MOTOROLA MC33395TDWB/R2

Freescale Semiconductor, Inc.
MOTOROLA
Document order number: MC33395/D
Rev 2.0, 01/2004
SEMICONDUCTOR TECHNICAL DATA
Advance Information
33395
33395T
Three-Phase Gate Driver IC
Freescale Semiconductor, Inc...
The 33395 simplifies the design of high-power BLDC motor control design by
combining the gate drive, charge pump, current sense, and protection circuitry
necessary to drive a three-phase bridge configuration of six N-channel power
MOSFETs. Mode logic is incorporated to route a pulse width modulation (PWM)
signal to either the low-side MOSFETs or high-side MOSFETs of the bridge, or
to provide complementary PWM outputs to both the low- and high-sides of the
bridge.
THREE-PHASE
GATE DRIVER IC
Detection and drive circuitry are also incorporated to control a reverse battery
protection high-side MOSFET switch. PWM frequencies up to 28 kHz are
possible. Built-in protection circuitry prevents damage to the MOSFET bridge as
well as the drive IC and includes overvoltage shutdown, overtemperature
shutdown, overcurrent shutdown, and undervoltage shutdown.
The device is parametrically specified over an ambient temperature range of
-40°C ≤ TA ≤ 125°C and 5.5 V ≤ VIGN ≤ 24 V supply.
Features
• Drives Six N-Channel Low RDS(ON) Power MOSFETs
• Built-In Charge Pump Circuitry
• Built-In Current Sense Comparator and Output Drive Current Limiting
• Built-In PWM Mode Control Logic
• Built-In Circuit Protection
• Designed for Fractional to Integral HP BLDC Motors
• 32-Terminal SOIC Wide Body Surface Mount Package
• 33395 Incorporates a <5.0 µs Shoot-Through Suppression Timer
• 33395T Incorporates a <1.0 µs Shoot-Through Suppression Timer
DWB SUFFIX
CASE 1324-02
32-TERMINAL SOICW
ORDERING INFORMATION
Device
MC33395DWB/R2
MC33395TDWB/R2
Temperature
Range (TA)
Package
-40°C to 125°C
32 SOICW
33395 Simplified Application Diagram
VPWR
33395
VDD
MCU
3
2
3
VIGNP
GDH1
GDH2
GDH3
SRC1
SRC2
SRC3
HSE1–3
MODE0–1 GDL1
GDL2
PWM
LSE1–3 GDL3
-ISENS
AGND
PGND
N
N
+ISENS
This document contains certain information on a new product.
Specifications and information herein are subject to change without notice.
© Motorola, Inc. 2004
S
S
VDD
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H
H
VGDH
VIGN
VDD
CP1H
CP1L
CP2H
CP2L
CRES
H
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VIGN
Osc.
VDD
Low
Low
Voltage
Reset
Reset
Charge
Charge
Pump
Overvoltage
Overvoltage
Shutdown
CP1H
CP1L
CP2H
CP2L
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CPRES
+ISENS
+
-ISENS
-
Drive
Drive Limiting
Limiting
L
MODE0
MODE1
PWM
HSE1
HSE2
HSE3
LSE1
LSE2
LSE3
VGDH
Control
Control
Logic
Logic
VIGNP
Gate
Drive
Gate
Circuits
Drive
Circuits
PGND
GDH1
GDH2
GDH3
SRC1
SRC2
SRC3
AGND
TEST
H
Overtemperature
Shutdown
Shutdown
GDL1
GDL2
GDL3
Figure 1. 33395 Simplified Internal Block Diagram
33395
2
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CP2H
CPRES
VIGN
VGDH
VIGNP
SRC1
GDH1
GDL1
SRC2
GDH2
GDL2
SRC3
GDH3
GDL3
PGND
TEST
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
CP2L
CP1H
CP1L
LSE1
LSE2
LSE3
HSE1
HSE2
HSE3
MODE0
MODE1
PWM
VDD
AGND
+ISENS
-ISENS
TERMINAL FUNCTION DESCRIPTION
Terminal
Terminal Name
Formal Name
1
CP2H
Charge Pump Cap
2
CPRES
Charge Pump Reserve Cap
3
VIGN
Input Voltage
4
VGDH
High-Side Gate Voltage
Output full-time gate drive for auxiliary high-side power MOSFET switch
5
VIGNP
Input Voltage Protected
Input from protected ignition level supply for power functions
