2SJ471 Silicon P Channel DV–L MOS FET High Speed Power Switching ADE-208-540 1st. Edition Features • Low on-resistance R DS(on) = 25 mΩ typ. • 4V gate drive devices. • High speed switching Outline TO–220CFM D G 1 2 S 3 1. Gate 2. Drain 3. Source 2SJ471 Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS –30 V Gate to source voltage VGSS ±20 V Drain current ID –30 A –120 A –30 A 30 W Drain peak current I D(pulse) Body to drain diode reverse drain current I DR Note1 Note2 Channel dissipation Pch Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C Notes: 1. PW ≤ 10µs, duty cycle ≤ 1 % 2. Value at Tc = 25°C 2 2SJ471 Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V(BR)DSS –30 — — V I D = –10mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS ±20 — — V I G = ±100µA, VDS = 0 Zero gate voltege drain current I DSS — — –10 µA VDS = –30 V, VGS = 0 Gate to source leak current I GSS — — ±10 µA VGS = ±16V, VDS = 0 Gate to source cutoff voltage VGS(off) –1.0 — –2.0 V I D = –1mA, VDS = –10V Static drain to source on state RDS(on) — 25 35 mΩ I D = –15A, VGS = –10V Note3 resistance RDS(on) — 40 60 mΩ I D = –15A, VGS = –4V Note3 Forward transfer admittance |yfs| 12 20 — S I D = –15A, VDS = –10V Note3 Input capacitance Ciss — 1700 — pF VDS = –10V Output capacitance Coss — 950 — pF VGS = 0 Reverse transfer capacitance Crss — 260 — pF f = 1MHz Turn-on delay time t d(on) — 20 — ns VGS = –10V, ID = –15A Rise time tr — 290 — ns RL = 0.67Ω Turn-off delay time t d(off) — 170 — ns Fall time tf — 130 — ns Body to drain diode forward voltage VDF — –1.1 — V I F = –30A, VGS = 0 Body to drain diode reverse recovery time t rr — 70 — ns I F = –30A, VGS = 0 diF/ dt = 50A/µs Note: 3. Pulse test 3 2SJ471 Main Characteristics Power vs. Temperature Derating Maximun Safe Operation Area –500 –10 –5 150 –40 –3.5 V –3 V –20 VGS = –2.5 V –40 –2 –4 –6 –8 Tc = –25°C 75°C –30 –20 –10 V DS = –10 V Pulse Test –10 Drain to Source Voltage V DS (V) 4 Ta = 25 °C 25°C Pulse Test 0 ) Typical Transfer Characteristics –30 –10 ot –50 Drain Current I D (A) Drain Current I D (A) Typical Output Characteristics –10 V –6 V –5 V –4.5 V –4 V sh –3 –0.1 –0.3 –1 –10 –30 –100 Drain to Source Voltage V DS (V) 200 Case Temperature Tc (°C) –50 (1 ) 100 s s °C 50 Operation in this area is limited by R DS(on) m m 25 0 1 = –1 –0.5 10 c –2 = µs –20 (T 10 PW –50 0 20 10 µs –100 10 30 n tio ra pe O Drain Current I D (A) –200 C D Channel Dissipation Pch (W) 40 0 –1 –2 –3 –4 –5 Gate to Source Voltage V GS (V) 2SJ471 Static Drain to Source on State Resistance vs. Drain Current 0.5 Pulse Test Pulse Test –0.8 0.2 –0.6 0.1 I D = –20 A –0.4 –10 A –0.2 0 –5 A Drain to Source on State Resistance R DS(on) ( Ω ) Static Drain to Source on State Resistance vs. Temperature 0.10 0.08 I D = –20 A 0.06 V GS = –4 V –5, –10 A 0.04 –5, –10, –20 A 0.02 0 –40 –10 V Pulse Test 0 40 80 120 Cate Temperature Tc (°C) 160 0.05 VGS = –4 V 0.02 –10 V 0.01 –1 –8 –4 –12 –16 –20 Gate to Source Voltage VGS (V) –2 –5 –10 –20 Drain Current I D (A) –50 Foward Transfer Admittance vs. Drain Current Foward Transfer Admittance |yfs| (S) Drain to Source Saturation Voltage VDS(on) (V) –1.0 Drain to Source on State Resistance R DS(on) ( Ω ) Drain to Source Saturation Voltage vs. Gate to Source Voltage 50 20 Tc = –25 °C 10 5 2 25 °C 75 °C 1 0.5 0.2 V DS = –10 V Pulse Test 0.1 –0.1–0.2 –0.5 –1 –2 –5 –10 –20 –50 Drain Current I D (A) 5 2SJ471 Typical Capacitance vs. Drain to Source Voltage Body to Drain Diode Reverse Recovery Time 500 5000 Capacitance C (pF) 10000 Reverse Recovery Time trr (ns) 1000 200 100 50 20 2000 Ciss 1000 Coss 500 Crss 200 di / dt = 50 A / µs V GS = 0, Ta = 25 °C 10 5 –0.1–0.2 –0.5 –1 –2 VGS = 0 f = 1 MHz 100 –5 –10 –20 –50 0 –30 –40 –4 V GS –20 –8 V DS –12 V DD = –25 V –10 V –5 V –16 I D = –30 A –50 0 16 32 48 64 Gate Charge Qg (nc) 6 –16 –20 Switching Characteristics –20 80 500 Switching Time t (ns) –10 –12 1000 0 Gate to Source Voltage VGS (V) Drain to Source Voltage V DS (V) Dynamic Input Characteristics V DD = –5 V –10 V –25 V –8 Drain to Source Voltage VDS (V) Reverse Drain Current I DR (A) 0 –4 t d(off) 200 100 tr tf 50 t d(on) 20 10 V GS = –10 V, V DD = –10 V duty < 1 % 5 –0.1–0.2 –0.5 –1 –2 –5 –10 –20 –50 Drain Current I D (A) 2SJ471 Reverse Drain Current vs. Source to Drain Voltage Reverse Drain Current I DR (A) –50 Pulse Test –40 –30 –10 V –5 V V GS = 0, 5 V –20 –10 0 –0.4 –0.8 –1.2 –1.6 –2.0 Source to Drain Voltage VSD (V) Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermao Impedance γ s (t) 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 θ ch – c(t) = γ s (t) • θ ch – c θ ch – c = 4.17 °C/W, Tc = 25 °C 0.1 0.05 0.03 0.01 10 µ PDM 0.02 1 lse 0.0 pu t ho 1s 100 µ D= PW T PW T 1m 10 m 100 m 1 10 Pulse Width PW (S) 7 2SJ471 Switching Timen Test Circuit Waveform Vout Monitor Vin Monitor Vin 10% D.U.T. RL 90% Vin 10 V 50Ω V DD = –10 V Vout td(on) 8 90% 90% 10% 10% tr td(off) tf 2SJ471 Package Dimensions Unit: mm 1.0 ± 0.2 1.15 ± 0.2 2.54 ± 0.5 2.54 ± 0.5 2.5 ± 0.2 13.6 ± 1.0 4.45 ± 0.3 4.1 ± 0.3 0.6 ± 0.1 2.7 ± 0.2 15.0 ± 0.3 f 3.2 ± 0.2 12.0 ± 0.3 10.0 ± 0.3 0.7 ± 0.1 Hitachi Code TO–220CFM — EIAJ — JEDEC 9 Cautions 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. Hitachi, Ltd. Semiconductor & Integrated Circuits. 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Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.