STMICROELECTRONICS BULD118D-1

BULD118D-1

HIGH VOLTAGE FAST-SWITCHING
NPN POWER TRANSISTOR
■
■
■
■
■
INTEGRATED ANTIPARALLEL
COLLECTOR- EMITTER DIODE
HIGH VOLTAGE CAPABILITY
LOW SPREAD OF DYNAMIC PARAMETERS
MINIMUM LOT-TO-LOT SPREAD FOR
RELIABLE OPERATION
VERY HIGH SWITCHING SPEED
3
2
APPLICATIONS:
■
ELECTRONIC BALLASTS FOR
FLUORESCENT LIGHTING
■
FLYBACK AND FORWARD SINGLE
TRANSISTOR LOW POWER CONVERTERS
DESCRIPTION
The device is manufactured using high voltage
Multi Epitaxial Planar technology for high
switching speeds and medium voltage capability.
It uses a Cellular Emitter structure with planar
edge termination to enhance switching speeds
while maintaining the wide RBSOA.
The device is designed for use in lighting
applications and low cost switch-mode power
supplies.
1
IPAK
(TO-251)
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Value
Uni t
V CES
Collector-Emitter Voltage (V BE = 0)
700
V
V CEO
Collector-Emitter Voltage (I B = 0)
400
V
V EBO
Emitter-Base Voltage (I C = 0)
9
V
Collector Current
2
A
Collector Peak Current (tp < 5 ms)
4
A
IC
I CM
Parameter
Base Current
1
A
I BM
Base Peak Current (t p < 5 ms)
2
A
P t ot
Total Dissipation at T c = 25 o C
20
IB
T stg
Tj
June 1998
St orage Temperature
Max. Operating Junction Temperature
W
-65 to 150
o
C
150
o
C
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BULD118D-1
THERMAL DATA
R t hj-ca se
R t hj- amb
Thermal Resistance Junction-Case
Thermal Resistance Junction-Ambient
Max
Max
o
6.25
100
o
C/W
C/W
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
Symb ol
Parameter
Test Cond ition s
I CES
Collector Cut-off
Current (V BE = 0)
V EBO
Emitter-Base Voltage
I E = 10 mA
Collector-Emitter
Sustaining Voltage
I C = 100 mA
Collector-Emitter
Leakage Current
V CE = 400 V
V CE(sat )∗
Collector-Emitter
Saturation Voltage
I C = 0.5 A
IC = 1 A
IC = 2 A
V BE(s at)∗
Base-Emitter
Saturation Voltage
DC Current G ain
V CEO(sus)
I CEO
h FE∗
tr
tf
ts
RESISTIVE LO AD
Rise Time
Fall T ime
Storage Time
group A
group B
V CE = 700 V
V CE = 700 V
Min.
Typ .
Tj = 125 o C
L = 25 mH
Max.
Un it
100
500
µA
µA
9
V
400
V
250
µA
IB = 0.1 A
IB = 0.2 A
IB = 0.4 A
0.5
1
1.5
V
V
V
I C = 0.5 A
IC = 1 A
IC = 2 A
IB = 0.1 A
IB = 0.2 A
IB = 0.4 A
1.0
1.2
1.3
V
V
V
I C = 10 mA
I C = 0.5 A
IC = 2 A
V CE = 5 V
VCE = 5 V
VCE = 5 V
VCC = 125 V
I B1 = 0.4 A
t p = 30 µs
IC = 2 A
IB2 = -0.2 A
10
10
8
50
0.7
0.3
1.4
2
ts
tf
INDUCTIVE LOAD
Storage Time
Fall T ime
IC = 1 A
V BE = -5 V
V c la mp = 300 V
VF
Diode Forward Voltage IC = 1 A
IB1 = 0.2 A
L = 50 mH
0.5
µs
µs
2.1
2.75
µs
µs
µs
µs
0.8
0.10
2.5
V
∗ Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
Note : Product is pre-selected in storage time (GROUP A and GROUP B). SGS-THOMSON reserves the right to ship either groups
according to production availability. Please contact your nearest SGS THOMSON MICROELECTRONICS sales office for delivery details.
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BULD118D-1
Safe Operating Areas
Derating Curve
DC Current Gain
DC Current Gain
Collector Emitter Saturation Voltage
Base Emitter Saturation Voltage
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BULD118D-1
Inductive Fall Time
Inductive Storage Time
Resistive Fall Time
Resistive Load Storage Time
Reverse Biased SOA
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BULD118D-1
Figure 1: Inductive Load Switching Test Circuit.
1) Fast electronic switch
2) Non-inductive Resistor
3) Fast recovery rectifier
Figure 2: Resistive Load Switching Test Circuit.
1) Fast electronic switch
2) Non-inductive Resistor
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BULD118D-1
TO-251 (IPAK) MECHANICAL DATA
mm
DIM.
MIN.
inch
MAX.
MIN.
A
2.2
TYP.
2.4
0.086
0.094
A1
0.9
1.1
0.035
0.043
A3
0.7
1.3
0.027
0.051
B
0.64
0.9
0.025
0.031
B2
5.2
5.4
0.204
0.212
B3
TYP.
MAX.
0.85
B5
0.033
0.3
0.012
B6
0.95
0.037
C
0.45
0.6
0.017
0.023
C2
0.48
0.6
0.019
0.023
D
6
6.2
0.236
0.244
E
6.4
6.6
0.252
0.260
G
4.4
4.6
0.173
0.181
H
15.9
16.3
0.626
0.641
L
9
9.4
0.354
0.370
L1
0.8
1.2
0.031
L2
0.8
0.047
1
0.031
0.039
A1
C2
A3
A
C
H
B
B6
=
1
=
2
G
=
=
=
E
B2
=
3
B5
L
D
B3
L2
L1
0068771-E
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BULD118D-1
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subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
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