SUD50N04-09H Datasheet

SUD50N04-09H
Vishay Siliconix
N-Channel 40-V (D-S), 175 °C MOSFET
FEATURES
PRODUCT SUMMARY
V(BR)DSS (V)
rDS(on) (Ω)
ID (A)c
Qg (Typ)
40
0.009 at VGS = 10 V
50
55
• TrenchFET® Power MOSFETS
• 175 °C Junction Temperature
• High Threshold Voltage At High Temperature
RoHS
COMPLIANT
TO-252
D
G
Drain Connected to Tab
G
D
S
Top View
S
Ordering Information: SUD50N04-09H-E3 (Lead (Pb)-free)
N-Channel MOSFET
ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter
Symbol
Limit
Drain-Source Voltage
VDS
40
Gate-Source Voltage
VGS
± 20
Continuous Drain Current (TJ = 175 °C)
TC = 25 °C
48c
IDM
Pulsed Drain Current
Avalanche Current
a
V
50c
ID
TC = 100 °C
Unit
A
100
IAS
35
Single Avalanche Energy
L = 0.1 mH
EAS
61.25
mJ
Power Dissipation
TC = 25 °C
PD
83.3
W
TJ, Tstg
- 55 to 175
°C
Operating Junction and Storage Temperature Range
THERMAL RESISTANCE RATINGS
Parameter
Junction-to-Ambientb
Junction-to-Case
Symbol
t ≤ 10 sec
Steady State
RthJA
RthJC
Typical
Maximum
18
22
40
50
1.5
1.8
Unit
°C/W
Notes:
a. Duty cycle ≤ 1 %.
b. Surface Mounted on 1" FR4 board.
c. Based on maximum allowable Junction Temperature. Package limitation current is 50 A.
Document Number: 72669
S-71661-Rev. E, 06-Aug-07
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SUD50N04-09H
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min
V(BR)DSS
VGS = 0 V, ID = 250 µA
40
VGS(th)
VDS = VGS, ID = 250 µA
3.4
IGSS
VDS = 0 V, VGS = ± 20 V
Typ
Max
Unit
Static
Drain-Source Breakdown Voltage
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Currenta
IDSS
± 100
VDS = 40 V, VGS = 0 V
1
VDS = 40 V, VGS = 0 V, TJ = 125 °C
50
VDS = 40 V, VGS = 0 V, TJ = 175 °C
150
ID(on)
VDS = 5 V, VGS = 10 V
50
VGS = 10 V, ID = 20 A
Drain-Source On-State Resistancea
Forward Transconductancea
5.0
rDS(on)
gfs
µA
0.009
0.014
VGS = 10 V, ID = 20 A, TJ = 175 °C
0.018
20
nA
A
0.0072
VGS = 10 V, ID = 20 A, TJ = 125 °C
VDS = 15 V, ID = 15 A
V
57
Ω
S
b
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Total Gate Chargec
Qg
Gate-Source Chargec
Qgs
c
3700
VGS = 0 V, VDS = 25 V, f = 1 MHz
pF
340
175
55
VDS = 20 V, VGS = 10 V, ID = 50 A
85
nC
19
Gate-Drain Charge
Qgd
13
Gate Resistance
Rg
1.3
c
td(on)
12
20
20
30
c
td(off)
35
55
11
20
Turn-On Delay Time
Rise Timec
Turn-Off Delay Time
tr
Fall Timec
VDD = 20 V, RL = 0.4 Ω
ID ≅ 50 A, VGEN = 10 V, Rg = 2.5 Ω
tf
Ω
ns
Source-Drain Diode Ratings and Characteristics (TC = 25 °C)b
IS
50
Pulsed Current
ISM
100
Forward Voltagea
VSD
IF = 30 A, VGS = 0 V
0.90
1.50
V
trr
IF = 30 A, di/dt = 100 A/µs
30
45
ns
Continuous Current
Reverse Recovery Time
A
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 72669
S-71661-Rev. E, 06-Aug-07
SUD50N04-09H
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C unless noted
100
100
VGS = 10 thru 7 V
80
I D - Drain Current (A)
I D - Drain Current (A)
80
60
40
6V
20
60
40
TC = 125 °C
20
25 °C
- 55 °C
0
0
0
2
4
6
8
0
10
1
2
3
4
5
6
VDS - Drain-to-Source Voltage (V)
VGS - Gate-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
120
7
0.016
TC = - 55 °C
0.014
100
r DS(on) - On-Resistance (Ω)
g fs - Transconductance (S)
25 °C
80
125 °C
60
40
20
0
0.012
0.010
VGS = 10 V
0.008
0.006
0.004
0.002
0.000
0
10
20
30
40
50
0
20
40
VGS - Gate-to-Source Voltage (V)
Transconductance
80
100
On-Resistance vs. Drain Current
20
5000
V GS - Gate-to-Source Voltage (V)
Ciss
4000
C - Capacitance (pF)
60
ID - Drain Current (A)
3000
2000
Coss
1000
Crss
VDS = 20 V
ID = 50 A
16
12
8
4
0
0
0
8
16
24
32
40
0
20
40
60
80
VDS - Drain-to-Source Voltage (V)
Qg - Total Gate Charge (nC)
Capacitance
Gate Charge
Document Number: 72669
S-71661-Rev. E, 06-Aug-07
100
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SUD50N04-09H
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C unless noted
2.0
100
VGS = 10 V
ID = 20 A
I S - Source Current (A)
rDS(on) - On-Resistance
(Normalized)
1.7
1.4
1.1
TJ = 150 °C
TJ = 25 °C
10
0.8
0.5
- 50
1
- 25
0
25
50
75
100
125
150
175
0.3
TJ - Junction Temperature (°C)
0.6
0.9
1.2
1.5
VSD - Source-to-Drain Voltage (V)
On-Resistance vs. Junction Temperature
Source-Drain Diode Forward Voltage
THERMAL RATINGS
200
80
Limited by rDS(on)
100
10 µs
70
100 µs
I D - Drain Current (A)
I D - Drain Current (A)
60
50
40
Limited By Package
30
10
1 ms
10 ms
100 ms
dc
1
20
TC = 25 °C
Single Pulse
10
0.1
0
0
25
50
75
100
125
150
0.1
175
TC - Case Temperature (°C)
1
10
100
VDS - Drain-to-Source Voltage (V)
*VGS > minimum V GS at which rDS(on) is specified
Maximum Avalanche and Drain Current
vs. Case Temperature
Safe Operating Area
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10- 4
10- 3
10- 2
10- 1
1
10
100
1K
Square Wave Pulse Duration (sec)
Normalized Thermal Transient Impedance, Junction-to-Ambient
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Document Number: 72669
S-71661-Rev. E, 06-Aug-07
SUD50N04-09H
Vishay Siliconix
THERMAL RATINGS
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.02
0.05
Single Pulse
0.01
10- 4
10- 3
10- 2
10- 1
1
10
100
Square Wave Pulse Duration (sec)
Normalized Thermal Transient Impedance, Junction-to-Case
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability
data, see http://www.vishay.com/ppg?72669.
Document Number: 72669
S-71661-Rev. E, 06-Aug-07
www.vishay.com
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Document Number: 91000
Revision: 18-Jul-08
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