FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET 30V, 55A, 11.5mΩ Features General Description ! rDS(ON) = 11.5mΩ, VGS = 10V, ID = 35A This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low rDS(ON) and fast switching speed. ! rDS(ON) = 15mΩ, VGS = 4.5V, ID = 35A ! High performance trench technology for extremely low rDS(ON) ! Low gate charge ! High power and current handling capability Application ! DC/DC converters D D G S D-PAK TO-252 (TO-252) ©2004 Fairchild Semiconductor Corporation FDD8882/FDU8882 Rev. 1.0.0 I-PAK (TO-251AA) G S G D S 1 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET November 2004 Symbol VDSS Drain to Source Voltage Parameter Ratings 30 Units V VGS Gate to Source Voltage ±20 V 55 A Drain Current Continuous (TC = 25oC, VGS = 10V) (Note 1) Continuous (TC = ID 25oC, VGS = 4.5V) (Note 1) Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 52oC/W) Pulsed 50 A 12.6 A Figure 4 A 41 mJ Single Pulse Avalanche Energy (Note 2) EAS Power dissipation PD 55 W 0.37 W/oC -55 to 175 oC Derate above 25oC TJ, TSTG Operating and Storage Temperature Thermal Characteristics RθJC Thermal Resistance Junction to Case TO-252, TO-251 2.73 o C/W RθJA Thermal Resistance Junction to Ambient TO-252, TO-251 100 o C/W RθJA Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area 52 oC/W Package Marking and Ordering Information Device Marking FDD8882 Device FDD8882 Package TO-252AA Reel Size 13” Tape Width 12mm Quantity 2500 units FDU8882 FDU8882 TO-251AA N/A (Tube) N/A 75 units FDD8882 FDD8882_NL (Note 3) TO-252AA 13” 12mm 2500 units FDU8882 FDU8882_NL (Note 3) TO-251AA N/A (Tube) N/A 75 units Electrical Characteristics TC = 25°C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units 30 - - - V - 1 - - 250 µA - - ±100 nA - 2.5 V Off Characteristics BVDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250µA, VGS = 0V VDS = 24V VGS = 0V TC = 150oC VGS = ±20V On Characteristics VGS(TH) rDS(ON) Gate to Source Threshold Voltage Drain to Source On Resistance FDD8882/FDU8882 Rev. 1.0.0 VGS = VDS, ID = 250µA 1.2 ID = 35A, VGS = 10V - 0.0094 0.0115 ID = 35A, VGS = 4.5V - 0.0130 0.0150 ID = 35A, VGS = 10V, TJ = 175oC - 0.0150 0.0190 2 Ω www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET Absolute Maximum Ratings TC = 25°C unless otherwise noted CISS Input Capacitance COSS Output Capacitance CRSS Reverse Transfer Capacitance RG Gate Resistance Qg(TOT) Total Gate Charge at 10V - 1260 - - 240 - pF - 140 - pF VGS = 0.5V, f = 1MHz - 2.4 - Ω VGS = 0V to 10V - 22 33 nC - 11.7 17.6 nC - 1.2 1.8 nC - 3.7 - nC VDS = 15V, VGS = 0V, f = 1MHz Qg(5) Total Gate Charge at 5V VGS = 0V to 5V Qg(TH) Threshold Gate Charge VGS = 0V to 1V Qgs Gate to Source Gate Charge Qgs2 Gate Charge Threshold to Plateau Qgd Gate to Drain “Miller” Charge Switching Characteristics VDD = 15V ID = 35A Ig = 1.0mA pF - 2.5 - nC - 4.6 - nC ns (VGS = 10V) tON Turn-On Time - - 135 td(ON) Turn-On Delay Time - 8 - ns tr Rise Time - 82 - ns td(OFF) Turn-Off Delay Time - 40 - ns tf Fall Time - 25 - ns tOFF Turn-Off Time - - 98 ns ISD = 35A - - 1.25 V ISD = 15A - - 1.0 V VDD = 15V, ID = 35A VGS = 10V, RGS = 13Ω Drain-Source Diode Characteristics VSD Source to Drain Diode Voltage trr Reverse Recovery Time ISD = 35A, dISD/dt = 100A/µs - - 32 ns QRR Reverse Recovered Charge ISD = 35A, dISD/dt = 100A/µs - - 21 nC Notes: 1: Package current limitation is 35A. 2: Starting TJ = 25°C, L = 0.1mH, IAS = 28A, VDD = 27V, VGS = 10V. 3: FDD8882_NL / FDU8882_NL is lead free product. FDD8882_NL / FDU8882_NL marking will appear on the reel label. FDD8882/FDU8882 Rev. 1.0.0 3 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET Dynamic Characteristics 60 CURRENT LIMITED BY