AD ADG706BRU

a
CMOS, +1.8 V to +5.5 V/ⴞ2.5 V, 2.5 ⍀
Low-Voltage, 8-/16-Channel Multiplexers
ADG706/ADG707
FEATURES
+1.8 V to +5.5 V Single Supply
ⴞ2.5 V Dual Supply
2.5 ⍀ ON Resistance
0.5 ⍀ ON Resistance Flatness
100 pA Leakage Currents
40 ns Switching Times
Single 16-to-1 Multiplexer ADG706
Differential 8-to-1 Multiplexer ADG707
28-Lead TSSOP Package
Low-Power Consumption
TTL/CMOS-Compatible Inputs
APPLICATIONS
Data Acquisition Systems
Communication Systems
Relay Replacement
Audio and Video Switching
Battery-Powered Systems
FUNCTIONAL BLOCK DIAGRAMS
ADG706
ADG707
S1
S1A
DA
S8A
D
S1B
DB
S16
S8B
1-OF-8
DECODER
1-OF-16
DECODER
A0 A1 A2 A3 EN
A0
A1
A2 EN
GENERAL DESCRIPTION
PRODUCT HIGHLIGHTS
The ADG706 and ADG707 are low-voltage, CMOS analog
multiplexers comprising 16 single channels and eight differential
channels, respectively. The ADG706 switches one of 16 inputs
(S1–S16) to a common output, D, as determined by the 4-bit
binary address lines A0, A1, A2, and A3. The ADG707 switches
one of eight differential inputs to a common differential output as
determined by the 3-bit binary address lines A0, A1, and A2.
An EN input on both devices is used to enable or disable the
device. When disabled, all channels are switched OFF.
1. Single-/dual-supply operation. The ADG706 and ADG707 are
fully specified and guaranteed with 3 V and 5 V single-supply
and ± 2.5 V dual-supply rails.
2. Low ON resistance (2.5 Ω typical)
3. Low-power consumption (<0.01 µW)
4. Guaranteed break-before-make switching action
5. Small 28-lead TSSOP package
Low-power consumption and operating supply range of 1.8 V to
5.5 V make the ADG706 and ADG707 ideal for battery-powered,
portable instruments. All channels exhibit break-before-make
switching action preventing momentary shorting when switching channels. These devices are also designed to operate from a
dual supply of ± 2.5 V.
These multiplexers are designed on an enhanced submicron process
that provides low-power dissipation yet gives high switching speed,
very low ON resistance, and leakage currents. ON resistance is in
the region of a few ohms and is closely matched between switches
and very flat over the full signal range. These parts can operate
equally well as either multiplexers or demultiplexers and have an
input signal range that extends to the supplies.
The ADG706 and ADG707 are available in small 28-lead TSSOP
packages.
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 2002
ADG706/ADG707–SPECIFICATIONS1 (V
Parameter
25ⴗC
ANALOG SWITCH
Analog Signal Range
ON Resistance (RON)
–40ⴗC
to +85ⴗC
0 V to VDD
2.5
4.5
ON Resistance Match Between
Channels (∆RON)
ON Resistance Flatness (RFLAT(ON))
5
0.3
0.8
0.5
1.2
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF)
Drain OFF Leakage ID (OFF)
ADG706
ADG707
Channel ON Leakage ID, IS (ON)
ADG706
ADG707
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
IINL or IINH
± 0.01
± 0.1
± 0.01
± 0.4
± 0.2
± 0.01
± 0.4
± 0.2
= 5 V ⴞ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.)
