IRF IRGP430UD2

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PD - 9.1063
IRGP430UD2
INSULATED GATE BIPOLAR TRANSISTOR
WITH ULTRAFAST SOFT RECOVERY DIODE
UltraFast CoPack IGBT
Features
C
VCES = 500V
• Switching-loss rating includes all "tail" losses
TM
• HEXFRED soft ultrafast diodes
• Optimized for high operating frequency (over 5kHz)
See Fig. 1 for Current vs. Frequency curve
VCE(sat) ≤ 3.0V
G
@VGE = 15V, IC = 15A
E
n-channel
Description
Co-packaged IGBTs are a natural extension of International Rectifier's well
known IGBT line. They provide the convenience of an IGBT and an ultrafast
recovery diode in one package, resulting in substantial benefits to a host of
high-voltage, high-current, motor control, UPS and power supply applications.
TO-247AC
Absolute Maximum Ratings
Parameter
VCES
IC @ T C = 25°C
IC @ T C = 100°C
ICM
ILM
IF @ T C = 100°C
IFM
VGE
PD @ T C = 25°C
PD @ T C = 100°C
TJ
TSTG
Collector-to-Emitter Voltage
Continuous Collector Current
Continuous Collector Current
Pulsed Collector Current
Clamped Inductive Load Current
Diode Continuous Forward Current
Diode Maximum Forward Current
Gate-to-Emitter Voltage
Maximum Power Dissipation
Maximum Power Dissipation
Operating Junction and
Storage Temperature Range
Soldering Temperature, for 10 sec.
Mounting Torque, 6-32 or M3 Screw.
Max.
Units
500
25
15
50
50
12
50
± 20
100
42
-55 to +150
V
A
V
W
°C
300 (0.063 in. (1.6mm) from case)
10 lbf•in (1.1 N•m)
Thermal Resistance
Parameter
RθJC
RθJC
RθCS
RθJA
Wt
Junction-to-Case - IGBT
Junction-to-Case - Diode
Case-to-Sink, flat, greased surface
Junction-to-Ambient, typical socket mount
Weight
C-633
To Order
Min.
Typ.
Max.
—
—
—
—
—
—
—
0.24
—
6 (0.21)
1.2
2.5
—
40
—
Units
°C/W
g (oz)
Revision 1
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IRGP430UD2
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
VCE(on)
Parameter
Collector-to-Emitter Breakdown Voltage
Temp. Coeff. of Breakdown Voltage
Collector-to-Emitter Saturation Voltage
VGE(th)
∆VGE(th)/∆TJ
gfe
ICES
Gate Threshold Voltage
Temp. Coeff. of Threshold Voltage
Forward Transconductance
Zero Gate Voltage Collector Current
VFM
Diode Forward Voltage Drop
IGES
Gate-to-Emitter Leakage Current
V(BR)CES
∆V(BR)CES/∆TJ
Min. Typ. Max. Units
Conditions
500
—
—
V
VGE = 0V, I C = 250µA
— 0.46 —
V/°C VGE = 0V, IC = 1.0mA
—
2.3
3.0
IC = 15A
V GE = 15V
—
2.8
—
V
IC = 25A
See Fig. 2, 5
—
2.6
—
IC = 15A, T J = 150°C
3.0
—
5.5
VCE = VGE, IC = 250µA
—
-11
— mV/°C VCE = VGE, IC = 250µA
2.3 8.1
—
S
VCE = 100V, I C = 15A
—
—
250
µA
VGE = 0V, V CE = 500V
—
— 2500
VGE = 0V, V CE = 500V, T J = 150°C
—
1.4
1.7
V
IC = 12A
See Fig. 13
—
1.3
1.6
IC = 12A, T J = 150°C
—
— ±100 nA
VGE = ±20V
Switching Characteristics @ TJ = 25°C (unless otherwise specified)
Qg
Qge
Qgc
td(on)
tr
td(off)
tf
Eon
Eoff
Ets
td(on)
tr
td(off)
tf
Ets
LE
Cies
Coes
Cres
trr
Parameter
Total Gate Charge (turn-on)
Gate - Emitter Charge (turn-on)
Gate - Collector Charge (turn-on)
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-On Switching Loss
Turn-Off Switching Loss
Total Switching Loss
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Switching Loss
Internal Emitter Inductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Diode Reverse Recovery Time
Irr
Diode Peak Reverse Recovery Current
Qrr
Diode Reverse Recovery Charge
di(rec)M/dt
Diode Peak Rate of Fall of Recovery
During t b
Notes:
Repetitive rating; V GE=20V, pulse width
limited by max. junction temperature.
( See fig. 20 )
Min.
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
Typ.
