5962R0720802VXC

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Redraw. Add device type 02 and RHA information. - drw
12-03-15
Charles F. Saffle
B
Corrections to figure 1, case outline X. - drw
16-05-02
Charles F. Saffle
REV
SHEET
REV
B
B
B
B
B
SHEET
15
16
17
18
19
REV STATUS
REV
B
B
B
B
B
B
B
B
B
B
B
B
B
B
OF SHEETS
SHEET
1
2
3
4
5
6
7
8
9
10
11
12
13
14
PMIC N/A
PREPARED BY
Dan Wonnell
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
CHECKED BY
Rajesh Pithadia
APPROVED BY
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
Robert M. Heber
DRAWING APPROVAL DATE
07-10-26
REVISION LEVEL
B
MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT,
500 MSPS, ANALOG-TO-DIGITAL CONVERTER,
MONOLITHIC SILICON
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
5962-07208
1 OF 19
5962-E323-16
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and
space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
-
07208
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
01
V
X
C
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device types. The device types identify the circuit function as follows:
Device type
Generic number
01
02
Circuit function
ADS5463-SP
ADS5463-SP
A/D converter, 12-bit, 500 MSPS
A/D converter, 12-bit, 500 MSPS
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class
Device requirements documentation
Q or V
Certification and qualification to MIL-PRF-38535
1.2.4 Case outline. The case outline is as designated in MIL-STD-1835 and as follows:
Outline letter
X
Descriptive designator
See figure 1
Terminals
Package style
84
Quad flatpack with non-conductive tie bar
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
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A
REVISION LEVEL
B
SHEET
2
1.3 Absolute maximum ratings. 1/
Supply voltage:
AVDD5 to GND ...................................................................................................... 6 V
DVDD3 to GND ...................................................................................................... 5 V
AVDD3 to GND ...................................................................................................... 5 V
Analog input to GND .................................................................................................. -0.3 V to AVDD5 + 0.3 V
Clock input to GND .................................................................................................... -0.3 V to AVDD5 + 0.3 V
CLK to CLK .............................................................................................................. ±2.5 V
Digital data output to GND ......................................................................................... -0.3 V to DVDD3 + 0.3 V
Maximum junction temperature (TJ) .......................................................................... +150°C
Storage temperature range (TSTG) ........................................................................... -65°C to 150°C
Thermal resistance, junction-to-ambient (θJA) ........................................................... 21.81°C/W 2/
Thermal resistance, junction-to-case (θJC) ................................................................ 0.849°C/W 3/
1.4 Recommended operating conditions.
Supplies:
Analog supply voltage (AVDD5) ............................................................................. 4.75 V to 5.25 V
Analog supply voltage (AVDD3) ............................................................................. 3 V to 3.6 V
Output driver supply voltage (DVDD3) ................................................................... 3 V to 3.6 V
Analog input:
Differential input range .......................................................................................... 2.2 VPP
Input common mode voltage (VCM) ....................................................................... 2.4 V
Clock input:
ADCLK input sample rate (sine wave) (1/tC) ......................................................... 500 MSPS
Clock amplitude, sine wave, differential ................................................................. 3 VPP
Clock duty cycle ..................................................................................................... 50 %
Operating case temperature range (TC) .................................................................... -55°C to +125°C
Estimated device life at elevated temperatures electromigration fail modes:
________
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Heat slug connected to PCB thermal plane. Airflow is at 0 LFM (no airflow).
3/ Specified with the thermal bond pad on the backside of the package soldered to a 2 ounce CU plate PCB thermal plane.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
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A
REVISION LEVEL
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SHEET
3
1.5 Radiation features.
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s)
Device type 02: ....................................................................................................... 100 krads(Si) 1/
Maximum total dose available (dose rate ≤ 10 mrads(Si)/s):
Device type 02 ....................................................................................................... 100 krads(Si) 2/
The manufacturer supplying RHA device type 02 on this drawing has performed characterization test to demonstrate that the
parts do not exhibit enhanced low dose rate sensitivity (ELDRS) to 100 krads(Si) in accordance with MIL-STD-883, method
1019, paragraph 3.13.1.1. Therefore these parts may be considered ELDRS free to 100 krads(Si). The manufacturer will
perform high dose rate lot acceptance testing on a wafer by wafer basis in accordance with MIL-STD-883, method 1019,
conditions A for device type 02.
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
________
1/ The manufacturer supplying device type 02 has performed characterization testing in accordance with MIL-STD-883 method
1019, condition A at 100 krads(Si) only. The radiation end point limits for the noted parameters are guaranteed only for the
conditions as specified in MIL-STD-883, method 1019, condition A to a maximum total dose of 100 krads(Si).