Unit
V
Ω typ
Ω max
Ω typ
Ω max
Ω typ
Ω max
Test Conditions/Comments
VS = 0 V to VDD, IDS = 10 mA;
Test Circuit 1
VS = 0 V to VDD, IDS = 10 mA
VS = 0 V to VDD, IDS = 10 mA
VDD = 5.5 V
VD = 4.5 V/1 V, VS = 1 V/4.5 V;
Test Circuit 2
VD = 4.5 V/1 V, VS = 1 V/4.5 V;
Test Circuit 3
± 1.5
±1
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
2.4
0.8
V min
V max
± 0.1
µA typ
µA max
pF typ
VIN = VINL or VINH
RL = 300 Ω, CL = 35 pF, Test Circuit 5;
VS1 = 3 V/0 V, VS16 = 0 V/3 V
RL = 300 Ω, CL = 35 pF;
VS = 3 V, Test Circuit 6
RL = 300 Ω, CL = 35 pF;
VS = 3 V, Test Circuit 7
RL = 300 Ω, CL = 35 pF;
VS = 3 V, Test Circuit 7
VS = 1 V, RS = 0 Ω, CL = 1 nF;
Test Circuit 8
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 9
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 10
± 0.3
± 1.5
±1
0.005
CIN, Digital Input Capacitance
DD
5
VD = VS = 1 V, or 4.5 V;
Test Circuit 4
2
DYNAMIC CHARACTERISTICS
tTRANSITION
40
Break-Before-Make Time Delay, tD
30
tON (EN)
32
tOFF (EN)
10
Charge Injection
±5
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
pC typ
OFF Isolation
–60
–80
dB typ
dB typ
Channel-to-Channel Crosstalk
–60
–80
dB typ
dB typ
25
36
13
MHz typ
MHz typ
pF typ
RL = 50 Ω, CL = 5 pF, Test Circuit 9
RL = 50 Ω, CL = 5 pF, Test Circuit 9
f = 1 MHz
180
90
pF typ
pF typ
f = 1 MHz
f = 1 MHz
200
100
pF typ
pF typ
f = 1 MHz
f = 1 MHz
0.001
µA typ
µA max
60
1
50
14
–3 dB Bandwidth
ADG706
ADG707
CS (OFF)
CD (OFF)
ADG706
ADG707
CD, CS (ON)
ADG706
ADG707
POWER REQUIREMENTS
IDD
1.0
VDD = 5.5 V
Digital Inputs = 0 V or 5.5 V
NOTES
1
Temperature range is –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–2–
REV. A
1
SPECIFICATIONS
ADG706/ADG707
(VDD = 3 V ⴞ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.)
Parameter
ANALOG SWITCH
Analog Signal Range
ON Resistance (RON)
25ⴗC
0 V to VDD
6
11
ON Resistance Match Between
Channels (∆RON)
ON Resistance Flatness (RFLAT(ON))
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF)
Drain OFF Leakage ID (OFF)
ADG706
ADG707
Channel ON Leakage ID, IS (ON)
ADG706
ADG707
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
IINL or IINH
–40ⴗC
to +85ⴗC
± 0.01
± 0.1
± 0.01
± 0.4
± 0.2
± 0.01
± 0.4
± 0.2
12
0.4
1.2
3
CIN, Digital Input Capacitance
5
45
V
Ω typ
Ω max
Ω typ
Ω max
Ω typ
Test Conditions/Comments
VS = 0 V to VDD, IDS = 10 mA;
Test Circuit 1
VS = 0 V to VDD, IDS = 10 mA
VS = 0 V to VDD, IDS = 10 mA
VDD = 3.3 V
VS = 3 V/1 V, VD = 1 V/3 V;
Test Circuit 2
VS = 3 V/1 V, VD = 1 V/3 V;
Test Circuit 3
± 1.5
±1
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
2.0
0.8
V min
V max
± 0.1
µA typ
µA max
pF typ
VIN = VINL or VINH
RL = 300 Ω, CL = 35 pF, Test Circuit 5
VS1 = 2 V/0 V, VS16 = 0 V/2 V
RL = 300 Ω, CL = 35 pF;
VS = 2 V, Test Circuit 6
RL = 300 Ω, CL = 35 pF;
VS = 2 V, Test Circuit 7
RL = 300 Ω, CL = 35 pF;
VS = 2 V, Test Circuit 7
VS = 1 V, RS = 0 Ω, CL = 1 nF;
Test Circuit 8
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 9
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 10
± 0.3
± 1.5
±1
0.005
DYNAMIC CHARACTERISTICS2
tTRANSITION
Unit
VS = VD = 1 V or 3 V;
Test Circuit 4
Break-Before-Make Time Delay, tD
30
tON (EN)
40
tOFF (EN)
20
Charge Injection
±5
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
pC typ
OFF Isolation
–60
–80
dB typ
dB typ