31
6.2
12
73
72
120
100
0.7
0.4
1.1
77
75
200
190
1.5
13
660
110
12
42
80
3.5
5.6
80
220
180
116
Max. Units
Conditions
47
IC = 15A
9.2
nC
VCC = 400V
19
See Fig. 8
—
TJ = 25°C
—
ns
IC = 15A, V CC = 400V
180
VGE = 15V, R G = 23Ω
150
Energy losses include "tail" and
—
diode reverse recovery.
—
mJ
See Fig. 9, 10, 11, 18
1.7
—
TJ = 150°C,
See Fig. 9, 10, 11, 18
—
ns
IC = 15A, V CC = 400V
—
VGE = 15V, R G = 23Ω
—
Energy losses include "tail" and
—
mJ
diode reverse recovery.
—
nH
Measured 5mm from package
—
VGE = 0V
—
pF
VCC = 30V
See Fig. 7
—
ƒ = 1.0MHz
60
ns
TJ = 25°C See Fig.
120
TJ = 125°C
14
I F = 12A
6.0
A
TJ = 25°C See Fig.
10
TJ = 125°C
15
V R = 200V
180
nC
TJ = 25°C See Fig.
600
TJ = 125°C
16
di/dt = 200A/µs
—
A/µs TJ = 25°C See Fig.
—
TJ = 125°C
17
VCC=80%(V CES), VGE=20V, L=10µH,
R G= 23Ω, ( See fig. 19 )
Pulse width ≤ 80µs; duty factor ≤ 0.1%.
C-634
To Order
Pulse width 5.0µs,
single shot.
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IRGP430UD2
20
Du ty c ycle: 5 0 %
TJ = 1 2 5° C
T s in k = 9 0 °C
Ga te d rive a s sp e cifie d
Tu rn-o n lo sse s in clu d e
effe cts o f re ve rse reco ve ry
Po we r D is sipation = 2 4W
Load Current (A)
16
12
6 0 % o f ra te d
v o lta g e
8
4
A
0
0.1
1
10
100
f, Frequency (kHz)
Fig. 1 - Typical Load Current vs. Frequency
(Load Current = I RMS of fundamental)
1000
IC , Collector-to-Em itter C urrent (A )
I C , C ollector-to-E mitter C urrent (A )
100
TJ = 25 °C
TJ = 1 50 °C
10
V G E = 15 V
20 µs P UL S E W ID TH
1
1
100
T J = 1 50 °C
10
TJ = 25 °C
1
V C C = 1 00 V
5 µ s P U L S E W ID TH
0.1
5
10
10
15
V G E , G ate -to-E m itter V olta ge (V )
V C E , C o llector-to-Em itter V oltage (V)
Fig. 3 - Typical Transfer Characteristics
Fig. 2 - Typical Output Characteristics
C-635
To Order
20
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IRGP430UD2
4.5
V G E = 15 V
V C E , C ollector-to-E mitter V oltage (V )
Maxim um D C Collector C urrent (A )
25
20
15
10
5
V G E = 15 V
80 µ s P U L S E W ID TH
4.0
I C = 3 0A
3.5
3.0
2.5
I C = 1 5A
2.0
I C = 7.5 A
1.5
1.0
0
25
50
75
100
125
-60
150
T C , C ase Tem perature (°C )
-40
-20
0
20
40
60
80
100 120 140 160
TC , C ase Tem perature (°C )
Fig. 5 - Collector-to-Emitter Voltage vs.
Case Temperature
Fig. 4 - Maximum Collector Current vs.
Case Temperature
T he rm al R e sp ons e (Z thJ C )
10
1
D = 0 .5 0
0 .2 0
PD M
0 .1 0
0.1
t
0 .0 5
0 .0 2
0 .0 1
0.01
0.00001
1
t
S IN G L E P U L S E
(T H E R M A L R E S P O N S E )
N o te s :
1 . D u ty fa c to r D = t
1
/t
2
2
2 . P e a k T J = P D M x Z thJ C + T C
0.0001
0.00 1
0.01
0.1
1
t 1 , R e c ta n gu la r P u ls e D ura tio n (s e c )
Fig. 6 - Maximum IGBT Effective Transient Thermal Impedance, Junction-to-Case
C-636
To Order
10
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IRGP430UD2
140 0
100 0
Cies
800
Coes
V G E , G ate-to-E m itter V oltage (V )
120 0
C, C apacitance (pF)
20
V GE = 0V,
f = 1MHz
C ies = C ge + C gc , Cce SHORTED
C res = C gc
C oes = C ce + C gc
16
12
600
400
V C E = 4 00 V
I C = 1 5A
Cres
200
0
8
4
0
1
10
100
0
10
V C E , C o llector-to-Em itter V oltage (V)
10
= 400V
= 15V
= 25°C
= 15A
1.12
1.09
1.06
A
1.03
0
10
20
30
40
40
Fig. 8 - Typical Gate Charge vs.