6
SRC1
High-Side Sense
Sense for high-side source voltage, phase 1
7
GDH1
Gate Drive High
Output for gate high-side, phase 1
8
GDL1
Output for Gate
Output for gate drive low-side, phase 1
9
SRC2
High-Side Sense
Sense for high-side source voltage, phase 2
10
GDH2
Gate Drive High
Output for gate high-side, phase 2
11
GDL2
Output for Gate
Output for gate drive low-side, phase 2
12
SRC3
High-Side Sense
Sense for high-side source voltage, phase 3
13
GDH3
Gate Drive High
Output for gate drive high-side, phase 3
14
GDL3
Gate Drive Low
Output for gate drive low-side, phase 3
15
PGND
Power Ground
Ground terminals for power functions
16
Test
Test Terminal
This should be connected to ground or left open
17
-ISENS
IS Minus
18
+ISENS
IS Plus
19
AGND
Analog Ground
20
VDD
Logic Supply Voltage
21
PWM
Pulse Width Modulator
22
MODE1
Mode Control Bit 1
Input for mode control selection
23
MODE0
Mode Control Bit 0
Input for mode control selection
24
HSE3
High-Side Enable
Input for high-side enable logic, phase 3
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
Definition
High potential terminal connection for secondary charge pump capacitor
Input from external reservoir capacitor for charge pump
Input from ignition level supply voltage for power functions
Inverting input for current limit comparator
Non-inverting input for current limit comparator
Ground terminal for logic functions
Supply voltage for logic functions
Input for pulse width modulated driver duty cycle
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TERMINAL FUNCTION DESCRIPTION (continued)
Terminal Name
Formal Name
25
HSE2
High-Side Enable
Input for high-side enable logic, phase 2
26
HSE1
High-Side Enable
Input for high-side enable logic, phase 1
27
LSE3
Low-Side Enable
Input for low-side enable logic, phase 3
28
LSE2
Low-Side Enable
Input for low-side enable logic, phase 2
29
LSE1
Low-Side Enable
Input for low-side enable logic, phase 1
30
CP1L
External Pump Capacitor
Input from external pump capacitor for charge pump and secondary terminals
31
CP1H
External Pump Capacitor
Input from external pump capacitor for charge pump and secondary terminals
32
CP2L
Charge Pump Capacitor
Input from external reservoir, external pump capacitors for charge pump, and
secondary terminals
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Terminal
33395
4
Definition
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MAXIMUM RATINGS
All voltages are with respect to ground unless otherwise noted
Rating
Symbol
Value
Unit
VIGN
-15.5 to 40
VDC
-0.3 to 65
VDC
VIGN Supply Voltage
VIGNP Load Dump Survival
V
IGNPLD
VDD Logic Supply Voltage (Fail Safe)
VDD
-0.3 to 7.0
VDC
Logic Input Voltage (LSEn, HSEn, PWM, and MODEn)
VIN
0.3 to 7.0
VDC
IVIGNStartUp
100
mA
Human Body Model (Note 1)
VESD1
±500
Machine Model (Note 2)
VESD2
±200
TSTG
-65 to 160
°C
Operating Ambient Temperature
TA
-40 to 125
°C
Operating Case Temperature
TC
-40 to 125
°C
Maximum Junction Temperature
TJ
150
°C
Power Dissipation (TA = 25°C)
PD
1.5
W
TSOLDER
240
°C
RθJA
65
°C/W
Start Up Current VIGNP
V
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ESD Voltage
Storage Temperature
Terminal Soldering Temperature
Thermal Resistance, Junction-to-Ambient
Notes
1. ESD1 testing is performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω).
2.
ESD2 testing is performed in accordance with the Machine Model (CZAP = 200 pF, RZAP = 0 Ω).