Channel-to-Channel Crosstalk
–60
–80
dB typ
dB typ
25
36
13
MHz typ
MHz typ
pF typ
RL = 50 Ω, CL = 5 pF, Test Circuit 9
RL = 50 Ω, CL = 5 pF, Test Circuit 9
f = 1 MHz
180
90
pF typ
pF typ
f = 1 MHz
f = 1 MHz
200
100
pF typ
pF typ
f = 1 MHz
f = 1 MHz
0.001
µA typ
µA max
75
1
70
28
–3 dB Bandwidth
ADG706
ADG707
CS (OFF)
CD (OFF)
ADG706
ADG707
CD, CS (ON)
ADG706
ADG707
POWER REQUIREMENTS
IDD
1.0
NOTES
1
Temperature range is –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. A
–3–
VDD = 3.3 V
Digital Inputs = 0 V or 3.3 V
ADG706/ADG707
DUAL SUPPLY1 (V = +2.5 V ⴞ10%, V
DD
Parameter
ANALOG SWITCH
Analog Signal Range
ON Resistance (RON)
ON Resistance Match Between
Channels (∆RON)
ON Resistance Flatness (RFLAT(ON))
SS
= –2.5 V ⴞ10%, GND = 0 V, unless otherwise noted.)
25ⴗC
–40ⴗC
to +85ⴗC
VSS to VDD
2.5
4.5
5
0.3
0.8
0.5
1.2
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF)
Drain OFF Leakage ID (OFF)
ADG706
ADG707
Channel ON Leakage ID, IS (ON)
ADG706
ADG707
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
IINL or IINH
CIN, Digital Input Capacitance
DYNAMIC CHARACTERISTICS2
tTRANSITION
± 0.01
± 0.1
± 0.01
± 0.4
± 0.2
± 0.01
± 0.4
± 0.2
0.005
Unit
V
Ω typ
Ω max
Ω typ
Ω max
Ω typ
Ω max
Test Conditions/Comments
VS = VSS to VDD, IDS = 10 mA;
Test Circuit 1
VS = VSS to VDD, IDS = 10 mA
VS = VSS to VDD, IDS = 10 mA
VDD = +2.75 V, VSS = –2.75 V
VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
Test Circuit 2
VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
Test Circuit 3
± 1.5
±1
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
1.7
0.7
V min
V max
± 0.1
µA typ
µA max
pF typ
VIN = VINL or VINH
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
pC typ
RL = 300 Ω, CL = 35 pF, Test Circuit 5
VS1 = 1.5 V/0 V, VS16 = 0 V/1.5 V
RL = 300 Ω, CL = 35 pF;
VS = 1.5 V, Test Circuit 6
RL = 300 Ω, CL = 35 pF;
VS = 1.5 V, Test Circuit 7
RL = 300 Ω, CL = 35 pF;
VS = 1.5 V, Test Circuit 7
VS = 0 V, RS = 0 Ω, CL = 1 nF;
Test Circuit 8
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 9
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 10
± 0.3
± 1.5
±1
5
40
60
VS = VD = +2.25 V/–1.25 V, Test Circuit 4
Break-Before-Make Time Delay, tD
15
tON (EN)
32
tOFF (EN)
16
Charge Injection
±8
OFF Isolation
–60
–80
dB typ
dB typ
Channel-to-Channel Crosstalk
–60
–80
dB typ
dB typ
25
36
13
MHz typ
MHz typ
pF typ
RL = 50 Ω, CL = 5 pF, Test Circuit 9
RL = 50 Ω, CL = 5 pF, Test Circuit 9
f = 1 MHz
180
90
pF typ
pF typ
f = 1 MHz
f = 1 MHz
200
100
pF typ
pF typ
f = 1 MHz
f = 1 MHz
µA typ
µA max
µA typ
µA max
VDD = +2.75 V
Digital Inputs = 0 V or 2.75 V
VSS = –2.75 V
Digital Inputs = 0 V or 2.75 V
1
50
–3 dB Bandwidth
ADG706
ADG707
CS (OFF)
CD (OFF)
ADG706
ADG707
CD, CS (ON)
ADG706
ADG707
POWER REQUIREMENTS
IDD
26
0.001
1.0
ISS
0.001
1.0
NOTES
1
Temperature range is –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–4–
REV. A
ADG706/ADG707
ABSOLUTE MAXIMUM RATINGS 1
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
TSSOP Package
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 97.9°C/W
θJC Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 14°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . . 300°C
IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . . . . 220°C
(TA = 25°C unless otherwise noted.)
