PANASONIC 2SC2590

Power Transistors
2SC2590
Silicon NPN epitaxial planar type
For low-frequency power amplification
Unit: mm
8.0+0.5
–0.1
3.2±0.2
1.9±0.1
3.05±0.1
3.8±0.3
• Excellent collector current IC characteristics of forward current
transfer ratio hFE
• High transition frequency fT
• TO-126B package which requires no insulation plate for installation to the heat sink
16.0±1.0
■ Features
11.0±0.5
φ 3.16±0.1
■ Absolute Maximum Ratings Ta = 25°C
Parameter
Symbol
Rating
Unit
Collector-base voltage (Emitter open)
VCBO
120
V
Collector-emitter voltage (Base open)
VCEO
120
V
Emitter-base voltage (Collector open)
VEBO
5
V
Collector current
IC
0.5
A
Peak collector current
ICP
1.0
A
Collector power dissipation
PC
1.2
W
Junction temperature
Tj
150
°C
Storage temperature
Tstg
−55 to +150
°C
0.75±0.1
0.5±0.1
4.6±0.2
1
2
0.5±0.1
1.76±0.1
2.3±0.2
1: Emitter
2: Collector
3: Base
TO-126B-A1 Package
3
■ Electrical Characteristics Ta = 25°C ± 3°C
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Collector-emitter voltage (Base open)
VCEO
IC = 100 µA, IB = 0
120
V
Emitter-base voltage (Collector open)
VEBO
IE = 10 µA, IC = 0
5
V
Forward current transfer ratio *1
hFE1 *2
VCE = 10 V, IC = 150 mA
90
hFE2
VCE = 5 V, IC = 500 mA
65
Collector-emitter saturation voltage
VCE(sat)
Base-emitter saturation voltage
VBE(sat)
Transition frequency
fT
Collector output capacitance
(Common base, input open circuited)
Cob
220

IC = 300 mA, IB = 30 mA
1.0
V
IC = 300 mA, IB = 30 mA
1.2
V
100
VCB = 10 V, IE = −50 mA, f = 200 MHz
200
VCB = 10 V, IE = 0, f = 1 MHz
11
MHz
20
pF
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *1: Pulse measurement
*2: Rank classification
Rank
Q
R
hFE1
90 to 155
130 to 220
Publication date: January 2003
SJD00100BED
1
2SC2590
PC  Ta
TC=25˚C
160
4
3
(1)
2
IB=1.0mA
0.9mA
0.8mA
120
0.7mA
0.6mA
80
0.5mA
0.4mA
0.3mA
40
1
0.2mA
(2)
0.1mA
0
0
40
80
120
160
200
0
2
4
6
8
VBE(sat)  IC
hFE  IC
TC=100˚C
25˚C
–25˚C
100
10
0.01
1
1
0.01
0.01
–25˚C
TC=100˚C
0.1
1
Single pulse
TC=25˚C
IE=0
f=1MHz
TC=25˚C
60
40
20
t=10ms
IC
t=1s
0.1
0.01
0.001
100
ICP
1
1
10
100
1 000
Collector-emitter voltage VCE (V)
SJD00100BED
VCB=10V
f=200MHz
TC=25˚C
300
200
100
0
−1
−10
Emitter current IE (mA)
Safe operation area
10
80
Collector current IC (A)
Collector output capacitance
C (pF)
(Common base, input open circuited) ob
Cob  VCB
2
0.1
Collector current IC (A)
Collector current IC (A)
Collector-base voltage VCB (V)
0.1
fT  I E
Transition frequency fT (MHz)
Forward current transfer ratio hFE
Base-emitter saturation voltage VBE(sat) (V)
0.1
10
25˚C
VCE=10V
25˚C
1
1
Collector current IC (A)
1 000
0.1
IC/IB=10
400
100˚C
0
12
Collector-emitter voltage VCE (V)
TC=–25˚C
0.01
0.01
10
Ambient temperature Ta (°C)
IC/IB=10
1
Collector-emitter saturation voltage VCE(sat) (V)
5
0
VCE(sat)  IC
(1)With a 100×100×2mm
Al heat sink
(2)Without heat sink
Collector current IC (mA)
Collector power dissipation PC (W)
IC  VCE
280
6
−100
Request for your special attention and precautions in using the technical information
and semiconductors described in this material
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if any of the products or technologies described in this material and controlled under the "Foreign
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product or technologies as described in this material.
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electronic equipment (such as office equipment, communications equipment, measuring instruments and household appliances).
Consult our sales staff in advance for information on the following applications:
• Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment,
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(5) The products and product specifications described in this material are subject to change without
notice for modification and/or improvement. At the final stage of your design, purchasing, or use of
the products, therefore, ask for the most up-to-date Product Standards in advance to make sure that
the latest specifications satisfy your requirements.
(6) When designing your equipment, comply with the guaranteed values, in particular those of maximum rating, the range of operating power supply voltage, and heat radiation characteristics. Otherwise, we will not be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of
incidence of break down and failure mode, possible to occur to semiconductor products. Measures
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2002 JUL