PACKAGE 1.0 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 40 20 0.2 VGS = 10V 0 0 0 25 50 75 100 150 125 175 25 50 75 TC , CASE TEMPERATURE (oC) 100 125 150 175 TC, CASE TEMPERATURE (oC) Figure 1. Normalized Power Dissipation vs Case Temperature Figure 2. Maximum Continuous Drain Current vs Case Temperature 2 DUTY CYCLE - DESCENDING ORDER 0.5 0.2 0.1 0.05 0.02 0.01 ZθJC, NORMALIZED THERMAL IMPEDANCE 1 PDM 0.1 t1 t2 SINGLE PULSE NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZθJC x RθJC + TC 0.01 10-5 10-4 10-3 10-2 10-1 100 101 t, RECTANGULAR PULSE DURATION (s) Figure 3. Normalized Maximum Transient Thermal Impedance 600 TC = 25oC IDM, PEAK CURRENT (A) TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS: 175 - TC I = I25 150 VGS = 4.5V 100 30 10-5 10-4 10-3 10-2 10-1 100 101 t, PULSE WIDTH (s) Figure 4. Peak Current Capability FDD8882/FDU8882 Rev. 1.0.0 4 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET Typical Characteristics TC = 25°C unless otherwise noted 500 IAS, AVALANCHE CURRENT (A) ID, DRAIN CURRENT (A) 1000 10µs 100 100µs 10 OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 1ms 1 SINGLE PULSE TJ = MAX RATED TC = 25oC 10ms If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 100 STARTING TJ = 25oC 10 STARTING TJ = 150oC DC 0.1 1 1 0.001 60 10 0.01 VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 5. Forward Bias Safe Operating Area 10 100 Figure 6. Unclamped Inductive Switching Capability 80 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VDD = 15V 60 40 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VGS = 10V ID, DRAIN CURRENT (A) ID , DRAIN CURRENT (A) 1 NOTE: Refer to Fairchild Application Notes AN7514 and AN7515 80 TJ = 25oC 20 TJ = 175oC VGS = 4.5V 60 VGS = 3.5V 40 VGS = 3V 20 o TJ = -55 C TC = 25oC 0 0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 0 VGS , GATE TO SOURCE VOLTAGE (V) 0.5 1.0 1.5 2.0 2.5 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics 1.8 20 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX ID = 35A NORMALIZED DRAIN TO SOURCE ON RESISTANCE rDS(ON), DRAIN TO SOURCE ON RESISTANCE (mΩ) 0.1 tAV, TIME IN AVALANCHE (ms) 16 12 ID = 1A PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 1.6 1.4 1.2 1.0 0.8 VGS = 10V, ID = 35A 0.6 8 2 4 6 8 -80 10 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC) VGS, GATE TO SOURCE VOLTAGE (V) Figure 9. Drain to Source On Resistance vs Gate Voltage and Drain Current FDD8882/FDU8882 Rev. 1.0.0 -40 Figure 10. Normalized Drain to Source On Resistance vs Junction Temperature 5 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET Typical Characteristics TC = 25°C unless otherwise noted 1.10 1.2 NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE NORMALIZED GATE THRESHOLD VOLTAGE VGS = VDS, ID = 250µA 1.0 0.8 0.6 ID = 250µA 1.05 1.00 0.95 0.90 0.4 -80 -40 0 40 80 120 160 -80 200 -40 TJ, JUNCTION TEMPERATURE (oC) Figure 11. Normalized Gate Threshold Voltage vs Junction Temperature 40 80 120 160 200 Figure 12. Normalized Drain to Source Breakdown Voltage vs Junction Temperature 3000 VGS , GATE TO SOURCE VOLTAGE (V) 10 CISS = CGS + CGD C, CAPACITANCE (pF) 0 TJ , JUNCTION TEMPERATURE (oC) 1000 COSS ≅ CDS + CGD CRSS = CGD VGS = 0V, f = 1MHz 100 VDD = 15V 8 6 4 WAVEFORMS IN DESCENDING ORDER: ID = 35A ID = 5A 2 0 0.1 1 10 30 0 VDS , DRAIN TO SOURCE VOLTAGE (V) 10 15 20 25 Qg, GATE CHARGE (nC) Figure 13. Capacitance vs Drain to Source Voltage FDD8882/FDU8882 Rev. 1.0.0 5 Figure 14. Gate Charge Waveforms for Constant Gate Current 6 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET Typical Characteristics TC = 25°C unless otherwise noted VDS BVDSS tP L VDS VARY tP TO OBTAIN REQUIRED PEAK IAS IAS + RG