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
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STATIC ELECTRICAL CHARACTERISTICS
Characteristics noted under conditions -40°C ≤ TA ≤ 125°C, 5.5 V ≤ VIGNP ≤ 24 V unless otherwise noted. Typical values reflect
approximate parameter mean at TA = 25°C under normal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
VIGN Current @ 5.5 V–24 V, VDD = 5.5 V
IIGN
–
0.2
1.0
mA
VIGNP Current @ 5.5 V–24 V, VDD = 5.5 V
IIGNP
–
–
100
mA
25
33
36.5
V
5.5
–
24
V
–
1.8
4.0
mA
VDD(RESET)
2.5
3.2
4.0
V
–
7.0
–
–
V
5.0
12
25
1.0
2.0
3.0
-0.3
VIGNP
24
VINP(OFFSET)
5.0
14
20
mV
VINP(BIAS)
-500
-170
500
nA
Comparator Input Offset Current
IINP(OFFSET)
-300
-3.0
300
nA
Common Mode Voltage (Note 4)
VCMR
0
–
VDD -2.0
VDC
Comparator Differential Input Voltage (Note 4)
VINPdiff
-VDD
–
+VDD
V
POWER INPUT
V
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VIGNP Overvoltage Shutdown
IGNPSD
VIGNP Voltage
VIGNP
VDD Current @ 5.5 VDC, 5.5 V ≤ VIGNP ≤ 24 V
IV
VDD Low-Voltage Reset Level
VDD One-Time Fuse (Logic Supply)
DD
INPUT/OUTPUT
µA
IIN
Input Current at VDD = 5.5 V
LSEn, HSEn, PWM, and MODEn = 3.0 V
VTH
Input Threshold at VDD = 5.5 V
LSEn, HSEn, PWM, and MODEn (Note 3)
V
VSCRn
VSCRn Source Sense Voltage
SRC1, SRC2, SRC3
Comparator Input Offset Voltage
Comparator Input Bias Current
V
VCRES -VIGNP
Charge Pump Voltage VIGN (Note 5)
V
VIGNP = 5.5 V, ICRES = 1.0 mA
4.0
6.0
18
VIGNP = 9.0 V, ICRES = 1.0 mA
4.0
7.5
18
VIGNP = 12 V, ICRES = 5.0 mA
4.5
10
18
VIGNP = 24 V, ICRES = 1.0 mA
8.0
16
18
VIGNP = 24 V, ICRES = 5.0 mA
4.5
12
18
VGDHn(on) -V SRCn
VGDH Output Voltage with GDHn in ON State
V
VIGNP = 5.5 V, IGDHn = 1.0 mA
4.0
5.2
18
VIGNP = 12 V, IGDHn = 5.0 mA
4.0
9.0
18
VIGNP = 24 V, IGDHn = 5.0 mA
4.5
11
18
-1.0
0.6
1.0
VGDH Output Voltage with GDHn in OFF State
VIGNP = SRCn = 14 V, IGDHn = 1.0 mA
V
VGDHn(off)
Notes
3. Logic inputs LSEn, HSEn, PWM, and MODEn have internal 20 µA internal sinks.
4. Guaranteed by design and characterization. Not production tested.
5. The Charge Pump has a positive temperature coefficient. Therefore the Min’s occur at -40°C, Typ’s at 25°C, and Max’s at 125°C.
33395
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STATIC ELECTRICAL CHARACTERISTICS
Characteristics noted under conditions -40°C ≤ TA ≤ 125°C, 5.5 V ≤ VIGNP ≤ 24 V unless otherwise noted. Typical values reflect
approximate parameter mean at TA = 25°C under normal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
VIGNP = 5.5 V, IGDLn = 1.0 mA
5.0
8.0
18
VIGNP = 12 V, IGDLn = 5.0 mA
8.0
14
18
VIGNP = 24 V, IGDLn = 0.0 mA
8.0
17
19
VIGNP = 24 V, IGDLn = 5.0 mA
8.0
16
19
-1.0
0.3
1.0
160
–
190
Unit
INPUT/OUTPUT (continued)
VGDL Low-Side Output Voltage GDHn in ON State
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VGDL Output Voltage GDHn in OFF State
VGDL(on)
VGDL(off)
VIGNP = 14 V, IGDLn = 1.0 mA
TLIM
Thermal Shutdown (Note 6)
