CXD2311AR 10-bit 20MSPS Video A/D Converter Description The CXD2311AR is a 10-bit CMOS A/D converter for video applications. This IC is ideally suited for the A/D conversion of video signals in TVs, VCRs, camcorders, etc. Features • Resolution: 10-bit ± 1.0 LSB (D.L.E.) • Maximum sampling frequency: 20MSPS • Low power consumption: 130mW (at 20MSPS typ.) (Not including reference current) • TTL compatible input • Tri-state TTL compatible output (DVDD = 3.3V) • Low input capacitance • Reference impedance: 280Ω (typ.) 48 pin LQFP (Plastic) Structure Silicon gate CMOS IC Absolute Maximum Ratings (Ta = 25°C) • Supply voltage VDD 7 V • Reference voltage VRT, VRB VDD + 0.5 to VSS – 0.5 V • Input voltage (analog) VIN VDD + 0.5 to VSS – 0.5 V • Input voltage (digital) VIH, VIL VDD + 0.5 to VSS – 0.5 V • Output voltage (digital) VOH, VOL VDD + 0.5 to VSS – 0.5 V • Storage temperature Tstg –55 to +150 °C Recommended Operating Conditions • Supply voltage AVDD, AVSS 5.0 ± 0.25 DVDD, DVSS 3.0 to 5.25 | DVSS – AVSS | 0 to 100 • Reference input voltage VRB More than 1.8 VRT to AVDD – 0.4 • Analog input VIN More than 1.8Vp-p • Clock pulse width TPW1 25 (min.) TPW0 25 (min.) • Operating ambient temperature Topr –20 to +75 V V mV V V ns ns °C Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. –1– E94Z27D79-PS CXD2311AR Block Diagram VIN 39 AVSS AVDD 27 28 36 18 26 AAA AAAA AAAAAAA AAAA AAAA AAA AAA AAAA AAAA AAA AAA AAAA AAAA AAA AAA AAAA AAAA AAA AAAA AAAA AAAA AAA AAAA AAAAAAAAAAA AAAA AAA AAA AAAA AAAAA AAAA AAAAA AAAAA + ×8 VRT 29 VRT 30 12 D9 Sense Amp – Coarse Correction & Latch 11 D8 10 D7 9 D6 8 D5 DAC Fine Comparate & Encode Coarse Comparate & Encode 5 D4 4 D3 Fine Latch VRB 35 D2 2 D1 Calibration Unit VRB 34 3 1 D0 (LSB) 21 MINV Sense Amp 20 LINV 19 TESTMODE CLK 22 OE 23 CE 24 Timing Gen 41 CAL Auto Calibration Pulse Generator 17 SEL 15 RESET Pin Configuration AVDD AVDD AVSS AVSS VRT VRT NC NC NC VRB VRB 37 AVSS 36 35 34 33 32 31 30 29 28 27 26 25 TSTR 38 AT CE 24 OE 23 39 VIN CLK 22 40 NC MINV 21 41 CAL LINV 20 42 TS TESTMODE 19 43 AVSS AVDD 18 44 AVSS SEL 17 45 DVDD DVSS 16 9 10 11 12 –2– D9 8 D8 7 D7 6 D6 5 DVDD 4 D5 3 DVSS 2 D3 1 D4 TO 13 D2 TIN 14 48 DVSS D1 RESET 15 D0 46 NC 47 NC CXD2311AR Pin Description Pin No Symbol Equivalent circuit Description DVDD 1 to 5 8 to 12 D0 (LSB) to D9 (MSB) output. D0 to D9 DVSS TO Test pin. TS = High: High impedance state 7, 45 DVDD Digital VDD. 6, 16, 48 DVSS Digital VSS. 27, 28, 36, 43, 44 AVSS Analog VSS. 13 AVDD 17 SEL Calibration input pulse select after completion of the startup calibration. High : Internal pulse generation Low : External input 17 AVSS AVDD 22 CLK Clock pin. 22 AVSS AVDD 41 CAL Calibration pulse input. 41 AVSS AVDD 15 RESET Calibration circuit reset and startup calibration restart. 15 AVSS –3– CXD2311AR Pin No. 14 Symbol Equivalent circuit Description Test signal input. Normally fixed to AVDD or AVSS. TIN AVDD 29, 30 Reference top. VRT 29 30 AVSS 34, 35 VRB 34 Reference bottom. 35 38 AT Test signal output. TS = High: High impedance state 42 TS Test signal input. Normally fixed to AVDD. 37 TSTR Test signal input. Normally fixed to AVSS. AVDD 23 OE D0 to D9 output enable. Low : Output state High : High impedance state 23 AVSS AVDD 24 CE Chip enable. Low : Active state High : Standby state 24 AVSS –4– CXD2311AR Pin No. Symbol Equivalent circuit Description AVDD 19 TESTMODE Test mode. High : Output state Low : Output fixed 19 AVSS AVDD 20 LINV Output inversion. High : D0 to D8 are inverted and output. 