FAIRCHILD RMPA2451-TB

RMPA2451
2.4–2.5 GHz GaAs MMIC Power Amplifier
General Description
Features
Fairchild Semiconductor’s RMPA2451 is a partially
matched monolithic power amplifier in a surface mount
package for use in wireless applications in the 2.4 to 2.5
GHz ISM frequency band. The amplifier may be biased for
linear, class AB or class F for high efficiency applications.
External matching components are required to optimize the
RF performance. The MMIC chip design utilizes our
0.25µm power Pseudomorphic High Electron Mobility
(PHEMT) process.
• 38% power added efficiency
• 29dBm typical output power
• Small package outline: 0.28" x 0.28" x 0.07"
• Low power mode: 0 dBm
Device
Absolute Ratings
Symbol
Vd1, Vd2
Vg1, Vg2
Vd–Vg
PIN
Id1
Id2
Ig
TC
TCASE
TSTG
RJC
Parameter
Positive Drain DC Voltage
Negative Gate DC Voltage
Simultaneous Drain to Gate Voltage
RF Input Power (from 50Ω source)
Drain Current, First Stage
Drain Current, Second Stage
Gate Current
Channel Temperature
Operating Case Temperature
Storage Temperature Range
Thermal Resistance (Channel to Case)
©2004 Fairchild Semiconductor Corporation
Min
0
-5
-40
-40
Max
+8
0
+10
+10
75
525
5
175
85
125
33
Units
V
V
V
dBm
mA
mA
mA
°C
°C
°C
°C/W
RMPA2451 Rev. B
RMPA2451
April 2004
Parameter
Frequency Range
Gain1
Output Power, P1dB1
Power Added Efficiency
3rd order Intermod. Product2
Drain Current (Id1 + Id2)
Gate Current (Ig1 + Ig2)
Input Return Loss (50W)
Low Power Mode, Pout3
Min
2400
28.5
27
Typ
33
29
38
-35
430
Max
2500
-27
5
2:1
0
Units
MHz
dB
dBm
%
dBc
mA
mA
dB
dBm
Notes:
1. Production Testing includes Gain, Output Power at1-dB gain compression (P1dB) and Input Return Loss at Vd1 = Vd2 = +5.0; Vg1, Vg2 = -0.5V (nominal), adjust
Vg1 and Vg2 to get Idq1 = 60mA, Idq2 = 340mA and at F = 2.45GHz, at 25°C.
2. Two tone 3rd order Output Intermodulation products (IM3) are measured with total output power level of 25dBm (tone spacing is 1MHz).
3. Vg1, Vg2 tied together. Vd = 5V until Idq total = 45 mA, Pin = -10dBm.
Other Parameters are guaranteed by Design Validation Testing (DVT)
©2004 Fairchild Semiconductor Corporation
RMPA2451 Rev. B
RMPA2451
Electrical Characteristics1
CAUTION: THIS IS AN ESD SENSITIVE DEVICE.
The following describes the procedure for evaluating the RMPA2451, a partially-matched PHEMT monolithic power amplifier
which has been designed for wireless applications in the 2.4 - 2.5 GHz ISM band, in a surface mount package. The package
outline, along with the pin designations, is provided as Figure 1. The functional block diagram of the packaged product is
provided as Figure 2.
It should be noted that the RMPA2451 requires the use of external passive components to form the DC bias and RF output
matching circuits. The schematic for a recommended DC bias / RF matching circuit is shown in Figure 3, along with a list of
the appropriate components. Figure 4 illustrates the layout of an evaluation board based on this schematic (RMPA2451-TB).
Figures 5 and 6 illustrate typical device performance. This data for various operating parameters was obtained across the
design bandwidth over a range of temperatures.
Figure 5 shows the variation in Gain and P1dB with temperature and operating frequency.
Figure 6 shows the 3rd-order intermodulation product measured at different total output power levels.
Top View
Bottom View
0.200 SQ.
6
5
4
7
0.030
4
6
0.015
3
8
2
9
5
3
7
2
8
1
9
0.020
1
0.011
10 11 12
12 11 10
Pin
Plastic Lid
0.008
0.075 MAX
0.015
0.282
Side Section
Dimensions in inches
1
2
3
4
5
6
7
8
9
10
11
12
Base
0.041
Description
Vd2 + RF Out
Vd2 + RF Out
Vd2 + RF Out
GND
Vd1
GND
GND
RF IN
GND
Vg1
Vg2
GND
GND
Figure 1. Package Information
©2004 Fairchild Semiconductor Corporation
RMPA2451 Rev. B
RMPA2451
Application Information
RMPA2451
Pin #5
Vd1
Pins #4, #6, #7, #9, #12
Ground
MMIC CHIP
Pins #1, #2, #3
RF OUTPUT & Vd2
Pin #8
RF INPUT
GROUND
(Back of the Chip)
Pin #10
Vg1
Pin #11
Vg2
Figure 2. Functional Block Diagram
Test Procedure for the Evaluation Board (RMPA2451-TB)
It is important that the following points be noted prior to
testing; Pin designations are as shown in Figure 2 and 4.
