Freescale Semiconductor Technical Data Document Number: MW4IC2020N Rev. 9, 5/2006 RF LDMOS Wideband Integrated Power Amplifiers The MW4IC2020N wideband integrated circuit is designed with on - chip matching that makes it usable from 1600 to 2400 MHz. This multi - stage structure is rated for 26 to 28 Volt operation and covers all typical cellular base station modulation formats. Final Application • Typical Two - Tone Performance: VDD = 26 Volts, IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA, Pout = 20 Watts PEP, Full Frequency Band Power Gain — 29 dB IMD — - 32 dBc Drain Efficiency — 26% (at 1805 MHz) and 20% (at 1990 MHz) Driver Applications • Typical GSM EDGE Performance: VDD = 26 Volts, IDQ1 = 80 mA, IDQ2 = 230 mA, IDQ3 = 230 mA, Pout = 5 Watts Avg., Full Frequency Band Power Gain — 29 dB Spectral Regrowth @ 400 kHz Offset = - 66 dBc Spectral Regrowth @ 600 kHz Offset = - 77 dBc EVM — 1% rms • Typical CDMA Performance: VDD = 26 Volts, IDQ1 = 80 mA, IDQ2 = 240 mA, IDQ3 = 250 mA, Pout = 1 Watt Avg., Full Frequency Band, IS - 95 CDMA (Pilot, Sync, Paging, Traffic Codes 8 Through 13), Channel Bandwidth = 1.2288 MHz. PAR = 9.8 dB @ 0.01% Probability on CCDF. Power Gain — 30 dB ACPR @ 885 kHz Offset = - 61 dBc in 30 kHz Bandwidth ALT1 @ 1.25 MHz Offset = - 69 dBc in 12.5 kHz Bandwidth ALT2 @ 2.25 MHz Offset = - 59 dBc in 1 MHz Bandwidth • Capable of Handling 3:1 VSWR, @ 26 Vdc, 1990 MHz, 8 Watts CW Output Power • Stable into a 3:1 VSWR. All Spurs Below - 60 dBc @ 100 mW to 8 W CW Pout. • Characterized with Series Equivalent Large - Signal Impedance Parameters • On - Chip Matching (50 Ohm Input, DC Blocked, >5 Ohm Output) • Integrated Temperature Compensation with Enable/Disable Function • On - Chip Current Mirror gm Reference FET for Self Biasing Application (1) • Integrated ESD Protection • 200°C Capable Plastic Package • N Suffix Indicates Lead - Free Terminations. RoHS Compliant. • In Tape and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel VRD1 VRG1 VDS2 VDS1 3 Stages IC RFin VDS3/RFout VGS1 VGS2 VGS3 Quiescent Current Temperature Compensation Figure 1. Functional Block Diagram MW4IC2020NBR1 MW4IC2020GNBR1 1805- 1990 MHz, 20 W, 26 V GSM/GSM EDGE, CDMA RF LDMOS WIDEBAND INTEGRATED POWER AMPLIFIERS CASE 1329 - 09 TO - 272 WB - 16 PLASTIC MW4IC2020NBR1 CASE 1329A - 03 TO - 272 WB - 16 GULL PLASTIC MW4IC2020GNBR1 GND VDS2 VRD1 VRG1 VDS1 1 2 3 4 5 16 15 RFin 6 14 VDS3/ RFout VGS1 VGS2 VGS3 GND 7 8 9 10 11 13 12 GND GND (Top View) Note: Exposed backside flag is source terminal for transistors. Figure 2. Pin Connections 1. Refer to AN1987, Quiescent Current Control for the RF Integrated Circuit Device Family. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1987. © Freescale Semiconductor, Inc., 2006. All rights reserved. RF Device Data Freescale Semiconductor MW4IC2020NBR1 MW4IC2020GNBR1 1 Table 1. Maximum Ratings Rating Symbol Value Unit Drain- Source Voltage VDSS - 0.5, +65 Vdc Gate- Source Voltage VGS - 0.5, +15 Vdc Storage Temperature Range Tstg - 65 to +175 °C Operating Junction Temperature TJ 200 °C Input Power Pin 20 dBm Symbol Value (1) Unit Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case RθJC Stage 1 Stage 2 Stage 3 °C/W 10.5 5.1 2.3 Table 3. ESD Protection Characteristics Test Conditions Class Human Body Model 2 (Minimum) Machine Model M3 (Minimum) Charge Device Model C5 (Minimum) Table 4. Moisture Sensitivity Level Test Methodology Per JESD 22 - A113, IPC/JEDEC J - STD - 020 Rating Package Peak Temperature Unit 3 260 °C Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted) Characteristic Symbol Min Typ Max Unit Functional Tests (In Freescale Wideband 1805 - 1990 MHz Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA, Pout = 20 W PEP, f1 = 1990 MHz, f2 = 1990.1 MHz and f1 = 1805 MHz, f2 = 1805.1 MHz, Two - Tone CW Power Gain Gps Drain Efficiency f1 = 1805 MHz, f2 = 1805.1 MHz f1 = 1990 MHz, f2 = 1990.1 MHz ηD 27 29 24 18 26 20 — dB — % Input Return Loss IRL — — - 10 dB Intermodulation Distortion IMD — - 32 - 27 dBc Typical Performances (In Freescale Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA, 1805 MHz<Frequency<1990 MHz, 1 - Tone Saturated Pulsed Output Power (f = 1 kHz, Duty Cycle 10%) Psat — 33 — W Quiescent Current Accuracy over Temperature ( - 10 to 85°C) (2) ΔIQT — ±5 — % Gain Flatness in 30 MHz Bandwidth @ Pout = 1 W CW GF — 0.15 — dB Deviation from Linear Phase in 30 MHz Bandwidth @ Pout = 1 W CW 1805- 1880 MHz 1930- 1990 MHz Φ — — ° Delay — 1.8 — ns ΦΔ — ±10 — ° Delay @ Pout = 1 W CW Including Output Matching Part - to - Part Phase Variation @ Pout = 1 W CW ±0.5 ±0.2 1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. 2. Refer to AN1977, Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1977. (continued) MW4IC2020NBR1 MW4IC2020GNBR1 2 RF Device Data Freescale Semiconductor Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Typical CDMA Performances (In Modified CDMA Test Fixture, 50 ohm system) VDD = 26 Vdc, DQ1 = 80 mA, IDQ2 = 240 mA, IDQ3 = 250 mA, Pout = 1 W Avg., I1930 MHz<Frequency<1990 MHz, 1 - Tone, 9 Channel Forward Model (Pilot, Paging, Sync, Traffic Codes 8 through 13). Peak/Avg. Ratio 9.8 dB @ 0.01% Probability on CCDF. Power Gain Gps — 30 — dB Drain Efficiency ηD — 5 — % Adjacent Channel Power Ratio (±885 kHz in 30 kHz Bandwidth) ACPR — - 61 — dBc Alternate 1 Channel Power Ratio (±1.25 MHz in 12.5 kHz Bandwidth) ALT1 — - 69 — dBc Alternate 2 Channel Power Ratio (±2.25 MHz in 1 MHz Bandwidth) ALT2 — - 59 — dBc Typical GSM