V
V
°C
Notes
6. Guaranteed by design and characterization. Not production tested.
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DYNAMIC ELECTRICAL CHARACTERISTICS
Characteristics noted under conditions -40°C ≤ TA ≤ 125°C, 5.5 V ≤ VIGNP ≤ 24 V unless otherwise noted. Typical values reflect
approximate parameter mean at TA = 25°C under normal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
–
0.35
1.5
–
0.25
1.5
33395
1.0
3.0
5.5
33395T
0.2
0.65
1.0
1.5
2.8
5.0
High-Side (GDHn) and Low-Side Drivers (GDHn) Rise Time
(25% to 75%), CISS Value = 2000 pF (Note 7)
t RH
High-Side (GDHn) and Low-Side Drivers (GDHn) Fall Time
(75% to 25%), CISS Value = 2000 pF (Note 7)
t FH
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Shoot-Through Suppression Time Delay (33395) (Note 7), (Note 8)
Current Limit Time Delay (Note 9)
µs
µs
µs
t D1, t D2
t ILIMDELAY
Unit
µs
Notes
7. See Figure 2, page 9.
8. Shoot-Through Suppression Time Delay is provided to prevent directly connected high- and low-side MOSFETs from being on
simultaneously.
9. Current Limit Time Delay: The internal comparator places the device in the current limit mode when the comparator output goes LOW and
sets an internal logic bit. This takes a finite amount of time and is stated as the Current Limit Time Delay.
33395
8
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GDHn SRCn (%)
Timing Diagram
100
75
25
0
tRH tFH
GDLn, Gate V (%)
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tD1
100
tD2
tFL
tRL
75
25
0
TIME
Figure 2. Shoot-Through Suppression
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SYSTEM /APPLICATION INFORMATION
INTRODUCTION
The 33395 and 33395T devices are designed to provide the
necessary drive and control signal buffering and amplification to
enable a DSP or MCU to control a three-phase array of power
MOSFETs such as would be required to energize the windings
of powerful brushless DC (BLDC) motors. It contains built-in
charge pump circuitry so that the MOSFET array may consist
entirely of N-Channel MOSFETs. It also contains feedback
sensing circuitry and control circuitry to provide a robust overall
motor control design.
FUNCTIONAL DESCRIPTION
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Gate Drive Circuits
The gate drive outputs (GDH1, GDH2, etc.) supply the peak
currents required to turn ON and hold ON the MOSFETs, as
well as turn OFF and hold OFF the MOSFETs.
By averaging these two values, the proper CPn value can be
determined:
0.15 µF
20
= 0.075 µF, lower limit; and
0.15 µF
10
= .015 µF, upper limit
Charge Pump
The current capability of the charge pump is sufficient to
supply the gate drive circuit’s demands when PWM’ing at up to
28 kHz. Two external charge pump capacitors and a reservoir
capacitor are required to complete the charge pump’s circuitry.
Charge reservoir capacitance is a function of the total
MOSFET gate charge (QG) gate drive voltage level relative to
the source (VGS) and the allowable sag of the drive level during
the turn-on interval (VSAG). CRES can be expressed by the
following formula:
CRES =
QG x VGS
2 x VGS x VSAG - VSAG2
For example, for QG = 60 nC, VGS = 14 V, VSAG = 0.2 V:
(60 nC) x (14 V)
CRES =
= 0.15 µF
2 x (14 V) x (0.2 V) - (0.2)2
Proper charge pump capacitance is required to maintain,
and provide for, adequate gate drive during high demand turnON intervals. Use the following formula to determine values for
CP1 and CP2:
For example, for the above determination of CRES = 0.15 µF:
CRES
20
33395
10
< CP1 = CP2 <
CRES
10
CP1 and CP2 =(0.0075 µF + 0.015 µF) ÷ 2 = 0.01 µF
Thermal Shutdown Function
The device has internal temperature sensing circuitry which
activates a protective shutdown function should the die reach
excessively elevated temperatures. This function effectively
limits power dissipation and thus protects the device.