20 AVSS AVDD 21 MINV Output inversion. High : D9 is inverted and output. 21 AVSS 18, 25, 26 AVDD Analog VDD. AVDD 39 VIN Analog input. 39 AVSS –5– CXD2311AR Digital Output The following table shows the correlation between the analog input voltage and the digital output code (TESTMODE = 1, LINV, MINV = 0) Input signal voltage Step Digital output code MSB LSB VRT 0 1 1 1 1 1 1 1 1 1 1 511 512 1 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1023 0 0 0 0 0 0 0 0 0 0 VRB The following table shows the output state for the combination of TESTMODE, LINV, and MINV states. TESTMODE LINV 1 1 1 1 0 0 0 0 0 1 0 1 0 1 0 1 MINV D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 0 0 1 1 0 0 1 1 P N P N 1 0 1 0 P N P N 0 1 0 1 P N P N 1 0 1 0 P N P N 0 1 0 1 P N P N 1 0 1 0 P N P N 0 1 0 1 P N P N 1 0 1 0 P N P N 0 1 0 1 P N P N 1 0 1 0 P P N N 0 0 1 1 P: Forward-phase output N: Inverted output Timing Chart 1 Clock tPW1 tPW0 1.65V tSL tSH Analog input HOLD N HOLD N + 3 HOLD N + 2 HOLD N + 1 tDL Data output N–3 N–2 N–1 N 1.65V (DVDD = 3.3V) 2.5V (DVDD = 5.0V) Timing Chart 2 tPZE tPEZ 1.65V 1.65V Output enable (OE) Data output 1.65V (DVDD = 3.3V) 2.5V (DVDD = 5.0V) Active High Impedance –6– Active CXD2311AR Electrical Characteristics Item Max. conversion rate Min. conversion rate Analog Supply current Digital Analog Standby current Digital Reference pin current Analog input band Analog input capacitance Reference resistance value (VRT – VRB) (Fc = 20MSPS, AVDD = 5V, DVDD = 3.3V, VRB = 2.0V, VRT = 4.0V, Ta = 25°C) Symbol Conditions Fc max Fc min IADD IDDD IAST IDST IRT IRB BW CIN FIN = 1.0kHz triangular wave input 20 FIN = 1.0kHz triangular wave input 16 Offset voltage EOB 5.0 –11.0 –1dB EOT = theoretical value-actual measured value EOB = actual measured valuetheoretical value –22 8 28 –18 tPEZ Clock not synchronized for active → high impedance 20 Tri-state output enable time tPZE Clock not synchronized for high impedance → active 10 Integral non-linearity error Differential non-linearity error Differential gain error Differential phase error Output data delay EL ED DG DP Digital input current Digital output current Digital output current Sampling delay tDL tSH tSL 30 –10 VIH = DVDD VIL = 0V 0.8 50 3.5 3.5 8 0 –7– µA mA Ω V 5 5 NTSC 40 IRE mod ramp, Fc = 14.3MSPS CL = 20pF mA 42 2.3 –50 DVDD = max 12 2.5 1.0 VIN = 4V VIN = 2V MSPS mV AVDD – AVSS VRT – VRB AVDD = 4.75V to 5.25V Unit MHz pF 380 Tri-state output disable time Analog input current 7.0 –7.0 35 10 0.5 30 5.0 1.0 1.0 11.0 –5.0 280 OE = AVSS VOH = DVDD – 0.5V DVDD = min VOL = 0.4V OE = AVDD VOH = DVDD DVDD = max VOL = 0V Digital input voltage 23 3.0 Max. 180 VCAL1 VCAL2 VIH VIL AIH AIL IIH IIL IOH IOL IOZH IOZL Startup calibration start voltage Typ. CE = High RREF EOT Min. V µA µA mA 1 1 µA 25 30 ns 15 20 ns ±1.3 ±0.5 1.0 0.3 13 6 2 ±2.0 ±1.0 LSB 18 4 % deg ns ns CXD2311AR Symbol Item SNR SNR SFDR SFDR Conditions Min. Typ. Max. 56 56 56 55 50 46 68 67 65 65 54 53 FIN = 100kHz FIN = 500kHz