2/
The manufacturer supplying device type 02 has performed characterization testing in accordance with MIL-STD-883 method
1019, and the parts do not exhibit enhanced low dose rate sensitivity (ELDRS) to 100 krads(Si). The radiation end point
limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition
D to a maximum total dose of 100 krads(Si).
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
B
SHEET
4
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 as specified herein, or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V.
3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Block diagram. The block diagram shall be as specified on figure 3.
3.2.4 Timing waveforms. The timing waveforms shall be as specified on figure 4.
3.2.5 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance
submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the
manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall
be provided with each lot of microcircuits delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
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5962-07208
A
REVISION LEVEL
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5
TABLE I. Electrical performance characteristics.
Test
Symbol
Group A
subgroups
Conditions 1/, 2/, 3/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Device
type
Limits
Unit
Min
Max
Internal reference voltages section
Reference voltage
VREF
1, 2, 3
All
2.38
2.42
V
Dynamic accuracy section
Differential linearity
error
DNL
fIN = 210 MHz
1, 2, 3
All
-0.98
1.2
LSB
Integral linearity error
INL
fIN = 210 MHz
1, 2, 3
01
-2.9
2.9
LSB
02
-3.5
3.5
Offset error
1, 2, 3
All
-0.5
0.5
%FS
Gain error
1, 2, 3
All
-5
5
%FS
1, 2, 3
01
335
mA
02
345
01
140
02
148
1, 2, 3
All
88
mA
1, 2, 3
01
2.425
W
02
2.450
Power supply section
Analog supply current
IAVDD5
FS = 500 MSPS, VIN = full scale,
fIN = 300 MHz
IAVDD3
Output buffer supply
current
IDVDD3
Power dissipation
PD
FS = 500 MSPS, VIN = full scale,
fIN = 300 MHz
FS = 500 MSPS, VIN = full scale,
fIN = 300 MHz
Dynamic AC characteristics section
Signal-to-noise ratio
SNR
4
fIN = 100 MHz
fIN = 210 MHz
01
64.1
5
62.7
6
63.5
4, 5, 6
02
60.5
4
01
63.6
5
62.4
6
63.2
4, 5, 6
02
dBFS
60.0
See footnotes at end of table.
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REVISION LEVEL
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TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Conditions 1/, 2/, 3/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Unit
Max
Dynamic AC characteristics section - continued.
Signal-to-noise ratio
Spurious free dynamic
range
SNR
SFDR
4
fIN = 300 MHz
fIN = 100 MHz
fIN = 210 MHz
fIN = 300 MHz
Second harmonic
HD2
fIN = 100 MHz
fIN = 210 MHz
fIN = 300 MHz
01
62.7
5
61.3
6
61.9
4, 5, 6
02
58.0
4
01
57.9
5
58.8
6
58.6
4, 5, 6
02
57.9
4
01
55.2
5
56.6
6
56.9
4, 5, 6
02
55.2
4
01
54.1
5
51.3
6
56.2
4, 5, 6
02
51.2
4
01
57.9
5
58.8
6
58.6
4, 5, 6
02
57.9
4
01
55.2
5
56.6
6
56.9
4, 5, 6
02
55.2
4
01
54.1
5
51.3
6
56.2
4, 5, 6
02
dBFS
dBc
dBc
51.2
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
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TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Group A
subgroups
Conditions 1/, 2/, 3/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Device
type
Limits
Min
Unit
Max
Dynamic AC characteristics section - continued.
Third harmonic
HD3
4
fIN = 100 MHz
fIN = 210 MHz
fIN = 300 MHz
Signal-to-noise and
distortion
SINAD
fIN = 100 MHz
fIN = 210 MHz
fIN = 300 MHz
01
69
5
68.5
6
65.6
4, 5, 6
02
64.0
4
01
66.7
5
65.3
6
64.1
4, 5, 6
02
59.0
4
01
70.1
5
61.9
6
64.8
4, 5, 6
02
61.9
4
01
58
5
58
6
58.4
4, 5, 6
02
55.9
4
01
55.8
5
56.2
6
56.7
4, 5, 6
02
53.8
4
01
54.9
5
52.2
6
56.1
4, 5, 6
02
dBc
dBc
50.2
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
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A
REVISION LEVEL
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SHEET
8
TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Conditions 1/, 2/, 3/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Unit
Max
Dynamic AC characteristics section - continued.