EDGE Performances (In Modified GSM EDGE Test Fixture, 50 ohm system) VDD = 26 Vdc, IDQ1 = 80 mA, IDQ2 = 230 mA, IDQ3 = 230 mA, Pout = 5 W Avg., 1805 MHz<Frequency<1990 MHz Power Gain Gps — 29 — dB Drain Efficiency ηD — 15 — % Error Vector Magnitude EVM — 1 — % rms Spectral Regrowth at 400 kHz Offset SR1 — - 66 — dBc Spectral Regrowth at 600 kHz Offset SR2 — - 77 — dBc MW4IC2020NBR1 MW4IC2020GNBR1 RF Device Data Freescale Semiconductor 3 VD3 VD2 + VD1 C2 1 2 3 NC 4 NC 5 C5 + C1 RF INPUT C6 DUT 16 C8 NC 15 Z2 Z1 + 14 C3 Z9 Z3 C9 Z4 Z5 Z6 C10 C11 C12 Z7 Z8 RF OUTPUT 6 C7 VG1 R1 VG2 R2 7 NC 8 9 10 11 Quiescent Current Temperature Compensation C13 C14 NC 13 12 C4 VG3 R3 Z1 Z2 Z3 Z4 Z5 1.820″ x 0.087″ Microstrip 0.245″ x 0.087″ Microstrip 0.345″ x 0.236″ Microstrip 0.327″ x 0.087″ Microstrip 0.271″ x 0.087″ Microstrip Z6 Z7 Z8 Z9 PCB 0.303″ x 0.087″ Microstrip 0.640″ x 0.087″ Microstrip 0.334″ x 0.087″ Microstrip 1.231″ x 0.043″ Microstrip Taconic TLX8 - 0300, 0.030″, εr = 2.55 Figure 3. MW4IC2020NBR1(GNBR1) Test Circuit Schematic Table 6. MW4IC2020NBR1(GNBR1) Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1, C2, C3 10 μF, 35 V Tantalum Capacitors TAJE226M035 AVX C4 220 nF Chip Capacitor (1206) 12065C224K28 AVX C5, C6, C8 6.8 pF 100B Chip Capacitors 100B6R8CW ATC C7 0.5 pF 100B Chip Capacitor 100B0R5BW ATC C9, C11 1.8 pF 100B Chip Capacitors 100B1R8BW ATC C10 2.2 pF 100B Chip Capacitor 100B2R2BW ATC C12 1 pF 100B Chip Capacitor 100B1R0BW ATC C13 0.3 pF 100B Chip Capacitor 100B0R3BW ATC C14 10 pF 100B Chip Capacitor 100B100GW ATC R1, R2, R3 1.8 kW Chip Resistors (1206) MW4IC2020NBR1 MW4IC2020GNBR1 4 RF Device Data Freescale Semiconductor C2 C3 VD2 MW4IC2020 Rev 1 VD1 C8 VD3 C5 C1 C6 C14 C7 C9 C10 C11 C12 C13 C4 VG1 R1 R2 VG2 GND R3 VG3 Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have no impact on form, fit or function of the current product. Figure 4. MW4IC2020NBR1(GNBR1) Test Circuit Component Layout MW4IC2020NBR1 MW4IC2020GNBR1 RF Device Data Freescale Semiconductor 5 32 0 Gps 30 28 −10 26 IRL 24 22 20 −5 −15 −20 ηD VDD = 26 Vdc, Pout = 20 W (PEP) IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA 100 kHz Tone Spacing −25 −30 IMD 18 −35 16 1800 1850 1900 IMD, INTERMODULATION DISTORTION (dBc) IRL, INPUT RETURN LOSS (dB) ηD, DRAIN EFFICIENCY (%), Gps, POWER GAIN (dB) TYPICAL CHARACTERISTICS −40 2000 1950 f, FREQUENCY (MHz) −10 VDD = 26 Vdc IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA f = 1840 MHz, 100 kHz Tone Spacing 3rd Order −30 5th Order −40 7th Order −50 −60 −70 −80 0.1 10 3rd Order 5th Order −40 7th Order −50 −60 −70 0.1 1 100 10 Pout, OUTPUT POWER (WATTS) PEP Pout, OUTPUT POWER (WATTS) PEP Figure 6. Intermodulation Distortion Products versus Output Power @ 1840 MHz Figure 