RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1014MW Quad Precision Operational Amplifier for Linear Technology Customer: Linear Technology, PO# 5555F RAD Job Number: 09-298 Part Type Tested: Linear Technology RH1014MW Quad Precision Operational Amplifier Commercial Part Number: RH1014MW Traceability Information: Lot Date Code: 0834A, Fab # W10722836.1 Wafer 8, Assy Lot #463812.1. Information obtained from Linear Technology PO#5555F Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation (all pins tied to ground) and 2 control units. Serial numbers 1115-1119 were biased during irradiation, serial numbers 1120-1124 were unbiased during irradiation (all pins tied to ground) and serial numbers 1125 and 1126 were used as controls. External Traveler: None required Pre-Irradiation Burn-In: Burn-In performed by Linear Devices prior to receipt by RAD. TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 20, 50, 100, and 200krad(Si). TID Overtest and Post-Irradiation Anneal: No overtest or anneal. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Test Hardware and Software: LTS2020 Tester, 2101 Family Board, 0600 Fixture and RH1014 DUT Board (BGSS-970312B) and RH1014L3.SRC test program. Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: Room temperature for irradiation and test controlled to 24°C±6°C per MILSTD-883. RLAT Result: PASSED. Units passed to 200krad(Si) with all parameters remaining within specification including after application of 90/90 KTL statistics. An ISO 9001:2000 Certified Company 1 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2000 Certified Company 2 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2000 Certified Company 3 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH1014 quad operational amplifiers described in this final report were irradiated using a split 15V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix A for the full bias circuits. These bias circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias.” The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 20, 50, 100 and 200krad(Si) for all electrical tests using the ±15V supply and with incremental readings at 20, 50 and 100krad(Si) for all electrical tests using the +5V and 0V supply conditions (See LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet Page 3, Note 2). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum enclosure was determined based on TLD dosimetry measurements (see previous section). The final dose rate for this work was 62.5rad(Si)/s with a precision of ±5%. An ISO 9001:2000 Certified Company 4 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the radiation lot acceptance testing the pre- and post-irradiation electrical parameters measured were: ±15V Tests 1. Positive Supply Current (ICC+) 2. Negative Supply Current (IEE-) 3. Input Offset Voltage (VOS1-VOS4) 4. Input Offset Current (IOS1-IOS4) 5. + Input Bias Current (IB+1-IB+4) 6. - Input Bias Current (IB-1-IB-4) 7. Common Mode Rejection Ratio (CMRR1-CMRR4) 8. Power Supply Rejection Ratio (PSRR1-PSRR4) 9. Large Signal Voltage Gain (AVOL9-AVOL12) 10. Positive Output Voltage Swing (VOUT+1-VOUT+4) 11. Negative Output Voltage Swing (VOUT-1-VOUT-4) 12. Positive Slew Rate (SlewRate+1-SlewRate+4) 13. Negative Slew Rate (SlewRate-1-SlewRate-4) +5V Tests 14. Positive Supply Current (ICC+2) 15. Negative Supply Current (IEE-2) 16. Input Offset Voltage (VOS5-VOS8) 17. Input Offset Current (IOS5-IOS8) 18. + Input Bias Current (IB+5-IB+8) 19. -Input Bias Current (IB-5-IB-8) 20. Positive Output Voltage Swing (VOUT+5-VOUT+8) 21. Positive Output Voltage Swing (VOUT+9-VOUT+12) 22. Output Voltage Low (VOUT-5-VOUT-8) 23. Output Voltage Low (VOUT-9-VOUT-12) 24. Output Voltage Low (VOUT-13-VOUT-16) The parametric data was obtained as read and record and all the raw data plus an attributes summary are contained in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. Note that the following criteria must be met for a device to pass the RLAT: following the radiation exposure each of the 5 pieces shall pass the specification value and the average value for the ten-piece sample must pass the specification value An ISO 9001:2000 Certified Company 5 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 when the KTL limits are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot could be logged as a failure. 5.0. Total Ionizing Dose Test Results The RH1014 operational amplifiers passed the RLAT to the maximum tested level of 200krad(Si) (for the ±15V supply conditions) and 100krad(Si) (for the +5V and 0V supply conditions) with all measured parameters remaining within specification, including after application of the KTL statistics. Input offset voltage, open loop gain (AVOL), input bias current, slew rate and select output voltage low suffered from some measure of radiation-induced degradation, however, as noted above, it was not sufficient to cause any of the parameters to go out of specification even after application of the KTL statistics. Figures 5.1 and 5.83 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.83 show the corresponding raw data for each of these parameters. Appendix D lists all the figures in this section. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. The control units, as expected, show no significant changes throughout the test. An ISO 9001:2000 Certified Company 6 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Supply Current @ +/-15V (A) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.1. Plot of Positive Supply Current @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 7 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.1. Raw data for Positive Supply Current @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Supply Current @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 1.48E-03 1.53E-03 1.49E-03 1.51E-03 1.52E-03 1.49E-03 1.48E-03 1.55E-03 1.52E-03 1.51E-03 1.49E-03 1.55E-03 20 1.52E-03 1.55E-03 1.52E-03 1.53E-03 1.54E-03 1.52E-03 1.52E-03 1.58E-03 1.54E-03 1.54E-03 1.50E-03 1.57E-03 50 1.46E-03 1.51E-03 1.48E-03 1.48E-03 1.48E-03 1.47E-03 1.46E-03 1.52E-03 1.48E-03 1.48E-03 1.50E-03 1.57E-03 100 1.33E-03 1.39E-03 1.37E-03 1.37E-03 1.35E-03 1.35E-03 1.33E-03 1.38E-03 1.36E-03 1.36E-03 1.50E-03 1.56E-03 200 1.09E-03 1.18E-03 1.16E-03 1.16E-03 1.12E-03 1.10E-03 1.08E-03 1.13E-03 1.13E-03 1.11E-03 1.48E-03 1.55E-03 1.51E-03 2.00E-05 1.56E-03 1.45E-03 1.53E-03 1.43E-05 1.57E-03 1.49E-03 1.48E-03 1.64E-05 1.53E-03 1.44E-03 1.36E-03 2.52E-05 1.43E-03 1.29E-03 1.14E-03 3.72E-05 1.24E-03 1.04E-03 1.51E-03 2.68E-05 1.58E-03 1.44E-03 2.20E-03 PASS 1.54E-03 2.68E-05 1.61E-03 1.47E-03 2.20E-03 PASS 1.48E-03 2.19E-05 1.54E-03 1.42E-03 2.20E-03 PASS 1.36E-03 1.86E-05 1.41E-03 1.30E-03 2.20E-03 PASS 1.11E-03 2.08E-05 1.17E-03 1.05E-03 2.20E-03 PASS An ISO 9001:2000 Certified Company 8 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Supply Current @ +/-15V (A) 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 -2.00E-03 -2.50E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.2. Plot of Negative Supply Current @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 9 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.2. Raw data for Negative Supply Current @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Supply Current @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 -1.49E-03 -1.53E-03 -1.49E-03 -1.51E-03 -1.52E-03 -1.50E-03 -1.48E-03 -1.54E-03 -1.52E-03 -1.51E-03 -1.49E-03 -1.56E-03 20 -1.52E-03 -1.55E-03 -1.52E-03 -1.53E-03 -1.54E-03 -1.53E-03 -1.52E-03 -1.59E-03 -1.54E-03 -1.54E-03 -1.50E-03 -1.56E-03 50 -1.47E-03 -1.50E-03 -1.48E-03 -1.48E-03 -1.48E-03 -1.47E-03 -1.46E-03 -1.52E-03 -1.48E-03 -1.48E-03 -1.50E-03 -1.57E-03 100 -1.33E-03 -1.39E-03 -1.37E-03 -1.37E-03 -1.35E-03 -1.35E-03 -1.33E-03 -1.39E-03 -1.36E-03 -1.36E-03 -1.50E-03 -1.56E-03 200 -1.09E-03 -1.18E-03 -1.17E-03 -1.16E-03 -1.13E-03 -1.09E-03 -1.09E-03 -1.14E-03 -1.13E-03 -1.11E-03 -1.49E-03 -1.56E-03 -1.51E-03 2.10E-05 -1.45E-03 -1.57E-03 -1.53E-03 1.25E-05 -1.50E-03 -1.57E-03 -1.48E-03 1.33E-05 -1.45E-03 -1.52E-03 -1.36E-03 2.51E-05 -1.29E-03 -1.43E-03 -1.14E-03 3.50E-05 -1.05E-03 -1.24E-03 -1.51E-03 2.52E-05 -1.44E-03 -1.58E-03 -2.20E-03 PASS -1.54E-03 2.72E-05 -1.47E-03 -1.62E-03 -2.20E-03 PASS -1.48E-03 2.33E-05 -1.42E-03 -1.55E-03 -2.20E-03 PASS -1.36E-03 1.94E-05 -1.30E-03 -1.41E-03 -2.20E-03 PASS -1.11E-03 2.39E-05 -1.05E-03 -1.18E-03 -2.20E-03 PASS An ISO 9001:2000 Certified Company 10 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 1 @ +/-15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.3. Plot of Offset Voltage 1 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 11 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.3. Raw data for Offset Voltage 1 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 1 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Total Dose (krad(Si)) 0 -1.67E-05 5.00E-05 1.78E-05 -2.40E-05 3.50E-05 -7.85E-06 7.97E-06 7.96E-05 2.78E-05 -4.58E-05 2.33E-05 1.79E-05 Biased Statistics Average Biased 1.24E-05 Std Dev Biased 3.21E-05 Ps90%/90% (+KTL) Biased 1.00E-04 Ps90%/90% (-KTL) Biased -7.56E-05 Un-Biased Statistics Average Un-Biased 1.23E-05 Std Dev Un-Biased 4.63E-05 Ps90%/90% (+KTL) Un-Biased 1.39E-04 Ps90%/90% (-KTL) Un-Biased -1.15E-04 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 20 -2.11E-05 6.14E-05 2.44E-05 -1.03E-05 4.55E-05 -1.68E-06 -2.77E-06 7.53E-05 4.43E-05 -3.73E-05 2.62E-05 2.14E-05 50 -1.17E-05 8.75E-05 5.48E-05 1.74E-05 6.46E-05 2.01E-05 1.91E-05 1.13E-04 7.37E-05 -1.56E-06 2.62E-05 2.07E-05 100 1.83E-05 1.37E-04 9.49E-05 5.52E-05 9.35E-05 6.62E-05 6.12E-05 1.63E-04 1.37E-04 5.30E-05 2.63E-05 2.09E-05 200 7.14E-05 2.33E-04 1.72E-04 1.28E-04 1.46E-04 1.52E-04 1.45E-04 2.66E-04 2.57E-04 1.64E-04 2.65E-05 2.08E-05 2.00E-05 3.53E-05 1.17E-04 -7.68E-05 4.25E-05 3.95E-05 1.51E-04 -6.57E-05 7.98E-05 4.50E-05 2.03E-04 -4.35E-05 1.50E-04 5.93E-05 3.13E-04 -1.27E-05 1.56E-05 4.42E-05 1.37E-04 -1.06E-04 -4.50E-04 PASS 4.50E-04 PASS 4.49E-05 4.72E-05 1.74E-04 -8.46E-05 -6.00E-04 PASS 6.00E-04 PASS 9.60E-05 5.02E-05 2.34E-04 -4.16E-05 -7.50E-04 PASS 7.50E-04 PASS 1.97E-04 5.96E-05 3.60E-04 3.36E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 12 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 2 @ +/-15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.4. Plot of Offset Voltage 2 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 13 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.4. Raw data for Offset Voltage 2 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 2 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Total Dose (krad(Si)) 0 2.42E-05 -2.81E-05 -4.57E-05 -6.64E-06 3.58E-05 -8.69E-06 -6.38E-05 5.63E-05 -1.96E-05 -2.89E-05 9.67E-06 -7.97E-06 Biased Statistics Average Biased -4.10E-06 Std Dev Biased 3.43E-05 Ps90%/90% (+KTL) Biased 8.99E-05 Ps90%/90% (-KTL) Biased -9.81E-05 Un-Biased Statistics Average Un-Biased -1.29E-05 Std Dev Un-Biased 4.38E-05 Ps90%/90% (+KTL) Un-Biased 1.07E-04 Ps90%/90% (-KTL) Un-Biased -1.33E-04 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 20 4.84E-06 -2.43E-05 -4.26E-05 -1.45E-05 2.76E-05 2.91E-06 -6.33E-05 6.25E-05 1.30E-07 -2.87E-05 7.74E-06 -9.77E-06 50 2.65E-05 8.34E-06 -2.69E-05 1.67E-05 4.37E-05 2.04E-05 -4.83E-05 8.41E-05 2.53E-05 -8.68E-06 9.19E-06 -1.04E-05 100 5.36E-05 6.17E-05 -3.73E-06 5.76E-05 6.58E-05 7.86E-05 -1.52E-05 1.40E-04 7.33E-05 3.58E-05 7.98E-06 -9.65E-06 200 1.25E-04 1.61E-04 4.36E-05 1.47E-04 1.13E-04 1.75E-04 6.39E-05 2.46E-04 1.61E-04 1.19E-04 8.70E-06 -8.81E-06 -9.79E-06 2.70E-05 6.43E-05 -8.38E-05 1.37E-05 2.62E-05 8.56E-05 -5.83E-05 4.70E-05 2.87E-05 1.26E-04 -3.18E-05 1.18E-04 4.55E-05 2.42E-04 -6.97E-06 -5.30E-06 4.64E-05 1.22E-04 -1.32E-04 -4.50E-04 PASS 4.50E-04 PASS 1.46E-05 4.87E-05 1.48E-04 -1.19E-04 -6.00E-04 PASS 6.00E-04 PASS 6.24E-05 5.72E-05 2.19E-04 -9.45E-05 -7.50E-04 PASS 7.50E-04 PASS 1.53E-04 6.77E-05 3.38E-04 -3.26E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 14 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 3 @ +/-15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.5. Plot of Offset Voltage 3 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 15 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.5. Raw data for Offset Voltage 3 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 3 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Total Dose (krad(Si)) 0 2.48E-05 6.32E-05 2.13E-05 3.03E-05 9.14E-05 -3.62E-06 -1.99E-05 2.67E-05 1.38E-05 -1.26E-05 1.53E-05 -2.81E-05 Biased Statistics Average Biased 4.62E-05 Std Dev Biased 3.03E-05 Ps90%/90% (+KTL) Biased 1.29E-04 Ps90%/90% (-KTL) Biased -3.68E-05 Un-Biased Statistics Average Un-Biased 8.72E-07 Std Dev Un-Biased 1.91E-05 Ps90%/90% (+KTL) Un-Biased 5.34E-05 Ps90%/90% (-KTL) Un-Biased -5.16E-05 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 20 3.06E-05 8.23E-05 3.35E-05 4.68E-05 8.88E-05 8.46E-06 -1.52E-05 2.86E-05 2.25E-05 -1.16E-05 1.97E-05 -2.50E-05 50 5.24E-05 1.03E-04 5.88E-05 8.19E-05 1.08E-04 3.31E-05 5.32E-06 6.31E-05 4.58E-05 6.29E-06 1.50E-05 -2.57E-05 100 8.58E-05 1.49E-04 9.34E-05 1.29E-04 1.33E-04 8.04E-05 4.18E-05 1.14E-04 8.70E-05 4.13E-05 1.63E-05 -2.46E-05 200 1.44E-04 2.37E-04 1.61E-04 2.25E-04 1.97E-04 1.85E-04 1.28E-04 2.20E-04 1.87E-04 1.16E-04 1.67E-05 -2.70E-05 5.64E-05 2.74E-05 1.32E-04 -1.88E-05 8.08E-05 2.51E-05 1.50E-04 1.21E-05 1.18E-04 2.70E-05 1.92E-04 4.38E-05 1.93E-04 3.99E-05 3.02E-04 8.32E-05 6.55E-06 1.97E-05 6.05E-05 -4.74E-05 -4.50E-04 PASS 4.50E-04 PASS 3.07E-05 2.51E-05 9.95E-05 -3.81E-05 -6.00E-04 PASS 6.00E-04 PASS 7.30E-05 3.13E-05 1.59E-04 -1.30E-05 -7.50E-04 PASS 7.50E-04 PASS 1.67E-04 4.35E-05 2.87E-04 4.79E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 16 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 4 @ +/-15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.6. Plot of Offset Voltage 4 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 17 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.6. Raw data for Offset Voltage 4 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 4 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Total Dose (krad(Si)) 0 2.01E-05 -1.44E-05 8.58E-06 -5.18E-05 -1.04E-05 9.54E-06 -1.80E-05 -1.15E-04 -3.72E-05 6.62E-05 4.42E-05 2.56E-05 Biased Statistics Average Biased -9.59E-06 Std Dev Biased 2.75E-05 Ps90%/90% (+KTL) Biased 6.57E-05 Ps90%/90% (-KTL) Biased -8.49E-05 Un-Biased Statistics Average Un-Biased -1.90E-05 Std Dev Un-Biased 6.65E-05 Ps90%/90% (+KTL) Un-Biased 1.63E-04 Ps90%/90% (-KTL) Un-Biased -2.01E-04 Specification MIN -3.00E-04 Status PASS Specification MAX 3.00E-04 Status PASS 20 2.02E-05 -3.85E-06 1.81E-05 -4.89E-05 -1.42E-05 2.14E-05 -2.06E-05 -1.12E-04 -2.29E-05 7.74E-05 4.29E-05 2.49E-05 50 3.64E-05 1.93E-05 4.02E-05 -2.25E-05 5.45E-06 4.71E-05 -3.50E-07 -8.41E-05 1.03E-05 1.08E-04 4.69E-05 2.37E-05 100 6.31E-05 6.00E-05 8.01E-05 2.47E-05 3.29E-05 9.97E-05 5.09E-05 -2.11E-05 7.14E-05 1.66E-04 4.59E-05 2.32E-05 200 1.20E-04 1.41E-04 1.40E-04 1.04E-04 7.57E-05 2.00E-04 1.37E-04 8.26E-05 1.89E-04 2.79E-04 4.52E-05 2.72E-05 -5.74E-06 2.82E-05 7.16E-05 -8.31E-05 1.58E-05 2.55E-05 8.57E-05 -5.42E-05 5.21E-05 2.29E-05 1.15E-04 -1.05E-05 1.16E-04 2.72E-05 1.91E-04 4.13E-05 -1.14E-05 6.96E-05 1.79E-04 -2.02E-04 -4.50E-04 PASS 4.50E-04 PASS 1.61E-05 7.01E-05 2.08E-04 -1.76E-04 -6.00E-04 PASS 6.00E-04 PASS 7.34E-05 6.85E-05 2.61E-04 -1.14E-04 -7.50E-04 PASS 7.50E-04 PASS 1.78E-04 7.35E-05 3.79E-04 -2.41E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 18 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Offset Current 1 @ +/-15V (A) 3.00E-08 2.00E-08 1.00E-08 0.00E+00 -1.00E-08 -2.00E-08 -3.00E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.7. Plot of Offset Current 1 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 19 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.7. Raw data for Offset Current 1 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 1 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -1.04E-10 -4.10E-11 -7.00E-12 1.31E-10 1.40E-11 8.00E-12 -1.20E-11 2.00E-11 6.20E-11 -4.90E-11 -7.90E-11 -1.42E-10 20 -7.50E-11 -1.50E-11 7.80E-11 1.54E-10 5.30E-11 4.60E-11 -7.20E-11 2.50E-11 1.47E-10 -4.60E-11 -8.00E-11 -1.81E-10 50 3.59E-10 -7.90E-11 9.10E-11 1.25E-10 1.31E-10 1.79E-10 1.26E-10 7.20E-11 1.72E-10 -1.37E-10 -4.50E-11 -2.13E-10 100 4.30E-10 1.99E-10 3.33E-10 4.33E-10 4.58E-10 5.78E-10 7.79E-10 3.62E-10 6.54E-10 6.10E-11 -2.90E-11 -2.10E-10 200 1.38E-09 6.47E-10 9.32E-10 5.57E-10 1.41E-09 1.67E-09 2.08E-09 9.05E-10 1.29E-09 8.65E-10 -4.00E-11 -1.64E-10 -1.40E-12 8.64E-11 2.36E-10 -2.38E-10 3.90E-11 8.78E-11 2.80E-10 -2.02E-10 1.25E-10 1.56E-10 5.54E-10 -3.03E-10 3.71E-10 1.07E-10 6.64E-10 7.68E-11 9.84E-10 3.97E-10 2.07E-09 -1.05E-10 5.80E-12 4.09E-11 1.18E-10 -1.06E-10 -1.00E-08 PASS 1.00E-08 PASS 2.00E-11 8.61E-11 2.56E-10 -2.16E-10 -1.00E-08 PASS 1.00E-08 PASS 8.24E-11 1.30E-10 4.39E-10 -2.74E-10 -1.50E-08 PASS 1.50E-08 PASS 4.87E-10 2.82E-10 1.26E-09 -2.87E-10 -2.00E-08 PASS 2.00E-08 PASS 1.36E-09 5.17E-10 2.78E-09 -5.74E-11 -2.50E-08 PASS 2.50E-08 PASS An ISO 9001:2000 Certified Company 20 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Offset Current 2 @ +/-15V (A) 3.00E-08 2.00E-08 1.00E-08 0.00E+00 -1.00E-08 -2.00E-08 -3.00E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.8. Plot of Offset Current 2 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 