VDD VDD - VGS DUT tP IAS 0V 0 0.01Ω tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms VDS VDD Qg(TOT) VDS L VGS VGS = 10V VGS Qg(5) + Qgs2 VDD VGS = 5V DUT VGS = 1V Ig(REF) 0 Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tr VDS tf 90% 90% + VGS VDD - 10% 10% 0 DUT 90% RGS VGS VGS 0 Figure 19. Switching Time Test Circuit FDD8882/FDU8882 Rev. 1.0.0 50% 10% 50% PULSE WIDTH Figure 20. Switching Time Waveforms 7 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET Test Circuits and Waveforms The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM, in an application. Therefore the application’s ambient temperature, TA (oC), and thermal resistance RθJA (oC/W) must be reviewed to ensure that TJM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. RθJA = 33.32+ 23.84/(0.268+Area) EQ.2 RθJA = 33.32+ 154/(1.73+Area) EQ.3 100 RθJA (oC/W) ( T JM – T A ) P DM = ----------------------------RθJA 125 (EQ. 1) 75 50 In using surface mount devices such as the TO-252 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of PDM is complex and influenced by many factors: 25 0.01 (0.0645) 0.1 (0.645) 1 10 (6.45) (64.5) AREA, TOP COPPER AREA in2 (cm2) Figure 21. Thermal Resistance vs Mounting Pad Area 1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 2. The number of copper layers and the thickness of the board. 3. The use of external heat sinks. 4. The use of thermal vias. 5. Air flow and board orientation. 6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the RθJA for the device as a function of the top copper (component side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve. Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads. 23.84 ( 0.268 + Area ) R θ JA = 33.32 + ------------------------------------- (EQ. 2) Area in Inches Squared 154 ( 1.73 + Area ) R θ JA = 33.32 + ---------------------------------- (EQ. 3) Area in Centimeters Squared FDD8882/FDU8882 Rev. 1.0.0 8 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET Thermal Resistance vs. Mounting Pad Area .SUBCKT FDD8882 2 1 3 ; rev October 2004 Ca 12 8 9e-10 Cb 15 14 9e-10 Cin 6 8 1.55e-9 LDRAIN DPLCAP DRAIN 2 5 10 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD 5 51 ESLC EVTHRES + 19 8 + LGATE GATE 1 11 + 17 EBREAK 18 - 50 RDRAIN 6 8 ESG DBREAK + RSLC2 Ebreak 11 7 17 18 34.1 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 It 8 17 1 RLDRAIN RSLC1 51 EVTEMP RGATE + 18 22 9 20 21 16 DBODY MWEAK 6 MMED MSTRO RLGATE Lgate 1 9 8.6e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 2.67e-9 LSOURCE CIN 8 7 SOURCE 3 RSOURCE RLSOURCE RLgate 1 9 86 RLdrain 2 5 10 RLsource 3 7 26.7 Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD S1A 12 S2A 13 8 15 14 13 S1B CA RBREAK 17 18 RVTEMP S2B 13 CB 6 8 EGS Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 2.5e-3 Rgate 9 20 2.43 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 6.5e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD 19 VBAT 5 8 EDS - IT 14 + + - + 8 22 RVTHRES Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*600),10))} .MODEL DbodyMOD D (IS=2E-12 IKF=10 N=1.01 RS=5.7e-3 TRS1=8e-4 TRS2=2e-7 + CJO=4.6e-10 M=0.58 TT=1e-11 XTI=2.7) .MODEL DbreakMOD D (RS=1 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=5.0e-10 IS=1e-30 N=10 M=0.45) .MODEL MmedMOD NMOS (VTO=2.11 KP=14 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.43) .MODEL MstroMOD NMOS (VTO=2.65 KP=240 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MweakMOD NMOS (VTO=1.82 KP=0.09 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=24.3 RS=0.1) .MODEL RbreakMOD RES (TC1=8.0e-4 TC2=-8e-7) .MODEL RdrainMOD RES (TC1=-6e-3 TC2=6e-6) .MODEL RSLCMOD RES (TC1=8e-5 TC2=2e-6) .MODEL RsourceMOD RES (TC1=7.5e-3 TC2=1e-6) .MODEL RvthresMOD RES (TC1=-1.2e-3 TC2=-8.3e-6) .MODEL RvtempMOD RES (TC1=-2.5e-3 TC2=3.3e-7) .MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3.5) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3.5 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-1.5) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1.5 VOFF=-2) .ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. FDD8882/FDU8882 Rev. 1.0.0 9 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET PSPICE Electrical Model rev October 2004 template FDD8882 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=2.0e-12,ikf=10,nl=1.01,rs=5.7e-3,trs1=8e-4,trs2=2e-7,cjo=4.6e-10,m=0.58,tt=1e-11,xti=2.7) dp..model dbreakmod = (rs=1,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=5.0e-10,isl=10e-30,nl=10,m=0.45) m..model mmedmod = (type=_n,vto=2.11,kp=14,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.65,kp=240,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.82,kp=0.09,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3.5) LDRAIN sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3.5,voff=-4) DPLCAP 5 sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-2,voff=-1.5) 10 sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-1.5,voff=-2) RLDRAIN RSLC1 c.ca n12 n8 = 9e-10 51 c.cb n15 n14 = 9e-10 RSLC2 c.cin n6 n8 = 1.1e-9 DRAIN 2 ISCL dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod - RDRAIN 6 8 ESG EVTHRES + 19 8 + spe.ebreak n11 n7 n17 n18 = 34.1 spe.eds n14 n8 n5 n8 = 1 GATE spe.egs n13 n8 n6 n8 = 1 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 LGATE EVTEMP RGATE + 18 22 9 20 21 11 DBODY 16 MWEAK 6 EBREAK + 17 18 - MMED MSTRO RLGATE CIN 8 LSOURCE 7 SOURCE 3 RSOURCE i.it n8 n17 = 1 RLSOURCE S1A l.lgate n1 n9 = 8.6e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 2.67e-9 res.rlgate n1 n9 = 86 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 26.7 DBREAK 50 12 S2A 14 13 13 8 S1B 15 17 18 RVTEMP S2B 13 CA RBREAK CB 6 8 EGS - 19 IT 14 + + VBAT 5 8 EDS - m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u + 8 22 RVTHRES res.rbreak n17 n18 = 1, tc1=8.0e-4,tc2=-8e-7 res.rdrain n50 n16 = 2.5e-3, tc1=-6e-3,tc2=6e-6 res.rgate n9 n20 = 2.43 res.rslc1 n5 n51 = 1e-6, tc1=8e-5,tc2=2e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 6.5e-3, tc1=7.5e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-1.2e-3,tc2=-8.3e-6 res.rvtemp n18 n19 = 1, tc1=-2.5e-3,tc2=3.3e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/600))** 10)) } } FDD8882/FDU8882 Rev. 1.0.0 10 www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET SABER Electrical Model th JUNCTION REV 23 October 2004 FDD8882T CTHERM1 TH 6 5.6e-4 CTHERM2 6 5 6.8e-4 CTHERM3 5 4 2.0e-3 CTHERM4 4 3 2.8e-3 CTHERM5 3 2 5.7e-3 CTHERM6 2 TL 5.8e-3 RTHERM1 CTHERM1 6 RTHERM1 TH 6 5.3e-2 RTHERM2 6 5 2.2e-1 RTHERM3 5 4 2.9e-1 RTHERM4 4 3 3.9e-1 RTHERM5 3 2 6.0e-1 RTHERM6 2 TL 6.6e-1 RTHERM2 CTHERM2 5 SABER Thermal Model SABER thermal model FDD8882T template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =5.6e-4 ctherm.ctherm2 6 5 =6.8e-4 ctherm.ctherm3 5 4 =2.0e-3 ctherm.ctherm4 4 3 =2.8e-3 ctherm.ctherm5 3 2 =5.7e-3 ctherm.ctherm6 2 tl =5.8e-3 RTHERM3 CTHERM3 4 RTHERM4 rtherm.rtherm1 th 6 =5.3e-2 rtherm.rtherm2 6 5 =2.2e-1 rtherm.rtherm3 5 4 =2.9e-1 rtherm.rtherm4 4 3 =3.9e-1 rtherm.rtherm5 3 2 =6.0e-1 rtherm.rtherm6 2 tl =6.6e-1 } CTHERM4 3 RTHERM5 CTHERM5 2 CTHERM6 RTHERM6 tl FDD8882/FDU8882 Rev. 1.0.0 11 CASE www.fairchildsemi.com FDD8882 / FDU8882 N-Channel PowerTrench® MOSFET PSPICE Thermal Model TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. 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PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I14