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –3.5 V
Analog Inputs2 . . . . . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V or
30 mA, Whichever Occurs First
Digital Inputs2 . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V or
30 mA, Whichever Occurs First
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 30 mA
Operating Temperature Range
Industrial . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum
rating may be applied at any one time.
2
Overvoltages at A, EN, S, or D will be clamped by internal diodes. Current should
be limited to the maximum ratings given.
ORDERING GUIDE
Model
Temperature Range
Package Description
Package Option
ADG706BRU
ADG707BRU
–40°C to +85°C
–40°C to +85°C
Thin Shrink Small Outline Package (TSSOP)
Thin Shrink Small Outline Package (TSSOP)
RU-28
RU-28
PIN CONFIGURATIONS
DA
VDD 1
28
D
VDD 1
28
NC 2
27
VSS
DB 2
27
VSS
NC 3
26
S8
NC 3
26
S8A
S16 4
25
S7
S8B 4
25
S7A
S15 5
24
S6
S7B 5
24
S6A
S14 6
23
S5
S6B 6
23
S5A
ADG706
ADG707
TOP VIEW 22 S4
S12 8 (Not to Scale) 21 S3
S4A
TOP VIEW 22
S4B 8 (Not to Scale) 21 S3A
S11 9
20
S2
S3B 9
20
S2A
S10 10
19
S1
S2B 10
19
S1A
S9 11
18
EN
S1B 11
18
EN
GND 12
17
A0
GND 12
17
A0
NC 13
16
A1
NC 13
16
A1
A3 14
15
A2
NC 14
15
A2
S13 7
S5B 7
NC = NO CONNECT
NC = NO CONNECT
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the ADG706/ADG707 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
REV. A
–5–
WARNING!
ESD SENSITIVE DEVICE
ADG706/ADG707
Table I. ADG706 Truth Table
Table II. ADG707 Truth Table
A3
A2
A1
A0
EN
ON Switch
A2
A1
A0
EN
ON Switch Pair
X
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
X
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
X
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
X
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
NONE
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
X
0
0
0
0
1
1
1
1
X
0
0
1
1
0
0
1
1
X
0
1
0
1
0
1
0
1
0
1
1
1
1
1
1
1
1
NONE
1
2
3
4
5
6
7
8
X = Don’t Care
X = Don’t Care
TERMINOLOGY
VDD
Most positive power supply potential
CD (OFF)
VSS
Most negative power supply in a dual-supply
application. In single-supply applications, this
should be tied to ground at the device.
“OFF” Switch drain capacitance. Measured
with reference to ground.
CD, CS (ON)
“ON” Switch capacitance. Measured with
reference to ground.
IDD
Positive supply current
CIN
Digital input capacitance
ISS
Negative supply current
tTRANSITION
GND
Ground (0 V) reference
S
Source terminal. May be an input or output.