FIN = 1MHz FIN = 3MHz FIN = 7MHz FIN = 10MHz FIN = 100kHz FIN = 500kHz FIN = 1MHz FIN = 3MHz FIN = 7MHz FIN = 10MHz Unit dB dB Application Circuit 1. Startup calibration + internal auto calibration 4.0V AVDD 2.0V AVDD AVDD AVSS VRT NC VRT NC NC AVSS 37 VRB AVSS VRB 2.0V AVSS 36 35 34 33 32 31 30 29 28 27 26 25 4.0V TSTR 38 AT AVDD OE 23 39 VIN CLK 22 40 NC MINV 21 41 CAL LINV 20 44 AVSS SEL 17 45 DVDD DVSS 16 6 7 8 9 10 11 12 D8 5 D7 4 D6 3 DVDD 2 D5 1 DVSS TO 13 D3 TIN 14 48 DVSS D4 47 NC D2 RESET 15 D1 46 NC D0 DVSS AVDD AVDD 18 43 AVSS AVSS Clock input TESTMODE 19 42 TS DVDD AVSS AVSS AVDD DVSS D9 Sample & Hold CE 24 is all 0.1µF Digital output Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same. –8– CXD2311AR Application Circuit 2. Startup calibration + external sync calibration 4.0V AVDD 2.0V 4.0V AVDD AVSS AVDD VRT VRT NC NC NC AVSS 37 VRB AVSS VRB 2.0V AVSS 36 35 34 33 32 31 30 29 28 27 26 25 TSTR 38 AT 41 CAL LINV 20 AVSS Clock input AVDD TESTMODE 19 42 TS 43 AVSS AVDD 18 44 AVSS SEL 17 45 DVDD DVSS 16 TIN 14 48 DVSS TO 13 4 5 6 7 8 9 10 11 12 AVSS AVDD DVSS D9 3 D7 2 D8 1 D6 47 NC DVDD RESET 15 D5 46 NC DVSS DVSS MINV 21 D4 AVSS 40 NC D3 DVDD CLK 22 D2 AVDD 39 VIN D1 Calibration pulse OE 23 D0 Sample & Hold CE 24 is all 0.1µF Digital output Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same. –9– CXD2311AR Application Circuit 3. Only startup calibration (Less than supply voltage fluctuation range of AVDD = ±100mV and reference voltage fluctuation range of |VRT – VRB| = 200mV) 4.0V AVDD 2.0V 4.0V AVDD AVSS AVDD VRT VRT NC NC NC AVSS 37 VRB AVSS VRB 2.0V AVSS 36 35 34 33 32 31 30 29 28 27 26 25 TSTR 38 AT AVDD OE 23 39 VIN CLK 22 40 NC MINV 21 41 CAL LINV 20 AVDD AVDD 18 43 AVSS 44 AVSS SEL 17 45 DVDD DVSS 16 AVSS 5 6 7 8 9 10 11 12 D7 4 D8 3 D6 2 DVDD 1 D5 DVSS TO 13 D4 TIN 14 48 DVSS D3 47 NC D2 RESET 15 D1 46 NC D0 DVSS Clock input TESTMODE 19 42 TS DVDD AVSS AVSS AVDD DVSS D9 Sample & Hold CE 24 is all 0.1µF Digital output Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same. – 10 – CXD2311AR 1. Calibration Function In order to achieve superior linearity, the CXD2311AR has a built-in calibration circuit. In order to eliminate the necessity for the externally input calibration pulse required by the earlier CXD2311R, a startup calibration function and an auto calibration pulse generation function have been newly added to the CXD2311AR. Fig. 1 shows a block diagram of the calibration pulse generation circuit. AVDD 1 16 CLK AVDD AVSS Sence Amp 1 VRT VRB Sence Amp 2 D Q 14 bit Counter CLR CO 24 bit Counter CLR CO OUT CLR SEL RESET CE CAL Fig. 1. Calibration Pulse Generation Circuit (1) Startup Calibration Function Over 600 calibration pulses are needed to complete the initial calibration process when the power is first supplied to the IC. The startup calibration function automatically generates these pulses internally and completes the initial calibration process. The following five conditions must be satisfied to initiate the startup calibration function. When RESET = High and CE = Low [V] AVDD 5 VRT b) VRB 2.5 1V 0 a) [t] c) d) e) The voltage between AVDD and AVSS is approximately 2.5V or more. The voltage between VRT and VRB is approximately 1V or more. The RESET pin (Pin 15) must is high. The CE pin (Pin 24) must is low. Condition b is met after condition a. Sence Amp 1 Sence Amp 2 CLR Once all five of these conditions have been met, the calibration pulses are generated. The pulses are generated by counting 16 main clock cycles on a 14-bit counter and closing the gate when the carry-out occurs. Therefore, the time required for startup calibration after the above five conditions have been met is determined by the following formula: Startup calibration time = main clock cycle × 16 × 16,384 For example, if the main clock frequency is 14.3MHz, the time required for startup calibration is 18ms. – 11 – CXD2311AR (2) Auto Calibration Pulse Generation Function After startup calibration is completed, this function periodically generates calibration pulses so that calibration can be performed constantly without any need for input of calibration pulses from an external source. This function counts 16 main clock cycles on a 24-bit counter and uses the carry-out as the calibration pulse. The cycle of the calibration pulse generated in this fashion is as follows: Internal calibration pulse generation cycle = main clock cycle × 16 × 16,777,216 Therefore, if the main clock frequency is 14.3MHz, the calibration pulse cycle is approximately 19 seconds; since calibration is performed once every seven pulses, the calibration cycle is approximately 130 seconds. In order to use this function, the SEL pin (Pin 17) must be high. Note that this function cannot be used if fixing the lower bits in the calibration operation as described below will cause problems because this function is executed asynchronously without regard to the input signals. (3) External Calibration Pulse Input Function If the auto calibration function cannot be used, calibration can be performed in synchronization with the input signals when a calibration pulse is input from the CAL pin (Pin 41) by setting the SEL pin (Pin 17) low. 10ns or more 7clock CLK CAL 1clock or more D5 to D9 N–3 N–2 N–1 D0 to D4 N–3 N–2 N–1 N N+1 N+2 N+3 N N+4 N+5 N+5 Fig. 2. Calibration Timing Chart Calibration starts when the falling edge of the pulse input to the CAL pin (Pin 41) is detected. Because the lower comparator is occupied for four clock cycles at this point, the previous lower data is held for four clock cycles after seven clock cycles since the rising edge of the clock cycle in which the falling edge of CAL was detected. Calibration can be performed outside of video intervals by using the sync signal, etc., to input the CAL signal. An example of this is shown below. [1] Inputting CAL every H-sync Input CLK CAL – 12 – CXD2311AR [2] Inputting CAL every V-sync Input CLK RESET CAL It is also possible to use only the startup calibration function by leaving the SEL pin (Pin 17) low and fixing the CAL pin (Pin 41) either high or low. Note that this method requires restriction of the fluctuation range of the supply voltage and the reference voltage. (4) Re-initiating the Startup Calibration Function The startup calibration function can be re-initiated after the power and reference voltage are supplied by using the CE pin (Pin 24) and the RESET pin (Pin 15). Particularly in cases where the riseup characteristics of the power supply and the reference voltage are unstable or the order of the riseup is not kept, it is possible to initiate startup calibration properly by connecting a CR and delaying startup until after power supply riseup. AVDD [V] AVDD VRT RESET R RESET 15 VRB C AVSS [t] Fig. 3. Initiation of the Startup Calibration Function Using the RESET pin – 13 – CXD2311AR 2. Power supply To prevent the influence of noise, connect the power supply to a 0.1µF by-pass capacitor as near the device as possible. 