FDB2532_F085 N-Channel PowerTrench® MOSFET 150V, 79A, 16mΩ Features Applications • r DS(ON) = 14mΩ (Typ.), VGS = 10V, ID = 33A • DC/DC converters and Off-Line UPS • Qg(tot) = 82nC (Typ.), VGS = 10V • Distributed Power Architectures and VRMs • Low Miller Charge • Primary Switch for 24V and 48V Systems • Low QRR Body Diode • UIS Capability (Single Pulse and Repetitive Pulse) • High Voltage Synchronous Rectifier • Qualified to AEC Q101 • Direct Injection / Diesel Injection Systems • RoHS Compliant • 42V Automotive Load Control Formerly developmental type 82884 • Electronic Valve Train Systems D DRAIN (FLANGE) GATE SOURCE G TO-263AB FDB SERIES S MOSFET Maximum Ratings TC = 25°C unless otherwise noted Symbol VDSS Drain to Source Voltage Parameter Ratings 150 Units V VGS Gate to Source Voltage ±20 V Continuous (TC = 25oC, VGS = 10V) 79 A Continuous (TC = 100oC, VGS = 10V) 56 A 8 A Drain Current ID Continuous (Tamb = 25oC, VGS = 10V, R θJA = 43oC/W) Pulsed EAS PD TJ, TSTG Single Pulse Avalanche Energy (Note 1) Figure 4 A 400 mJ Power dissipation 310 W Derate above 25oC 2.07 W/oC Operating and Storage Temperature o -55 to 175 C Thermal Characteristics RθJC RθJA Thermal Resistance Junction to Case TO-263 2 Thermal Resistance Junction to Ambient TO-263, 1in copper pad area 0.48 o C/W 43 o C/W This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/ Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html. All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems certification. ©2010 Fairchild Semiconductor Corporation FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET September 2010 Device Marking FDB2532 Device FDB2532_F085 Package TO-263AB Reel Size 330mm Tape Width 24mm Quantity 800 units Electrical Characteristics TC = 25°C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units V Off Characteristics BVDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250μA, VGS = 0V 150 - - - - 1 - - 250 VGS = ±20V - - ±100 nA V GS = VDS, ID = 250μA 2 - 4 V ID = 33A, VGS = 10V - 0.014 0.016 ID = 16A, VGS = 6V, - 0.016 0.024 ID = 33A, VGS = 10V, TC = 175oC - 0.040 0.048 - 5870 - pF - 615 - pF - 135 - pF - 82 107 nC VDS = 120V VGS = 0V TC = 150oC μA On Characteristics VGS(TH) rDS(ON) Gate to Source Threshold Voltage Drain to Source On Resistance Ω Dynamic Characteristics CISS Input Capacitance COSS Output Capacitance CRSS Reverse Transfer Capacitance Qg(TOT) Total Gate Charge at 10V VGS = 0V to 10V VGS = 0V to 2V Qg(TH) Threshold Gate Charge Qgs Gate to Source Gate Charge Qgs2 Gate Charge Threshold to Plateau Qgd Gate to Drain “Miller” Charge VDS = 25V, VGS = 0V, f = 1MHz V DD = 75V ID = 33A Ig = 1.0mA - 11 14 nC - 23 - nC - 13 - nC - 19 - nC ns Resistive Switching Characteristics (VGS = 10V) tON Turn-On Time - - 69 td(ON) Turn-On Delay Time - 16 - ns tr Rise Time - 30 - ns td(OFF) Turn-Off Delay Time - 39 - ns tf Fall Time - 17 - ns tOFF Turn-Off Time - - 84 ns V VDD = 75V, ID = 33A VGS = 10V, RGS = 3.6Ω Drain-Source Diode Characteristics ISD = 33A - - 1.25 ISD = 16A - - 1.0 V Reverse Recovery Time ISD = 33A, dISD/dt= 100A/μs - - 105 ns Reverse Recovery Charge ISD = 33A, dISD/dt= 100A/μs - - 327 nC VSD Source to Drain Diode Voltage trr QRR Notes: 1: Starting TJ = 