21 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.8. Raw data for Offset Current 2 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 2 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -6.40E-11 -5.40E-11 1.21E-10 -4.20E-11 -7.90E-11 -9.20E-11 -1.40E-11 5.40E-11 -4.50E-11 -8.70E-11 7.90E-11 -1.70E-11 20 5.10E-11 4.00E-12 2.03E-10 -1.00E-11 4.10E-11 -1.59E-10 -7.20E-11 4.00E-11 5.30E-11 -3.90E-11 9.60E-11 -3.60E-11 50 2.98E-10 1.63E-10 2.23E-10 1.74E-10 3.25E-10 1.04E-10 2.90E-11 1.30E-11 1.29E-10 1.43E-10 4.90E-11 -2.70E-11 100 7.19E-10 -4.40E-11 6.16E-10 5.93E-10 7.29E-10 2.50E-10 5.02E-10 3.91E-10 5.80E-10 5.42E-10 8.30E-11 -1.50E-11 200 1.74E-09 5.73E-10 1.41E-09 1.07E-09 1.72E-09 1.58E-09 1.73E-09 8.96E-10 2.18E-09 2.35E-09 6.70E-11 -1.20E-11 -2.36E-11 8.20E-11 2.01E-10 -2.48E-10 5.78E-11 8.50E-11 2.91E-10 -1.75E-10 2.37E-10 7.26E-11 4.36E-10 3.74E-11 5.23E-10 3.22E-10 1.41E-09 -3.62E-10 1.30E-09 4.91E-10 2.65E-09 -4.50E-11 -3.68E-11 6.00E-11 1.28E-10 -2.01E-10 -1.00E-08 PASS 1.00E-08 PASS -3.54E-11 8.68E-11 2.03E-10 -2.73E-10 -1.00E-08 PASS 1.00E-08 PASS 8.36E-11 5.91E-11 2.46E-10 -7.85E-11 -1.50E-08 PASS 1.50E-08 PASS 4.53E-10 1.34E-10 8.20E-10 8.64E-11 -2.00E-08 PASS 2.00E-08 PASS 1.75E-09 5.70E-10 3.31E-09 1.84E-10 -2.50E-08 PASS 2.50E-08 PASS An ISO 9001:2000 Certified Company 22 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Offset Current 3 @ +/-15V (A) 3.00E-08 2.00E-08 1.00E-08 0.00E+00 -1.00E-08 -2.00E-08 -3.00E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.9. Plot of Offset Current 3 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 23 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.9. Raw data for Offset Current 3 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 3 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -6.30E-11 -2.30E-11 1.30E-11 2.70E-11 -6.00E-12 -4.50E-11 9.90E-11 1.80E-11 4.30E-11 2.80E-11 1.21E-10 -1.37E-10 20 3.40E-11 -4.10E-11 -1.08E-10 1.17E-10 -4.90E-11 1.02E-10 2.13E-10 4.40E-11 2.23E-10 7.80E-11 9.30E-11 -1.08E-10 50 3.43E-10 1.10E-10 1.59E-10 1.88E-10 1.00E-11 2.27E-10 3.48E-10 -5.30E-11 2.09E-10 2.01E-10 5.80E-11 -8.70E-11 100 5.85E-10 4.11E-10 5.39E-10 4.63E-10 3.25E-10 4.39E-10 6.20E-10 8.80E-11 5.47E-10 8.37E-10 8.20E-11 -5.20E-11 200 1.46E-09 6.81E-10 1.22E-09 9.69E-10 1.30E-09 1.63E-09 1.96E-09 7.49E-10 2.06E-09 2.53E-09 5.10E-11 -1.07E-10 -1.04E-11 3.50E-11 8.55E-11 -1.06E-10 -9.40E-12 8.68E-11 2.29E-10 -2.47E-10 1.62E-10 1.22E-10 4.96E-10 -1.72E-10 4.65E-10 1.03E-10 7.47E-10 1.82E-10 1.13E-09 3.05E-10 1.96E-09 2.89E-10 2.86E-11 5.17E-11 1.70E-10 -1.13E-10 -1.00E-08 PASS 1.00E-08 PASS 1.32E-10 8.12E-11 3.55E-10 -9.08E-11 -1.00E-08 PASS 1.00E-08 PASS 1.86E-10 1.46E-10 5.88E-10 -2.15E-10 -1.50E-08 PASS 1.50E-08 PASS 5.06E-10 2.75E-10 1.26E-09 -2.49E-10 -2.00E-08 PASS 2.00E-08 PASS 1.79E-09 6.62E-10 3.60E-09 -3.01E-11 -2.50E-08 PASS 2.50E-08 PASS An ISO 9001:2000 Certified Company 24 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Offset Current 4 @ +/-15V (A) 3.00E-08 2.00E-08 1.00E-08 0.00E+00 -1.00E-08 -2.00E-08 -3.00E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.10. Plot of Offset Current 4 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 25 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.10. Raw data for Offset Current 4 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 4 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -1.02E-10 -9.70E-11 0.00E+00 1.40E-11 3.00E-12 -7.40E-11 2.00E-12 4.10E-11 1.14E-10 -5.90E-11 1.10E-10 -8.20E-11 20 -2.90E-11 1.00E-11 1.08E-10 2.40E-11 1.80E-11 2.70E-11 2.90E-11 2.30E-11 1.36E-10 1.39E-10 9.60E-11 -9.90E-11 50 2.76E-10 -2.50E-11 2.01E-10 2.00E-11 -2.20E-11 1.90E-10 7.60E-11 4.90E-11 -1.00E-12 2.70E-10 4.50E-11 -1.24E-10 100 4.69E-10 3.69E-10 4.46E-10 1.36E-10 1.20E-10 4.39E-10 4.87E-10 9.90E-11 4.03E-10 5.72E-10 5.40E-11 -1.16E-10 200 1.36E-09 1.20E-09 1.17E-09 7.87E-10 9.70E-10 1.73E-09 1.90E-09 8.97E-10 1.27E-09 1.54E-09 4.50E-11 -7.50E-11 -3.64E-11 5.79E-11 1.22E-10 -1.95E-10 2.62E-11 5.02E-11 1.64E-10 -1.11E-10 9.00E-11 1.39E-10 4.72E-10 -2.92E-10 3.08E-10 1.69E-10 7.70E-10 -1.54E-10 1.10E-09 2.20E-10 1.70E-09 4.92E-10 4.80E-12 7.67E-11 2.15E-10 -2.05E-10 -1.00E-08 PASS 1.00E-08 PASS 7.08E-11 6.09E-11 2.38E-10 -9.63E-11 -1.00E-08 PASS 1.00E-08 PASS 1.17E-10 1.11E-10 4.20E-10 -1.87E-10 -1.50E-08 PASS 1.50E-08 PASS 4.00E-10 1.80E-10 8.93E-10 -9.30E-11 -2.00E-08 PASS 2.00E-08 PASS 1.47E-09 3.95E-10 2.55E-09 3.83E-10 -2.50E-08 PASS 2.50E-08 PASS An ISO 9001:2000 Certified Company 26 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 1 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.11. Plot of Positive Bias Current 1 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 27 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.11. Raw data for Positive Bias Current 1 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 1 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.74E-09 1.21E-08 1.18E-08 1.10E-08 1.09E-08 1.09E-08 1.09E-08 1.11E-08 1.12E-08 1.18E-08 1.16E-08 1.06E-08 20 1.37E-08 1.61E-08 1.57E-08 1.52E-08 1.57E-08 1.46E-08 1.52E-08 1.51E-08 1.52E-08 1.62E-08 1.17E-08 1.07E-08 50 2.08E-08 2.44E-08 2.35E-08 2.31E-08 2.48E-08 2.20E-08 2.31E-08 2.25E-08 2.24E-08 2.45E-08 1.16E-08 1.07E-08 100 3.33E-08 3.76E-08 3.64E-08 3.59E-08 3.92E-08 3.36E-08 3.51E-08 3.48E-08 3.43E-08 3.73E-08 1.17E-08 1.06E-08 200 5.54E-08 6.17E-08 5.85E-08 5.80E-08 6.47E-08 5.48E-08 5.78E-08 5.62E-08 5.46E-08 6.00E-08 1.16E-08 1.06E-08 1.11E-08 9.21E-10 1.36E-08 8.59E-09 1.53E-08 9.49E-10 1.79E-08 1.27E-08 2.33E-08 1.54E-09 2.75E-08 1.91E-08 3.65E-08 2.20E-09 4.25E-08 3.05E-08 5.96E-08 3.61E-09 6.95E-08 4.98E-08 1.12E-08 3.67E-10 1.22E-08 1.02E-08 -3.00E-08 PASS 3.00E-08 PASS 1.52E-08 5.89E-10 1.69E-08 1.36E-08 -7.50E-08 PASS 7.50E-08 PASS 2.29E-08 9.93E-10 2.56E-08 2.02E-08 -1.00E-07 PASS 1.00E-07 PASS 3.50E-08 1.40E-09 3.89E-08 3.12E-08 -1.75E-07 PASS 1.75E-07 PASS 5.67E-08 2.24E-09 6.28E-08 5.06E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 28 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 2 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.12. Plot of Positive Bias Current 2 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 29 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.12. Raw data for Positive Bias Current 2 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 2 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.51E-09 1.16E-08 1.01E-08 1.08E-08 9.97E-09 1.08E-08 1.01E-08 1.07E-08 9.66E-09 9.91E-09 1.09E-08 1.05E-08 20 1.34E-08 1.57E-08 1.39E-08 1.52E-08 1.48E-08 1.46E-08 1.42E-08 1.47E-08 1.32E-08 1.38E-08 1.10E-08 1.06E-08 50 2.06E-08 2.39E-08 2.12E-08 2.31E-08 2.34E-08 2.17E-08 2.16E-08 2.20E-08 1.97E-08 2.07E-08 1.09E-08 1.06E-08 100 3.28E-08 3.73E-08 3.32E-08 3.62E-08 3.76E-08 3.30E-08 3.28E-08 3.37E-08 3.02E-08 3.17E-08 1.09E-08 1.05E-08 200 5.46E-08 6.09E-08 5.34E-08 5.85E-08 6.21E-08 5.31E-08 5.37E-08 5.43E-08 4.78E-08 5.07E-08 1.09E-08 1.06E-08 1.04E-08 8.34E-10 1.27E-08 8.12E-09 1.46E-08 9.42E-10 1.72E-08 1.20E-08 2.24E-08 1.44E-09 2.64E-08 1.85E-08 3.54E-08 2.27E-09 4.16E-08 2.92E-08 5.79E-08 3.82E-09 6.84E-08 4.74E-08 1.02E-08 4.94E-10 1.16E-08 8.87E-09 -3.00E-08 PASS 3.00E-08 PASS 1.41E-08 6.30E-10 1.58E-08 1.24E-08 -7.50E-08 PASS 7.50E-08 PASS 2.11E-08 9.64E-10 2.38E-08 1.85E-08 -1.00E-07 PASS 1.00E-07 PASS 3.23E-08 1.39E-09 3.61E-08 2.85E-08 -1.75E-07 PASS 1.75E-07 PASS 5.19E-08 2.69E-09 5.93E-08 4.45E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 30 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 3 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.13. Plot of Positive Bias Current 3 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 31 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.13. Raw data for Positive Bias Current 3 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 3 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.88E-09 1.19E-08 1.10E-08 1.12E-08 1.07E-08 1.12E-08 1.04E-08 1.09E-08 1.05E-08 1.03E-08 1.17E-08 1.09E-08 20 1.38E-08 1.60E-08 1.51E-08 1.54E-08 1.58E-08 1.51E-08 1.47E-08 1.50E-08 1.43E-08 1.42E-08 1.19E-08 1.09E-08 50 2.13E-08 2.46E-08 2.28E-08 2.36E-08 2.52E-08 2.26E-08 2.21E-08 2.24E-08 2.12E-08 2.14E-08 1.18E-08 1.09E-08 100 3.36E-08 3.81E-08 3.54E-08 3.70E-08 4.02E-08 3.45E-08 3.38E-08 3.43E-08 3.24E-08 3.29E-08 1.18E-08 1.09E-08 200 5.59E-08 6.30E-08 5.72E-08 5.97E-08 6.65E-08 5.56E-08 5.50E-08 5.50E-08 5.11E-08 5.25E-08 1.17E-08 1.10E-08 1.09E-08 7.40E-10 1.30E-08 8.90E-09 1.53E-08 8.71E-10 1.77E-08 1.29E-08 2.35E-08 1.55E-09 2.77E-08 1.93E-08 3.69E-08 2.52E-09 4.38E-08 3.00E-08 6.05E-08 4.32E-09 7.23E-08 4.86E-08 1.07E-08 3.77E-10 1.17E-08 9.64E-09 -3.00E-08 PASS 3.00E-08 PASS 1.47E-08 3.99E-10 1.57E-08 1.36E-08 -7.50E-08 PASS 7.50E-08 PASS 2.19E-08 6.25E-10 2.37E-08 2.02E-08 -1.00E-07 PASS 1.00E-07 PASS 3.36E-08 8.81E-10 3.60E-08 3.11E-08 -1.75E-07 PASS 1.75E-07 PASS 5.39E-08 1.94E-09 5.92E-08 4.85E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 32 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 4 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.14. Plot of Positive Bias Current 4 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 33 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.14. Raw data for Positive Bias Current 4 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 4 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.34E-09 1.18E-08 1.08E-08 1.15E-08 1.06E-08 1.10E-08 1.04E-08 1.08E-08 1.10E-08 1.15E-08 1.12E-08 1.03E-08 20 1.31E-08 1.56E-08 1.46E-08 1.57E-08 1.55E-08 1.47E-08 1.47E-08 1.47E-08 1.49E-08 1.58E-08 1.13E-08 1.03E-08 50 2.01E-08 2.36E-08 2.18E-08 2.37E-08 2.44E-08 2.22E-08 2.24E-08 2.21E-08 2.21E-08 2.39E-08 1.13E-08 1.03E-08 100 3.20E-08 3.66E-08 3.40E-08 3.69E-08 3.87E-08 3.41E-08 3.42E-08 3.43E-08 3.40E-08 3.65E-08 1.13E-08 1.03E-08 200 5.34E-08 5.96E-08 5.47E-08 5.91E-08 6.35E-08 5.52E-08 5.61E-08 5.52E-08 5.41E-08 5.86E-08 1.12E-08 1.02E-08 1.08E-08 9.36E-10 1.34E-08 8.22E-09 1.49E-08 1.08E-09 1.79E-08 1.19E-08 2.27E-08 1.73E-09 2.75E-08 1.80E-08 3.56E-08 2.64E-09 4.28E-08 2.84E-08 5.81E-08 4.07E-09 6.93E-08 4.69E-08 1.10E-08 3.88E-10 1.20E-08 9.89E-09 -3.00E-08 PASS 3.00E-08 PASS 1.50E-08 4.59E-10 1.62E-08 1.37E-08 -7.50E-08 PASS 7.50E-08 PASS 2.26E-08 7.84E-10 2.47E-08 2.04E-08 -1.00E-07 PASS 1.00E-07 PASS 3.46E-08 1.03E-09 3.74E-08 3.18E-08 -1.75E-07 PASS 1.75E-07 PASS 5.59E-08 1.71E-09 6.05E-08 5.12E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 34 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 1 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.15. Plot of Negative Bias Current 1 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 35 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.15. Raw data for Negative Bias Current 1 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 1 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.66E-09 1.20E-08 1.18E-08 1.12E-08 1.09E-08 1.09E-08 1.09E-08 1.11E-08 1.14E-08 1.18E-08 1.16E-08 1.04E-08 20 1.36E-08 1.61E-08 1.59E-08 1.54E-08 1.58E-08 1.46E-08 1.52E-08 1.52E-08 1.54E-08 1.63E-08 1.17E-08 1.04E-08 50 2.14E-08 2.44E-08 2.37E-08 2.33E-08 2.50E-08 2.22E-08 2.34E-08 2.26E-08 2.28E-08 2.44E-08 1.16E-08 1.04E-08 100 3.38E-08 3.80E-08 3.69E-08 3.65E-08 3.97E-08 3.42E-08 3.62E-08 3.53E-08 3.51E-08 3.75E-08 1.16E-08 1.04E-08 200 5.69E-08 6.25E-08 5.96E-08 5.88E-08 6.63E-08 5.68E-08 6.00E-08 5.74E-08 5.63E-08 6.11E-08 1.16E-08 1.05E-08 1.11E-08 9.36E-10 1.37E-08 8.56E-09 1.54E-08 1.00E-09 1.81E-08 1.26E-08 2.36E-08 1.40E-09 2.74E-08 1.97E-08 3.70E-08 2.18E-09 4.30E-08 3.10E-08 6.08E-08 3.66E-09 7.08E-08 5.08E-08 1.12E-08 3.93E-10 1.23E-08 1.02E-08 -3.00E-08 PASS 3.00E-08 PASS 1.53E-08 6.09E-10 1.70E-08 1.37E-08 -7.50E-08 PASS 7.50E-08 PASS 2.31E-08 8.36E-10 2.54E-08 2.08E-08 -1.00E-07 PASS 1.00E-07 PASS 3.57E-08 1.22E-09 3.90E-08 3.23E-08 -1.75E-07 PASS 1.75E-07 PASS 5.83E-08 2.12E-09 6.42E-08 5.25E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 36 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 2 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.16. Plot of Negative Bias Current 2 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 37 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.16. Raw data for Negative Bias Current 2 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 2 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.49E-09 1.16E-08 1.02E-08 1.09E-08 9.96E-09 1.07E-08 1.01E-08 1.08E-08 9.66E-09 9.85E-09 1.10E-08 1.06E-08 20 1.35E-08 1.57E-08 1.41E-08 1.52E-08 1.48E-08 1.46E-08 1.42E-08 1.49E-08 1.33E-08 1.37E-08 1.11E-08 1.06E-08 50 2.10E-08 2.41E-08 2.15E-08 2.33E-08 2.38E-08 2.19E-08 2.17E-08 2.22E-08 1.99E-08 2.10E-08 1.11E-08 1.06E-08 100 3.36E-08 3.74E-08 3.38E-08 3.69E-08 3.84E-08 3.35E-08 3.34E-08 3.43E-08 3.09E-08 3.24E-08 1.10E-08 1.06E-08 200 5.65E-08 6.17E-08 5.50E-08 5.99E-08 6.40E-08 5.48E-08 5.56E-08 5.55E-08 5.01E-08 5.33E-08 1.10E-08 1.05E-08 1.04E-08 8.46E-10 1.28E-08 8.12E-09 1.47E-08 9.02E-10 1.71E-08 1.22E-08 2.28E-08 1.41E-09 2.66E-08 1.89E-08 3.60E-08 2.18E-09 4.20E-08 3.01E-08 5.94E-08 3.69E-09 6.95E-08 4.93E-08 1.02E-08 5.17E-10 1.16E-08 8.81E-09 -3.00E-08 PASS 3.00E-08 PASS 1.42E-08 6.32E-10 1.59E-08 1.24E-08 -7.50E-08 PASS 7.50E-08 PASS 2.13E-08 8.96E-10 2.38E-08 1.89E-08 -1.00E-07 PASS 1.00E-07 PASS 3.29E-08 1.31E-09 3.65E-08 2.93E-08 -1.75E-07 PASS 1.75E-07 PASS 5.39E-08 2.28E-09 6.01E-08 4.76E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 38 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 3 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.17. Plot of Negative Bias Current 3 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 39 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.17. Raw data for Negative Bias Current 3 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 3 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.86E-09 1.19E-08 1.10E-08 1.13E-08 1.08E-08 1.13E-08 1.06E-08 1.10E-08 1.06E-08 1.03E-08 1.18E-08 1.08E-08 20 1.40E-08 1.61E-08 1.52E-08 1.56E-08 1.58E-08 1.53E-08 1.49E-08 1.51E-08 1.46E-08 1.43E-08 1.19E-08 1.09E-08 50 2.16E-08 2.46E-08 2.31E-08 2.39E-08 2.53E-08 2.29E-08 2.25E-08 2.24E-08 2.14E-08 2.18E-08 1.20E-08 1.09E-08 100 3.43E-08 3.86E-08 3.61E-08 3.76E-08 4.07E-08 3.51E-08 3.45E-08 3.46E-08 3.30E-08 3.38E-08 1.19E-08 1.09E-08 200 5.76E-08 6.38E-08 5.87E-08 6.08E-08 6.80E-08 5.74E-08 5.72E-08 5.61E-08 5.33E-08 5.52E-08 1.19E-08 1.08E-08 1.10E-08 7.62E-10 1.31E-08 8.89E-09 1.53E-08 8.40E-10 1.76E-08 1.30E-08 2.37E-08 1.41E-09 2.76E-08 1.98E-08 3.75E-08 2.42E-09 4.41E-08 3.08E-08 6.18E-08 4.22E-09 7.34E-08 5.02E-08 1.08E-08 3.82E-10 1.18E-08 9.71E-09 -3.00E-08 PASS 3.00E-08 PASS 1.48E-08 4.19E-10 1.60E-08 1.37E-08 -7.50E-08 PASS 7.50E-08 PASS 2.22E-08 5.99E-10 2.38E-08 2.06E-08 -1.00E-07 PASS 1.00E-07 PASS 3.42E-08 8.04E-10 3.64E-08 3.20E-08 -1.75E-07 PASS 1.75E-07 PASS 5.59E-08 1.67E-09 6.04E-08 5.13E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 40 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 4 @ +/-15V (A) 3.00E-07 2.00E-07 1.00E-07 0.00E+00 -1.00E-07 -2.00E-07 -3.00E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.18. Plot of Negative Bias Current 4 @ +/-15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 41 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.18. Raw data for Negative Bias Current 4 @ +/-15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 4 @ +/-15V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 9.23E-09 1.17E-08 1.08E-08 1.15E-08 1.07E-08 1.09E-08 1.05E-08 1.09E-08 1.10E-08 1.15E-08 1.13E-08 1.02E-08 20 1.32E-08 1.57E-08 1.46E-08 1.57E-08 1.55E-08 1.48E-08 1.47E-08 1.48E-08 1.51E-08 1.60E-08 1.14E-08 1.02E-08 50 2.05E-08 2.37E-08 2.20E-08 2.37E-08 2.44E-08 2.25E-08 2.26E-08 2.22E-08 2.23E-08 2.43E-08 1.14E-08 1.02E-08 100 3.26E-08 3.70E-08 3.45E-08 3.72E-08 3.89E-08 3.47E-08 3.48E-08 3.45E-08 3.44E-08 3.72E-08 1.14E-08 1.02E-08 200 5.49E-08 6.10E-08 5.61E-08 6.01E-08 6.48E-08 5.72E-08 5.83E-08 5.62E-08 5.56E-08 6.04E-08 1.13E-08 1.02E-08 1.08E-08 9.75E-10 1.35E-08 8.12E-09 1.49E-08 1.08E-09 1.79E-08 1.20E-08 2.29E-08 1.61E-09 2.73E-08 1.85E-08 3.60E-08 2.50E-09 4.29E-08 2.92E-08 5.94E-08 4.00E-09 7.04E-08 4.84E-08 1.10E-08 3.49E-10 1.19E-08 1.00E-08 -3.00E-08 PASS 3.00E-08 PASS 1.51E-08 5.35E-10 1.66E-08 1.36E-08 -7.50E-08 PASS 7.50E-08 PASS 2.28E-08 8.48E-10 2.51E-08 2.05E-08 -1.00E-07 PASS 1.00E-07 PASS 3.51E-08 1.17E-09 3.83E-08 3.19E-08 -1.75E-07 PASS 1.75E-07 PASS 5.75E-08 1.91E-09 6.27E-08 5.23E-08 -2.50E-07 PASS 2.50E-07 PASS An ISO 9001:2000 Certified Company 42 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 1 (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.19. Plot of Common Mode Rejection Ratio 1 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 43 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.19. Raw data for Common Mode Rejection Ratio 1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 1 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.20E+02 1.17E+02 1.17E+02 1.15E+02 1.17E+02 1.16E+02 1.19E+02 1.12E+02 1.14E+02 1.17E+02 1.15E+02 1.19E+02 20 1.17E+02 1.16E+02 1.14E+02 1.12E+02 1.13E+02 1.14E+02 1.15E+02 1.10E+02 1.12E+02 1.15E+02 1.15E+02 1.19E+02 50 1.14E+02 1.13E+02 1.13E+02 1.11E+02 1.12E+02 1.12E+02 1.14E+02 1.08E+02 1.11E+02 1.13E+02 1.15E+02 1.19E+02 100 1.12E+02 1.12E+02 1.12E+02 1.11E+02 1.11E+02 1.11E+02 1.12E+02 1.08E+02 1.10E+02 1.12E+02 1.15E+02 