Overvoltage Shutdown Function
When the supply voltage (VIGN) exceeds the specified overvoltage shutdown level, the part will automatically shut down to
protect both internal circuits as well as the load. Operation will
resume upon return of VIGN to normal operating levels.
Low Voltage Reset Function
When the logic supply voltage (VDD) drops below the
minimum voltage level or when the part is initially powered up,
this function will turn OFF and hold OFF the external MOSFETs
until the voltage increases above the minimum voltage level
required for normal operation.
Control Logic
The control logic block controls when the low-side and highside drivers are enabled. The logic implements the Truth Table
found in the specification and monitors the M0, M1, PWM, CL,
OT, OV, LSE, and HSE terminals. Note that the drivers are
enabled 3 µs after the PWM edge. During complimentary chop
mode the high-side and low-side drives are alternatively
enabled and disabled during the PWM cycle. To prevent shootthrough current, the high-side drive turn-on is delayed by tD1,
and the low-side drive turn on is delayed by tD2 (see Figure 2,
page 9).
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Note that the drivers are disabled during an overtemperature
or overvoltage fault. A flip-flop keeps the drive off until the
following PWM cycle. This prevents erratic operation during
fault conditions. The current limit circuit also uses a flip-flop for
latching the drive off until the following PWM cycle.
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Note PWM must be toggled after POR, Thermal Limit, or
overvoltage faults to re-enable the gate drivers.
sense resistor placed in series with the ground return of the
three-phase output bridge. When triggered by the comparator,
the CL (current limit) bit of the internal error register is set, and
the output gate drive pairs (i.e., GDH1 and GDL1, GDH2 and
GDL2, GDH3 and GDL3), are controlled such that current will
cease flowing through the load (refer to Table 1, Truth Table,
page 12).
VGDH
Overtemperature and Overvoltage Shutdown
Circuits
The VGDH terminal is used to provide a gate drive signal to a
reverse battery protection MOSFET. If reverse battery
protection is desired, VIGN would be applied to the source of an
external MOSFET, and the drain of the MOSFET would then
deliver a "protected" supply voltage (VIGNP) to the three phase
array of external MOSFETs as well as the supply voltage to the
VIGNP terminal of the IC.
Internal monitoring is provided for both over temperature
conditions and over voltage conditions. When any of these
conditions presents itself to the IC, the corresponding internally
set bits of the error register are set, and the output gate drive
pairs (i.e., GDH1 and GDL1, GDH2 and GDL2, GDH3 and
GDL3), are controlled such that current will cease flowing
through the load (refer to Table 1).
In a reverse polarity event (e.g., an erroneous installation of
the system battery), the VGDH signal will not be supplied to the
external protection MOSFET, and the MOSFET will remain off
and thus prevent reverse polarity from being applied to the load
and the VIGNP supply terminal of the IC.
LSE and HSE Input Circuits
High-Side Gate Drive Circuits
Outputs GDH1, GDH2, and GDH3 provide the elevated drive
voltage to the high-side external MOSFETs (HS1, HS2, and
HS3; see Figure 3, page 13). These gate drive outputs supply
the peak currents required to turn ON and hold ON the highside MOSFETs, as well as turn OFF the MOSFETs. These gate
drive circuits are powered from an internal charge pump, and
therefore compensate for voltage dropped across the load that
is reflected to the source-gate circuits of the high-side
MOSFETs.
The low-side enable input terminals (LSE1, LSE2, LSE3)
and high-side enable input terminals (HSE1, HSE2, HSE3) form
the input pairs (HSE1 and LSE1, HSE2 and LSE2, HSE3 and
LSE3) which set the logic states of the output gate drive pairs
(i.e., GDH1 and GDL1, GDH2 and GDL2, GDH3 and GDL3) in
accordance with the logic set forth in the Truth Table (page 12).
Typically these inputs are supplied from an MCU or DSP to
provide the phasing of the currents applied to a brushless dc
motor's stator coils via the output MOSFET pairs.
PWM Input
The pulse width modulation input provides a single input
terminal to accomplish PWM modulation of the output pairs in
accordance with the states of the Mode 0 and Mode 1 inputs as
set forth in the Truth Table (page 12).