3. DVDD Either a 3.3V or 5.0V digital power supply can be used. Compared to the 5.0V power supply, the 3.3V power supply generates a decreased amount of radiation noise but offers a decreased drive capacity. These two power supplies do not virtually differ in static and dynamic characteristics. Further, the High output level rises up to DVDD. 4. Reference input The voltage to be supplied to the reference pins must be driven by a buffer having a 10mA or more drive capacity. For supplied voltage stabilization, connect the buffer to a 0.1µF by-pass capacitor as near the pins as possible. 5. Latch-up Ensure that the AVDD and DVDD pins share the same power supply on a board to prevent latch-up which may be caused by power ON time-lag. 6. Board To obtain full-expected performance from this IC, be sure that the mounting board has a large ground pattern for lower impedance. It is recommended that the IC be mounted on a board without using a socket to evaluate its characteristics adequately. – 14 – CXD2311AR Example of Representative Characteristics Maximum operating frequency vs. Ambient temperature Maximum operating frequency [MHz] Supply current [mA] Supply current vs. Ambient temperature Fc = 20MHz fin = 1kHz triangular wave AVDD = 5.0V DVDD = 3.3V 25 23 21 –20 0 25 50 75 fin = 1kHz triangular wave AVDD = 5.0V DVDD = 3.3V 35 30 25 20 –20 Ambient temperature [°C] Sampling delay [ns] Output data delay [ns] AVDD = 5.0V DVDD = 3.3V Fc = 1MHz CL = 20pF –20 0 25 50 TSH AVDD = 5.0V DVDD = 3.3V Fc = 1MHz 4 TSL 2 75 –20 SFDR [dB] SNR [dB] 40 AVDD = 5.0V DVDD = 3.3V Fc = 20MHz VIN = 2Vp-p Ta = 25°C 50 40 10M 100k Input frequency [Hz] Output level [dB] Effective bits [bit] AVDD = 5.0V DVDD = 3.3V Fc = 20MHz VIN = 2Vp-p Ta = 25°C 1M 10M Input band 9 100k 1M Input frequency [Hz] Input frequency vs. Effective bits 7 50 60 50 8 25 Input frequency vs. SFDR AVDD = 5.0V DVDD = 3.3V Fc = 20MHz VIN = 2Vp-p Ta = 25°C 1M 0 Ambient temperature [°C] Input frequency vs. SNR 100k 75 6 Ambient temperature [°C] 60 50 Sampling delay vs. Ambient temperature 17 13 25 Ambient temperature [°C] Output data delay vs Ambient temperature 15 0 10M 1 0 –1 –2 –3 AVDD = 5.0V DVDD = 3.3V Fc = 20MHz VIN = 2Vp-p Ta = 25°C 100k Input frequency [Hz] 1M 10M Input frequency [Hz] – 15 – 75 CXD2311AR Package Outline Unit: mm 48PIN LQFP (PLASTIC) 9.0 ± 0.2 ∗ 7.0 ± 0.1 36 25 A 13 48 0.5 ± 0.2 (8.0) 24 37 (0.22) 12 1 + 0.05 0.127 – 0.02 0.5 + 0.08 0.18 – 0.03 0.13 M + 0.2 1.5 – 0.1 0.1 0° to 10° 0.5 ± 0.2 0.1 ± 0.1 NOTE: Dimension “∗” does not include mold protrusion. DETAIL A PACKAGE STRUCTURE PACKAGE MATERIAL EPOXY RESIN SOLDER/PALLADIUM PLATING SONY CODE LQFP-48P-L01 LEAD TREATMENT EIAJ CODE LQFP048-P-0707 LEAD MATERIAL 42/COPPER ALLOY PACKAGE MASS 0.2g JEDEC CODE – 16 –