NEC UPD16650N

DATA SHEET
MOS INTEGRATED CIRCUIT
µPD16650
120-/128-OUTPUT TFT-LCD GATE DRIVER
The µPD16650 is a TFT-LCD gate driver. Provided with a level shift circuit at the logic input, this chip can output
a high gate scan voltage for a CMOS-level input. The µPD16650 has an output change-over function for switching
from the 120-output mode to the 128-output mode, and vice versa, thereby supporting the VGA, SVGA, and XGA
panels. Its output enable function (OE) enables installing the driver on either side.
FEATURES
• Output with high dielectric strength (on/off range: VDD - VEE1 = 40 VMAX.)
• Built-in shift direction change-over function
• Shiftable negative supply voltage (VEE1) level (shift range: |VEE1 - VEE2| = 10 V)
• Two acceptable CMOS input levels (3.3 and 5 V)
• Output enable function
• MC-selectable output count (MC = high: 120-output mode)
(MC = low : 128-output mode)
• Slim TCP
ORDERING INFORMATION
Part number
Package
µPD16650N-×××
TCP (TAB package)
µPD16650N-×××
Standard TCP (OL pitch = 220 µm)
Remark When ordering, the customer can specify the external form of the TCP. Call one of our sales representatives
for more information.
Document No. S11041EJ1V0DS00 (1st edition)
(Previous No. IP-3677)
Date Published December 1995 P
Printed in Japan
©
1995
µPD16650
BLOCK DIAGRAM
VCHA
R/L
LS
φX
LS
STVR
LS
MC
LS
OE
LS
LS
128-bit shift register
STVL
VEE1
X1
X2
X127
Remark LS (level shifter): Interfaces the 5 V CMOS level with the VDD-VEE2 level.
2
X128
µPD16650
PIN CONNECTION DIAGRAM (µPD16650N-×××)
X128
X127
X126
VDD
X70
VCHA
X69
VEE2
X68
STVL
X67
OE
X66
φX
R/L
X65
(Copper foil side)
X64
VCC
X63
MC
X62
VSS
X61
STVR
X60
VEE2
X59
These pins are ineffective in the
120-output mode.
VEE1
X3
X2
X1
Caution
The VCHA pin should be connected to the VDD or VEE2 pin on the TCP. (This method eliminates
the necessity to provide the VCHA input pin on the TCP, resulting in a reduction in the number
of required input pins.)
3
µPD16650
PIN DESCRIPTION
Pin name
Pin symbol
X1 to X128
Driver output
Description of function
Output scan signals to drive the TFT-LCD gate electrodes. The output changes
when the shift clock φX rises. The amplitude of the driver output is VDD - VEE1.
See the timing charts shown later for details of how to switch between the 120output mode and 128-output mode.
MC
Output count change-over
Receives a signal that changes the number of outputs. For the 120-output
input
mode, this pin must be supplied with a high level (VCC). For the 128-output
mode, it must be supplied with a low level (VSS or VEE2).
VCHA
STVR
Logic voltage change-over
Must be supplied with the VEE2 level when the logic supply voltage is 3.3 V, and
input
with the VDD level when the logic supply voltage is 5.0 V.
Start pulse input/output
Receives an input to the internal shift register. The input data is loaded on the
shift register at the positive-going edge of the shift clock φX. The scan signals
STVL
are output from X1 to X128. The input/output level is the CMOS level.
Outputs a start pulse to the next stage if a cascade connection is used. In the
120-output mode, the start pulse is output at the negative-going edge of the
120th shift clock φX pulse, and cleared at the negative-going edge of the 121st
pulse. In the 128-output mode, the start pulse is output at the negative-going
edge of the 128th shift clock φX pulse, and cleared at the negative-going edge
of the 129th pulse.
R/L
φX
Shift direction change-over
R/L = high (for shift right): STVR → X1 → X128 → STVL
input
R/L = low (for shift left)
Shift clock input
Receives a shift clock pulse for the internal shift register. A shift occurs at the
: STVL → X128 → X1 → STVR
positive-going edge of the shift clock pulse.
OE
Output enable input
When this pin is at a high level, the driver output is fixed at a low level. The
shift register is not cleared, however. The internal logic circuit operates even
when the pin is at a high level.
The signal supplied to this pin is not
synchronized with the clock.
VDD
Driver positive supply volt-
Receives the supply voltage for both the logic circuit and driver.
age
VCC
Reference voltage
5 ±0.5 V/3.3 ±0.3 V
Reference voltage for the LS1 and LS2 level shifters.