7. Intermodulation Distortion Products versus Output Power @ 1960 MHz 36 35 31 30 TC = −30_C 29 24 18 ηD 25_C 27 18 TC = −30_C 12 25 6 15 0 10 100 25_C −30_C 31 12 25_C ηD 29 9 85_C 27 6 85_C 25 85_C 1 Gps 33 ηD, DRAIN EFFICIENCY (%) G ps , POWER GAIN (dB) VDD = 26 Vdc IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA f = 1960 MHz 23 0.1 VDD = 26 Vdc IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA f = 1960 MHz, 100 kHz Tone Spacing −30 100 Gps G ps , POWER GAIN (dB) −20 −80 1 35 33 −10 23 0.1 VDD = 26 Vdc, IDQ1 = 80 mA 3 IDQ2 = 240 mA, IDQ3 = 250 mA f = 1960 MHz, 1−Carrier N−CDMA 0 1 10 Pout, OUTPUT POWER (WATTS) CW Pout, OUTPUT POWER (WATTS) AVG. Figure 8. Power Gain and Drain Efficiency versus Output Power Figure 9. Power Gain and Drain Efficiency versus Output Power ηD, DRAIN EFFICIENCY (%) −20 IMD, INTERMODULATION DISTORTION (dBc) IMD, INTERMODULATION DISTORTION (dBc) Figure 5. Two - Tone Wideband Performance MW4IC2020NBR1 MW4IC2020GNBR1 6 RF Device Data Freescale Semiconductor 85_C VDD = 26 Vdc, IDQ1 = 80 mA IDQ2 = 240 mA, IDQ3 = 250 mA −50 f = 1960 MHz, Single−Carrier N−CDMA TC = 25_C −30_C −55 −30_C 25_C −60 85_C ACPR −65 ALT2 −30_C −70 ALT1 85_C −75 0.1 34 25_C 30 28 85_C 26 VDD = 26 Vdc Pout = 20 W (PEP) IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA 24 25_C 1 22 1800 10 1850 1900 2000 1950 Pout, OUTPUT POWER (WATTS) AVG. f, FREQUENCY (MHz) Figure 10. Alternate Channel Power Ratio, Alternate 1 and 2 Channel Power Ratio versus Output Power Figure 11. Power Gain versus Frequency 4 VDD = 26 Vdc 3.5 IDQ1 = 80 mA, IDQ2 = 230 mA, IDQ3 = 230 mA EDGE Modulation, f = 1840 MHz 3 TC = 85_C 25_C −30_C 2.5 2 1.5 1 0.5 0 4 3.5 VDD = 26 Vdc IDQ1 = 80 mA, IDQ2 = 230 mA, IDQ3 = 230 mA EDGE Modulation, f = 1960 MHz 3 TC = 85_C 25_C −30_C 2.5 2 1.5 1 0.5 0 0.1 1 100 10 1 0.1 10 100 Pout, OUTPUT POWER (WATTS) AVG. Pout, OUTPUT POWER (WATTS) AVG. Figure 12. EVM versus Output Power @ 1840 MHz Figure 13. EVM versus Output Power @ 1960 MHz −50 TC = 25_C −55 −60 85_C VDD = 26 Vdc IDQ1 = 80 mA, IDQ2 = 230 mA, IDQ3 = 230 mA EDGE Modulation, f = 1840 MHz −65 −30_C 85_C SR 400 kHz 25_C −70 −30_C −75 SR 600 kHz −80 −85 0.1 1 10 100 SPECTRAL REGROWTH @ 400 kHz AND 600 kHz (dBc) SPECTRAL REGROWTH @ 400 kHz AND 600 kHz (dBc) TC = −30_C 32 G ps , POWER GAIN (dB) −45 EVM, ERROR VECTOR MAGNITUDE (% rms) EVM, ERROR VECTOR MAGNITUDE (% rms) ACPR, ADJACENT CHANNEL POWER RATIO (dBc) ALT 1 & 2, ALTERNATE 1 & 2 CHANNEL POWER RATIO (dB TYPICAL CHARACTERISTICS −50 VDD = 26 Vdc −55 IDQ1 = 80 mA, IDQ2 = 230 mA, IDQ3 = 230 mA EDGE Modulation, f = 1960 MHz −60 −30_C TC = 25_C −65 85_C SR 400 kHz −70 85_C 25_C −75 −30_C SR 600 kHz −80 −85 0.1 1 10 100 Pout, OUTPUT POWER (WATTS) AVG. Pout, OUTPUT POWER (WATTS) AVG. Figure 