54 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 5 ESD/Latch-Up-Protection All pins have an ESD protection of >4000V and a latch-up protection of 100mA or (up to +8V / down to –4V) relative to VSS/VSSA. ESD protection referenced to the Human Body Model is tested with devices in SOP-8 packages during product qualification. The ESD test follows the Human Body Model with 1.5kOhm/100pF based on MIL 883, Method 3015.7. 6 Pin Configuration and Package The standard package of the ZSC31014 is SOP-8 (3.81mm body (150mil) wide) with lead-pitch 1.27mm (50mil). See the notes in Table 6.2 regarding connection requirements. Table 6.1 Storage and Soldering Conditions for the SOP-8 Package Parameter Symbol Conditions Min Typ Max Unit 150 C Maximum Storage Temperature Tmax_storage Less than 10hrs, before mounting Minimum Storage Temperature: Tmin_storage Store in original packing only Tdrybake Less than100 hrs total, before mounting 125 C Less than 30s (IPC/JEDEC-STD-020 Standard) 260 C Maximum Dry-Bake Temperature Soldering Peak Temperature Data Sheet July 2, 2014. Tpeak C -50 © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 55 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Figure 6.1 ZSC31014 Pin-Out Diagram Table 6.2 Pin No. 1 8 2 7 3 6 4 5 ZSC31014 Pin Assignments Name Description Note 1 VSS Ground supply. Must connect to GND. 2 Bsink Switched ground for bridge sink – optional feature for power savings. If not used, must be unconnected. 3 VBP Positive input for differential signal (bridge positive). 4 VBN Negative input for differential signal (bridge negative). 5 SCL/SCLK I C™ clock if in I C™ Mode. Serial clock if in SPI Mode. 6 SDA/MISO I C™ data if in I C™ Mode. Master-In-Slave-Out if in SPI Mode. 7 INT/SS Interrupt signal (conversion complete output) if in I C™ Mode. Slave Select (input) if in SPI Mode. 8 VDD Supply voltage (2.7-5.5V). 2 2 2 2 2 If not used, must be unconnected. Must connect to Vsupply. 7 Test The test program is based on this datasheet. The final parameters, which will be tested during production, are listed in the tables of section 1. The digital part of the IC includes a scan path, which can be activated and controlled during wafer test. It guarantees failure coverage of more than 80%. Additional digital and analog tests are added to increase this coverage to over 90%. See test specification for further details. 8 Reliability A reliability investigation according to the in-house non-automotive standard has been performed. Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 56 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 9 Customization For high-volume applications that require upgraded or downgraded functionality compared to the ZSC31014, ZMDI can customize the circuit design by adding or removing certain functional blocks. For this customization, ZMDI has a considerable library of sensor-dedicated circuitry blocks, which enable ZMDI to provide a custom solution quickly. Please contact ZMDI for further information. 10 Ordering Codes Sales Code Description Package ZSC31014EAB ZSC31014 Die — Temperature range: -40°C to +125°C Unsawn on Wafer ZSC31014EAC ZSC31014 Die — Temperature range: -40°C to +125°C Sawn on Wafer Frame ZSC31014EAG1 ZSC31014 SOP8 (150 mil) — Temperature range: -40° to +125°C Tube: add “-T” to sales code Reel: add “-R” ZSC31014EIB ZSC31014 Die — Temperature range: -40° to +85°C Unsawn on Wafer ZSC31014EIC ZSC31014 Die — Temperature range: -40° to +85°C Sawn on Wafer Frame ZSC31014EIG1 ZSC31014 SOP8 (150 mil) — Temperature range: -40° to +85°C Tube: add “-T” to sales code Reel: add “-R” ZSC31014KIT ZSC31014 SSC Evaluation Kit: Communication Board, SSC Board, Sensor Replacement Board, USB Cable, and 5 IC Samples (software can downloaded on the ZSC31014 product page at www.zmdi.com/zsc31014) Kit Contact ZMDI Sales for support and sales of ZMDI’s ZSC31014 Mass Calibration System. 11 Related Documents Note: X.xy refers to the most recent version. Document File Name ZSC31014 SSC Evaluation Kit Description ZSC31014_SSC_Evaluation_Kit_Description_Rev_X.xy.pdf ZSC31014 SSC Mass Calibration System Description * ZSC31014_SSC_Mass_Calibration_Rev_X.xy.pdf ZSC31014 Technical Notes—Calibration Sequence and Calibration DLL * ZSC31014_TN_Calibration_DLL_Rev_X.xy.pdf ZSC31014 Technical Note—Detailed Equations for Calibration Math ** ZSC31014_TN_Calibration_Math_Rev_X.xy.pdf ZMDI Technical Note—Wafer Dicing Guidelines ZMDI_Wafer_Dicing_Guidelines_Rev_X.xy.pdf For the most recent revision of this document and of the related documents, visit the ZSC31014 product page at www.zmdi.com/zsc31014 on ZMDI’s website at www.zmdi.com or contact your nearest ZMDI sales office. * Documents marked with an asterisk (*) require a login account for access on the web. For detailed instructions, visit www.zmdi.com/login-account-setup-procedure. ** Documents marked with a double asterisk (**) are available only on request (see page 59 for contact information). Data Sheet July 2, 2014. © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 57 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner 12 Definitions of Acronyms Term Description ADC Analog-to-Digital Converter AFE Analog Front-End ACK Acknowledge MCU Microprocessor MSB Most Significant Bit NACK Not Acknowledged SCL Serial Clock SDA Serial Data SPI System Packet Interface 13 Document Revision History Revision Date Description 1.20 May 15, 2009 Added notation for timing tolerance (nominal frequency ±15%) in section 3. Table 2.4 A2D_Offset Signals. Added all possible configurations. Revised web address and sales contacts. 