VSS
Ground
Must be connected to the system ground.
VEE1
Driver negative supply volt-
VEE1 (for the driver)
age
VEE2
Driver negative supply voltage
4
VEE2 (for the logic circuit)
µPD16650
CAUTIONS FOR USE
1)
Power-on sequence
To prevent latch-up disruption, the power must be switched on in the order:
VCC → VEE1 → VEE2 → VDD → Logic input
When witching off, reverse the order. This order must be observed also during transition.
2)
Insertion of bypass capacitors
The internal logic circuit operates at a high voltage. To make VIH and VIL immune to noise, use capacitors of
0.1 µF or so between supply voltages as shown below.
VDD
VCC
0.1 µ F
0.1 µ F
VSS
0.1 µ F
VEE2
3)
Negative voltage level shift
If it is necessary to shift the level of a negative supply voltage, shift the VEE1 (driver supply voltage) level. The
shift should be limited to within: VEE2 ≤ VEE1 ≤ VEE2 + 10 V
Note that shifting the VEE1 level results in the ON-state output resistance and output fall time ratings being
changed.
4)
Handling the VEE1 and VEE2 driver negative supply voltage pins
For applications in which a negative supply voltage level is not shifted, connect the VEE1 pin (driver supply voltage)
to the VEE2 pin (logic supply voltage) outside the TCP. Fix all unused input pins to the VEE2 level.
5
µPD16650
TIMING CHART (MC = VSS, 128-OUTPUT MODE, AND R/L = VCC)
φX
1
2
3
127
128
129
130
STVR (STVL)
X1
X2
X3
X127
X128
STVL (STVR)
X1 at the
next stage
X2 at the
next stage
Caution
6
Do not change all outputs simultaneously, because such a sequence may result in malfunction.
µPD16650
TIMING CHART (MC = VCC, 120-OUTPUT MODE, AND R/L = VCC)
1
φX
2
3
119
120
121
122
STVR (STVL)
X1
X2
X3
X127
X128
STVL (STVR)
X1 at the
next stage
X2 at the
next stage
Cautions 1. Do not change all outputs simultaneously, because such a sequence may result in malfunction.
2. The output sequence in the 120-output mode is as follows:
STVR (STVL) → X1 → X2 ... X60 → X69 ... X127 → X128 → STVL (STVR)
7
µPD16650
ABSOLUTE MAXIMUM RATINGS (TA = 25 °C, VSS = 0 V)
Parameter
Symbol
Conditions
Rated value
Unit
V
Supply voltage
VDD
–0.5 to +28
Supply voltage
VCC
–0.5 to +7
V
Supply voltage
VDD-VEE1
–0.5 to +42
V
–22 to +0.5
V
VDD-VEE2
Supply voltage
VEE1, V EE2
Input voltage
VI
VEE2 – 0.5 to VDD2 + 0.5
V
Input current
II
±10
mA
Output current
IO
±10
mA
Operating temperature range
TA
–20 to +85
°C
Storage temperature range
Tstg.
–55 to +125
°C
RECOMMENDED OPERATING RANGES (TA = –20 °C to +70 °C, VSS = 0 V)
Parameter
Symbol
Conditions
Min.
Typ.
Max.
Unit
Supply voltage
VDD
16
25
V
Supply voltage
VEE1
VEE2
VEE2 + 10
V
Supply voltage
VEE2
–20
0
V
Supply voltage
VDD-VEE1
20
40
V
VDD-VEE2
Supply voltage
VCC
For the 3.3 V logic input
3.0
3.3
3.6
V
Supply voltage
VCC
For the 5.0 V logic input
4.5
5.0
5.5
V
Remark When shifting the level of VEE1 (driver supply voltage), satisfy the condition:
VEE2 ≤ VEE1 ≤ VEE2 + 10 V
Note that shifting the VEE1 level results in the ON-state output resistance and output fall time ratings being
changed.
ELECTRICAL CHARACTERISTICS
(TA = –20 °C to +70 °C, VDD = 20 V, VEE1 = VEE2 = –20 V, VCC = 3.3 ±0.3 V or 5.0 ±0.5 V, VSS = 0 V)
Parameter
Symbol
Conditions
Min.
Typ.
Max.