Delay time measured between the 50% and
90% points of the digital inputs and the switch
“ON” condition when switching from one
address state to another
D
Drain terminal. May be an input or output.
tON (EN)
AX
Logic control input
EN
Active high device enable
Delay time between the 50% and 90% points
of the EN digital input and the Switch “ON”
condition
VD (VS)
Analog voltage on terminals D, S
tOFF (EN)
RON
Ohmic resistance between D and S
Delay time between the 50% and 90% points
of the EN digital input and the Switch “OFF”
condition
∆RON
ON Resistance match between any two channels,
i.e., RONmax – RONmin
tOPEN
RFLAT(ON)
Flatness is defined as the difference between the
maximum and minimum value of ON resistance
as measured over the specified analog signal
range.
“OFF” Time measured between the 80% points
of both switches when switching from one
address state to another
Charge
Injection
Measure of the glitch impulse transferred from
the digital input to the analog output during
switching
IS (OFF)
Source leakage current with the Switch “OFF”
OFF Isolation
ID (OFF)
Drain leakage current with the Switch “OFF”
Measure of unwanted signal coupling through
an “OFF” switch
ID, IS (ON)
Channel leakage current with the Switch “ON”
Crosstalk
VINL
Maximum input voltage for Logic “0”
Measure of unwanted signal that is coupled
through from one channel to another as a result
of parasitic capacitance
VINH
Minimum input voltage for Logic “1”
Bandwidth
IINL(IINH)
Input current of the digital input
Frequency at which the output is attenuated
by 3 dB
CS (OFF)
“OFF” Switch Source Capacitance. Measured
with reference to ground.
ON Response
Frequency response of the “ON” Switch
Insertion
Loss
Loss due to the ON Resistance of
the switch
–6–
REV. A
Typical Performance Characteristics– ADG706/ADG707
8
7
ON RESISTANCE – ⍀
5
VDD = 3.3V
4
VDD = 4.5V
3
2
VDD = 5.5V
6
5
4
3
+85ⴗC
2
5
4
+25ⴗC
3
+85ⴗC
2
0
0
TPC 1. ON Resistance as a Function
of VD (VS) for Single Supply
0
ⴚ2.75 ⴚ2.00 ⴚ1.00
0
1.00
2.00 2.75
VD OR VS, DRAIN OR SOURCE VOLTAGE – V
0
1
2
3
4
5
VD OR VS, DRAIN OR SOURCE VOLTAGE – V
TPC 2. ON Resistance as a Function
of VD (VS) for Different Temperatures,
Single Supply
8
TPC 3. ON Resistance as a Function
of VD (VS) for Different Temperatures,
Dual Supply
0.3
8
TA = 25ⴗC
7
7
6
6
–40ⴗC
1
1
2
3
4
1
5