Worst harmonic/spur
(other than HD2 and
HD3)
HDW
4
fIN = 100 MHz
70.6
6
72.6
02
68.0
4
01
70.6
5
67.1
6
66.5
4, 5, 6
02
62.0
4
01
69.3
fIN = 300 MHz
THD
5
4, 5, 6
fIN = 210 MHz
Total harmonic
distortion
72.2
01
5
66.3
6
66.3
4, 5, 6
02
62.0
4
01
57.8
fIN = 100 MHz
5
58.3
6
58.1
4, 5, 6
02
57.8
4
01
55
fIN = 210 MHz
5
55.9
6
56.2
4, 5, 6
02
55.0
4
01
53.9
fIN = 300 MHz
5
51
6
55.6
4, 5, 6
02
dBc
dBc
51.0
See footnotes at end of table.
STANDARD
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COLUMBUS, OHIO 43218-3990
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REVISION LEVEL
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9
TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Conditions 1/, 2/, 3/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Unit
Max
Dynamic AC characteristics section - continued.
Effective number of bits
ENOB
4
fIN = 100 MHz
01
9.3
5
9.3
6
9.4
4, 5, 6
02
9.0
4
01
8.9
fIN = 210 MHz
5
9.0
6
9.1
4, 5, 6
02
8.65
4
01
8.8
fIN = 300 MHz
5
8.3
6
9.0
4, 5, 6
02
8.05
Bits
Digital characteristics – LVDS digital outputs
Differential output
voltage
VOD
1, 2, 3
01, 02
247
454
mV
Common mode output
voltage
VOC
1, 2, 3
01, 02
1.125
1.375
V
Clock period
tCLK
9, 10, 11
01, 02
2
50
ns
Clock pulse duration,
high
tCLKH
9, 10, 11
01, 02
1
ns
Clock pulse duration,
low
tCLKL
9, 10, 11
01, 02
1
ns
Timing characteristics 4/
Clock input section
1/
3/
Device type 02 has been characterized at level of R of irradiation. However, this device is only tested at the ‘R’ level. Pre
and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical
measurements for any RHA level, TA = +25°C (see 1.5 herein).
The manufacturer supplying RHA device type 02 on this drawing has performed characterization test to demonstrate that
the parts do not exhibit enhanced low dose rate sensitivity (ELDRS) to 100 krads(Si) in accordance with MIL-STD-883,
method 1019, paragraph 3.13.1.1. Therefore these parts may be considered ELDRS free to 100 krads(Si). The
manufacturer will perform high dose rate lot acceptance testing on a wafer by wafer basis in accordance with MIL-STD-883,
method 1019, conditions A for device type 02.
Unless otherwise specified, sampling rate = 500 MSPS, 50 % clock duty cycle, AVDD5 = 5 V, AVDD3 = 3.3 V,
4/
DVDD3 = 3.3 V, 3 VPP differential clock.
Timing parameters are assured by design or characterization, but not production tested.
2/
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FIGURE 1. Case outline X.
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Dimensions
Symbol
Inches
Max
Min
Max
A1
---
0.091
---
2.31
A2
---
0.115
---
2.92
A3
0.002
0.014
0.05
A4
0.03 BSC
b
0.006
0.36
0.762 BSC
0.013
0.15
0.33
c
0.004
0.009
0.10
0.23
D1/E1
0.740
0.760
18.80
19.30
D2/E2
0.500 BSC
D3/E3
1.196
12.7 BSC
1.222
30.38
31.04
D4/E4
0.629 BSC
15.98 BSC
e
0.025 BSC
0.64 BSC
F
0.175
0.225
4.45
5.72
J
0.030
0.040
0.76
1.02
K
---
0.020
---
0.51
K1
---
0.018
---
0.46
L
2.025
L1
1.980
N
NOTES:
1.
2.
3.
4.
5.
6.
Millimeters
Min
51.44
2.024
50.29
51.41
84
Controlling dimensions are inches, millimeter dimensions are given for reference only.
Ceramic quad flatpack with flat leads brazed to non-conductive tie bar carrier.
This package is hermetically sealed with a metal lid.
The leads are gold plated and can be solder dipped.
All leads are not shown for clarity purposes.
Lid and heat sink are connected to GND leads.
FIGURE 1. Case outline X – continued.
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Device type
01 and 02
Case
outline
X
Terminal
number
Terminal
symbol
Terminal
number
Terminal
symbol
Terminal
number
Terminal
symbol
Terminal
number
Terminal
symbol
1
GND
22
GND
43
GND
64
GND
2
DVDD3
23
AVDD5
44
OVR
65
D4
3
GND
24
GND
45
OVR
66
D4
4
AVDD5
25
AVDD5
46
NC
67
D5
5
NC
26
GND
47
NC
68
D5
6
NC
27
AVDD5
48
NC
69
GND
7
VREF
28
GND
49
NC
70
DVDD3
8
GND
29
AVDD5
50
NC
71
D6
9
AVDD5
30
GND
51
NC
72
D6
10
GND
31
RESERVED
52
NC
73
D7
11
CLK
32
GND
53
NC
74
D7
12
CLK
33
AVDD5
54
DVDD3
75
D8
13
GND
34
GND
55
GND
76
D8
14
AVDD5
35
RESERVED
56
D0
77
D9
15
AVDD5
36
GND
57
D0
78
D9
16
GND
37
AVDD3
58
D1
79
D10
17
AIN
38
GND
59
D1
80
D10
18
AIN
39
AVDD3
60
D2
81
D11
19
GND
40
GND
61
D2
82
D11
20
AVDD5
41
AVDD3
62
D3
83
DRY
21
GND
42
GND
63
D3
84
DRY
FIGURE 2. Terminal connections.