1.19E+02 200 1.11E+02 1.12E+02 1.10E+02 1.09E+02 1.10E+02 1.10E+02 1.11E+02 1.07E+02 1.09E+02 1.10E+02 1.15E+02 1.18E+02 1.17E+02 1.72E+00 1.22E+02 1.12E+02 1.14E+02 1.80E+00 1.19E+02 1.09E+02 1.13E+02 1.09E+00 1.16E+02 1.10E+02 1.12E+02 6.88E-01 1.13E+02 1.10E+02 1.10E+02 1.09E+00 1.13E+02 1.07E+02 1.16E+02 2.83E+00 1.23E+02 1.08E+02 9.70E+01 PASS 1.13E+02 2.35E+00 1.20E+02 1.07E+02 9.70E+01 PASS 1.12E+02 2.32E+00 1.18E+02 1.05E+02 9.40E+01 PASS 1.10E+02 1.77E+00 1.15E+02 1.05E+02 9.00E+01 PASS 1.09E+02 1.64E+00 1.14E+02 1.05E+02 8.60E+01 PASS An ISO 9001:2000 Certified Company 44 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 2 (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.20. Plot of Common Mode Rejection Ratio 2 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 45 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.20. Raw data for Common Mode Rejection Ratio 2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 2 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.27E+02 1.20E+02 1.13E+02 1.13E+02 1.13E+02 1.21E+02 1.37E+02 1.15E+02 1.16E+02 1.23E+02 1.15E+02 1.17E+02 20 1.19E+02 1.15E+02 1.11E+02 1.11E+02 1.11E+02 1.17E+02 1.25E+02 1.10E+02 1.14E+02 1.18E+02 1.15E+02 1.18E+02 50 1.16E+02 1.14E+02 1.10E+02 1.10E+02 1.10E+02 1.14E+02 1.19E+02 1.09E+02 1.12E+02 1.15E+02 1.15E+02 1.18E+02 100 1.15E+02 1.12E+02 1.09E+02 1.09E+02 1.09E+02 1.13E+02 1.16E+02 1.07E+02 1.11E+02 1.13E+02 1.15E+02 1.18E+02 200 1.13E+02 1.11E+02 1.09E+02 1.08E+02 1.08E+02 1.11E+02 1.12E+02 1.06E+02 1.10E+02 1.11E+02 1.15E+02 1.17E+02 1.17E+02 6.02E+00 1.34E+02 1.01E+02 1.13E+02 3.55E+00 1.23E+02 1.04E+02 1.12E+02 2.68E+00 1.19E+02 1.05E+02 1.11E+02 2.46E+00 1.18E+02 1.04E+02 1.10E+02 2.09E+00 1.16E+02 1.04E+02 1.22E+02 8.81E+00 1.46E+02 9.82E+01 9.70E+01 PASS 1.17E+02 5.45E+00 1.32E+02 1.02E+02 9.70E+01 PASS 1.14E+02 3.78E+00 1.24E+02 1.04E+02 9.40E+01 PASS 1.12E+02 3.11E+00 1.20E+02 1.03E+02 9.00E+01 PASS 1.10E+02 2.43E+00 1.17E+02 1.03E+02 8.60E+01 PASS An ISO 9001:2000 Certified Company 46 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 3 (dB) 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.21. Plot of Common Mode Rejection Ratio 3 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 47 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.21. Raw data for Common Mode Rejection Ratio 3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 3 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.13E+02 1.16E+02 1.16E+02 1.15E+02 1.16E+02 1.15E+02 1.24E+02 1.11E+02 1.16E+02 1.17E+02 1.14E+02 1.12E+02 20 1.11E+02 1.13E+02 1.14E+02 1.13E+02 1.13E+02 1.13E+02 1.22E+02 1.10E+02 1.13E+02 1.14E+02 1.14E+02 1.12E+02 50 1.10E+02 1.12E+02 1.13E+02 1.11E+02 1.12E+02 1.12E+02 1.18E+02 1.09E+02 1.12E+02 1.12E+02 1.14E+02 1.12E+02 100 1.10E+02 1.11E+02 1.11E+02 1.10E+02 1.11E+02 1.10E+02 1.15E+02 1.07E+02 1.10E+02 1.11E+02 1.14E+02 1.12E+02 200 1.09E+02 1.10E+02 1.11E+02 1.10E+02 1.10E+02 1.09E+02 1.12E+02 1.06E+02 1.08E+02 1.09E+02 1.14E+02 1.12E+02 1.15E+02 1.14E+00 1.18E+02 1.12E+02 1.13E+02 1.13E+00 1.16E+02 1.10E+02 1.12E+02 1.20E+00 1.15E+02 1.08E+02 1.11E+02 7.00E-01 1.12E+02 1.09E+02 1.10E+02 7.89E-01 1.12E+02 1.08E+02 1.17E+02 4.56E+00 1.29E+02 1.04E+02 9.70E+01 PASS 1.15E+02 4.57E+00 1.27E+02 1.02E+02 9.70E+01 PASS 1.12E+02 3.31E+00 1.21E+02 1.03E+02 9.40E+01 PASS 1.11E+02 2.92E+00 1.19E+02 1.03E+02 9.00E+01 PASS 1.09E+02 1.97E+00 1.14E+02 1.03E+02 8.60E+01 PASS An ISO 9001:2000 Certified Company 48 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 4 (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.22. Plot of Common Mode Rejection Ratio 4 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 49 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.22. Raw data for Common Mode Rejection Ratio 4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Common Mode Rejection Ratio 4 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.16E+02 1.22E+02 1.12E+02 1.18E+02 1.29E+02 1.21E+02 1.30E+02 1.10E+02 1.13E+02 1.22E+02 1.83E+02 1.26E+02 20 1.21E+02 1.17E+02 1.10E+02 1.14E+02 1.20E+02 1.17E+02 1.25E+02 1.09E+02 1.11E+02 1.17E+02 1.39E+02 1.26E+02 50 1.28E+02 1.15E+02 1.09E+02 1.13E+02 1.17E+02 1.15E+02 1.19E+02 1.08E+02 1.09E+02 1.15E+02 1.44E+02 1.26E+02 100 1.27E+02 1.14E+02 1.08E+02 1.11E+02 1.14E+02 1.13E+02 1.16E+02 1.06E+02 1.08E+02 1.13E+02 1.46E+02 1.27E+02 200 1.28E+02 1.12E+02 1.08E+02 1.10E+02 1.12E+02 1.11E+02 1.12E+02 1.05E+02 1.07E+02 1.10E+02 1.47E+02 1.27E+02 1.19E+02 6.39E+00 1.37E+02 1.02E+02 1.16E+02 4.60E+00 1.29E+02 1.04E+02 1.17E+02 7.03E+00 1.36E+02 9.73E+01 1.15E+02 7.04E+00 1.34E+02 9.55E+01 1.14E+02 8.15E+00 1.36E+02 9.18E+01 1.19E+02 7.86E+00 1.41E+02 9.76E+01 9.70E+01 PASS 1.16E+02 6.22E+00 1.33E+02 9.87E+01 9.70E+01 PASS 1.13E+02 4.49E+00 1.25E+02 1.01E+02 9.40E+01 PASS 1.11E+02 3.78E+00 1.21E+02 1.01E+02 9.00E+01 PASS 1.09E+02 2.85E+00 1.17E+02 1.01E+02 8.60E+01 PASS An ISO 9001:2000 Certified Company 50 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.50E+02 Power Supply Rejection Ratio 1 (dB) 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.23. Plot of Power Supply Rejection Ratio 1 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 51 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.23. Raw data for Power Supply Rejection Ratio 1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 1 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.23E+02 1.31E+02 1.23E+02 1.28E+02 1.39E+02 1.25E+02 1.27E+02 1.24E+02 1.31E+02 1.41E+02 1.30E+02 1.19E+02 20 1.24E+02 1.36E+02 1.25E+02 1.51E+02 1.49E+02 1.27E+02 1.48E+02 1.26E+02 1.27E+02 1.31E+02 1.51E+02 1.19E+02 50 1.29E+02 1.33E+02 1.27E+02 1.35E+02 1.41E+02 1.26E+02 1.49E+02 1.21E+02 1.37E+02 1.45E+02 1.33E+02 1.17E+02 100 1.36E+02 1.25E+02 1.21E+02 1.38E+02 1.45E+02 1.30E+02 1.44E+02 1.18E+02 1.32E+02 1.24E+02 1.36E+02 1.16E+02 200 1.48E+02 1.23E+02 1.19E+02 1.32E+02 1.37E+02 1.34E+02 1.22E+02 1.16E+02 1.26E+02 1.19E+02 1.29E+02 1.19E+02 1.29E+02 6.36E+00 1.46E+02 1.11E+02 1.37E+02 1.29E+01 1.72E+02 1.02E+02 1.33E+02 5.40E+00 1.48E+02 1.18E+02 1.33E+02 9.95E+00 1.60E+02 1.06E+02 1.32E+02 1.16E+01 1.64E+02 9.99E+01 1.30E+02 6.84E+00 1.48E+02 1.11E+02 1.00E+02 PASS 1.32E+02 9.40E+00 1.58E+02 1.06E+02 9.80E+01 PASS 1.36E+02 1.20E+01 1.69E+02 1.03E+02 9.40E+01 PASS 1.30E+02 9.76E+00 1.56E+02 1.03E+02 8.60E+01 PASS 1.23E+02 6.95E+00 1.42E+02 1.04E+02 8.00E+01 PASS An ISO 9001:2000 Certified Company 52 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 2 (dB) 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.24. Plot of Power Supply Rejection Ratio 2 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 53 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.24. Raw data for Power Supply Rejection Ratio 2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 2 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.26E+02 1.25E+02 1.20E+02 1.45E+02 1.23E+02 1.24E+02 1.26E+02 1.39E+02 1.27E+02 1.28E+02 1.26E+02 1.35E+02 20 1.29E+02 1.26E+02 1.21E+02 1.34E+02 1.27E+02 1.25E+02 1.27E+02 1.37E+02 1.25E+02 1.27E+02 1.31E+02 1.36E+02 50 1.38E+02 1.24E+02 1.21E+02 1.28E+02 1.26E+02 1.27E+02 1.32E+02 1.30E+02 1.31E+02 1.26E+02 1.28E+02 1.32E+02 100 1.30E+02 1.20E+02 1.23E+02 1.25E+02 1.28E+02 1.41E+02 1.34E+02 1.24E+02 1.34E+02 1.20E+02 1.29E+02 1.31E+02 200 1.33E+02 1.17E+02 1.23E+02 1.21E+02 1.32E+02 1.25E+02 1.23E+02 1.18E+02 1.31E+02 1.16E+02 1.27E+02 1.37E+02 1.28E+02 9.81E+00 1.55E+02 1.01E+02 1.27E+02 4.82E+00 1.41E+02 1.14E+02 1.27E+02 6.17E+00 1.44E+02 1.10E+02 1.25E+02 4.04E+00 1.36E+02 1.14E+02 1.25E+02 6.97E+00 1.44E+02 1.06E+02 1.29E+02 5.85E+00 1.45E+02 1.13E+02 1.00E+02 PASS 1.28E+02 4.83E+00 1.41E+02 1.15E+02 9.80E+01 PASS 1.29E+02 2.45E+00 1.36E+02 1.22E+02 9.40E+01 PASS 1.31E+02 8.47E+00 1.54E+02 1.07E+02 8.60E+01 PASS 1.23E+02 5.78E+00 1.39E+02 1.07E+02 8.00E+01 PASS An ISO 9001:2000 Certified Company 54 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.50E+02 Power Supply Rejection Ratio 3 (dB) 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.25. Plot of Power Supply Rejection Ratio 3 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 55 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.25. Raw data for Power Supply Rejection Ratio 3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 3 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.28E+02 1.42E+02 1.32E+02 1.33E+02 1.25E+02 1.28E+02 1.22E+02 1.31E+02 1.43E+02 1.27E+02 1.35E+02 1.27E+02 20 1.43E+02 1.32E+02 1.43E+02 1.26E+02 1.40E+02 1.28E+02 1.26E+02 1.37E+02 1.33E+02 1.28E+02 1.38E+02 1.28E+02 50 1.31E+02 1.39E+02 1.27E+02 1.30E+02 1.30E+02 1.32E+02 1.26E+02 1.28E+02 1.31E+02 1.25E+02 1.43E+02 1.24E+02 100 1.34E+02 1.45E+02 1.24E+02 1.24E+02 1.33E+02 1.37E+02 1.32E+02 1.21E+02 1.34E+02 1.44E+02 1.49E+02 1.25E+02 200 1.26E+02 1.30E+02 1.24E+02 1.22E+02 1.46E+02 1.22E+02 1.24E+02 1.18E+02 1.20E+02 1.29E+02 1.44E+02 1.30E+02 1.32E+02 6.14E+00 1.49E+02 1.15E+02 1.37E+02 7.71E+00 1.58E+02 1.16E+02 1.32E+02 4.33E+00 1.43E+02 1.20E+02 1.32E+02 8.68E+00 1.56E+02 1.08E+02 1.29E+02 9.71E+00 1.56E+02 1.03E+02 1.30E+02 7.92E+00 1.52E+02 1.08E+02 1.00E+02 PASS 1.30E+02 4.41E+00 1.42E+02 1.18E+02 9.80E+01 PASS 1.28E+02 3.10E+00 1.37E+02 1.20E+02 9.40E+01 PASS 1.34E+02 8.53E+00 1.57E+02 1.10E+02 8.60E+01 PASS 1.23E+02 4.16E+00 1.34E+02 1.11E+02 8.00E+01 PASS An ISO 9001:2000 Certified Company 56 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.50E+02 Power Supply Rejection Ratio 4 (dB) 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.26. Plot of Power Supply Rejection Ratio 4 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 57 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.26. Raw data for Power Supply Rejection Ratio 4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Power Supply Rejection Ratio 4 (dB) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.21E+02 1.30E+02 1.43E+02 1.34E+02 1.21E+02 1.45E+02 1.23E+02 1.28E+02 1.45E+02 1.41E+02 1.22E+02 1.26E+02 20 1.24E+02 1.25E+02 1.32E+02 1.39E+02 1.23E+02 1.58E+02 1.31E+02 1.33E+02 1.28E+02 1.33E+02 1.25E+02 1.27E+02 50 1.29E+02 1.29E+02 1.37E+02 1.39E+02 1.21E+02 1.47E+02 1.27E+02 1.26E+02 1.45E+02 1.36E+02 1.24E+02 1.21E+02 100 1.25E+02 1.51E+02 1.29E+02 1.27E+02 1.27E+02 1.27E+02 1.29E+02 1.22E+02 1.47E+02 1.24E+02 1.24E+02 1.22E+02 200 1.48E+02 1.34E+02 1.28E+02 1.23E+02 1.28E+02 1.19E+02 1.24E+02 1.17E+02 1.22E+02 1.18E+02 1.23E+02 1.27E+02 1.30E+02 9.18E+00 1.55E+02 1.04E+02 1.29E+02 6.60E+00 1.47E+02 1.10E+02 1.31E+02 7.39E+00 1.51E+02 1.11E+02 1.32E+02 1.09E+01 1.62E+02 1.02E+02 1.32E+02 9.52E+00 1.58E+02 1.06E+02 1.37E+02 1.04E+01 1.65E+02 1.08E+02 1.00E+02 PASS 1.37E+02 1.23E+01 1.70E+02 1.03E+02 9.80E+01 PASS 1.36E+02 9.72E+00 1.63E+02 1.10E+02 9.40E+01 PASS 1.30E+02 1.01E+01 1.58E+02 1.02E+02 8.60E+01 PASS 1.20E+02 2.81E+00 1.28E+02 1.12E+02 8.00E+01 PASS An ISO 9001:2000 Certified Company 58 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 RL=10k VO=+/-10V (V/mV) 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.27. Plot of Open Loop Gain 1 RL=10k VO=+/-10V (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 59 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.27. Raw data for Open Loop Gain 1 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Open Loop Gain 1 RL=10k VO=+/-10V (V/mV) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 3.67E+04 3.20E+04 3.18E+04 3.41E+04 3.00E+04 2.95E+04 2.93E+04 3.08E+04 3.35E+04 3.26E+04 4.41E+04 4.46E+04 20 3.39E+04 2.83E+04 3.34E+04 2.74E+04 3.65E+04 2.22E+04 3.03E+04 2.94E+04 3.40E+04 3.75E+04 5.09E+04 3.17E+04 50 2.93E+04 3.11E+04 3.30E+04 2.62E+04 2.47E+04 1.99E+04 2.67E+04 2.80E+04 4.39E+04 2.78E+04 4.35E+04 3.59E+04 100 4.45E+04 1.93E+04 3.17E+04 3.32E+04 2.52E+04 2.67E+04 2.51E+04 3.22E+04 2.09E+04 2.21E+04 3.04E+04 3.61E+04 200 2.55E+04 2.62E+04 2.48E+04 2.63E+04 2.09E+04 3.68E+04 2.17E+04 3.71E+04 2.85E+04 2.51E+04 3.27E+04 3.84E+04 3.29E+04 2.56E+03 3.99E+04 2.59E+04 3.19E+04 3.86E+03 4.25E+04 2.13E+04 2.89E+04 3.41E+03 3.82E+04 1.95E+04 3.08E+04 9.46E+03 5.68E+04 4.87E+03 2.47E+04 2.25E+03 3.09E+04 1.86E+04 3.11E+04 1.88E+03 3.63E+04 2.60E+04 1.20E+03 PASS 3.07E+04 5.71E+03 4.64E+04 1.50E+04 2.00E+02 PASS 2.93E+04 8.85E+03 5.35E+04 4.99E+03 1.00E+02 PASS 2.54E+04 4.44E+03 3.76E+04 1.32E+04 5.00E+01 PASS 2.98E+04 6.93E+03 4.88E+04 1.08E+04 2.50E+01 PASS An ISO 9001:2000 Certified Company 60 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 RL=10k VO=+/-10V (V/mV) 6.00E+04 5.00E+04 4.00E+04 3.00E+04 2.00E+04 1.00E+04 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.28. Plot of Open Loop Gain 2 RL=10k VO=+/-10V (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 61 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.28. Raw data for Open Loop Gain 2 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Open Loop Gain 2 RL=10k VO=+/-10V (V/mV) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 5.39E+04 4.18E+04 4.07E+04 3.80E+04 4.75E+04 4.19E+04 4.43E+04 4.91E+04 5.25E+04 4.32E+04 4.71E+04 5.29E+04 20 5.99E+04 3.81E+04 4.67E+04 4.99E+04 4.68E+04 4.19E+04 3.60E+04 4.34E+04 4.63E+04 5.59E+04 4.77E+04 4.26E+04 50 3.60E+04 3.84E+04 4.44E+04 3.67E+04 5.13E+04 3.70E+04 4.71E+04 4.01E+04 2.81E+04 3.00E+04 4.38E+04 3.98E+04 100 3.80E+04 4.38E+04 3.31E+04 3.28E+04 4.03E+04 3.38E+04 4.09E+04 3.34E+04 3.27E+04 4.44E+04 4.60E+04 4.38E+04 200 3.61E+04 3.41E+04 3.69E+04 4.22E+04 4.14E+04 3.38E+04 4.31E+04 3.22E+04 3.99E+04 2.55E+04 5.74E+04 4.66E+04 4.44E+04 6.34E+03 6.17E+04 2.70E+04 4.83E+04 7.81E+03 6.97E+04 2.69E+04 4.13E+04 6.46E+03 5.91E+04 2.36E+04 3.76E+04 4.74E+03 5.06E+04 2.46E+04 3.81E+04 3.50E+03 4.77E+04 2.86E+04 4.62E+04 4.45E+03 5.84E+04 3.40E+04 1.20E+03 PASS 4.47E+04 7.27E+03 6.46E+04 2.48E+04 2.00E+02 PASS 3.65E+04 7.72E+03 5.76E+04 1.53E+04 1.00E+02 PASS 3.71E+04 5.30E+03 5.16E+04 2.25E+04 5.00E+01 PASS 3.49E+04 6.88E+03 5.38E+04 1.60E+04 2.50E+01 PASS An ISO 9001:2000 Certified Company 62 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 3 RL=10k VO=+/-10V (V/mV) 4.00E+04 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.29. Plot of Open Loop Gain 3 RL=10k VO=+/-10V (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 63 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.29. Raw data for Open Loop Gain 3 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Open Loop Gain 3 RL=10k VO=+/-10V (V/mV) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 3.70E+04 3.07E+04 3.64E+04 3.23E+04 3.36E+04 4.71E+04 3.30E+04 2.58E+04 2.79E+04 3.86E+04 3.48E+04 3.41E+04 20 3.11E+04 3.66E+04 4.60E+04 2.29E+04 2.47E+04 2.89E+04 4.15E+04 2.23E+04 3.55E+04 4.18E+04 3.72E+04 4.15E+04 50 2.93E+04 3.13E+04 3.83E+04 3.30E+04 3.02E+04 4.10E+04 2.91E+04 2.64E+04 2.75E+04 2.99E+04 2.33E+04 3.65E+04 100 2.30E+04 2.47E+04 2.60E+04 3.80E+04 3.21E+04 3.19E+04 2.47E+04 2.70E+04 2.23E+04 3.03E+04 2.45E+04 4.44E+04 200 2.64E+04 3.35E+04 3.84E+04 2.84E+04 2.70E+04 2.80E+04 1.84E+04 2.29E+04 2.73E+04 2.09E+04 2.44E+04 3.63E+04 3.40E+04 2.66E+03 4.13E+04 2.67E+04 3.23E+04 9.43E+03 5.81E+04 6.39E+03 3.24E+04 3.56E+03 4.22E+04 2.27E+04 2.88E+04 6.20E+03 4.58E+04 1.18E+04 3.07E+04 5.10E+03 4.47E+04 1.67E+04 3.45E+04 8.63E+03 5.81E+04 1.08E+04 1.20E+03 PASS 3.40E+04 8.40E+03 5.70E+04 1.09E+04 2.00E+02 PASS 3.08E+04 5.88E+03 4.69E+04 1.46E+04 1.00E+02 PASS 2.72E+04 3.94E+03 3.80E+04 1.65E+04 5.00E+01 PASS 2.35E+04 4.12E+03 3.48E+04 1.22E+04 2.50E+01 PASS An ISO 9001:2000 Certified Company 64 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 4 RL=10k VO=+/-10V (V/mV) 4.00E+04 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.30. Plot of Open Loop Gain 4 RL=10k VO=+/-10V (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 65 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.30. Raw data for Open Loop Gain 4 RL=10k VO=+/-10V (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Open Loop Gain 4 RL=10k VO=+/-10V (V/mV) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 3.06E+04 2.45E+04 2.70E+04 2.39E+04 2.52E+04 3.19E+04 2.90E+04 3.04E+04 3.64E+04 3.47E+04 3.12E+04 4.37E+04 20 2.29E+04 4.18E+04 3.01E+04 3.24E+04 4.71E+04 3.30E+04 3.36E+04 3.59E+04 3.17E+04 3.27E+04 3.52E+04 4.81E+04 50 3.10E+04 3.16E+04 2.51E+04 3.04E+04 3.97E+04 3.52E+04 3.64E+04 2.60E+04 3.44E+04 3.29E+04 2.42E+04 3.11E+04 100 2.91E+04 3.58E+04 2.78E+04 3.53E+04 2.19E+04 3.90E+04 2.22E+04 2.41E+04 2.87E+04 2.76E+04 2.98E+04 4.00E+04 200 2.28E+04 2.92E+04 3.04E+04 3.39E+04 3.01E+04 2.33E+04 3.12E+04 1.65E+04 2.17E+04 2.67E+04 3.36E+04 3.43E+04 2.62E+04 2.69E+03 3.36E+04 1.88E+04 3.49E+04 9.62E+03 6.12E+04 8.48E+03 3.16E+04 5.22E+03 4.59E+04 1.73E+04 3.00E+04 5.78E+03 4.59E+04 1.42E+04 2.93E+04 4.04E+03 4.04E+04 1.82E+04 3.25E+04 3.04E+03 4.08E+04 2.42E+04 1.20E+03 PASS 3.34E+04 1.58E+03 3.77E+04 2.91E+04 2.00E+02 PASS 3.30E+04 4.08E+03 4.42E+04 2.18E+04 1.00E+02 PASS 2.83E+04 6.52E+03 4.62E+04 1.04E+04 5.00E+01 PASS 2.39E+04 5.48E+03 3.89E+04 8.86E+03 2.50E+01 PASS An ISO 9001:2000 Certified Company 66 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 1 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.31. Plot of Positive Output Voltage 1 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 67 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.31. Raw data for Positive Output Voltage 1 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 1 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 100 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 200 