25°C, L = 0.5 mH, IAS = 40A. 2: Pulse Width = 100s ©2010 Fairchild Semiconductor Corporation FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET Package Marking and Ordering Information 1.2 125 100 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER VGS = 10V 1.0 0.8 0.6 0.4 75 50 25 0.2 0 0 25 50 75 100 150 125 175 0 25 TC , CASE TEMPERATURE (oC) Figure 1. Normalized Power Dissipation vs Ambient Temperature 50 75 100 125 TC, CASE TEMPERATURE (oC) 150 175 Figure 2. Maximum Continuous Drain Current vs Case Temperature 2.0 DUTY CYCLE - DESCENDING ORDER 0.5 0.2 0.1 0.05 0.02 0.01 ZθJC, NORMALIZED THERMAL IMPEDANCE 1.0 PDM 0.1 t1 t2 NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x Z θJC x RθJC + TC SINGLE PULSE 0.01 10 -5 10-4 10 -3 10-2 10-1 t, RECTANGULAR PULSE DURATION (s) 100 101 Figure 3. Normalized Maximum Transient Thermal Impedance 2000 TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION 1000 IDM, PEAK CURRENT (A) TC = 25 oC FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS: I = I25 175 - TC 150 VGS = 10V 100 50 10-5 10-4 10-3 10-2 t, PULSE WIDTH (s) 10-1 100 101 Figure 4. Peak Current Capability ©2010 Fairchild Semiconductor Corporation FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET Typical Characteristics TA = 25°C unless otherwise noted 200 1000 10μs STARTING TJ = 25oC IAS, AVALANCHE CURRENT (A) ID, DRAIN CURRENT (A) 100 100μs 100 OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 10 1ms 10ms DC 1 SINGLE PULSE TJ = MAX RATED TC = 25oC If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 1 0.1 1 10 100 VDS, DRAIN TO SOURCE VOLTAGE (V) 0.001 300 0.01 0.1 tAV, TIME IN AVALANCHE (ms) 1 NOTE: Refer to Fairchild Application Notes AN7515 and AN7517 Figure 5. Forward Bias Safe Operating Area Figure 6. Unclamped Inductive Switching Capability 180 180 PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX VDD = 15V 150 120 TJ = 175oC 90 60 TJ = 25oC VGS = 7V VGS = 10V ID, DRAIN CURRENT (A) 150 ID , DRAIN CURRENT (A) STARTING TJ = 150oC 10 TJ = -55oC VGS = 6V 120 90 TC = 25oC 60 VGS = 5V 30 PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX 30 0 0 3.0 3.5 4.0 4.5 5.0 5.5 6.0 VGS , GATE TO SOURCE VOLTAGE (V) 0.0 6.5 Figure 7. Transfer Characteristics 6.0 Figure 8. Saturation Characteristics 3.0 18 PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX NORMALIZED DRAIN TO SOURCE ON RESISTANCE DRAIN TO SOURCE ON RESISTANCE (m Ω) 1.0 2.0 3.0 4.0 5.0 VDS, DRAIN TO SOURCE VOLTAGE (V) 17 VGS = 6V 16 15 VGS = 10V 14 13 PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX 2.5 2.0 1.5 1.0 VGS = 10V, ID =33A 0.5 0 20 40 60 ID, DRAIN CURRENT (A) 80 Figure 9. Drain to Source On Resistance vs Drain Current ©2010 Fairchild Semiconductor Corporation -80 -40 0 40 80 120 TJ, JUNCTION TEMPERATURE (oC) 160 200 Figure 10. Normalized Drain to Source On Resistance vs Junction Temperature FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET Typical Characteristics TA = 25°C unless otherwise noted 1.2 1.4 VGS = VDS, ID = 250μA NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE ID = 250μA NORMALIZED GATE THRESHOLD VOLTAGE 1.2 1.0 0.8 0.6 0.4 1.1 1.0 0.9 -80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC) 200 Figure 11. Normalized