Unit
Input high voltage
VIH
Other than VCHA
0.7VCC
VCC
V
Input low voltage
VIL
Other than VCHA
VEE2
0.3VCC
V
Output high voltage
VOH
STVR(STVL), IOH = –40 µA
VCC – 0.4
VCC
V
Output low voltage
VOL
STVR(STVL), IOL = 40 µA
VSS
VSS + 0.4
V
Output high current
IXOH
Xn, VX = VDD – 1 V
–1.5
mA
Output low current
IXOL
Xn, VX = VEE1 + 1 V
ON-state output resistance
RON1
VX = VEE1 + 1 V or VDD – 1 V
660
Ω
Input leakage current
IIL
V1 = 0 V, 5.0 V, or 3.3 V
±1.0
µA
Dynamic drain current
IDD
VDD, fφX = 31.5 kHz
0.5
1.0
mA
IEE
VEE1/2, fφX = 31.5 kHz
–0.5
–1.0
mA
ICC
VCC, fφX = 31.5 kHz
50
100
µA
8
mA
1.5
µPD16650
SWITCHING CHARACTERISTICS
(TA = –20 °C to +70 °C, VDD = 20 V, VEE1 = VEE2 = –20 V, VSS = 0 V, VCC = 3.3 ±0.3 V or 5.0 ±0.5 V)
Parameter
STVR and STVL output delay
Symbol
Conditions
Min.
Typ.
Max.
Unit
tPHL1
CL = 20 pF
600
ns
tPLH1
CLK → STVR(STVL)
600
ns
tPHL2
CL = 220 pF
700
ns
tPLH2
CLK → Xn
700
ns
td1
CL = 220 pF, OE: L → H
700
ns
td2
CL = 220 pF, OE: H → L
700
ns
Output rise time
tTHL
CL = 220 pF
300
ns
Output fall time
tTLH
CL = 220 pF
300
ns
Input capacitance
CI
TA = 25 °C
15
pF
Maximum clock frequency
f φX
For cascade connection
Driver output delay
100
kHz
TIMING REQUIREMENTS
(TA = –20 °C to +70 °C, VDD = 20 V, VEE1 = VEE2 = –20 V, VSS = 0 V, VCC = 3.3 ±0.3 V or 5.0 ±0.5 V)
Parameter
Symbol
Conditions
Min.
Typ.
Max.
Unit
Clock pulse high width
PWφX(H)
Duty = 50 %
500
ns
Clock pulse low width
PWφX(L)
Duty = 50 %
500
ns
Data setup time
tsetup
STVR(STVL) ↑ → CLK ↑
100
ns
Data hold time
thold
CLK ↑ → STVR(STVL) ↓
100
ns
Remark The logic input rise time (tr) and fall time (tf) must be within 20 ns (between 10 % and 90 % of the peak
amplitude of the input).
9
µPD16650
SWITCHING CHARACTERISTIC WAVEFORM (R/L = HIGH)
1/f φ X
PW φ X
PWφ X
VCC
50 %
50 %
50 %
50 %
φx
VSS
thold
tsetup
VCC
VSS
tPLH2
tPHL2
90 %
90 %
50 %
50 %
Xn
10 %
10 %
tTLH
tPLH1
tTHL
tPHL1
VOH
50 %
50 %
STVL (STVR)
VOL
VCC
OE
50 %
50 %
VSS
td2
td1
Xn
Xn
10
50 %
50 %
µPD16650
RECOMMENDED MOUNTING CONDITIONS
When mounting this product, please make sure that the following recommended conditions are satisfied.
For packaging methods and conditions other than those recommended below, please contact NEC sales
personnel.
µPD16650N-×××
Mounting Condition
Thermocompression
Caution
Mounting Method
Condition
Soldering
Heating tool 300 to 350 ˚C; heating for 2 to 3 seconds; pressure 100 g
(per solder)
ACF (Sheet-shape bonding
agent)
Temporary bonding 70 to 100 ˚C; pressure 3 to 8 kg/cm 2; time 3 to 5
secs.
Real bonding 165 to 180 ˚C; pressure 25 to 45 kg/cm 2; time 30 to 40
secs. (when using the anisotropic conductive film SUMIZAC1003 of
Sumitomo Bakelite, Ltd.)
To find out the detailed conditions for packaging the ACF part, please contact the ACF
manufacturing company. Be sure to avoid using two or more packaging methods at a time.
Reference
NEC Semiconductor Device Reliability/Quality Control System (IEI-1212)
Quality Grades to NEC’s Semiconductor Devices (IEI-1209)
11
µPD16650
[MEMO]
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consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
“Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on
a customer designated “quality assurance program“ for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact NEC Sales Representative in advance.
Anti-radioactive design is not implemented in this product.
M4 94.11