• Vgg1 and Vgg2 are the negative Gate bias voltages
applied at the pins of the evaluation test board.
• Vdd1 and Vdd2 are the positive Drain bias voltages
applied at the pins of the evaluation test board.
• Vg1 and Vg2 are the negative Gate bias voltages applied
at the pins of the package.
• Vd1 and Vd2 are the positive Drain bias voltages applied
at the pins of the package.
CAUTION: LOSS OF GATE VOLTAGES (VG1, VG2)
WHILE DRAIN VOLTAGES (VD1, VD2) ARE PRESENT
MAY DAMAGE THE AMPLIFIER.
The following sequence of procedures must be followed to
properly test the amplifier:
Step 1: Turn the RF power OFF.
Step 2: Use the GND terminals of the evaluation board for
the ground of the DC supplies.
Step 4: Apply a nominal voltage of +5.0V to the Vdd
terminals. Adjust Vgg2 to provide a second stage quiescent
Drain current, Idd2, of 340 mA. Adjust Vgg1 to give a first
stage quiescent Drain current, Id1 of 60mA.
Step 5: Apply an RF signal within the ISM frequency range
(2.4 - 2.5 GHz) at an initial input power level of -10 dBm.
Step 6: To perform intermodulation product measurements, a second RF signal generator with a frequency
difference of 1 MHz is required, along with an appropriate
power combiner. The test configuration should allow this
additional generator to provide the same input power level
as the first generator into the device. Intermodulation
readings may then be made at the required total output
power levels.
Step 7: To operate at lower quiescent Drain currents,
increase the magnitudes of Vgg1 and Vgg2 as required,
alternatively to operate at higher quiescent Drain currents,
the magnitudes of Vgg1 and Vgg2 should be decreased
accordingly.
Step 8: When turning the amplifier OFF, the power-up
sequence should be reversed.
Step 3: Apply a nominal voltage of approximately - 3.0V to
both Vgg1 and Vgg2 terminals.
©2004 Fairchild Semiconductor Corporation
RMPA2451 Rev. B
RMPA2451
V dd1
C2
C1
C3
C3
RF INPUT
RF OUTPUT
RMPA2451
PPYYWWX
L2
L1
C4
V dd2
C2
C1
Vgg1
C2
V gg2
C1
C1
C2
Figure 3. Schematic of a Recommended DC Bias/RF Matching Circuit
C3
L2
C1
C2
C3
C4
V dd1
+
6 5 4
7
8
9
RF INPUT
3
2
1
RM
PA
245153
RF OUTPUT
10 1112
+
+
+
L1
C1
C1
C2
C2
C1
C2
Vgg1
Vgg2
GND
Vdd2
Parts Lists for Test Evaluation Board
Part
Value
C1
C2
C3
C4
L1
L2
1000pF
2.2µF
1.0pF
2.0pF
10.0nH
1.8nH
Quantity
Supplier
Part Number
4
4
2
1
1
1
Murata
Sprague
Murata
Murata
Coilcraft
Coilcraft
GRM36X
595D225X0016T2T
GRM36COG1R0B050
GRM36COG2R0B050
0805HT10NTKBC
0805HT1N8TKBC
Figure 4. Layout of Evaluation Board (RMPA2451-TB)
©2004 Fairchild Semiconductor Corporation
RMPA2451 Rev. B
RMPA2451
Typical Characteristics
Variation In Gain & P1dB With Frequency Over Temperature
(Vdd = +5.0 V, Iddq = 60 + 340mA @ 25°C)
37.0
2.50GHz
2.45GHz
2.40GHz
Gain (dB)
35.0
33.0
31.0
P1dB (dBm)
29.0
2.50GHz
2.45GHz
2.40GHz
27.0
25.0
-50
-30
-10
10
30
50
70
90
TEMPERATURE (°C)
NB: Gain measured at Pin = -10dBm
Figure 5. Typical Gain and P1dB Performance Across Bandwidth Over Temperature
Variation In IM3 with Frequency & Temperature for Different Total Output Power Levels
(Vdd = +5.0 V, Iddq = 60 + 340mA @ 25°C)
-25.0
3rd ORDER INTERMOD. PRODUCT (dBc)
-27.0
-29.0
2.50GHz
-31.0
2.40GHz
PTOT = 25dBm
2.45GHz
-33.0
-35.0
2.50GHz
-37.0
2.40GHz
2.45GHz
PTOT = 23dBm
-39.0
-41.0
-43.0
-50
-30
-10
10
30
50
70
90
TEMPERATURE (°C)
Figure 6. Typical Third-Order Intermodulation Product Variation Over Temperature
©2004 Fairchild Semiconductor Corporation
RMPA2451 Rev. B
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
2. A critical component is any component of a life
1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I10