Gate Threshold Voltage vs Junction Temperature -80 -40 0 40 80 120 160 TJ , JUNCTION TEMPERATURE (o C) 200 Figure 12. Normalized Drain to Source Breakdown Voltage vs Junction Temperature 10000 10 VGS , GATE TO SOURCE VOLTAGE (V) VDD = 75V C, CAPACITANCE (pF) CISS = CGS + CGD COSS ≅ CDS + CGD 1000 CRSS = CGD 100 VGS = 0V, f = 1MHz 8 6 4 WAVEFORMS IN DESCENDING ORDER: ID = 33A ID = 16A 2 0 50 0.1 1 10 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 13. Capacitance vs Drain to Source Voltage ©2010 Fairchild Semiconductor Corporation 150 0 20 40 60 80 100 Qg, GATE CHARGE (nC) Figure 14. Gate Charge Waveforms for Constant Gate Currents FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET Typical Characteristics TA = 25°C unless otherwise noted VDS BVDSS tP VDS L IAS VDD VARY tP TO OBTAIN + RG REQUIRED PEAK IAS VDD - VGS DUT tP IAS 0V 0 0.01Ω tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms VDS VDD Qg(TOT) VDS L VGS = 10V VGS + VDD VGS - VGS = 2V DUT Qgs2 0 Ig(REF) Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tf tr VDS 90% 90% + VGS VDD - 10% 0 10% DUT 90% RGS VGS 50% 50% PULSE WIDTH VGS 0 Figure 19. Switching Time Test Circuit ©2010 Fairchild Semiconductor Corporation 10% Figure 20. Switching Time Waveforms FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET Test Circuits and Waveforms (T –T ) JM A P D M = ----------------------------R θ JA (EQ. 1) In using surface mount devices such as the TO-263 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of P DM is complex and influenced by many factors: 1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 80 RθJA = 26.51+ 19.84/(0.262+Area) EQ.2 RθJA = 26.51+ 128/(1.69+Area) EQ.3 60 RθJA (o C/W) The maximum rated junction temperature, TJM , and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM , in an application. Therefore the application’s ambient temperature, TA (oC), and thermal resistance RθJA (oC/W) must be reviewed to ensure that TJM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. 40 20 0.1 1 10 (0.645) (6.45) AREA, TOP COPPER AREA in2 (cm2 ) (64.5) Figure 21. Thermal Resistance vs Mounting Pad Area 2. The number of copper layers and the thickness of the board. 3. The use of external heat sinks. 4. The use of thermal vias. 5. Air flow and board orientation. 6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the RθJA for the device as a function of the top copper (component side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve. Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeter square. The area, in square inches or square centimeters is the top copper area including the gate and source pads. R θ JA 19.84 ( 0.262 + Area ) = 26.51 + ------------------------------------- (EQ. 2) Area in Inches Squared R θ JA 128 ( 1.69 + Area ) = 26.51 + ---------------------------------- (EQ. 3) Area in Centimeters Squared ©2010 Fairchild Semiconductor Corporation FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET Thermal Resistance vs. Mounting Pad Area rev April 2002 LDRAIN DPLCAP 10 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD RSLC2 5 51 - Lgate 1 9 9.56e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 7.71e-9 RLDRAIN RSLC1 51 Ebreak 11 7 17 18 