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 4.76E-03 1.41E+01 1.41E+01 1.41E+01 4.66E-03 1.41E+01 1.41E+01 1.41E+01 4.32E-03 1.41E+01 1.41E+01 1.41E+01 4.51E-03 1.41E+01 1.41E+01 1.41E+01 4.58E-03 1.41E+01 1.41E+01 1.41E+01 4.64E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.94E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.92E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 5.37E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 5.20E-03 1.41E+01 1.41E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 68 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 2 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.32. Plot of Positive Output Voltage 2 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 69 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.32. Raw data for Positive Output Voltage 2 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 2 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 100 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 200 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 3.56E-03 1.41E+01 1.41E+01 1.41E+01 3.94E-03 1.41E+01 1.41E+01 1.41E+01 4.15E-03 1.41E+01 1.41E+01 1.41E+01 3.70E-03 1.41E+01 1.41E+01 1.41E+01 4.27E-03 1.41E+01 1.41E+01 1.41E+01 4.15E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.85E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.15E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.56E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 5.26E-03 1.41E+01 1.41E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 70 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 3 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.33. Plot of Positive Output Voltage 3 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 71 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.33. Raw data for Positive Output Voltage 3 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 3 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 100 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 200 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 3.70E-03 1.41E+01 1.41E+01 1.41E+01 3.35E-03 1.41E+01 1.41E+01 1.41E+01 4.32E-03 1.41E+01 1.41E+01 1.41E+01 4.27E-03 1.41E+01 1.41E+01 1.41E+01 3.27E-03 1.41E+01 1.41E+01 1.41E+01 4.60E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.16E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 3.85E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.12E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.66E-03 1.41E+01 1.41E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 72 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 4 @ +/-15V (V) 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 1.26E+01 1.24E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.34. Plot of Positive Output Voltage 4 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 73 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.34. Raw data for Positive Output Voltage 4 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 4 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 20 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 50 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 100 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 200 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 4.32E-03 1.41E+01 1.41E+01 1.41E+01 4.32E-03 1.41E+01 1.41E+01 1.41E+01 4.09E-03 1.41E+01 1.41E+01 1.41E+01 4.77E-03 1.41E+01 1.41E+01 1.41E+01 4.77E-03 1.41E+01 1.41E+01 1.41E+01 4.36E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.62E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 4.60E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 5.26E-03 1.41E+01 1.41E+01 1.25E+01 PASS 1.41E+01 5.26E-03 1.41E+01 1.41E+01 1.25E+01 PASS An ISO 9001:2000 Certified Company 74 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Output Voltage 1 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.35. Plot of Negative Output Voltage 1 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 75 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.35. Raw data for Negative Output Voltage 1 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Output Voltage 1 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 100 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 200 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 6.42E-03 6.31E-03 7.04E-03 5.87E-03 4.69E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 2.88E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.70E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 3.16E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 76 -1.44E+01 2.70E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.49E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Output Voltage 2 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.36. Plot of Negative Output Voltage 2 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 77 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.36. Raw data for Negative Output Voltage 2 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Output Voltage 2 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 100 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 200 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 5.59E-03 5.45E-03 5.68E-03 4.97E-03 4.76E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 2.59E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.49E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.70E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 78 -1.44E+01 3.11E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 3.32E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Output Voltage 3 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.37. Plot of Negative Output Voltage 3 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 79 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.37. Raw data for Negative Output Voltage 3 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Output Voltage 3 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 100 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 200 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 5.22E-03 5.17E-03 5.59E-03 4.77E-03 4.88E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 2.41E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.19E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.19E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 80 -1.44E+01 2.74E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.88E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Output Voltage 4 @ +/-15V (V) -1.20E+01 -1.25E+01 -1.30E+01 -1.35E+01 -1.40E+01 -1.45E+01 -1.50E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.38. Plot of Negative Output Voltage 4 @ +/-15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 81 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.38. Raw data for Negative Output Voltage 4 @ +/-15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Output Voltage 4 @ +/-15V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 20 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 50 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 100 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 200 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 6.53E-03 6.42E-03 7.09E-03 5.94E-03 4.02E-03 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 2.59E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 3.03E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.97E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS An ISO 9001:2000 Certified Company 82 -1.44E+01 2.59E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS -1.44E+01 2.19E-03 -1.44E+01 -1.44E+01 -1.25E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 1 @ +/-15V (V/us) 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.39. Plot of Positive Slew Rate 1 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 83 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.39. Raw data for Positive Slew Rate 1 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Slew Rate 1 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 5.20E-01 4.84E-01 4.60E-01 4.67E-01 5.05E-01 4.96E-01 4.89E-01 4.84E-01 4.75E-01 4.76E-01 4.74E-01 5.10E-01 20 5.13E-01 4.76E-01 4.57E-01 4.74E-01 5.14E-01 4.77E-01 4.85E-01 4.79E-01 4.73E-01 4.75E-01 4.76E-01 5.03E-01 50 4.88E-01 4.57E-01 4.43E-01 4.64E-01 4.84E-01 4.64E-01 4.77E-01 4.56E-01 4.52E-01 4.51E-01 4.78E-01 5.08E-01 100 4.58E-01 4.30E-01 4.14E-01 4.27E-01 4.51E-01 4.30E-01 4.34E-01 4.25E-01 4.25E-01 4.15E-01 4.76E-01 5.08E-01 200 3.89E-01 3.81E-01 3.69E-01 3.75E-01 3.95E-01 3.71E-01 3.71E-01 3.70E-01 3.67E-01 3.62E-01 4.78E-01 5.01E-01 4.87E-01 2.53E-02 5.56E-01 4.18E-01 4.87E-01 2.55E-02 5.57E-01 4.17E-01 4.67E-01 1.88E-02 5.19E-01 4.16E-01 4.36E-01 1.81E-02 4.86E-01 3.86E-01 3.82E-01 1.04E-02 4.10E-01 3.53E-01 4.84E-01 8.86E-03 5.08E-01 4.60E-01 2.00E-01 PASS 4.78E-01 4.60E-03 4.90E-01 4.65E-01 1.20E-01 PASS 4.60E-01 1.08E-02 4.90E-01 4.30E-01 1.10E-01 PASS 4.26E-01 7.12E-03 4.45E-01 4.06E-01 7.00E-02 PASS 3.68E-01 3.83E-03 3.79E-01 3.58E-01 1.00E-02 PASS An ISO 9001:2000 Certified Company 84 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 5.00E-01 Positive Slew Rate 2 @ +/-15V (V/us) 4.50E-01 4.00E-01 3.50E-01 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.40. Plot of Positive Slew Rate 2 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 85 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.40. Raw data for Positive Slew Rate 2 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Slew Rate 2 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 4.88E-01 4.53E-01 4.69E-01 4.43E-01 4.97E-01 4.49E-01 4.80E-01 4.64E-01 4.86E-01 4.81E-01 4.44E-01 4.73E-01 20 4.77E-01 4.41E-01 4.73E-01 4.55E-01 4.91E-01 4.60E-01 4.77E-01 4.54E-01 4.76E-01 4.79E-01 4.49E-01 4.86E-01 50 4.51E-01 4.29E-01 4.60E-01 4.27E-01 4.69E-01 4.38E-01 4.43E-01 4.36E-01 4.47E-01 4.51E-01 4.65E-01 4.75E-01 100 4.30E-01 3.99E-01 4.20E-01 3.98E-01 4.33E-01 4.08E-01 4.11E-01 4.11E-01 4.19E-01 4.27E-01 4.59E-01 4.89E-01 200 3.69E-01 3.53E-01 3.77E-01 3.52E-01 3.87E-01 3.47E-01 3.53E-01 3.55E-01 3.66E-01 3.63E-01 4.46E-01 4.86E-01 4.70E-01 2.28E-02 5.32E-01 4.08E-01 4.67E-01 1.96E-02 5.21E-01 4.14E-01 4.47E-01 1.87E-02 4.98E-01 3.96E-01 4.16E-01 1.67E-02 4.62E-01 3.70E-01 3.68E-01 1.52E-02 4.09E-01 3.26E-01 4.72E-01 1.53E-02 5.14E-01 4.30E-01 2.00E-01 PASS 4.69E-01 1.14E-02 5.00E-01 4.38E-01 1.20E-01 PASS 4.43E-01 6.20E-03 4.60E-01 4.26E-01 1.10E-01 PASS 4.15E-01 7.76E-03 4.36E-01 3.94E-01 7.00E-02 PASS 3.57E-01 7.69E-03 3.78E-01 3.36E-01 1.00E-02 PASS An ISO 9001:2000 Certified Company 86 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 3 @ +/-15V (V/us) 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.41. Plot of Positive Slew Rate 3 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 87 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.41. Raw data for Positive Slew Rate 3 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Slew Rate 3 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 5.09E-01 4.75E-01 4.91E-01 4.69E-01 5.14E-01 4.92E-01 4.90E-01 4.85E-01 5.07E-01 5.13E-01 4.76E-01 5.11E-01 20 5.10E-01 4.70E-01 4.89E-01 4.71E-01 5.15E-01 4.82E-01 4.89E-01 4.92E-01 4.97E-01 5.14E-01 4.83E-01 5.03E-01 50 4.80E-01 4.57E-01 4.81E-01 4.49E-01 4.84E-01 4.57E-01 4.68E-01 4.64E-01 4.78E-01 4.77E-01 4.76E-01 4.98E-01 100 4.50E-01 4.27E-01 4.44E-01 4.15E-01 4.54E-01 4.23E-01 4.41E-01 4.38E-01 4.54E-01 4.50E-01 4.87E-01 4.98E-01 200 3.89E-01 3.72E-01 3.98E-01 3.71E-01 3.99E-01 3.65E-01 3.69E-01 3.78E-01 3.86E-01 3.83E-01 4.77E-01 5.18E-01 4.92E-01 1.99E-02 5.46E-01 4.37E-01 4.91E-01 2.11E-02 5.49E-01 4.33E-01 4.70E-01 1.60E-02 5.14E-01 4.26E-01 4.38E-01 1.65E-02 4.83E-01 3.93E-01 3.86E-01 1.36E-02 4.23E-01 3.48E-01 4.97E-01 1.20E-02 5.30E-01 4.65E-01 2.00E-01 PASS 4.95E-01 1.20E-02 5.28E-01 4.62E-01 1.20E-01 PASS 4.69E-01 8.87E-03 4.93E-01 4.44E-01 1.10E-01 PASS 4.41E-01 1.21E-02 4.74E-01 4.08E-01 7.00E-02 PASS 3.76E-01 8.98E-03 4.01E-01 3.52E-01 1.00E-02 PASS An ISO 9001:2000 Certified Company 88 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 5.00E-01 Positive Slew Rate 4 @ +/-15V (V/us) 4.50E-01 4.00E-01 3.50E-01 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.42. Plot of Positive Slew Rate 4 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 89 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.42. Raw data for Positive Slew Rate 4 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Slew Rate 4 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 4.88E-01 4.52E-01 4.35E-01 4.52E-01 4.84E-01 4.74E-01 4.68E-01 4.65E-01 4.53E-01 4.53E-01 4.53E-01 4.84E-01 20 4.89E-01 4.47E-01 4.29E-01 4.51E-01 4.80E-01 4.60E-01 4.54E-01 4.62E-01 4.52E-01 4.44E-01 4.60E-01 4.80E-01 50 4.65E-01 4.22E-01 4.21E-01 4.24E-01 4.62E-01 4.38E-01 4.38E-01 4.42E-01 4.27E-01 4.28E-01 4.57E-01 4.79E-01 100 4.27E-01 4.11E-01 4.00E-01 4.06E-01 4.33E-01 4.08E-01 4.11E-01 4.09E-01 3.99E-01 3.99E-01 4.52E-01 4.88E-01 200 3.78E-01 3.54E-01 3.52E-01 3.53E-01 3.71E-01 3.47E-01 3.52E-01 3.26E-01 3.43E-01 3.51E-01 4.43E-01 4.93E-01 4.62E-01 2.29E-02 5.25E-01 4.00E-01 4.59E-01 2.47E-02 5.27E-01 3.91E-01 4.39E-01 2.26E-02 5.01E-01 3.77E-01 4.15E-01 1.40E-02 4.54E-01 3.77E-01 3.62E-01 1.21E-02 3.95E-01 3.29E-01 4.63E-01 9.34E-03 4.88E-01 4.37E-01 2.00E-01 PASS 4.54E-01 7.13E-03 4.74E-01 4.35E-01 1.20E-01 PASS 4.35E-01 6.69E-03 4.53E-01 4.16E-01 1.10E-01 PASS 4.05E-01 5.76E-03 4.21E-01 3.89E-01 7.00E-02 PASS 3.44E-01 1.06E-02 3.73E-01 3.15E-01 1.00E-02 PASS An ISO 9001:2000 Certified Company 90 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Slew Rate 1 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.43. Plot of Negative Slew Rate 1 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 91 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.43. Raw data for Negative Slew Rate 1 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Slew Rate 1 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -5.95E-01 -5.43E-01 -5.15E-01 -5.30E-01 -6.04E-01 -5.31E-01 -5.54E-01 -5.36E-01 -5.33E-01 -5.18E-01 -5.39E-01 -5.82E-01 20 -5.62E-01 -5.26E-01 -5.10E-01 -5.10E-01 -5.65E-01 -5.38E-01 -5.47E-01 -5.44E-01 -5.24E-01 -5.32E-01 -5.34E-01 -5.84E-01 50 -5.38E-01 -5.01E-01 -4.87E-01 -5.12E-01 -5.57E-01 -5.10E-01 -5.17E-01 -5.21E-01 -5.11E-01 -4.98E-01 -5.29E-01 -5.54E-01 100 -5.10E-01 -4.86E-01 -4.62E-01 -4.79E-01 -4.96E-01 -4.80E-01 -4.98E-01 -4.80E-01 -4.61E-01 -4.59E-01 -5.26E-01 -5.82E-01 200 -4.49E-01 -4.23E-01 -4.09E-01 -4.15E-01 -4.40E-01 -4.06E-01 -4.15E-01 -4.15E-01 -4.06E-01 -4.06E-01 -5.30E-01 -5.73E-01 -5.57E-01 3.98E-02 -4.48E-01 -6.67E-01 -5.35E-01 2.72E-02 -4.60E-01 -6.09E-01 -5.19E-01 2.83E-02 -4.41E-01 -5.97E-01 -4.87E-01 1.80E-02 -4.37E-01 -5.36E-01 -4.27E-01 1.69E-02 -3.81E-01 -4.73E-01 -5.34E-01 1.29E-02 -4.99E-01 -5.70E-01 -2.00E-01 PASS -5.37E-01 9.27E-03 -5.12E-01 -5.62E-01 -1.20E-01 PASS -5.11E-01 8.73E-03 -4.87E-01 -5.35E-01 -1.10E-01 PASS -4.76E-01 1.60E-02 -4.32E-01 -5.20E-01 -7.00E-02 PASS -4.10E-01 4.93E-03 -3.96E-01 -4.23E-01 -1.00E-02 PASS An ISO 9001:2000 Certified Company 92 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Slew Rate 2 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.44. Plot of Negative Slew Rate 2 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 93 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.44. Raw data for Negative Slew Rate 2 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Slew Rate 2 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -5.42E-01 -5.03E-01 -5.42E-01 -5.04E-01 -5.48E-01 -5.13E-01 -5.31E-01 -5.26E-01 -5.47E-01 -5.45E-01 -5.05E-01 -5.28E-01 20 -5.47E-01 -4.95E-01 -5.20E-01 -4.81E-01 -5.47E-01 -5.18E-01 -5.34E-01 -5.16E-01 -5.38E-01 -5.34E-01 -4.99E-01 -5.52E-01 50 -5.08E-01 -4.83E-01 -5.05E-01 -4.81E-01 -5.16E-01 -4.83E-01 -5.08E-01 -5.00E-01 -5.06E-01 -5.03E-01 -4.99E-01 -5.49E-01 100 -4.73E-01 -4.49E-01 -4.68E-01 -4.44E-01 -4.89E-01 -4.48E-01 -4.74E-01 -4.55E-01 -4.67E-01 -4.79E-01 -5.02E-01 -5.21E-01 200 -4.07E-01 -3.89E-01 -4.14E-01 -3.83E-01 -4.24E-01 -3.91E-01 -3.77E-01 -3.94E-01 -3.97E-01 -4.01E-01 -5.06E-01 -5.32E-01 -5.28E-01 2.23E-02 -4.67E-01 -5.89E-01 -5.18E-01 2.99E-02 -4.36E-01 -6.00E-01 -4.99E-01 1.57E-02 -4.56E-01 -5.42E-01 -4.65E-01 1.83E-02 -4.14E-01 -5.15E-01 -4.03E-01 1.71E-02 -3.56E-01 -4.50E-01 -5.32E-01 1.41E-02 -4.94E-01 -5.71E-01 -2.00E-01 PASS -5.28E-01 1.02E-02 -5.00E-01 -5.56E-01 -1.20E-01 PASS -5.00E-01 9.97E-03 -4.73E-01 -5.27E-01 -1.10E-01 PASS -4.65E-01 1.29E-02 -4.29E-01 -5.00E-01 -7.00E-02 PASS -3.92E-01 9.17E-03 -3.67E-01 -4.17E-01 -1.00E-02 PASS An ISO 9001:2000 Certified Company 94 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Slew Rate 3 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.45. Plot of Negative Slew Rate 3 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 95 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.45. Raw data for Negative Slew Rate 3 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Slew Rate 3 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -5.71E-01 -5.32E-01 -5.41E-01 -5.27E-01 -5.84E-01 -5.33E-01 -5.44E-01 -5.54E-01 -5.53E-01 -5.68E-01 -5.31E-01 -5.67E-01 20 -5.53E-01 -5.34E-01 -5.39E-01 -5.06E-01 -5.75E-01 -5.29E-01 -5.55E-01 -5.47E-01 -5.48E-01 -5.54E-01 -5.32E-01 -5.74E-01 50 -5.52E-01 -5.16E-01 -5.24E-01 -4.96E-01 -5.66E-01 -5.12E-01 -5.14E-01 -5.28E-01 -5.42E-01 -5.43E-01 -5.32E-01 -5.87E-01 100 -5.03E-01 -4.77E-01 -4.98E-01 -4.79E-01 -5.16E-01 -4.72E-01 -4.76E-01 -4.85E-01 -4.90E-01 -5.18E-01 -5.37E-01 -5.45E-01 200 -4.41E-01 -4.14E-01 -4.41E-01 -4.23E-01 -4.44E-01 -4.05E-01 -4.15E-01 -4.15E-01 -4.27E-01 -4.33E-01 -5.40E-01 -5.54E-01 -5.51E-01 2.51E-02 -4.82E-01 -6.20E-01 -5.41E-01 2.54E-02 -4.72E-01 -6.11E-01 -5.31E-01 2.81E-02 -4.54E-01 -6.08E-01 -4.95E-01 1.65E-02 -4.49E-01 -5.40E-01 -4.33E-01 1.33E-02 -3.96E-01 -4.69E-01 -5.50E-01 1.30E-02 -5.15E-01 -5.86E-01 -2.00E-01 PASS -5.47E-01 1.05E-02 -5.18E-01 -5.75E-01 -1.20E-01 PASS -5.28E-01 1.48E-02 -4.87E-01 -5.68E-01 -1.10E-01 PASS -4.88E-01 1.81E-02 -4.39E-01 -5.38E-01 -7.00E-02 PASS -4.19E-01 1.10E-02 -3.89E-01 -4.49E-01 -1.00E-02 PASS An ISO 9001:2000 Certified Company 96 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Negative Slew Rate 4 @ +/-15V (V/us) 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.46. Plot of Negative Slew Rate 4 @ +/-15V (V/us) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 97 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.46. Raw data for Negative Slew Rate 4 @ +/-15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Slew Rate 4 @ +/-15V (V/us) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 -5.59E-01 -4.96E-01 -4.92E-01 -5.02E-01 -5.47E-01 -5.13E-01 -5.06E-01 -5.05E-01 -4.98E-01 -5.01E-01 -4.97E-01 -5.46E-01 20 -5.36E-01 -4.93E-01 -4.81E-01 -4.99E-01 -5.23E-01 -5.03E-01 -5.06E-01 -5.04E-01 -4.90E-01 -4.93E-01 -4.94E-01 -5.41E-01 50 -5.11E-01 -4.82E-01 -4.63E-01 -4.76E-01 -5.14E-01 -4.85E-01 -4.87E-01 -4.93E-01 -4.69E-01 -4.71E-01 -5.00E-01 -5.51E-01 100 -4.84E-01 -4.61E-01 -4.34E-01 -4.48E-01 -4.76E-01 -4.53E-01 -4.56E-01 -4.56E-01 -4.41E-01 -4.46E-01 -4.97E-01 -5.42E-01 200 -4.19E-01 -3.91E-01 -3.88E-01 -3.91E-01 -3.98E-01 -3.89E-01 -3.95E-01 -3.97E-01 -4.01E-01 -3.96E-01 -4.89E-01 -5.35E-01 -5.19E-01 3.13E-02 -4.33E-01 -6.05E-01 -5.06E-01 2.25E-02 -4.45E-01 -5.68E-01 -4.89E-01 2.24E-02 -4.28E-01 -5.51E-01 -4.61E-01 2.03E-02 -4.05E-01 -5.16E-01 -3.97E-01 1.26E-02 -3.63E-01 -4.32E-01 -5.05E-01 5.68E-03 -4.89E-01 -5.20E-01 -2.00E-01 PASS -4.99E-01 7.19E-03 -4.79E-01 -5.19E-01 -1.20E-01 PASS -4.81E-01 1.05E-02 -4.52E-01 -5.10E-01 -1.10E-01 PASS -4.50E-01 6.66E-03 -4.32E-01 -4.69E-01 -7.00E-02 PASS -3.96E-01 4.34E-03 -3.84E-01 -4.07E-01 -1.00E-02 PASS An ISO 9001:2000 Certified Company 98 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Supply Current @ +5V (A) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.47. Plot of Positive Supply Current @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 99 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.47. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Supply Current @ +5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 0 1.29E-03 1.38E-03 1.30E-03 1.34E-03 1.35E-03 1.35E-03 1.27E-03 1.38E-03 1.33E-03 1.36E-03 1.32E-03 1.38E-03 20 1.32E-03 1.39E-03 1.35E-03 1.34E-03 1.39E-03 1.37E-03 1.35E-03 1.42E-03 1.37E-03 1.34E-03 1.33E-03 1.39E-03 50 1.26E-03 1.30E-03 1.27E-03 1.28E-03 1.27E-03 1.27E-03 1.27E-03 1.34E-03 1.27E-03 1.27E-03 1.32E-03 1.35E-03 100 1.07E-03 1.15E-03 1.11E-03 1.13E-03 1.11E-03 1.11E-03 1.11E-03 1.17E-03 1.11E-03 1.12E-03 1.32E-03 1.37E-03 200 8.53E-04 9.15E-04 9.15E-04 8.84E-04 9.02E-04 8.52E-04 8.28E-04 9.43E-04 9.01E-04 8.95E-04 1.31E-03 1.37E-03 1.33E-03 3.82E-05 1.44E-03 1.23E-03 1.36E-03 3.15E-05 1.44E-03 1.27E-03 1.27E-03 1.71E-05 1.32E-03 1.23E-03 1.11E-03 3.00E-05 1.19E-03 1.03E-03 8.94E-04 2.61E-05 9.65E-04 8.22E-04 1.34E-03 4.11E-05 1.45E-03 1.22E-03 2.00E-03 PASS 1.37E-03 2.86E-05 1.45E-03 1.29E-03 2.00E-03 PASS 1.28E-03 3.22E-05 1.37E-03 1.20E-03 2.00E-03 PASS 1.12E-03 2.38E-05 1.19E-03 1.06E-03 2.00E-03 PASS 8.84E-04 4.49E-05 1.01E-03 7.61E-04 2.00E-03 PASS An ISO 9001:2000 Certified Company 100 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Supply Current @ +5V (A) 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 -2.00E-03 -2.50E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.48. Plot of Negative Supply Current @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 101 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.48. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Supply Current @ +5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 -1.27E-03 -1.36E-03 -1.29E-03 -1.33E-03 -1.32E-03 -1.30E-03 -1.27E-03 -1.35E-03 -1.33E-03 -1.32E-03 -1.29E-03 -1.35E-03 20 -1.29E-03 -1.36E-03 -1.32E-03 -1.34E-03 -1.34E-03 -1.34E-03 -1.32E-03 -1.41E-03 -1.35E-03 -1.35E-03 -1.29E-03 -1.35E-03 50 -1.23E-03 -1.28E-03 -1.24E-03 -1.27E-03 -1.24E-03 -1.25E-03 -1.23E-03 -1.31E-03 -1.27E-03 -1.25E-03 -1.29E-03 -1.36E-03 100 -1.04E-03 -1.13E-03 -1.10E-03 -1.10E-03 -1.08E-03 -1.10E-03 -1.08E-03 -1.15E-03 -1.11E-03 -1.10E-03 -1.29E-03 -1.35E-03 200 -8.45E-04 -9.11E-04 -8.92E-04 -8.92E-04 -8.72E-04 -8.45E-04 -8.37E-04 -9.08E-04 -8.81E-04 -8.55E-04 -1.28E-03 -1.35E-03 -1.31E-03 3.67E-05 -1.21E-03 -1.41E-03 -1.33E-03 2.45E-05 -1.26E-03 -1.40E-03 -1.25E-03 2.04E-05 -1.19E-03 -1.31E-03 -1.09E-03 3.29E-05 -1.00E-03 -1.18E-03 -8.82E-04 2.50E-05 -8.14E-04 -9.51E-04 -1.32E-03 2.92E-05 -1.24E-03 -1.40E-03 -2.00E-03 PASS -1.35E-03 3.49E-05 -1.26E-03 -1.45E-03 -2.00E-03 PASS -1.26E-03 2.82E-05 -1.18E-03 -1.34E-03 -2.00E-03 PASS -1.11E-03 2.72E-05 -1.03E-03 -1.18E-03 -2.00E-03 PASS -8.65E-04 2.91E-05 -7.85E-04 -9.45E-04 -2.00E-03 PASS An ISO 9001:2000 Certified Company 102 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 1 @ +5V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.49. Plot of Offset Voltage 1 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 103 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.49. Raw data for Offset Voltage 1 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 1 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -5.16E-05 1.91E-05 1.45E-06 -5.63E-05 2.26E-05 -4.44E-05 -1.21E-05 6.05E-05 -1.12E-05 -6.11E-05 5.20E-06 3.25E-05 20 -5.28E-05 3.14E-05 1.38E-05 -3.75E-05 3.81E-05 -3.24E-05 -1.58E-05 6.67E-05 1.02E-05 -4.66E-05 3.88E-06 3.23E-05 50 -3.20E-05 6.47E-05 4.61E-05 -1.21E-05 5.82E-05 -8.69E-06 5.57E-06 1.03E-04 4.61E-05 -6.27E-06 5.33E-06 3.23E-05 100 -8.08E-06 1.20E-04 9.66E-05 2.75E-05 8.93E-05 3.30E-05 5.09E-05 1.61E-04 1.17E-04 5.64E-05 5.69E-06 3.38E-05 200 5.12E-05 2.21E-04 1.82E-04 1.06E-04 1.48E-04 1.34E-04 1.57E-04 2.81E-04 2.45E-04 1.85E-04 6.41E-06 3.19E-05 -1.29E-05 3.83E-05 9.21E-05 -1.18E-04 -1.41E-06 4.13E-05 1.12E-04 -1.15E-04 2.50E-05 4.40E-05 1.46E-04 -9.57E-05 6.51E-05 5.33E-05 2.11E-04 -8.11E-05 1.41E-04 6.58E-05 3.22E-04 -3.90E-05 -1.37E-05 4.67E-05 1.14E-04 -1.42E-04 -4.50E-04 PASS 4.50E-04 PASS -3.59E-06 4.46E-05 1.19E-04 -1.26E-04 -6.00E-04 PASS 6.00E-04 PASS 2.80E-05 4.74E-05 1.58E-04 -1.02E-04 -7.50E-04 PASS 7.50E-04 PASS 8.36E-05 5.35E-05 2.30E-04 -6.32E-05 -9.00E-04 PASS 9.00E-04 PASS 2.00E-04 6.13E-05 3.68E-04 3.22E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 104 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 2 @ +5V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.50. Plot of Offset Voltage 2 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 105 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.50. Raw data for Offset Voltage 2 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 2 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -2.83E-05 -5.39E-05 -1.07E-04 -3.97E-05 -9.30E-06 -5.94E-05 -1.18E-04 2.72E-05 -6.39E-05 -5.51E-05 -2.99E-05 -3.32E-05 20 -3.83E-05 -4.27E-05 -1.00E-04 -4.31E-05 -1.13E-05 -4.38E-05 -1.13E-04 3.99E-05 -4.40E-05 -4.79E-05 -3.18E-05 -3.40E-05 50 -1.46E-05 -6.27E-06 -8.28E-05 -9.17E-06 5.93E-06 -1.54E-05 -9.11E-05 7.14E-05 -1.51E-05 -2.29E-05 -3.07E-05 -3.50E-05 100 1.27E-05 5.63E-05 -6.12E-05 3.65E-05 2.63E-05 4.03E-05 -4.61E-05 1.38E-04 3.50E-05 2.94E-05 -3.05E-05 -3.31E-05 200 9.01E-05 1.69E-04 -2.00E-05 1.32E-04 7.29E-05 1.62E-04 5.33E-05 2.61E-04 1.35E-04 1.30E-04 -3.02E-05 -3.30E-05 -4.75E-05 3.68E-05 5.33E-05 -1.48E-04 -4.71E-05 3.25E-05 4.19E-05 -1.36E-04 -2.14E-05 3.52E-05 7.50E-05 -1.18E-04 1.41E-05 4.50E-05 1.38E-04 -1.09E-04 8.87E-05 7.14E-05 2.84E-04 -1.07E-04 -5.38E-05 5.20E-05 8.86E-05 -1.96E-04 -4.50E-04 PASS 4.50E-04 PASS -4.17E-05 5.42E-05 1.07E-04 -1.90E-04 -6.00E-04 PASS 6.00E-04 PASS -1.46E-05 5.77E-05 1.44E-04 -1.73E-04 -7.50E-04 PASS 7.50E-04 PASS 3.93E-05 6.54E-05 2.19E-04 -1.40E-04 -9.00E-04 PASS 9.00E-04 PASS 1.48E-04 7.49E-05 3.54E-04 -5.71E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 106 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 3 @ +5V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.51. Plot of Offset Voltage 3 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 107 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.51. Raw data for Offset Voltage 3 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 3 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 8.70E-06 2.56E-05 3.02E-06 1.51E-05 7.23E-05 -3.42E-05 -5.29E-05 3.26E-06 -1.42E-05 -5.04E-05 -2.53E-06 -2.91E-05 20 1.90E-05 4.74E-05 2.31E-05 3.71E-05 7.56E-05 -1.90E-05 -4.29E-05 1.52E-05 1.46E-06 -4.19E-05 -1.80E-06 -2.73E-05 50 4.63E-05 7.10E-05 4.69E-05 7.04E-05 9.51E-05 1.04E-05 -1.87E-05 5.03E-05 2.75E-05 -1.64E-05 -3.01E-06 -2.80E-05 100 8.21E-05 1.22E-04 8.96E-05 1.25E-04 1.26E-04 6.06E-05 2.38E-05 1.08E-04 7.98E-05 1.92E-05 -3.13E-06 -2.78E-05 200 1.51E-04 2.17E-04 1.67E-04 2.32E-04 1.95E-04 1.78E-04 1.30E-04 2.34E-04 1.86E-04 1.02E-04 2.51E-07 -2.80E-05 2.50E-05 2.78E-05 1.01E-04 -5.12E-05 4.04E-05 2.27E-05 1.03E-04 -2.18E-05 6.59E-05 2.03E-05 1.22E-04 1.03E-05 1.09E-04 2.13E-05 1.67E-04 5.06E-05 1.92E-04 3.38E-05 2.85E-04 9.97E-05 -2.97E-05 2.40E-05 3.62E-05 -9.56E-05 -4.50E-04 PASS 4.50E-04 PASS -1.74E-05 2.58E-05 5.35E-05 -8.83E-05 -6.00E-04 PASS 6.00E-04 PASS 1.06E-05 2.94E-05 9.11E-05 -6.99E-05 -7.50E-04 PASS 7.50E-04 PASS 5.82E-05 3.75E-05 1.61E-04 -4.46E-05 -9.00E-04 PASS 9.00E-04 PASS 1.66E-04 5.14E-05 3.07E-04 2.50E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 108 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-03 Offset Voltage 4 @ +5V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 -1.00E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.52. Plot of Offset Voltage 4 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 109 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.52. Raw data for Offset Voltage 4 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Voltage 4 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -4.17E-05 -7.00E-05 -2.61E-05 -9.09E-05 -6.20E-05 -2.96E-05 -6.77E-05 -1.47E-04 -7.85E-05 3.49E-05 -1.21E-05 6.89E-06 20 -3.68E-05 -5.48E-05 -1.62E-05 -8.39E-05 -5.95E-05 -1.05E-05 -6.51E-05 -1.36E-04 -6.18E-05 4.96E-05 -1.38E-05 5.33E-06 50 -1.35E-05 -2.57E-05 1.14E-05 -5.41E-05 -3.75E-05 2.46E-05 -3.83E-05 -1.00E-04 -2.38E-05 8.31E-05 -1.28E-05 5.45E-06 100 1.32E-05 1.52E-05 5.40E-05 -5.30E-06 -1.11E-05 7.67E-05 1.87E-05 -2.86E-05 4.26E-05 1.46E-04 -1.16E-05 6.05E-06 200 7.74E-05 1.05E-04 1.14E-04 8.88E-05 3.84E-05 2.00E-04 1.16E-04 9.54E-05 1.80E-04 2.85E-04 -1.32E-05 6.41E-06 -5.81E-05 2.52E-05 1.08E-05 -1.27E-04 -5.03E-05 2.54E-05 1.94E-05 -1.20E-04 -2.39E-05 2.48E-05 4.40E-05 -9.18E-05 1.32E-05 2.55E-05 8.31E-05 -5.67E-05 8.47E-05 2.95E-05 1.66E-04 3.73E-06 -5.77E-05 6.70E-05 1.26E-04 -2.41E-04 -4.50E-04 PASS 4.50E-04 PASS -4.48E-05 6.93E-05 1.45E-04 -2.35E-04 -6.00E-04 PASS 6.00E-04 PASS -1.09E-05 6.89E-05 1.78E-04 -2.00E-04 -7.50E-04 PASS 7.50E-04 PASS 5.11E-05 6.54E-05 2.30E-04 -1.28E-04 -9.00E-04 PASS 9.00E-04 PASS 1.75E-04 7.50E-05 3.81E-04 -3.04E-05 -9.00E-04 PASS 9.00E-04 PASS An ISO 9001:2000 Certified Company 110 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-08 Offset Current 1 @ +5V (A) 2.00E-08 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 -2.50E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.53. Plot of Offset Current 1 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 111 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.53. Raw data for Offset Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 1 @ +5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -1.14E-10 -4.70E-11 2.20E-11 1.01E-10 1.00E-11 -3.70E-11 -4.40E-11 2.10E-11 5.00E-11 0.00E+00 -3.60E-11 -1.97E-10 20 -1.02E-10 -3.50E-11 4.60E-11 8.80E-11 5.70E-11 -7.30E-11 -4.60E-11 -2.60E-11 1.52E-10 -6.60E-11 -6.90E-11 -2.51E-10 50 4.10E-10 -5.40E-11 1.63E-10 1.11E-10 1.81E-10 9.30E-11 1.72E-10 -4.40E-11 1.97E-10 -2.33E-10 -4.80E-11 -2.02E-10 100 6.66E-10 1.97E-10 4.04E-10 3.72E-10 6.81E-10 5.98E-10 9.04E-10 2.48E-10 4.25E-10 -4.00E-11 -8.90E-11 -2.31E-10 200 1.55E-09 5.60E-10 1.03E-09 6.08E-10 1.92E-09 1.72E-09 2.34E-09 4.31E-10 1.20E-09 9.46E-10 -1.02E-10 -1.96E-10 -5.60E-12 8.04E-11 2.15E-10 -2.26E-10 1.08E-11 7.77E-11 2.24E-10 -2.02E-10 1.62E-10 1.67E-10 6.19E-10 -2.95E-10 4.64E-10 2.07E-10 1.03E-09 -1.03E-10 1.13E-09 5.93E-10 2.76E-09 -4.95E-10 -2.00E-12 3.95E-11 1.06E-10 -1.10E-10 -1.00E-08 PASS 1.00E-08 PASS -1.18E-11 9.34E-11 2.44E-10 -2.68E-10 -1.00E-08 PASS 1.00E-08 PASS 3.70E-11 1.78E-10 5.24E-10 -4.50E-10 -1.50E-08 PASS 1.50E-08 PASS 4.27E-10 3.56E-10 1.40E-09 -5.49E-10 -2.00E-08 PASS 2.00E-08 PASS 1.33E-09 7.32E-10 3.33E-09 -6.80E-10 -2.00E-08 PASS 2.00E-08 PASS An ISO 9001:2000 Certified Company 112 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-08 Offset Current 2 @ +5V (A) 2.00E-08 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 -2.50E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.54. Plot of Offset Current 2 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 113 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.54. Raw data for Offset Current 2 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 2 @ +5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -5.70E-11 -5.10E-11 1.47E-10 -8.00E-12 -6.80E-11 -9.00E-11 5.00E-12 3.40E-11 -3.70E-11 -9.70E-11 1.03E-10 -4.00E-11 20 -5.40E-11 -3.00E-11 1.84E-10 -1.20E-11 5.60E-11 -1.24E-10 -7.60E-11 -2.00E-11 9.70E-11 -7.00E-11 8.10E-11 -2.30E-11 50 4.18E-10 1.61E-10 1.48E-10 1.52E-10 3.81E-10 8.80E-11 4.90E-11 4.50E-11 1.41E-10 8.60E-11 1.01E-10 -3.00E-11 100 8.61E-10 -1.80E-11 6.85E-10 6.61E-10 9.10E-10 4.02E-10 5.42E-10 3.22E-10 7.02E-10 5.97E-10 6.60E-11 -6.40E-11 200 1.83E-09 5.69E-10 1.47E-09 1.27E-09 2.21E-09 1.59E-09 1.91E-09 4.74E-10 2.06E-09 2.54E-09 7.70E-11 -2.70E-11 -7.40E-12 8.93E-11 2.37E-10 -2.52E-10 2.88E-11 9.59E-11 2.92E-10 -2.34E-10 2.52E-10 1.35E-10 6.23E-10 -1.19E-10 6.20E-10 3.73E-10 1.64E-09 -4.02E-10 1.47E-09 6.19E-10 3.17E-09 -2.28E-10 -3.70E-11 5.75E-11 1.21E-10 -1.95E-10 -1.00E-08 PASS 1.00E-08 PASS -3.86E-11 8.43E-11 1.92E-10 -2.70E-10 -1.00E-08 PASS 1.00E-08 PASS 8.18E-11 3.87E-11 1.88E-10 -2.43E-11 -1.50E-08 PASS 1.50E-08 PASS 5.13E-10 1.52E-10 9.30E-10 9.62E-11 -2.00E-08 PASS 2.00E-08 PASS 1.72E-09 7.73E-10 3.83E-09 -4.04E-10 -2.00E-08 PASS 2.00E-08 PASS An ISO 9001:2000 Certified Company 114 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-08 Offset Current 3 @ +5V (A) 2.00E-08 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 -2.50E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.55. Plot of Offset Current 3 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 115 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.55. Raw data for Offset Current 3 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 3 @ +5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -1.48E-10 -7.40E-11 -5.80E-11 5.60E-11 8.00E-12 -3.30E-11 4.30E-11 5.40E-11 2.00E-11 2.00E-12 1.09E-10 -1.31E-10 20 -7.00E-12 -5.40E-11 -7.40E-11 7.40E-11 -2.40E-11 3.00E-11 1.34E-10 4.40E-11 1.90E-10 -4.80E-11 8.80E-11 -1.33E-10 50 2.98E-10 1.00E-11 9.20E-11 2.23E-10 -1.50E-11 2.01E-10 2.43E-10 -8.70E-11 2.06E-10 2.72E-10 8.10E-11 -1.44E-10 100 7.88E-10 3.37E-10 5.74E-10 5.43E-10 5.16E-10 5.29E-10 6.42E-10 1.70E-10 5.24E-10 8.97E-10 9.10E-11 -8.90E-11 200 1.70E-09 6.37E-10 1.37E-09 1.03E-09 1.71E-09 1.61E-09 2.06E-09 4.14E-10 1.91E-09 2.64E-09 8.00E-11 -1.21E-10 -4.32E-11 7.84E-11 1.72E-10 -2.58E-10 -1.70E-11 5.71E-11 1.40E-10 -1.74E-10 1.22E-10 1.35E-10 4.93E-10 -2.50E-10 5.52E-10 1.61E-10 9.93E-10 1.10E-10 1.29E-09 4.59E-10 2.55E-09 3.03E-11 1.72E-11 3.46E-11 1.12E-10 -7.76E-11 -1.00E-08 PASS 1.00E-08 PASS 7.00E-11 9.31E-11 3.25E-10 -1.85E-10 -1.00E-08 PASS 1.00E-08 PASS 1.67E-10 1.45E-10 5.64E-10 -2.30E-10 -1.50E-08 PASS 1.50E-08 PASS 5.52E-10 2.62E-10 1.27E-09 -1.66E-10 -2.00E-08 PASS 2.00E-08 PASS 1.73E-09 8.24E-10 3.99E-09 -5.31E-10 -2.00E-08 PASS 2.00E-08 PASS An ISO 9001:2000 Certified Company 116 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-08 Offset Current 4 @ +5V (A) 2.00E-08 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 -2.50E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.56. Plot of Offset Current 4 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 117 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.56. Raw data for Offset Current 4 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Offset Current 4 @ +5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 -1.15E-10 -7.40E-11 4.60E-11 -4.70E-11 2.20E-11 -4.90E-11 1.30E-11 1.00E-10 5.60E-11 -5.80E-11 9.40E-11 -1.03E-10 20 -7.10E-11 -6.40E-11 4.80E-11 -1.04E-10 -3.10E-11 -9.00E-11 -9.30E-11 -1.50E-11 -1.40E-11 4.30E-11 8.40E-11 -1.01E-10 50 1.61E-10 -1.12E-10 1.62E-10 -1.06E-10 -1.08E-10 -2.90E-11 -1.36E-10 -1.94E-10 -6.20E-11 1.05E-10 5.50E-11 -9.00E-11 100 5.90E-10 2.63E-10 4.38E-10 1.49E-10 2.59E-10 5.18E-10 3.67E-10 -1.54E-10 2.68E-10 4.91E-10 