Low-Side Gate Drive Circuits
Mode Selection Inputs
Outputs GDL1, GDL2, and GDL3 provide the drive voltage to
the low-side external MOSFETs (LS1, LS2, and LS3; see
Figure 3). These gate drive outputs supply the peak currents
required to turn ON and hold ON the low-side MOSFETs, as
well as turn OFF the MOSFETs.
The mode selection inputs (Mode 0 and Mode 1) determine
the PWM implementation of the output pairs in accordance with
the logic set forth in the Truth Table (page 12). PWM'ing can
thus be set to occur either on the high-side MOSFETs or the
low-side MOSFETs, or can be set to occur on both the high-side
and low-side MOSFETs as "complementary chopping".
VDD Fuse
The VDD supply of the 33395 IC has an internal fuse, which
will blow and set all outputs of the device to OFF, if the VDD
voltage exceeds that stated in the maximum rating section of
the data sheet. When this fuse blows, the device is permanently
disabled.
ISENS Inputs
Test Terminal
This terminal should be grounded or left floating (i.e., do not
connect it to the printed circuit board). It is used by the
automated test equipment to verify proper operation of the
internal overtemperature shut down circuitry. This terminal is
susceptible to latch-up and therefore may cause erroneous
operation or device failure if connected to external circuitry.
The +Isens and -Isens terminals are inputs to the internal
current sense comparator. In a typical application, these would
receive a a low-pass filtered voltage derived from a current
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Table 1. Truth Table
The logic state of each output pair, GDLn and GDHn (n = 1, 2, 3), is a function of its corresponding input pair, LSEn and HSEn
(n = 1, 2, 3), along with the logic states of the MODEn and PWM inputs and the internally set overtemperature shutdown (OT),
overvoltage (OV), and current limit (CL) bits provided in this table.
NORMAL OPERATION
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Switching Modes
Internally Set Bits
Input Pairs
(e.g., LSE2 and HSE2)
Output Pairs
(e.g., GDL2 and GDH2)
MODE1
MODE0
OT
OV
CL
LSEn
HSEn
GDLn
GDHn
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
1
0
0
0
0
0
1
0
PWM
0
0
0
0
0
0
1
1
0
0
0
1
0
0
0
0
0
0
0
0
1
0
0
0
0
1
0
1
0
1
0
0
0
1
0
PWM
PWM
0
1
0
0
0
1
1
0
0
1
0
0
0
0
0
0
0
0
1
0
0
0
0
0
1
0
PWM
1
0
0
0
0
1
0
1
0
1
0
0
0
0
1
1
0
0
1
1
0
0
0
0
0
0
0
1
1
0
0
0
0
1
PWM
PWM
1
1
0
0
0
1
0
1
0
1
1
0
0
0
1
1
0
0
FAULT MODE OPERATION
Switching Modes
33395
12
Internally Set Bits
Input Pairs
(e.g., LSE2 and HSE2)
Output Pairs
(e.g., GDL2 and GDH2)
MODE1
MODE0
OT
OV
CL
LSEn
HSEn
GDLn
GDHn
0
0
0
0
1
0
0
0
0
0
0
0
0
1
0
1
0
1
0
0
0
0
1
1
0
0
0
0
0
0
0
1
1
1
0
0
0
1
0
0
1
0
0
0
0
0
1
0
0
1
0
1
0
1
0
1
0
0
1
1
0
0
1
0
1
0
0
1
1
1
0
0
1
0
0
0
1
0
0
0
0
1
0
0
0
1
0
1
0
0
1
0
0
0
1
1
0
1
0
1
0
0
0
1
1
1
0
0
1
1
0
0
1
0
0
0
0
1
1
0
0
1
0
1
1
0
1
1
0
0
1
1
0
1
0
1
1
0
0
1
1
1
0
0
x
x
x
1
x
x
x
0
0
x
x
1
x
x
x
x
0
0
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
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12 V
SRC1
GDH1
GDL1
SRC2
GDH2
GDL2
SRC3
GDH3
GDL3
PGND
TEST
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
HS2
HS3
LS1
LS2
LS3
CP2L
CP1H
CP1L
LSE1
LSE2
LSE3
HSE1
HSE2
HSE3
MODE0
MODE1
PWM
VDD
+
-
TO MOTOR
CP2H
CPRES
VIGN
VGDH
VIGNP
HS1
MCU
5.0 V
+
AGND
+ISENS
-ISENS
RSENSE
Freescale Semiconductor, Inc...