VD OR VS, DRAIN OR SOURCE VOLTAGE – V
VDD = 3V
VSS = 0V
VDD = 5V
VSS = 0V
TA = 25ⴗC
0.2
ON RESISTANCE – ⍀
ON RESISTANCE – ⍀
+25ⴗC
6
–40ⴗC
1
VDD = +2.5V
VSS = –2.5V
5
4
3
+85ⴗC
5
4
–40ⴗC
3
2
2
1
1
0
–2
ⴚ1
1
2
3
ⴚ3
0
VD OR VS, DRAIN OR SOURCE VOLTAGE – V
0
TPC 4. ON Resistance as a Function
of VD (VS) for Dual Supply
0.1
0
ⴚ0.1
TPC 5. ON Resistance as a Function
of VD (VS) for Different Temperatures,
Single Supply
ⴚ0.2
0
1
0.2
ID (OFF)
0.2
CURRENT – nA
0.1
0
ID, IS (ON)
–0.1
IS (OFF)
2
3
4
VD (VD = VDD – VS) – V
VDD
VDD = +2.5V
VSS = –2.5V
TA = 25ⴗC
VDD
ID (OFF)
0.1
A3
S1
A2
S16
50⍀
VS
ADG706*
A1
A0
0
D
EN**
–0.1
5
TPC 6. Leakage Currents as a Function
of VD (VS)
0.3
VDD = 3V
VSS = 0V
TA = 25ⴗC
ID (OFF)
ID, IS (ON)
IS (OFF)
+25ⴗC
1.0
1.5
2.0
2.5
3.0
0
0.5
VD OR VS , DRAIN OR SOURCE VOLTAGE – V
0.3
CURRENT – nA
VDD = +2.5V
VSS = –2.5V
7
CURRENT – nA
ON RESISTANCE – ⍀
VDD = 2.7V
6
VDD = 5V
VSS = 0V
ON RESISTANCE – ⍀
7
0
8
8
TA = 25ⴗC
VSS = GND
ID, IS (ON)
GND
IS (OFF)
VOUT
RL
50⍀
VSS
VSS
–0.2
–0.2
–0.3
0
2
3
4
1
VD (VD = VDD – VS) – V
5
TPC 7. Leakage Currents as a Function
of VD (VS)
REV. A
–0.3
–2.75 –2.00 –1.00
0
1.00 2.00
VD (VD = VDD – VS) – V
2.75
TPC 8. Leakage Currents as a Function
of VD (VS)
–7–
*SIMILAR CONNECTION FOR ADG707
**CONNECT TO 2.4V FOR BANDWIDTH MEASUREMENTS
OFF ISOLATION = 20LOG10(VOUT /VS)
VOUT WITH SWITCH
INSERTION LOSS = 20LOG10
(
VOUT WITHOUT SWITCH
)
TPC 9. Leakage Currents as a Function
of Temperature
ADG706/ADG707
0.8
0.5
VS = 1V/3V
TA = 25ⴗC
0.4
ID (OFF)
0.3
ADG706
–2
IS (OFF)
0.2
0.1
CURRENT – A
0.6
10m
1m
ATTENUATION – dB
CURRENT – nA
0
VDD = 3V
VSS = GND
VD = 3V/1V
0.7
ADG707
–4
10␮
VDD = +5V
1␮
–6
VDD = +3V
100n
–8
10n
0
ID, IS (ON)
15
25
35 45
55
65
TEMPERATURE – ⴗC
75
–10
10k
85
1n
10
100M
ⴚ20
10
ⴚ40
0
ⴚ60
–10
ⴚ80
–20
ⴚ100
–30
1M
10M
FREQUENCY ⴚ Hz
100M
TPC 13. OFF Isolation vs. Frequency
–40
–3
10k
100k
1k
FREQUENCY – Hz
1M
10M
0
VDD = +2.5V
VSS = –2.5V
VDD = 5V
VSS = GND
100k
100
TPC 12. Supply Currents vs. Input
Switching Frequency
20
VDD = 5V
TA = 25ⴗC
QINJ – pC
ATTENUATION – dB
10M
TPC 11. ON Response vs. Frequency
0
ⴚ120
30k
1M
FREQUENCY – Hz
TPC 10. Leakage Currents as a
Function of Temperature
ⴚ20
100k
ATTENUATION ⴚ dB
–0.1
5
VDD = +2.5V
VSS = –2.5V
100␮
VDD = 3V
VSS = GND
VDD = 5V
TA = 25ⴗC
ⴚ40
ⴚ60
ⴚ80
ⴚ100
–2
–1
0
1
2
VOLTAGE – V
3
TPC 14. Charge Injection vs.