3.90E-11 -1.01E-10 200 1.83E-09 1.37E-09 1.50E-09 1.11E-09 1.85E-09 1.79E-09 2.22E-09 4.64E-10 1.30E-09 1.72E-09 5.20E-11 -1.08E-10 -3.36E-11 6.68E-11 1.50E-10 -2.17E-10 -4.44E-11 5.78E-11 1.14E-10 -2.03E-10 -6.00E-13 1.48E-10 4.05E-10 -4.06E-10 3.40E-10 1.74E-10 8.17E-10 -1.37E-10 1.53E-09 3.15E-10 2.39E-09 6.68E-10 1.24E-11 6.76E-11 1.98E-10 -1.73E-10 -1.00E-08 PASS 1.00E-08 PASS -3.38E-11 5.77E-11 1.24E-10 -1.92E-10 -1.00E-08 PASS 1.00E-08 PASS -6.32E-11 1.14E-10 2.49E-10 -3.75E-10 -1.50E-08 PASS 1.50E-08 PASS 2.98E-10 2.72E-10 1.04E-09 -4.47E-10 -2.00E-08 PASS 2.00E-08 PASS 1.50E-09 6.65E-10 3.32E-09 -3.24E-10 -2.00E-08 PASS 2.00E-08 PASS An ISO 9001:2000 Certified Company 118 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 1 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.57. Plot of Positive Bias Current 1 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 119 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.57. Raw data for Positive Bias Current 1 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 1 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.10E-08 1.33E-08 1.31E-08 1.23E-08 1.21E-08 1.21E-08 1.20E-08 1.23E-08 1.25E-08 1.29E-08 1.27E-08 1.20E-08 20 1.56E-08 1.79E-08 1.76E-08 1.71E-08 1.76E-08 1.65E-08 1.70E-08 1.71E-08 1.70E-08 1.81E-08 1.28E-08 1.20E-08 50 2.39E-08 2.71E-08 2.62E-08 2.58E-08 2.77E-08 2.48E-08 2.59E-08 2.55E-08 2.53E-08 2.74E-08 1.28E-08 1.20E-08 100 3.73E-08 4.14E-08 4.01E-08 3.98E-08 4.34E-08 3.79E-08 3.95E-08 3.91E-08 3.87E-08 4.17E-08 1.28E-08 1.20E-08 200 6.01E-08 6.63E-08 6.29E-08 6.27E-08 6.95E-08 6.04E-08 6.31E-08 6.19E-08 6.04E-08 6.54E-08 1.27E-08 1.20E-08 1.24E-08 9.21E-10 1.49E-08 9.85E-09 1.72E-08 9.13E-10 1.97E-08 1.47E-08 2.61E-08 1.45E-09 3.01E-08 2.22E-08 4.04E-08 2.23E-09 4.65E-08 3.43E-08 6.43E-08 3.65E-09 7.43E-08 5.43E-08 1.24E-08 3.45E-10 1.33E-08 1.14E-08 -5.00E-08 PASS 5.00E-08 PASS 1.72E-08 5.93E-10 1.88E-08 1.55E-08 -1.00E-07 PASS 1.00E-07 PASS 2.58E-08 9.75E-10 2.84E-08 2.31E-08 -1.25E-07 PASS 1.25E-07 PASS 3.94E-08 1.41E-09 4.32E-08 3.55E-08 -2.00E-07 PASS 2.00E-07 PASS 6.22E-08 2.08E-09 6.79E-08 5.65E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 120 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 2 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.58. Plot of Positive Bias Current 2 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 121 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.58. Raw data for Positive Bias Current 2 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 2 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.08E-08 1.29E-08 1.13E-08 1.21E-08 1.11E-08 1.20E-08 1.12E-08 1.18E-08 1.09E-08 1.12E-08 1.20E-08 1.20E-08 20 1.53E-08 1.74E-08 1.56E-08 1.69E-08 1.66E-08 1.65E-08 1.61E-08 1.66E-08 1.50E-08 1.57E-08 1.21E-08 1.20E-08 50 2.36E-08 2.65E-08 2.39E-08 2.57E-08 2.62E-08 2.45E-08 2.45E-08 2.48E-08 2.24E-08 2.36E-08 1.20E-08 1.20E-08 100 3.66E-08 4.08E-08 3.69E-08 3.98E-08 4.15E-08 3.70E-08 3.69E-08 3.78E-08 3.42E-08 3.59E-08 1.20E-08 1.20E-08 200 5.90E-08 6.50E-08 5.83E-08 6.28E-08 6.67E-08 5.80E-08 5.86E-08 5.96E-08 5.30E-08 5.59E-08 1.20E-08 1.19E-08 1.16E-08 8.49E-10 1.40E-08 9.31E-09 1.64E-08 8.98E-10 1.88E-08 1.39E-08 2.52E-08 1.32E-09 2.88E-08 2.16E-08 3.91E-08 2.24E-09 4.53E-08 3.30E-08 6.24E-08 3.68E-09 7.25E-08 5.23E-08 1.14E-08 4.47E-10 1.27E-08 1.02E-08 -5.00E-08 PASS 5.00E-08 PASS 1.60E-08 6.39E-10 1.77E-08 1.42E-08 -1.00E-07 PASS 1.00E-07 PASS 2.39E-08 9.54E-10 2.66E-08 2.13E-08 -1.25E-07 PASS 1.25E-07 PASS 3.64E-08 1.38E-09 4.02E-08 3.26E-08 -2.00E-07 PASS 2.00E-07 PASS 5.70E-08 2.63E-09 6.42E-08 4.98E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 122 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 3 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.59. Plot of Positive Bias Current 3 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 123 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.59. Raw data for Positive Bias Current 3 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 3 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.13E-08 1.32E-08 1.25E-08 1.24E-08 1.20E-08 1.25E-08 1.17E-08 1.22E-08 1.19E-08 1.16E-08 1.29E-08 1.24E-08 20 1.58E-08 1.79E-08 1.71E-08 1.72E-08 1.77E-08 1.70E-08 1.66E-08 1.69E-08 1.62E-08 1.62E-08 1.30E-08 1.24E-08 50 2.44E-08 2.74E-08 2.57E-08 2.62E-08 2.83E-08 2.55E-08 2.51E-08 2.53E-08 2.41E-08 2.45E-08 1.30E-08 1.24E-08 100 3.76E-08 4.19E-08 3.95E-08 4.08E-08 4.45E-08 3.86E-08 3.81E-08 3.85E-08 3.67E-08 3.72E-08 1.30E-08 1.24E-08 200 6.06E-08 6.74E-08 6.23E-08 6.43E-08 7.16E-08 6.07E-08 6.02E-08 6.04E-08 5.64E-08 5.80E-08 1.29E-08 1.24E-08 1.23E-08 7.22E-10 1.43E-08 1.03E-08 1.72E-08 8.18E-10 1.94E-08 1.49E-08 2.64E-08 1.50E-09 3.05E-08 2.23E-08 4.09E-08 2.58E-09 4.79E-08 3.38E-08 6.52E-08 4.36E-09 7.72E-08 5.33E-08 1.20E-08 3.83E-10 1.30E-08 1.09E-08 -5.00E-08 PASS 5.00E-08 PASS 1.66E-08 3.63E-10 1.76E-08 1.56E-08 -1.00E-07 PASS 1.00E-07 PASS 2.49E-08 5.97E-10 2.65E-08 2.33E-08 -1.25E-07 PASS 1.25E-07 PASS 3.78E-08 8.44E-10 4.01E-08 3.55E-08 -2.00E-07 PASS 2.00E-07 PASS 5.92E-08 1.85E-09 6.42E-08 5.41E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 124 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Bias Current 4 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.60. Plot of Positive Bias Current 4 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 125 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.60. Raw data for Positive Bias Current 4 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Bias Current 4 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.06E-08 1.29E-08 1.19E-08 1.27E-08 1.17E-08 1.22E-08 1.16E-08 1.19E-08 1.21E-08 1.28E-08 1.23E-08 1.16E-08 20 1.51E-08 1.73E-08 1.63E-08 1.75E-08 1.74E-08 1.67E-08 1.65E-08 1.66E-08 1.68E-08 1.76E-08 1.23E-08 1.17E-08 50 2.32E-08 2.63E-08 2.44E-08 2.64E-08 2.72E-08 2.52E-08 2.53E-08 2.50E-08 2.49E-08 2.67E-08 1.24E-08 1.16E-08 100 3.59E-08 4.01E-08 3.74E-08 4.05E-08 4.26E-08 3.81E-08 3.84E-08 3.84E-08 3.80E-08 4.06E-08 1.24E-08 1.16E-08 200 5.77E-08 6.35E-08 5.86E-08 6.32E-08 6.77E-08 6.03E-08 6.10E-08 6.02E-08 5.90E-08 6.34E-08 1.23E-08 1.16E-08 1.20E-08 9.34E-10 1.45E-08 9.41E-09 1.67E-08 1.02E-09 1.95E-08 1.39E-08 2.55E-08 1.62E-09 2.99E-08 2.10E-08 3.93E-08 2.65E-09 4.65E-08 3.20E-08 6.21E-08 4.05E-09 7.32E-08 5.10E-08 1.21E-08 4.27E-10 1.33E-08 1.10E-08 -5.00E-08 PASS 5.00E-08 PASS 1.68E-08 4.51E-10 1.81E-08 1.56E-08 -1.00E-07 PASS 1.00E-07 PASS 2.54E-08 7.17E-10 2.74E-08 2.34E-08 -1.25E-07 PASS 1.25E-07 PASS 3.87E-08 1.10E-09 4.17E-08 3.57E-08 -2.00E-07 PASS 2.00E-07 PASS 6.08E-08 1.62E-09 6.52E-08 5.63E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 126 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 1 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.61. Plot of Negative Bias Current 1 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 127 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.61. Raw data for Negative Bias Current 1 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 1 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.09E-08 1.33E-08 1.31E-08 1.24E-08 1.22E-08 1.21E-08 1.20E-08 1.24E-08 1.26E-08 1.30E-08 1.27E-08 1.18E-08 20 1.56E-08 1.79E-08 1.77E-08 1.72E-08 1.78E-08 1.64E-08 1.71E-08 1.71E-08 1.72E-08 1.80E-08 1.28E-08 1.19E-08 50 2.43E-08 2.71E-08 2.64E-08 2.60E-08 2.80E-08 2.50E-08 2.62E-08 2.55E-08 2.55E-08 2.72E-08 1.28E-08 1.19E-08 100 3.80E-08 4.17E-08 4.06E-08 4.03E-08 4.41E-08 3.85E-08 4.05E-08 3.95E-08 3.92E-08 4.17E-08 1.28E-08 1.18E-08 200 6.18E-08 6.70E-08 6.41E-08 6.34E-08 7.17E-08 6.23E-08 6.56E-08 6.25E-08 6.17E-08 6.64E-08 1.27E-08 1.18E-08 1.24E-08 9.30E-10 1.49E-08 9.83E-09 1.73E-08 9.42E-10 1.98E-08 1.47E-08 2.64E-08 1.37E-09 3.01E-08 2.26E-08 4.09E-08 2.23E-09 4.70E-08 3.48E-08 6.56E-08 3.88E-09 7.62E-08 5.50E-08 1.24E-08 4.05E-10 1.35E-08 1.13E-08 -5.00E-08 PASS 5.00E-08 PASS 1.72E-08 5.50E-10 1.87E-08 1.57E-08 -1.00E-07 PASS 1.00E-07 PASS 2.59E-08 8.43E-10 2.82E-08 2.36E-08 -1.25E-07 PASS 1.25E-07 PASS 3.99E-08 1.22E-09 4.32E-08 3.65E-08 -2.00E-07 PASS 2.00E-07 PASS 6.37E-08 2.14E-09 6.96E-08 5.78E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 128 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 2 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.62. Plot of Negative Bias Current 2 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 129 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.62. Raw data for Negative Bias Current 2 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 2 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.08E-08 1.29E-08 1.15E-08 1.20E-08 1.11E-08 1.19E-08 1.13E-08 1.19E-08 1.09E-08 1.11E-08 1.21E-08 1.19E-08 20 1.54E-08 1.74E-08 1.59E-08 1.69E-08 1.67E-08 1.64E-08 1.61E-08 1.66E-08 1.52E-08 1.56E-08 1.22E-08 1.20E-08 50 2.40E-08 2.67E-08 2.42E-08 2.59E-08 2.67E-08 2.46E-08 2.46E-08 2.48E-08 2.26E-08 2.38E-08 1.21E-08 1.20E-08 100 3.75E-08 4.09E-08 3.77E-08 4.05E-08 4.25E-08 3.75E-08 3.76E-08 3.82E-08 3.49E-08 3.66E-08 1.22E-08 1.20E-08 200 6.11E-08 6.57E-08 5.99E-08 6.42E-08 6.90E-08 5.97E-08 6.07E-08 6.03E-08 5.52E-08 5.85E-08 1.21E-08 1.19E-08 1.17E-08 8.36E-10 1.40E-08 9.37E-09 1.64E-08 8.22E-10 1.87E-08 1.42E-08 2.55E-08 1.31E-09 2.91E-08 2.19E-08 3.98E-08 2.16E-09 4.57E-08 3.39E-08 6.40E-08 3.67E-09 7.41E-08 5.39E-08 1.14E-08 4.67E-10 1.27E-08 1.02E-08 -5.00E-08 PASS 5.00E-08 PASS 1.60E-08 5.96E-10 1.76E-08 1.44E-08 -1.00E-07 PASS 1.00E-07 PASS 2.41E-08 8.99E-10 2.65E-08 2.16E-08 -1.25E-07 PASS 1.25E-07 PASS 3.70E-08 1.28E-09 4.05E-08 3.35E-08 -2.00E-07 PASS 2.00E-07 PASS 5.89E-08 2.22E-09 6.49E-08 5.28E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 130 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 3 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.63. Plot of Negative Bias Current 3 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 131 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.63. Raw data for Negative Bias Current 3 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 3 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.12E-08 1.32E-08 1.25E-08 1.24E-08 1.20E-08 1.25E-08 1.18E-08 1.22E-08 1.20E-08 1.16E-08 1.31E-08 1.23E-08 20 1.59E-08 1.78E-08 1.70E-08 1.74E-08 1.78E-08 1.71E-08 1.68E-08 1.70E-08 1.64E-08 1.62E-08 1.31E-08 1.22E-08 50 2.47E-08 2.74E-08 2.58E-08 2.65E-08 2.83E-08 2.58E-08 2.53E-08 2.52E-08 2.44E-08 2.48E-08 1.31E-08 1.22E-08 100 3.85E-08 4.24E-08 4.02E-08 4.14E-08 4.50E-08 3.92E-08 3.88E-08 3.88E-08 3.74E-08 3.82E-08 1.30E-08 1.22E-08 200 6.24E-08 6.81E-08 6.38E-08 6.55E-08 7.34E-08 6.23E-08 6.24E-08 6.10E-08 5.85E-08 6.08E-08 1.31E-08 1.22E-08 1.23E-08 7.54E-10 1.43E-08 1.02E-08 1.72E-08 8.06E-10 1.94E-08 1.50E-08 2.65E-08 1.38E-09 3.03E-08 2.27E-08 4.15E-08 2.46E-09 4.82E-08 3.47E-08 6.67E-08 4.34E-09 7.86E-08 5.47E-08 1.20E-08 3.36E-10 1.29E-08 1.11E-08 -5.00E-08 PASS 5.00E-08 PASS 1.67E-08 3.72E-10 1.77E-08 1.57E-08 -1.00E-07 PASS 1.00E-07 PASS 2.51E-08 5.34E-10 2.66E-08 2.37E-08 -1.25E-07 PASS 1.25E-07 PASS 3.85E-08 7.18E-10 4.04E-08 3.65E-08 -2.00E-07 PASS 2.00E-07 PASS 6.10E-08 1.60E-09 6.54E-08 5.66E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 132 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Bias Current 4 @ +/-5V (A) 2.50E-07 2.00E-07 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 -2.00E-07 -2.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.64. Plot of Negative Bias Current 4 @ +/-5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 133 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.64. Raw data for Negative Bias Current 4 @ +/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Negative Bias Current 4 @ +/-5V (A) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Total Dose (krad(Si)) 0 1.05E-08 1.29E-08 1.20E-08 1.27E-08 1.18E-08 1.22E-08 1.16E-08 1.20E-08 1.23E-08 1.27E-08 1.24E-08 1.15E-08 20 1.51E-08 1.73E-08 1.63E-08 1.75E-08 1.73E-08 1.66E-08 1.64E-08 1.66E-08 1.68E-08 1.78E-08 1.25E-08 1.15E-08 50 2.34E-08 2.62E-08 2.46E-08 2.63E-08 2.71E-08 2.52E-08 2.53E-08 2.49E-08 2.49E-08 2.68E-08 1.25E-08 1.15E-08 100 3.65E-08 4.05E-08 3.79E-08 4.08E-08 4.29E-08 3.88E-08 3.89E-08 3.84E-08 3.83E-08 4.13E-08 1.25E-08 1.15E-08 200 5.97E-08 6.51E-08 6.03E-08 6.45E-08 6.96E-08 6.21E-08 6.33E-08 6.07E-08 6.05E-08 6.53E-08 1.23E-08 1.15E-08 1.20E-08 9.37E-10 1.45E-08 9.40E-09 1.67E-08 1.03E-09 1.95E-08 1.39E-08 2.55E-08 1.51E-09 2.97E-08 2.14E-08 3.97E-08 2.52E-09 4.66E-08 3.28E-08 6.38E-08 4.03E-09 7.49E-08 5.28E-08 1.22E-08 3.89E-10 1.32E-08 1.11E-08 -5.00E-08 PASS 5.00E-08 PASS 1.68E-08 5.40E-10 1.83E-08 1.54E-08 -1.00E-07 PASS 1.00E-07 PASS 2.54E-08 8.02E-10 2.76E-08 2.32E-08 -1.25E-07 PASS 1.25E-07 PASS 3.91E-08 1.22E-09 4.25E-08 3.58E-08 -2.00E-07 PASS 2.00E-07 PASS 6.24E-08 1.99E-09 6.78E-08 5.69E-08 -2.00E-07 PASS 2.00E-07 PASS An ISO 9001:2000 Certified Company 134 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 1 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.65. Plot of Positive Output Voltage 1 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 135 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.65. Raw data for Positive Output Voltage 1 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 1 RL=open @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 4.27E+00 4.25E+00 4.27E+00 4.25E+00 4.27E+00 4.26E+00 4.27E+00 4.25E+00 4.25E+00 4.26E+00 4.26E+00 4.26E+00 20 4.26E+00 4.25E+00 4.26E+00 4.25E+00 4.26E+00 4.25E+00 4.26E+00 4.24E+00 4.25E+00 4.26E+00 4.27E+00 4.26E+00 50 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.27E+00 4.26E+00 100 4.32E+00 4.29E+00 4.31E+00 4.30E+00 4.32E+00 4.30E+00 4.31E+00 4.29E+00 4.29E+00 4.29E+00 4.27E+00 4.26E+00 200 4.32E+00 4.31E+00 4.32E+00 4.31E+00 4.32E+00 4.31E+00 4.32E+00 4.31E+00 4.31E+00 4.32E+00 4.27E+00 4.26E+00 4.26E+00 9.22E-03 4.29E+00 4.24E+00 4.25E+00 7.01E-03 4.27E+00 4.24E+00 4.27E+00 7.43E-03 4.29E+00 4.25E+00 4.31E+00 1.05E-02 4.34E+00 4.28E+00 4.31E+00 3.58E-03 4.32E+00 4.30E+00 4.26E+00 5.86E-03 4.27E+00 4.24E+00 4.00E+00 PASS 4.25E+00 5.26E-03 4.27E+00 4.24E+00 4.00E+00 PASS 4.26E+00 5.15E-03 4.28E+00 4.25E+00 4.00E+00 PASS 4.30E+00 7.65E-03 4.32E+00 4.28E+00 4.00E+00 PASS 4.31E+00 3.91E-03 4.32E+00 4.30E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 136 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 2 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.66. Plot of Positive Output Voltage 2 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 137 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.66. Raw data for Positive Output Voltage 2 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 2 RL=open @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 4.29E+00 4.27E+00 4.28E+00 4.27E+00 4.28E+00 4.27E+00 4.29E+00 4.27E+00 4.27E+00 4.28E+00 4.28E+00 4.27E+00 20 4.28E+00 4.27E+00 4.27E+00 4.27E+00 4.28E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 4.28E+00 4.27E+00 50 4.29E+00 4.28E+00 4.28E+00 4.28E+00 4.30E+00 4.28E+00 4.29E+00 4.27E+00 4.28E+00 4.28E+00 4.28E+00 4.27E+00 100 4.31E+00 4.31E+00 4.31E+00 4.31E+00 4.32E+00 4.31E+00 4.31E+00 4.30E+00 4.31E+00 4.31E+00 4.28E+00 4.27E+00 200 4.32E+00 4.31E+00 4.31E+00 4.31E+00 4.32E+00 4.32E+00 4.32E+00 4.31E+00 4.31E+00 4.31E+00 4.27E+00 4.27E+00 4.28E+00 9.69E-03 4.30E+00 4.25E+00 4.27E+00 7.33E-03 4.29E+00 4.25E+00 4.28E+00 9.63E-03 4.31E+00 4.26E+00 4.31E+00 3.35E-03 4.32E+00 4.30E+00 4.31E+00 3.58E-03 4.32E+00 4.30E+00 4.28E+00 5.86E-03 4.29E+00 4.26E+00 4.00E+00 PASS 4.27E+00 5.81E-03 4.28E+00 4.25E+00 4.00E+00 PASS 4.28E+00 6.66E-03 4.30E+00 4.26E+00 4.00E+00 PASS 4.31E+00 3.91E-03 4.32E+00 4.30E+00 4.00E+00 PASS 4.31E+00 3.78E-03 4.32E+00 4.30E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 138 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 3 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.67. Plot of Positive Output Voltage 3 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 139 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.67. Raw data for Positive Output Voltage 3 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 3 RL=open @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 4.27E+00 4.25E+00 4.26E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 20 4.27E+00 4.25E+00 4.26E+00 4.25E+00 4.26E+00 4.25E+00 4.26E+00 4.24E+00 4.26E+00 4.26E+00 4.26E+00 4.26E+00 50 4.27E+00 4.26E+00 4.27E+00 4.26E+00 4.28E+00 4.27E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 4.26E+00 4.26E+00 100 4.32E+00 4.31E+00 4.31E+00 4.31E+00 4.32E+00 4.30E+00 4.31E+00 4.30E+00 4.31E+00 4.31E+00 4.26E+00 4.26E+00 200 4.32E+00 4.31E+00 4.32E+00 4.31E+00 4.32E+00 4.32E+00 4.32E+00 4.31E+00 4.32E+00 4.32E+00 4.26E+00 4.26E+00 4.26E+00 7.18E-03 4.28E+00 4.24E+00 4.26E+00 5.96E-03 4.27E+00 4.24E+00 4.27E+00 5.86E-03 4.28E+00 4.25E+00 4.31E+00 5.32E-03 4.33E+00 4.30E+00 4.32E+00 2.59E-03 4.32E+00 4.31E+00 4.26E+00 5.36E-03 4.28E+00 4.25E+00 4.00E+00 PASS 4.25E+00 6.23E-03 4.27E+00 4.24E+00 4.00E+00 PASS 4.27E+00 5.93E-03 4.28E+00 4.25E+00 4.00E+00 PASS 4.31E+00 6.30E-03 4.33E+00 4.29E+00 4.00E+00 PASS 4.31E+00 4.09E-03 4.33E+00 4.30E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 140 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 4 RL=open @ +5V (V) 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 3.95E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.68. Plot of Positive Output Voltage 4 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 141 