159 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 It 8 17 1 DRAIN 2 5 EVTHRES + 19 8 + LGATE GATE 1 ESLC 11 + 17 EBREAK 18 - 50 RDRAIN 6 8 ESG DBREAK + .SUBCKT FDB2532 2 1 3 ; CA 12 8 1.4e-9 CB 15 14 1.6e-9 CIN 6 8 5.61e-9 EVTEMP RGATE + 18 22 9 20 21 16 DBODY MWEAK 6 MMED MSTRO RLGATE LSOURCE CIN 8 7 RSOURCE RLgate 1 9 95.6 RLdrain 2 5 10 RLsource 3 7 77.1 Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD S1A 12 S2A 13 8 14 13 S1B CA 15 17 18 RVTEMP CB 6 8 5 8 EDS - 19 VBAT + IT 14 + + EGS Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 9.6e-3 Rgate 9 20 1.01 RSLC1 5 51 RSLCMOD 1.0e-6 RSLC2 5 50 1.0e3 Rsource 8 7 RsourceMOD 3.0e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD RLSOURCE RBREAK S2B 13 SOURCE 3 - 8 22 RVTHRES Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*190),3))} .MODEL DbodyMOD D (IS=6.0E-11 N=1.09 RS=2.3e-3 TRS1=3.0e-3 TRS2=1.0e-6 + CJO=3.9e-9 M=0.65 TT=4.8e-8 XTI=4.2) .MODEL DbreakMOD D (RS=0.17 TRS1=3.0e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=1.0e-9 IS=1.0e-30 N=10 M=0.6) .MODEL MmedMOD NMOS (VTO=3.55 KP=10 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.01) .MODEL MstroMOD NMOS (VTO=4.2 KP=145 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MweakMOD NMOS (VTO=2.9 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=10.1 RS=0.1) .MODEL RbreakMOD RES (TC1=1.1e-3 TC2=-9.0e-7) .MODEL RdrainMOD RES (TC1=9.0e-3 TC2=3.5e-5) .MODEL RSLCMOD RES (TC1=3.4e-3 TC2=1.5e-6) .MODEL RsourceMOD RES (TC1=4.0e-3 TC2=1.0e-6) .MODEL RvthresMOD RES (TC1=-4.1e-3 TC2=-1.4e-5) .MODEL RvtempMOD RES (TC1=-4.0e-3 TC2=3.5e-6) .MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-6.0 VOFF=-4.0) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4.0 VOFF=-6.0) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1.4 VOFF=1.0) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=1.0 VOFF=-1.4) .ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. ©2010 Fairchild Semiconductor Corporation FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET PSPICE Electrical Model REV April 2002 ttemplate FDB2532 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=6.0e-11,nl=1.09,rs=2.3e-3,trs1=3.0e-3,trs2=1.0e-6,cjo=3.9e-9,m=0.65,tt=4.8e-8,xti=4.2) dp..model dbreakmod = (rs=0.17,trs1=3.0e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=1.0e-9,isl=10.0e-30,nl=10,m=0.6) m..model mmedmod = (type=_n,vto=3.55,kp=10,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=4.2,kp=145,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=2.9,kp=0.05,is=1e-30, tox=1,rs=0.1) LDRAIN sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-6.0,voff=-4.0) DPLCAP 5 sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-4.0,voff=-6.0) sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-1.4,voff=1.0) 10 RLDRAIN sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=1.0,voff=-1.4) RSLC1 51 c.ca n12 n8 = 1.4e-9 RSLC2 c.cb n15 n14 = 1.6e-9 ISCL c.cin n6 n8 = 5.61e-9 spe.ebreak n11 n7 n17 n18 = 159 GATE spe.eds n14 n8 n5 n8 = 1 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 RDRAIN 6 8 ESG EVTHRES + 19 8 + LGATE DBREAK 50 - dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod EVTEMP RGATE + 18 22 9 20 21 11 DBODY 16 MWEAK 6 EBREAK + 17 18 - MMED MSTRO RLGATE CIN DRAIN 2 8 LSOURCE SOURCE 3 7 RSOURCE RLSOURCE i.it n8 n17 = 1 S1A 12 l.lgate n1 n9 = 9.56e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 7.71e-9 S2A 13 8 14 13 S1B CA res.rlgate n1 n9 = 95.6 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 77.1 RBREAK 15 17 18 RVTEMP S2B 13 CB 6 8 EGS - 19 IT 14 + + VBAT 5 8 EDS - m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u + 8 22 RVTHRES res.rbreak n17 n18 = 1, tc1=1.1e-3,tc2=-9.0e-7 res.rdrain n50 n16 = 9.6e-3, tc1=9.0e-3,tc2=3.5e-5 res.rgate n9 n20 = 1.01 res.rslc1 n5 n51 = 1.0e-6, tc1=3.4e-3,tc2=1.5e-6 res.rslc2 n5 n50 = 1.0e3 res.rsource n8 n7 = 3.0e-3, tc1=4.0e-3,tc2=1.0e-6 res.rvthres n22 n8 = 1, tc1=-4.1e-3,tc2=-1.4e-5 res.rvtemp n18 n19 = 1, tc1=-4.0e-3,tc2=3.5e-6 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/190))** 3)) } } ©2010 Fairchild Semiconductor Corporation FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET SABER Electrical Model th JUNCTION REV 26 February 2002 FDB2532 CTHERM1 TH 6 7.5e-3 CTHERM2 6 5 8.0e-3 CTHERM3 5 4 9.0e-3 CTHERM4 4 3 2.4e-2 CTHERM5 3 2 3.4e-2 CTHERM6 2 TL 6.5e-2 RTHERM1 CTHERM1 6 RTHERM1 TH 6 3.1e-4 RTHERM2 6 5 2.5e-3 RTHERM3 5 4 2.0e-2 RTHERM4 4 3 8.0e-2 RTHERM5 3 2 1.2e-1 RTHERM6 2 TL 1.3e-1 RTHERM2 CTHERM2 5 SABER Thermal Model SABER thermal model FDB2532 template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =7.5e-3 ctherm.ctherm2 6 5 =8.0e-3 ctherm.ctherm3 5 4 =9.0e-3 ctherm.ctherm4 4 3 =2.4e-2 ctherm.ctherm5 3 2 =3.4e-2 ctherm.ctherm6 2 tl =6.5e-2 rrtherm.rtherm1 th 6 =3.1e-4 rtherm.rtherm2 6 5 =2.5e-3 rtherm.rtherm3 5 4 =2.0e-2 rtherm.rtherm4 4 3 =8.0e-2 rtherm.rtherm5 3 2 =1.2e-1 rtherm.rtherm6 2 tl =1.3e-1 } RTHERM3 CTHERM3 4 RTHERM4 CTHERM4 3 RTHERM5 CTHERM5 2 RTHERM6 CTHERM6 tl ©2010 Fairchild Semiconductor Corporation CASE FDB2532_F085 Rev. A FDB2532_F085 N-Channel PowerTrench® MOSFET SPICE Thermal Model AccuPower¥ Auto-SPM¥ Build it Now¥ CorePLUS¥ CorePOWER¥ CROSSVOLT¥ CTL¥ Current Transfer Logic¥ DEUXPEED® Dual Cool™ EcoSPARK® EfficientMax¥ ESBC¥ F-PFS¥ FRFET® SM Global Power Resource Green FPS¥ Green FPS¥ e-Series¥ Gmax¥ GTO¥ IntelliMAX¥ ISOPLANAR¥ MegaBuck¥ MICROCOUPLER¥ MicroFET¥ MicroPak¥ MicroPak2¥ MillerDrive¥ MotionMax¥ Motion-SPM¥ OptoHiT™ OPTOLOGIC® OPTOPLANAR® ® Fairchild® Fairchild Semiconductor® FACT Quiet Series¥ FACT® FAST® FastvCore¥ FETBench¥ FlashWriter®* FPS¥ ® PDP SPM™ Power-SPM¥ PowerTrench® PowerXS™ Programmable Active Droop¥ QFET® QS¥ Quiet Series¥ RapidConfigure¥ ¥ Saving our world, 1mW/W/kW at a time™ SignalWise¥ SmartMax¥ SMART START¥ SPM® STEALTH¥ SuperFET¥ SuperSOT¥-3 SuperSOT¥-6 SuperSOT¥-8 SupreMOS¥ SyncFET¥ Sync-Lock™ ® * The Power Franchise® TinyBoost¥ TinyBuck¥ TinyCalc¥ TinyLogic® TINYOPTO¥ TinyPower¥ TinyPWM¥ TinyWire¥ TriFault Detect¥ TRUECURRENT¥* PSerDes¥ UHC® Ultra FRFET¥ UniFET¥ VCX¥ VisualMax¥ XS™ * Trademarks of System General Corporation, used under license by Fairchild Semiconductor. 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Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only. Rev. I48 © Fairchild Semiconductor Corporation www.fairchildsemi.com FDB2532_F085 N-Channel PowerTrench® MOSFET TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.