Gate-to-Emitter Voltage
Total Switching Losses (mJ)
Total Switching Losses (mJ)
VCC
VGE
TC
IC
30
Q G , Total G ate C harge (nC )
Fig. 7 - Typical Capacitance vs.
Collector-to-Emitter Voltage
1.15
20
50
RG = 23Ω
V GE = 15V
V CC = 400V
I C = 30A
I C = 15A
1
I C = 7.5A
A
0.1
-60
60
-40
-20
0
20
40
60
80
100 120 140 160
TC , Case Temperature (°C)
R G , Gate Resistance (Ω)
Fig. 9 - Typical Switching Losses vs. Gate
Resistance
Fig. 10 - Typical Switching Losses vs.
Case Temperature
C-637
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IRGP430UD2
4.0
100
= 23Ω
= 150°C
= 400V
= 15V
IC , Collector-to-Emitter Current (A)
RG
TC
V CC
V GE
3.0
2.0
1.0
0
10
20
30
VGE = 20V
TJ = 125°C
SAFE OPERATING AREA
10
A
0.0
A
1
40
1
I C , Collector-to-Emitter Current (A)
10
100
VCE, Collector-to-Emitter Voltage (V)
Fig. 12 - Turn-Off SOA
Fig. 11 - Typical Switching Losses vs.
Collector-to-Emitter Current
100
Instantaneous Forward Current - I F (A)
Total Switching Losses (mJ)
5.0
TJ = 150°C
10
TJ = 125°C
TJ = 25°C
1
0.4
0.8
1.2
1.6
2.0
2.4
Forward Voltage Drop - V FM (V)
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
C-638
To Order
1000
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IRGP430UD2
100
160
VR = 200V
TJ = 125°C
TJ = 25°C
VR = 200V
TJ = 125°C
TJ = 25°C
120
I IRRM - (A)
t rr - (ns)
I F = 24A
I F = 12A
80
I F = 6.0A
I F = 24A
I F = 12A
10
IF = 6.0A
40
0
100
1
100
1000
di f /dt - (A/µs)
1000
Fig. 15 - Typical Recovery Current vs. dif/dt
Fig. 14 - Typical Reverse Recovery vs. dif/dt
600
10000
VR = 200V
TJ = 125°C
TJ = 25°C
di(rec)M/dt - (A/µs)
VR = 200V
TJ = 125°C
TJ = 25°C
Q RR - (nC)
400
I F = 24A
I F = 12A
200
1000
IF = 6.0A
I F = 12A
100
IF = 24A
IF = 6.0A
0
100
di f /dt - (A/µs)
1000
di f /dt - (A/µs)
10
100
1000
di f /dt - (A/µs)
Fig. 16 - Typical Stored Charge vs. dif/dt
Fig. 17 - Typical di(rec)M/dt vs. dif/dt
C-639
To Order
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IRGP430UD2
90% Vge
+Vge
Same type
device as
D.U.T.
Vce
430µF
80%
of Vce
Ic
D.U.T.
90% Ic
10% Vce
Ic
5% Ic
td(off)
tf
Eoff =
Fig. 18a - Test Circuit for Measurement of
∫
t1+5µS
Vce ic dt
t1
ILM, Eon, Eoff(diode) , trr, Qrr, Irr, td(on), tr, td(off), tf
t1
t2
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining
Eoff, td(off), tf
trr
GATE VOLTAGE D.U.T.
10% +Vg
Qrr =
Ic
∫
trr
id dt
tx
+Vg
tx
10% Vcc
10% Irr
Vcc
DUT VOLTAGE
AND CURRENT
Vce
Vpk
Irr
Vcc
10% Ic
90% Ic
Ipk
Ic
DIODE RECOVERY
WAVEFORMS
tr
td(on)
5% Vce
t1
∫
t2
Eon = Vce ie dt
t1
DIODE REVERSE
RECOVERY ENERGY
t2
t3
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,
∫
t4
Erec = Vd id dt
t3
t4
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining E on, td(on), tr
Defining E rec, trr, Qrr, Irr
Refer to Section D for the following:
Appendix B: Section D - page D-4
Fig. 18e - Macro Waveforms for Test Circuit Fig. 18a
Fig. 19 - Clamped Inductive Load Test Circuit
Fig. 20 - Pulsed Collector Current Test Circuit
Package Outline 3 - JEDEC Outline TO-247AC
C-640
To Order
Section D - page D-13