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.68. Raw data for Positive Output Voltage 4 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 4 RL=open @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 4.29E+00 4.26E+00 4.28E+00 4.27E+00 4.28E+00 4.27E+00 4.28E+00 4.27E+00 4.27E+00 4.27E+00 4.28E+00 4.27E+00 20 4.28E+00 4.26E+00 4.27E+00 4.26E+00 4.27E+00 4.27E+00 4.27E+00 4.26E+00 4.26E+00 4.26E+00 4.28E+00 4.27E+00 50 4.29E+00 4.27E+00 4.28E+00 4.27E+00 4.29E+00 4.28E+00 4.28E+00 4.27E+00 4.27E+00 4.28E+00 4.28E+00 4.27E+00 100 4.31E+00 4.31E+00 4.31E+00 4.31E+00 4.32E+00 4.31E+00 4.31E+00 4.31E+00 4.31E+00 4.31E+00 4.28E+00 4.28E+00 200 4.32E+00 4.31E+00 4.31E+00 4.31E+00 4.32E+00 4.31E+00 4.32E+00 4.31E+00 4.31E+00 4.31E+00 4.28E+00 4.27E+00 4.28E+00 1.23E-02 4.31E+00 4.24E+00 4.27E+00 7.95E-03 4.29E+00 4.25E+00 4.28E+00 1.05E-02 4.31E+00 4.25E+00 4.31E+00 3.63E-03 4.32E+00 4.30E+00 4.31E+00 2.88E-03 4.32E+00 4.30E+00 4.27E+00 4.95E-03 4.29E+00 4.26E+00 4.00E+00 PASS 4.26E+00 4.97E-03 4.28E+00 4.25E+00 4.00E+00 PASS 4.28E+00 5.20E-03 4.29E+00 4.26E+00 4.00E+00 PASS 4.31E+00 3.91E-03 4.32E+00 4.30E+00 4.00E+00 PASS 4.31E+00 4.22E-03 4.32E+00 4.30E+00 4.00E+00 PASS An ISO 9001:2000 Certified Company 142 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 1 RL=600 @ +5V (V) 4.50E+00 4.00E+00 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.69. Plot of Positive Output Voltage 1 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 143 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.69. Raw data for Positive Output Voltage 1 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 1 RL=600 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 3.83E+00 3.82E+00 3.82E+00 3.82E+00 3.84E+00 3.83E+00 3.83E+00 3.82E+00 3.82E+00 3.83E+00 3.83E+00 3.84E+00 20 3.83E+00 3.82E+00 3.82E+00 3.82E+00 3.84E+00 3.83E+00 3.83E+00 3.82E+00 3.82E+00 3.83E+00 3.83E+00 3.84E+00 50 3.83E+00 3.82E+00 3.82E+00 3.82E+00 3.84E+00 3.82E+00 3.83E+00 3.82E+00 3.82E+00 3.82E+00 3.83E+00 3.84E+00 100 3.83E+00 3.81E+00 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.83E+00 3.81E+00 3.81E+00 3.82E+00 3.83E+00 3.84E+00 200 3.82E+00 3.81E+00 3.81E+00 3.81E+00 3.83E+00 3.81E+00 3.82E+00 3.80E+00 3.80E+00 3.81E+00 3.83E+00 3.84E+00 3.83E+00 8.17E-03 3.85E+00 3.80E+00 3.83E+00 8.90E-03 3.85E+00 3.80E+00 3.82E+00 8.41E-03 3.85E+00 3.80E+00 3.82E+00 8.46E-03 3.84E+00 3.80E+00 3.81E+00 9.18E-03 3.84E+00 3.79E+00 3.83E+00 6.08E-03 3.84E+00 3.81E+00 3.40E+00 PASS 3.82E+00 5.73E-03 3.84E+00 3.81E+00 3.20E+00 PASS 3.82E+00 5.41E-03 3.84E+00 3.81E+00 3.00E+00 PASS 3.82E+00 6.07E-03 3.83E+00 3.80E+00 2.80E+00 PASS 3.81E+00 6.88E-03 3.83E+00 3.79E+00 2.80E+00 PASS An ISO 9001:2000 Certified Company 144 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 2 RL=600 @ +5V (V) 4.50E+00 4.00E+00 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.70. Plot of Positive Output Voltage 2 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 145 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.70. Raw data for Positive Output Voltage 2 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 2 RL=600 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 3.83E+00 3.81E+00 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.83E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 3.82E+00 20 3.83E+00 3.81E+00 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 3.82E+00 50 3.82E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 3.80E+00 3.82E+00 3.82E+00 3.82E+00 3.82E+00 100 3.82E+00 3.80E+00 3.82E+00 3.80E+00 3.82E+00 3.81E+00 3.82E+00 3.80E+00 3.82E+00 3.81E+00 3.82E+00 3.82E+00 200 3.81E+00 3.80E+00 3.81E+00 3.80E+00 3.82E+00 3.81E+00 3.81E+00 3.79E+00 3.81E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 8.35E-03 3.84E+00 3.80E+00 3.82E+00 8.56E-03 3.84E+00 3.79E+00 3.82E+00 8.35E-03 3.84E+00 3.79E+00 3.81E+00 8.88E-03 3.84E+00 3.79E+00 3.81E+00 9.48E-03 3.83E+00 3.78E+00 3.82E+00 6.76E-03 3.84E+00 3.80E+00 3.40E+00 PASS 3.82E+00 6.53E-03 3.84E+00 3.80E+00 3.20E+00 PASS 3.81E+00 6.77E-03 3.83E+00 3.80E+00 3.00E+00 PASS 3.81E+00 7.52E-03 3.83E+00 3.79E+00 2.80E+00 PASS 3.81E+00 7.60E-03 3.83E+00 3.79E+00 2.80E+00 PASS An ISO 9001:2000 Certified Company 146 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 3 RL=600 @ +5V (V) 4.50E+00 4.00E+00 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.71. Plot of Positive Output Voltage 3 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 147 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.71. Raw data for Positive Output Voltage 3 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 3 RL=600 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 3.84E+00 3.82E+00 3.83E+00 3.82E+00 3.84E+00 3.83E+00 3.83E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 3.83E+00 20 3.83E+00 3.82E+00 3.83E+00 3.82E+00 3.84E+00 3.83E+00 3.83E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 3.83E+00 50 3.83E+00 3.82E+00 3.83E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 3.81E+00 3.83E+00 3.83E+00 3.83E+00 3.83E+00 100 3.83E+00 3.81E+00 3.83E+00 3.81E+00 3.83E+00 3.82E+00 3.83E+00 3.81E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 200 3.82E+00 3.81E+00 3.82E+00 3.81E+00 3.82E+00 3.82E+00 3.82E+00 3.80E+00 3.82E+00 3.82E+00 3.83E+00 3.83E+00 3.83E+00 7.83E-03 3.85E+00 3.81E+00 3.83E+00 7.56E-03 3.85E+00 3.81E+00 3.82E+00 7.89E-03 3.85E+00 3.80E+00 3.82E+00 8.46E-03 3.85E+00 3.80E+00 3.82E+00 8.67E-03 3.84E+00 3.79E+00 3.83E+00 6.19E-03 3.85E+00 3.81E+00 3.40E+00 PASS 3.83E+00 6.11E-03 3.84E+00 3.81E+00 3.20E+00 PASS 3.83E+00 7.04E-03 3.84E+00 3.81E+00 3.00E+00 PASS 3.82E+00 7.13E-03 3.84E+00 3.80E+00 2.80E+00 PASS 3.82E+00 8.26E-03 3.84E+00 3.79E+00 2.80E+00 PASS An ISO 9001:2000 Certified Company 148 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Output Voltage 4 RL=600 @ +5V (V) 4.50E+00 4.00E+00 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.72. Plot of Positive Output Voltage 4 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 149 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.72. Raw data for Positive Output Voltage 4 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Positive Output Voltage 4 RL=600 @ +5V (V) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 0 3.82E+00 3.81E+00 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.81E+00 3.81E+00 3.82E+00 3.82E+00 3.83E+00 20 3.82E+00 3.81E+00 3.82E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.81E+00 3.81E+00 3.82E+00 3.82E+00 3.83E+00 50 3.82E+00 3.81E+00 3.81E+00 3.81E+00 3.83E+00 3.82E+00 3.82E+00 3.81E+00 3.81E+00 3.82E+00 3.82E+00 3.83E+00 100 3.82E+00 3.81E+00 3.81E+00 3.80E+00 3.82E+00 3.81E+00 3.82E+00 3.80E+00 3.80E+00 3.81E+00 3.82E+00 3.83E+00 200 3.81E+00 3.80E+00 3.80E+00 3.80E+00 3.82E+00 3.81E+00 3.81E+00 3.79E+00 3.80E+00 3.81E+00 3.82E+00 3.83E+00 3.82E+00 7.73E-03 3.84E+00 3.80E+00 3.82E+00 8.64E-03 3.84E+00 3.79E+00 3.81E+00 8.23E-03 3.84E+00 3.79E+00 3.81E+00 8.44E-03 3.83E+00 3.79E+00 3.81E+00 9.47E-03 3.83E+00 3.78E+00 3.82E+00 5.79E-03 3.83E+00 3.80E+00 3.40E+00 PASS 3.81E+00 6.06E-03 3.83E+00 3.80E+00 3.20E+00 PASS 3.81E+00 5.93E-03 3.83E+00 3.80E+00 3.00E+00 PASS 3.81E+00 7.40E-03 3.83E+00 3.79E+00 2.80E+00 PASS 3.80E+00 7.28E-03 3.82E+00 3.78E+00 2.80E+00 PASS An ISO 9001:2000 Certified Company 150 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 RL=open @ +5V (V) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.73. Plot of Output Voltage Low 1 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 151 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.73. Raw data for Output Voltage Low 1 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 1 RL=open @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.40E-02 1.36E-02 1.38E-02 1.37E-02 1.39E-02 1.38E-02 1.38E-02 1.37E-02 1.36E-02 1.37E-02 1.38E-02 1.40E-02 20 1.40E-02 1.38E-02 1.40E-02 1.38E-02 1.41E-02 1.39E-02 1.40E-02 1.37E-02 1.39E-02 1.37E-02 1.40E-02 1.40E-02 50 1.42E-02 1.40E-02 1.39E-02 1.38E-02 1.42E-02 1.40E-02 1.42E-02 1.40E-02 1.40E-02 1.42E-02 1.39E-02 1.40E-02 100 1.44E-02 1.42E-02 1.42E-02 1.40E-02 1.42E-02 1.44E-02 1.45E-02 1.43E-02 1.43E-02 1.44E-02 1.39E-02 1.41E-02 200 1.47E-02 1.45E-02 1.43E-02 1.44E-02 1.48E-02 1.50E-02 1.53E-02 1.52E-02 1.50E-02 1.51E-02 1.39E-02 1.40E-02 1.38E-02 1.58E-04 1.42E-02 1.34E-02 1.39E-02 1.34E-04 1.43E-02 1.36E-02 1.40E-02 1.79E-04 1.45E-02 1.35E-02 1.42E-02 1.41E-04 1.46E-02 1.38E-02 1.45E-02 2.07E-04 1.51E-02 1.40E-02 1.37E-02 8.37E-05 1.39E-02 1.35E-02 2.50E-02 PASS 1.38E-02 1.34E-04 1.42E-02 1.35E-02 3.00E-02 PASS 1.41E-02 1.10E-04 1.44E-02 1.38E-02 4.00E-02 PASS 1.44E-02 8.37E-05 1.46E-02 1.42E-02 5.00E-02 PASS 1.51E-02 1.30E-04 1.55E-02 1.48E-02 5.00E-02 PASS An ISO 9001:2000 Certified Company 152 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 RL=open @ +5V (V) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.74. Plot of Output Voltage Low 2 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 153 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.74. Raw data for Output Voltage Low 2 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 2 RL=open @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.41E-02 1.38E-02 1.38E-02 1.37E-02 1.39E-02 1.41E-02 1.40E-02 1.40E-02 1.38E-02 1.40E-02 1.39E-02 1.38E-02 20 1.41E-02 1.39E-02 1.40E-02 1.38E-02 1.42E-02 1.41E-02 1.41E-02 1.39E-02 1.40E-02 1.40E-02 1.41E-02 1.39E-02 50 1.44E-02 1.40E-02 1.42E-02 1.39E-02 1.42E-02 1.43E-02 1.42E-02 1.41E-02 1.41E-02 1.41E-02 1.40E-02 1.38E-02 100 1.43E-02 1.41E-02 1.43E-02 1.42E-02 1.44E-02 1.45E-02 1.46E-02 1.45E-02 1.44E-02 1.45E-02 1.39E-02 1.39E-02 200 1.47E-02 1.46E-02 1.46E-02 1.47E-02 1.47E-02 1.52E-02 1.53E-02 1.54E-02 1.53E-02 1.53E-02 1.38E-02 1.39E-02 1.39E-02 1.52E-04 1.43E-02 1.34E-02 1.40E-02 1.58E-04 1.44E-02 1.36E-02 1.41E-02 1.95E-04 1.47E-02 1.36E-02 1.43E-02 1.14E-04 1.46E-02 1.39E-02 1.47E-02 5.48E-05 1.48E-02 1.45E-02 1.40E-02 1.10E-04 1.43E-02 1.37E-02 2.50E-02 PASS 1.40E-02 8.37E-05 1.42E-02 1.38E-02 3.00E-02 PASS 1.42E-02 8.94E-05 1.44E-02 1.39E-02 4.00E-02 PASS 1.45E-02 7.07E-05 1.47E-02 1.43E-02 5.00E-02 PASS 1.53E-02 7.07E-05 1.55E-02 1.51E-02 5.00E-02 PASS An ISO 9001:2000 Certified Company 154 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 3 RL=open @ +5V (V) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.75. Plot of Output Voltage Low 3 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 155 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.75. Raw data for Output Voltage Low 3 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 3 RL=open @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.39E-02 1.38E-02 1.39E-02 1.38E-02 1.40E-02 1.39E-02 1.41E-02 1.39E-02 1.39E-02 1.39E-02 1.39E-02 1.38E-02 20 1.43E-02 1.37E-02 1.39E-02 1.39E-02 1.40E-02 1.41E-02 1.42E-02 1.38E-02 1.40E-02 1.40E-02 1.39E-02 1.39E-02 50 1.43E-02 1.40E-02 1.40E-02 1.40E-02 1.44E-02 1.41E-02 1.42E-02 1.40E-02 1.42E-02 1.42E-02 1.40E-02 1.40E-02 100 1.45E-02 1.41E-02 1.43E-02 1.41E-02 1.45E-02 1.44E-02 1.46E-02 1.42E-02 1.44E-02 1.45E-02 1.39E-02 1.38E-02 200 1.47E-02 1.45E-02 1.46E-02 1.45E-02 1.46E-02 1.52E-02 1.53E-02 1.53E-02 1.52E-02 1.52E-02 1.39E-02 1.38E-02 1.39E-02 8.37E-05 1.41E-02 1.37E-02 1.40E-02 2.19E-04 1.46E-02 1.34E-02 1.41E-02 1.95E-04 1.47E-02 1.36E-02 1.43E-02 2.00E-04 1.48E-02 1.38E-02 1.46E-02 8.37E-05 1.48E-02 1.44E-02 1.39E-02 8.94E-05 1.42E-02 1.37E-02 2.50E-02 PASS 1.40E-02 1.48E-04 1.44E-02 1.36E-02 3.00E-02 PASS 1.41E-02 8.94E-05 1.44E-02 1.39E-02 4.00E-02 PASS 1.44E-02 1.48E-04 1.48E-02 1.40E-02 5.00E-02 PASS 1.52E-02 5.48E-05 1.54E-02 1.51E-02 5.00E-02 PASS An ISO 9001:2000 Certified Company 156 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 4 RL=open @ +5V (V) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.76. Plot of Output Voltage Low 4 RL=open @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 157 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.76. Raw data for Output Voltage Low 4 RL=open @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 4 RL=open @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.40E-02 1.38E-02 1.38E-02 1.37E-02 1.42E-02 1.38E-02 1.41E-02 1.37E-02 1.36E-02 1.39E-02 1.42E-02 1.40E-02 20 1.42E-02 1.39E-02 1.39E-02 1.40E-02 1.41E-02 1.40E-02 1.41E-02 1.38E-02 1.39E-02 1.40E-02 1.41E-02 1.42E-02 50 1.41E-02 1.40E-02 1.41E-02 1.41E-02 1.41E-02 1.42E-02 1.44E-02 1.41E-02 1.40E-02 1.42E-02 1.40E-02 1.41E-02 100 1.45E-02 1.44E-02 1.43E-02 1.42E-02 1.44E-02 1.45E-02 1.47E-02 1.45E-02 1.44E-02 1.46E-02 1.40E-02 1.40E-02 200 1.47E-02 1.45E-02 1.45E-02 1.47E-02 1.50E-02 1.53E-02 1.54E-02 1.52E-02 1.53E-02 1.53E-02 1.40E-02 1.41E-02 1.39E-02 2.00E-04 1.44E-02 1.34E-02 1.40E-02 1.30E-04 1.44E-02 1.37E-02 1.41E-02 4.47E-05 1.42E-02 1.40E-02 1.44E-02 1.14E-04 1.47E-02 1.40E-02 1.47E-02 2.05E-04 1.52E-02 1.41E-02 1.38E-02 1.92E-04 1.43E-02 1.33E-02 2.50E-02 PASS 1.40E-02 1.14E-04 1.43E-02 1.36E-02 3.00E-02 PASS 1.42E-02 1.48E-04 1.46E-02 1.38E-02 4.00E-02 PASS 1.45E-02 1.14E-04 1.49E-02 1.42E-02 5.00E-02 PASS 1.53E-02 7.07E-05 1.55E-02 1.51E-02 5.00E-02 PASS An ISO 9001:2000 Certified Company 158 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.77. Plot of Output Voltage Low 1 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 159 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.77. Raw data for Output Voltage Low 1 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 1 RL=600 @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 6.00E-03 6.20E-03 5.90E-03 5.90E-03 6.20E-03 6.10E-03 6.00E-03 6.00E-03 6.10E-03 6.00E-03 6.00E-03 6.10E-03 20 6.10E-03 6.00E-03 5.90E-03 6.00E-03 6.20E-03 6.20E-03 6.00E-03 6.10E-03 6.00E-03 6.20E-03 5.80E-03 6.10E-03 50 5.90E-03 5.90E-03 5.90E-03 6.00E-03 6.00E-03 5.90E-03 6.00E-03 6.00E-03 6.00E-03 5.90E-03 6.10E-03 6.20E-03 100 5.60E-03 5.70E-03 5.50E-03 5.70E-03 5.70E-03 5.60E-03 5.70E-03 5.70E-03 5.70E-03 5.70E-03 6.00E-03 6.10E-03 200 4.90E-03 5.20E-03 5.20E-03 4.90E-03 5.00E-03 5.20E-03 5.10E-03 5.00E-03 5.00E-03 5.00E-03 5.90E-03 6.10E-03 6.04E-03 1.52E-04 6.46E-03 5.62E-03 6.04E-03 1.14E-04 6.35E-03 5.73E-03 5.94E-03 5.48E-05 6.09E-03 5.79E-03 5.64E-03 8.94E-05 5.89E-03 5.39E-03 5.04E-03 1.52E-04 5.46E-03 4.62E-03 6.04E-03 5.48E-05 6.19E-03 5.89E-03 1.00E-02 PASS 6.10E-03 1.00E-04 6.37E-03 5.83E-03 1.00E-02 PASS 5.96E-03 5.48E-05 6.11E-03 5.81E-03 1.00E-02 PASS 5.68E-03 4.47E-05 5.80E-03 5.56E-03 1.00E-02 PASS 5.06E-03 8.94E-05 5.31E-03 4.81E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 160 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.78. Plot of Output Voltage Low 2 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 161 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.78. Raw data for Output Voltage Low 2 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 2 RL=600 @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 5.80E-03 5.90E-03 5.80E-03 5.70E-03 6.00E-03 5.90E-03 5.80E-03 5.80E-03 5.90E-03 6.00E-03 5.90E-03 5.80E-03 20 5.90E-03 5.70E-03 5.80E-03 5.90E-03 5.90E-03 5.90E-03 6.00E-03 5.70E-03 5.80E-03 5.80E-03 5.80E-03 6.00E-03 50 5.80E-03 5.70E-03 5.70E-03 5.50E-03 5.80E-03 5.60E-03 5.80E-03 5.70E-03 5.80E-03 5.90E-03 5.80E-03 6.00E-03 100 5.50E-03 5.50E-03 5.70E-03 5.50E-03 5.60E-03 5.60E-03 5.60E-03 5.50E-03 5.60E-03 5.70E-03 5.60E-03 6.00E-03 200 4.80E-03 4.80E-03 5.00E-03 4.70E-03 4.80E-03 4.90E-03 4.90E-03 4.80E-03 5.00E-03 4.90E-03 5.80E-03 5.70E-03 5.84E-03 1.14E-04 6.15E-03 5.53E-03 5.84E-03 8.94E-05 6.09E-03 5.59E-03 5.70E-03 1.22E-04 6.04E-03 5.36E-03 5.56E-03 8.94E-05 5.81E-03 5.31E-03 4.82E-03 1.10E-04 5.12E-03 4.52E-03 5.88E-03 8.37E-05 6.11E-03 5.65E-03 1.00E-02 PASS 5.84E-03 1.14E-04 6.15E-03 5.53E-03 1.00E-02 PASS 5.76E-03 1.14E-04 6.07E-03 5.45E-03 1.00E-02 PASS 5.60E-03 7.07E-05 5.79E-03 5.41E-03 1.00E-02 PASS 4.90E-03 7.07E-05 5.09E-03 4.71E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 162 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 3 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.79. Plot of Output Voltage Low 3 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 163 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.79. Raw data for Output Voltage Low 3 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 3 RL=600 @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 6.00E-03 5.80E-03 6.10E-03 6.10E-03 6.20E-03 5.90E-03 6.00E-03 6.00E-03 6.20E-03 6.10E-03 6.10E-03 6.30E-03 20 6.10E-03 5.90E-03 6.10E-03 6.00E-03 6.00E-03 6.00E-03 6.10E-03 6.10E-03 6.00E-03 6.00E-03 6.00E-03 5.90E-03 50 5.90E-03 5.90E-03 6.00E-03 5.90E-03 6.00E-03 6.00E-03 5.90E-03 6.10E-03 5.80E-03 5.90E-03 6.00E-03 6.20E-03 100 5.70E-03 5.60E-03 5.60E-03 5.60E-03 5.60E-03 5.50E-03 5.70E-03 5.70E-03 5.80E-03 5.80E-03 6.30E-03 6.30E-03 200 4.90E-03 5.00E-03 5.10E-03 5.10E-03 5.10E-03 5.10E-03 5.00E-03 4.90E-03 5.10E-03 5.10E-03 6.00E-03 6.30E-03 6.04E-03 1.52E-04 6.46E-03 5.62E-03 6.02E-03 8.37E-05 6.25E-03 5.79E-03 5.94E-03 5.48E-05 6.09E-03 5.79E-03 5.62E-03 4.47E-05 5.74E-03 5.50E-03 5.04E-03 8.94E-05 5.29E-03 4.79E-03 6.04E-03 1.14E-04 6.35E-03 5.73E-03 1.00E-02 PASS 6.04E-03 5.48E-05 6.19E-03 5.89E-03 1.00E-02 PASS 5.94E-03 1.14E-04 6.25E-03 5.63E-03 1.00E-02 PASS 5.70E-03 1.22E-04 6.04E-03 5.36E-03 1.00E-02 PASS 5.04E-03 8.94E-05 5.29E-03 4.79E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 164 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 4 RL=600 @ +5V (V) 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.80. Plot