1.30 January 20, 2010 Revisions to EEPROM default values in Table 3.7. Addition of ordering information. 1.32 April 5, 2010 Clarification of ordering information. Correction of values in Table 1.4. Default values for Osc_trim changed. Changed Equations (4) and (6). 1.33 May 6, 2010 Added EEPROM specifications to section 1.3“Electrical Parameters.” Added Table 6.1 “Storage and Soldering Conditions” to section 6 “Pin Configuration and Package.” Added notes to Table 6.2 “ZSC31014 Pin Assignments.” Matched A2D_Offset settings in Table 3.7 for B_Config and T_Config to Table 2.4. 1.34 July 21, 2010 Clarification of external temperature measurement, section 2.2.3.2. Addition of DF4 to Figure 3.6. 1.40 July 27, 2010 Revision of product name from ZMD31014 to ZSC31014. 1.50 January 7, 2011 Added I C™ specification deviation note, section 2.3.4 1.51 March 13, 2011 Update to ZMDI contact information. 1.52 July 12, 2011 Addition of Offset_B column to Table 2.4 for coefficient settings needed when collecting uncalibrated raw bridge values from the ADC. 1.53 May 10, 2012 Update to part ordering code table in section 10. Update to contact information. Revision of product title. 1.60 September 21, 2012 Revision of “Power-On-Reset Level” specification in section 1.3 and related text in section 2.3.6. Update for product ordering codes. 1.61 December 6, 2012 Update for contact information for Zentrum Mikroelektronik Dresden AG Korea Office and phone numbers for USA office. Data Sheet July 2, 2014. 2 © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 58 of 59 ZSC31014 RBiciLiteTM Digital Output Sensor Signal Conditioner Revision Date Description 1.62 March 11, 2013 Removed external temperature compensation. Updates for part order codes in section 10. Updates for contact information and minor edits to cover and header imagery. 1.63 April 21, 2014 Revision of “I C™ Interface & SPI Interface” section of Table 1.3. Minor updates for references to product and contents of Evaluation Kit. Waffle pack is no longer an option for delivery package. Updates for contact information. 1.64 July 2, 2014 Revision of calibration temperature for SOP8-packaged parts in section 2.2.3 and related default entries for registers 0AHEX to 0DHEX in Table 3.7. Update for section 8 regarding quality testing. Updates for contact information. 2 Sales and Further Information www.zmdi.com [email protected] Zentrum Mikroelektronik Dresden AG Global Headquarters Grenzstrasse 28 01109 Dresden, Germany ZMD America, Inc. 1525 McCarthy Blvd., #212 Milpitas, CA 95035-7453 USA Central Office: Phone: +49.351.8822.306 Fax: +49.351.8822.337 USA Phone 1.855.275.9634 Phone +1.408.883.6310 Fax +1.408.883.6358 European Technical Support Phone +49.351.8822.7.772 Fax +49.351.8822.87.772 DISCLAIMER: This information applies to a product under development. Its characteristics and specifications are subject to change without notice. Zentrum Mikroelektronik Dresden AG (ZMD AG) assumes no obligation regarding future manufacture unless otherwise agreed to in writing. The information furnished hereby is believed to be true and accurate. However, under no circumstances shall ZMD AG be liable to any customer, licensee, or any other third party for any special, indirect, incidental, or consequential damages of any kind or nature whatsoever arising out of or in any way related to the furnishing, performance, or use of this technical data. ZMD AG hereby expressly disclaims any liability of ZMD AG to any customer, licensee or any other third party, and any such customer, licensee and any other third party hereby waives any liability of ZMD AG for any damages in connection with or arising out of the furnishing, performance or use of this technical data, whether based on contract, warranty, tort (including negligence), strict liability, or otherwise. European Sales (Stuttgart) Phone +49.711.674517.55 Fax +49.711.674517.87955 Data Sheet July 2, 2014. Zentrum Mikroelektronik Dresden AG, Japan Office 2nd Floor, Shinbashi Tokyu Bldg. 4-21-3, Shinbashi, Minato-ku Tokyo, 105-0004 Japan ZMD FAR EAST, Ltd. 3F, No. 51, Sec. 2, Keelung Road 11052 Taipei Taiwan Phone +81.3.6895.7410 Fax +81.3.6895.7301 Phone +886.2.2377.8189 Fax +886.2.2377.8199 Zentrum Mikroelektronik Dresden AG, Korea Office U-space 1 Building 11th Floor, Unit JA-1102 670 Sampyeong-dong Bundang-gu, Seongnam-si Gyeonggi-do, 463-400 Korea Phone +82.31.950.7679 Fax +82.504.841.3026 © 2014 Zentrum Mikroelektronik Dresden AG — Rev. 1.64 All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice. 59 of 59