STMICROELECTRONICS STB20NM50FD-1

STP20NM50FD
STB20NM50FD-1
N-CHANNEL 500V - 0.22Ω - 20A TO-220/I2PAK
FDmesh™ Power MOSFET (with FAST DIODE)
TYPE
VDSS
RDS(on)
Rds(on)*Qg
ID
STP20NM50FD
STB20NM50FD-1
500V
500V
<0.25Ω
<0.25Ω
8.36 Ω*nC
8.36 Ω*nC
20 A
20 A
■
■
■
■
■
■
TYPICAL RDS(on) = 0.22Ω
HIGH dv/dt AND AVALANCHE CAPABILITIES
100% AVALANCHE TESTED
LOW INPUT CAPACITANCE AND GATE CHARGE
LOW GATE INPUT RESISTANCE
TIGHT PROCESS CONTROL AND HIGH
MANUFACTURING YIELDS
3
1
TO-220
DESCRIPTION
The FDmesh™ associates all advantages of reduced
on-resistance and fast switching with an intrinsic fastrecovery body diode. It is therefore strongly recommended for bridge topologies, in particular ZVS phaseshift converters.
12
2
3
I2PAK
(Tabless TO-220)
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
ZVS PHASE-SHIFT FULL BRIDGE CONVERTERS
FOR SMPS AND WELDING EQUIPMENT
■
ORDERING INFORMATION
SALES TYPE
MARKING
PACKAGE
PACKAGING
STP20NM50FD
P20NM50FD
TO-220
TUBE
STB20NM50FD-1
August 2003
B20NM50FD-1
2
I PAK
TUBE
1/9
STP20NM50FD/STB20NM50FD-1
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Parameter
Value
Unit
Drain-source Voltage (VGS = 0)
500
V
Drain-gate Voltage (RGS = 20 kΩ)
500
V
Gate- source Voltage
±30
V
ID
Drain Current (continuous) at TC = 25°C
20
A
ID
Drain Current (continuous) at TC = 100°C
14
A
Drain Current (pulsed)
80
A
IDM ()
PTOT
dv/dt (1)
Tstg
Tj
Total Dissipation at TC = 25°C
192
W
Derating Factor
1.2
W/°C
Peak Diode Recovery voltage slope
20
V/ns
–65 to 150
°C
150
°C
Storage Temperature
Max. Operating Junction Temperature
( ) Pulse width limited by safe operating area
(1) ISD ≤ 20A, di/dt ≤ 200 A/µs, VDD ≤ V(BR)DSS, T j ≤ TJMAX.
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case
Max
0.65
°C/W
Rthj-amb
Thermal Resistance Junction-ambient
Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Max Value
Unit
Tl
AVALANCHE CHARACTERISTICS
Symbol
Parameter
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
10
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 35 V)
700
mJ
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
ON/OFF
Symbol
Parameter
V(BR)DSS
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
1
µA
VDS = Max Rating, TC = 125 °C
10
µA
Gate-body Leakage
Current (VDS = 0)
VGS = ±30V
±100
nA
VGS(th
Gate Threshold Voltage
VDS = VGS, ID = 250 µA
4
5
V
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 10A
0.22
0.25
Ω
IDSS
IGSS
2/9
Test Conditions
Min.
Typ.
Max.
500
3
Unit
V
STP20NM50FD/STB20NM50FD-1
ELECTRICAL CHARACTERISTICS (CONTINUED)
DYNAMIC
Symbol
gfs (1)
Ciss
Coss
Crss
Coss eq. (2)
Rg
Parameter
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
Test Conditions
Min.
VDS > ID(on) x RDS(on)max,
ID = 10A
VDS = 25V, f = 1 MHz, VGS = 0
Typ.
Max.
Unit
9
S
1380
290
40
pF
pF
pF
Equivalent Output
Capacitance
VGS = 0V, VDS = 0V to 400V
130
pF
Gate Input Resistance
f=1 MHz Gate DC Bias=0
Test Signal Level=20mV
Open Drain
2.8
Ω
(1) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
(2) Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS.
SWITCHING ON
Symbol
td(on)
tr
Qg
Qgs
Qgd
Parameter
Turn-on Delay Time
Rise Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Test Conditions
Min.
VDD = 250V, ID = 10 A
RG = 4.7Ω VGS = 10V
(see test circuit, Figure 3)
VDD = 400V, ID = 20A,
VGS = 10V
Typ.
Max.
Unit
22
ns
20
ns
38
18
10
53
nC
nC
nC
Typ.
Max.
Unit
SWITCHING OFF
Symbol
tr(Voff)
Parameter
Off-voltage Rise Time
tf
Fall Time
tc
Cross-over Time
Test Conditions
Min.
VDD = 400V, ID = 20 A,
RG = 4.7Ω, VGS = 10V
(see test circuit, Figure 5)
6
ns
15
ns
30
ns
SOURCE DRAIN DIODE
Symbol
ISD
ISDM (2)
VSD (1)
Parameter
Test Conditions
Min.
Typ.
Source-drain Current
Source-drain Current (pulsed)
Forward On Voltage
ISD = 20 A, VGS = 0
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
ISD = 20 A, di/dt = 100A/µs,
VDD = 60V, Tj = 150°C
(see test circuit, Figure 5)
IRRM
Reverse Recovery Current
Max.
Unit
20
A
80
A
1.5
V
245
ns
2
µC
16
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3/9
STP20NM50FD/STB20NM50FD-1
Safe Operating Area For TO-220 / I²PAK
Output Characteristics
Transconductance
4/9
Thermal Impedance For TO-220 / I²PAK
Transfer Characteristics
Static Drain-source On Resistance
STP20NM50FD/STB20NM50FD-1
Gate Charge vs Gate-source Voltage
Capacitance Variations
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/9
STP20NM50FD/STB20NM50FD-1
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/9
STP20NM50FD/STB20NM50FD-1
TO-220 MECHANICAL DATA
DIM.
mm.
MIN.
TYP
inch
MAX.
MIN.
4.60
0.173
TYP.
MAX.
A
4.40
0.181
b
0.61
0.88
0.024
0.034
b1
1.15
1.70
0.045
0.066
c
0.49
0.70
0.019
0.027
D
15.25
15.75
0.60
0.620
E
10
10.40
0.393
0.409
e
2.40
2.70
0.094
0.106
e1
4.95
5.15
0.194
0.202
F
1.23
1.32
0.048
0.052
H1
6.20
6.60
0.244
0.256
J1
2.40
2.72
0.094
0.107
L
13
14
0.511
0.551
L1
3.50
3.93
0.137
0.154
L20
16.40
L30
28.90
0.645
1.137
øP
3.75
3.85
0.147
0.151
Q
2.65
2.95
0.104
0.116
7/9
STP20NM50FD/STB20NM50FD-1
TO-262 (I2PAK) MECHANICAL DATA
mm.
inch
DIM.
MIN.
8/9
TYP
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
A1
2.40
2.72
0.094
0.107
b
0.61
0.88
0.024
0.034
b1
1.14
1.70
0.044
0.066
c
0.49
0.70
0.019
0.027
c2
1.23
1.32
0.048
0.052
D
8.95
9.35
0.352
0.368
e
2.40
2.70
0.094
0.106
e1
4.95
5.15
0.194
0.202
E
10
10.40
0.393
0.410
L
13
14
0.511
0.551
L1
3.50
3.93
0.137
0.154
L2
1.27
1.40
0.050
0.055
STP20NM50FD/STB20NM50FD-1
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
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