of Output Voltage Low 4 RL=600 @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 165 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.80. Raw data for Output Voltage Low 4 RL=600 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 4 RL=600 @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 5.80E-03 5.80E-03 5.80E-03 5.90E-03 6.10E-03 5.70E-03 5.70E-03 5.80E-03 5.80E-03 5.80E-03 5.70E-03 5.90E-03 20 6.00E-03 5.80E-03 5.70E-03 5.70E-03 5.80E-03 5.80E-03 5.90E-03 5.80E-03 5.80E-03 5.80E-03 5.90E-03 5.80E-03 50 5.90E-03 5.60E-03 5.50E-03 5.60E-03 5.70E-03 5.90E-03 5.70E-03 5.70E-03 5.60E-03 5.70E-03 5.90E-03 6.00E-03 100 5.50E-03 5.60E-03 5.40E-03 5.50E-03 5.60E-03 5.60E-03 5.50E-03 5.60E-03 5.40E-03 5.60E-03 5.70E-03 5.80E-03 200 4.70E-03 4.90E-03 5.00E-03 4.80E-03 4.80E-03 5.00E-03 4.90E-03 5.00E-03 5.20E-03 5.00E-03 5.70E-03 5.70E-03 5.88E-03 1.30E-04 6.24E-03 5.52E-03 5.80E-03 1.22E-04 6.14E-03 5.46E-03 5.66E-03 1.52E-04 6.08E-03 5.24E-03 5.52E-03 8.37E-05 5.75E-03 5.29E-03 4.84E-03 1.14E-04 5.15E-03 4.53E-03 5.76E-03 5.48E-05 5.91E-03 5.61E-03 1.00E-02 PASS 5.82E-03 4.47E-05 5.94E-03 5.70E-03 1.00E-02 PASS 5.72E-03 1.10E-04 6.02E-03 5.42E-03 1.00E-02 PASS 5.54E-03 8.94E-05 5.79E-03 5.29E-03 1.00E-02 PASS 5.02E-03 1.10E-04 5.32E-03 4.72E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 166 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 IL=1mA @ +5V (V) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.81. Plot of Output Voltage Low 1 IL=1mA @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 167 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.81. Raw data for Output Voltage Low 1 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 1 IL=1mA @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.34E-01 2.39E-01 2.43E-01 2.39E-01 2.39E-01 2.37E-01 2.41E-01 2.38E-01 2.40E-01 2.39E-01 2.41E-01 2.35E-01 20 2.32E-01 2.39E-01 2.42E-01 2.39E-01 2.37E-01 2.35E-01 2.38E-01 2.36E-01 2.39E-01 2.40E-01 2.42E-01 2.36E-01 50 2.35E-01 2.42E-01 2.45E-01 2.44E-01 2.41E-01 2.39E-01 2.41E-01 2.39E-01 2.43E-01 2.41E-01 2.42E-01 2.35E-01 100 2.46E-01 2.50E-01 2.52E-01 2.50E-01 2.50E-01 2.46E-01 2.49E-01 2.47E-01 2.51E-01 2.49E-01 2.42E-01 2.36E-01 200 3.08E-01 2.77E-01 2.80E-01 2.77E-01 2.89E-01 2.79E-01 2.83E-01 2.82E-01 2.77E-01 2.77E-01 2.41E-01 2.36E-01 2.39E-01 3.19E-03 2.48E-01 2.30E-01 2.38E-01 3.70E-03 2.48E-01 2.28E-01 2.41E-01 3.91E-03 2.52E-01 2.31E-01 2.50E-01 2.19E-03 2.56E-01 2.44E-01 2.86E-01 1.31E-02 3.22E-01 2.50E-01 2.39E-01 1.58E-03 2.43E-01 2.35E-01 3.50E-01 PASS 2.38E-01 2.07E-03 2.43E-01 2.32E-01 8.00E-01 PASS 2.41E-01 1.67E-03 2.45E-01 2.36E-01 1.00E+00 PASS 2.48E-01 1.95E-03 2.54E-01 2.43E-01 1.60E+00 PASS 2.80E-01 2.79E-03 2.87E-01 2.72E-01 1.60E+00 PASS An ISO 9001:2000 Certified Company 168 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 IL=1mA @ +5V (V) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.82. Plot of Output Voltage Low 2 IL=1mA @ +5V (V) versus total dose. The data show significant degradation at the 200krad(Si) dose level, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 169 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.82. Raw data for Output Voltage Low 2 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 2 IL=1mA @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.39E-01 2.44E-01 2.43E-01 2.45E-01 2.42E-01 2.40E-01 2.42E-01 2.42E-01 2.38E-01 2.38E-01 2.44E-01 2.38E-01 20 2.38E-01 2.45E-01 2.41E-01 2.44E-01 2.43E-01 2.39E-01 2.40E-01 2.40E-01 2.37E-01 2.37E-01 2.46E-01 2.39E-01 50 2.40E-01 2.48E-01 2.44E-01 2.49E-01 2.47E-01 2.43E-01 2.45E-01 2.43E-01 2.41E-01 2.41E-01 2.46E-01 2.40E-01 100 2.56E-01 2.58E-01 2.52E-01 2.58E-01 2.58E-01 2.52E-01 2.54E-01 2.52E-01 2.50E-01 2.50E-01 2.46E-01 2.39E-01 200 9.56E-01 3.07E-01 2.87E-01 3.06E-01 1.01E+00 2.99E-01 3.86E-01 3.05E-01 2.99E-01 3.08E-01 2.46E-01 2.38E-01 2.43E-01 2.30E-03 2.49E-01 2.36E-01 2.42E-01 2.77E-03 2.50E-01 2.35E-01 2.46E-01 3.65E-03 2.56E-01 2.36E-01 2.56E-01 2.61E-03 2.64E-01 2.49E-01 5.73E-01 3.74E-01 1.60E+00 -4.53E-01 2.40E-01 2.00E-03 2.45E-01 2.35E-01 3.50E-01 PASS 2.39E-01 1.52E-03 2.43E-01 2.34E-01 8.00E-01 PASS 2.43E-01 1.67E-03 2.47E-01 2.38E-01 1.00E+00 PASS 2.52E-01 1.67E-03 2.56E-01 2.47E-01 1.60E+00 PASS 3.19E-01 3.74E-02 4.22E-01 2.17E-01 1.60E+00 PASS An ISO 9001:2000 Certified Company 170 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 3 IL=1mA @ +5V (V) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.83. Plot of Output Voltage Low 3 IL=1mA @ +5V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 171 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.83. Raw data for Output Voltage Low 3 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 3 IL=1mA @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.33E-01 2.40E-01 2.37E-01 2.39E-01 2.37E-01 2.36E-01 2.37E-01 2.36E-01 2.34E-01 2.34E-01 2.40E-01 2.34E-01 20 2.33E-01 2.40E-01 2.37E-01 2.40E-01 2.37E-01 2.35E-01 2.35E-01 2.35E-01 2.32E-01 2.32E-01 2.42E-01 2.36E-01 50 2.35E-01 2.43E-01 2.39E-01 2.43E-01 2.40E-01 2.39E-01 2.39E-01 2.38E-01 2.36E-01 2.36E-01 2.41E-01 2.35E-01 100 2.47E-01 2.53E-01 2.46E-01 2.51E-01 2.51E-01 2.46E-01 2.48E-01 2.46E-01 2.44E-01 2.44E-01 2.41E-01 2.35E-01 200 3.15E-01 2.83E-01 2.74E-01 2.82E-01 3.02E-01 2.79E-01 2.90E-01 2.82E-01 2.79E-01 2.81E-01 2.40E-01 2.34E-01 2.37E-01 2.68E-03 2.45E-01 2.30E-01 2.37E-01 2.88E-03 2.45E-01 2.30E-01 2.40E-01 3.32E-03 2.49E-01 2.31E-01 2.50E-01 2.97E-03 2.58E-01 2.41E-01 2.91E-01 1.68E-02 3.37E-01 2.45E-01 2.35E-01 1.34E-03 2.39E-01 2.32E-01 3.50E-01 PASS 2.34E-01 1.64E-03 2.38E-01 2.29E-01 8.00E-01 PASS 2.38E-01 1.52E-03 2.42E-01 2.33E-01 1.00E+00 PASS 2.46E-01 1.67E-03 2.50E-01 2.41E-01 1.60E+00 PASS 2.82E-01 4.55E-03 2.95E-01 2.70E-01 1.60E+00 PASS An ISO 9001:2000 Certified Company 172 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 4 IL=1mA @ +5V (V) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.84. Plot of Output Voltage Low 4 IL=1mA @ +5V (V) versus total dose. The data show significant degradation at the 200krad(Si) dose level, however the parameter remains within specification even after application of the KTL statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 173 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table 5.84. Raw data for Output Voltage Low 4 IL=1mA @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Output Voltage Low 4 IL=1mA @ +5V (V) Total Dose (krad(Si)) Device 1115 1116 1117 1118 1119 1120 1121 1122 1123 1124 1125 1126 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.38E-01 2.45E-01 2.47E-01 2.45E-01 2.44E-01 2.41E-01 2.44E-01 2.44E-01 2.46E-01 2.44E-01 2.45E-01 2.39E-01 20 2.37E-01 2.44E-01 2.46E-01 2.44E-01 2.44E-01 2.40E-01 2.43E-01 2.42E-01 2.44E-01 2.43E-01 2.47E-01 2.40E-01 50 2.40E-01 2.48E-01 2.50E-01 2.49E-01 2.49E-01 2.43E-01 2.46E-01 2.44E-01 2.48E-01 2.46E-01 2.46E-01 2.41E-01 100 2.53E-01 2.57E-01 2.58E-01 2.57E-01 2.58E-01 2.51E-01 2.54E-01 2.54E-01 2.56E-01 2.54E-01 2.46E-01 2.39E-01 200 1.14E+00 2.94E-01 2.91E-01 2.97E-01 6.09E-01 2.98E-01 3.05E-01 3.02E-01 2.91E-01 2.92E-01 2.47E-01 2.40E-01 2.44E-01 3.42E-03 2.53E-01 2.34E-01 2.43E-01 3.46E-03 2.52E-01 2.34E-01 2.47E-01 4.09E-03 2.58E-01 2.36E-01 2.57E-01 2.07E-03 2.62E-01 2.51E-01 5.26E-01 3.69E-01 1.54E+00 -4.86E-01 2.44E-01 1.79E-03 2.49E-01 2.39E-01 3.50E-01 PASS 2.42E-01 1.52E-03 2.47E-01 2.38E-01 8.00E-01 PASS 2.45E-01 1.95E-03 2.51E-01 2.40E-01 1.00E+00 PASS 2.54E-01 1.79E-03 2.59E-01 2.49E-01 1.60E+00 PASS 2.98E-01 6.11E-03 3.14E-01 2.81E-01 1.60E+00 PASS An ISO 9001:2000 Certified Company 174 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary were presented in this report. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to determine the outcome of the testing: following the radiation exposure each parameter had to pass the specification value and the average value for the five-piece sample must pass the specification value when the KTL limits are applied. If these conditions were not both satisfied following the radiation exposure, then the lot would be logged as an RLAT failure. Based on these criteria, the RH1014 quad operational amplifier discussed in this report passed the passed the RLAT to the maximum tested level of 200krad(Si) (for the ±15V supply conditions) and for the +5V and 0V supply conditions with all measured parameters remaining within specification, including after application of the KTL statistics. Input offset voltage, open loop gain (AVOL), input bias current, slew rate and select output voltage low suffered from some measure of radiation-induced degradation, however, as noted above, it was not sufficient to cause any of the parameters to go out of specification even after application of the KTL statistics. An ISO 9001:2000 Certified Company 175 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of device-under-test to show part markings An ISO 9001:2000 Certified Company 176 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: TID Bias Connections (Extracted from LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet) Biased Samples: Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Function OUT A -IN A +IN A V+ +IN B -IN B OUT B OUT C -IN C +IN C V+IN D -IN D OUT D Bias To Pin 2 Via 10kΩ Resistor To Pin 1 Via 10kΩ Resistor 8V Via 10kΩ Resistor +15V Decoupled to GND W/ 0.1μF 8V Via 10kΩ Resistor To Pin 7 Via 10kΩ Resistor To Pin 6 Via 10kΩ Resistor To Pin 9 Via 10kΩ Resistor To Pin 8 Via 10kΩ Resistor 8V Via 10kΩ Resistor -15V Decoupled to GND W/ 0.1μF 8V Via 10kΩ Resistor To Pin 14 Via 10kΩ Resistor To Pin 13 Via 10kΩ Resistor An ISO 9001:2000 Certified Company 177 RLAT Report 09-298 090804 R1.1 Unbiased Samples (All Pins Tied to Ground): Pin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Function OUT A -IN A +IN A V+ +IN B -IN B OUT B OUT C -IN C +IN C V+IN D -IN D OUT D Bias GND GND GND GND GND GND GND GND GND GND GND GND GND GND An ISO 9001:2000 Certified Company 178 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from the LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet. Figure B.2. Package drawing (for reference only). This figure was extracted from the LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet. An ISO 9001:2000 Certified Company 179 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on Radiation Assured Device’s LTS2020 Test System. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2000 Certified Company 180 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Table C.1. Measured parameters and test conditions for the RH1014MW. Unless otherwise noted the conditions were selected to match the post-irradiation specifications. See LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet for the post irradiation test conditions and specifications. TEST NUMBER TEST DESCRIPTION TEST CONDITIONS 1 Positive Supply Current (ICC+) VS=±15V 2 Negative Supply Current (IEE-) VS=±15V 3 Input Offset Voltage (VOS1-VOS4) VS=±15V 4 Input Offset Current (IOS1-IOS4) VS=±15V 5 + Input Bias Current (IB+1-IB+4) VS=±15V 6 - Input Bias Current (IB-1-IB-4) VS=±15V 7 Common Mode Rejection Ratio (CMRR1-CMRR4) VCM = 13.5V, –15V 8 Power Supply Rejection Ratio (PSRR1-PSRR4) VS = ±10V to ±18V 9 Large Signal Voltage Gain (AVOL9-AVOL12) VS=±15V, VO = ±10V, RL = 10kΩ 10 Positive Output Voltage Swing (VOUT+1-VOUT+4) VS=±15V, RL= 10kΩ 11 Negative Output Voltage Swing (VOUT-1-VOUT-4) VS=±15V, RL= 10kΩ 12 Positive Slew Rate (SlewRate+1-SlewRate+4) VS=±15V, RL= 10kΩ 13 Negative Slew Rate (SlewRate-1-SlewRate-4) VS=±15V, RL= 10kΩ An ISO 9001:2000 Certified Company 181 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 14 Positive Supply Current (ICC+2) VS=+5V 15 Negative Supply Current (IEE-2) VS=+5V 16 Input Offset Voltage (VOS5-VOS8) VS=+5V 17 Input Offset Current (IOS5-IOS8) VS=+5V 18 + Input Bias Current (IB+5-IB+8) VS=+5V 19 - Input Bias Current (IB-5-IB-8) VS=+5V 20 Positive Output Voltage Swing (VOUT+5-VOUT+8) VS=+5V, No Load 21 Positive Output Voltage Swing (VOUT+9-VOUT+12) VS=+5V, RL= 600Ω 22 Output Voltage Low (VOUT-5-VOUT-8) VS=+5V, No Load 23 Output Voltage Low (VOUT-9-VOUT-12) VS=+5V, RL= 600Ω 24 Output Voltage Low (VOUT-13-VOUT-16) VS=+5V, ISINK= 1mA An ISO 9001:2000 Certified Company 182 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 Pre-Irradiation Specification Measurement Resolution/Precision Positive Supply Current (ICC+) 2.2mA ± 1.07E-05A Negative Supply Current (IEE-) -2.2mA ±1.07E-05A Input Offset Voltage (VOS1-VOS4) ±0.3mV ± 2.65E-06V Input Offset Current (IOS1-IOS4) ±10nA ± 6.69E-11A + Input Bias Current (IB+1-IB+4) ±30nA ±6.97E-11A - Input Bias Current (IB-1-IB-4) ±30nA ± 8.01E-11A Common Mode Rejection Ratio (CMRR1CMRR4) 97dB ±1.37E+00dB Power Supply Rejection Ratio (PSRR1-PSRR4) 100dB ±1.53E+01dB 1200V/mV ±1.0E+04V/mV Positive Output Voltage Swing (VOUT+1-VOUT+4) 12.5V ±2.99E-03V Negative Output Voltage Swing (VOUT-1-VOUT-4) -12.5V ±2.89E-03V Positive Slew Rate (SlewRate+1-SlewRate+4) 0.2V/μs ±1.32E-02V/μs Negative Slew Rate (SlewRate-1-SlewRate-4) -0.2V/μs ±1.87E-02V/μs Measured Parameter Large Signal Voltage Gain (AVOL9-AVOL12) An ISO 9001:2000 Certified Company 183 RLAT Report 09-298 090804 R1.1 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Supply Current (ICC+2) 2.0mA ±8.71E-06A Negative Supply Current (IEE-2) -2.0mA ±1.31E-05A ±0.45mV ± 1.27E-06V Input Offset Current (IOS5-IOS8) ±10nA ± 2.64E-11A + Input Bias Current (IB+5-IB+8) ±50nA ±5.02E-11A - Input Bias Current (IB-5-IB-8) ±50nA ± 3.95E-11A 4.0V ±1.96E-03V 3.4V ±2.05E-03V Output Voltage Low (VOUT-5-VOUT-8) 25mV ±1.90E-04V Output Voltage Low (VOUT-9-VOUT-12) 10mV ±1.46E-04V Output Voltage Low (VOUT-13-VOUT-16) 350mV ±1.63E-03V Input Offset Voltage (VOS5-VOS8) Positive Output Voltage Swing (VOUT+5VOUT+8) Positive Output Voltage Swing (VOUT+9VOUT+12) An ISO 9001:2000 Certified Company 184 RLAT Report 09-298 090804 R1.1 Appendix D: List of Figures Used in Section 5 (RLAT Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current @ +/-15V (A) Negative Supply Current @ +/-15V (A) Offset Voltage 1 @ +/-15V (V) Offset Voltage 2 @ +/-15V (V) Offset Voltage 3 @ +/-15V (V) Offset Voltage 4 @ +/-15V (V) Offset Current 1 @ +/-15V (A) Offset Current 2 @ +/-15V (A) Offset Current 3 @ +/-15V (A) Offset Current 4 @ +/-15V (A) Positive Bias Current 1 @ +/-15V (A) Positive Bias Current 2 @ +/-15V (A) Positive Bias Current 3 @ +/-15V (A) Positive Bias Current 4 @ +/-15V (A) Negative Bias Current 1 @ +/-15V (A) Negative Bias Current 2 @ +/-15V (A) Negative Bias Current 3 @ +/-15V (A) Negative Bias Current 4 @ +/-15V (A) Common Mode Rejection Ratio 1 (dB) Common Mode Rejection Ratio 2 (dB) Common Mode Rejection Ratio 3 (dB) Common Mode Rejection Ratio 4 (dB) Power Supply Rejection Ratio 1 (dB) Power Supply Rejection Ratio 2 (dB) Power Supply Rejection Ratio 3 (dB) Power Supply Rejection Ratio 4 (dB) Open Loop Gain 1 RL=10k VO=+/-10V (V/mV) Open Loop Gain 2 RL=10k VO=+/-10V (V/mV) Open Loop Gain 3 RL=10k VO=+/-10V (V/mV) Open Loop Gain 4 RL=10k VO=+/-10V (V/mV) Positive Output Voltage 1 @ +/-15V (V) Positive Output Voltage 2 @ +/-15V (V) Positive Output Voltage 3 @ +/-15V (V) Positive Output Voltage 4 @ +/-15V (V) Negative Output Voltage 1 @ +/-15V (V) Negative Output Voltage 2 @ +/-15V (V) Negative Output Voltage 3 @ +/-15V (V) Negative Output Voltage 4 @ +/-15V (V) Positive Slew Rate 1 @ +/-15V (V/us) An ISO 9001:2000 Certified Company 185 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 5.63 5.64 5.65 5.66 5.67 5.68 5.69 5.70 5.71 5.72 5.73 5.74 5.75 5.76 5.77 5.78 5.79 5.80 Positive Slew Rate 2 @ +/-15V (V/us) Positive Slew Rate 3 @ +/-15V (V/us) Positive Slew Rate 4 @ +/-15V (V/us) Negative Slew Rate 1 @ +/-15V (V/us) Negative Slew Rate 2 @ +/-15V (V/us) Negative Slew Rate 3 @ +/-15V (V/us) Negative Slew Rate 4 @ +/-15V (V/us) Positive Supply Current @ +5V (A) Negative Supply Current @ +5V (A) Offset Voltage 1 @ +5V (V) Offset Voltage 2 @ +5V (V) Offset Voltage 3 @ +5V (V) Offset Voltage 4 @ +5V (V) Offset Current 1 @ +5V (A) Offset Current 2 @ +5V (A) Offset Current 3 @ +5V (A) Offset Current 4 @ +5V (A) Positive Bias Current 1 @ +/-5V (A) Positive Bias Current 2 @ +/-5V (A) Positive Bias Current 3 @ +/-5V (A) Positive Bias Current 4 @ +/-5V (A) Negative Bias Current 1 @ +/-5V (A) Negative Bias Current 2 @ +/-5V (A) Negative Bias Current 3 @ +/-5V (A) Negative Bias Current 4 @ +/-5V (A) Positive Output Voltage 1 RL=open @ +5V (V) Positive Output Voltage 2 RL=open @ +5V (V) Positive Output Voltage 3 RL=open @ +5V (V) Positive Output Voltage 4 RL=open @ +5V (V) Positive Output Voltage 1 RL=600 @ +5V (V) Positive Output Voltage 2 RL=600 @ +5V (V) Positive Output Voltage 3 RL=600 @ +5V (V) Positive Output Voltage 4 RL=600 @ +5V (V) Output Voltage Low 1 RL=open @ +5V (V) Output Voltage Low 2 RL=open @ +5V (V) Output Voltage Low 3 RL=open @ +5V (V) Output Voltage Low 4 RL=open @ +5V (V) Output Voltage Low 1 RL=600 @ +5V (V) Output Voltage Low 2 RL=600 @ +5V (V) Output Voltage Low 3 RL=600 @ +5V (V) Output Voltage Low 4 RL=600 @ +5V (V) An ISO 9001:2000 Certified Company 186 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-298 090804 R1.1 5.81 5.82 5.83 5.84 Output Voltage Low 1 IL=1mA @ +5V (V) Output Voltage Low 2 IL=1mA @ +5V (V) Output Voltage Low 3 IL=1mA @ +5V (V) Output Voltage Low 4 IL=1mA @ +5V (V) An ISO 9001:2000 Certified Company 187 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800