Source Voltage
–8–
4
5
ⴚ120
30k
100k
1M
10M
FREQUENCY ⴚ Hz
100M
TPC 15. Crosstalk vs. Frequency
REV. A
ADG706/ADG707
TEST CIRCUITS
IDS
VDD
VSS
VDD
VSS
V1
S1
S
IDOFF
D
S2
D
A
VD
S16
VS
EN
VS
0.8V
GND
RON = V1/VDS
Test Circuit 1. ON Resistance
ISOFF
VDD
VSS
VDD
VSS
Test Circuit 3. ID (OFF)
S1
A
VSS
VDD
VSS
D
S1
D
S2
VS
VDD
VD
A
VD
S16
S16
0.8V
EN
IDON
EN
VS
2.4V
GND
GND
Test Circuit 4. ID (ON)
Test Circuit 2. IS (OFF)
VDD
VSS
VDD
VSS
3V
VIN
50⍀
ADDRESS
DRIVE (VIN)
VS1
S1
A3
D
A2
S1 THRU S15
A1
ADG706* S16
50%
0V
VS16
VS1
A0
VOUT
D
2.4V
50%
RL
300⍀
EN
GND
CL
35pF
90%
VOUT
90%
VS16
t TRANSITION
t TRANSITION
*SIMILAR CONNECTION FOR ADG707
Test Circuit 5. Switching Time of Multiplexer, tTRANSITION
VIN
50⍀
VDD
VSS
VDD
VSS
3V
A3
S1
A2
S1 THRU S15
A1
ADG706* S16
VS
ADDRESS
DRIVE (VIN)
D
0V
A0
EN
GND
VS
VOUT
D
2.4V
RL
300⍀
CL
35pF
VOUT
80%
t OPEN
*SIMILAR CONNECTION FOR ADG707
Test Circuit 6. Break-Before-Make Delay, tOPEN
REV. A
80%
–9–
ADG706/ADG707
VDD
VSS
VDD
VSS
3V
VS
S1
A3
ENABLE
DRIVE (VIN)
t OFF (EN)
ADG706*
A1
VO
D
EN
VOUT
RL
300⍀
GND
50⍀
0.9VO
0.9VO
A0
VIN
50%
0V
S2 THRU S16
A2
50%
OUTPUT
CL
35pF
0V
t ON(EN)
*SIMILAR CONNECTION FOR ADG707
Test Circuit 7. Enable Delay, tON (EN), tOFF (EN)
VDD
VSS
VDD
VSS
A3
3V
A2
LOGIC
INPUT (VIN)
ADG706*
A1
0V
A0
S
D
VOUT
RS
CL
1nF
EN
VS
VIN
VOUT
⌬VOUT
QINJ = CL ⴛ ⌬VOUT
GND
*SIMILAR CONNECTION FOR ADG707
Test Circuit 8. Charge Injection
VDD
VDD
VDD
S1
A3
A2
50⍀
S16
A1
50⍀
A0
EN**
GND
ADG706*
A0
D
D
S1
VOUT
RL
50⍀
VSS
50⍀
VS
VSS
(
VOUT WITHOUT SWITCH
VOUT
RL
50⍀
S2
S16
GND
*SIMILAR CONNECTION FOR ADG707
**CONNECT TO 2.4V FOR BANDWIDTH MEASUREMENTS
OFF ISOLATION = 20LOG10(VOUT /VS)
INSERTION LOSS = 20LOG10
VOUT WITH SWITCH
2.4V
EN
A2
VS
ADG706*
A1
VDD
A3
VSS
VSS
*SIMILAR CONNECTION FOR ADG707
CHANNEL-TO-CHANNEL CROSSTALK = 20LOG10(VOUT/VS )
)
Test Circuit 10. Channel-to-Channel Crosstalk
Test Circuit 9. OFF Isolation and Bandwidth
–10–
REV. A
ADG706/ADG707
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
28-Lead TSSOP
(RU-28)
0.386 (9.80)
0.378 (9.60)
28
15
0.177 (4.50)
0.169 (4.30)
0.256 (6.50)
0.246 (6.25)
1
14
PIN 1
0.006 (0.15)
0.002 (0.05)
SEATING
PLANE
REV. A
0.0433 (1.10)
MAX
0.0256 (0.65)
BSC
0.0118 (0.30)
0.0075 (0.19)
0.0079 (0.20)
0.0035 (0.090)
–11–
8ⴗ
0ⴗ
0.028 (0.70)
0.020 (0.50)
ADG706/ADG707
Revision History
Location
Page
5/02—Data Sheet changed from REV. 0 to REV. A.
Changes to SPECIFICATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Edits to ABSOLUTE MAXIMUM RATINGS notes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Edits to TPCs 2, 3, 4, 6–9, 12, 14 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7–8
PRINTED IN U.S.A.
Edits to Test Circuits 9 and 10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
C01001–0–5/02(A)
Edits to FEATURES and PRODUCT HIGHLIGHTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
–12–
REV. A