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Terminal
symbol
Description
AIN
Differential input signal (positive)
AIN
Differential input signal (negative)
AVDD5
Analog power supply (5 V)
AVDD3
Analog power supply (3.3 V)
CLK
Differential input clock (positive). Conversion initiated on
rising edge.
CLK
Differential input clock (negative)
D0, D0
D1-D3,
D1 - D3
D4-D5,
D4 - D5
D6-D10,
D6 - D10
D11, D11
DRY, DRY
LVDS digital output pair, least significant bit (LSB)
LVDS digital output pairs
LVDS digital output pairs
LVDS digital output pairs
LVDS digital output pair, most significant bit (MSB)
Data ready LVDS output pair
DVDD
Output driver power supply (3.3 V)
GND
Ground
NC
No connect
OVR, OVR
Over range indicator LVDS output. A logic high signals an
analog input excess of full scale range.
RESERVED
Reserved for possible future control features
VREF
Reference voltage
FIGURE 2. Terminal connections – continued.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
B
SHEET
14
FIGURE 3. Block diagram.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
B
SHEET
15
FIGURE 4. Timing waveforms.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
B
SHEET
16
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection.
4.2.1 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections, and as specified herein.
4.4.1 Group A inspection.
a.
Tests shall be as specified in table IIA herein.
b.
Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
B
SHEET
17
TABLE IIA. Electrical test requirements.
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
Device
class Q
class V
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
1, 9
1, 9
1, 2, 3, 1/ 2/
4, 5, 6, 9, 10, 11
1, 2, 3, 1/ 2/ 3/
4, 5, 6, 9, 10, 11
1, 2, 3, 4, 5, 6, 2/
9,10,11
1, 2, 3, 4 ,5 ,6, 2/
9, 10, 11
1, 4
1, 4, 9 3/
1, 4
1, 4, 9
1, 4
1, 4, 9
1/ PDA applies to subgroup 1.
2/ Subgroups 9, 10, 11, if not tested, are guaranteed to the limits in table I.
3/ Delta limits as specified in table IIB shall be required where specified, and the delta limits
shall be computed with reference to the zero hour electrical parameters.
TABLE IIB. Burn-in and operating life test. Delta parameters (+25°C).
Parameters 1/
Delta limits
Reference voltage (VREF)
+/- 10 mV
3.3 V digital supply (IDVDD3)
+/- 2 mA
1/ These parameters shall be recorded before and after the required
burn-in and life test to determine delta limits
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
B
SHEET
18
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a.
End-point electrical parameters shall be as specified in table IIA herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. All device classes must meet the postirradiation end-point
electrical parameter limits as defined in table I at TA = +25°C ±5°C, after exposure, to the subgroups specified in table II
herein.
4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883,
method 1019 condition A and as specified herein. The manufacturer shall performed high dose rate lot acceptance testing on a
wafer by wafer basis in accordance with MIL-STD-883, method 1019, conditions A for device type 02.
4.4.4.1.1 Accelerated annealing testing. Accelerated annealing testing shall be performed on all devices requiring a RHA
level greater than 5k rads(Si). The post-anneal end-point electrical parameter limits shall be as specified in table I herein and
shall be the pre-irradiation end-point electrical parameter limits at 25°C ±5°C. Testing shall be performed at initial qualification
and after any design or process changes which may affect the RHA response of the device.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
prepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in
MIL-HDBK-103 and QML-38535. The vendors listed in MIL-HDBK-103 and QML-38535 have submitted a certificate of
compliance (see 3.6 herein) to DLA Land and Maritime-VA and have agreed to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-07208
A
REVISION LEVEL
B
SHEET
19
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 16-05-02
Approved sources of supply for SMD 5962-07208 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-0720801VXC
01295
ADS5463MHFG-V
5962R0720802VXC
01295
ADS5463MHFG-RHA
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
01295
Vendor name
and address
Texas Instruments, Inc.
Semiconductor Group
8505 Forest Ln.
PO Box 660199
Dallas, TX 75243
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.