+
Figure 3. Typical Application Diagram
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
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33395
13
Freescale Semiconductor, Inc.
PACKAGE DIMENSIONS
DWB SUFFIX
32-TERMINAL SOICW
PLASTIC PACKAGE
CASE 1324-02
ISSUE A
NOTES:
1.
2.
10.3
3.
4.
7.6
7.4
C
5
Freescale Semiconductor, Inc...
1
B
2.65
2.35
9
5.
30X
32
0.65
6.
PIN 1 ID
4
B
9
B
11.1
10.9
CL
7.
8.
9.
16
17
A
5.15
32X
2X 16 TIPS
0.3
SEATING
PLANE
ALL DIMENSIONS ARE IN MILLIMETERS.
DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
DATUMS B AND C TO BE DETERMINED AT THE
PLANE WHERE THE BOTTOM OF THE LEADS EXIT
THE PLASTIC BODY.
THIS DIMENSION DOES NOT INCLUDE MOLD FLASH,
PROTRUSION OR GATE BURRS. MOLD FLASH,
PROTRUSION OR GATE BURRS SHALL NOT EXCEED
0.15 MM PER SIDE. THIS DIMENSION IS DETERMINED
AT THE PLANE WHERE THE BOTTOM OF THE LEADS
EXIT THE PLASTIC BODY.
THIS DIMENSION DOES NOT INCLUDE INTERLEAD
FLASH OR PROTRUSIONS. INTERLEAD FLASH AND
PROTRUSIONS SHALL NOT EXCEED 0.25 MM PER
SIDE. THIS DIMENSION IS DETERMINED AT THE
PLANE WHERE THE BOTTOM OF THE LEADS EXIT
THE PLASTIC BODY.
THIS DIMENSION DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR PROTRUSION
SHALL NOT CAUSE THE LEAD WIDTH TO EXCEED
0.4 MM PER SIDE. DAMBAR CANNOT BE LOCATED
ON THE LOWER RADIUS OR THE FOOT. MINIMUM
SPACE BETWEEN PROTRUSION AND ADJACENT
LEAD SHALL NOT LESS THAN 0.07 MM.
EXACT SHAPE OF EACH CORNER IS OPTIONAL.
THESE DIMENSIONS APPLY TO THE FLAT SECTION
OF THE LEAD BETWEEN 0.10 MM AND 0.3 MM FROM
THE LEAD TIP.
THE PACKAGE TOP MAY BE SMALLER THAN THE
PACKAGE BOTTOM. THIS DIMENSION IS
DETERMINED AT THE OUTERMOST EXTREMES OF
THE PLASTIC BODY EXCLUSIVE OF MOLD FLASH,
TIE BAR BURRS, GATE BURRS AND INTER-LEAD
FLASH, BUT INCLUDING ANY MISMATCH BETWEEN
THE TOP AND BOTTOM OF THE PLASTIC BODY.
A
0.10 A
B C
A
(0.29)
A
BASE METAL
0.25
0.19
(0.203)
0.25
0.38
0.22
6
0.13
M
C A
PLATING
M
SECTION A-A
B
ROTATED 90 CLOCKWISE
33395
14
R0.08 MIN
GAUGE PLANE
0
MIN
0.29
0.13
8
8
0
0.9
0.5
SECTION B-B
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
For More Information On
This Product,
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Freescale Semiconductor, Inc.
Freescale Semiconductor, Inc...
NOTES
MOTOROLA ANALOG INTEGRATED CIRCUIT DEVICE DATA
For More Information On This Product,
Go to: www.freescale.com
33395
15
Freescale Semiconductor, Inc...
Freescale Semiconductor, Inc.
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MC33395/D