14. Spectral Regrowth at 400 and 600 kHz versus Output Power @ 1840 MHz Figure 15. Spectral Regrowth at 400 and 600 kHz versus Output Power @ 1960 MHz MW4IC2020NBR1 MW4IC2020GNBR1 RF Device Data Freescale Semiconductor 7 TYPICAL CHARACTERISTICS MTTF FACTOR (HOURS X AMPS 2 ) 1.E+09 1.E+08 3rd Stage 2nd Stage 1.E+07 1st Stage 1.E+06 1.E+05 1.E+04 90 100 110 120 130 140 150 160 170 180 190 TJ, JUNCTION TEMPERATURE (°C) This above graph displays calculated MTTF in hours x ampere2 drain current. Life tests at elevated temperatures have correlated to better than ±10% of the theoretical prediction for metal failure. Divide MTTF factor by ID2 for MTTF in a particular application. Figure 16. MTTF Factor versus Junction Temperature MW4IC2020NBR1 MW4IC2020GNBR1 8 RF Device Data Freescale Semiconductor f = 1805 MHz f = 1990 MHz f = 1805 MHz f = 1990 MHz Zload Zin Zo = 50 Ω VDD = 26 V, IDQ1 = 80 mA, IDQ2 = 200 mA, IDQ3 = 300 mA, Pout = 20 W PEP Zin f MHz Zin Ω Zload Ω 1805 40.00 + j6.50 8.75 - j1.42 1842 40.00 + j2.00 7.00 - j2.70 1880 40.00 - j1.50 5.90 - j2.97 1930 40.00 - j1.80 5.46 - j3.20 1960 40.00 - j2.10 4.30 - j3.35 1990 40.00 - j2.60 4.45 - j3.30 = Device input impedance as measured from gate to ground. Zload = Test circuit impedance as measured from drain to ground. Output Matching Network Device Under Test Z in Z load Figure 17. Series Equivalent Input and Load Impedance MW4IC2020NBR1 MW4IC2020GNBR1 RF Device Data Freescale Semiconductor 9 PACKAGE DIMENSIONS MW4IC2020NBR1 MW4IC2020GNBR1 10 RF Device Data Freescale Semiconductor MW4IC2020NBR1 MW4IC2020GNBR1 RF Device Data Freescale Semiconductor 11 MW4IC2020NBR1 MW4IC2020GNBR1 12 RF Device Data Freescale Semiconductor MW4IC2020NBR1 MW4IC2020GNBR1 RF Device Data Freescale Semiconductor 13 MW4IC2020NBR1 MW4IC2020GNBR1 14 RF Device Data Freescale Semiconductor MW4IC2020NBR1 MW4IC2020GNBR1 RF Device Data Freescale Semiconductor 15 How to Reach Us: Home Page: www.freescale.com E - mail: [email protected] USA/Europe or Locations Not Listed: Freescale Semiconductor Technical Information Center, CH370 1300 N. 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Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © Freescale Semiconductor, Inc. 2006. All rights reserved. RoHS- compliant and/or Pb - free versions of Freescale products have the functionality and electrical characteristics of their non - RoHS- compliant and/or non - Pb- free counterparts. For further information, see http://www.freescale.com or contact your Freescale sales representative. For information on Freescale’s Environmental Products program, go to http://www.freescale.com/epp. MW4IC2020NBR1 MW4IC2020GNBR1 Document Number: MW4IC2020N Rev. 9, 5/2006 16 RF Device Data Freescale Semiconductor